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Frédéric Wrobel

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Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices

Lucas Matana Luza , Frédéric Wrobel , Luis Entrena , Luigi Dilillo
ETS 2022 - 27th IEEE European Test Symposium, May 2022, Barcelona, Spain. pp.1-10, ⟨10.1109/ets54262.2022.9810454⟩
Conference papers lirmm-03833958v1

Benchmarks of Energy Deposition Studies for Heavy-Ion Collimation Losses at the LHC

Jean-Baptiste Potoine , Roderik Bruce , Rongrong Cai , Pascal Hermes , Anton Lechner
13th International Particle Accelerator Conference, Jun 2022, Muangthong Thani, Thailand. pp.WEPOST019, ⟨10.18429/JACoW-IPAC2022-WEPOST019⟩
Conference papers hal-03765965v1

Power Deposition Studies for Crystal-Based Heavy Ion Collimation in the LHC

Jean-Baptiste Potoine , Roderik Bruce , Rongrong Cai , Luigi Salvatore Esposito , Pascal Hermes
13th International Particle Accelerator Conference, Jun 2022, Muangthong Thani, Thailand. pp.WEPOST018, ⟨10.18429/JACoW-IPAC2022-WEPOST018⟩
Conference papers hal-03765969v1

Risk of Halo-Induced Magnet Quenches in the HL-LHC Beam Dump Insertion

Jean-Baptiste Potoine , Andrea Apollonio , Eleonora Belli , Chiara Bracco , Roderik Bruce
12th International Particle Accelerator Conference , May 2021, Online, Brazil. pp.MOPAB002, ⟨10.18429/JACoW-IPAC2021-MOPAB002⟩
Conference papers hal-03371332v1
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Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects

Israel C Lopes , Vincent Pouget , Frédéric Wrobel , Frédéric Saigné , Antoine Touboul
IEEE Latin American Test Symposium (LATS) 2020, Mar 2020, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS49555.2020.9093681⟩
Conference papers hal-03251533v1
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Effect of Temperature on Single Event Latchup Sensitivity

S. Guagliardo , Frédéric Wrobel , Ygor Quadros de Aguiar , Jean-Luc Autran , P. Leroux
International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS), Apr 2020, Marrakech, Morocco. ⟨10.1109/dtis48698.2020.9081275⟩
Conference papers hal-03187841v1

Evaluation and Analysis of Technologies for Robotic Platforms for the Nuclear Decommissioning

Georgios Tsiligiannis , Antoine Touboul , Gaetan Bricas , Tadec Maraine , Jerome Boch
2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9081293⟩
Conference papers hal-04023605v1

Analysis of Total Dose Effects on a PDSOI n-channel High Voltage Transistor for Analog Applications

F. Perez , F. Saigné , A. Michez , S. Furic , E. Leduc
IEEE RADECS 2019, Sep 2019, Montpellier, France
Conference papers hal-02442035v1

Impact of electrical stress and neutron irradiation on reliability of silicon carbide power MOSFET

K. Niskanen , Antoine Touboul , Rosine Coq Germanicus , A. Michez , A. Javanainen
IEEE RADECS 2019, Sep 2019, Montpellier, France. pp.1365 - 1373, ⟨10.1109/TNS.2020.2983599⟩
Conference papers hal-02446882v1

Silicon carbide power MOSFETs under neutron irradiation: Failure In Time demonstration and long term reliability degradation evaluation

K. Niskanen , Antoine Touboul , Rosine Coq Germanicus , A. Michez , Frédéric Wrobel
55th IEEE Nuclear Space and Radiation Effects Conference, Jul 2019, San Antonio, United States
Conference papers hal-02446823v1
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Exploiting Transistor Folding Layout as RHBD technique against Single Event Transients

Y. Q. Aguiar , Frédéric Wrobel , J.-L. Autran , F. L. Kastensmidt , P. Leroux
IEEE RADECS 2019, Sep 2019, Montpellier, France. pp.1581 - 1589, ⟨10.1109/tns.2020.3003166⟩
Conference papers hal-02446833v1
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Single Event Latchup Cross Section Calculation from TCAD Simulations – Effects of the Doping Profiles and Anode to Cathode Spacing

S. Guagliardo , Frédéric Wrobel , Y. Q. Aguiar , J.-L. Autran , P. Leroux
IEEE RADECS 2019, Sep 2019, Montpellier, France
Conference papers hal-02446849v1

Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions

Ygor Quadros de Aguiar , Frédéric Wrobel , Jean-Luc Autran , Paul Leroux , Frédéric Saigné
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018), Oct 2018, Aalborg, Denmark
Conference papers hal-02086379v1

Investigation on Passive and Autonomous Mode Operation of Floating Gate Dosimeters

M. Brucoli , S. Danzeca , M. Brugger , A. Masi , A. Pineda
IEEE RADECS2018, 2018, Goteborg, Sweden
Conference papers hal-02022568v1
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Impact of Complex-Logic Cell Layout on the Single-Event Transient Sensitivity

Ygor Quadros de Aguiar , Frédéric Wrobel , Jean-Luc Autran , Paul Leroux , Frédéric Saigné
IEEE RADECS2018, Sep 2018, Goteborg, Sweden
Conference papers hal-02086422v1

Aging and Gate Bias Effects on TID Sensitivity of Wide Bandgap Power Devices

Kimmo Niskanen , Antoine Touboul , Rosine Coq Germanicus , Frédéric Wrobel , F. Saigné
IEEE RADECS2018, Sep 2018, Goteborg, Sweden
Conference papers hal-02086450v1

SEE Flux and Spectral Hardness Calibration of Neutron Spallation and Mixed Field Facilities

Matteo Cecchetto , Rubén García Alía , Pablo Fernandez-Martinez , Rudy Ferraro , Salvatore Danzeca
RADECS: Radiation Effects on Components and Systems, Sep 2018, Goteborg, Sweden
Conference papers hal-02086446v1

TCAD simulation of radiation-induced leakage current in SDRAM

Hoang Nguyen , Axel Rodriguez , Frédéric Wrobel , Alain Michez , Francoise Bezerra
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018), Oct 2018, Aalborg, Denmark
Conference papers hal-02086412v1

Investigation on the Sensitivity Degradation of Dosimeters based on Floating Gate Structure

M. Brucoli , S. Danzeca , J. Cesari , M. Brugger , A. Masi
IEEE RADECS, 2017, Genève, Switzerland
Conference papers hal-01931780v1

A calculation method to estimate single event upset cross section

Frédéric Wrobel , Antoine Touboul , V. Pouget , Luigi Dilillo , J. Boch
ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France
Conference papers hal-01929212v1

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random- Access Memory

Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere
RADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland
Conference papers hal-01929267v1

Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis

V. Pouget , S. Jonathas , R. Job , J.-R. Vaillé , Frédéric Wrobel
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) 2017, 2017, Bordeaux, France
Conference papers hal-01929245v1

TCAD prediction of dose effects on MOSFETs with ECORCE

A. Michez , J. Boch , J. Dardié , Frédéric Wrobel , Antoine Touboul
IEEE RADECS, 2017, Genève, Switzerland
Conference papers hal-01929250v1

Analysis of Single-Event Effects in DDR3 and DDR3L SDRAMs Using Laser Testing and Monte-Carlo Simulations

P. Kohler , V. Pouget , Frédéric Wrobel , F. Saigné
NSREC 2017, 2017, New Orleans, United States
Conference papers hal-01929203v1

TCAD Simulations of Leakage Currents Induced by SDRAM Single-Event Cell Degradation

A. Rodriguez , Frédéric Wrobel , A. Michez , Antoine Touboul , F. Bezerra
IEEE RADECS 2016, 2016, Brême, Germany
Conference papers hal-01824785v1

The Power Law Shape of Heavy Ions Experimental Cross Section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Eric Lorfèvre
NSREC: Nuclear and Space Radiation Effects Conference, IEEE NPSS (Nuclear & Plasma Sciences Society ), Jul 2016, Portland, United States
Conference papers lirmm-01298421v1

