Florent Houdellier
Présentation
**Research and teaching activities : charged particle optics (TEM, FIB mainly) **
Since 2025 : In charge of the Peter. W. Hawkes' Chair of Charged Particle Optics (INSA-TESCAN-CNRS)
2022 : Accreditation to Supervise Research (Habilitation à Diriger des Recherches-HDR)
Since 2020 : CNRS Research Engineer (IRHC) at CEMES-CNRS.
2018-2023 : Director of the CNRS/Hitachi High-Technologies (HHT) Joint laboratory "HC-IUMi" (Hitachi-CNRS Infrastructure for Ultrafast Microscopy) located in CEMES-CNRS, which aims to develop the next generation of ultrafast coherent FE-TEM.
2016-2020 : CNRS Research Engineer (IR1) at CEMES-CNRS. Head of the Characterisation platform and TEM service. Member of the Electron Microscopy research group (I3EM).
2007-2016 : CNRS Research Engineer (IR2) at CEMES-CNRS. Head of the TEM service
2006 - 2007 : Post-doctoral position supported by the European ESTEEM project. Development of new holographic methods with elastic and inelastic electrons. Development of CHEF and EMCD experiments with a Cs-corrected microscope.
2003 - 2006 : PhD thesis at CEMES-CNRS (Centre d’Elaboration de Matériaux et d’Etudes Structurales-Centre National de la Recherche Scientifique) : Development of CBED and high resolution electron holography for strain measurements
1998 - 2003 : Engineering School INSA (Institut National des Sciences Appliquées) Toulouse. Speciality : Nanophysics
Awards :
2020: CNRS Cristal award
2019: Ernst Ruska prize of the German Microscopy Society (DGE)
2019: European Microscopy Society (EMS) 2018 outstanding paper award
2006: Pierre Favard Award of the French Microscopy Society (Sfmu)
Domaines de recherche
Publications
Publications
Time-Resolved Cathodoluminescence in a Transmission Electron Microscope11th International Conference on Metamaterials, Photonic Crystals and Plasmonics (META 2021), Jul 2021, Warsaw, Poland
Communication dans un congrès
hal-04449931
v1
|
|
Synthesis and (some) applications of carbon-nanotube-supported pyrolytic carbon nanoconesConference on Carbon Materials "CCM-2019", Indian Carbon Society, Nov 2019, New Delhi, India
Communication dans un congrès
hal-02411274
v1
|
|
Micromagnetic Objects and dynamical imaging Interferometry Instrumentation & In situ for Electron MicroscopyMCMeet - GDRs MCM2 et MEETICC, Oct 2017, Strasbourg, France
Communication dans un congrès
hal-01725341
v1
|
|
Towards ultrafast TEM based on a modified cold-field emission TEM2016 Houches WE Heraeus Workshop, May 2016, Les Houches, France
Communication dans un congrès
hal-01768918
v1
|
|
Measurement of crystalline lattice strain by transmission electron microscopy”14ème colloque de la Société Française des Microscopies, Jun 2015, Nice, France
Communication dans un congrès
hal-01763051
v1
|
|
In situ electron microscopy of hard and soft matterJoint XIII Interamerican Microscopy Congress & XVI Venezuelan Congress for Microscopy and Microanalysis 'CIASEM-2015', Oct 2015, Isla de Margarita, Venezuela
Communication dans un congrès
hal-02123302
v1
|
|
Development of TEM and SEM high brightness electron guns using cold field emission from a carbon nanotipPICO-2015, Apr 2015, Jülich, Netherlands
Communication dans un congrès
hal-02123316
v1
|
|
|
|
Ultrafast laser-induced field emission from a single carbon nanotube based nanotip2015 Conference on Lasers and Electro-Optics (CLEO) : Applications and Technology, May 2015, San Jose, United States. pp.JW2A--52, ⟨10.1364/CLEO_AT.2015.JW2A.52⟩
Communication dans un congrès
hal-01430583
v1
|
Synthesis and applications of individual carbon-nanotube-supported carbon nanoconesIEEE Nanotechnology Materials and Devices Conference, Oct 2014, Aci Castello, Italy
Communication dans un congrès
hal-02123308
