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Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions

Ygor Quadros de Aguiar , Frédéric Wrobel , Jean-Luc Autran , Paul Leroux , Frédéric Saigné , et al.
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018), Oct 2018, Aalborg, Denmark
Communication dans un congrès hal-02086379v1
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Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions

Y.Q. Aguiar , Frédéric Wrobel , Jean-Luc Autran , P. Leroux , F. Saigné , et al.
Microelectronics Reliability, 2018, 88-90, pp.920-924. ⟨10.1016/j.microrel.2018.07.018⟩
Article dans une revue hal-02089778v1

In-depth resolution for LBIC technique by two-photon absorption

Dong Yun Wan , Vincent Pouget , Alexandre Douin , Patrice Jaulent , Dean Lewis , et al.
Semiconductors, 2007, 41 (4), pp.371-375, 10.1134/S106378260704001X. ⟨10.1134/S106378260704001X⟩
Article dans une revue istex hal-00204572v1

Analysis of the Single-Event Latch-up Cross Section of a 16nm FinFET System-on-Chip using Backside Single-Photon Absorption Laser Testing and Correlation with Heavy Ion Data

Matthieu Fongral , Vincent Pouget , Frédéric Saigné , Marine Ruffenach , Jérôme Carron , et al.
European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2023, Toulouse, France
Communication dans un congrès hal-04308603v1
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Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge

S. Guagliardo , Frédéric Wrobel , Ygor Quadros de Aguiar , Jean-Luc Autran , Paul Leroux , et al.
Microelectronics Reliability, 2021, 119, ⟨10.1016/j.microrel.2021.114087⟩
Article dans une revue hal-03187849v1

Total Ionizing Dose effects in DDR3 SDRAMs under Co-60 and X-ray irradiation

P. Kohler , Vincent Pouget , Frédéric Saigné , J. Boch , T. Maraine , et al.
European Conference on Radiation Effects on Components and Systems (RADECS), Sep 2018, Goteborg, Sweden
Communication dans un congrès hal-02088721v1

Laser-Induced Current Transients in Silicon-Germanium HBTs

J.A Pellish , R. Reed , D. Mcmorrow , J. Melinger , P. Jenkins , et al.
IEEE Transactions on Nuclear Science, 2008, 55 (6), pp.2936-2942
Article dans une revue hal-00397926v1

Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology

Issam El Moukhtari , Vincent Pouget , Frédéric Darracq , Camille Larue , Philippe Perdu , et al.
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2635-2639. ⟨10.1109/TNS.2012.2231437⟩
Article dans une revue hal-00880480v1

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization

T. Beauchêne , D. Lewis , F. Beaudoin , V. Pouget , R. Desplats , et al.
Microelectronics Reliability, 2003, 43 (3), pp.439 - 444. ⟨10.1016/S0026-2714(02)00339-6⟩
Article dans une revue istex hal-01887647v1

Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection

Gennaro Severino Rodrigues , Ádria Barros de Oliveira , Fernanda Lima Kastensmidt , Vincent Pouget , Alberto Bosio
Journal of Electronic Testing: : Theory and Applications, 2019, ⟨10.1007/s10836-019-05806-y⟩
Article dans une revue hal-02145492v1

Evaluation of SRAMs Reliability for Space Electronics Using Ultra Short Laser Pulses

Frédéric Darracq , Hervé Lapuyade , Pascal Fouillat , Vincent Pouget , Dean Lewis , et al.
19th Symposium on Microelectronics Technology and Devices (SBMicro 2004), 2004, Brazil. pp.1
Communication dans un congrès hal-00185409v1

Single Event Transients (SETs) in RF Circuits

N. Varanasi , W. M. Chen , H. J. Barnaby , B. Vermeire , J. Cressler , et al.
15th Single-Event Effects Symposium, 2006, Long Beach, United States
Communication dans un congrès hal-00398023v1

Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges

Philippe Perdu , Dean Lewis , V. Pouget
European Symposium on Reliability of Electron Devices (ESREF), 2008, Maastricht, Netherlands
Communication dans un congrès hal-00401385v1

Evaluation of SRAMs reliability for space electronics using ultrashort laser pulses

Frédéric Darracq , Herve Lapuyade , Pascal Fouillat , Vincent Pouget , Dean Lewis , et al.
Journal of Integrated Circuits and Systems, 2006, 1 (3), pp.11 -16
Article dans une revue hal-00359396v1

Jitter Improvement of Time-Resolved Photoelectric Laser Stimulation for Dynamic Imaging of Integrated Circuits

Alexandre Douin , Vincent Pouget , Dean Lewis , Pascal Fouillat , Philippe Perdu
Instrumentation and Measurement Technology Conference 2007, May 2007, Varsovie, Poland. pp.1-5, 10.1109/IMTC.2007.379080, ⟨10.1109/IMTC.2007.379080⟩
Communication dans un congrès hal-00204580v1

