Giorgio Di Natale
241
Documents
Presentation
Giorgio Di Natale received the PhD in Computer Engineering from the Politecnico di Torino in 2003. He is director of research for the National Research Center of France at the TIMA laboratory in Grenoble.
His research interests include hardware security and trust, secure circuits design and test, reliability evaluation and fault tolerance, software implemented hardware fault tolerance, and VLSI testing.
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Open Automation Framework for Complex Parametric Electrical SimulationsInternational Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2023), IEEE, May 2023, Tallinn, Estonia
Conference papers
hal-04103996v1
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On-Line Method to Limit Unreliability and Bit-Aliasing in RO-PUFIEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS 2023), Jul 2023, Crete, Greece. ⟨10.1109/IOLTS59296.2023.10224877⟩
Conference papers
hal-04193294v1
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A Study of High Temperature Effects on Ring Oscillator based Physical Unclonable Functions29th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2023), Jul 2023, Chania, Greece
Conference papers
hal-04169632v1
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NEUROPULS: NEUROmorphic energy-efficient secure accelerators based on Phase change materials aUgmented siLicon photonicSETS 2023 - IEEE European Test Symposium, IEEE, May 2023, Venise, Italy. ⟨10.48550/arXiv.2305.03139⟩
Conference papers
hal-04103942v1
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MBSA Approaches Applied to Next Decade Digital System-On-a-Chip ComponentsCongrès Lambda Mu 23 « Innovations et maîtrise des risques pour un avenir durable » - 23e Congrès de Maîtrise des Risques et de Sûreté de Fonctionnement, Institut pour la Maîtrise des Risques, Oct 2022, Paris Saclay, France
Conference papers
hal-03877954v1
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On-Line Reliability Estimation of Ring Oscillator PUFIEEE European Test Symposium (ETS 2022), May 2022, Barcelona, Spain. ⟨10.1109/ETS54262.2022.9810418⟩
Conference papers
hal-03767650v1
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Circuit-to-Circuit Attacks in SoCs via Trojan-Infected IEEE 1687 Test InfrastructureIEEE International Test Conference, Sep 2022, Anaheim, United States
Conference papers
hal-03738329v1
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Sub-Space Modeling: An Enrollment Solution for XOR Arbiter PUF using Machine LearningInternational Symposium on Quality Electronic Design (ISQED 2022), Apr 2022, Virtual event, United States. ⟨10.1109/ISQED54688.2022.9806267⟩
Conference papers
hal-03599356v1
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Elaborating on Sub-Space Modeling as an Enrollment Solution for Strong PUF18th IEEE International Conference on Distributed Computing in Sensor Systems (DCOSS 2022), May 2022, Los Angeles, United States
Conference papers
hal-03767658v1
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Secure PUF-based Authentication and Key Exchange Protocol using Machine LearningIEEE Computer Society Annual Symposium on VLSI (ISVLSI 2022), Jul 2022, Pafos, Cyprus
Conference papers
hal-03689856v1
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On the optimization of Software Obfuscation against Hardware Trojans in MicroprocessorsIEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2022), Apr 2022, Prague, Czech Republic
Conference papers
hal-03616490v1
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An Efficient Approach to Model Strong PUF with Multi-Layer Perceptron using Transfer LearningInternational Symposium on Quality Electronic Design (ISQED 2022), Apr 2022, Virtual event, United States. ⟨10.1109/ISQED54688.2022.9806257⟩
Conference papers
hal-03599336v1
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Dependability of Alternative Computing Paradigms for Machine Learning: hype or hope?IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2022), Apr 2022, Prague, Czech Republic. ⟨10.1109/DDECS54261.2022.9770138⟩
Conference papers
hal-03641285v1
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Software Product Reliability Based on Basic Block Metrics RecompositionIEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS 2022), Sep 2022, Turin, Italy. ⟨10.1109/IOLTS56730.2022.9897289⟩
Conference papers
hal-03768055v1
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MBSA Approaches Applied to Next Decade Digital ComponentsIEEE European Test Symposium (ETS 2022), May 2022, Barcelona, Spain
Conference papers
hal-03767686v1
