Frédéric Wrobel

250

Documents

Affiliations actuelles

Radiations et composants (RADIAC)
Institut d’Electronique et des Systèmes (IES)
Fiabilité et Systèmes en Environnements Contraints (FSEC)

Contact

Publications

Reliability analysis of clock networks and critical paths under radiation-induced transients using custom simulation tools

Nikolaos Chatzivangelis , Georgios-Ioannis Paliaroutis , Wesley Grignani , Christos Sotiriou , Frederic Wrobel et al.

Microprocessors and Microsystems: Embedded Hardware Design , 2026, pp.105330. ⟨10.1016/j.micpro.2026.105330⟩

Article dans une revue hal-05741569v1

Study of TID Response of a Low Cost Motor Board with a System-Level Testing Approach

Guillaume Carpentier , Jérôme Boch , Frédéric Saigné , Julien Favrichon , Eric Cantrel et al.

IEEE Transactions on Nuclear Science, 2026, 73 (8), pp.3070 - 3080. ⟨10.1109/TNS.2026.3662050⟩

Article dans une revue cea-05667513v1

HARV-SoC Evaluation on SmartFusion2 and PolarFire FPGAs Under Neutron and Proton Radiation

Wesley Grignani , Douglas A Santos , Maria Kastriotou , Carlo Cazzaniga , Douglas R Melo et al.

IEEE Transactions on Nuclear Science, In press, ⟨10.1109/TNS.2026.3708801⟩

Article dans une revue hal-05677629v1

Kosmiko: from CMOS imaging sensors to pixel-calibrated particle instruments

Frédéric Wrobel , Juliette Wrobel , Tadec Maraine , Jérôme Boch , Clément Risso et al.

Experimental Astronomy, 2026, 62 (2), pp.21. ⟨10.1007/s10686-026-10081-9⟩

Article dans une revue hal-05766845v1

Single Event Effects of SiC power MOSFETs: from neutron interaction to destruction at the die level

Rosine Coq Germanicus , Alain Michez , Kimmo Niskanen , Mahima Chaudhary , Guillaume Bascoul et al.

IEEE Transactions on Nuclear Science, 2025, 72 (8), pp.2368 - 2376. ⟨10.1109/TNS.2025.3561583⟩

Article dans une revue hal-05081304v1

An introduction to natural radiations and their detrimental effects on electronic devices

Frédéric Wrobel

Comptes Rendus. Mécanique, 2025, 353 (G1), pp.989-997. ⟨10.5802/crmeca.310⟩

Article dans une revue hal-05569006v1

Physical Explanation for the Higher Sensitivity to Ion-Induced Burnout in SiC Schottky Diodes Compared to Si Schottky Diodes

C M Marques , A. Michez , F. Wrobel , S. Kuboyama , F. Saigné et al.

IEEE Transactions on Nuclear Science, 2025, pp.1-1. ⟨10.1109/TNS.2025.3561917⟩

Article dans une revue hal-05046464v1

Physics-Based Ion Track Structure Model for Single-Event Effect Simulations on Power Devices

Manami Iwata , Satoshi Kuboyama , Alain Michez , Akiko Makihara , Misa Takahashi et al.

IEEE Transactions on Nuclear Science, 2025, pp.1-1. ⟨10.1109/TNS.2025.3564242⟩

Article dans une revue hal-05048888v1

SEU cross-section estimation using ECORCE TCAD tool

Cleiton Marques , Alain Michez , Frédéric Wrobel , Ygor Aguiar , Frédéric Saigné et al.

Electronics, 2025, 14 (15), pp.2997. ⟨10.3390/electronics14152997⟩

Article dans une revue hal-05653299v1

Proton, Electron, and Photon Flux Measurement and Simulation During Stratospheric Balloon Flights

Hugo Cintas , Frédéric Wrobel , Frédéric Saigné , Marine Ruffenach , Damien Herrera et al.

IEEE Transactions on Nuclear Science, 2024, 71 (8), pp.1638-1644. ⟨10.1109/TNS.2024.3430044⟩

Article dans une revue hal-04980597v1

South Atlantic Anomaly Evolution Seen by the Proton Flux

F. Ginisty , Frédéric Wrobel , R. Ecoffet , M. Mandea , A. Michez et al.

Journal of Geophysical Research Space Physics, 2024, 129 (6), ⟨10.1029/2023JA032186⟩

Article dans une revue hal-04607263v1

A Methodology to Estimate Single-Event Effects Induced by Low-Energy Protons

Cleiton Marques , Frédéric Wrobel , Ygor Aguiar , Alain Michez , Jérôme Boch et al.

Eng, 2024, 5 (1), pp.319-332. ⟨10.3390/eng5010017⟩

Article dans une revue hal-04607274v1

Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells

Cleiton Marques , Frédéric Wrobel , Ygor Aguiar , Alain Michez , Frédéric Saigné et al.

Electronics, 2024, 13 (10), pp.1954. ⟨10.3390/electronics13101954⟩

Article dans une revue hal-04607285v1

RAMSEES: A Model of the Atmospheric Radiative Environment Based on Geant4 Simulation of Extensive Air Shower

Hugo Cintas , Frédéric Wrobel , Marine Ruffenach , Damien Herrera , Frédéric Saigné et al.

Aerospace, 2023, 10 (3), pp.295. ⟨10.3390/aerospace10030295⟩

Article dans une revue hal-04056501v1

An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons

Frédéric Wrobel , Ygor Aguiar , Cleiton Marques , Giuseppe Lerner , Rubén García Alía et al.

Electronics, 2023, 12 (1), pp.104. ⟨10.3390/electronics12010104⟩

Article dans une revue hal-04023766v1

Power deposition studies for standard and crystal-assisted heavy ion collimation in the CERN Large Hadron Collider

J. B. Potoine , R. Bruce , R. Cai , F. Cerutti , M. D’andrea et al.

Physical Review Accelerators and Beams, 2023, 26 (9), pp.093001. ⟨10.1103/PhysRevAccelBeams.26.093001⟩

Article dans une revue hal-04194516v1

Comparison of relativistic electron flux at Low Earth Orbit (LEO) and Electric Orbit Raising (EOR) from the CARMEN Missions

François Ginisty , Frédéric Wrobel , Robert Ecoffet , Nicolas Balcon , Julien Mekki et al.

Advances in Space Research, 2023, ⟨10.1016/j.asr.2023.01.002⟩

Article dans une revue hal-04056835v1

CARMEN 2 & 3 LEO Electron Flux Measurements Linear Projection Onto RBSP Elliptical Orbit

François Ginisty , Frédéric Wrobel , Robert Ecoffet , Denis Standarovski , Julien Mekki et al.

IEEE Transactions on Nuclear Science, 2023, pp.1-1. ⟨10.1109/TNS.2023.3260904⟩

Article dans une revue hal-04056511v1

Neutron-Induced Failure Dependence on Reverse Gate Voltage for SiC Power MOSFETs in Atmospheric Environment

K. Niskanen , Rosine Coq Germanicus , A. Michez , Frédéric Wrobel , Jérôme Boch et al.

IEEE Transactions on Nuclear Science, 2021, 68 (8), pp.1623-1632. ⟨10.1109/tns.2021.3077733⟩

Article dans une revue hal-03341565v1

Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge

S. Guagliardo , Frédéric Wrobel , Ygor Quadros de Aguiar , Jean-Luc Autran , Paul Leroux et al.

Microelectronics Reliability, 2021, 119, ⟨10.1016/j.microrel.2021.114087⟩

Article dans une revue hal-03187849v1

0.1–10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric Environments

Matteo Cecchetto , Ruben Garcia Alia , Frédéric Wrobel , Andrea Coronetti , Kacper Bilko et al.

IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.873-883. ⟨10.1109/TNS.2021.3064666⟩

Article dans une revue hal-04023651v1

Mitigation and Predictive Assessment of SET Immunity of Digital Logic Circuits for Space Missions

Y.Q. Aguiar , Frédéric Wrobel , Jean-Luc Autran , Paul Leroux , Frédéric Saigné et al.

Aerospace, 2020, 7 (2), pp.12. ⟨10.3390/aerospace7020012⟩

Article dans une revue hal-03129193v1

Analysis of SET Propagation in a System in Package Point of Load Converter

T. Rajkowski , Frédéric Saigné , Vincent Pouget , F. Wrobel , A. Touboul et al.

IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1494-1502. ⟨10.1109/TNS.2020.2992808⟩

Article dans une revue hal-03671272v1

Reliability-driven pin assignment optimization to improve in-orbit soft-error rate

Y.Q. Aguiar , Frédéric Wrobel , J-L Autran , P Leroux , Frédéric Saigné et al.

Microelectronics Reliability, 2020, 114, pp.113885. ⟨10.1016/j.microrel.2020.113885⟩

Article dans une revue hal-03187821v1

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

K. Niskanen , A. Touboul , Rosine Coq Germanicus , A. Michez , A. Javanainen et al.

IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1365-1373. ⟨10.1109/TNS.2020.2983599⟩

Article dans une revue hal-03511987v1

Thermal Neutron-Induced SEUs in the LHC Accelerator Environment

Matteo Cecchetto , Rubén García Alía , Frédéric Wrobel , Maris Tali , Oliver Stein et al.

IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1412-1420. ⟨10.1109/TNS.2020.2997992⟩

Article dans une revue hal-02911959v1

Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation

R B Schvittz , Y.Q. Aguiar , Frédéric Wrobel , J-L Autran , L. S Rosa et al.

Microelectronics Reliability, 2020, 114, ⟨10.1016/j.microrel.2020.113871⟩

Article dans une revue hal-03187813v1

Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate

Ruben Garcia Alia , Maris Tali , Markus Brugger , Matteo Cecchetto , Francesco Cerutti et al.

IEEE Transactions on Nuclear Science, 2020, 67 (1), pp.345-352. ⟨10.1109/TNS.2019.2951307⟩

Article dans une revue hal-04023584v1

Design exploration of majority voter architectures based on the signal probability for TMR strategy optimization in space applications

Y.Q. Aguiar , Frédéric Wrobel , J-L Autran , P Leroux , Frédéric Saigné et al.

