Arnaud Virazel
100%
Libre accès
6
Documents
Affiliations actuelles
- 1100642
Identifiants chercheurs
- arnaud-virazel
- IdRef : 068454724
- ISNI : 0000000139422532
- 0000-0001-7398-7107
Présentation
Enseignant-chercheur au **LIRMM** dans l’équipe de recherche **TEST**: Test and dEpendability of microelectronic integrated SysTems.
<https://www.lirmm.fr/recherche/equipes/test>
**Cours** :
<http://www.lirmm.fr/~virazel/COURS/index.php?dir=L1%20-%20HLEE202/Cours/>
**Researchgate** :
[https://www.researchgate.net/profile/Arnaud\_Virazel](https://www.researchgate.net/profile/Arnaud_Virazel)
Publications
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Analysis of resistive defects on a foundry 8T SRAM-based IMC architectureMicroelectronics Reliability, 2023, 147, pp.115029. ⟨10.1016/j.microrel.2023.115029⟩
Article dans une revue
hal-04129470v1
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Analysis of Resistive-Open Defects on a Foundry 8T SRAM-based IMC Architecture17e Colloque National du GDR SoC², Jun 2023, Lyon, France
Communication dans un congrès
lirmm-04565688v1
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Intra-cell Resistive-Open Defect Analysis on a Foundry 8T SRAM-based IMC ArchitectureETS 2023 - 28th IEEE European Test Symposium, May 2023, Venise, Italy. ⟨10.1109/ETS56758.2023.10174107⟩
Communication dans un congrès
hal-04164663v1
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Analysis of Read Port Short Defects in an 8T SRAM-based IMC Architecture16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France
Communication dans un congrès
lirmm-03990078v1
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Preliminary Defect Analysis of 8T SRAM Cells for In-Memory Computing ArchitecturesDTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505101⟩
Communication dans un congrès
lirmm-03377433v1
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Preliminary Defect Analysis of 8T SRAM Cells Used for In-Memory Computing15e Colloque National du GDR SoC², Jun 2021, Rennes, France
Communication dans un congrès
lirmm-03994467v1
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