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Ali IBRAHIM

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Physicochemical-microstructural approach for modeling the crack passage at topside metallic parts in IGBT semiconductor power electronics

Mustafa Shqair , Zoubir Khatir , Ali Ibrahim , Mounira Bouarroudj-Berkani , Ayda Halouani
2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Apr 2022, St Julian, Malta. pp.1-6, ⟨10.1109/EuroSimE54907.2022.9758895⟩
Communication dans un congrès hal-03656147v1

Analytical Model for Real-Time Junction Temperature Estimation of Multi-chip Power Module in PWM operation

Ali Ibrahim , Zoubir Khatir
2022 IEEE 13th International Symposium on Power Electronics for Distributed Generation Systems (PEDG), Jun 2022, Kiel, Germany. pp.1-6, ⟨10.1109/PEDG54999.2022.9923091⟩
Communication dans un congrès hal-04154674v1

Condition monitoring and evaluation of Ron degradation during power cycling in switching mode of SiC-Mosfets power modules

Ali Ibrahim , Zoubir Khatir
12th International Conference on Integrated Power Electronics Systems (CIPS 2022), Mar 2022, Berlin, Germany
Communication dans un congrès hal-04451130v1

Condition monitoring and evaluation of Ron degradation during power cycling of SiC-Mosfets power modules

Ali Ibrahim , Zoubir Khatir , Mounira Bouarroudj-Berkani
International Conference on integrated Power Electronics Systems (CIPS), Mar 2022, Berlin, Germany
Communication dans un congrès hal-03656145v1
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Wire-bond Contact Degradation Modelling for Remaining Useful Lifetime Prognosis of IGBT Power Modules

Mohamad Nazar , Ali Ibrahim , Zoubir Khatir , Nicolas Degrenne , Zeina Al Masry
ESREF 2020, 31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2020, Athènes, Greece
Communication dans un congrès hal-03153075v1
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Remaining Useful Lifetime estimation for Electronic Power modules using an analytical degradation model

Mohamad Nazar , Ali Ibrahim , Zoubir Khatir , Nicolas Degrenne , Zeina Al Masry
Fifth European Conference of the PHM Society 2020 (The Prognostics and Health Management), Jul 2020, Turin (virtual conference), Italy. pp.10
Communication dans un congrès hal-03152503v1

New Electro-Thermal Model for a Multichip Power Module Used in a Motor Drive

Merouane Ouhab , Zoubir Khatir , Ali Ibrahim , Jean-Pierre Ousten , Radoslava Mitova
2017 International Exhibition and Conference for Power Electronics and Energy Management (PCIM 2017), May 2017, Nuremberg, Germany. 8p
Communication dans un congrès hal-01671574v1

Power Cycling Tests in High Temperature Conditions of SiC-MOSFET Power Modules and Ageing Assessment

Ali Ibrahim , Jean-Pierre Ousten , Richard Lallemand , Zoubir Khatir
CIPS 2016 - 9th International Conference on integrated Power Electronics Systems, Mar 2016, Nuremberg, Germany. 6p
Communication dans un congrès hal-01675215v1

Power cycling aging tests at 200°C of SiC assemblies for high temperature electronics

Ali Ibrahim , Zoubir Khatir
EPE 13 - European Conference on Power Electronics and Applications, Sep 2013, Lille, France. 10p
Communication dans un congrès hal-01671569v1

Robustness of 1.2 kV SiC MOSFET devices

Othman Dhouha , Stéphane Lefebvre , Mounira Berkani , Zoubir Khatir , Ali Ibrahim
ESREF, 2013, Arcachon, France
Communication dans un congrès hal-01700475v1

Power cycling ageing tests at 200°C of SiC assemblies for high temperature electronics

Ali Ibrahim , Zoubir Khatir
European Conference on Power Electronics and Applications, Sep 2013, France. 10p
Communication dans un congrès hal-01056984v1

Investigation of 1.2 kV investigation of SiC MOSFETs for aeronautics applications