Microelectronics Reliability, 2020, 114, ⟨10.1016/j.microrel.2020.113877⟩

Article dans une revue hal-03187823v1

Radiation hardening efficiency of gate sizing and transistor stacking based on standard cells

Y.Q. Aguiar , Frédéric Wrobel , S. Guagliardo , J.-L. Autran , P. Leroux et al.

Microelectronics Reliability, 2019, 100-101, pp.113457. ⟨10.1016/j.microrel.2019.113457⟩

Article dans une revue hal-02515096v1

Impact of Complex-Logic Cell Layout on the Single-Event Transient Sensitivity

Y. Aguiar , Frédéric Wrobel , Jean-Luc Autran , P. Leroux , Frédéric Saigné et al.

IEEE Transactions on Nuclear Science, 2019, pp.1-1. ⟨10.1109/TNS.2019.2918077⟩

Article dans une revue hal-02136500v1

Investigation on Passive and Autonomous Mode Operation of Floating Gate Dosimeters

M. Brucoli , J. Cesari , S. Danzeca , M. Brugger , A. Masi et al.

IEEE Transactions on Nuclear Science, 2019, pp.1-1. ⟨10.1109/TNS.2019.2895366⟩

Article dans une revue hal-02086332v1

SEE flux and spectral hardness calibration of neutron spallation and mixed field facilities

Matteo Cecchetto , Pablo Fernandez-Martinez , Rubén García Alía , Rudy Ferraro , Salvatore Danzeca et al.

IEEE Transactions on Nuclear Science, 2019, 66 (7), pp.1532-1540. ⟨10.1109/TNS.2019.2908067⟩

Article dans une revue hal-02086319v1

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere et al.

IEEE Transactions on Nuclear Science, 2018, 65 (8), pp.1708-1714. ⟨10.1109/TNS.2018.2797543⟩

Article dans une revue lirmm-02007922v1

Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions

Y.Q. Aguiar , Frédéric Wrobel , Jean-Luc Autran , P. Leroux , F. Saigné et al.

Microelectronics Reliability, 2018, 88-90, pp.920-924. ⟨10.1016/j.microrel.2018.07.018⟩

Article dans une revue hal-02089778v1

Analysis of Single-Event Effects in DDR3 and DDR3L SDRAMs Using Laser Testing and Monte-Carlo Simulations

P. Kohler , Vincent Pouget , Frédéric Wrobel , F. Saigné , Pierre-Xiao Wang et al.

IEEE Transactions on Nuclear Science, 2018, 65 (1), pp.262 - 268. ⟨10.1109/TNS.2017.2781145⟩

Article dans une revue hal-01927959v1

TCAD simulation of radiation-induced leakage current in 1T1C SDRAM

Hoang Nguyen , A. Rodriguez , Frédéric Wrobel , A. Michez , F. Bezerra et al.

Microelectronics Reliability, 2018, 88-90, pp.974-978. ⟨10.1016/j.microrel.2018.07.094⟩

Article dans une revue hal-02086293v1

Floating Gate Dosimeter Suitability for Accelerator-like Environments

Matteo Brucoli , Salvatore Danzeca , Markus Brugger , Alessandro Masi , Alvaro Pineda et al.

IEEE Transactions on Nuclear Science, 2017, pp.1-1. ⟨10.1109/TNS.2017.2681651⟩

Article dans une revue hal-01956667v1

Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis

V. Pouget , S. Jonathas , R. Job , J.-R. Vaillé , Frédéric Wrobel et al.

Microelectronics Reliability, 2017, 76-77, pp.650 - 654. ⟨10.1016/j.microrel.2017.07.028⟩

Article dans une revue hal-01636062v1

A calculation method to estimate single event upset cross section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Jérôme Boch et al.

Microelectronics Reliability, 2017, 76-77, pp.644-649. ⟨10.1016/j.microrel.2017.07.056⟩

Article dans une revue hal-01636059v1

Tools for modeling radioactive contaminants in chip materials

Frédéric Wrobel , A. Kaouache , F. Saigné , Antoine Touboul , R. D. Schrimpf et al.

Semiconductor Science and Technology, 2017, 32 (3), pp.034001. ⟨10.1088/1361-6641/aa5479⟩

Article dans une revue hal-01504448v1

Proton-Induced Single-Event Degradation in SDRAMs

Axel Rodriguez , Frédéric Wrobel , Anne Samaras , Francoise Bezerra , Benjamin Vandevelde et al.

IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2115-2121. ⟨10.1109/TNS.2016.2551733⟩

Article dans une revue lirmm-01382563v1

The Power Law Shape of Heavy Ions Experimental Cross Section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Eric Lorfèvre et al.

IEEE Transactions on Nuclear Science, 2016, 64 (1), pp.427-433. ⟨10.1109/TNS.2016.2608004⟩

Article dans une revue lirmm-01382480v1

Methodologies for the Statistical Analysis of Memory Response to Radiation

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Christopher Frost , Ali Mohammad Zadeh et al.

IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2122-2128. ⟨10.1109/TNS.2016.2527781⟩

Article dans une revue lirmm-01382508v1

Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammad Zadeh , Arto Javanainen et al.

IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2010-2015. ⟨10.1109/TNS.2016.2559943⟩

Article dans une revue lirmm-01382552v1

Soft errors in commercial off-the-shelf static random access memories

Luigi Dilillo , Georgios Tsiligiannis , Viyas Gupta , Alexandre Louis Bosser , Frédéric Saigné et al.

Semiconductor Science and Technology, 2016, Special Issue on Radiation Effects in Semiconductor Devices, 32 (1), ⟨10.1088/1361-6641/32/1/013006⟩

Article dans une revue lirmm-01434747v1

SEL Hardness Assurance in a Mixed Radiation Field

Rubén García Alía , Markus Brugger , Salvatore Danzeca , Veronique Ferlet-Cavrois , Christopher Frost et al.

IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2555 - 2562. ⟨10.1109/TNS.2015.2477597⟩

Article dans une revue hal-01635724v1

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen et al.

IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2620-2626. ⟨10.1109/TNS.2015.2496874⟩

Article dans une revue lirmm-01254157v1

SEE on Different Layers of Stacked-SRAMs

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Mathias Rousselet , Ali Mohammad Zadeh et al.

IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2673-2678. ⟨10.1109/TNS.2015.2496725⟩

Article dans une revue lirmm-01254148v1

Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.

Journal of Instrumentation, 2014, 9 (5), pp.#C05052. ⟨10.1088/1748-0221/9/05/C05052⟩

Article dans une revue lirmm-01234448v1

An SRAM Based Monitor for Mixed-Field Radiation Environments

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.

IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1663-1670. ⟨10.1109/TNS.2014.2299733⟩

Article dans une revue lirmm-01234441v1

Energy Dependence of Tungsten-Dominated SEL Cross Sections

Rubén García Alía , Markus Brugger , Salvatore Danzeca , Veronique Ferlet-Cavrois , Christian Poivey et al.

IEEE Transactions on Nuclear Science, 2014, 61 (5), pp.2718 - 2726. ⟨10.1109/TNS.2014.2350538⟩

Article dans une revue hal-01635364v1

Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

Lionel Foro , Antoine Touboul , Alain Michez , Frédéric Wrobel , Paolo Rech et al.

IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1739-1746. ⟨10.1109/TNS.2014.2332813⟩

Article dans une revue lirmm-01237646v1

Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation

A. Privat , Antoine Touboul , Mickael Petit , J.-J. Huselstein , Frédéric Wrobel et al.

IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1856 - 1864. ⟨10.1109/TNS.2014.2333542⟩

Article dans une revue hal-01635047v1

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.

IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3389-3394. ⟨10.1109/TNS.2014.2363120⟩

Article dans une revue hal-04056468v1

SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate

Rubén García Alía , Ewart W. Blackmore , Markus Brugger , Salvatore Danzeca , Veronique Ferlet-Cavrois et al.

IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.2936 - 2944. ⟨10.1109/TNS.2014.2356641⟩

Article dans une revue hal-01635360v1

Dynamic Test Methods for COTS SRAMs

Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard et al.

IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3095-3102. ⟨10.1109/TNS.2014.2363123⟩

Article dans une revue lirmm-01234463v1

Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Vincent Pouget , Frédéric Saigné

IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1813-1818. ⟨10.1109/TNS.2014.2299762⟩

Article dans une revue lirmm-01234429v1

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

A. Privat , Antoine Touboul , A. Michez , S. Bourdarie , J.-R. Vaillé et al.

IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.2930 - 2935. ⟨10.1109/TNS.2014.2365041⟩

Article dans une revue hal-01635347v1

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Robert Ecoffet et al.

IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3564-3571. ⟨10.1109/TNS.2014.2368613⟩

Article dans une revue lirmm-01234461v1

An Analytical Model to Quantify Decay Chain Disequilibrium–Application to the Thorium Decay Chain

A. Kaouache , Frédéric Wrobel , F. Saigné , Antoine Touboul , R. D. Schrimpf et al.

IEEE Transactions on Nuclear Science, 2014, 61 (3), pp.1414 - 1419. ⟨10.1109/TNS.2014.2318074⟩

Article dans une revue hal-01635042v1

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Tarek Saad Saoud , Soilihi Moindjie , Jean-Luc Autran , Daniela Munteanu , Frédéric Wrobel et al.

IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3380-3388. ⟨10.1109/TNS.2014.2365038⟩

Article dans une revue lirmm-01234455v1

Multiple Cell Upset Classification in Commercial SRAMs

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.

IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1747-1754. ⟨10.1109/TNS.2014.2313742⟩

Article dans une revue lirmm-01234446v1

Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial et al.

IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2617-2622. ⟨10.1109/TNS.2013.2239311⟩

Article dans une revue lirmm-00805005v1

Post-Irradiation-Gate-Stress on Power MOSFETs: Quantification of Latent Defects-Induced Reliability Degradation

A. Privat , Antoine Touboul , A. Michez , S. Bourdarie , J.-R. Vaillé et al.

IEEE Transactions on Nuclear Science, 2013, 60 (6), pp.4166 - 4174. ⟨10.1109/TNS.2013.2287974⟩

Article dans une revue hal-01634014v1

Neutrons-Induced IGBT Failure: Effects of the Number of Tested Devices on the Cross Section Calculation

Antoine Touboul , Lionel L. Foro , Frédéric Wrobel , Karima Guetarni , Jérôme Boch et al.

IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2392 - 2396. ⟨10.1109/TNS.2013.2248747⟩

Article dans une revue hal-01634418v1

SEE Measurements and Simulations Using Mono-Energetic GeV-Energy Hadron Beams

Rubén García Alía , Markus Brugger , Salvatore Danzeca , Veronique Ferlet-Cavrois , Christian Poivey et al.

IEEE Transactions on Nuclear Science, 2013, 60 (6), pp.4142 - 4149. ⟨10.1109/TNS.2013.2279690⟩

Article dans une revue hal-01803056v1

SEU Measurements and Simulations in a Mixed Field Environment

Rubén García Alía , Bartolomej Biskup , Markus Brugger , Marco Calviani , Christian Poivey et al.

IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2469-2476. ⟨10.1109/TNS.2013.2249096⟩

Article dans une revue hal-01634526v1

A Simple Method for Assessing Power Devices Sensitivity to SEEs in Atmospheric Environment

L. Foro , Antoine Touboul , Frédéric Wrobel , F. Saigné

IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2559 - 2566. ⟨10.1109/TNS.2013.2259639⟩

Article dans une revue hal-01634484v1

Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM cell

Frédéric Wrobel , Antoine Touboul , Luigi Dilillo , Frédéric Saigné

IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2537-2541. ⟨10.1109/TNS.2012.2235148⟩

Article dans une revue lirmm-00805001v1

Analytical Method to Evaluate Soft Error Rate Due to Alpha Contamination

A. Kaouache , Frédéric Wrobel , F. Saigné , Antoine Touboul , R. D. Schrimpf

IEEE Transactions on Nuclear Science, 2013, 60 (6), pp.4059 - 4066. ⟨10.1109/TNS.2013.2285401⟩

Article dans une revue hal-01634036v1

A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere et al.

IEEE Transactions on Nuclear Science, 2013, 60 (5), pp.3603-3608. ⟨10.1109/TNS.2013.2264957⟩

Article dans une revue lirmm-01234419v1

Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere et al.

IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2386-2391. ⟨10.1109/TNS.2013.2257847⟩

Article dans une revue lirmm-01234425v1

Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects

A. Reed , A. Weller , A. Akkerman , J. Barak , W. Culpepper et al.

IEEE Transactions on Nuclear Science, 2013, 60 (3), pp.1876 - 1911. ⟨10.1109/TNS.2013.2262101⟩

Article dans une revue hal-01634560v1

On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum

Antoine Touboul , L. Foro , Frédéric Wrobel , Frédéric Saigné

Microelectronics Reliability, 2012, 52 (1), pp.124 - 129. ⟨10.1016/j.microrel.2011.08.023⟩

Article dans une revue istex hal-01633517v1

Embedded silicon detector to investigate the natural radiative environment

Denis Pantel , Jean-Roch Vaillé , Frédéric Wrobel , Luigi Dilillo , Jean-Marc J.-M. Galliere et al.

Journal of Instrumentation, 2012, 7 (5), pp.1-11. ⟨10.1088/1748-0221/7/05/P05007⟩

Article dans une revue lirmm-00805011v1

Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Jérôme Boch et al.

IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩

Article dans une revue lirmm-00805031v1

Swift heavy ion-induced silicon dioxide nanostructuration: experimental observation of velocity effect

Antoine Touboul , A. Privat , Richard Arinero , Frédéric Wrobel , Eric Lorfèvre et al.

European Physical Journal: Applied Physics, 2012, 60 (1), ⟨10.1051/epjap/2012120349⟩

Article dans une revue istex hal-01633533v1

Neutron-Induced Failure in Silicon IGBTs, Silicon Super-Junction and SiC MOSFETs

Alessio Griffoni , Jeroen van Duivenbode , Dimitri Linten , Eddy Simoen , Paolo Rech et al.

IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.866-871. ⟨10.1109/TNS.2011.2180924⟩

Article dans une revue lirmm-00805039v1

MC-ORACLE: A tool for predicting Soft Error Rate

Frédéric Wrobel , Frédéric Saigné

Computer Physics Communications, 2011, 182 (2), pp.317-321. ⟨10.1016/j.cpc.2010.10.005⟩

Article dans une revue istex hal-01632705v1

Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné et al.

IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩

Article dans une revue lirmm-00805046v1

Effect of the Uranium Decay Chain Disequilibrium on Alpha Disintegration Rate

Michael Gedion , Frédéric Wrobel , Frédéric Saigné , M. Portier , Antoine Touboul et al.

IEEE Transactions on Nuclear Science, 2011, 58 (6), pp.2793 - 2797. ⟨10.1109/TNS.2011.2172954⟩

Article dans une revue hal-01632775v1

Development of Monte Carlo Modeling for Neutron-Induced Failures of Trench FieldStop IGBT

Frédéric Saigné , L. Foro , Frédéric Wrobel , Antoine Touboul

IEEE Transactions on Nuclear Science, 2011, 58 (6), pp.2748 - 2754. ⟨10.1109/TNS.2011.2172631⟩

Article dans une revue hal-01632696v1

Uranium and Thorium Contribution to Soft Error Rate in Advanced Technologies

Michael Gedion , Frédéric Saigné , Frédéric Wrobel , Ronald D. Schrimpf

IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.1098 - 1103. ⟨10.1109/TNS.2011.2128884⟩

Article dans une revue hal-01632710v1

Analytical Modeling of Alpha-Particle Emission Rate at Wafer-Level

Sébastien Martinie , Jean-Luc Autran , Daniela Munteanu , Frédéric Wrobel , Michael Gedion et al.

IEEE Transactions on Nuclear Science, 2011, 58 (6, 1), pp.2798-2803. ⟨10.1109/TNS.2011.2170851⟩

Article dans une revue hal-01430100v1

Behavior of CVD diamond-based TL dosimeters in radiotherapy environments using photon and electron beams from treatment accelerators

Mourad Benabdesselam , A. Petitfils , Frédéric Wrobel , Franck Mady , Serge Marcie et al.

Diamond and Related Materials, 2011, 20 (4), pp.520-522. ⟨10.1016/j.diamond.2011.02.004⟩

Article dans une revue istex hal-00740867v1

Experimental Characterization of Atmospheric Radiation Environment with Stratospheric Balloon

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Paolo Rech et al.

IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.945-951. ⟨10.1109/TNS.2011.2136359⟩

Article dans une revue lirmm-00805045v1

Monte Carlo Simulations to Evaluate the Contribution of Si Bulk, Interconnects, and Packaging to Alpha-Soft Error Rates in Advanced Technologies

M. Gedion , Frédéric Wrobel , Frédéric Saigné , R. D. Schrimpf , J. Mekki

IEEE Transactions on Nuclear Science, 2010, ⟨10.1109/TNS.2010.2085446⟩

Article dans une revue hal-01632367v1

Natural radioactivity consideration for high- dielectrics and metal gates choice in nanoelectronic devices

Michael Gedion , Frédéric Wrobel , Frédéric Saigné

Journal of Physics D: Applied Physics, 2010, 43 (27), pp.275501. ⟨10.1088/0022-3727/43/27/275501⟩

Article dans une revue istex hal-00569646v1

Contribution of Latent Defects Induced by High-Energy Heavy Ion Irradiation on the Gate Oxide Breakdown

Mathias Marinoni , Antoine Touboul , Aminata M. J. F. Carvalho , Frédéric Saigné , Frédéric Wrobel et al.

IEEE Transactions on Nuclear Science, 2009, 56 (4), pp.2213 - 2217. ⟨10.1109/TNS.2008.2010258⟩

Article dans une revue hal-01631574v1

He and Ne Ages of Large Presolar Silicon Carbide Grains: Solving the Recoil Problem

Ulrich Ott , Philipp Heck , Frank Gyngard , Rainer Wieler , Frédéric Wrobel et al.

Publications of the Astronomical Society of Australia, 2009, 26 (3), pp.297-302. ⟨10.1071/AS08039⟩

Article dans une revue hal-04056440v1

Prediction of Multiple Cell Upset Induced by Heavy Ions in a 90 nm Bulk SRAM

V. Correas , Frédéric Saigné , B. Sagnes , Frédéric Wrobel , J. Boch et al.

IEEE Transactions on Nuclear Science, 2009, 56 (4), pp.2050 - 2055. ⟨10.1109/TNS.2009.2013622⟩

Article dans une revue hal-01631580v1

Radioactive Nuclei Induced Soft Errors at Ground Level

Frédéric Wrobel , Frédéric Saigné , Jean Gasiot , Michael Gedion , Ronald D. Schrimpf

IEEE Transactions on Nuclear Science, 2009, 56 (6), pp.3437-3441. ⟨10.1109/TNS.2009.2033363⟩

Article dans une revue hal-01631599v1

Measurement and calculation of charge deposition in a silicon diode irradiated by 30 MeV protons

Simon Rocheman , Frédéric Wrobel , Frédéric Saigné , Jean-Roch Vaillé , Cécile Weulersse et al.

Journal of Applied Physics, 2008, 104 (9), ⟨10.1063/1.2990072⟩

Article dans une revue hal-01630112v1

Thermal quenching investigation in CVD diamond by simultaneous detection of thermally stimulated luminescence and conductivity.

Mourad Benabdesselam , A. Petitfils , Frédéric Wrobel , J. E. Butler , Franck Mady

Journal of Applied Physics, 2008, 103, pp.114908. ⟨10.1063/1.2937243⟩

Article dans une revue hal-00530726v1

Hafnium and Uranium Contributions to Soft Error Rate at Ground Level

Frédéric Wrobel , Jean Gasiot , Frédéric Saigné

IEEE Transactions on Nuclear Science, 2008, 55 (6), pp.3141 - 3145. ⟨10.1109/TNS.2008.2005778⟩

Article dans une revue hal-01630087v1

Neutron Induced Energy Deposition in a Silicon Diode

Simon Rocheman , Frédéric Wrobel , Jean-Roch Vaillé , Frédéric Saigné , Cécile Weulersse et al.

