
Florence Azais
231
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Publications
Digital Generation of RF Phase-Modulated Test Stimuli: Application to BPSK Modulation SchemeDFT 2024 - 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Didcot, United Kingdom. pp.1-6, ⟨10.1109/DFT63277.2024.10753528⟩
Communication dans un congrès
lirmm-04827861
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Low-Resource Fully-Digital BPSK Demodulation Technique for Intra-Body Wireless Sensor NetworksI2MTC 2024 - IEEE International Instrumentation and Measurement Technology Conference, May 2024, Glasgow, United Kingdom. pp.1-6, ⟨10.1109/I2MTC60896.2024.10561051⟩
Communication dans un congrès
lirmm-04630465
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Low-cost generation of RF test stimuli from baseband digital signalsATS 2024 - 33rd IEEE Asian Test Symposium, Dec 2024, Ahmedabad, India. In press
Communication dans un congrès
lirmm-04868000
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Digital generation of single tone FM/PM test stimuli: a theoretical analysisLATS 2024 - 25th IEEE Latin American Test Symposium, Apr 2024, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS62223.2024.10534627⟩
Communication dans un congrès
lirmm-04689333
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Logic Locking: Exploration of a new key-gate based on tristate logicLATS 2024 - 25th IEEE Latin American Test Symposium, Apr 2024, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS62223.2024.10534598⟩
Communication dans un congrès
lirmm-04564164
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Low-cost digital solution for production test of ZigBee transmitters - Special Session “AMS-RF testing”LATS 2023 - 24th IEEE Latin American Test Symposium, Mar 2023, Veracruz, Mexico. pp.1-2, ⟨10.1109/LATS58125.2023.10154484⟩
Communication dans un congrès
lirmm-04257082
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Leveraging Layout-based Effects for Locking Analog ICsASHES 2022 - 6th Workshop on Attacks and Solutions in Hardware Security @CCS 2022, Nov 2022, Los Angeles, CA, United States. pp.5-13, ⟨10.1145/3560834.3563826⟩
Communication dans un congrès
lirmm-04080258
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Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuliETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-6, ⟨10.1109/ETS50041.2021.9465473⟩
Communication dans un congrès
lirmm-03426321
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Digital test of ZigBee transmitters: Validation in industrial test environmentDATE 2021 - 24th Design, Automation and Test in Europe Conference and Exhibition, Feb 2021, Grenoble, France. pp.396-401, ⟨10.23919/DATE51398.2021.9474090⟩
Communication dans un congrès
lirmm-03426209
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Exploring on-line RF performance monitoring based on the indirect test strategyLATS 2021 - 22nd IEEE Latin American Test Symposium, Oct 2021, Punta del Este (virtual), Uruguay. pp.1-7, ⟨10.1109/LATS53581.2021.9651743⟩
Communication dans un congrès
lirmm-03426373
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Low-cost testing of a 2.4GHz ZigBee transmitter using standard digital ATEETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia
Communication dans un congrès
lirmm-03001537
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Implementing indirect test of RF circuits without compromising test quality: a practical case studyLATS 2020 - 21st IEEE Latin American Test Symposium, Mar 2020, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS49555.2020.9093666⟩
Communication dans un congrès
lirmm-03000910
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EVM measurement of RF ZigBee transceivers using standard digital ATEDFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250900⟩
Communication dans un congrès
lirmm-03000882
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Indirect test of RF circuits using ensemble methodsETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia
Communication dans un congrès
lirmm-03001530
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Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICsIOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩
Communication dans un congrès
lirmm-02993384
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The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated CircuitsSETS 2019 - South European Test Seminar, 2019, Pitztal, Austria
Communication dans un congrès
lirmm-02375866
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Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled AcquisitionETS 2019 - 24th IEEE European Test Symposium, May 2019, Baden-Baden, Germany. ⟨10.1109/ETS.2019.8791540⟩
Communication dans un congrès
lirmm-02274367
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The use of ensemble methods for indirect test of RF circuits13e Colloque National du GDR SOC², Jun 2019, Montpellier, France
Communication dans un congrès
lirmm-02375900
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Which metrics to use for RF indirect test strategy?SMACD 2019 - 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Jul 2019, Lausanne, Switzerland. pp.73-76, ⟨10.1109/SMACD.2019.8795302⟩
Communication dans un congrès
lirmm-02338027
