- 2
FC
Frédéric CAYREL
2
Documents
Identifiants chercheurs
- frederic-cayrel
- IdRef : 094927898
Présentation
Page en construction / Page under construction
Publications
- 1
- 1
- 1
- 1
- 1
- 2
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 2
- 1
- 1
- 1
- 1
Porosity and Thickness Characterization of Porous Si and Oxidized Porous Si layers – an ultraviolet-visible-mid Infrared Ellipsometry StudyMicroporous and Mesoporous Materials, 2016, 227, pp.112-120. ⟨10.1016/j.micromeso.2016.02.039⟩
Article dans une revue
hal-01784759v1
|
|
Systematic Study of Anodic Etching of Highly Doped N-Type 4H-SiC in Various HF Based ElectrolytesJournal of The Electrochemical Society, 2013, 160 (9), pp.D372-D379. ⟨10.1149/2.082309jes⟩
Article dans une revue
hal-01810897v1
|