Irina Ionica

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Publications

Calibration of second harmonic generation technique to probe the field-effect passivation of Si(100) with Al2O3 dielectric layers

B. Obeid , Lionel Bastard , Aude Bouchard , V. Aubriet , K. Jouannic et al.

Journal of Applied Physics, 2024, 135 (9), ⟨10.1063/5.0188837⟩

Article dans une revue hal-04742978v1

Low Temperature Junction Formation for EZ-FET

N. Zerhouni Abdou , P. Acosta Alba , L. Brunet , F. Milesi , M. Opprecht et al.

IEEE Journal of the Electron Devices Society, 2024, 12, pp.384-389. ⟨10.1109/JEDS.2023.3339306⟩

Article dans une revue hal-04742946v1

Methodology for parameters extraction with undoped junctionless EZ-FETs

N. Zerhouni Abdou , S. Reboh , L. Brunet , M. Alepidis , P. Acosta Alba et al.

Solid-State Electronics, 2024, 217, pp.108897. ⟨10.1016/j.sse.2024.108897⟩

Article dans une revue hal-04742900v1

Super-Nernstian pH detection using out-of-equilibrium body potential in silicon on insulator ISFET sensors: Proof-of-concept and optimization paths

Miltiadis Alepidis , Cécile Delacour , Maryline Bawedin , Irina Ionica

Sensors and Actuators A: Physical , 2024, 373, pp.115439. ⟨10.1016/j.sna.2024.115439⟩

Article dans une revue hal-04743221v1

Second harmonic generation in centrosymmetric multilayered structures: Theoretical approach for nonlinear boundary conditions

B. Obeid , Irina Ionica , G. Vitrant , D. Damianos , Lionel Bastard

Journal of Applied Physics, 2023, 134 (8), ⟨10.1063/5.0156004⟩

Article dans une revue hal-04742984v1
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Undoped junctionless EZ-FET: Model and measurements

N. Zerhouni Abdou , S. Reboh , M. Alepidis , L. Brunet , P. Acosta Alba et al.

Solid-State Electronics, 2023, 208, pp.108731. ⟨10.1016/j.sse.2023.108731⟩

Article dans une revue hal-04742941v1
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A simple test structure for the electrical characterization of front and back channels for advanced SOI technology development

M. Alepidis , Irina Ionica , F. Milesi , N. Bresson , G. Gaudin et al.

Solid-State Electronics, 2021, 185, pp.108047. ⟨10.1016/j.sse.2021.108047⟩

Article dans une revue hal-04743005v1
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Neuron-gated silicon nanowire field effect transistors to follow single spike propagation within neuronal network

Cécile Delacour , F. Veliev , T. Crozes , G. Bres , J. Minet et al.

Advanced Engineering Materials, 2021, 23 (4), pp.2001226. ⟨10.1002/adem.202001226⟩

Article dans une revue hal-03089482v1

Origin of the Out-of-Equilibrium Body Potential In Silicon on Insulator Devices With Metal Contacts

M. Alepidis , G. Ghibaudo , Maryline Bawedin , Irina Ionica

IEEE Electron Device Letters, 2021, 42 (12), pp.1834-1837. ⟨10.1109/LED.2021.3122472⟩

Article dans une revue hal-04742996v1
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(Invited) Second Harmonic Generation: A Powerful Non-Destructive Characterization Technique for Dielectric-on-Semiconductor Interfaces

Irina Ionica , Dimitrios Damianos , Anne Kaminski-Cachopo , Danièle Blanc-Pelissier , Gérard Ghibaudo et al.

ECS Transactions, 2020, 97 (1), pp.119-130. ⟨10.1149/09701.0119ecst⟩

Article dans une revue hal-02861584v1

Novel DNA Biosensor Based on the Out-of-Equilibrium Body Potential Method in Silicon-on-Insulator

Licinius Benea , Melania Popescu , Maryline Bawedin , Monica Simion , Irina Ionica

IEEE Sensors Journal, 2020, 20 (23), pp.14032-14041. ⟨10.1109/JSEN.2020.3008133⟩

Article dans une revue hal-04743020v1
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Out-of-Equilibrium Body Potential Measurement on Silicon-on-Insulator With Deposited Metal Contacts

Miltiadis Alepidis , Aude Bouchard , Cécile Delacour , Maryline Bawedin , Irina Ionica

IEEE Transactions on Electron Devices, 2020, 67 (11), pp.4582-4586. ⟨10.1109/TED.2020.3023872⟩

Article dans une revue hal-03090124v1
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Experimental and simulation investigation of the out-of-equilibrium phenomena on the pseudo-MOSFET configuration under transient linear voltage ramps

Miltiadis Alepidis , Licinius Benea , Davide Bucci , Xavier Mescot , Irina Ionica et al.