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Use of ensemble methods for indirect test of RF circuits: can it bring benefits?LATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. pp.1-6, ⟨10.1109/LATW.2019.8704641⟩
Communication dans un congrès
lirmm-02338047
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Test of 2.4 GHz ZigBee Transmitter using Standard Digital ATESETS 2019 - South European Test Seminar, 2019, Pitztal, Austria
Communication dans un congrès
lirmm-02375880
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Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologiesLATS 2018 - 19th IEEE Latin American Test Symposium, Mar 2018, Sao Paulo, Brazil. ⟨10.1109/LATW.2018.8349696⟩
Communication dans un congrès
lirmm-02064921
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Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATEIOLTS: International On-Line Testing Symposium, Jul 2018, Platja d'Aro, Spain. pp.17-22, ⟨10.1109/IOLTS.2018.8474229⟩
Communication dans un congrès
lirmm-01997910
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Analytical Study of On-chip Generations of Analog Sine-wave Based on Combined Digital SignalsIMSTW: International Mixed Signals Testing Workshop, Jul 2017, Thessaloniki, Greece. ⟨10.1109/IMS3TW.2017.7995205⟩
Communication dans un congrès
lirmm-01699387
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Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditionsETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968208⟩
Communication dans un congrès
hal-01709615
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Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI TechnologyISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.320-325, ⟨10.1109/ISVLSI.2017.63⟩
Communication dans un congrès
hal-01709614
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Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurationsISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, PA, United States. pp.164-169, ⟨10.1109/ISVLSI.2016.102⟩
Communication dans un congrès
lirmm-01374292
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Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defectLATS: Latin-American Test Symposium, Mar 2016, Foz do Iguacu, Brazil. pp.129-134, ⟨10.1109/LATW.2016.7483352⟩
Communication dans un congrès
lirmm-01374300
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Toward adaptation of ADCs to operating conditions through on-chip correctionISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.634-639, ⟨10.1109/ISVLSI.2015.62⟩
Communication dans un congrès
lirmm-01233117
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A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal AcquisitionETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. pp.1-6, ⟨10.1109/ETS.2015.7138761⟩
Communication dans un congrès
lirmm-01233093
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A framework for efficient implementation of analog/RF alternate test with model redundancyISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.621-626, ⟨10.1109/ISVLSI.2015.30⟩
Communication dans un congrès
lirmm-01233104
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A generic methodology for building efficient prediction models in the context of alternate testingIMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. ⟨10.1109/IMS3TW.2015.7177873⟩
Communication dans un congrès
lirmm-01233150
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Embedded test instrument for on-chip phase noise evaluation of analog/IF signalsDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.237-242, ⟨10.1109/DDECS.2015.11⟩
Communication dans un congrès
lirmm-01233136
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Digital on-chip measurement circuit for built-in phase noise testingIMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. ⟨10.1109/IMS3TW.2015.7177880⟩
Communication dans un congrès
lirmm-01233161
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Analog test: Why still “à la mode” after more than 25 years of research?ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. ⟨10.1109/ETS.2015.7138772⟩
Communication dans un congrès
lirmm-01922917
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A digital technique for the evaluation of SSB phase noise of analog/RF signalsLATS: Latin-American Test Symposium, Mar 2015, Puerto Vallarta, Mexico. ⟨10.1109/LATW.2015.7102407⟩
Communication dans un congrès
lirmm-01233125
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Special session: Hot topics: Statistical test methodsVTS: VLSI Test Symposium, Apr 2015, Napa, CA, United States. ⟨10.1109/VTS.2015.7116265⟩
Communication dans un congrès
hal-01177043
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Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter moduleIMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto ALegre, Brazil. ⟨10.1109/IMS3TW.2014.6997401⟩
Communication dans un congrès
lirmm-01119365
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Stochastic model for phase noise measurement from 1-bit signal acquisitionIMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto Alegre, Brazil. ⟨10.1109/IMS3TW.2014.6997400⟩
Communication dans un congrès
lirmm-01119368
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Solutions for the self-adaptation of communicating systems in operationIOLTS: International On-line Test Symposium, Jul 2014, Platja d’Aro, Spain. pp.234-239, ⟨10.1109/IOLTS.2014.6873705⟩