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Identification of Hardware Devices based on Sensors and Switching Activity: a Preliminary StudyDesign, Automation & Test in Europe Conference & Exhibition (DATE 2021), Feb 2021, Grenoble (virtuel), France. ⟨10.23919/DATE51398.2021.9474173⟩
Conference papers
hal-03351477v1
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Security Primitives with Emerging MemoriesDesign Automation Conference (DAC 2021), Dec 2021, San Francisco, United States
Conference papers
hal-03652969v1
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Automated Dysfunctional Model Extraction for Model Based Safety Assessment of Digital SystemsIEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS 2021), Jun 2021, Torino, Italy. ⟨10.1109/IOLTS52814.2021.9486705⟩
Conference papers
hal-03351793v1
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Security EDA Extension through P1687.1 and 1687 CallbacksIEEE International Test Conference (ITC 2021), Oct 2021, Anaheim (CA), United States. pp.344-353, ⟨10.1109/ITC50571.2021.00050⟩
Conference papers
hal-03629319v1
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Memristive Logic-in-Memory Implementations: A Comparison16th International Conference on PRIME, Jul 2021, Online, Germany
Conference papers
hal-03370877v1
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On the Limitations of Concatenating Boolean Operations in Memristive-Based Logic-In-Memory Solutions16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021), Jun 2021, Apulia (virtuelle), Italy. ⟨10.1109/DTIS53253.2021.9505096⟩
Conference papers
hal-03351924v1
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Hardware Security and Machine Learning: Hero or Hoax?22nd IEEE Latin-American Test Symposium (LATS 2021), Oct 2021, Virtual event, Brazil
Conference papers
hal-03635104v1
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Design Space Exploration Applied to Security16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021), Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505151⟩
Conference papers
hal-03351948v1
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Scramble Cache: An Efficient Cache Architecture for Randomized Set PermutationDesign, Automation & Test in Europe Conference & Exhibition (DATE 2021), Feb 2021, Grenoble, France. ⟨10.23919/DATE51398.2021.9473919⟩
Conference papers
hal-03351626v1
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Machine Learning and Hardware security: Challenges and OpportunitiesInternational Conference on Computer-Aided Design (ICCAD 2020), Nov 2020, San Diego, United States
Conference papers
hal-02999327v1
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PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test CommunityIEEE European Test Symposium (ETS 2020), May 2020, Tallinn, Estonia. pp.1-10
Conference papers
hal-02999226v1
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Power of Prediction: Advantages of Deep Learning Modeling as Replacement for Traditional PUF CRP EnrollmentTrueDevice2020, Mar 2020, Grenoble, France
Conference papers
hal-02954099v1
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Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access MechanismIEEE European Test Symposium, May 2020, Tallinn, Estonia. ⟨10.1109/ETS48528.2020.9131560⟩
Conference papers
hal-02532389v1
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Nonlinear Codes for Control Flow CheckingIEEE European Test Symposium (ETS 2020), May 2020, Tallinn, Estonia. ⟨10.1109/ETS48528.2020.9131592⟩
Conference papers
hal-02899964v1
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Latest Trends in Hardware Security and PrivacyIEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2020), Oct 2020, Rome, Italy
Conference papers
hal-02999289v1
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Rebooting Computing: The Challenges for Test and Reliability2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Oct 2019, Noordwijk, Netherlands. pp.8138-8143, ⟨10.1109/DFT.2019.8875270⟩
Conference papers
hal-02462194v1
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Providing Confidentiality and Integrity in Ultra Low Power IoT DevicesDTIS 2019 - 14th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2019, Mykonos, Greece. ⟨10.1109/DTIS.2019.8735090⟩
Conference papers
hal-02166920v1
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Special Session: Reliability of Hardware-Implemented Spiking Neural Networks (SNN)IEEE VLSI Test Symposium (VTS 2019), Apr 2019, Monterey, United States
Conference papers
hal-02166904v1
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On the Reliability of the Ring Oscillator Physically Unclonable FunctionsIEEE 4th International Verification and Security Workshop (IVSW'2019), Jul 2019, Rhodes Island, Greece. pp.25-30
Conference papers
