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Combining machine learning with finite element simulations for fast computation in power module failure Analysis due to wire bond degradation
Mehdi Ghrabli
,
Mounira Bouarroudj
,
Ludovic Chamoin
,
Emanuel Aldea
3rd IACM Digital Twins in Engineering Conference (DTE 2025) & 1st ECCOMAS Artificial Intelligence and Computational Methods in Applied Science (AICOMAS 2025), Feb 2025, Paris, France
Communication dans un congrès
hal-04992870
v1
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Investigating the Impact of Alignment Angle Between Copper Turns and Magnetic Core on Magnetic Field Coupling in PCB Integrated Inductors
Mohamed Alkurdi
,
Christian Martin
,
Mounira Bouarroudj
,
Mickael Petit
The 26th European Conference on Power Electronics and Applications, GDR SEEDS France & EPE Association, Mar 2025, Paris, France. ⟨10.34746/epe2025-0182⟩
Communication dans un congrès
hal-05106019
v1
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Hybrid modeling for remaining useful life prediction in power module prognosis
Mehdi Ghrabli
,
Mounira Bouarroudj
,
Ludovic Chamoin
,
Emanuel Aldea
25th International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2024, Catane, Italy. pp.1-9, ⟨10.1109/EuroSimE60745.2024.10491493⟩
Communication dans un congrès
hal-04425579
v1
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Physics informed Markov chains for remaining useful life prediction of wire bonds in power modules
Mehdi Ghrabli
,
Mounira Bouarroudj
,
Ludovic Chamoin
,
Emanuel Aldea
35th European Symposium of Reliability of Electronic Devices, Failure Physics and Analysis (ESREF 2024), Sep 2024, Parme, Italy
Communication dans un congrès
hal-04992850
v1
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Prédiction de la durée de vie restante d'un module de puissance par inférence bayesienne
Louis Schuler
,
Ludovic Chamoin
,
Zoubir Khatir
,
Mounira Bouarroudj-Berkani
,
Merouane Ouhab
Journée thématique de la F2M: Approches probabilistes en mécanique, 2023, Marne la Vallée, France
Communication dans un congrès
hal-04425601
v1
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Power Cycling Test of PCB-Embedded Power Packaging
Mounira Bouarroudj
,
Said Bensebaa
,
Mickael Petit
,
Stéphane Lefebvre
PCIM Europe 2023; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, May 2023, Nuremberg, Germany. ⟨10.30420/566091124⟩
Communication dans un congrès
hal-04364495
v1
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Non-intrusive electro-mechanical reduced model of IGBT power modules
Louis Schuler
,
Ludovic Chamoin
,
Zoubir Khatir
,
Mounira Bouarroudj-Berkani
,
Merouane Ouhab
et al.
24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EUROSIME 2023), 2023, Graz, Austria
Communication dans un congrès
hal-04424575
v1
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A non-intrusive multi-physics PGD-based reduced model for the prediction of power electronic module lifetime
Louis Schuler
,
Ludovic Chamoin
,
Zoubir Khatir
,
Mounira Bouarroudj-Berkani
,
Merouane Ouhab
6th International Workshop on Model Reduction Techniques, Nov 2023, Paris-Saclay, France
Communication dans un congrès
hal-04425570
v1
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Non-intrusive reduced order modelling for a coupled electro-thermo-mechanical problem
Louis Schuler
,
Ludovic Chamoin
,
Zoubir Khatir
,
Mounira Bouarroudj-Berkani
,
Merouane Ouhab
10th International Conference on Computational Methods for Coupled Problems in Science and Engineering (COUPLED 2023), 2023, Chania, Greece
Communication dans un congrès
hal-04424592
v1
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Probabilistic and Physics-Informed Machine Learning for Predictive Maintenance with Time Series Data
Phan-Anh Vu
,
Emanuel Aldea
,
Mounira Bouarroudj
,
S. Le Hégarat-Mascle
24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) 2023, Apr 2023, Graz, Austria. pp.1-8, ⟨10.1109/EuroSimE56861.2023.10100781⟩
Communication dans un congrès
hal-04364503
v1
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Non-intrusive electro-thermo-mechanical reduced model for diagnosis and prognostic on IGBT power modules
Louis Schuler
,
Ludovic Chamoin
,
Zoubir Khatir
,
Mounira Bouarroudj
,
Merouane Ouhab
2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Apr 2023, Graz, Austria. pp.1-9, ⟨10.1109/EuroSimE56861.2023.10100766⟩
Communication dans un congrès
hal-04363889
v1
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Non-intrusive multi-physics PGD-based reduced model for the modeling of power electronic modules
Louis Schuler
,
Ludovic Chamoin
,
Zoubir Khatir
,
Mounira Bouarroudj-Berkani
,
Merouane Ouhab
et al.
