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Claudio Lazzari
79
Documents
Researcher identifiers
claudio-lazzari-
0000-0003-3703-0302
- Google Scholar : https://scholar.google.com/citations?user=Op4-kSAAAAAJ&hl=es
- IdRef : 130835722
Presentation
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An Analysis and Design Technique to Reduce SET Sensitivity in Combinational Integrated Circuits16th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-Soc'08), Oct 2008, Rhodes Island, Greece. pp.114-117
Conference papers
hal-01408783v1
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SET-Factor: An Analysis and Design Tool to Reduce SET Sensitivity in Integrated Circuits13th IEEE European Test Symposium (ETS'08), May 2008, Verbania, Italy
Conference papers
hal-01408791v1
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The location of the host and other resources by Chagas disease vectors.Workshop of the SSA-American Trypanosimiasis Update Project, Apr 2007, ASUNCION, Paraguay
Conference papers
hal-00196047v1
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Efficient Timing Closure with a Transistor Level Design FlowIFIP International Conference on Very Large Scale Integration (VLSI-SoC'07), Oct 2007, Atlanta, GA, United States. pp.312-315
Conference papers
hal-01408793v1
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A neuroanatomical guide of the cercal scape system of the wood cricket.7th International Congress of Comparative Physiology and Biochemistry (ICCPB), Apr 2007, BAHIA, Brazil. pp.S33
Conference papers
hal-00196049v1
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SET fault injection methods in analog circuits: case study8th Latin-American Test Workshop (LATW'07), Mar 2007, Cuzco, Peru. pp.155-160
Conference papers
hal-00156749v1
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Efficient Transistor Sizing for Soft Error Protection in Combinational Logic Circuits2nd International Workshop on Dependable Circuit Design (DECIDE’07), Dec 2007, Buenos Aires, Argentina
Conference papers
hal-01408792v1
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Behavioural physiology of blood-sucking bugs.7th International Congress of Comparative Physiology and Biochemistry (ICCPB), Aug 2007, Bahia, Brazil. pp.130-131
Conference papers
hal-00196048v1
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Phase-Locked Loop Automatic Layout Generation and Transient Fault Injection Analysis: A Case Study12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006, Lake Como, Italy. pp.165-172, ⟨10.1109/IOLTS.2006.48⟩
Conference papers
hal-00143423v1
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Multiple Defects Tolerant Devices for Unreliable Future NanotechnologiesIEEE Latin American Test Workshop (LATW'06), Mar 2006, Buenos Aires, Argentina
Conference papers
hal-01408796v1
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On implementing a soft error hardening technique by using an automatic layout generator: case study11th-IEEE-International-On-Line-Testing-Symposium., 2005, French Riviera, France. pp.29-34, ⟨10.1109/IOLTS.2005.45⟩
Conference papers
hal-00015449v1
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Soft error circuit hardening techniques implementation using an automatic layout generatorProceedings of IEEE Latin American Test Workshop (LATW'05), Mar 2005, Salvador Bahia, Brazil. pp.175-180
Conference papers
hal-00460557v1
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Orientation Towards Hosts in Haematophagous Insects: An Integrative PerspectiveElsevier Ltd. Advances in Insect Phyiology, Elsevier Ltd, Vol. 37, pp. 1-58, 2009, ⟨10.1016/S0065-2806(09)37001-0⟩
Book sections
hal-00435805v1
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Circadian rhythms in insectsMaría Luisa Fanjul-Moles and Raúl Aguilar Roblero. Comparative Aspects of Circadian Rhythms, Transworld Research Network, pp.75-92, 2008
Book sections
hal-00402506v1
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A Transistor Placement Technique Using Genetic Algorithm And Analytical ProgrammingVLSI-SOC: From Systems to Silicon, (selected contributions from VLSI-SoC'05), Springer, pp.331-344, Vol.240, 2007, Series: IFIP International Federation for Information Processing, ⟨10.1007/978-0-387-73661-7_21⟩
Book sections
hal-00191996v1
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Les punaises de lit : impacts, prévention et lutteSaisine n°2021-SA-0147, Anses. 2023, 257 p
Reports
anses-04171363v1
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Transistor Level Automatic Generation of Radiation-Hardened CircuitsMicro and nanotechnologies/Microelectronics. Institut National Polytechnique de Grenoble - INPG, 2007. English. ⟨NNT : ⟩
Theses
tel-00198470v1
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