hal-02506955v1
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High-Entropy STT-MTJ-based TRNG8th Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE'2019), May 2019, Baden Baden, Germany
Conference papers
hal-02506736v1
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A Comprehensive Approach to a Trusted Test InfrastructureIVSW 2019 - 4th IEEE International Verification and Security Workshop, Jul 2019, Rhodes, Greece. pp.43-48, ⟨10.1109/IVSW.2019.8854428⟩
Conference papers
lirmm-02306980v1
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HATE: a HArdware Trojan Emulation Environment for Microprocessor-based SystemsIEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS'2019), Jul 2019, Rhodes Island, Greece
Conference papers
hal-02506766v1
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Hidden-Delay-Fault Sensor for Test, Reliability and SecurityIEEE Design Automation and Test Conference in Europe (DATE 2019), Mar 2019, Florence, Italy
Conference papers
hal-02166929v1
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Alternatives to fault injections for early safety/security evaluations24th IEEE European Test Symposium (ETS 2019), May 2019, Baden Baden, Germany. ⟨10.1109/ETS.2019.8791555⟩
Conference papers
hal-02110119v1
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Stream Cipher Based Encryption in IEEE Test StandardsTRUDEVICE 2019 - 8th Workshop on Trustworthy Manufacturing and Utilization of Secure Devices, May 2019, Baden Baden, Germany
Conference papers
hal-02506743v1
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Encryption-Based Secure JTAGDDECS 2019 - 22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2019, Cluj-Napoca, Romania. pp.1-6, ⟨10.1109/DDECS.2019.8724654⟩
Conference papers
hal-02149061v1
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Neuromorphic Computing - From Robust Hardware Architectures to Testing Strategies26th IFIP IEEE International Conference on Very Large Scale Integration (VLSI SOC 2018), Oct 2018, Verona, Italy. pp.176-179, ⟨10.1109/VLSI-SoC.2018.8644897⟩
Conference papers
hal-01961756v1
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The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacksIOLTS: International On-Line Testing Symposium, Jul 2018, Platja d’Aro, Spain. pp.214-219, ⟨10.1109/IOLTS.2018.8474230⟩
Conference papers
emse-01856000v1
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A Novel Use of Approximate Circuits to Thwart Hardware Trojan Insertion and Provide ObfuscationIOLTS: International Symposium on On-Line Testing And Robust System Design, Jul 2018, Platja d'Aro, Spain. pp.41-42, ⟨10.1109/IOLTS.2018.8474077⟩
Conference papers
lirmm-02095736v1
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SI ECCS: SECure context saving for IoT devicesDTIS 2018 - 13th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, Apr 2018, Taormina, Italy. ⟨10.1109/DTIS.2018.8368561⟩
Conference papers
hal-01740173v1
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Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault modelFDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.1-6, ⟨10.1109/FDTC.2018.00009⟩
Conference papers
emse-01856008v1
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Encryption of test data: which cipher is better?PRIME: PhD Research in Microelectronics and Electronics, Jul 2018, Prague, Czech Republic. pp.85-88, ⟨10.1109/PRIME.2018.8430366⟩
Conference papers
lirmm-01867249v1
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A new secure stream cipher for scan chain encryption3rd IEEE International Verification and Security Workshop (IVSW 2018), Jul 2018, Platja d’Aro, Spain. pp.68-73, ⟨10.1109/IVSW.2018.8494852⟩
Conference papers
lirmm-01867256v1
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Does stream cipher-based scan chains encryption really prevent scan attacks?TRUDEVICE Workshop, Mar 2018, Dresden, Germany
Conference papers
lirmm-01867286v1
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Scan chain encryption for the test, diagnosis and debug of secure circuitsETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968248⟩
Conference papers
lirmm-01699254v1
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Experimentations on scan chain encryption with PRESENTIVSW: International Verification and Security Workshop, Jul 2017, Thessaloniki, Greece. pp.45-50, ⟨10.1109/IVSW.2017.8031543⟩
Conference papers
lirmm-01699258v1
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Zero bit-error-rate weak PUF based on Spin-Transfer-Torque MRAM memoriesIVSW: International Verification and Security Workshop, Jul 2017, Thessaloniki, Greece. pp.128-133, ⟨10.1109/IVSW.2017.8031552⟩
Conference papers
hal-01591549v1