IEEE Transactions on Nuclear Science, 2008, 55 (6), pp.3146 - 3150. ⟨10.1109/TNS.2008.2006264⟩

Article dans une revue hal-01630102v1

High-Energy Heavy Ion Irradiation-Induced Structural Modifications: A Potential Physical Understanding of Latent Defects

Mathias Marinoni , Antoine Touboul , Damien Zander , Christian Petit , Frédéric Wrobel et al.

IEEE Transactions on Nuclear Science, 2008, 55 (6), pp.2970 - 2974. ⟨10.1109/TNS.2008.2006489⟩

Article dans une revue hal-01630094v1

Detailed history of recoiling ions induced by nucleons

Frédéric Wrobel

Computer Physics Communications, 2008, 178 (2), pp.88-104. ⟨10.1016/j.cpc.2007.08.005⟩

Article dans une revue istex hal-04056434v1

Effects of atmospheric neutrons and natural contamination on advanced microelectronic memories

Frédéric Wrobel , J. Gasiot , Frédéric Saigné , Antoine Touboul

Applied Physics Letters, 2008, 93 (6), ⟨10.1063/1.2971203⟩

Article dans une revue hal-01630029v1

Role of TL thermal quenching in CVD diamond for medical applications

A. Petitfils , Frédéric Wrobel , M. Benabdesselam , P. Iacconi , J.E. Butler

Diamond and Related Materials, 2007, 16 (4-7), pp.1062-1065. ⟨10.1016/j.diamond.2006.11.092⟩

Article dans une revue istex hal-04056430v1

Characterization of B-doped polycrystalline diamond films using thermally stimulated luminescence

Mourad Benabdesselam , Philibert Iacconi , Frédéric Wrobel , A. Petitfils , J. E. Butler

Diamond and Related Materials, 2007, 16 (4-7), pp.805-808. ⟨10.1016/j.diamond.2006.11.089⟩

Article dans une revue hal-00438282v1

Kerma rate effects on thermoluminescent response of CVD diamond

Frédéric Wrobel , M. Benabdesselam , P. Iacconi , F. Mady

Radiation Protection Dosimetry, 2006, 119 (1-4), pp.115-118. ⟨10.1093/rpd/nci585⟩

Article dans une revue istex hal-04056413v1

Dose rate effects in bipolar oxides: Competition between trap filling and recombination

J. Boch , Frédéric Saigné , Antoine Touboul , S. Ducret , F Carlotti et al.

Applied Physics Letters, 2006, 88 (23), ⟨10.1063/1.2210293⟩

Article dans une revue hal-01803025v1

The electron energy dependence of the TL response for CVD diamonds

Frédéric Wrobel , B. Serrano , M. Benabdesselam , P. Iacconi , A. Costa

Radiation Protection Dosimetry, 2006, 119 (1-4), pp.49-52. ⟨10.1093/rpd/nci614⟩

Article dans une revue istex hal-04056419v1

Thermoluminescence properties of CVD diamond for clinical dosimetry use

M. Benabdesselam , B. Serrano , P. Iacconi , Frédéric Wrobel , D. Lapraz et al.

Radiation Protection Dosimetry, 2006, 120 (1-4), pp.87-90. ⟨10.1093/rpd/nci595⟩

Article dans une revue istex hal-04056395v1

Influence of absorbed dose and deep traps on thermoluminescence response: a numerical simulation

F. Mady , R. Bindi , P. Iacconi , Frédéric Wrobel

Radiation Protection Dosimetry, 2006, 119 (1-4), pp.37-40. ⟨10.1093/rpd/nci609⟩

Article dans une revue istex hal-04056404v1

Measurement of the energy depositions in a silicon volume by 14 MeV neutrons

H. Chabane , J.-R. Vaillé , Bruno Barelaud , Frédéric Wrobel , Y. Calzavara et al.

IEEE Transactions on Nuclear Science, 2006, 53 (6), pp.3707-3712. ⟨10.1109/TNS.2006.885008⟩

Article dans une revue hal-00329675v1

Determination of the deposited energy in a silicon volume by n-Si nuclear interaction

H. Chabane , J.-R. Vaillé , T. Mérelle , Frédéric Saigné , L. Dusseau et al.

Journal of Applied Physics, 2006, 99 (12), pp.124916.1-124916.5. ⟨10.1063/1.2209088⟩

Article dans une revue hal-00329590v1

Monte-Carlo simulations to quantify neutron-induced multiple bit upsets in advanced SRAMs

T. Mérelle , Frédéric Saigné , B. Sagnes , G. Gasiot , P. Roche et al.

IEEE Transactions on Nuclear Science, 2005, 52 (2) (5), pp.1538-1544. ⟨10.1109/TNS.2005.855823⟩

Article dans une revue hal-00328657v1

Criterion for SEU Occurrence in SRAM Deduced From Circuit and Device Simulations in Case of Neutron-Induced SER

T. Mérelle , H. Chabane , J.-M. Palau , K. Castellani-Coulié , Frédéric Wrobel et al.

IEEE Transactions on Nuclear Science, 2005, 52 (4), pp.1148-1155. ⟨10.1109/TNS.2005.852319⟩

Article dans une revue hal-00328654v1

Parameterization of neutron-induced SER in bulk SRAMs from reverse Monte Carlo Simulations

Frédéric Wrobel , P. Iacconi

IEEE Transactions on Nuclear Science, 2005, 52 (6), pp.2313-2318. ⟨10.1109/TNS.2005.860751⟩

Article dans une revue hal-04056388v1

Neutron-induced SEU in SRAMs: Simulations with n-Si and n-O interactions

D. Lambert , J. Baggio , G. Hubert , V. Ferlet-Cavrois , O. Flament et al.

IEEE Transactions on Nuclear Science, 2005, 52 (1) (6), pp.2332-2339. ⟨10.1109/TNS.2005.860753⟩

Article dans une revue hal-00328123v1

Neutron and proton-induced single event upsets in advanced commercial fully depleted SOI SRAMs

J. Baggio , V. Ferlet-Cavrois , D. Lambert , P. Paillet , Frédéric Wrobel et al.

IEEE Transactions on Nuclear Science, 2005, 52 (6), pp.2319-2325. ⟨10.1109/TNS.2005.860722⟩

Article dans une revue hal-04056381v1

Neutron absorbed dose determination by calculations of recoil energy

Frédéric Wrobel , M. Benabdesselam , P. Iacconi , D. Lapraz

Radiation Protection Dosimetry, 2004, 110 (1-4), pp.807-811. ⟨10.1093/rpd/nch147⟩

Article dans une revue istex hal-04056372v1

Methodology to compute neutron-Induced Alphas contribution on the SEU Cross section in sensitive RAMs

Frédéric Wrobel , J.-M. Palau , P. Iacconi , M.-C. Palau , B. Sagnes et al.

IEEE Transactions on Nuclear Science, 2004, 51 (6), pp.3291 - 3297. ⟨10.1109/TNS.2004.839142⟩

Article dans une revue hal-01802244v1

Contribution of SiO2 in Neutron-Induced SEU in SRAMs

Frédéric Wrobel , J.-M. Palau , M.-C. Calvet , P. Iacconi

IEEE Transactions on Nuclear Science, 2003, 50 (6), pp.2055 - 2059. ⟨10.1109/TNS.2003.821596⟩

Article dans une revue hal-00327202v1

Monte Carlo Exploration of Neutron-Induced SEU-Sensitive Volumes in SRAMs

J.-M. Palau , Frédéric Wrobel , K. Castellani-Coulié , M.-C. Calvet , P.E. Dodd et al.

IEEE Transactions on Nuclear Science, 2002, 49 (6), pp.3075 - 3081. ⟨10.1109/TNS.2002.805420⟩

Article dans une revue hal-00325124v1

Simulation of nucleon-induced nuclear reactions in a simplified SRAM structure: scaling effects on SEU and MBU cross sections

Frédéric Wrobel , J.-M. Palau , M.-C. Calvet , O. Bersillon , H. Duarte

IEEE Transactions on Nuclear Science, 2001, 48 (6), pp.1946-1952. ⟨10.1109/23.983155⟩

Article dans une revue hal-04056366v1

Incidence of multi-particle events on soft error rates caused by n-Si nuclear reactions

Frédéric Wrobel , J.-M. Palau , M.C. Calvet , O. Bersillon , H. Duarte

IEEE Transactions on Nuclear Science, 2000, 47 (6), pp.2580-2585. ⟨10.1109/23.903812⟩

Article dans une revue hal-04056354v1

Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-based FPGA under Proton Irradiation

Wesley Grignani , Douglas A Santos , Carolina Imianosky , Douglas R Melo , Frédéric Wrobel et al.

27th IEEE Latin American Test Symposium, Mar 2026, Florianopolis, Brazil

Communication dans un congrès hal-05481332v1

Design and Reliability Analysis of a Fault-Tolerant Pipelined RISC-V Processor with Instruction Cache

Wesley Grignani , Douglas A Santos , Douglas R Melo , Frédéric Wrobel , Luigi Dilillo

39th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Sep 2026, Roma, Italy

Communication dans un congrès hal-05692391v1

Neutron Characterization of a Fault-Tolerant Pipelined RISC-V SoC and Instruction Cache

Wesley Grignani , Douglas A Santos , Maria Kastriotou , Carlo Cazzaniga , Douglas R Melo et al.

Radiation and its Effects on Components and Systems Conference, Sep 2026, Prague, Czech Republic

Communication dans un congrès hal-05662824v1

Comparative analysis of SEGR and SEB susceptibility in Si and SiC MOSFETs using TCAD modeling

Cleiton Marques , Alain Michez , Timothée Labau , Rosine Coq Germanicus , Frédéric Wrobel et al.