Communication dans un congrès
hal-01118068
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Low-cost phase noise testing of complex RF ICs using standard digital ATEITC: International Test Conference, Oct 2014, Seattle, WA, United States. ⟨10.1109/TEST.2014.7035301⟩
Communication dans un congrès
lirmm-01119356
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Phase noise measurement on IF analog signals using standard digital ATE resourcesNEWCAS: New Circuits and Systems, Jun 2014, Trois-Rivieres, Canada. pp.121-124, ⟨10.1109/NEWCAS.2014.6933998⟩
Communication dans un congrès
lirmm-01119359
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New implementions of predictive alternate analog/RF test with augmented model redundancyDATE 2014 - 17th Design, Automation and Test in Europe Conference and Exhibition, Mar 2014, Dresden, Germany. ⟨10.7873/DATE2014.144⟩
Communication dans un congrès
lirmm-00994714
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Self-Adaptive NFC SystemsIOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain
Communication dans un congrès
lirmm-01084355
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Investigations on alternate analog/RF test with model redundancySTEM Workshop, May 2014, Paderborn, Germany
Communication dans un congrès
lirmm-01119374
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Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testingLATW: Latin American Test Workshop, Mar 2014, Fortaleza, Brazil. ⟨10.1109/LATW.2014.6841930⟩
Communication dans un congrès
lirmm-01119361
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Pre-characterization Procedure for a Mixed Mode Simulation of IR-Drop Induced DelaysLATW: Latin American Test Workshop, Apr 2013, Cordoba, Argentina. ⟨10.1109/LATW.2013.6562657⟩
Communication dans un congrès
lirmm-00820067
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MIRID: Mixed-Mode IR-Drop Induced Delay SimulatorATS: Asian Test Symposium, Nov 2013, Jiaosi Township, Taiwan. pp.177-182, ⟨10.1109/ATS.2013.41⟩
Communication dans un congrès
lirmm-00932357
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Accurate and Efficient Analytical Electrical Model of Antenna for NFC ApplicationsNEWCAS: New Circuits and Systems, Jun 2013, Paris, France. pp.137-141, ⟨10.1109/NEWCAS.2013.6573657⟩
Communication dans un congrès
lirmm-00839190
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Self-test and self-calibration of a MEMS convective accelerometerDTIP: Design, Test, Integration & Packaging of MEMS/MOEMS, Apr 2013, Barcelona, Spain. pp.239-242
Communication dans un congrès
lirmm-00814231
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A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing3rd IEEE International Workshop on Test and Validation of High Speed Analog Circuits, Sep 2013, Anaheim, CA, United States
Communication dans un congrès
lirmm-00985422
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Low-cost SNR estimation of analog signals using standard digital Automated Test Equipment (ATE)NEWCAS: International New Circuits and Systems Conference, Jun 2012, Montréal, Canada. pp.197-200, ⟨10.1109/NEWCAS.2012.6328990⟩
Communication dans un congrès
lirmm-00803558
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Design-for-manufacturability of MEMS convective accelerometers through adaptive electrical calibration strategyLATW: Latin American Test Workshop, Apr 2012, Quito, Ecuador. ⟨10.1109/LATW.2012.6261237⟩
Communication dans un congrès
lirmm-00803451
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An IR-Drop Simulation Principle Oriented to Delay TestingDCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.404-409
Communication dans un congrès
lirmm-00804254
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Smart selection of indirect parameters for DC-based alternate RF IC testingVTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.19-24, ⟨10.1109/VTS.2012.6231074⟩
Communication dans un congrès
lirmm-00803453
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Making predictive analog/RF alternate test strategy independent of training set sizeITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.9, ⟨10.1109/TEST.2012.6401560⟩
Communication dans un congrès
lirmm-00803564
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On the use of redundancy to reduce prediction error in alternate analog/RF testIMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, May 2012, Taipei, Taiwan. pp.34-39, ⟨10.1109/IMS3TW.2012.17⟩
Communication dans un congrès
lirmm-00803556
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Investigation on the Effect of Geometrical Dimensions on the Conductive Behaviour of a MEMS Convective AccelerometerDTIP'11: Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Aix-en-Provence, France. pp.14-17
Communication dans un congrès
lirmm-00632610
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Level-Crossing based QAM Demodulation for Low-Cost Analog/RF TestingNEWCAS: International New Circuits and Systems Conference, Jun 2011, Bordeaux, France. pp.309-312, ⟨10.1109/NEWCAS.2011.5981317⟩
Communication dans un congrès
lirmm-00702763
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Test and Calibration of MEMS Convective Accelerometers with a Fully Electrical SetupLATW: Latin American Test Workshop, Mar 2011, Porto de Galinhas, Brazil. ⟨10.1109/LATW.2011.5985907⟩