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Hacking the Control Flow error detection mechanismIVSW: International Verification and Security Workshop, Jul 2017, Thessaloniki, Greece. pp.51-56, ⟨10.1109/IVSW.2017.8031544⟩
Conference papers
lirmm-01700739v1
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Reliability of computing systems: From flip flops to variablesIOLTS: International On-Line Testing Symposium, Jul 2017, Thessaloniki, Greece. pp.196-198, ⟨10.1109/IOLTS.2017.8046242⟩
Conference papers
lirmm-01700744v1
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Do we need a holistic approach for the design of secure IoT systems?CF: Computing Frontiers, May 2017, Siena, Italy. pp.425-430, ⟨10.1145/3075564.3079070⟩
Conference papers
hal-01628683v1
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Scan Chain EncryptionDOCTIS: Journée des Doctorants de l’école doctorale I2S, 2017, Montpellier, France
Conference papers
lirmm-01867277v1
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Cache- and register-aware system reliability evaluation based on data lifetime analysisVTS: VLSI Test Symposium, Apr 2016, Las Vegas, United States. ⟨10.1109/VTS.2016.7477299⟩
Conference papers
lirmm-01374569v1
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Cache-aware reliability evaluation through LLVM-based analysis and fault injectionIOLTS: International On-Line Testing Symposium, Jul 2016, Sant Feliu de Guixols, Spain. pp.19-22, ⟨10.1109/IOLTS.2016.7604663⟩
Conference papers
lirmm-01444619v1
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Using Outliers to Detect Stealthy Hardware Trojan Triggering?IVSW: International Verification and Security Workshop, Jul 2016, Sant Feliu de Guixols, France
Conference papers
lirmm-01347119v1
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SEcube™: An open-source security platform in a single SoCDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2016, Istanbaul, Turkey. ⟨10.1109/DTIS.2016.7483810⟩
Conference papers
lirmm-01444711v1
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Security primitives (PUF and TRNG) with STT-MRAMVTS: VLSI Test Symposium, Apr 2016, Las Vegas, United States. ⟨10.1109/VTS.2016.7477292⟩
Conference papers
lirmm-01374573v1
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Hardware Trust through Layout Filling: a Hardware Trojan Prevention TechniqueISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, United States. pp.254-259, ⟨10.1109/ISVLSI.2016.22⟩
Conference papers
lirmm-01346529v1
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True random number generator based on nanomagnetsNMDC: Nanotechnology Materials and Devices Conference, Oct 2016, Toulouse, France. ⟨10.1109/NMDC.2016.7777089⟩
Conference papers
lirmm-01444398v1
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Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional ProgramsVLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability, Sep 2016, Tallinn, Estonia. pp.130-151, ⟨10.1007/978-3-319-67104-8_7⟩
Conference papers
hal-01675205v1
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Duplication-based Concurrent Detection of Hardware Trojans in Integrated CircuitsTRUDEVICE, Nov 2016, Barcelona, Spain
Conference papers
lirmm-01385551v1
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Faster-than-at-speed execution of functional programs: An experimental analysisVLSI-SoC: Very Large Scale Integration and System-on-Chip, Sep 2016, Tallinn, Estonia. ⟨10.1109/VLSI-SoC.2016.7753581⟩
Conference papers
lirmm-01444403v1
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STT-MTJ-based TRNG with on-the-fly temperature/current variation compensationIOLTS: International On-Line Testing Symposium, Jul 2016, Sant Feliu de Guixols, Spain. pp.179-184, ⟨10.1109/IOLTS.2016.7604694⟩
Conference papers
lirmm-01444408v1
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Cross-layer system reliability assessment framework for hardware faultsITC: International Test Conference, Nov 2016, Fort Worth, TX, United States. ⟨10.1109/TEST.2016.7805863⟩
Conference papers
lirmm-01444774v1
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Towards a Highly Reliable SRAM-based PUFsDATE 2016 - 19th Design, Automation and Test in Europe Conference and Exhibition, Mar 2016, Dresden, Germany. pp.273-276
Conference papers
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Towards Model Driven Design of Crypto Primitives and ProcessesSAM: Sensor Array and Multichannel Signal Processing, Jul 2016, Rio de Janeiro, Brazil. pp.152-158
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SCHIFI: Scalable and flexible high performance FPGA-based fault injectorDCIS 2016 - 31st Conference on Design of Circuits and Integrated Systems, Nov 2016, Granada, Spain. ⟨10.1109/DCIS.2016.7845375⟩