Monte Carlo simulation of particle-induced bit upsets

Frédéric Wrobel , Antoine Touboul , Jean-Roch Vaillé , Jérôme Boch , Frédéric Saigné
13th International Conference on Radiation Shielding (ICRS-13) & 19th Topical Meeting of the Radiation Protection & Shielding Division of the American Nuclear Society -2016 (RPSD-2016), Oct 2016, Paris, France. pp.06033, ⟨10.1051/epjconf/201715306033⟩
Conference papers hal-01645320v1

Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAM

Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Helmut Puchner
RADECS: Radiation and Its Effects on Components and Systems, Sep 2016, Bremen, Germany
Conference papers lirmm-01337405v1

MTCube project: COTS memory SEE ground-test results and in-orbit error rate prediction

Viyas Gupta , Alexandre Louis Bosser , Frédéric Wrobel , Frédéric Saigné , Laurent Dusseau
4S: Small Satellites Systems and Services Symposium, Centre national d'études spatiales (CNES); European Space Agency (ESA), May 2016, La Valletta, Malta
Conference papers lirmm-01298423v1

Floating Gate Dosimeter suitability for Accelerator-like Environments

M. Brucoli , S. Danzeca , M. Brugger , A. Masi , A. Pineda
16th European Conference on Radiation and its Effects on Components and Systems (IEEE RADECS), 2016, Bremen, Germany. pp.2054-2060, ⟨10.1109/TNS.2017.2681651⟩
Conference papers hal-01931782v1

Investigation of Alpha Emissivity as a Function of Time

Frédéric Wrobel , A. Kaouache , F. Saigné , Antoine Touboul , R. D. Schrimpf
51th IEEE Nuclear Space and Radiation Effects Conference, 2015, Boston, United States
Conference papers hal-01824780v1

Simulation tools for soft error rate calculations in SRAM

Frédéric Wrobel
CMOS Emerging Technologies Conference, 2015, Vancouver, Canada
Conference papers hal-01932449v1

Experimental Characterization and In-flight Observation of Weakened Cells in SDRAM

A. Samaras , B. Vandevelde , N. Sukhaseum , N. Chatry , A. Rodriguez
IEEE RADECS 2015, 2015, Moscou, Russia
Conference papers hal-01932459v1

A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Rudy Ferraro , Christopher Frost
RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365578⟩
Conference papers lirmm-01238397v1

SEL Hardness Assurance in a Mixed Radiation Field

R. Alia Garcia , M. Brugger , S. Danzeca , V. Ferlet-Cavrois , C. Frost
51th IEEE Nuclear Space and Radiation Effects Conference, 2015, Boston, United States
Conference papers hal-01824775v1

Real-Time SRAM Based Particle Detector

Luigi Dilillo , Alexandre Louis Bosser , Viyas Gupta , Frédéric Wrobel , Frédéric Saigné
IWASI: International Workshop on Advances in Sensors and Interfaces, Politecnico di Bari, Jun 2015, Gallipoli, Italy. pp.58-62, ⟨10.1109/IWASI.2015.7184968⟩
Conference papers lirmm-01238435v1

Proton-Induced SDRAM Cell Degradation

Axel Rodriguez , Frédéric Wrobel , Anne Samaras , Francoise Bezerra , Benjamin Vandevelde
RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365650⟩
Conference papers lirmm-01238408v1

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, MA, United States. ⟨10.1109/TNS.2015.2496874⟩
Conference papers hal-01932433v1

Heavy-ion radiation impact on a 4Mb FRAM under Different Test Conditions

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammadzadeh , Arto Javanainen
RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365617⟩
Conference papers lirmm-01238392v1

Impact of Stacked-Layer Structure on SEE Rate of SRAMs

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammadzadeh , Arto Javanainen
NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States
Conference papers lirmm-01238384v1

Generic Analytic Expression of Heavy Ion SEU Cross Section Derived from Monte-Carlo Diffusion-Based Prediction Code

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Robert Ecoffet
NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States
Conference papers lirmm-01238388v1

Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Conference papers lirmm-01237709v1

Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation

Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Conference papers lirmm-01237660v1

SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate

R. Alia Garcia , E. W. Blackmore , M. Brugger , S. Danzeca , V. Ferlet-Cavrois
50th IEEE Nuclear Space and Radiation Effects Conference, 2014, Paris, France
Conference papers hal-01824720v1

Single Event Upset Prediction from Heavy Ions Cross Sections with No Parameters

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Frédéric Saigné
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Conference papers lirmm-01237668v1

Impact of natural radioactivity on the Soft Error Rate

Frédéric Wrobel
CMOS Emerging Technologies Conference, 2014, Grenoble, France
Conference papers hal-01934472v1

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive operating area determination

A. Privat , Antoine Touboul , A. Michez , S. Bourdarie , J.-R. Vaillé
50th IEEE Nuclear Space and Radiation Effects Conference, 2014, Paris, France
Conference papers hal-01824688v1

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude Vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Tarek Saad Saoud , Soilihi Moindjie , Jean-Luc Autran , Daniela Munteanu , Frédéric Wrobel
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Conference papers lirmm-01237717v1

SEU Cross Section Calculation Based on Experimental Data of Another kind of Particle

Annelise Touboul , Antoine Touboul , Frédéric Wrobel , V. Pouget , Luigi Dilillo
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Conference papers hal-01934616v1

SEL Cross Section Energy Dependence Impact on the High-Energy Accelerator Error Rate

R. Garcia Alia , S. Danzeca , M. Brugger , M. Julien , S. Giovanni
IEEE-NSREC 2014, 2014, Paris, France
Conference papers hal-01934546v1

Contraintes radiatives que subit l'électronique au sol et en altitude - Notions fondamentales

Frédéric Wrobel
Journées RADSOL du GDR ERRATA, 2014, Paris, France
Conference papers hal-01932596v1
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Presentation of the MTCube CubeSat Project

Viyas Gupta , Luigi Dilillo , Frédéric Wrobel , Ali Mohammad Zadeh , Muriel Bernard
4S Symposium 2014 - Small Satellites Systems and Services, European Space Agency (ESA); Centre National d'Etudes Spatiales (CNES), May 2014, Majorca, Spain
Conference papers lirmm-01272951v1

Problématique et ordres de grandeur

Frédéric Wrobel
Journées RADSOL du GDR ERRATA, 2013, Paris, France
Conference papers hal-01935689v1

Analytical Method to Evaluate Soft Error Rate Due to Alpha Pollutants

A. Kaouache , Frédéric Wrobel , F. Saigné , Antoine Touboul , R. D. Schrimpf
Nuclear and Space Radiation Effects (NSREC), 2013, San Francisco, United States
Conference papers hal-01824623v1

Evaluating An SEU Monitor For Mixed-Field Radiation Environments

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL Synchrotron, Jun 2013, Paris, France
Conference papers lirmm-01238433v1
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Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic Mode

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937429⟩
Conference papers lirmm-00839062v1

Temperature Impact on the Neutron SER of a Commercial 90nm SRAM

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2013, San Francisco, Ca, United States. pp.1-4
Conference papers lirmm-00805291v1

Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation Environments

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2013, Bari, Italy. pp.75-80, ⟨10.1109/IWASI.2013.6576070⟩
Conference papers lirmm-00839046v1

Post-Irradiation-Gate-Stress on Power MOSFETs: Quantification of Latent Defects-Induced Reliability Degradation

A. Privat , Antoine Touboul , R. Arinero , Frédéric Wrobel , F. Saigné
Nuclear and Space Radiation Effects (NSREC), 2013, San Francisco, United States
Conference papers hal-01824642v1

An Integrated Solid Detector For Onboard Detection Of Natural Radiations In Atmosphere