Model Reduction and Surrogate Modeling, 2022, Berlin, Germany
Communication dans un congrès
hal-04424548
v1
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Model reduction for sensitivity analysis of solder joint fracture in power electronic modules
Louis Schuler
,
Ludovic Chamoin
,
Zoubir Khatir
,
Mounira Bouarroudj-Berkani
,
Merouane Ouhab
et al.
International Conference on integrated Power Electronics Systems (CIPS), Mar 2022, Berlin, Germany
Communication dans un congrès
hal-03656148
v1
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Condition monitoring and evaluation of Ron degradation during power cycling in switching mode of SiC-Mosfets power modules
Ali Ibrahim
,
Richard Lallemand
,
Zoubir Khatir
,
Mounira Bouarroudj-Berkani
,
Damien Ingrosso
12th International Conference on Integrated Power Electronics Systems (CIPS 2022), Mar 2022, Berlin, Germany
Communication dans un congrès
hal-03656145
v1
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Construction d'un modèle réduit PGD pour l'étude de la fissuration thermo-mécanique des modules de puissance
Louis Schuler
,
Ludovic Chamoin
,
Zoubir Khatir
,
Mounira Berkani
,
Merouane Ouhab
et al.
15ème colloque national en calcul des structures, Université Polytechnique Hauts-de-France [UPHF], May 2022, 83400 Hyères-les-Palmiers, France
Communication dans un congrès
hal-03717595
v1
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Physicochemical-microstructural approach for modeling the crack passage at topside metallic parts in IGBT semiconductor power electronics
Mustafa Shqair
,
Zoubir Khatir
,
Ali Ibrahim
,
Mounira Bouarroudj-Berkani
,
Ayda Halouani
et al.
2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Apr 2022, St Julian, Malta. pp.1-6, ⟨10.1109/EuroSimE54907.2022.9758895⟩
Communication dans un congrès
hal-03656147
v1
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Experimental And Numerical Characterization Of PCB-Embedded Power Dies Using Solderless Pressed Metal Foam
Said Bensebaa
,
Mounira Bouarroudj-Berkani
,
Stéphane Lefebvre
,
Mickael Petit
,
N. Schmitt
Communication dans un congrès
hal-03380517
v1
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Design And Characterization Of PCB-Embedded Power Dies Using Solderless Pressed Metal Foam
Said Bensebaa
,
Mounira Bouarroudj-Berkani
,
Stéphane Lefebvre
,
Mickael Petit
PCIM Europe digital days 2020; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Jul 2020, Nuremberg, Germany
Communication dans un congrès
hal-03020871
v1
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Conducted Noise Investigation for IMS Based GaN HEMT Power Module by Black Box Model
Amina Gahfif
,
François Costa
,
Pierre-Etienne Lévy
,
Mounira Bouarroudj-Berkani
,
Bertrand Revol
et al.
Communication dans un congrès
hal-03266493
v1
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EMC “Black Box” model for unbalanced power electronic converters
Amina Gahfif
,
Pierre-Etienne Lévy
,
Marwan Ali
,
Mounira Bouarroudj-Berkani
,
François Costa
Communication dans un congrès
hal-03852584
v1
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Inductances enfouies au PCB pour l'électronique de puissance
Mickael Petit
,
Denis Labrousse
,
Stéphane Lefebvre
,
François Costa
,
Mounira Berkani
et al.
COMET, Elaboration de composants passifs magnétiques, CNES Toulouse, Apr 2018, Toulouse, France
Communication dans un congrès
hal-01802072
v1
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Surface analysis of smart power top metal: IR thermal measurement and source potential mapping
Mounira Berkani
,
Stéphane Lefebvre
,
Gilles Rostaing
,
Michel Riccio
,
Roberta Ruffilli
et al.
International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2016 28th, Jun 2016, Prague, Czech Republic. ⟨10.1109/ISPSD.2016.7520861⟩
Communication dans un congrès
hal-01681518
v1
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Analyse du vieillissement de la métallisation d'un MOSFET par la distribution du potentiel de source
Roberta Ruffilli
,
Mounira Berkani
,
Gilles Rostaing
,
Marc Legros
,
Stéphane Lefebvre
et al.
Symposium de Genie Electrique, Jun 2016, Grenoble, France
Communication dans un congrès
hal-01361625
v1
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Etude comparative de l'effet des contraintes électriques extrêmes - application aux composants " Smart Power
Gilles Rostaing
,
Mounira Berkani
,
Denis Labrousse
,
Stéphane Lefebvre
,
Philippe Dupuy
Symposium de Génie Électrique 2014, Jul 2014, Cachan, France
Communication dans un congrès
hal-01065246
v1
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Robustness Study of SiC MOSFET Under Harsh Electrical and Thermal Constraints
Mbarek Safa
,
Pascal Dherbécourt
,
O. Latry
,
Francois Fouquet
,
Othman Dhouha
et al.