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lirmm-01700747v1
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Ring Oscillators Analysis for FPGA Security PurposesTRUDEVICE, Mar 2015, Grenoble, France
Conference papers
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Sensitivity to fault laser injection: a comparison between 28nm bulk and FD-SOI technologyTRUDEVICE Workshop, Sep 2015, Saint-Malo, France
Conference papers
lirmm-01234094v1
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Figure of merits of 28nm Si technologies for implementing laser attack resistant security dedicated circuitsISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.362-367, ⟨10.1109/ISVLSI.2015.76⟩
Conference papers
emse-01227138v1
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Hierarchical Secure DfTTRUDEVICE Workshop, Sep 2015, St Malo, France
Conference papers
lirmm-01234095v1
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Digital Right Management for IP ProtectionISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.200-203, ⟨10.1109/ISVLSI.2015.127⟩
Conference papers
lirmm-01234082v1
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3D DFT Challenges and SolutionsISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.603-608, ⟨10.1109/ISVLSI.2015.11⟩
Conference papers
lirmm-01234076v1
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Multi-segment Enhanced Scan-chains for Secure ICsTRUDEVICE Workshop, Sep 2015, Saint-Malo, France
Conference papers
lirmm-01276304v1
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Validation Of Single BBICS Architecture In Detecting Multiple FaultsATS: Asian Test Symposium, Nov 2015, Mumbai, India
Conference papers
lirmm-01234067v1
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New Testing Procedure for Finding Insertion Sites of Stealthy Hardware TrojansDATE 2015 - 18th Design, Automation and Test in Europe Conference and Exhibition, Mar 2015, Grenoble, France. pp.776-781, ⟨10.7873/DATE.2015.1102⟩
Conference papers
lirmm-01141619v1
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SEcubeTM: The most advanced, Open Source Security Platform in a Single ChipTRUDEVICE Workshop, Sep 2015, Saint-Malo, France
Conference papers
lirmm-01276298v1
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Hardware Trojan Prevention using Layout-Level Design ApproachECCTD: European Conference on Circuit Theory and Design, Aug 2015, Trondheim, Norway. ⟨10.1109/ECCTD.2015.7300093⟩
Conference papers
lirmm-01234072v1
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Session-less based thermal-aware 3D-SIC test schedulingETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. ⟨10.1109/ETS.2015.7138732⟩
Conference papers
lirmm-01922990v1
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STT MRAM-Based PUFsDATE 2015 - 18th Design, Automation and Test in Europe Conference and Exhibition, Mar 2015, Grenoble, France. pp.872-875, ⟨10.7873/DATE.2015.0505⟩
Conference papers
lirmm-01234087v1
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STT-MRAM-Based Strong PUF ArchitectureISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.467-472, ⟨10.1109/ISVLSI.2015.128⟩
Conference papers
lirmm-01234079v1
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Exploiting the Variability of the Magnetic Tunnel Junction for Security Purposese-NVM: Leading Edge Embedded NVM, Sep 2015, Gardanne, France
Conference papers
lirmm-01276293v1
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Zero Bit-Error-Rate Weak PUF based on Spin-Transfer-Torque MRAM MemoriesTRUDEVICE Workshop, Sep 2015, Saint-Malo, France
Conference papers
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Challenges in Designing Trustworthy Cryptographic Co-ProcessorsISCAS: International Symposium on Circuits and Systems, May 2015, Lisbon, Portugal. pp.2009-2012, ⟨10.1109/ISCAS.2015.7169070⟩
Conference papers
lirmm-01234083v1
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Customized Cell Detector for Laser-Induced-Fault DetectionIOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain. pp.37-42, ⟨10.1109/IOLTS.2014.6873669⟩
Conference papers
lirmm-01119576v1
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Built-In Self-Test for Manufacturing TSV Defects before bondingVTS: VLSI Test Symposium, Apr 2014, Napa, CA, United States. ⟨10.1109/VTS.2014.6818771⟩
Conference papers
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Secure Test Method for Fuzzy ExtractorJoint MEDIAN-TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands
Conference papers
lirmm-01234106v1
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Cross-Layer Early Reliability Evaluation for the Computing cOntinuumDSD: Digital System Design, Aug 2014, Verona, Italy. pp.199-205, ⟨10.1109/DSD.2014.65⟩