RADECS 2025 - RADiation and its Effects on Components and Systems Conference, Sep 2025, Anvers, Belgium

Communication dans un congrès cea-05422315v1

HARV-SoC Evaluation on SmartFusion2 and PolarFire FPGAs Under Neutron Radiation

Wesley Grignani , Douglas A Santos , Maria Kastriotou , Carlo Cazzaniga , Douglas R Melo et al.

Radiation and its Effects on Components and Systems Conference, Sep 2025, Antwerp, Belgium

Communication dans un congrès hal-05128008v1

Special Session Paper: Simulation Methodologies and Experiments for Reliability Analysis of Devices in Radiation Harsh Environments

Nikoloas Chatzivangelis , Nikoloas Zazatis , Wesley Grignani , Georgios-Ioannis Paliaroutis , Douglas A Santos et al.

38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2025, Barcelona, Spain

Communication dans un congrès hal-05371489v1

Physical Explanation for the Higher Sensitivity to Ion-Induced Burnout in SiC Schottky Diodes Compared to Si Schottky Diodes

Cleiton Marques , Alain Michez , Frédéric Wrobel , S. Kuboyama , Frédéric Saigné et al.

RADiation Effects on Components and Systems (RADECS), Sep 2024, Maspalomas, Canary Islands, Spain

Communication dans un congrès hal-04715410v1

Proton and Electron Flux Measurement and Simulation during Stratospheric Balloon Flights

Hugo Cintas , Frédéric Wrobel , Frédéric Saigné , Marine Ruffenach , Damien Herrera et al.

RADECS 2023, Sep 2023, Toulouse, France

Communication dans un congrès hal-04980384v1

Studying the South Atlantic Anomaly temporal evolution from 1998 to 2022 using the SEM-2 proton flux

François Ginisty , Frédéric Wrobel , Robert Ecoffet , Mioara Mandea , Alain Michez et al.

EGU, Apr 2023, Vienne (Austria), Austria. ⟨10.5194/egusphere-egu23-12704⟩

Communication dans un congrès hal-04980455v1

Impact of Ground Material and Space Protons Direction on Neutron Flux in Atmosphere

Hugo Cintas , Frédéric Wrobel , Frédéric Saigné , Marine Ruffenach , Françoise Bezerra et al.

NSREC, Jul 2023, Kansas City (US), United States

Communication dans un congrès hal-04980417v1

CARMEN 2 & 3 LEO data projection on RBSP elliptical orbit using machine learning algorithms

François Ginisty , Robert Ecoffet , Frédéric Wrobel , Denis Standarovski , Marine Ruffenach et al.

RADECS, Oct 2022, Venice Italy, Italy

Communication dans un congrès hal-04980576v1

Benchmarks of Energy Deposition Studies for Heavy-Ion Collimation Losses at the LHC

Jean-Baptiste Potoine , Roderik Bruce , Rongrong Cai , Pascal Hermes , Anton Lechner et al.

13th International Particle Accelerator Conference, Jun 2022, Muangthong Thani, Thailand. pp.WEPOST019, ⟨10.18429/JACoW-IPAC2022-WEPOST019⟩

Communication dans un congrès hal-03765965v1

Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices

Lucas Matana Luza , Frédéric Wrobel , Luis Entrena , Luigi Dilillo

ETS 2022 - 27th IEEE European Test Symposium, May 2022, Barcelona, Spain. pp.1-10, ⟨10.1109/ets54262.2022.9810454⟩

Communication dans un congrès lirmm-03833958v1

LEO on Electric Orbit Raising (EOR) projection from CARMEN 3 and 4 datas

François Ginisty , Frédéric Wrobel , Robert Ecoffet , Denis Standarovski , Marine Ruffenach et al.

COSPAR, Jul 2022, Athens (Greece), Greece

Communication dans un congrès hal-04980541v1

Power Deposition Studies for Crystal-Based Heavy Ion Collimation in the LHC

Jean-Baptiste Potoine , Roderik Bruce , Rongrong Cai , Luigi Salvatore Esposito , Pascal Hermes et al.

13th International Particle Accelerator Conference, Jun 2022, Muangthong Thani, Thailand. pp.WEPOST018, ⟨10.18429/JACoW-IPAC2022-WEPOST018⟩

Communication dans un congrès hal-03765969v1

Risk of Halo-Induced Magnet Quenches in the HL-LHC Beam Dump Insertion

Jean-Baptiste Potoine , Andrea Apollonio , Eleonora Belli , Chiara Bracco , Roderik Bruce et al.

12th International Particle Accelerator Conference , May 2021, Online, Brazil. pp.MOPAB002, ⟨10.18429/JACoW-IPAC2021-MOPAB002⟩

Communication dans un congrès hal-03371332v1

Impact of electrical stress and neutron irradiation on reliability of silicon carbide power MOSFET

K. Niskanen , Antoine Touboul , Rosine Coq Germanicus , A. Michez , A. Javanainen et al.

IEEE RADECS 2019, Sep 2019, Montpellier, France. pp.1365 - 1373, ⟨10.1109/TNS.2020.2983599⟩

Communication dans un congrès hal-02446882v1

Evaluation and Analysis of Technologies for Robotic Platforms for the Nuclear Decommissioning

Georgios Tsiligiannis , Antoine Touboul , Gaetan Bricas , Tadec Maraine , Jerome Boch et al.

2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9081293⟩

Communication dans un congrès hal-04023605v1

Effect of Temperature on Single Event Latchup Sensitivity

S. Guagliardo , Frédéric Wrobel , Ygor Quadros de Aguiar , Jean-Luc Autran , P. Leroux et al.

International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS), Apr 2020, Marrakech, Morocco. ⟨10.1109/dtis48698.2020.9081275⟩

Communication dans un congrès hal-03187841v1

Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects

Israel C Lopes , Vincent Pouget , Frédéric Wrobel , Frédéric Saigné , Antoine Touboul et al.

IEEE Latin American Test Symposium (LATS) 2020, Mar 2020, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS49555.2020.9093681⟩

Communication dans un congrès hal-03251533v1

Exploiting Transistor Folding Layout as RHBD technique against Single Event Transients

Y. Q. Aguiar , Frédéric Wrobel , J.-L. Autran , F. L. Kastensmidt , P. Leroux et al.

IEEE RADECS 2019, Sep 2019, Montpellier, France. pp.1581 - 1589, ⟨10.1109/tns.2020.3003166⟩

Communication dans un congrès hal-02446833v1

Single Event Latchup Cross Section Calculation from TCAD Simulations – Effects of the Doping Profiles and Anode to Cathode Spacing

S. Guagliardo , Frédéric Wrobel , Y. Q. Aguiar , J.-L. Autran , P. Leroux et al.

IEEE RADECS 2019, Sep 2019, Montpellier, France

Communication dans un congrès hal-02446849v1

Analysis of Total Dose Effects on a PDSOI n-channel High Voltage Transistor for Analog Applications

F. Perez , F. Saigné , A. Michez , S. Furic , E. Leduc et al.

IEEE RADECS 2019, Sep 2019, Montpellier, France

Communication dans un congrès hal-02442035v1

Silicon carbide power MOSFETs under neutron irradiation: Failure In Time demonstration and long term reliability degradation evaluation

K. Niskanen , Antoine Touboul , Rosine Coq Germanicus , A. Michez , Frédéric Wrobel et al.

55th IEEE Nuclear Space and Radiation Effects Conference, Jul 2019, San Antonio, United States

Communication dans un congrès hal-02446823v1

TCAD simulation of radiation-induced leakage current in SDRAM

Hoang Nguyen , Axel Rodriguez , Frédéric Wrobel , Alain Michez , Francoise Bezerra et al.

29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018), Oct 2018, Aalborg, Denmark

Communication dans un congrès hal-02086412v1

SEE Flux and Spectral Hardness Calibration of Neutron Spallation and Mixed Field Facilities

Matteo Cecchetto , Rubén García Alía , Pablo Fernandez-Martinez , Rudy Ferraro , Salvatore Danzeca et al.

RADECS: Radiation Effects on Components and Systems, Sep 2018, Goteborg, Sweden

Communication dans un congrès hal-02086446v1

Investigation on Passive and Autonomous Mode Operation of Floating Gate Dosimeters

M. Brucoli , S. Danzeca , M. Brugger , A. Masi , A. Pineda et al.

IEEE RADECS2018, 2018, Goteborg, Sweden

Communication dans un congrès hal-02022568v1

Impact of Complex-Logic Cell Layout on the Single-Event Transient Sensitivity

Ygor Quadros de Aguiar , Frédéric Wrobel , Jean-Luc Autran , Paul Leroux , Frédéric Saigné et al.

IEEE RADECS2018, Sep 2018, Goteborg, Sweden

Communication dans un congrès hal-02086422v1

Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions

Ygor Quadros de Aguiar , Frédéric Wrobel , Jean-Luc Autran , Paul Leroux , Frédéric Saigné et al.

29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018), Oct 2018, Aalborg, Denmark

Communication dans un congrès hal-02086379v1

Aging and Gate Bias Effects on TID Sensitivity of Wide Bandgap Power Devices

Kimmo Niskanen , Antoine Touboul , Rosine Coq Germanicus , Frédéric Wrobel , F. Saigné et al.

IEEE RADECS2018, Sep 2018, Goteborg, Sweden

Communication dans un congrès hal-02086450v1

Investigation on the Sensitivity Degradation of Dosimeters based on Floating Gate Structure

M. Brucoli , S. Danzeca , J. Cesari , M. Brugger , A. Masi et al.

IEEE RADECS, 2017, Genève, Switzerland

Communication dans un congrès hal-01931780v1

Floating Gate Dosimeter suitability for Accelerator-like Environments

M. Brucoli , S. Danzeca , M. Brugger , A. Masi , A. Pineda et al.

16th European Conference on Radiation and its Effects on Components and Systems (IEEE RADECS), 2016, Bremen, Germany. pp.2054-2060, ⟨10.1109/TNS.2017.2681651⟩

Communication dans un congrès hal-01931782v1

Analysis of Single-Event Effects in DDR3 and DDR3L SDRAMs Using Laser Testing and Monte-Carlo Simulations

P. Kohler , V. Pouget , Frédéric Wrobel , F. Saigné

NSREC 2017, 2017, New Orleans, United States

Communication dans un congrès hal-01929203v1

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random- Access Memory

Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere et al.

RADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland

Communication dans un congrès hal-01929267v1

Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis

V. Pouget , S. Jonathas , R. Job , J.-R. Vaillé , Frédéric Wrobel et al.

European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) 2017, 2017, Bordeaux, France

Communication dans un congrès hal-01929245v1

TCAD prediction of dose effects on MOSFETs with ECORCE

A. Michez , J. Boch , J. Dardié , Frédéric Wrobel , Antoine Touboul et al.

IEEE RADECS, 2017, Genève, Switzerland

Communication dans un congrès hal-01929250v1

A calculation method to estimate single event upset cross section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Jérôme Boch et al.

ESREF 2017 - 28th European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France. pp.644-649, ⟨10.1016/j.microrel.2017.07.056⟩

Communication dans un congrès hal-01929212v1

Monte Carlo simulation of particle-induced bit upsets

Frédéric Wrobel , Antoine Touboul , Jean-Roch Vaillé , Jérôme Boch , Frédéric Saigné

13th International Conference on Radiation Shielding (ICRS-13) & 19th Topical Meeting of the Radiation Protection & Shielding Division of the American Nuclear Society -2016 (RPSD-2016), Oct 2016, Paris, France. pp.06033, ⟨10.1051/epjconf/201715306033⟩

Communication dans un congrès hal-01645320v1

TCAD Simulations of Leakage Currents Induced by SDRAM Single-Event Cell Degradation

A. Rodriguez , Frédéric Wrobel , A. Michez , Antoine Touboul , F. Bezerra et al.

IEEE RADECS 2016, 2016, Brême, Germany

Communication dans un congrès hal-01824785v1

MTCube project: COTS memory SEE ground-test results and in-orbit error rate prediction

Viyas Gupta , Alexandre Louis Bosser , Frédéric Wrobel , Frédéric Saigné , Laurent Dusseau et al.

4S: Small Satellites Systems and Services Symposium, Centre national d'études spatiales (CNES); European Space Agency (ESA), May 2016, La Valletta, Malta

Communication dans un congrès lirmm-01298423v1

Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAM

Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Helmut Puchner et al.

RADECS: Radiation and Its Effects on Components and Systems, Sep 2016, Bremen, Germany

Communication dans un congrès lirmm-01337405v1

The Power Law Shape of Heavy Ions Experimental Cross Section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Eric Lorfèvre et al.

NSREC: Nuclear and Space Radiation Effects Conference, IEEE NPSS (Nuclear & Plasma Sciences Society ), Jul 2016, Portland, United States

Communication dans un congrès lirmm-01298421v1

Real-Time SRAM Based Particle Detector

Luigi Dilillo , Alexandre Louis Bosser , Viyas Gupta , Frédéric Wrobel , Frédéric Saigné

IWASI: International Workshop on Advances in Sensors and Interfaces, Politecnico di Bari, Jun 2015, Gallipoli, Italy. pp.58-62, ⟨10.1109/IWASI.2015.7184968⟩

Communication dans un congrès lirmm-01238435v1

SEL Hardness Assurance in a Mixed Radiation Field

R. Alia Garcia , M. Brugger , S. Danzeca , V. Ferlet-Cavrois , C. Frost et al.

51th IEEE Nuclear Space and Radiation Effects Conference, 2015, Boston, United States

Communication dans un congrès hal-01824775v1

Proton-Induced SDRAM Cell Degradation

Axel Rodriguez , Frédéric Wrobel , Anne Samaras , Francoise Bezerra , Benjamin Vandevelde et al.

RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365650⟩

Communication dans un congrès lirmm-01238408v1

A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Rudy Ferraro , Christopher Frost et al.

RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365578⟩

Communication dans un congrès lirmm-01238397v1

Simulation tools for soft error rate calculations in SRAM

Frédéric Wrobel

CMOS Emerging Technologies Conference, 2015, Vancouver, Canada

Communication dans un congrès hal-01932449v1

Experimental Characterization and In-flight Observation of Weakened Cells in SDRAM

A. Samaras , B. Vandevelde , N. Sukhaseum , N. Chatry , A. Rodriguez et al.

IEEE RADECS 2015, 2015, Moscou, Russia

Communication dans un congrès hal-01932459v1

Investigation of Alpha Emissivity as a Function of Time

Frédéric Wrobel , A. Kaouache , F. Saigné , Antoine Touboul , R. D. Schrimpf et al.

51th IEEE Nuclear Space and Radiation Effects Conference, 2015, Boston, United States

Communication dans un congrès hal-01824780v1

Generic Analytic Expression of Heavy Ion SEU Cross Section Derived from Monte-Carlo Diffusion-Based Prediction Code

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Robert Ecoffet et al.

NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States

Communication dans un congrès lirmm-01238388v1

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen et al.

NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, MA, United States. ⟨10.1109/TNS.2015.2496874⟩

Communication dans un congrès hal-01932433v1

Heavy-ion radiation impact on a 4Mb FRAM under Different Test Conditions

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammadzadeh , Arto Javanainen et al.

RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365617⟩

Communication dans un congrès lirmm-01238392v1

Impact of Stacked-Layer Structure on SEE Rate of SRAMs

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammadzadeh , Arto Javanainen et al.

NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States

Communication dans un congrès lirmm-01238384v1

Impact of natural radioactivity on the Soft Error Rate

Frédéric Wrobel

CMOS Emerging Technologies Conference, 2014, Grenoble, France

Communication dans un congrès hal-01934472v1

Single Event Upset Prediction from Heavy Ions Cross Sections with No Parameters

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Frédéric Saigné

NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France

Communication dans un congrès lirmm-01237668v1

Contraintes radiatives que subit l'électronique au sol et en altitude - Notions fondamentales

Frédéric Wrobel

Journées RADSOL du GDR ERRATA, 2014, Paris, France

Communication dans un congrès hal-01932596v1

Presentation of the MTCube CubeSat Project

Viyas Gupta , Luigi Dilillo , Frédéric Wrobel , Ali Mohammad Zadeh , Muriel Bernard et al.

4S Symposium 2014 - Small Satellites Systems and Services, European Space Agency (ESA); Centre National d'Etudes Spatiales (CNES), May 2014, Majorca, Spain

Communication dans un congrès lirmm-01272951v1

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive operating area determination

A. Privat , Antoine Touboul , A. Michez , S. Bourdarie , J.-R. Vaillé et al.

50th IEEE Nuclear Space and Radiation Effects Conference, 2014, Paris, France

Communication dans un congrès hal-01824688v1

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude Vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Tarek Saad Saoud , Soilihi Moindjie , Jean-Luc Autran , Daniela Munteanu , Frédéric Wrobel et al.

NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France

Communication dans un congrès lirmm-01237717v1

Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.

NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France

Communication dans un congrès lirmm-01237709v1

Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation

Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard et al.

NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France

Communication dans un congrès lirmm-01237660v1

SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate

R. Alia Garcia , E. W. Blackmore , M. Brugger , S. Danzeca , V. Ferlet-Cavrois et al.

50th IEEE Nuclear Space and Radiation Effects Conference, 2014, Paris, France

Communication dans un congrès hal-01824720v1

SEU Cross Section Calculation Based on Experimental Data of Another kind of Particle

Annelise Touboul , Antoine Touboul , Frédéric Wrobel , V. Pouget , Luigi Dilillo et al.

NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France

Communication dans un congrès hal-01934616v1

SEL Cross Section Energy Dependence Impact on the High-Energy Accelerator Error Rate

R. Garcia Alia , S. Danzeca , M. Brugger , M. Julien , S. Giovanni et al.

IEEE-NSREC 2014, 2014, Paris, France

Communication dans un congrès hal-01934546v1

Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation Environments

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.

IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2013, Bari, Italy. pp.75-80, ⟨10.1109/IWASI.2013.6576070⟩

Communication dans un congrès lirmm-00839046v1

Impact of Single Event Gate Rupture and latent defects on Power MOSFETs switching operation

A. Privat , Antoine Touboul , M. Petit , J. Huselstein , Frédéric Wrobel et al.

IEEE RADECS 2013, 2013, Oxford, United Kingdom

Communication dans un congrès hal-01824651v1

SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variations

Georgios Tsiligiannis , Elena Ioana Vatajelu , Luigi Dilillo , Alberto Bosio , Patrick Girard et al.

IOLTS: International On-Line Testing Symposium, Jul 2013, Chania, Crete, Greece. pp.145-150, ⟨10.1109/IOLTS.2013.6604066⟩

Communication dans un congrès lirmm-00818955v1

On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell

Elena Ioana Vatajelu , Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard et al.

DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. pp.143-148, ⟨10.1109/DFT.2013.6653597⟩

Communication dans un congrès lirmm-01238413v1

Comparison of the transient current shapes obtained with the diffusion model and the double exponential law — Impact on the SER

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Frédéric Saigné

RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937441⟩

Communication dans un congrès lirmm-01237599v1

SEE Measurements and Simulations using Mono-Energetic GeV-Energy Hadron Beams

R. Alia Garcia , S. Danzeca , M. Brugger , G. Spiezia , S. Uznanski et al.

Nuclear and Space Radiation Effects (NSREC), 2013, San Francisco, United States

Communication dans un congrès hal-01824413v1

Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBT

Lionel Foro , Antoine Touboul , Frédéric Wrobel , Paolo Rech , Luigi Dilillo et al.

RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937428⟩

Communication dans un congrès lirmm-01237617v1

Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic Mode

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.

RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937429⟩

Communication dans un congrès lirmm-00839062v1

Temperature Impact on the Neutron SER of a Commercial 90nm SRAM

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.