v1
|
|
Determination of strain within Si1-yCy layers grown by CVD on a Si substrateSymposium C – Quantitative Electron Microscopy for Materials Science, 2007, undetermined, France. pp.12-19, ⟨10.1557/PROC-1026-C07-03⟩
Communication dans un congrès
hal-01736057
v1
|
|
Comparaison des modes d'imagerie fond noir TEM et STEM pour l'observation de structures moléculaires47. Journées du GUMP, Société Française des Microscopies (SFµ). Paris, FRA., May 2011, Guadeloupe, France. 1 p
Communication dans un congrès
hal-02810543
v1
|
|
Strain Mapping of Layers and Devices Using Electron HolographyECS Trans. 2010, 2010, Unknown, Unknown Region. ⟨10.1149/1.3487533⟩
Communication dans un congrès
hal-01736051
v1
|
|
Recent advances in Transmission Electron Microscopy illustrated by an application to atomic scale characterization of nanoscale precipitationPTM2010 - International Conference on Solid-Solid Phase Transformations, 2010, AVIGNON, France
Communication dans un congrès
hal-00610638
v1
|
|
Critical Analysis of Different Techniques for Measuring Strain in Si1-yCy Layers Grown by CVD on a Si SubstrateECS Transactions, May 2008, Unknown, Unknown Region. ⟨10.1149/1.2911510⟩
Communication dans un congrès
hal-01736065
v1
|
Comparative molecular dark field modes in cell imagingThe IFSM International Microscopy Congress IMC17, Sep 2010, Rio de Janeiro, Brazil. , 1 p., 2010
Poster de conférence
hal-02820670
v1
|
Étonnante physiqueSéverine Martrenchard. CNRS Editions, pp.422, 2023, 9782271148902
Ouvrages
hal-04318170
v1
|
Chapter Two - Cold field emission electron source: From higher brightness to ultrafast beamCoherent Electron Microscopy: Designing Faster and Brighter Electron Sources, 227, Elsevier, pp.107-161, 2023, Advances in Imaging and Electron Physics, 978-0-443-19324-8. ⟨10.1016/B978-0-443-19324-8.00002-X⟩
Chapitre d'ouvrage
hal-04185381
v1
|
|
Chapter One - Characterization of nanomaterials properties using FE-TEMCoherent Electron Microscopy: Designing Faster and Brighter Electron Sources, 227, pp.1-105, 2023, Advances in Imaging and Electron Physics, 978-0-443-19324-8. ⟨10.1016/B978-0-443-19324-8.00001-8⟩
Chapitre d'ouvrage
hal-04185377
v1
|
|
Chapter Three - Every electron counts: Toward the development of aberration-optimized and aberration-corrected electron sourcesCoherent Electron Microscopy: Designing Faster and Brighter Electron Sources, 227, Elsevier, pp.163-216, 2023, Advances in Imaging and Electron Physics, 978-0-443-19324-8. ⟨10.1016/B978-0-443-19324-8.00003-1⟩
Chapitre d'ouvrage
hal-04185384
v1
|
|
Ultrafast Transmission Electron Microscopy: Historical Development, Instrumentation, and ApplicationsPeter W. Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France. Advances in Electronics and Electron Physics, 207, Elsevier, 2018, 1076-5670. ⟨10.1016/bs.aiep.2018.06.001⟩
Chapitre d'ouvrage
hal-01839320
v1
|
|
Dark-Field Electron Holography for Strain MappingAlain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩
Chapitre d'ouvrage
hal-01736026
v1
|
|
CHAPTER 6 - Aberration Correction With the SACTEM-Toulouse: From Imaging to DiffractionP.W.Hawkes. Advances in Imaging and Electron Physics vol 153, 153, Academic press, 2008, Aberration-Corrected Electron Microscopy, 978-0-12-374220-9. ⟨10.1016/S1076-5670(08)01006-9⟩
Chapitre d'ouvrage
hal-01742322
v1
|
|
|
Contribution au développement du CBED et de l’holographie HREM pour l’analyse des déformations de couches épitaxiéesOptique [physics.optics]. INSA Toulouse; CNRS-CEMES, 2006. Français. ⟨NNT : ⟩
Thèse
tel-01754061
v1
|
|
|
COHERENT ELECTRON MICROSCOPY: CONTRIBUTIONS AND PROJECT. Towards aberration-corrected bright electron sourceOptics [physics.optics]. Université Toulouse 3 Paul Sabatier, 2022
HDR
tel-03695440
v2
|