Florent Houdellier
Présentation
**Research and teaching activities : charged particle optics (TEM, FIB mainly) ** Since 2025 : In charge of the Peter. W. Hawkes' Chair of Charged Particle Optics (INSA-TESCAN-CNRS) 2022 : Accreditation to Supervise Research (Habilitation à Diriger des Recherches-HDR) Since 2020 : CNRS Research Engineer (IRHC) at CEMES-CNRS. 2018-2023 : Director of the CNRS/Hitachi High-Technologies (HHT) Joint laboratory "HC-IUMi" (Hitachi-CNRS Infrastructure for Ultrafast Microscopy) located in CEMES-CNRS, which aims to develop the next generation of ultrafast coherent FE-TEM. 2016-2020 : CNRS Research Engineer (IR1) at CEMES-CNRS. Head of the Characterisation platform and TEM service. Member of the Electron Microscopy research group (I3EM). 2007-2016 : CNRS Research Engineer (IR2) at CEMES-CNRS. Head of the TEM service 2006 - 2007 : Post-doctoral position supported by the European ESTEEM project. Development of new holographic methods with elastic and inelastic electrons. Development of CHEF and EMCD experiments with a Cs-corrected microscope. 2003 - 2006 : PhD thesis at CEMES-CNRS (Centre d’Elaboration de Matériaux et d’Etudes Structurales-Centre National de la Recherche Scientifique) : Development of CBED and high resolution electron holography for strain measurements 1998 - 2003 : Engineering School INSA (Institut National des Sciences Appliquées) Toulouse. Speciality : Nanophysics Awards : 2020: CNRS Cristal award 2019: Ernst Ruska prize of the German Microscopy Society (DGE) 2019: European Microscopy Society (EMS) 2018 outstanding paper award 2006: Pierre Favard Award of the French Microscopy Society (Sfmu)
Domaines de recherche
Publications
Publications
Time-Resolved Cathodoluminescence in a Transmission Electron Microscope11th International Conference on Metamaterials, Photonic Crystals and Plasmonics (META 2021), Jul 2021, Warsaw, Poland |
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Synthesis and (some) applications of carbon-nanotube-supported pyrolytic carbon nanoconesConference on Carbon Materials "CCM-2019", Indian Carbon Society, Nov 2019, New Delhi, India |
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Micromagnetic Objects and dynamical imaging Interferometry Instrumentation & In situ for Electron MicroscopyMCMeet - GDRs MCM2 et MEETICC, Oct 2017, Strasbourg, France |
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Towards ultrafast TEM based on a modified cold-field emission TEM2016 Houches WE Heraeus Workshop, May 2016, Les Houches, France |
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In situ electron microscopy of hard and soft matterJoint XIII Interamerican Microscopy Congress & XVI Venezuelan Congress for Microscopy and Microanalysis 'CIASEM-2015', Oct 2015, Isla de Margarita, Venezuela |
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Development of TEM and SEM high brightness electron guns using cold field emission from a carbon nanotipPICO-2015, Apr 2015, Jülich, Netherlands |
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Ultrafast laser-induced field emission from a single carbon nanotube based nanotip2015 Conference on Lasers and Electro-Optics (CLEO) : Applications and Technology, May 2015, San Jose, United States. pp.JW2A--52, ⟨10.1364/CLEO_AT.2015.JW2A.52⟩ |
Measurement of crystalline lattice strain by transmission electron microscopy”14ème colloque de la Société Française des Microscopies, Jun 2015, Nice, France |
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Synthesis and applications of individual carbon-nanotube-supported carbon nanoconesIEEE Nanotechnology Materials and Devices Conference, Oct 2014, Aci Castello, Italy |
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Comparaison des modes d'imagerie fond noir TEM et STEM pour l'observation de structures moléculaires47. Journées du GUMP, Société Française des Microscopies (SFµ). Paris, FRA., May 2011, Guadeloupe, France. 1 p |
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Determination of strain within Si1-yCy layers grown by CVD on a Si substrateSymposium C – Quantitative Electron Microscopy for Materials Science, 2007, undetermined, France. pp.12-19, ⟨10.1557/PROC-1026-C07-03⟩ |
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Recent advances in Transmission Electron Microscopy illustrated by an application to atomic scale characterization of nanoscale precipitationPTM2010 - International Conference on Solid-Solid Phase Transformations, 2010, AVIGNON, France |
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Strain Mapping of Layers and Devices Using Electron HolographyECS Trans. 2010, 2010, Unknown, Unknown Region. ⟨10.1149/1.3487533⟩ |
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Critical Analysis of Different Techniques for Measuring Strain in Si1-yCy Layers Grown by CVD on a Si SubstrateECS Transactions, May 2008, Unknown, Unknown Region. ⟨10.1149/1.2911510⟩ |
Comparative molecular dark field modes in cell imagingThe IFSM International Microscopy Congress IMC17, Sep 2010, Rio de Janeiro, Brazil. , 1 p., 2010 |
Étonnante physiqueSéverine Martrenchard. CNRS Éditions, pp.422, 2023, 9782271148902 |
Chapter Two - Cold field emission electron source: From higher brightness to ultrafast beamCoherent Electron Microscopy: Designing Faster and Brighter Electron Sources, 227, Elsevier, pp.107-161, 2023, Advances in Imaging and Electron Physics, 978-0-443-19324-8. ⟨10.1016/B978-0-443-19324-8.00002-X⟩ |
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Chapter One - Characterization of nanomaterials properties using FE-TEMCoherent Electron Microscopy: Designing Faster and Brighter Electron Sources, 227, pp.1-105, 2023, Advances in Imaging and Electron Physics, 978-0-443-19324-8. ⟨10.1016/B978-0-443-19324-8.00001-8⟩ |
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Chapter Three - Every electron counts: Toward the development of aberration-optimized and aberration-corrected electron sourcesCoherent Electron Microscopy: Designing Faster and Brighter Electron Sources, 227, Elsevier, pp.163-216, 2023, Advances in Imaging and Electron Physics, 978-0-443-19324-8. ⟨10.1016/B978-0-443-19324-8.00003-1⟩ |
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Ultrafast Transmission Electron Microscopy: Historical Development, Instrumentation, and ApplicationsPeter W. Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France. Advances in Electronics and Electron Physics, 207, Elsevier, 2018, 1076-5670. ⟨10.1016/bs.aiep.2018.06.001⟩ |
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Dark-Field Electron Holography for Strain MappingAlain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩ |
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CHAPTER 6 - Aberration Correction With the SACTEM-Toulouse: From Imaging to DiffractionP.W.Hawkes. Advances in Imaging and Electron Physics vol 153, 153, Academic press, 2008, Aberration-Corrected Electron Microscopy, 978-0-12-374220-9. ⟨10.1016/S1076-5670(08)01006-9⟩ |
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Morphologies of caustics studied by catastrophe charged-particle optics2025 |
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Contribution au développement du CBED et de l’holographie HREM pour l’analyse des déformations de couches épitaxiéesOptique [physics.optics]. INSA Toulouse; CNRS-CEMES, 2006. Français. ⟨NNT : ⟩ |
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COHERENT ELECTRON MICROSCOPY: CONTRIBUTIONS AND PROJECT. Towards aberration-corrected bright electron sourceOptics [physics.optics]. Université Toulouse 3 Paul Sabatier, 2022 |