Irina Ionica
Publications
Publications
Undoped junctionless EZ-FET: Model and measurementsEuroSOI-ULIS 2023, May 2023, Tarragona, Spain |
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EZ-FET junctions activation by nanosecond laser annealing2023 21st International Workshop on Junction Technology (IWJT), Jun 2023, Kyoto, Japan. pp.1-4, ⟨10.23919/IWJT59028.2023.10175175⟩ |
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Second Harmonic Generation: Non-Linear Optics for Characterization of Electrical Properties of Dielectric-on-Semiconductor Interfacessymposium D02: Dielectrics for Nanosystems 9: Materials Science, Processing, Reliability, and Manufacturing, conference 241st ECS meeting, May 2022, Vancouver (CA), Canada |
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(Digital Presentation) Characterization of Passivation Dielectrics on Silicon Through Second Harmonic Generation: Effect of Fixed Chargesymposium D02: Dielectrics for Nanosystems 9: Materials Science, Processing, Reliability, and Manufacturing, conference 241st ECS meeting, May 2022, Vancouver BC, Canada. pp.19-30, ⟨10.1149/10802.0019ecst⟩ |
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3D sequential integration: applications and associated key enabling modules (design & technology)2021 IEEE International Electron Devices Meeting (IEDM), Dec 2021, San Francisco, France. pp.3.2.1-3.2.4, ⟨10.1109/IEDM19574.2021.9720671⟩ |
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Novel pH Sensor Based on out-of-Equilibrium Body Potential Monitored in Silicon on Insulator with Metal Contacts18th International Meeting on Chemical Sensors (ICMS), May 2021, Virtual conference, United States. pp.1589, ⟨10.1149/MA2021-01591589mtgabs⟩ |
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Fluctuation-enhanced sensing of charged micro-particles using Silicon-On-Insulator Bottom Gate Field Effect Transistors: some preliminary observationsIEEE SENSORS 2021, Oct 2021, Visio Conférence, France |
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A simple test structure for the electrical characterization of front and back channels for advanced SOI technology developmentINFOS 2021, Jun 2021, Rende, Italy |
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Out-of-Equilibrium Body Potential Measurement on Silicon-on-Insulator With Deposited Metal ContactsESSDERC (European Solid-State Device Research Conference), 2021, Virtual conference, France |
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Pseudo-MOSFET response to transient ramp signal applied to the gate2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2019, Grenoble, France. pp.1-4, ⟨10.1109/EUROSOI-ULIS45800.2019.9041868⟩ |
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Potential of nanonets for the 3D integration of biosensors on CMOS (invited)Journées Nationales Nanofils Semiconducteurs Journées Nationales Nanofils Semiconducteurs, Lyon, 13-15 Nov. 2019, Nov 2019, Lyon, France |
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ψ-MOSFET Configuration for DNA Detection2018 International Semiconductor Conference (CAS), Oct 2018, Sinaia, Romania. pp.143-146, ⟨10.1109/SMICND.2018.8539753⟩ |
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Nanoindentation effects on the electrical caracterizaron in Ψ-MOSFET configuration2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Mar 2018, Granada, Spain. pp.141-144, ⟨10.1109/ULIS.2018.8354754⟩ |
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Second Harmonic Generation: A Non-Destructive Characterization Method for Dielectric-Semiconductor Interfaces2018 International Semiconductor Conference (CAS), Oct 2018, Sinaia, Romania. pp.35-42, ⟨10.1109/SMICND.2018.8539758⟩ |
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Electrical detection of bacteria on SOI film using the pseudo-MOSFET configurationInternational Workshop on Semi-conducting Nanomaterials for Health, Environment and Security Applications, Nanonets2Sense, Nov 2018, Grenoble, France |
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Layer thickness impact on Second Harmonic Generation characterization of SOI wafers2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, Greece. pp.184-187, ⟨10.1109/ULIS.2017.7962557⟩ |
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Second Harmonic Generation as a Contactless Probe of Al2O3 Passivation LayerJournées Énergie du Labex LANEF. Photovoltaïque: Couches MInces & Concepts avancés., R. André, V. Consonni, L. Grenet, J.P. Travers, May 2017, Grenoble, France |
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Out-of-equilibrium body potential measurements in pseudo-MOSFET for biosensing2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, Greece. pp.19-22, ⟨10.1109/ULIS.2017.7962590⟩ |
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(Invited) Non-Destructive Characterization of Dielectric - Semiconductor Interfaces by Second Harmonic Generation229th ECS Meetings: 7th Int. Symposium on Dielectrics for Nanosystems: Materials Science, Processing, Reliability and Manufaturing - and - Solid State Topics General Session, D. Misra, K. Sundaram, H. Iwai, T. Chikyo, Y. Obeng, Z. Chen, D. Bauza, O. Leonte and K. Shimanura, May 2016, San Diego, United States |