Frédéric Wrobel , Jean-Roch Vaillé , Antoine Touboul , Luigi Dilillo , Frédéric Saigné
iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL synchrotron, Jun 2013, Paris, France
Conference papers lirmm-01238432v1
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Comparison of the transient current shapes obtained with the diffusion model and the double exponential law — Impact on the SER

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Frédéric Saigné
RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937441⟩
Conference papers lirmm-01237599v1

On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell

Elena Ioana Vatajelu , Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard
DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. pp.143-148, ⟨10.1109/DFT.2013.6653597⟩
Conference papers lirmm-01238413v1

Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBT

Lionel Foro , Antoine Touboul , Frédéric Wrobel , Paolo Rech , Luigi Dilillo
RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937428⟩
Conference papers lirmm-01237617v1

SEE Measurements and Simulations using Mono-Energetic GeV-Energy Hadron Beams

R. Alia Garcia , S. Danzeca , M. Brugger , G. Spiezia , S. Uznanski
Nuclear and Space Radiation Effects (NSREC), 2013, San Francisco, United States
Conference papers hal-01824413v1

Effect of thorium decay chain disequilibrium on alpha emissivity

A. Kaouache , Frédéric Wrobel , F. Saigné , Antoine Touboul , R. Schrimpf
IEEE RADECS 2013, 2013, Oxford, United Kingdom
Conference papers hal-01824648v1

SEU Monitoring in Mixed-Field Radiation Environments of Particle Accelerators

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937419⟩
Conference papers lirmm-00839085v1

SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variations

Georgios Tsiligiannis , Elena Ioana Vatajelu , Luigi Dilillo , Alberto Bosio , Patrick Girard
IOLTS: International On-Line Testing Symposium, Jul 2013, Chania, Crete, Greece. pp.145-150, ⟨10.1109/IOLTS.2013.6604066⟩
Conference papers lirmm-00818955v1

Impact of Single Event Gate Rupture and latent defects on Power MOSFETs switching operation

A. Privat , Antoine Touboul , M. Petit , J. Huselstein , Frédéric Wrobel
IEEE RADECS 2013, 2013, Oxford, United Kingdom
Conference papers hal-01824651v1

A Simple Method for Assessing Power Devices Sensitivity to SEEs in Atmospheric Environment

L. Foro , Antoine Touboul , Frédéric Wrobel , Frédéric Saigné
IEEE RADECS 2012, 2012, Biarritz, France
Conference papers hal-01824381v1

A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to Neutrons

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Conference papers lirmm-00805163v1

Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS Transistor

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Jean-Roch Vaillé , Frédéric Saigné
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States. pp.1-4
Conference papers lirmm-00805275v1

SEU Measurements and Simulations in a Mixed Field Environment

R. Alia Garcia , B. Biskup , M. Brugger , M. Calviani , C. Poivey
IEEE RADECS 2012, 2012, Biarritz, France
Conference papers hal-01824344v1

Complete Framework for the Estimation of the SRAM Core-Cell Resilience to Radiation

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial
RADECS: Radiation and its Effects on Components and Systems, Sep 2012, Biarritz, France
Conference papers hal-01935785v1

Alpha particle-induced transient currents in 65 nm and 40 nm technologies

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Frédéric Saigné
SEE'2012: Single Event Effects Symposium, Apr 2012, San Diego, CA, United States. pp.1
Conference papers lirmm-00805378v1

Dynamic Mode Test of a Commercial 4Mb Toggle MRAM under Neutron Radiation

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Conference papers lirmm-00805165v1

Soft Error Triggering Criterion Based on Simple Electrical Model of the SRAM cell

Frédéric Wrobel , Antoine Touboul , Frédéric Saigné
IEEE RADECS 2012, 2012, Biarritz, France
Conference papers hal-01824369v1

Dynamic-Stress Neutrons Test of Commercial SRAMs

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné
IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4
Conference papers lirmm-00805349v1

A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in Altitude

Denis Pantel , Jean-Roch Vaillé , Frédéric Wrobel , Luigi Dilillo , Jean-Marc J.-M. Galliere
IEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, ⟨10.1109/RTC.2012.6418104⟩
Conference papers lirmm-00805169v1

Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron Radiation

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial
IOLTS: International On-Line Testing Symposium, Jun 2012, Sitges, Spain. pp.212-222, ⟨10.1109/IOLTS.2012.6313853⟩
Conference papers lirmm-00805373v1

Neutrons-induced IGBT Failure: Effects of the Number of Tested Devices on the Cross Section Calculation

Antoine Touboul , L. Foro , Frédéric Wrobel , K. Guetarni , J. Boch
IEEE RADECS 2012, 2012, Biarritz, France
Conference papers hal-01824319v1

Trench Fieldstop IGBT failures at ground level

Antoine Touboul , Frédéric Wrobel
SEE Symposium, 2012, San Diego, United States
Conference papers hal-01935981v1

Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Conference papers lirmm-00805150v1

Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench

Luigi Dilillo , Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel
IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6
Conference papers lirmm-00805120v1

Robust Data Collection and Transfer Framework for a Distributed SRAM Based Neutron Sensor

Luigi Dilillo , Alberto Bosio , Paolo Rech , Patrick Girard , Frédéric Wrobel
IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2011, Savelletri di Fasano, Italy. pp.176-180, ⟨10.1109/IWASI.2011.6004712⟩
Conference papers lirmm-00805394v1

Neutron-Induced Failures of Trench Gate Fieldstop IGBT

L. Foro , Antoine Touboul , Frédéric Wrobel , Frédéric Saigné
IEEE NSREC, 2011, Las Végas, United States
Conference papers hal-01824305v1

Synergy of non-ionizing and ionizing processes in the reliability degradation of Power MOSFETs oxide

M. Naceur , Antoine Touboul , M. Gedion , J.-R. Vaillé , Frédéric Wrobel
IEEE RADECS, 2011, Seville, Spain
Conference papers hal-01824307v1

Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Frédéric Wrobel
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩
Conference papers lirmm-00805314v1

Effect of Uranium Chain Disequilibrium on Alpha Disintegration Rate

M. Gedion , Frédéric Wrobel , Frédéric Saigné , M. Portier , Antoine Touboul
IEEE NSREC, 2011, Las Végas, United States
Conference papers hal-01824299v1

Alpha-Soft Error Rate due to new generations of high-k gate oxides and metal gate electrodes in a 32 nm node

M. Gedion , Frédéric Wrobel , F. Saigné , R. D. Schrimpf
RADECS 2011, 2011, Seville, Spain
Conference papers hal-01937444v1

A Monte-Carlo Engineer Tool for the Prediction of SEU Proton Cross Section from Heavy Ion Data

C. Weulersse , Frédéric Wrobel , F. Miller , T. Carriere , R. Gaillard
RADECS 2011, 2011, Seville, Spain
Conference papers hal-01937424v1

Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power Devices

Alessio Griffoni , Jeroen van Duivenbode , Dimitri Linten , Eddy Simoen , Paolo Rech
RADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.226-231, ⟨10.1109/RADECS.2011.6131395⟩
Conference papers lirmm-00805339v1

Velocity effect on heavy ion-induced gate oxide latent defects

Antoine Touboul , M. Portier , R. Arinero , G. Chaumont , Frédéric Saigné
47th IEEE Nuclear Space and Radiation Effects Conference, 2010, Denver, United States
Conference papers hal-01823532v1

Comparison of SER induced by Uranium and Thorium

M. Gedion , Frédéric Wrobel , F. Saigné
8th European Workshop on Radiation and its Effects on Components and Systems, 2010, Langenfeld, Austria
Conference papers hal-01823542v1

ORACLE: A tool for predicting Soft Error Rate

Frédéric Wrobel , Frédéric Saigné
Supercomputing in nuclear Application, 2010, Tokyo, Japan
Conference papers hal-01823016v1

Caractérisation électromagnétique d'une diode perturbée par des convertisseurs lors d'une campagne de mesures en ballon