Dhouha Othman , Stéphane Lefebvre , Mounira Berkani , Zoubir Khatir , Ali Ibrahim
Power Electronics and Applications (EPE), 2013 15th European Conference on, Sep 2013, Lille, France. pp.1-9, ⟨10.1109/EPE.2013.6634665⟩
Communication dans un congrès hal-00881162v1

Detection of Rolling Element Bearing Faults by Analysis of the Motor Current, in proceeding of IMechE

Ali Ibrahim , François Guillet , Mohamed El Badaoui , B. Randall , Didier Rémond
9th International Conference on Vibrations in Rotating Machinery, Sep 2008, London, United Kingdom. pp.0
Communication dans un congrès hal-00553851v1

Monitoring of Induction Machine Bearing Fault by Using of Instantaneous Frequency

Ali Ibrahim , François Guillet , Mohamed El Badaoui , Frédéric Bonnardot
XVIth symposium on Vibrations, chocs & bruit (VCB 2008), Jun 2008, Lyon, France. pp.0
Communication dans un congrès hal-00553139v1

Detection of rolling element bearing faults by analysis of the motor current

A. Ibrahim , F. Guillet , M. El Badaoui , R.B Randall , Didier Remond
IMechE 9th International Conference on Vibrations in Rotating Machinery, Sep 2008, Royaume-Uni
Communication dans un congrès hal-00506185v1

Detection of Rolling Element Bearing Faults by Using of Instantaneous Frequency

Ali Ibrahim , François Guillet , Mohamed El Badaoui , Frédéric Bonnardot
ISMA2008, Sep 2008, Leuven, Belgium. pp.0
Communication dans un congrès hal-00552204v1

Using the Cyclostationarity of Electrical Signal for Bearing Fault Detection in Induction Machine

Ali Ibrahim , Mohamed El Badaoui , François Guillet , M. Zoaeter
IEEE ICIT'2006, Dec 2006, Mumbai, India. pp.0
Communication dans un congrès hal-00552233v1

Electrical signals analysis of an asynchronous motor for bearing fault detection

Ali Ibrahim , Mohamed El Badaoui , François Guillet , Youssef Widian
IEEE IECON'06, Nov 2006, Paris, France. pp.0
Communication dans un congrès hal-00552237v1

Don't ignore nonstationarity: use it to advantage

Frédéric Bonnardot , Roger Boustany , Ali Ibrahim , Khalid Sabri , Jérôme Antoni
ISMA2006 International Conference on Noise and Vibration Engineering, Sep 2006, Leuven, Belgium
Communication dans un congrès hal-00552833v1
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Thermal Fatigue Effect on the Grain Groove Profile in the Case of Diffusion in Thin Polycrystalline Films of Power Electronic Devices

Tayssir Hamieh , Ali Ibrahim , Zoubir Khatir
Micromachines, 2023, 14 (9), pp.1781. ⟨10.3390/mi14091781⟩
Article dans une revue hal-04209549v1
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New model of crack propagation of aluminium wire bonds in IGBT power modules under low temperature variations

Ayda Halouani , Zoubir Khatir , R. Lallemand , Ali Ibrahim , Nicolas Degrenne
Microelectronics Reliability, 2023, 147, pp.115066. ⟨10.1016/j.microrel.2023.115066⟩
Article dans une revue hal-04154649v1
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Thermal Stress Analysis Comparison in IGBT Power Modules between DC and switching Power Cycling

Zoubir Khatir , Richard Lallemand , Ali Ibrahim , Damien Ingrosso
IEEE Transactions on Power Electronics, 2023, 38 (9), ⟨10.1109/TPEL.2023.3289890⟩
Article dans une revue hal-04154662v1

A combined physicochemical-microstructural approach to predict the crack path at the topside interconnections in IGBT power devices

Mustafa Shqair , Zoubir Khatir , Ali Ibrahim , Mounira Bouarroudj-Berkani , Ayda Halouani
Microelectronics Reliability, 2022, 132, pp.114516. ⟨10.1016/j.microrel.2022.114516⟩
Article dans une revue hal-03656143v1
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Microstructural evolution during the crack propagation at the bond-wire contact area of IGBT power modules upon power cycling

