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Ali IBRAHIM
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Characterization and aging test methodology for power electronic devices at high temperatureAdvanced Materials Research, 2011, 324, pp 411-414. ⟨10.4028/www.scientific.net/AMR.324.411⟩
Article dans une revue
hal-01701988v1
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Investigations on junction temperature estimation based on junction voltage measurementsMicroelectronics Reliability, 2010, 50 (9-11), pp 1506-1510. ⟨10.1016/j.microrel.2010.07.102⟩
Article dans une revue
hal-01704413v1
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