Communication dans un congrès
lirmm-00702769
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A MEMS Convective Accelerometer Equipped with On-Chip Facilities for Sensitivity Electrical CalibrationIMS3TW'11: IEEE International Mixed-Signals, Sensors and Systems Test Workshop, United States. pp.82-87, ⟨10.1109/IMS3TW.2011.21⟩
Communication dans un congrès
lirmm-00702759
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An Electrical Test Method for MEMS Convective Accelerometers: Development and EvaluationDATE: Design, Automation and Test in Europe, Mar 2011, Grenoble, France. ⟨10.1109/DATE.2011.5763137⟩
Communication dans un congrès
lirmm-00702754
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A Study of Package Effects on the Behavior of MEMS Convective AccelerometersDTIP'10: Design, Test, Integration and Packaging of MEMS/MOEMS, Seville, Spain. pp.6-9
Communication dans un congrès
lirmm-00489026
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AM-Demodulation of Analog/RF Signals Using Digital Tester ChannelsIMS3TW 2010 - 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, Jun 2010, La Grande Motte, France. ⟨10.1109/IMS3TW.2010.5503013⟩
Communication dans un congrès
lirmm-00494546
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ANC-Based Method for Testing Converters with Random-Phase HarmonicsIMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès
lirmm-00494578
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Experiments on the Analysis of Phase/Frequency-Modulated RF Signals Using Digital Tester ChannelsLATW'10: 11th Latin-American Test Workshop, Punta del Este, Uruguay. pp.N/A
Communication dans un congrès
lirmm-00473524
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Adaptive LUT-Based System for In Situ ADC Auto-correctionIMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès
lirmm-00494424
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On the Use of Standard Digital ATE for the Analysis of RF SignalsETS 2010 - 15th IEEE European Test Symposium, May 2010, Prague, Czech Republic. pp.43-48, ⟨10.1109/ETSYM.2010.5512782⟩
Communication dans un congrès
lirmm-00492828
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Modeling the Influence of Etching Defects on the Sensitivity of MEMS Convective AccelerometersIMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès
lirmm-00494555
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LH-BIST for Digital Correction of ADC OffsetDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.199-203
Communication dans un congrès
lirmm-00375659
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A Method for Electrical Calibration of MEMS Accelerometers Through Multivariate RegressionIMS3TW'09: IEEE 15th Mixed-Signals, Sensors and Systems Test Workshop, Jun 2009, pp.N/A
Communication dans un congrès
lirmm-00399110
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An Analysis of the Timing Behavior of CMOS Digital Blocks under Simultaneous Switching Noise ConditionsDDECS'09: IEEE Design and Diagnostics of Electronic Circuits and Systems, Apr 2009, Liberec, Czech Republic. pp.158-163
Communication dans un congrès
lirmm-00386906
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Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals using Digital ATEATS: Asian Test Symposium, 2009, Taichung, Taiwan. pp.261-266, ⟨10.1109/ATS.2009.56⟩
Communication dans un congrès
lirmm-00436384
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Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split ModelsDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229
Communication dans un congrès
lirmm-00370798
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Analyzing the Impact of Simultaneous Switching Noise on the Timing Behavior of CMOS Digital BlocksLATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A
Communication dans un congrès
lirmm-00367718
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A Multi-Converter DFT Technique for Complex SIP: Concepts and ValidationECCTD: European Conference on Circuit Theory and Design, Aug 2009, Antalya, Turkey. pp.747-750
Communication dans un congrès
lirmm-00448863
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Investigations on Electrical-only Test Setup for MEMS Convective AccelerometerICSCS: International Conference on Signals, Circuits and Systems, Nov 2009, Medenine, Tunisia. ⟨10.1109/ICSCS.2009.5412624⟩
Communication dans un congrès
lirmm-00436265
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Transit Time Extraction Method for ESD Protection Diodes ModelIEW'08: International ESD Workshop, Port d'Albret, France
Communication dans un congrès
lirmm-00337884
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Evaluation of a Fully Electrical Test and Calibration Method for MEMS Capacitive AccelerometersIMS3TW'08: 14th IEEE International Mixed-Signals, Sensor, and Systems Test Workshop, Jun 2008, Vancouver, Canada, pp.6, ⟨10.1109/IMS3TW.2008.4581616⟩
Communication dans un congrès
lirmm-00337875
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A Novel Method for Test and Calibration of Capacitive Accelerometers with a Fully Electrical SetupDDECS 2008 - 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2008, Bratislava, Slovakia. ⟨10.1109/DDECS.2008.4538807⟩