CENICS, 2014, Lisbonne, Portugal
Communication dans un congrès
hal-01700474
v1
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3-D electrothermal simulation of active cycling on smart power MOSFETs during short-circuit and UIS conditions
Michele Riccio
,
Vincenzo d'Alessandro
,
Andrea Irace
,
Gilles Rostaing
,
Mounira Berkani
et al.
ESREF, 2014, Berlin, Germany
Communication dans un congrès
hal-01700470
v1
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Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications
Gilles Rostaing
,
Mounira Berkani
,
Stéphane Lefebvre
,
Zoubir Khatir
,
Philippe Dupuy
ESREF, 2013, Arcachon, France
Communication dans un congrès
hal-01700479
v1
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Robustness of 1.2 kV SiC MOSFET devices
Othman Dhouha
,
Stéphane Lefebvre
,
Mounira Berkani
,
Zoubir Khatir
,
Ali Ibrahim
et al.
ESREF, 2013, Arcachon, France
Communication dans un congrès
hal-01700475
v1
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Investigation of 1.2 kV investigation of SiC MOSFETs for aeronautics applications
Dhouha Othman
,
Stéphane Lefebvre
,
Mounira Berkani
,
Zoubir Khatir
,
Ali Ibrahim
et al.
Power Electronics and Applications (EPE), 2013 15th European Conference on, Sep 2013, Lille, France. pp.1-9, ⟨10.1109/EPE.2013.6634665⟩
Communication dans un congrès
hal-00881162
v1
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Etude du vieillissement de la couche de métallisation de composants de puissance à semi-conducteur
Sylvain Pietranico
,
Sylvie Pommier
,
Stéphane Lefebvre
,
Mounira Berkani
,
Zoubir Khatir
et al.
Électronique de Puissance du Futur, Jun 2010, Saint Nazaire, France. pp.1-10
Communication dans un congrès
hal-00713099
v1
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Failure modes and robustness of SiC JFET transistors under current limiting operations
Mounira Berkani
,
Stéphane Lefebvre
,
Othman Dhouha
,
Moumen Sabrine
,
Zoubir Khatir
et al.
Power Electronics and Applications (EPE 2011),, Aug 2011, Birmingham, United Kingdom. pp.1-10
Communication dans un congrès
hal-00713076
v1
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Investigations on ageing of IGBT transistors under repetitive short-circuits operations
Mounira Berkani
,
Stéphane Lefebvre
,
Zoubir Khatir
,
Serge Bontemps
International Conference & Exhibition on Power Electronics/Intelligent Motion/Power Quality, Jun 2009, Shanghai, China. pp.237-242
Communication dans un congrès
hal-00538554
v1
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Temperature Levels Effects on the Thermo-Mechanical Behaviour of Solder Attach During Thermal Cycling of Power Electronic Modules
Mounira Bouarroudj-Berkani
,
Zoubir Khatir
,
Stéphane Lefebvre
Power Electronics Specialists Conference, 2008. PESC 2008. IEEE, Jun 2008, Rhodes, Greece
Communication dans un congrès
hal-01677164
v1
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Comparison of stress distributions and failure modes during thermal cycling and power cycling on high power IGBT modules
Mounira Bouarroudj
,
Zoubir Khatir
,
Jean Pierre Ousten
,
Laurent Dupont
,
Stéphane Lefebvre
et al.
EPE 2007 - 12th European Conference on Power Electronics and Applications, Sep 2007, Aalborg, Denmark. 10p, ⟨10.1109/EPE.2007.4417457⟩
Communication dans un congrès
hal-01702003
v1
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Ageing Test Results of low voltage MOSFET Modules for Electrical Vehicles
Laurent Dupont
,
Stéphane Lefebvre
,
Mounira Bouarroudj
,
Zoubir Khatir
,
Jean-Claude Faugieres
et al.
EPE 2007 - 12th European Conference on Power Electronics and Applications, Sep 2007, Aalborg, Denmark. 10p
Communication dans un congrès
hal-01701952
v1
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Degradation behavior of 600V-200A IGBT modules under Power cycling and high temperature environment conditions
Mounira Bouarroudj
,
Zoubir Khatir
,
Jean Pierre Ousten
,
Frédéric Badel
,
Laurent Dupont
et al.
18th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2007, BORDEAUX, France. pp. 1719-1724, ⟨10.1016/j.microrel.2007.07.027⟩
Communication dans un congrès
hal-01702036
v1
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