Blain Amable , Denis Pantel , Adrien Doridant , Jérémy Raoult , Frédéric Wrobel
Club Opto-Hyper, May 2010, Toulouse, France
Conference papers hal-01894330v1

ORACLE : A tool for predicting Soft Error Rate

Frédéric Wrobel , F. Saigné
Supercomputing in nuclear Application, 2010, Tokyo, Japan
Conference papers hal-01937506v1
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Behavior of CVD diamond-based TL dosimeters in radiotherapy environments using photon and electron beams from treatment accelerators

M. Benabdesselam , A. Petitfils , Frédéric Wrobel , F. Mady , S. Marcié
21st Conference on Diamond, Diamond like Materials, Carbon Nanotubes and Nitrides, Sep 2010, Budapest, Hungary
Conference papers hal-01307873v1

Front End of Line, Back End of Line, and Packaging Contribution to Soft Errors Induced by Alpha Particles

M. Gedion , Frédéric Wrobel , Frédéric Saigné
47th IEEE Nuclear Space and Radiation Effects Conference, 2010, Denver, United States
Conference papers hal-01823034v1

R&D For a GEANT4-based, multi-scale simulation environment to study the radiation effects on electronic devices

J. Mekki , Frédéric Wrobel , Frédéric Saigné , M. G. Pia
Supercomputing in nuclear Application, 2010, Tokyo, Japan
Conference papers hal-01823023v1

Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria
Conference papers lirmm-00566847v1

Radioactive Nuclei Induced Soft Errors at Ground Level

Frédéric Wrobel , Frédéric Saigné , M. Gedion , J. Gasiot , R. D. Schrimpf
46th IEEE Nuclear Space and Radiation Effects Conference, 2009, Québec, Canada
Conference papers hal-01822778v1
Image document

Neutron Detection through an SRAM-Based Test Bench

Luigi Dilillo , Frédéric Wrobel , Jean-Marc J.-M. Galliere , Frédéric Saigné
IWASI'09: International Workshop On Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. pp.64-69, ⟨10.1109/IWASI.2009.5184769⟩
Conference papers lirmm-00438842v1

Use of BOBST for the Detection of Neutrons Induced Errors in SRAM

Luigi Dilillo , Frédéric Wrobel , Jean-Marc J.-M. Galliere , F. Saigné
IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2009, Trani, Italy
Conference papers hal-01957246v1

30 MeV and 63 MeV neutron induced energy deposition in a silicon diode: Experimental validation of Monte Carlo simulation

S. Rocheman , Frédéric Wrobel , J.-R. Vaillé , Frédéric Saigné , C. Weulersse
45th IEEE Nuclear Space and Radiation Effects Conference, 2008, Tucson, United States
Conference papers hal-01822737v1

Investigation of the influence of process and design on soft error rate in integrated CMOS technologies thanks to Monte Carlo simulation

C. Weulersse , A. Bougerol , G. Hubert , Frédéric Wrobel , T. Carriere
2008 IEEE International Reliability Physics Symposium (IRPS), Apr 2008, Phoenix, United States. ⟨10.1109/RELPHY.2008.4559010⟩
Conference papers hal-01762971v1

Study of the Contribution of Latent Defects Induced by Swift Heavy Ion Irradiation on the Gate Oxide Breakdown

M. Marinoni , Antoine Touboul , D. Zander , C. Petit , A.M.J.F. Carvalho
7th European Workshop on Radiation and its Effects on Components and Systems, 2008, Jyvaskyla, Finland
Conference papers hal-01822746v1

Hafnium and Uranium Contributions to Soft Error Rate

Frédéric Wrobel , J. Gasiot , Frédéric Saigné
45th IEEE Nuclear Space and Radiation Effects Conference, 2008, Tucson, United States
Conference papers hal-01822453v1

Prediction of Multiple Cell Upset induced by heavy ions in a 90nm bulk SRAM

V. Correas , Frédéric Saigné , B. Sagnes , Frédéric Wrobel , J. Boch
7th European Workshop on Radiation and its Effects on Components and Systems, 2008, Jyvaskyla, Finland
Conference papers hal-01822751v1

Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells

C. Rusu , A. Bougerol , Lorena Anghel , C. Weulerse , N. Buard
13th IEEE International On-Line Testing symposium (IOLT'07), Jul 2007, Crete, Greece. pp.137-145, ⟨10.1109/IOLTS.2007.46⟩
Conference papers hal-00172599v1

Prediction of transients induced by neutrons/protons in CMOS combinational logic cells

A. Hubert , A. Bougerol , F. Miller , N. Buard , Lorena Anghel
12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006, Lake Como, Italy. 9 pp., ⟨10.1109/IOLTS.2006.51⟩
Conference papers hal-00142517v1

Determination of the Deposited Energy in a Silicon Volume by n-Si Nuclear Interaction using 14 MeV neutron source

H. Chabane , J.-R. Vaillé , Bruno Barelaud , Frédéric Wrobel , Y. Calzavara
43th IEEE Nuclear Space and Radiation Effects Conference, 2006, Ponte Vedra Beach, United States
Conference papers hal-01807738v1

Comparison of Experimental and Simulated Am/Be Neutron Source Energy Spectra Obtained in Silicon Detector

H. Chabane , J.-R. Vaillé , T. Mérelle , Bruno Barelaud , Frédéric Wrobel
8th European Conference on Radiation and its Effects on Components and Systems, 2005, Cap d'Agde, France
Conference papers hal-01807160v1

A review of DASIE code family: contribution to SEU/MBU understanding

G. Hubert , G. Buard , N. Weulersse , C. Carrière , M.-C. Palau
11th IEEE International On-Line Testing Symposium, 2005, Saint Raphael, France
Conference papers hal-01806862v1

Neutron-Induced SEU in SRAMs: Simulations With n-Si and n-O Interactions

D. Lambert , J. Baggio , G. Hubert , V. Ferlet-Cavrois , O. Flament
42th IEEE Nuclear Space and Radiation Effects Conference, 2005, Seattle, United States
Conference papers hal-01807126v1

SEU calculations for neutron induced alpha in sensitive RAMs

Frédéric Wrobel , J.-M. Palau , P. Iacconi , M.-C. Calvet , B. Sagnes
41th IEEE Nuclear Space and Radiation Effects Conference, 2004, Atlanta, United States
Conference papers hal-01806807v1

Monte-Carlo simulations to quantify neutron-induced multiple bit upsets in advanced SRAMs

T. Mérelle , Frédéric Saigné , B. Sagnes , G. Gasiot , P. Roche
5th European Workshop on Radiation and its Effects on Components and Systems, 2004, Madrid, Spain
Conference papers hal-01806854v1

CARMEN 2 & 3 LEO Electron Flux Measurements Linear Projection Onto RBSP Elliptical Orbit

François Ginisty , Frédéric Wrobel , Robert Ecoffet , Denis Standarovski , Julien Mekki
IEEE Transactions on Nuclear Science, 2023, pp.1-1. ⟨10.1109/TNS.2023.3260904⟩
Journal articles hal-04056511v1
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RAMSEES: A Model of the Atmospheric Radiative Environment Based on Geant4 Simulation of Extensive Air Shower

Hugo Cintas , Frédéric Wrobel , Marine Ruffenach , Damien Herrera , Frédéric Saigné
Aerospace, 2023, 10 (3), pp.295. ⟨10.3390/aerospace10030295⟩
Journal articles hal-04056501v1

Comparison of relativistic electron flux at Low Earth Orbit (LEO) and Electric Orbit Raising (EOR) from the CARMEN Missions

François Ginisty , Frédéric Wrobel , Robert Ecoffet , Nicolas Balcon , Julien Mekki
Advances in Space Research, 2023, ⟨10.1016/j.asr.2023.01.002⟩
Journal articles hal-04056835v1
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An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons

Frédéric Wrobel , Ygor Aguiar , Cleiton Marques , Giuseppe Lerner , Rubén García Alía
Electronics, 2023, 12 (1), pp.104. ⟨10.3390/electronics12010104⟩
Journal articles hal-04023766v1