Communication dans un congrès
lirmm-00337873
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A Physics-Based Compact Model for ESD Protection Diodes under Very Fast Transients30th Annual EOS/ESD Symposium, Sep 2008, Tuscon, Arizona, USA, pp.9
Communication dans un congrès
lirmm-00337880
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On-Chip Monitor for the Detection of Logic Errors due to Simultaneous Switching NoiseLATW'08: 9th Latin-American Test Workshop, Puebla, Mexico, pp.11-16
Communication dans un congrès
lirmm-00260194
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Conception de MEMS : de l'idée à l'integration SoC/SiPGDR SoC-SiP: System-On-Chip & Sytem-In-Package, Jun 2008, Paris, France
Communication dans un congrès
lirmm-00361232
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On the Detection of SSN-Induced Logic Errors Through On-Chip MonitoringIOLTS: International On-Line Testing Symposium, Jul 2008, Rhodes, Greece. pp.233-238, ⟨10.1109/IOLTS.2008.19⟩
Communication dans un congrès
lirmm-00294767
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Analyzing the Logic Behavior of Digital CMOS Circuits in Presence of Simultaneous Switching NoiseLATW: Latin American Test Workshop, Mar 2007, Cuzco, Peru
Communication dans un congrès
lirmm-00199261
v1
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Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOCETS: European Test Symposium, May 2007, Freiburg, Germany. pp.211-216, ⟨10.1109/ETS.2007.1⟩
Communication dans un congrès
lirmm-00158527
v1
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Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave GeneratorsIMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, Povoa de Varzim, Portugal. pp.196-201
Communication dans un congrès
lirmm-00161708
v1
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Characterization of the Transient Behavior of Gated/STI Diodes and their Associated BJT in the CDM Time DomainEOS/ESD'07: 29th Electrical Overstress/Electrostatic Discharge Symposium, Sep 2007, Anaheim, CA, USA, pp.3A.2_1- 3A.2_10, ⟨10.1109/EOSESD.2007.4401748⟩
Communication dans un congrès
lirmm-00199232
v1
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Impact of Simultaneous Switching Noise on the Static Behavior of Digital CMOS CircuitsATS: Asian Test Symposium, Oct 2007, Beijing, China. pp.239-244
Communication dans un congrès
lirmm-00179262
v1
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On the Use of LVTPNP in ESD Protection StructuresIEW'07: International Electrostatic Discharge Workshop, May 2007, Lake Tahoe, CA, United States
Communication dans un congrès
lirmm-00199246
v1
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Experimental Validation of the "Analogue Network of Converters" Technique to Test Complex SiP/SoCIEEE International Mixed-Signal Testing Workshop, Jun 2006, Paris, France. pp.84-88
Communication dans un congrès
lirmm-00119266
v1
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Partially Depleted SOI Body-Contacted MOSFET-Triggered Silicon Controlled Rectifier for ESD ProtectionEOS/ESD Symposium, Sep 2006, Tucson (USA), pp.6
Communication dans un congrès
lirmm-00112952
v1
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A simulation tool for CDM stress evaluation at circuit levelEOS/ESD/EMI Workshop, May 2006, Toulouse, France. pp.89-92
Communication dans un congrès
lirmm-00112986
v1
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On the Testing of the Electronic Conditioning Chain of a CMOS MEMS Based Magnetic Field SensorLATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, Argentina. pp.29-34
Communication dans un congrès
lirmm-00102750
v1
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Electro-thermal short pulsed simulation for SOI technologyESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Oct 2006, Wuppertal, Germany
Communication dans un congrès
lirmm-00112981
v1
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“Analogue Network of Converters”: A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOCETS: European Test Symposium, May 2006, Southampton, United Kingdom. pp.159-164
Communication dans un congrès
lirmm-00115676
v1
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VHDL-AMS Fault Simulation for Testing DNA Bio-Sensing ArraysIEEE SENSORS, Oct 2005, Irvine, United States. ⟨10.1109/ICSENS.2005.1597878⟩
Communication dans un congrès
lirmm-00106042
v1
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Analysis and Attenuation Proposal in Ground Bounce: IILATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.34-39
Communication dans un congrès
lirmm-00106514
v1
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Electro-Thermal On-Line Testing of a MEMS Magnetometer Through Bias ModulationLATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.213-218
Communication dans un congrès
lirmm-00106517
v1
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On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field SensorVTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.213-218
Communication dans un congrès
lirmm-00105996
v1
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Fast and Fully-Efficient Test Flow for ADCsIMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.244-249
Communication dans un congrès
lirmm-00106523
v1