Solid-State Electronics, 2020, 168, pp.107721. ⟨10.1016/j.sse.2019.107721⟩

Article dans une revue hal-03171017v1

Impact of contact and channel resistance on the frequency-dependent capacitance and conductance of pseudo-MOSFET

S. Sato , G. Ghibaudo , L. Benea , I. Ionica , Y. Omura et al.

Solid-State Electronics, 2019, 159, pp.197-203. ⟨10.1016/j.sse.2019.03.059⟩

Article dans une revue hal-02321909v1
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Out-of-Equilibrium Body Potential Measurements in Pseudo-MOSFET for Sensing Applications

Licinius Benea , Bawedin M. , Cécile Delacour , Irina Ionica

Solid-State Electronics, 2018, 143, pp.69-76. ⟨10.1016/j.sse.2017.11.010⟩

Article dans une revue hal-01685404v1
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Second Harmonic Generation characterization of SOI wafers: Impact of layer thickness and interface electric field

D. Damianos , G. Vitrant , M. Lei , J. Changala , A. Kaminski-Cachopo et al.

Solid-State Electronics, 2018, 143, pp.90 - 96. ⟨10.1016/j.sse.2017.12.006⟩

Article dans une revue hal-01893421v1
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Field-effect passivation of Si by ALD-Al2O3: second harmonic generation monitoring and simulation

D Damianos , G. Vitrant , A. Kaminski-Cachopo , D. Blanc-Pélissier , G. Ghibaudo et al.

Journal of Applied Physics, 2018, 124 (12), pp.125309. ⟨10.1063/1.5041062⟩

Article dans une revue hal-01883529v1

Back-gated InGaAs-on-insulator lateral N+NN+ MOSFET: Fabrication and typical conduction mechanisms

H.J. Park , L. Pirro , L. Czornomaz , I. Ionica , M. Bawedin et al.

Solid-State Electronics, 2017, 128, pp.80-86. ⟨10.1016/j.sse.2016.10.019⟩

Article dans une revue hal-02003226v1
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Non-destructive Characterization of Dielectric-Semiconductor Interfaces by Second Harmonic Generation

I. Ionica , D. Damianos , A. Kaminski , G. Vitrant , D. Blanc-Pélissier et al.

ECS Transactions, 2016, 72 (2), pp.139 - 151. ⟨10.1149/07202.0139ecst⟩

Article dans une revue hal-01890919v1

A review of electrical characterization techniques for ultrathin FDSOI materials and devices

Sorin Cristoloveanu , Bawedin M. , Irina Ionica

Solid-State Electronics, 2016, 117, pp.10-36. ⟨10.1016/j.sse.2015.11.007⟩

Article dans une revue istex hal-02003172v1

Low-frequency noise in bare SOI wafers: Experiments and model

L. Pirro , I. Ionica , S. Cristoloveanu , G. Ghibaudo

Solid-State Electronics, 2016, 125, pp.167-174. ⟨10.1016/j.sse.2016.07.012⟩

Article dans une revue istex hal-01947800v1

Back-gate effects and mobility characterization in junctionless transistor

Mukta Singh Parihar , Fanyu Liu , Carlos Navarro , Sylvain Barraud , Bawedin M. et al.