Compact modeling of Optically-Gated Carbon NanoTube Field Effect Transistor

Si-Yu Liao , Cristell Maneux , Vincent Pouget , Sebastien Fregonese , Thomas Zimmer
Trends in NanoTechnologies 2009, Sep 2009, Barcelonna, Spain. pp._
Communication dans un congrès hal-00399897v1

Net integrity checking by optical localization techniques

G. Haller , A. Machouat , Dean Lewis , Vincent Pouget
19th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) 2009, Oct 2009, Arcachon, France. pp.1
Communication dans un congrès hal-00585657v1

Comparison of classical and two-photon photoelectric laser stimulation capabilities for failure analysis

Kai Shao , V. Pouget , Emeric Faraud , C. Larue , D. Lewis
18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jul 2011, Incheon, South Korea. pp.1-4
Communication dans un congrès hal-00669828v1

Investigation of millisecond-long analog single-event transients in the LM6144 op amp

Y. Boulghassoul , S. Buchner , D. Mcmorrow , V. Pouget , L.W. Massengill , et al.
IEEE Transactions on Nuclear Science, 2004, 51 (6), pp.3529 - 3536. ⟨10.1109/TNS.2004.839196⟩
Article dans une revue hal-01887662v1

Highlights of laser testing capabilities regarding the understanding of SEE in SRAM Based FPGAs

A. Bocquillon , G. Foucard , F. Miller , N. Buard , Régis Leveugle , et al.
9th European Conference on Radiation and its Effects on Components and Systems (RADECS'07), Sep 2007, Deauville, France
Communication dans un congrès hal-00288250v1

Remote SEE Testing Capabilities with Heavy Ions and Laser Beams at CYCLONE-HIF and ATLAS Facilities

P. Peronnard , Raoul Velazco , G. Foucard , V. Pouget , G. Berger , et al.
Radiation Effects Data Workshop, Jul 2008, Tucson, AZ, United States. pp.106-109, ⟨10.1109/REDW.2008.26⟩
Communication dans un congrès hal-00374744v1

Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection

V. Pouget , A. Douin , G. Foucard , P. Peronnard , D. Lewis , et al.
14th IEEE International Symposium On-Line Testing (IOLT'08), Jul 2008, Rhodes, Greece. pp.295-301, ⟨10.1109/IOLTS.2008.39⟩
Communication dans un congrès hal-00347751v1

Characterization and modelling of laser-induced single-event burn-out in SiC power diodes

N. Mbaye , V. Pouget , F. Darracq , D. Lewis
ESREF 2013, 2013, Arcachon, France
Communication dans un congrès hal-01935694v1

Applications de l acoustique picoseconde à l analyse non destructive de circuits intégrés

J. M. Rampnoux , Y. Ezzahri , S. Dilhaire , S. Grauby , W. Claeys , et al.
Colloque Interdisciplinaire en Instrumentation (C2I), 2004, France. pp.1
Communication dans un congrès hal-00182903v1

Study of Single Event Transients in High-Speed Operational Amplifiers

Patrice Jaulent , Vincent Pouget , Dean Lewis , Pascal Fouillat
9th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2007, Deauville, France. pp.97-103
Communication dans un congrès hal-00397836v1

Banc de génération et détection de faisceau THz par photo commutateur ultrarapide sur GaAs BT

Patrick Mounaix , M. Tondusson , Laurent Sarger , Alexandre Douin , Vincent Pouget , et al.
3ème journées Thz, 2005, Aussois, France
Communication dans un congrès hal-00398013v1

Linear Systems Analysis of Single Event Transients in Voltage Controlled Oscillators

N. Varanasi , W. M. Chen , B. Vermeire , P.C. Adell , Vincent Pouget , et al.
16th Single-Event Effects Symposium, 2007, Long Beach, United States
Communication dans un congrès hal-00398028v1

Compact modeling of optically gated carbon nanotube field effect transistor

Si-Yu Liao , Cristell Maneux , Vincent Pouget , Sebastien Fregonese , Thomas Zimmer
physica status solidi (b), 2010, 247 (8), pp.1858 - 1861. ⟨10.1002/pssb.200983818⟩
Article dans une revue hal-00495144v1

Best practice and trends in laser testing for Single−Event Effects

Vincent Pouget
RADECS Workshop 2018 and the 2nd International Conference on Radiation Effects of Electronic Devices (ICREED), May 2018, Pekin, China
Communication dans un congrès hal-02108913v1

An Approximate Error-Detection Technique for Multi-Core Real-Time Systems

Gennaro Rodrigues , Adria Barros , Israel Lopes , Vincent Pouget , Alberto Bosio , et al.
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2019, Montpellier, France. pp.01-04, ⟨10.1109/RADECS47380.2019.9745688⟩
Communication dans un congrès hal-03890419v1