NSREC: Nuclear and Space Radiation Effects Conference, Jul 2013, San Francisco, Ca, United States. pp.1-4

Communication dans un congrès lirmm-00805291v1

Problématique et ordres de grandeur

Frédéric Wrobel

Journées RADSOL du GDR ERRATA, 2013, Paris, France

Communication dans un congrès hal-01935689v1

Evaluating An SEU Monitor For Mixed-Field Radiation Environments

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.

iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL Synchrotron, Jun 2013, Paris, France

Communication dans un congrès lirmm-01238433v1

Analytical Method to Evaluate Soft Error Rate Due to Alpha Pollutants

A. Kaouache , Frédéric Wrobel , F. Saigné , Antoine Touboul , R. D. Schrimpf

Nuclear and Space Radiation Effects (NSREC), 2013, San Francisco, United States

Communication dans un congrès hal-01824623v1

Effect of thorium decay chain disequilibrium on alpha emissivity

A. Kaouache , Frédéric Wrobel , F. Saigné , Antoine Touboul , R. Schrimpf et al.

IEEE RADECS 2013, 2013, Oxford, United Kingdom

Communication dans un congrès hal-01824648v1

SEU Monitoring in Mixed-Field Radiation Environments of Particle Accelerators

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.

RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937419⟩

Communication dans un congrès lirmm-00839085v1

Post-Irradiation-Gate-Stress on Power MOSFETs: Quantification of Latent Defects-Induced Reliability Degradation

A. Privat , Antoine Touboul , R. Arinero , Frédéric Wrobel , F. Saigné et al.

Nuclear and Space Radiation Effects (NSREC), 2013, San Francisco, United States

Communication dans un congrès hal-01824642v1

An Integrated Solid Detector For Onboard Detection Of Natural Radiations In Atmosphere

Frédéric Wrobel , Jean-Roch Vaillé , Antoine Touboul , Luigi Dilillo , Frédéric Saigné

iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL synchrotron, Jun 2013, Paris, France

Communication dans un congrès lirmm-01238432v1

A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to Neutrons

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial et al.

RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4

Communication dans un congrès lirmm-00805163v1

Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS Transistor

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Jean-Roch Vaillé , Frédéric Saigné

NSREC: Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States. pp.1-4

Communication dans un congrès lirmm-00805275v1

A Simple Method for Assessing Power Devices Sensitivity to SEEs in Atmospheric Environment

L. Foro , Antoine Touboul , Frédéric Wrobel , Frédéric Saigné

IEEE RADECS 2012, 2012, Biarritz, France

Communication dans un congrès hal-01824381v1

SEU Measurements and Simulations in a Mixed Field Environment

R. Alia Garcia , B. Biskup , M. Brugger , M. Calviani , C. Poivey et al.

IEEE RADECS 2012, 2012, Biarritz, France

Communication dans un congrès hal-01824344v1

Trench Fieldstop IGBT failures at ground level

Antoine Touboul , Frédéric Wrobel

SEE Symposium, 2012, San Diego, United States

Communication dans un congrès hal-01935981v1

Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere et al.

RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4

Communication dans un congrès lirmm-00805150v1

Dynamic Mode Test of a Commercial 4Mb Toggle MRAM under Neutron Radiation

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial et al.

RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4

Communication dans un congrès lirmm-00805165v1

Alpha particle-induced transient currents in 65 nm and 40 nm technologies

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Frédéric Saigné

SEE'2012: Single Event Effects Symposium, Apr 2012, San Diego, CA, United States. pp.1

Communication dans un congrès lirmm-00805378v1

Soft Error Triggering Criterion Based on Simple Electrical Model of the SRAM cell

Frédéric Wrobel , Antoine Touboul , Frédéric Saigné

IEEE RADECS 2012, 2012, Biarritz, France

Communication dans un congrès hal-01824369v1

A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in Altitude

Denis Pantel , Jean-Roch Vaillé , Frédéric Wrobel , Luigi Dilillo , Jean-Marc J.-M. Galliere et al.

IEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, ⟨10.1109/RTC.2012.6418104⟩

Communication dans un congrès lirmm-00805169v1

Neutrons-induced IGBT Failure: Effects of the Number of Tested Devices on the Cross Section Calculation

Antoine Touboul , L. Foro , Frédéric Wrobel , K. Guetarni , J. Boch et al.

IEEE RADECS 2012, 2012, Biarritz, France

Communication dans un congrès hal-01824319v1

Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron Radiation

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial et al.

IOLTS: International On-Line Testing Symposium, Jun 2012, Sitges, Spain. pp.212-222, ⟨10.1109/IOLTS.2012.6313853⟩

Communication dans un congrès lirmm-00805373v1

Complete Framework for the Estimation of the SRAM Core-Cell Resilience to Radiation

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial et al.

RADECS: Radiation and its Effects on Components and Systems, Sep 2012, Biarritz, France

Communication dans un congrès hal-01935785v1

Synergy of non-ionizing and ionizing processes in the reliability degradation of Power MOSFETs oxide

M. Naceur , Antoine Touboul , M. Gedion , J.-R. Vaillé , Frédéric Wrobel et al.

IEEE RADECS, 2011, Seville, Spain

Communication dans un congrès hal-01824307v1

Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power Devices

Alessio Griffoni , Jeroen van Duivenbode , Dimitri Linten , Eddy Simoen , Paolo Rech et al.

RADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.226-231, ⟨10.1109/RADECS.2011.6131395⟩

Communication dans un congrès lirmm-00805339v1

Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Frédéric Wrobel et al.

RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩

Communication dans un congrès lirmm-00805314v1

Dynamic-Stress Neutrons Test of Commercial SRAMs

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné et al.

IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4

Communication dans un congrès lirmm-00805349v1

Neutron-Induced Failures of Trench Gate Fieldstop IGBT

L. Foro , Antoine Touboul , Frédéric Wrobel , Frédéric Saigné

IEEE NSREC, 2011, Las Végas, United States

Communication dans un congrès hal-01824305v1

Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench

Luigi Dilillo , Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel et al.

IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6

Communication dans un congrès lirmm-00805120v1

Robust Data Collection and Transfer Framework for a Distributed SRAM Based Neutron Sensor

Luigi Dilillo , Alberto Bosio , Paolo Rech , Patrick Girard , Frédéric Wrobel et al.

IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2011, Savelletri di Fasano, Italy. pp.176-180, ⟨10.1109/IWASI.2011.6004712⟩

Communication dans un congrès lirmm-00805394v1

A Monte-Carlo Engineer Tool for the Prediction of SEU Proton Cross Section from Heavy Ion Data

C. Weulersse , Frédéric Wrobel , F. Miller , T. Carriere , R. Gaillard et al.

RADECS 2011, 2011, Seville, Spain

Communication dans un congrès hal-01937424v1

Alpha-Soft Error Rate due to new generations of high-k gate oxides and metal gate electrodes in a 32 nm node

M. Gedion , Frédéric Wrobel , F. Saigné , R. D. Schrimpf

RADECS 2011, 2011, Seville, Spain

Communication dans un congrès hal-01937444v1

Effect of Uranium Chain Disequilibrium on Alpha Disintegration Rate

M. Gedion , Frédéric Wrobel , Frédéric Saigné , M. Portier , Antoine Touboul et al.

IEEE NSREC, 2011, Las Végas, United States

Communication dans un congrès hal-01824299v1

ORACLE : A tool for predicting Soft Error Rate

Frédéric Wrobel , F. Saigné

Supercomputing in nuclear Application, 2010, Tokyo, Japan

Communication dans un congrès hal-01937506v1

Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné et al.

RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria

Communication dans un congrès lirmm-00566847v1

Front End of Line, Back End of Line, and Packaging Contribution to Soft Errors Induced by Alpha Particles

M. Gedion , Frédéric Wrobel , Frédéric Saigné

47th IEEE Nuclear Space and Radiation Effects Conference, 2010, Denver, United States

Communication dans un congrès hal-01823034v1

ORACLE: A tool for predicting Soft Error Rate

Frédéric Wrobel , Frédéric Saigné

Supercomputing in nuclear Application, 2010, Tokyo, Japan

Communication dans un congrès hal-01823016v1

Comparison of SER induced by Uranium and Thorium

M. Gedion , Frédéric Wrobel , F. Saigné

8th European Workshop on Radiation and its Effects on Components and Systems, 2010, Langenfeld, Austria

Communication dans un congrès hal-01823542v1

Caractérisation électromagnétique d'une diode perturbée par des convertisseurs lors d'une campagne de mesures en ballon

Blain Amable , Denis Pantel , Adrien Doridant , Jérémy Raoult , Frédéric Wrobel et al.

Club Opto-Hyper, May 2010, Toulouse, France

Communication dans un congrès hal-01894330v1

Velocity effect on heavy ion-induced gate oxide latent defects

Antoine Touboul , M. Portier , R. Arinero , G. Chaumont , Frédéric Saigné et al.