Conference papers
lirmm-01234117v1
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Laser attacks on integrated circuits: from CMOS to FD-SOIDTIS: Design and Technology of Integrated Systems in Nanoscale Era, May 2014, Santorin, Greece. ⟨10.1109/DTIS.2014.6850664⟩
Conference papers
emse-01099042v1
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Simulating Laser Effects on ICs, from Physical Level to Gate Level: a comprehensive approachTRUDEVICE Workshop, May 2014, Paderborn, Germany
Conference papers
lirmm-01119614v1
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Fault injection tools based on Virtual MachinesReCoSoC: Reconfigurable and Communication-Centric Systems-on-Chip, May 2014, Montpellier, France. ⟨10.1109/ReCoSoC.2014.6861351⟩
Conference papers
hal-01075479v1
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2D to 3D Test Pattern Retargeting Using IEEE P1687 Based 3D DFT ArchitecturesISVLSI: International Symposium on Very Large Scale Integration, Jul 2014, Tampa, FL, United States. pp.386-391, ⟨10.1109/ISVLSI.2014.83⟩
Conference papers
lirmm-01119605v1
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Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2014), Sep 2014, Berlin, Germany
Conference papers
hal-03094235v1
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Hacking and Protecting IC HardwareDATE 2014 - 17th Design, Automation and Test in Europe Conference and Exhibition, Mar 2014, Dresden, Germany. ⟨10.7873/DATE.2014.112⟩
Conference papers
lirmm-01234147v1
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A novel Adaptive Fault Tolerant Flip-Flop Architecture based on TMRETS: European Test Symposium, May 2014, Paderborn, Germany. ⟨10.1109/ETS.2014.6847831⟩
Conference papers
lirmm-01234133v1
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Testing PUF-Based Secure Key Storage CircuitsDATE 2014 - 17th Design, Automation and Test in Europe Conference and Exhibition, Mar 2014, Dresden, Germany. ⟨10.7873/DATE.2014.207⟩
Conference papers
lirmm-01234141v1
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A survey on simulation-based fault injection tools for complex systemsDTIS: Design and Technology of Integrated Systems in Nanoscale Era, May 2014, Santorini, Greece. ⟨10.1109/DTIS.2014.6850649⟩
Conference papers
hal-01075473v1
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A Novel Hardware Logic Encryption Technique for thwarting Illegal Overproduction and Hardware TrojansIOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Girona, Spain. pp.49-54, ⟨10.1109/IOLTS.2014.6873671⟩
Conference papers
lirmm-01025275v1
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Cross-Layer Early Reliability Evaluation: Challenges and PromisesIOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Girona, Spain. pp.228-233, ⟨10.1109/IOLTS.2014.6873704⟩
Conference papers
lirmm-01234123v1
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Multi-stage Cross-layer Hardware Trojan Prevention, Detection and ToleranceJoint MEDIAN-TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands
Conference papers
lirmm-01234110v1
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Layout-Aware Laser Fault Injection Simulation and Modeling: from physical level to gate levelDTIS: Design and Technology of Integrated Systems in Nanoscale Era, May 2014, Santorin, Greece. ⟨10.1109/DTIS.2014.6850665⟩
Conference papers
lirmm-01119592v1
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Hacking and protecting IC hardwareDATE 2014 - 17th Design, Automation and Test in Europe Conference and Exhibition, Mar 2014, Dresden, Germany. ⟨10.7873/DATE.2014.112⟩
Conference papers
hal-02412114v1
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TRUDEVICE Project: Trustworthy Manufacturing and Utilization of Secure DevicesHiPEAC Computing Systems Week (CSW), Oct 2014, Athens, Greece
Conference papers
lirmm-01234099v1
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MRAM-based PUFJoint MEDIAN-TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands
Conference papers
lirmm-01234112v1
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Laser-Induced Fault Effects in Security-Dedicated CircuitsVLSI-SoC: Very Large Scale Integration and System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.220-240, ⟨10.1007/978-3-319-25279-7_12⟩
Conference papers
hal-01383737v1
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Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detectionESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2013, Arcachon, France. pp.B3c-2 #68
Conference papers
hal-00872705v1
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Laser-Induced Fault Simulation |