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BIST Implementation of Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field SensorLATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.207-212
Communication dans un congrès
lirmm-00106516
v1
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Design&Test of an Oscillation Based System Architecture for DNA Sensor ArraysIMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.234-239
Communication dans un congrès
lirmm-00106525
v1
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Test of a CMOS Micro Compass2nd PATENT-DfMM Summer School, Sep 2005
Communication dans un congrès
lirmm-00106560
v1
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Testing the Interconnect Networks and I/O Resources of Field Programmable Analog ArraysVTS: VLSI Test Symposium, May 2005, Palm Springs, CA, United States. pp.389-400, ⟨10.1109/VTS.2005.85⟩
Communication dans un congrès
lirmm-00105998
v1
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Towards On-Line Testing of MEMS Using Electro-Thermal ExcitationETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.76-81
Communication dans un congrès
lirmm-00106009
v1
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Comparison Between 0.13 µm PD-SOI Gated Diode and non Gated Diode through DC TCAD SimulationsEUROSOI'05, Jan 2005, Grenade, Spain
Communication dans un congrès
lirmm-00106519
v1
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Physics and Design Optimization of ESD Diode for 0.13mm PD-SOI TechnologyEOS/ESD: Electrical Overstress/Electrostatic Discharge, Sep 2005, Anaheim, United States
Communication dans un congrès
lirmm-00106041
v1
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Superposition vs. Modulation: A Comparative Analysis for Electro-Thermal On-Line MEMS TestingIMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.212-219
Communication dans un congrès
lirmm-00106522
v1
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Optimised Probing Flow for High Speed Fault LocalizationISTFA'04: International Symposium on Testing and Failure Analysis, Nov 2004, Worcester (USA)
Communication dans un congrès
lirmm-00108898
v1
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Testing the Configurable Analog Blocks of Field Programmable Analog ArraysITC: International Test Conference, Oct 2004, Charlotte, United States. pp.893-902
Communication dans un congrès
lirmm-00108897
v1
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Towards Low-Cost Testing of Analog-to-Digital ConvertersWorkshop on the Testing of High Resolution Mixed-Signal Interfaces, 2004
Communication dans un congrès
lirmm-00109143
v1
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Testing Global Interconnects of Field Programmable Analog ArraysIMSTW'04: 10th International Mixed-Signal Testing Workshop, Jun 2004, Portland, Oregon, United States
Communication dans un congrès
lirmm-00108657
v1
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Analysis and Attenuation Proposal in Ground BounceATS: Asian Test Symposium, Nov 2004, Kenting Taiwan. pp.460-463, ⟨10.1109/ATS.2004.25⟩
Communication dans un congrès
lirmm-00108931
v1
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Test Digital, Test de Mémoires, Test Mixte : 5 Centres de Compétence pour la Formation en EuropeCNFM'04 : 8ème Journées Pédagogiques du Comité National de Formation en Microélectronique, 2004, Saint Malo, France. p. 242
Communication dans un congrès
lirmm-00108671
v1
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Investigations on the Use of EWS Data for Failure Diagnosis EnhancementLATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena (Colombia), pp.6-10
Communication dans un congrès
lirmm-00108652
v1
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On the Use of Electrical Stimuli for MEMS TestingLATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.118-122
Communication dans un congrès
lirmm-00108651
v1
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Electrically-Induced Thermal Stimuli for MEMS TestingETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.60-65
Communication dans un congrès
lirmm-00108904
v1
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An Approach to the Built-in-Self of Field Programmable Analog ArraysVTS: VLSI Test Symposium, Apr 2004, Napa Valley, CA, United States. pp.383-388
Communication dans un congrès
lirmm-00108908
v1
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On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static ErrorsLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.198-203
Communication dans un congrès
lirmm-00269498
v1
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Electrical Modeling of LSCRs in Deep Submicron CMOS Technologies for Circuit-Level Simulation of ESDBCTM 2003 - Bipolar/BiCMOS Circuits and Technology Meeting, Sep 2003, Toulouse, France. pp.97-100, ⟨10.1109/BIPOL.2003.1274943⟩
Communication dans un congrès
lirmm-00269608
v1
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Use of a Statistical Approach for Efficient Implementation of Oscillation-Based Test StrategyIMSTW 2003 - 9th IEEE International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.99-103
Communication dans un congrès
lirmm-00269582
v1
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Analysis of the Specification Influence on the Efficiency of an Optimized Test Flow for ADCsIMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.185-190