Power deposition studies for standard and crystal-assisted heavy ion collimation in the CERN Large Hadron Collider

J. B. Potoine , R. Bruce , R. Cai , F. Cerutti , M. D’andrea
Physical Review Accelerators and Beams, 2023, 26 (9), pp.093001. ⟨10.1103/PhysRevAccelBeams.26.093001⟩
Journal articles hal-04194516v1
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Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge

S. Guagliardo , Frédéric Wrobel , Ygor Quadros de Aguiar , Jean-Luc Autran , Paul Leroux
Microelectronics Reliability, 2021, 119, ⟨10.1016/j.microrel.2021.114087⟩
Journal articles hal-03187849v1
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Neutron-Induced Failure Dependence on Reverse Gate Voltage for SiC Power MOSFETs in Atmospheric Environment

K. Niskanen , Rosine Coq Germanicus , A. Michez , Frédéric Wrobel , Jérôme Boch
IEEE Transactions on Nuclear Science, 2021, 68 (8), pp.1623-1632. ⟨10.1109/tns.2021.3077733⟩
Journal articles hal-03341565v1

0.1–10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric Environments

Matteo Cecchetto , Ruben Garcia Alia , Frédéric Wrobel , Andrea Coronetti , Kacper Bilko
IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.873-883. ⟨10.1109/TNS.2021.3064666⟩
Journal articles hal-04023651v1
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Mitigation and Predictive Assessment of SET Immunity of Digital Logic Circuits for Space Missions

Y.Q. Aguiar , Frédéric Wrobel , Jean-Luc Autran , Paul Leroux , Frédéric Saigné
Aerospace, 2020, 7 (2), pp.12. ⟨10.3390/aerospace7020012⟩
Journal articles hal-03129193v1
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Analysis of SET Propagation in a System in Package Point of Load Converter

T. Rajkowski , Frédéric Saigné , Vincent Pouget , F. Wrobel , A. Touboul
IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1494-1502. ⟨10.1109/TNS.2020.2992808⟩
Journal articles hal-03671272v1
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Design exploration of majority voter architectures based on the signal probability for TMR strategy optimization in space applications

Y.Q. Aguiar , Frédéric Wrobel , J-L Autran , P Leroux , Frédéric Saigné
Microelectronics Reliability, 2020, 114, ⟨10.1016/j.microrel.2020.113877⟩
Journal articles hal-03187823v1
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Reliability-driven pin assignment optimization to improve in-orbit soft-error rate

Y.Q. Aguiar , Frédéric Wrobel , J-L Autran , P Leroux , Frédéric Saigné
Microelectronics Reliability, 2020, 114, pp.113885. ⟨10.1016/j.microrel.2020.113885⟩
Journal articles hal-03187821v1
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Thermal Neutron-Induced SEUs in the LHC Accelerator Environment

Matteo Cecchetto , Rubén García Alía , Frédéric Wrobel , Maris Tali , Oliver Stein
IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1412-1420. ⟨10.1109/TNS.2020.2997992⟩
Journal articles hal-02911959v1

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

K. Niskanen , A. Touboul , Rosine Coq Germanicus , A. Michez , A. Javanainen
IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1365-1373. ⟨10.1109/TNS.2020.2983599⟩
Journal articles hal-03511987v1

Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate

Ruben Garcia Alia , Maris Tali , Markus Brugger , Matteo Cecchetto , Francesco Cerutti
IEEE Transactions on Nuclear Science, 2020, 67 (1), pp.345-352. ⟨10.1109/TNS.2019.2951307⟩
Journal articles hal-04023584v1
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Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation

R B Schvittz , Y.Q. Aguiar , Frédéric Wrobel , J-L Autran , L. S Rosa
Microelectronics Reliability, 2020, 114, ⟨10.1016/j.microrel.2020.113871⟩
Journal articles hal-03187813v1
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Radiation hardening efficiency of gate sizing and transistor stacking based on standard cells

Y.Q. Aguiar , Frédéric Wrobel , S. Guagliardo , J.-L. Autran , P. Leroux
Microelectronics Reliability, 2019, 100-101, pp.113457. ⟨10.1016/j.microrel.2019.113457⟩
Journal articles hal-02515096v1

Impact of Complex-Logic Cell Layout on the Single-Event Transient Sensitivity

Y. Aguiar , Frédéric Wrobel , Jean-Luc Autran , P. Leroux , Frédéric Saigné
IEEE Transactions on Nuclear Science, 2019, pp.1-1. ⟨10.1109/TNS.2019.2918077⟩
Journal articles hal-02136500v1

SEE flux and spectral hardness calibration of neutron spallation and mixed field facilities

Matteo Cecchetto , Pablo Fernandez-Martinez , Rubén García Alía , Rudy Ferraro , Salvatore Danzeca
IEEE Transactions on Nuclear Science, 2019, 66 (7), pp.1532-1540. ⟨10.1109/TNS.2019.2908067⟩
Journal articles hal-02086319v1

Investigation on Passive and Autonomous Mode Operation of Floating Gate Dosimeters

M. Brucoli , J. Cesari , S. Danzeca , M. Brugger , A. Masi
IEEE Transactions on Nuclear Science, 2019, pp.1-1. ⟨10.1109/TNS.2019.2895366⟩
Journal articles hal-02086332v1
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Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions

Y.Q. Aguiar , Frédéric Wrobel , Jean-Luc Autran , P. Leroux , F. Saigné
Microelectronics Reliability, 2018, 88-90, pp.920-924. ⟨10.1016/j.microrel.2018.07.018⟩
Journal articles hal-02089778v1

TCAD simulation of radiation-induced leakage current in 1T1C SDRAM

Hoang Nguyen , A. Rodriguez , Frédéric Wrobel , A. Michez , F. Bezerra
Microelectronics Reliability, 2018, 88-90, pp.974-978. ⟨10.1016/j.microrel.2018.07.094⟩
Journal articles hal-02086293v1

Analysis of Single-Event Effects in DDR3 and DDR3L SDRAMs Using Laser Testing and Monte-Carlo Simulations

P. Kohler , Vincent Pouget , Frédéric Wrobel , F. Saigné , Pierre-Xiao Wang
IEEE Transactions on Nuclear Science, 2018, 65 (1), pp.262 - 268. ⟨10.1109/TNS.2017.2781145⟩
Journal articles hal-01927959v1
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Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere
IEEE Transactions on Nuclear Science, 2018, 65 (8), pp.1708-1714. ⟨10.1109/TNS.2018.2797543⟩
Journal articles lirmm-02007922v1

Tools for modeling radioactive contaminants in chip materials

Frédéric Wrobel , A. Kaouache , F. Saigné , Antoine Touboul , R. D. Schrimpf
Semiconductor Science and Technology, 2017, 32 (3), pp.034001. ⟨10.1088/1361-6641/aa5479⟩
Journal articles hal-01504448v1

Floating Gate Dosimeter Suitability for Accelerator-like Environments

Matteo Brucoli , Salvatore Danzeca , Markus Brugger , Alessandro Masi , Alvaro Pineda
IEEE Transactions on Nuclear Science, 2017, pp.1-1. ⟨10.1109/TNS.2017.2681651⟩
Journal articles hal-01956667v1

A calculation method to estimate single event upset cross section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Jérôme Boch
Microelectronics Reliability, 2017, 76-77, pp.644-649. ⟨10.1016/j.microrel.2017.07.056⟩
Journal articles hal-01636059v1

Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis

V. Pouget , S. Jonathas , R. Job , J.-R. Vaillé , Frédéric Wrobel
Microelectronics Reliability, 2017, 76-77, pp.650 - 654. ⟨10.1016/j.microrel.2017.07.028⟩
Journal articles hal-01636062v1

Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammad Zadeh , Arto Javanainen
IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2010-2015. ⟨10.1109/TNS.2016.2559943⟩
Journal articles lirmm-01382552v1