47th IEEE Nuclear Space and Radiation Effects Conference, 2010, Denver, United States

Communication dans un congrès hal-01823532v1

R&D For a GEANT4-based, multi-scale simulation environment to study the radiation effects on electronic devices

J. Mekki , Frédéric Wrobel , Frédéric Saigné , M. G. Pia

Supercomputing in nuclear Application, 2010, Tokyo, Japan

Communication dans un congrès hal-01823023v1

Behavior of CVD diamond-based TL dosimeters in radiotherapy environments using photon and electron beams from treatment accelerators

M. Benabdesselam , A. Petitfils , Frédéric Wrobel , F. Mady , S. Marcié et al.

21st Conference on Diamond, Diamond like Materials, Carbon Nanotubes and Nitrides, Sep 2010, Budapest, Hungary

Communication dans un congrès hal-01307873v1

Use of BOBST for the Detection of Neutrons Induced Errors in SRAM

Luigi Dilillo , Frédéric Wrobel , Jean-Marc J.-M. Galliere , F. Saigné

IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2009, Trani, Italy

Communication dans un congrès hal-01957246v1

Neutron Detection through an SRAM-Based Test Bench

Luigi Dilillo , Frédéric Wrobel , Jean-Marc J.-M. Galliere , Frédéric Saigné

IWASI'09: International Workshop On Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. pp.64-69, ⟨10.1109/IWASI.2009.5184769⟩

Communication dans un congrès lirmm-00438842v1

Radioactive Nuclei Induced Soft Errors at Ground Level

Frédéric Wrobel , Frédéric Saigné , M. Gedion , J. Gasiot , R. D. Schrimpf

46th IEEE Nuclear Space and Radiation Effects Conference, 2009, Québec, Canada

Communication dans un congrès hal-01822778v1

Study of the Contribution of Latent Defects Induced by Swift Heavy Ion Irradiation on the Gate Oxide Breakdown

M. Marinoni , Antoine Touboul , D. Zander , C. Petit , A.M.J.F. Carvalho et al.

7th European Workshop on Radiation and its Effects on Components and Systems, 2008, Jyvaskyla, Finland

Communication dans un congrès hal-01822746v1

30 MeV and 63 MeV neutron induced energy deposition in a silicon diode: Experimental validation of Monte Carlo simulation

S. Rocheman , Frédéric Wrobel , J.-R. Vaillé , Frédéric Saigné , C. Weulersse et al.

45th IEEE Nuclear Space and Radiation Effects Conference, 2008, Tucson, United States

Communication dans un congrès hal-01822737v1

Investigation of the influence of process and design on soft error rate in integrated CMOS technologies thanks to Monte Carlo simulation

C. Weulersse , A. Bougerol , G. Hubert , Frédéric Wrobel , T. Carriere et al.

2008 IEEE International Reliability Physics Symposium (IRPS), Apr 2008, Phoenix, United States. ⟨10.1109/RELPHY.2008.4559010⟩

Communication dans un congrès hal-01762971v1

Prediction of Multiple Cell Upset induced by heavy ions in a 90nm bulk SRAM

V. Correas , Frédéric Saigné , B. Sagnes , Frédéric Wrobel , J. Boch et al.

7th European Workshop on Radiation and its Effects on Components and Systems, 2008, Jyvaskyla, Finland

Communication dans un congrès hal-01822751v1

Hafnium and Uranium Contributions to Soft Error Rate

Frédéric Wrobel , J. Gasiot , Frédéric Saigné

45th IEEE Nuclear Space and Radiation Effects Conference, 2008, Tucson, United States

Communication dans un congrès hal-01822453v1

Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells

C. Rusu , A. Bougerol , Lorena Anghel , C. Weulerse , N. Buard et al.

13th IEEE International On-Line Testing symposium (IOLT'07), Jul 2007, Crete, Greece. pp.137-145, ⟨10.1109/IOLTS.2007.46⟩

Communication dans un congrès hal-00172599v1

Determination of the Deposited Energy in a Silicon Volume by n-Si Nuclear Interaction using 14 MeV neutron source

H. Chabane , J.-R. Vaillé , Bruno Barelaud , Frédéric Wrobel , Y. Calzavara et al.

43th IEEE Nuclear Space and Radiation Effects Conference, 2006, Ponte Vedra Beach, United States

Communication dans un congrès hal-01807738v1

Prediction of transients induced by neutrons/protons in CMOS combinational logic cells

A. Hubert , A. Bougerol , F. Miller , N. Buard , Lorena Anghel et al.

12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006, Lake Como, Italy. 9 pp., ⟨10.1109/IOLTS.2006.51⟩

Communication dans un congrès hal-00142517v1

A review of DASIE code family: contribution to SEU/MBU understanding

G. Hubert , G. Buard , N. Weulersse , C. Carrière , M.-C. Palau et al.

11th IEEE International On-Line Testing Symposium, 2005, Saint Raphael, France

Communication dans un congrès hal-01806862v1

Comparison of Experimental and Simulated Am/Be Neutron Source Energy Spectra Obtained in Silicon Detector

H. Chabane , J.-R. Vaillé , T. Mérelle , Bruno Barelaud , Frédéric Wrobel et al.

8th European Conference on Radiation and its Effects on Components and Systems, 2005, Cap d'Agde, France

Communication dans un congrès hal-01807160v1

Neutron-Induced SEU in SRAMs: Simulations With n-Si and n-O Interactions

D. Lambert , J. Baggio , G. Hubert , V. Ferlet-Cavrois , O. Flament et al.

42th IEEE Nuclear Space and Radiation Effects Conference, 2005, Seattle, United States

Communication dans un congrès hal-01807126v1

SEU calculations for neutron induced alpha in sensitive RAMs

Frédéric Wrobel , J.-M. Palau , P. Iacconi , M.-C. Calvet , B. Sagnes et al.

41th IEEE Nuclear Space and Radiation Effects Conference, 2004, Atlanta, United States

Communication dans un congrès hal-01806807v1

Monte-Carlo simulations to quantify neutron-induced multiple bit upsets in advanced SRAMs

T. Mérelle , Frédéric Saigné , B. Sagnes , G. Gasiot , P. Roche et al.

5th European Workshop on Radiation and its Effects on Components and Systems, 2004, Madrid, Spain

Communication dans un congrès hal-01806854v1

A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures

Cleiton Marques , Leonardo Brendler , Frédéric Wrobel , Alexandra Zimpeck , Walter Bartra et al.

IEEE, pp.1-6, 2023, ⟨10.1109/SBCCI60457.2023.10261665⟩

Proceedings/Recueil des communications hal-04238000v1

Single-Event Effects, from Space to Accelerator Environments

Ygor Quadros De Aguiar , Frédéric Wrobel , Jean-Luc Autran , Rubén García Alía

Springer International Publishing, 2025, ISBN978-3-031-71723-9. ⟨10.1007/978-3-031-71723-9⟩

Ouvrages hal-04980620v1

Chargement...

Frédéric Wrobel

Publications

Publications

Reliability analysis of clock networks and critical paths under radiation-induced transients using custom simulation tools

Study of TID Response of a Low Cost Motor Board with a System-Level Testing Approach

HARV-SoC Evaluation on SmartFusion2 and PolarFire FPGAs Under Neutron and Proton Radiation

Kosmiko: from CMOS imaging sensors to pixel-calibrated particle instruments

Single Event Effects of SiC power MOSFETs: from neutron interaction to destruction at the die level

An introduction to natural radiations and their detrimental effects on electronic devices

Physical Explanation for the Higher Sensitivity to Ion-Induced Burnout in SiC Schottky Diodes Compared to Si Schottky Diodes

Physics-Based Ion Track Structure Model for Single-Event Effect Simulations on Power Devices

SEU cross-section estimation using ECORCE TCAD tool

Proton, Electron, and Photon Flux Measurement and Simulation During Stratospheric Balloon Flights

South Atlantic Anomaly Evolution Seen by the Proton Flux

A Methodology to Estimate Single-Event Effects Induced by Low-Energy Protons

Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells

RAMSEES: A Model of the Atmospheric Radiative Environment Based on Geant4 Simulation of Extensive Air Shower

An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons

Power deposition studies for standard and crystal-assisted heavy ion collimation in the CERN Large Hadron Collider

Comparison of relativistic electron flux at Low Earth Orbit (LEO) and Electric Orbit Raising (EOR) from the CARMEN Missions

CARMEN 2 & 3 LEO Electron Flux Measurements Linear Projection Onto RBSP Elliptical Orbit

Neutron-Induced Failure Dependence on Reverse Gate Voltage for SiC Power MOSFETs in Atmospheric Environment

Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge

0.1–10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric Environments

Mitigation and Predictive Assessment of SET Immunity of Digital Logic Circuits for Space Missions

Analysis of SET Propagation in a System in Package Point of Load Converter

Reliability-driven pin assignment optimization to improve in-orbit soft-error rate

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

Thermal Neutron-Induced SEUs in the LHC Accelerator Environment

Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation

Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate

Design exploration of majority voter architectures based on the signal probability for TMR strategy optimization in space applications

Radiation hardening efficiency of gate sizing and transistor stacking based on standard cells

Impact of Complex-Logic Cell Layout on the Single-Event Transient Sensitivity

Investigation on Passive and Autonomous Mode Operation of Floating Gate Dosimeters

SEE flux and spectral hardness calibration of neutron spallation and mixed field facilities

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions

Analysis of Single-Event Effects in DDR3 and DDR3L SDRAMs Using Laser Testing and Monte-Carlo Simulations

TCAD simulation of radiation-induced leakage current in 1T1C SDRAM

Floating Gate Dosimeter Suitability for Accelerator-like Environments

Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis

A calculation method to estimate single event upset cross section

Tools for modeling radioactive contaminants in chip materials

Proton-Induced Single-Event Degradation in SDRAMs

The Power Law Shape of Heavy Ions Experimental Cross Section

Methodologies for the Statistical Analysis of Memory Response to Radiation

Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions

Soft errors in commercial off-the-shelf static random access memories

SEL Hardness Assurance in a Mixed Radiation Field

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

SEE on Different Layers of Stacked-SRAMs

Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology

An SRAM Based Monitor for Mixed-Field Radiation Environments

Energy Dependence of Tungsten-Dominated SEL Cross Sections

Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate

Dynamic Test Methods for COTS SRAMs

Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

An Analytical Model to Quantify Decay Chain Disequilibrium&#x2013;Application to the Thorium Decay Chain

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Multiple Cell Upset Classification in Commercial SRAMs

Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode

Post-Irradiation-Gate-Stress on Power MOSFETs: Quantification of Latent Defects-Induced Reliability Degradation

Neutrons-Induced IGBT Failure: Effects of the Number of Tested Devices on the Cross Section Calculation

SEE Measurements and Simulations Using Mono-Energetic GeV-Energy Hadron Beams

SEU Measurements and Simulations in a Mixed Field Environment

A Simple Method for Assessing Power Devices Sensitivity to SEEs in Atmospheric Environment

Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM cell

Analytical Method to Evaluate Soft Error Rate Due to Alpha Contamination

A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation

Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling

Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects

On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum

Embedded silicon detector to investigate the natural radiative environment

Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress

Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions

An Analytical Model to Quantify Decay Chain Disequilibrium–Application to the Thorium Decay Chain

CARMEN 2 & 3 LEO data projection on RBSP elliptical orbit using machine learning algorithms