Communication dans un congrès
lirmm-00269583
v1
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Delay Testing of MOS Transistor with Gate Oxide ShortATS: Asian Test Symposium, Nov 2003, Xian, China. pp.168-173
Communication dans un congrès
lirmm-00269641
v1
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Automatic Generation of LH-BIST Architecture for ADC TestingIWADC'03: IEEE International Workshop on ADC Modelling and Testing, Sep 2003, Perugia, Italy. pp.7-12
Communication dans un congrès
lirmm-00269683
v1
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An Automatic Tool for Generation of ADC BIST ArchitectureIMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.79-84
Communication dans un congrès
lirmm-00269580
v1
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STMSCR: A New Multi-Finger SCR-Based Protection Structure Against ESDEOS/ESD Symposium, Las Vegas (USA), pp. 223-241
Communication dans un congrès
lirmm-00269603
v1
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A Novel SCR-Based Protection Structure Against ESD with Efficient Multi-Finger TriggeringESSDERC 2003 - 33rd European Solid-State Device Research Conference, Sep 2003, Estoril, Portugal. pp.207-210, ⟨10.1109/ESSDERC.2003.1256850⟩
Communication dans un congrès
lirmm-00269605
v1
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OBIST Applied to FPAAs: A Case StudyLATW 2003 - 4th IEEE Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.238-243
Communication dans un congrès
lirmm-00269501
v1
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On the Synthesis of Analog Cascaded Filters with Optimal Test Point InsertionLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.212-216
Communication dans un congrès
lirmm-00269499
v1
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GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact ModelLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil
Communication dans un congrès
lirmm-00269604
v1
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A New Methodology for ADC Test Flow OptimizationITC: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209, ⟨10.1109/TEST.2003.1270841⟩
Communication dans un congrès
lirmm-00269527
v1
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Modeling Gate Oxide Short Defects in CMOS Minimum TransistorsETW: European Test Workshop, 2002, Corfu, Greece. pp.15-20
Communication dans un congrès
lirmm-00268527
v1
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European Network for Test EducationDELTA'02: 1st International Workshop on Electronic DesignTest and Applications, Christchurch, New Zeland, pp.230-239
Communication dans un congrès
lirmm-00268490
v1
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A high accuracy triangle-wave signal generator for on-chip ADC testingETW 2002 - 7th IEEE European Test Workshop, May 2002, Corfu, Greece. pp.89-94, ⟨10.1109/ETW.2002.1029644⟩
Communication dans un congrès
lirmm-00268483
v1
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Non-Linear and Non-Split Transistor MOS Model for Gate Oxyde ShortDBT: Defect Based Testing, Apr 2002, Monterey, CA, United States. pp.11-16
Communication dans un congrès
lirmm-00269333
v1
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Low Voltage Testing of Gate Oxide Short in CMOS TechnologyDDECS: Design and Diagnostics of Electronic Circuits and Systems, 2002, Brno, Czech Republic. pp.168-174
Communication dans un congrès
lirmm-00268526
v1
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A Non-Split Model for Realistic Gate Oxide Short in CMOS TechnologyDCIS: Design of Circuits and Integrated Systems, 2002, Santander, Spain. pp.197-204
Communication dans un congrès
lirmm-00268432
v1
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Caractérisation et Modélisation de Thyristors Parasites en Technologie CMOS Fortement SubmicroniqueColloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 137-140
Communication dans un congrès
lirmm-00269319
v1
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On the Evaluation of ADC Static Parameters Through Dynamic TestingADDA & EWADC, Jun 2002, Prague, Czech Republic. pp.95-98
Communication dans un congrès
lirmm-00269338
v1
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Experimental test infrastructure supporting IEEE 11494 StandardETW: European Test Workshop, 2002, Corfou, Greece
Communication dans un congrès
lirmm-00268606
v1
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Implementation of an Experimental IEEE 1149.4 Mixed-Signal Test ChipBTW 2002 - 1st IEEE International Board Test Workshop, Oct 2002, Baltimore, United States. paper 4.2
Communication dans un congrès
lirmm-00269342
v1
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A Remote Access to Engineering Test Facilities for the Distant Education of European Microelectronics Students32nd Annual Frontiers in Education (FIE), Nov 2002, Boston, MA, United States. pp.T2E-24, ⟨10.1109/FIE.2002.1157943⟩
Communication dans un congrès
lirmm-00269423
v1
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Estimating Static Parameters of A-to-D Converters from Spectral AnalysisLATW: Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.174-179
Communication dans un congrès
lirmm-00269320
v1
