
Ian Vickridge
91
Documents
Publications
Publications
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PIXE-KOSSEL IN A GaAs MONOCRYSTALIBAF 2021, 8ème Rencontre "Ion Beam Applications" Francophone, Jul 2021, en ligne, France.
Poster de conférence
hal-03933048
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Guide d'ondes analysé par PIXE en mode KosselJSI 2020 Journées Surfaces & Interfaces, Jan 2020, Paris, France.
Poster de conférence
hal-03932801
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Kossel interferences of proton-induced X-ray emission lines to study the interfaces of thin film waveguides3rd International Summer School on the Physical and Chemical Principles in Materials Science, Jul 2018, Nanjing, China
Poster de conférence
hal-03932192
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Growth and Characterisation of TaxNyOz grown by Magnetron sputtering and HiPIMS for Photo-electrolysis of water21st International Conference on Ion Beam Analysis (IBA 2013), 2013, Seattle, United States. 2013
Poster de conférence
hal-01540463
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RBS Channeling Investigation of ultrathin GaMnAs Layers with very high critical Temperatures.21st International Conference on Ion Beam Analysis (IBA 2013), 2013, Seattle, United States
Poster de conférence
hal-01540461
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Dépôt et Caractérisation de Couches Minces Diélectriques La-Ti-O-N.Ion Beam Analysis Francophone, 2012, Cadarache, France. 2012
Poster de conférence
hal-01540370
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Etude par RBS-c de la nature de l'interstitiel de Mn dans le composé Ga1-xMnxAsIon Beam Analysis Francophone, 2012, Cadarache, France. 2012
Poster de conférence
hal-01540357
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Unravelling secrets from atoms to planets PIXE combined with Kossel diffraction for the analysis of thin film multilayersPIXE 2019, 16th Int. Conf. on Particle Induced X-ray Emission Portugal, 24-29 mars 2019, Mar 2019, Caldas da Rainha, Portugal
Communication dans un congrès
hal-03932725
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Etude de guides d’ondes par PIXE en mode Kossel13ème Colloque « Rayons X et Matière » (RX2019), Nov 2019, Nancy, France
Communication dans un congrès
hal-03932776
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Caractérisation de multicouches nanométriques par PIXE-KosselJournées de la Matière Condensée, Caractérisation physico-chimique en MEB et microsonde, Aug 2018, Grenoble, France
Communication dans un congrès
hal-03932230
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La diffraction de Kossel combinée à l'émission X induite par protons pour l'étude de multicouches nanométriquesJournées de la Matière Condensée, Grenoble, Nouvelles méthodes de diffusion de rayons X pour l'étude des matériaux fonctionnels, Aug 2018, Grenoble, France
Communication dans un congrès
hal-03932242
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Kossel interferences of proton-induced X-ray emission lines to study the interfaces of thin film waveguidesPXRNMS2018, Physics of X-ray and Neutron Multilayer Structures, Nov 2018, Palaiseau, France
Communication dans un congrès
hal-03932389
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Angular distribution of a characteristic x-ray emission transmitted by a periodic multilayerPXRNMS2018, Physics of X-ray and Neutron Multilayer Structures, Nov 2018, Palaiseau, France
Communication dans un congrès
hal-03932468
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STUDY OF NANO-SCALE SUPERLATTICES BY PROTON INDUCED KOSSEL DIFFRACTION3NANO2017, 4th Int. Conf. on Nanoscience, Nanotechnology and Nanobiotechnology, Dec 2017, Paris, France
Communication dans un congrès
hal-03931403
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Effet Kossel dans une multicouche périodique Cr/B4C/Sc sous irradiation par un faisceau de protonsInstrumenter et Innover en Chimie Physique pour Préparer l'Avenir, 2ème édition, May 2017, Paris, France
Communication dans un congrès
hal-03933214
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Kossel X-ray standing-waves within a Cr/B4C/Sc multilayer excited by protons (Orale)PXRNMS-2016 Workshop (Physics of X-Ray and Neutron Multilayer Structures), MESA+ Institute for Nanotechnology of the University of Twente, Enschede, The Netherlands, Nov 2016, Enschede, Netherlands
Communication dans un congrès
hal-01686684
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Détermination par RBS-C quantitative de la répartition du MN en sites interstitiels et substitutionnel en GaxMn1-xAs ultra-mince avec température critique élevée.Ion Beam Analysis Francophone, Société Française du Vide, 2014, Obernnai, France
Communication dans un congrès
hal-01540472
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Characterization of SiC thin film obtained by magnetron reactive sputtering : IBA, IR and Raman studies5th European Conference on Silicon Carbide and Related Materials, Aug 2004, Bologna, Unknown Region. pp.287-290
Communication dans un congrès
hal-01288833
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Modification of the oxide/semiconductor interface by high temperature NO treatments: A combined EPR, NRA and XPS study on oxidized porous and bulk n-type 4H-SiC5th European Conference on Silicon Carbide and Related Materials, Aug 2004, Bologna, Unknown Region. pp.277-280
Communication dans un congrès
hal-01288837
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Study of thin hafnium oxides deposited by atomic layer depositionthe Sixteenth International Conference on Ion Beam Analysis, 2004, France. pp.856-861., ⟨10.1016/j.nimb.2004.01.176⟩
Communication dans un congrès
istex
hal-00005053
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Thermal oxidation of 6H-SiC studied by oxygen isotopic tracing and narrow nuclear resonance profilingthe Sixteenth International Conference on Ion Beam Analysis, 2004, France. pp.914-918., ⟨10.1016/j.nimb.2004.01.187⟩
Communication dans un congrès
istex
hal-00005210
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Silicon isotopic tracing with the $^{29}$Si(p, $\gamma$) narrow resonance near 415 keVIon Beam Analysis Accelerators in Applied Research and Technology International Conference on Ion Beam Analysis 14 European Conference on Accelerators in Applied Research and Technology 6, Jul 1999, Dresden, Germany. pp.441-445
Communication dans un congrès
in2p3-00005570
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Handbook Handbook on Best Practice for Minimising Beam Induced Damage during IBA SPIRIT[Research Report] Institut des NanoSciences de Paris. 2013
Rapport
(rapport de recherche)
hal-01508624
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