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Volume and interface conduction in InGaAs junctionless transistors2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.104-107, ⟨10.1109/ULIS.2016.7440063⟩ |
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Transient second harmonic generation and correlation with Ψ-MOSFET in SOI wafers2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.222-225, ⟨10.1109/ULIS.2016.7440093⟩ |
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Scanning microwave microscopy for non-destructive characterization of SOI wafers2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.238-241, ⟨10.1109/ULIS.2016.7440097⟩ |
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Quasi-static capacitance measurements in pseudo-MOSFET configuration for D<inf>it</inf> extraction in SOI wafers2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2015, Bologna, Italy. pp.249-252, ⟨10.1109/ULIS.2015.7063820⟩ |
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A simple compact model for carrier distribution and its application in single-, double- and triple-gate junctionless transistors2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2015, Bologna, Italy. pp.277-280, ⟨10.1109/ULIS.2015.7063827⟩ |
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Back-gate effects and detailed characterization of junctionless transistor2015 ESSDERC - 45th European Solid-State Device Research Conference, Sep 2015, Graz, Austria. pp.282-285, ⟨10.1109/ESSDERC.2015.7324769⟩ |
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Second harmonic generation for non-destructive characterization of silicon-on-insulator substrates2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2015, Bologna, Italy. pp.185-188, ⟨10.1109/ULIS.2015.7063744⟩ |
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Low-frequency noise in bare SOI wafers: Experiments and model2015 ESSDERC - 45th European Solid-State Device Research Conference, Sep 2015, Graz, Austria. pp.286-289, ⟨10.1109/ESSDERC.2015.7324770⟩ |
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Special characterization techniques for advanced FDSOI process2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, United States. pp.9a.1, ⟨10.1109/S3S.2015.7333543⟩ |
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A review of the pseudo-MOSFET and recent developments18th Int. Workshop on Dielectrics in Microelectronics (WODIM 2014), Jun 2014, Kinsale, Ireland |
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Surface effects on split C-V measurements on SOI wafers10th EUROSOI Workshop, Jan 2014, Tarragone, Spain |
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Split-CV for pseudo-MOSFET characterization: Experimental setups and associated parameter extraction methods2014 International Conference on Microelectronic Test Structures (ICMTS), Mar 2014, Udine, Italy. pp.14-19, ⟨10.1109/ICMTS.2014.6841461⟩ |
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Parasitic bipolar effect in advanced FD SOI MOSFETs: experimental evidence and gain extraction10th EUROSOI Workshop, Jan 2014, Tarrogona, Spain |
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Effect of back gate on parasitic bipolar effect in FD SOI MOSFETs2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2014, Millbrae, United States. pp.5.8, ⟨10.1109/S3S.2014.7028210⟩ |
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Effective mobility in extra-thin film and ultra-thin BOX SOI wafers.EuroSOI 2013, Jan 2013, Paris, France. pp.2.4 |
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A new extraction method for estimating the bonding quality of metal bonding wafers.EuroSOI 2013, Jan 2013, Paris, France. pp.P1.1 |
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Pseudo-MOSFET under illumination: a novel method for extraction of carrier lifetime.EuroSOI 2013, Jan 2013, Paris, France. pp.P1.2 |
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Electrical characterization of ultra-thin silicon-on-insulator substrates : static and split C–V measurements in the Pseudo–MOSFET configuration4th Int. Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Technology (ULSIC ), Jul 2013, Villard de Lans, France. pp.203-208 |
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Selected SOI puzzles and tentative answers1st Ukrainian-French Symposium 'Semiconductor-On-Insulator Materials, Devices and Circuits: Physics, Technology and Diagnostics, Oct 2010, Kiev, Ukraine |
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Advances in the pseudo-MOSFET characterization methodIEEE Conference Proceedings., 2010, France. pp.45-51 |
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Effet de champ et blocage de Coulomb dans des nanostructures de silicium élaborées par microscopie à force atomiquePhysique [physics]. Institut National Polytechnique de Grenoble - INPG, 2005. Français. ⟨NNT : ⟩ |