Solid-State Electronics, 2016, 125, pp.154-160. ⟨10.1016/j.sse.2016.07.016⟩

Article dans une revue istex hal-02003150v1

Interface trap density evaluation on bare silicon-on-insulator wafers using the quasi-static capacitance technique

L. Pirro , I. Ionica , G. Ghibaudo , Xavier Mescot , L. Faraone et al.

Journal of Applied Physics, 2016, 119 (17), pp.175702. ⟨10.1063/1.4947498⟩

Article dans une revue hal-01947679v1
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Second harmonic generation for contactless non-destructive characterization of silicon on insulator wafers

D. Damianos , L. Pirro , G. Soylu , I. Ionica , V. Nguyen et al.

Solid-State Electronics, 2016, 115, pp.237 - 243. ⟨10.1016/j.sse.2015.08.006⟩

Article dans une revue hal-01893414v1

Split-Capacitance and Conductance-Frequency Characteristics of SOI Wafers in Pseudo-MOSFET Configuration

Luca Pirro , Amer Diab , Irina Ionica , Gérard Ghibaudo , Lorenzo Faraone et al.

IEEE Transactions on Electron Devices, 2015, 62 (9), pp.2717-2723. ⟨10.1109/TED.2015.2454438⟩

Article dans une revue hal-01947654v1

Extraction of the Parasitic Bipolar Gain Using the Back-Gate in Ultrathin FD SOI MOSFETs

Fanyu Liu , Irina Ionica , Bawedin M. , Sorin Cristoloveanu

IEEE Electron Device Letters, 2015, 36 (2), pp.96-98. ⟨10.1109/LED.2014.2385797⟩

Article dans une revue hal-02004030v1

Parasitic bipolar effect in ultra-thin FD SOI MOSFETs

F.Y. Liu , I. Ionica , M. Bawedin , S. Cristoloveanu

Solid-State Electronics, 2015, 112, pp.29-36. ⟨10.1016/j.sse.2015.02.009⟩

Article dans une revue istex hal-02003101v1
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Impact of Blend Morphology on Interface State Recombination in Bulk Heterojunction Organic Solar Cells

Benjamin Bouthinon , Raphaël Clerc , Jérôme Vaillant , J.-M Verilhac , Jérôme Faure-Vincent et al.

Advanced Functional Materials, 2015, pp.10.1002/adfm.201401633. ⟨10.1002/adfm.201401633⟩

Article dans une revue hal-01100102v1

Enhanced coupling effects in vertical double-gate FinFETs

Sung-Jae Chang , Mayline Bawedin , Yufeng Guo , Fanyu Liu , Kerem Akarvardar et al.

Solid-State Electronics, 2014, 97, pp.88-98. ⟨10.1016/j.sse.2014.04.024⟩

Article dans une revue istex hal-02002974v1

A new characterization technique for SOI wafers: Split C(V) in pseudo-MOSFET configuration

A. Diab , C. Fernandez , A. Ohata , N. Rodriguez , I. Ionica et al.

Solid-State Electronics, 2013, 90, pp.127-133. ⟨10.1016/j.sse.2013.02.041⟩

Article dans une revue istex hal-01001928v1

Characterization of heavily doped SOI wafers under pseudo-MOSFET configuration

F.Y. Liu , A. Diab , I. Ionica , K. Akarvardar , C. Hobbs et al.

Solid-State Electronics, 2013, 90, pp.65-72. ⟨10.1016/j.sse.2013.02.050⟩

Article dans une revue istex hal-01001965v1

RC Model for Frequency Dependence of Split C-V Measurements on Bare SOI Wafers

A. Diab , I. Ionica , G. Ghibaudo , S. Cristoloveanu

IEEE Electron Device Letters, 2013, 34 (6), pp.792-794. ⟨10.1109/LED.2013.2257663⟩

Article dans une revue hal-00994383v1

Photo-pseudo-metal-oxide-semiconductor field effect transistor for characterization of surface recombination in silicon on insulator materials

M. Daanoune , A. Diab , S. Sirajeddine , A. Kaminski-Cachopo , I. Ionica et al.

Journ. Appl. Phys., 2013, 113 (Issue 18), pp.183702:1-5. ⟨10.1063/1.4804064⟩

Article dans une revue hal-00994579v1

Characterization of Silicon-On-Insulator films with pseudo metal-oxide-semiconductor field-effect transistor: correlation between contact pressure, crater morphology and series resistance.