Mustafa Shqair , Zoubir Khatir , Ali Ibrahim , Ayda Halouani , Mounira Bouarroudj-Berkani
Microelectronics Reliability, 2022, ⟨10.1016/j.microrel.2022.114635⟩
Article dans une revue hal-03788643v1

Finite elements analyses of early-stage crack propagation in aluminum wire bonds due to power cycling

A Halouani , Mustafa Shqair , Zoubir Khatir , A Ibrahim , M Ouhab
Microelectronics Reliability, 2022, 138, pp.114610. ⟨10.1016/j.microrel.2022.114610⟩
Article dans une revue hal-04102314v1
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Effect of load sequence interaction on bond-wire lifetime due to power cycling

Zoubir Khatir , Son-Ha Tran , Ali Ibrahim , Richard Lallemand , Nicolas Degrenne
Scientific Reports, 2021, 11, pp.5601. ⟨10.1038/s41598-021-84976-2⟩
Article dans une revue hal-03173035v1
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Using of Bond-Wire Resistance as Ageing Indicator of Semiconductor Power Modules

Ali Ibrahim , Zoubir Khatir , Jean-Pierre Ousten , Richard Lallemand , Stefan V. Mollov
Microelectronics Reliability, 2020, Microelectronics Reliability, 114, ⟨10.1016/j.microrel.2020.113757⟩
Article dans une revue hal-03153283v1
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Wire-bond contact degradation modeling for remaining useful lifetime prognosis of IGBT power modules

M Nazar , Ali Ibrahim , Zoubir Khatir , Nicolas Degrenne , Z Al-Masry
Microelectronics Reliability, 2020, 114, ⟨10.1016/j.microrel.2020.113824⟩
Article dans une revue hal-03150944v1

Analysis of the aging mechanism occurring at the bond-wire contact of IGBT power devices during power cycling

Nausicaa Dornic , Ali Ibrahim , Zoubir Khatir , N. Degrenne , S. Mollov
Microelectronics Reliability, 2020, 114, pp.113873. ⟨10.1016/j.microrel.2020.113873⟩
Article dans une revue hal-03271785v1

Constant ΔTj Power Cycling Strategy in DC Mode for Top-Metal and Bond-Wire Contacts Degradation Investigations

Son-Ha Tran , Zoubir Khatir , Richard Lallemand , Ali Ibrahim , Jean Pierre Ousten
IEEE Transactions on Power Electronics, 2019, 34 (3), pp.2171-2180. ⟨10.1109/TPEL.2018.2847234⟩
Article dans une revue hal-02195018v1
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New solution of the partial differential equation of the grain groove profile problem in the case of evaporation/condensation

Hamieh Tayssir , Zoubir Khatir , Ali Ibrahim
Scientific Reports, 2019, 17 p. ⟨10.1038/s41598-019-46537-6⟩
Article dans une revue hal-02186758v1
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Stress-based Model for Lifetime Estimation of Bond-Wire Contacts using Power Cycling Tests and Finite Element Modelling

Nausicaa Dornic , Zoubir Khatir , Son-Ha Tran , Ali Ibrahim , Richard Lallemand
IEEE Journal of Emerging and Selected Topics in Power Electronics, 2019, 8 p. ⟨10.1109/JESTPE.2019.2918941⟩
Article dans une revue hal-02186162v1
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Analytical Solutions to the Problem of the Grain Groove Profile

Tayssir Hamieh , Zoubir Khatir , Ali Ibrahim
Nanoscience & Technology: Open Access, 2018, ⟨10.15226/2374-8141/5/2/00157⟩
Article dans une revue hal-02093930v1

Theoretical investigation of the charges weight between interface and oxygen traps in barrier layer on the 2DEG density of Al2O3/AlGaN/GaN HEMTs

Fadi Zaki , Zoubir Khatir , R Escoffier , Ali Ibrahim
Journal of Computational Electronics, 2018, 17 (3), pp.1220-1228. ⟨10.1007/s10825-018-1186-9⟩
Article dans une revue hal-01815391v1