Methodologies for the Statistical Analysis of Memory Response to Radiation

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Christopher Frost , Ali Mohammad Zadeh
IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2122-2128. ⟨10.1109/TNS.2016.2527781⟩
Journal articles lirmm-01382508v1

The Power Law Shape of Heavy Ions Experimental Cross Section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Eric Lorfèvre
IEEE Transactions on Nuclear Science, 2016, 64 (1), pp.427-433. ⟨10.1109/TNS.2016.2608004⟩
Journal articles lirmm-01382480v1

Proton-Induced Single-Event Degradation in SDRAMs

Axel Rodriguez , Frédéric Wrobel , Anne Samaras , Francoise Bezerra , Benjamin Vandevelde
IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2115-2121. ⟨10.1109/TNS.2016.2551733⟩
Journal articles lirmm-01382563v1

Soft errors in commercial off-the-shelf static random access memories

Luigi Dilillo , Georgios Tsiligiannis , Viyas Gupta , Alexandre Louis Bosser , Frédéric Saigné
Semiconductor Science and Technology, 2016, Special Issue on Radiation Effects in Semiconductor Devices, 32 (1), ⟨10.1088/1361-6641/32/1/013006⟩
Journal articles lirmm-01434747v1

SEE on Different Layers of Stacked-SRAMs

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Mathias Rousselet , Ali Mohammad Zadeh
IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2673-2678. ⟨10.1109/TNS.2015.2496725⟩
Journal articles lirmm-01254148v1

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen
IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2620-2626. ⟨10.1109/TNS.2015.2496874⟩
Journal articles lirmm-01254157v1

SEL Hardness Assurance in a Mixed Radiation Field

Rubén García Alía , Markus Brugger , Salvatore Danzeca , Veronique Ferlet-Cavrois , Christopher Frost
IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2555 - 2562. ⟨10.1109/TNS.2015.2477597⟩
Journal articles hal-01635724v1

An Analytical Model to Quantify Decay Chain Disequilibrium–Application to the Thorium Decay Chain

A. Kaouache , Frédéric Wrobel , F. Saigné , Antoine Touboul , R. D. Schrimpf
IEEE Transactions on Nuclear Science, 2014, 61 (3), pp.1414 - 1419. ⟨10.1109/TNS.2014.2318074⟩
Journal articles hal-01635042v1
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Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Tarek Saad Saoud , Soilihi Moindjie , Jean-Luc Autran , Daniela Munteanu , Frédéric Wrobel
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3380-3388. ⟨10.1109/TNS.2014.2365038⟩
Journal articles lirmm-01234455v1

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Robert Ecoffet
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3564-3571. ⟨10.1109/TNS.2014.2368613⟩
Journal articles lirmm-01234461v1
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Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
Journal of Instrumentation, 2014, 9 (5), pp.#C05052. ⟨10.1088/1748-0221/9/05/C05052⟩
Journal articles lirmm-01234448v1

An SRAM Based Monitor for Mixed-Field Radiation Environments

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1663-1670. ⟨10.1109/TNS.2014.2299733⟩
Journal articles lirmm-01234441v1

Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation

A. Privat , Antoine Touboul , Mickael Petit , J.-J. Huselstein , Frédéric Wrobel
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1856 - 1864. ⟨10.1109/TNS.2014.2333542⟩
Journal articles hal-01635047v1
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90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3389-3394. ⟨10.1109/TNS.2014.2363120⟩
Journal articles hal-04056468v1

Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Vincent Pouget , Frédéric Saigné
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1813-1818. ⟨10.1109/TNS.2014.2299762⟩
Journal articles lirmm-01234429v1

Dynamic Test Methods for COTS SRAMs

Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3095-3102. ⟨10.1109/TNS.2014.2363123⟩
Journal articles lirmm-01234463v1

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

A. Privat , Antoine Touboul , A. Michez , S. Bourdarie , J.-R. Vaillé
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.2930 - 2935. ⟨10.1109/TNS.2014.2365041⟩
Journal articles hal-01635347v1

SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate

Rubén García Alía , Ewart W. Blackmore , Markus Brugger , Salvatore Danzeca , Veronique Ferlet-Cavrois
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.2936 - 2944. ⟨10.1109/TNS.2014.2356641⟩
Journal articles hal-01635360v1

Multiple Cell Upset Classification in Commercial SRAMs

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1747-1754. ⟨10.1109/TNS.2014.2313742⟩
Journal articles lirmm-01234446v1

Energy Dependence of Tungsten-Dominated SEL Cross Sections

Rubén García Alía , Markus Brugger , Salvatore Danzeca , Veronique Ferlet-Cavrois , Christian Poivey
IEEE Transactions on Nuclear Science, 2014, 61 (5), pp.2718 - 2726. ⟨10.1109/TNS.2014.2350538⟩
Journal articles hal-01635364v1

Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

Lionel Foro , Antoine Touboul , Alain Michez , Frédéric Wrobel , Paolo Rech
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1739-1746. ⟨10.1109/TNS.2014.2332813⟩
Journal articles lirmm-01237646v1

Analytical Method to Evaluate Soft Error Rate Due to Alpha Contamination

A. Kaouache , Frédéric Wrobel , F. Saigné , Antoine Touboul , R. D. Schrimpf
IEEE Transactions on Nuclear Science, 2013, 60 (6), pp.4059 - 4066. ⟨10.1109/TNS.2013.2285401⟩
Journal articles hal-01634036v1

Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM cell

Frédéric Wrobel , Antoine Touboul , Luigi Dilillo , Frédéric Saigné
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2537-2541. ⟨10.1109/TNS.2012.2235148⟩
Journal articles lirmm-00805001v1

SEU Measurements and Simulations in a Mixed Field Environment

Rubén García Alía , Bartolomej Biskup , Markus Brugger , Marco Calviani , Christian Poivey
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2469 - 2476. ⟨10.1109/TNS.2013.2249096⟩
Journal articles hal-01634526v1

A Simple Method for Assessing Power Devices Sensitivity to SEEs in Atmospheric Environment

L. Foro , Antoine Touboul , Frédéric Wrobel , F. Saigné
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2559 - 2566. ⟨10.1109/TNS.2013.2259639⟩
Journal articles hal-01634484v1

Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2386-2391. ⟨10.1109/TNS.2013.2257847⟩
Journal articles lirmm-01234425v1

Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects

A. Reed , A. Weller , A. Akkerman , J. Barak , W. Culpepper
IEEE Transactions on Nuclear Science, 2013, 60 (3), pp.1876 - 1911. ⟨10.1109/TNS.2013.2262101⟩
Journal articles hal-01634560v1

Neutrons-Induced IGBT Failure: Effects of the Number of Tested Devices on the Cross Section Calculation

Antoine Touboul , Lionel L. Foro , Frédéric Wrobel , Karima Guetarni , Jérôme Boch
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2392 - 2396. ⟨10.1109/TNS.2013.2248747⟩
Journal articles hal-01634418v1

SEE Measurements and Simulations Using Mono-Energetic GeV-Energy Hadron Beams

Rubén García Alía , Markus Brugger , Salvatore Danzeca , Veronique Ferlet-Cavrois , Christian Poivey
IEEE Transactions on Nuclear Science, 2013, 60 (6), pp.4142 - 4149. ⟨10.1109/TNS.2013.2279690⟩
Journal articles hal-01803056v1

A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere
IEEE Transactions on Nuclear Science, 2013, 60 (5), pp.3603-3608. ⟨10.1109/TNS.2013.2264957⟩
Journal articles lirmm-01234419v1

Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2617-2622. ⟨10.1109/TNS.2013.2239311⟩
Journal articles lirmm-00805005v1

Post-Irradiation-Gate-Stress on Power MOSFETs: Quantification of Latent Defects-Induced Reliability Degradation

A. Privat , Antoine Touboul , A. Michez , S. Bourdarie , J.-R. Vaillé
IEEE Transactions on Nuclear Science, 2013, 60 (6), pp.4166 - 4174. ⟨10.1109/TNS.2013.2287974⟩
Journal articles hal-01634014v1

