
Corentin Durand
44
Documents
Présentation
Publications
Publications
Epitaxial Topological Insulator Bi1 xSbx lms on GaAs substrates for Spintronic applicationsJournées de la Matière Condensée, Société Française de Physique, Oct 2024, Marseille, France
Communication dans un congrès
hal-04949065
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Characterization of epitaxial Bi1-xSbx topological insulator thin films on GaAs(111) substratesJournées de la Matière Condensée 2024, Société Française de Physique, Oct 2024, Marseille, France
Communication dans un congrès
hal-04946094
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Topological insulator Bi1-xSbx films on GaAs substrates as current-induced Spin-Orbit Torques generators2023 E-MRS Fall Meeting, E-MRS, Sep 2023, Warsaw (Varsovie), Poland
Communication dans un congrès
hal-04297125
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Electronic properties of selective area grown semiconductor heterostructuresJournées du GDR Nanosciences with near-field microscopy under ultra high vacuum 2021, Nov 2021, Toulouse, France
Communication dans un congrès
hal-03606187
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Au(111) characterization, single atom manipulation and Si(100):H surface imaging by LT-UHV-4P-STM.AVS 63rd International Symposium & Exhibition , Nov 2016, Nashville TN United States
Communication dans un congrès
hal-01745411
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Electrical characterization of semiconductor nanowires by scanning tunneling microscopySPIE Photonics West, OPTO, Conference 8996 - Quantum Dots and Nanostructures : Synthesis, Characterization, and Modeling XI, 2014, San Francisco, CA, United States. 89960E, 10 p., ⟨10.1117/12.2042767⟩
Communication dans un congrès
hal-00974539
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Nanoscale transport measurements with multiple probe scanning tunneling microscopy16th International Congress of Metrology, 2013, Paris, France. S20 Nanotechnology, 13001, 4 p., ⟨10.1051/metrology/201313001⟩
Communication dans un congrès
hal-00877775
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Ionisation par impact dans les jonctions p-n de silicium16ème Forum des Microscopies à Sondes Locales, Mar 2013, Spa, Belgique
Communication dans un congrès
hal-00956271
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Electrical transport measurements of individual III-V semiconductor nanowires with reconstructed sidewallsInternational Conference on Nanoscience and Technology, ICN+T 2012, 2012, Paris, France
Communication dans un congrès
hal-00798122
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Étude des propriétés électroniques de nanofils semiconducteurs d'InAs par microscopie à effet tunnel basse température et quatre pointes14ème Forum des Microscopies à Sonde Locale, 2011, Ecully, France
Communication dans un congrès
hal-00807239
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Combined STM and four-probe resistivity measurements on single semiconductor nanowires1st AtMol International Workshop on Atomic Scale Interconnection Machine, Jun 2011, Singapore, Singapore. pp.107-118, ⟨10.1007/978-3-642-28172-3_8⟩
Communication dans un congrès
istex
hal-00800076
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Electrical transport measurements and topography of III-V semiconductor nanowires by four probe and low temperature scanning tunneling microscopyMaterials Research Society Fall Meeting, MRS Fall 2011, Symposium BB : Semiconductor nanowires for photovoltaics, 2011, Boston, MA, United States
Communication dans un congrès
hal-00807581
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Electrical transport measurements and topography of semiconductor nanowires by four probe and low temperature scanning tunneling microscopyHerodot Summer School, 2011, Cargese, France
Communication dans un congrès
hal-00807584
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Electrical transport measurements and topography of III-V semiconductor nanowires by four probe and low temperature scanning tunneling microscopy4th Plenary Workshop of GdR Nanofils Semiconducteurs, 2011, Porquerolles, France
Communication dans un congrès
hal-00807242
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Four-point probe measurements at the nanoscaleHerodot Summer School, 2011, Cargese, France
Communication dans un congrès
hal-00807585
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Nanopackaging of Si(100)H Wafer for Atomic-Scale InvestigationsOn-Surface Atomic Wires and Logic Gates, pp.25-51, 2017, ⟨10.1007/978-3-319-51847-3_2⟩
Chapitre d'ouvrage
hal-02084802
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Phénomènes de transport dans les nanostructures semi-conductrices étudiés par microscopie à effet tunnel à pointes multiples2012
Autre publication scientifique
hal-00799310
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