Effect of power cycling tests on traps under the gate of Al2O3/AlGaN/GaN normally-ON devices

Malika Elharizi , Fadi Zaki , Ali Ibrahim , Zoubir Khatir , Jean Pierre Ousten
Microelectronics Reliability, 2018, 88-90, pp. 671-676. ⟨10.1016/j.microrel.2018.07.070⟩
Article dans une revue hal-02093634v1

New Analytical Model for Real-Time Junction Temperature Estimation of Multichip Power Module Used in a Motor Drive

Merouane Ouhab , Zoubir Khatir , Ali Ibrahim , Jean Pierre Ousten , Radoslava Mitova
IEEE Transactions on Power Electronics, 2018, 33 (6), pp.5292 - 5301. ⟨10.1109/TPEL.2017.2736534⟩
Article dans une revue hal-01723547v1
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Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling

Nausicaa Dornic , Ali Ibrahim , Zoubir Khatir , Zoubir Khatir , Sh Tran
Microelectronics Reliability, 2018, 88, p. 462 - 469. ⟨10.1016/j.microrel.2018.07.041⟩
Article dans une revue hal-02090201v1

Power Cycling Issues and Challenges of SiC-MOSFET Power Modules in High Temperature Conditions

Ali Ibrahim , Jean-Pierre Ousten , Richard Lallemand , Zoubir Khatir
Microelectronics Reliability, 2016, 58 (3), pp.204-210. ⟨10.1016/j.microrel.2015.11.030⟩
Article dans une revue hal-01671546v1

Robustness of 1.2 kV SiC MOSFET devices

Dhouha Othman , Stéphane Lefebvre , Mounira Bouarroudj-Berkani , Zoubir Khatir , Ali Ibrahim
Microelectronics Reliability, 2013, 53 (9-11), pp.1735-1738. ⟨10.1016/j.microrel.2013.07.072⟩
Article dans une revue hal-00876938v1

Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application

Dhouha Othman , Mounira Bouarroudj-Berkani , Stéphane Lefebvre , Zoubir Khatir , Ali Ibrahim
Microelectronics Reliability, 2012, 52 (9-10), pp.1859-1864
Article dans une revue hal-00739653v1

Comparison Study on Performances and Reliability between MOSFET & JFET Silicon carbide technologies - Abilities for Aeronautics Application

D Othman , Mounira Berkani , S Lefebvre , Ali Ibrahim , Zoubir Khatir
Microelectronics Reliability, 2012, 52 (10), pp.1859-1864. ⟨10.1016/j.microrel.2012.06.078⟩
Article dans une revue hal-00868886v1

Characterization and aging test methodology for power electronic devices at high temperature

Ali Ibrahim , Zoubir Khatir , Laurent Dupont
Advanced Materials Research, 2011, 324, pp 411-414. ⟨10.4028/www.scientific.net/AMR.324.411⟩
Article dans une revue hal-01701988v1

Bearing Damage Using Stator Current, Electrical and Voltage to Cancel Electrical Noise

A. Ibrahim , Frédéric Bonnardot , Mohamed El Badaoui , F. Guillet
EURASIP Journal on Advances in Signal Processing, 2011, pp.11-32. ⟨10.1155/2011/235236⟩
Article dans une revue hal-00582408v1

Investigations on junction temperature estimation based on junction voltage measurements

Zoubir Khatir , Laurent Dupont , Ali Ibrahim
Microelectronics Reliability, 2010, 50 (9-11), pp 1506-1510. ⟨10.1016/j.microrel.2010.07.102⟩
Article dans une revue hal-01704413v1

A New Bearing Faults Detection Method Based on Instantaneous Power Factor

Ali Ibrahim , Mohamed El Badaoui , François Guillet , Frédéric Bonnardot
IEEE Transactions on Industrial Electronics, 2008, Vol 55 (12), pp.4252 - 4259
Article dans une revue hal-00551952v1