Neutron-Induced Failure in Silicon IGBTs, Silicon Super-Junction and SiC MOSFETs

Alessio Griffoni , Jeroen van Duivenbode , Dimitri Linten , Eddy Simoen , Paolo Rech
IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.866-871. ⟨10.1109/TNS.2011.2180924⟩
Journal articles lirmm-00805039v1

Embedded silicon detector to investigate the natural radiative environment

Denis Pantel , Jean-Roch Vaillé , Frédéric Wrobel , Luigi Dilillo , Jean-Marc J.-M. Galliere
Journal of Instrumentation, 2012, 7 (5), pp.1-11. ⟨10.1088/1748-0221/7/05/P05007⟩
Journal articles lirmm-00805011v1

Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Jérôme Boch
IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩
Journal articles lirmm-00805031v1

Swift heavy ion-induced silicon dioxide nanostructuration: experimental observation of velocity effect

Antoine Touboul , A. Privat , R. Arinero , Frédéric Wrobel , E. Lorfèvre
European Physical Journal: Applied Physics, 2012, 60 (1), ⟨10.1051/epjap/2012120349⟩
Journal articles hal-01633533v1

On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum

Antoine Touboul , L. Foro , Frédéric Wrobel , Frédéric Saigné
Microelectronics Reliability, 2012, 52 (1), pp.124 - 129. ⟨10.1016/j.microrel.2011.08.023⟩
Journal articles hal-01633517v1

Behavior of CVD diamond-based TL dosimeters in radiotherapy environments using photon and electron beams from treatment accelerators

Mourad Benabdesselam , A. Petitfils , Frédéric Wrobel , Franck Mady , Serge Marcie
Diamond and Related Materials, 2011, 20 (4), pp.520-522. ⟨10.1016/j.diamond.2011.02.004⟩
Journal articles hal-00740867v1

Analytical Modeling of Alpha-Particle Emission Rate at Wafer-Level

Sébastien Martinie , Jean-Luc Autran , Daniela Munteanu , Frédéric Wrobel , Michael Gedion
IEEE Transactions on Nuclear Science, 2011, 58 (6, 1), pp.2798-2803. ⟨10.1109/TNS.2011.2170851⟩
Journal articles hal-01430100v1

Uranium and Thorium Contribution to Soft Error Rate in Advanced Technologies

Michael Gedion , Frédéric Saigné , Frédéric Wrobel , Ronald D. Schrimpf
IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.1098 - 1103. ⟨10.1109/TNS.2011.2128884⟩
Journal articles hal-01632710v1

Development of Monte Carlo Modeling for Neutron-Induced Failures of Trench FieldStop IGBT

Frédéric Saigné , L. Foro , Frédéric Wrobel , Antoine Touboul
IEEE Transactions on Nuclear Science, 2011, 58 (6), pp.2748 - 2754. ⟨10.1109/TNS.2011.2172631⟩
Journal articles hal-01632696v1

MC-ORACLE: A tool for predicting Soft Error Rate

Frédéric Wrobel , Frédéric Saigné
Computer Physics Communications, 2011, 182 (2), pp.317 - 321. ⟨10.1016/j.cpc.2010.10.005⟩
Journal articles hal-01632705v1

Experimental Characterization of Atmospheric Radiation Environment with Stratospheric Balloon

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Paolo Rech
IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.945-951. ⟨10.1109/TNS.2011.2136359⟩
Journal articles lirmm-00805045v1

Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné
IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩
Journal articles lirmm-00805046v1

Effect of the Uranium Decay Chain Disequilibrium on Alpha Disintegration Rate

Michael Gedion , Frédéric Wrobel , Frédéric Saigné , M. Portier , Antoine Touboul
IEEE Transactions on Nuclear Science, 2011, 58 (6), pp.2793 - 2797. ⟨10.1109/TNS.2011.2172954⟩
Journal articles hal-01632775v1
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Natural radioactivity consideration for high- dielectrics and metal gates choice in nanoelectronic devices

Michael Gedion , Frédéric Wrobel , Frédéric Saigné
Journal of Physics D: Applied Physics, 2010, 43 (27), pp.275501. ⟨10.1088/0022-3727/43/27/275501⟩
Journal articles hal-00569646v1

Monte Carlo Simulations to Evaluate the Contribution of Si Bulk, Interconnects, and Packaging to Alpha-Soft Error Rates in Advanced Technologies

M. Gedion , Frédéric Wrobel , Frédéric Saigné , R. D. Schrimpf , J. Mekki
IEEE Transactions on Nuclear Science, 2010, ⟨10.1109/TNS.2010.2085446⟩
Journal articles hal-01632367v1

Prediction of Multiple Cell Upset Induced by Heavy Ions in a 90 nm Bulk SRAM

V. Correas , Frédéric Saigné , B. Sagnes , Frédéric Wrobel , J. Boch
IEEE Transactions on Nuclear Science, 2009, 56 (4), pp.2050 - 2055. ⟨10.1109/TNS.2009.2013622⟩
Journal articles hal-01631580v1

Radioactive Nuclei Induced Soft Errors at Ground Level

Frédéric Wrobel , Frédéric Saigné , Jean Gasiot , Michael Gedion , Ronald D. Schrimpf
IEEE Transactions on Nuclear Science, 2009, 56 (6), pp.3437 - 3441. ⟨10.1109/TNS.2009.2033363⟩
Journal articles hal-01631599v1

He and Ne Ages of Large Presolar Silicon Carbide Grains: Solving the Recoil Problem

Ulrich Ott , Philipp Heck , Frank Gyngard , Rainer Wieler , Frédéric Wrobel
Publications of the Astronomical Society of Australia, 2009, 26 (3), pp.297-302. ⟨10.1071/AS08039⟩
Journal articles hal-04056440v1

Contribution of Latent Defects Induced by High-Energy Heavy Ion Irradiation on the Gate Oxide Breakdown

Mathias Marinoni , Antoine Touboul , Aminata M. J. F. Carvalho , Frédéric Saigné , Frédéric Wrobel
IEEE Transactions on Nuclear Science, 2009, 56 (4), pp.2213 - 2217. ⟨10.1109/TNS.2008.2010258⟩
Journal articles hal-01631574v1

High-Energy Heavy Ion Irradiation-Induced Structural Modifications: A Potential Physical Understanding of Latent Defects

Mathias Marinoni , Antoine Touboul , Damien Zander , Christian Petit , Frédéric Wrobel
IEEE Transactions on Nuclear Science, 2008, 55 (6), pp.2970 - 2974. ⟨10.1109/TNS.2008.2006489⟩
Journal articles hal-01630094v1

Neutron Induced Energy Deposition in a Silicon Diode

Simon Rocheman , Frédéric Wrobel , Jean-Roch Vaillé , Frédéric Saigné , Cécile Weulersse
IEEE Transactions on Nuclear Science, 2008, 55 (6), pp.3146 - 3150. ⟨10.1109/TNS.2008.2006264⟩
Journal articles hal-01630102v1

Effects of atmospheric neutrons and natural contamination on advanced microelectronic memories

Frédéric Wrobel , J. Gasiot , Frédéric Saigné , Antoine Touboul
Applied Physics Letters, 2008, 93 (6), ⟨10.1063/1.2971203⟩
Journal articles hal-01630029v1

Measurement and calculation of charge deposition in a silicon diode irradiated by 30 MeV protons

Simon Rocheman , Frédéric Wrobel , Frédéric Saigné , Jean-Roch Vaillé , Cécile Weulersse
Journal of Applied Physics, 2008, 104 (9), ⟨10.1063/1.2990072⟩
Journal articles hal-01630112v1
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Thermal quenching investigation in CVD diamond by simultaneous detection of thermally stimulated luminescence and conductivity.