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Design of an IEEE 1149.4 Test Chip with Extended ABM FunctionalityIMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Montreux (Suisse), France. pp. 153-159
Communication dans un congrès
lirmm-00269340
v1
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Protection contre les ESD : Caractérisation et Modélisation de Thyristors ParasitesEOS/ESD/EMI Workshop, Toulouse (France), France. pp.P nd
Communication dans un congrès
lirmm-00269343
v1
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Mesure des Paramètres Statiques des Convertisseurs A/N par une Analyse SpectraleColloque du GDR CAO de Circuits et Systèmes Intégrés, May 2002, Paris, France. pp.47-50
Communication dans un congrès
lirmm-00269325
v1
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EuNICE-Test Project: A remote Access to Engineering Test for European UniversitiesEWME: European Workshop on Microelectronics Education, 2002, Vigo, Spain. pp.133-136
Communication dans un congrès
lirmm-00268489
v1
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Designing Testable Analog Filters with Optimal DFT InsertionIMSTW: International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.201-203
Communication dans un congrès
lirmm-00269341
v1
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Evaluation of ADC Static Parameters via Frequency DomainIMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.165-169
Communication dans un congrès
lirmm-00269347
v1
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Boolean and Current Detection of MOS Transistor with Gate Oxide ShortIEEE International Test Conference, Oct 2001, Baltimore, USA, pp.10
Communication dans un congrès
lirmm-00370400
v1
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A multi-mode stimuli generator for analogue and mixed-signal built-in-self-testIMSTW: International Mixed Signal Testing Workshop, Jun 1998, The Hague, Pays-Bas. pp.100-106
Communication dans un congrès
hal-01384740
v1
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A built-in multi-mode stimuli generator for analogue and mixed-signal testingBrazilian Symposium on Integrated Circuit Design, 1998, Rio de Janeiro, Brazil. pp.175-178, ⟨10.1109/SBCCI.1998.715435⟩
Communication dans un congrès
hal-00005876
v1
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A multi-mode signature analyzer for analog and mixed circuitsVLSI: Integrated Systems on Silicon, Aug 1997, Gramado, Brazil. pp.65-76, ⟨10.1007/978-0-387-35311-1_6⟩
Communication dans un congrès
hal-01399998
v1
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Implementing model redundancy in predictive alternate test to improve test confidenceETS: European Test Symposium, May 2013, Avignon, France. 18th IEEE European Test Symposium, 2013, ⟨10.1109/ETS.2013.6569386⟩
Poster de conférence
lirmm-00820077
v1
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Analog Measurements based on Digital Test Equipment for Low-Cost Testing of Analog/RF CircuitsETS: European Test Symposium, May 2013, Avignon, France. , 18th IEEE European Test Symposium, 2013
Poster de conférence
lirmm-00820084
v1
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Logic Errors in CMOS Circuits due to Simultaneous Switching NoiseETS: European Test Symposium, May 2007, Freiburg, Germany. 12th IEEE European Test Symposium, pp.59-64, 2007
Poster de conférence
lirmm-00154744
v1
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On the Development of a Low-Cost Diagnostic Flow for Efficient Failure AnalysisETS: European Test Symposium, May 2004, Ajaccio, France. 9th IEEE European Test Symposium, 2004
Poster de conférence
lirmm-00108658
v1
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Proceedings of 19th International Mixed-Signal Testing Workshop (IMSTW - 2014)IEEE, 2014
Ouvrages
lirmm-01433614
v1
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Test de Circuits et de Systèmes IntégrésCollection EGEM, Ed.Hermès, 2004, 2-7462-0864-4
Ouvrages
lirmm-00109158
v1
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Models for Bridging DefectsModels in Hardware Testing, 43, Springer Netherlands, pp.33-70, 2010, Frontiers in Electronic Testing, 978-90-481-3281-2
Chapitre d'ouvrage
lirmm-00371365
v1
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Analog and Mixed-Signal Test Bus: IEEE 1149.4 Test StandardHuertas J.L. Test and Design-for-Testability in Mixed-Signal Integrated Circuits, Kluwer Academic Publishers, pp.28, 2004, 1-4020-7724-6
Chapitre d'ouvrage
lirmm-00109159
v1
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On-Chip Generator of a Saw-Tooth Test Stimulus for ADC BISTSOC Design Methodologies, 90, Kluwer Academic Publishers, pp.425-436, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_36⟩
Chapitre d'ouvrage
lirmm-00268477
v1
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Method And Apparatus For Measuring Phase NoiseFrance, Patent n° : 81582852EP01. 2013, pp.32
Brevet
lirmm-00985404
v1
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Gated thyristor and related system and methodUnited States, Patent n° : FR20060052837. 2006
Brevet
lirmm-00406923
v1
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Electrostatic Discharge Protection Device Comprising Several ThyristorsFrance, Patent n° : FR0205009A. 2002
Brevet
lirmm-00406883
v1
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