BR
Bruno Rouzeyre
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Documents
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- bruno-rouzeyre
- IdRef : 07124705X
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Sensitivity to Laser Fault Injection: CMOS FD-SOI vs. CMOS bulkIEEE Transactions on Device and Materials Reliability, 2019, 19 (1), pp.6-15. ⟨10.1109/TDMR.2018.2886463⟩
Article dans une revue
hal-01971932v1
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A Comprehensive Approach to a Trusted Test InfrastructureIVSW 2019 - 4th IEEE International Verification and Security Workshop, Jul 2019, Rhodes, Greece. pp.43-48, ⟨10.1109/IVSW.2019.8854428⟩
Communication dans un congrès
lirmm-02306980v1
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