Mourad Benabdesselam , A. Petitfils , Frédéric Wrobel , J. E. Butler , Franck Mady
Journal of Applied Physics, 2008, 103, pp.114908. ⟨10.1063/1.2937243⟩
Journal articles hal-00530726v1

Hafnium and Uranium Contributions to Soft Error Rate at Ground Level

Frédéric Wrobel , Jean Gasiot , Frédéric Saigné
IEEE Transactions on Nuclear Science, 2008, 55 (6), pp.3141 - 3145. ⟨10.1109/TNS.2008.2005778⟩
Journal articles hal-01630087v1

Detailed history of recoiling ions induced by nucleons

Frédéric Wrobel
Computer Physics Communications, 2008, 178 (2), pp.88-104. ⟨10.1016/j.cpc.2007.08.005⟩
Journal articles hal-04056434v1

Role of TL thermal quenching in CVD diamond for medical applications

A. Petitfils , Frédéric Wrobel , M. Benabdesselam , P. Iacconi , J.E. Butler
Diamond and Related Materials, 2007, 16 (4-7), pp.1062-1065. ⟨10.1016/j.diamond.2006.11.092⟩
Journal articles hal-04056430v1
Image document

Characterization of B-doped polycrystalline diamond films using thermally stimulated luminescence

Mourad Benabdesselam , Philibert Iacconi , Frédéric Wrobel , A. Petitfils , J. E. Butler
Diamond and Related Materials, 2007, 16 (4-7), pp.805-808. ⟨10.1016/j.diamond.2006.11.089⟩
Journal articles hal-00438282v1

Measurement of the energy depositions in a silicon volume by 14 MeV neutrons

H. Chabane , J.-R. Vaillé , Bruno Barelaud , Frédéric Wrobel , Y. Calzavara
IEEE Transactions on Nuclear Science, 2006, 53 (6), pp.3707-3712. ⟨10.1109/TNS.2006.885008⟩
Journal articles hal-00329675v1

Kerma rate effects on thermoluminescent response of CVD diamond

Frédéric Wrobel , M. Benabdesselam , P. Iacconi , F. Mady
Radiation Protection Dosimetry, 2006, 119 (1-4), pp.115-118. ⟨10.1093/rpd/nci585⟩
Journal articles hal-04056413v1

The electron energy dependence of the TL response for CVD diamonds

Frédéric Wrobel , B. Serrano , M. Benabdesselam , P. Iacconi , A. Costa
Radiation Protection Dosimetry, 2006, 119 (1-4), pp.49-52. ⟨10.1093/rpd/nci614⟩
Journal articles hal-04056419v1

Influence of absorbed dose and deep traps on thermoluminescence response: a numerical simulation

F. Mady , R. Bindi , P. Iacconi , Frédéric Wrobel
Radiation Protection Dosimetry, 2006, 119 (1-4), pp.37-40. ⟨10.1093/rpd/nci609⟩
Journal articles hal-04056404v1

Thermoluminescence properties of CVD diamond for clinical dosimetry use

M. Benabdesselam , B. Serrano , P. Iacconi , Frédéric Wrobel , D. Lapraz
Radiation Protection Dosimetry, 2006, 120 (1-4), pp.87-90. ⟨10.1093/rpd/nci595⟩
Journal articles hal-04056395v1

Determination of the deposited energy in a silicon volume by n-Si nuclear interaction

H. Chabane , J.-R. Vaillé , T. Mérelle , Frédéric Saigné , L. Dusseau
Journal of Applied Physics, 2006, 99 (12), pp.124916.1-124916.5. ⟨10.1063/1.2209088⟩
Journal articles hal-00329590v1

Dose rate effects in bipolar oxides: Competition between trap filling and recombination

J. Boch , Frédéric Saigné , Antoine Touboul , S. Ducret , F Carlotti
Applied Physics Letters, 2006, 88 (23), ⟨10.1063/1.2210293⟩
Journal articles hal-01803025v1

Parameterization of neutron-induced SER in bulk SRAMs from reverse Monte Carlo Simulations

Frédéric Wrobel , P. Iacconi
IEEE Transactions on Nuclear Science, 2005, 52 (6), pp.2313-2318. ⟨10.1109/TNS.2005.860751⟩
Journal articles hal-04056388v1

Neutron-induced SEU in SRAMs: Simulations with n-Si and n-O interactions

D. Lambert , J. Baggio , G. Hubert , V. Ferlet-Cavrois , O. Flament
IEEE Transactions on Nuclear Science, 2005, 52 (1) (6), pp.2332-2339. ⟨10.1109/TNS.2005.860753⟩
Journal articles hal-00328123v1

Monte-Carlo simulations to quantify neutron-induced multiple bit upsets in advanced SRAMs

T. Mérelle , Frédéric Saigné , B. Sagnes , G. Gasiot , P. Roche
IEEE Transactions on Nuclear Science, 2005, 52 (2) (5), pp.1538-1544. ⟨10.1109/TNS.2005.855823⟩
Journal articles hal-00328657v1

Criterion for SEU Occurrence in SRAM Deduced From Circuit and Device Simulations in Case of Neutron-Induced SER

T. Mérelle , H. Chabane , J.-M. Palau , K. Castellani-Coulié , Frédéric Wrobel
IEEE Transactions on Nuclear Science, 2005, 52 (4), pp.1148-1155. ⟨10.1109/TNS.2005.852319⟩
Journal articles hal-00328654v1

Neutron and proton-induced single event upsets in advanced commercial fully depleted SOI SRAMs

J. Baggio , V. Ferlet-Cavrois , D. Lambert , P. Paillet , Frédéric Wrobel
IEEE Transactions on Nuclear Science, 2005, 52 (6), pp.2319-2325. ⟨10.1109/TNS.2005.860722⟩
Journal articles hal-04056381v1

Methodology to compute neutron-Induced Alphas contribution on the SEU Cross section in sensitive RAMs

Frédéric Wrobel , J.-M. Palau , P. Iacconi , M.-C. Palau , B. Sagnes
IEEE Transactions on Nuclear Science, 2004, 51 (6), pp.3291 - 3297. ⟨10.1109/TNS.2004.839142⟩
Journal articles hal-01802244v1

Neutron absorbed dose determination by calculations of recoil energy

Frédéric Wrobel , M. Benabdesselam , P. Iacconi , D. Lapraz
Radiation Protection Dosimetry, 2004, 110 (1-4), pp.807-811. ⟨10.1093/rpd/nch147⟩
Journal articles hal-04056372v1

Contribution of SiO2 in Neutron-Induced SEU in SRAMs

Frédéric Wrobel , J.-M. Palau , M.-C. Calvet , P. Iacconi
IEEE Transactions on Nuclear Science, 2003, 50 (6), pp.2055 - 2059. ⟨10.1109/TNS.2003.821596⟩
Journal articles hal-00327202v1

Monte Carlo Exploration of Neutron-Induced SEU-Sensitive Volumes in SRAMs

J.-M. Palau , Frédéric Wrobel , K. Castellani-Coulié , M.-C. Calvet , P.E. Dodd
IEEE Transactions on Nuclear Science, 2002, 49 (6), pp.3075 - 3081. ⟨10.1109/TNS.2002.805420⟩
Journal articles hal-00325124v1

Simulation of nucleon-induced nuclear reactions in a simplified SRAM structure: scaling effects on SEU and MBU cross sections

Frédéric Wrobel , J.-M. Palau , M.-C. Calvet , O. Bersillon , H. Duarte
IEEE Transactions on Nuclear Science, 2001, 48 (6), pp.1946-1952. ⟨10.1109/23.983155⟩
Journal articles hal-04056366v1

Incidence of multi-particle events on soft error rates caused by n-Si nuclear reactions

Frédéric Wrobel , J.-M. Palau , M.C. Calvet , O. Bersillon , H. Duarte
IEEE Transactions on Nuclear Science, 2000, 47 (6), pp.2580-2585. ⟨10.1109/23.903812⟩
Journal articles hal-04056354v1