I. Savin , I. Ionica , W. van den Daele , T. Nguyen , X. Mescot et al.

Applied Physics Letters, 2008, XX (XX, XX183511), pp.1-3

Article dans une revue hal-00391712v1

Optical Switching of Porphyrin-Coated Silicon Nanowire Field Effect Transistors

Clemens Winkelmann , Irina Ionica , Xavier Chevalier , Guy Royal , Christophe Bucher et al.

Nano Letters, 2007, 7 (6), pp.1454-1458. ⟨10.1021/nl0630485⟩

Article dans une revue hal-00700064v1

Undoped junctionless EZ-FET: Model and measurements

N. Zerhouni Abdou , S. Reboh , M. Alepidis , L. Brunet , P. Acosta Alba et al.

EuroSOI-ULIS 2023, May 2023, Tarragona, Spain

Communication dans un congrès hal-04743599v1

EZ-FET junctions activation by nanosecond laser annealing

N. Zerhouni Abdou , P. Acosta-Alba , L. Brunet , M. Opprecht , F. Milesi et al.

2023 21st International Workshop on Junction Technology (IWJT), Jun 2023, Kyoto, Japan. pp.1-4, ⟨10.23919/IWJT59028.2023.10175175⟩

Communication dans un congrès hal-04743066v1

Second Harmonic Generation: Non-Linear Optics for Characterization of Electrical Properties of Dielectric-on-Semiconductor Interfaces

Irina Ionica , D. Damianos , Baydaa Obeid , Anne Kaminski , Danièle Blanc-Pelissier et al.

symposium D02: Dielectrics for Nanosystems 9: Materials Science, Processing, Reliability, and Manufacturing, conference 241st ECS meeting, May 2022, Vancouver (CA), Canada

Communication dans un congrès hal-04743586v1

(Digital Presentation) Characterization of Passivation Dielectrics on Silicon Through Second Harmonic Generation: Effect of Fixed Charge

Baydaa Obeid , Lionel Bastard , Valentin Aubriet , Kristell Courouble , Didier Dutartre et al.

symposium D02: Dielectrics for Nanosystems 9: Materials Science, Processing, Reliability, and Manufacturing, conference 241st ECS meeting, May 2022, Vancouver BC, Canada. pp.19-30, ⟨10.1149/10802.0019ecst⟩

Communication dans un congrès hal-04743087v1

3D sequential integration: applications and associated key enabling modules (design & technology)

P. Batude , O. Billoint , S. Thuries , P. Malinge , C. Fenouillet-Beranger et al.

2021 IEEE International Electron Devices Meeting (IEDM), Dec 2021, San Francisco, France. pp.3.2.1-3.2.4, ⟨10.1109/IEDM19574.2021.9720671⟩

Communication dans un congrès cea-04456122v1

Novel pH Sensor Based on out-of-Equilibrium Body Potential Monitored in Silicon on Insulator with Metal Contacts

Miltiadis Alepidis , Aude Bouchard , Cécile Delacour , Maryline Bawedin , Irina Ionica

18th International Meeting on Chemical Sensors (ICMS), May 2021, Virtual conference, United States. pp.1589, ⟨10.1149/MA2021-01591589mtgabs⟩

Communication dans un congrès hal-04743123v1

Fluctuation-enhanced sensing of charged micro-particles using Silicon-On-Insulator Bottom Gate Field Effect Transistors: some preliminary observations

I Kury Abi Nakhoul , T Miltiadis , Marianne Weidenhaupt , Elena Ionica , Irina Ionica et al.

IEEE SENSORS 2021, Oct 2021, Visio Conférence, France

Communication dans un congrès hal-04755301v1

A simple test structure for the electrical characterization of front and back channels for advanced SOI technology development

M. Alepidis , Irina Ionica , F. Milesi , N. Bresson , G. Gaudin et al.

INFOS 2021, Jun 2021, Rende, Italy

Communication dans un congrès hal-04743644v1

Out-of-Equilibrium Body Potential Measurement on Silicon-on-Insulator With Deposited Metal Contacts

Miltiadis Alepidis , Aude Bouchard , Cécile Delacour , Maryline Bawedin , Irina Ionica

ESSDERC (European Solid-State Device Research Conference), 2021, Virtual conference, France

Communication dans un congrès hal-04743635v1

Pseudo-MOSFET response to transient ramp signal applied to the gate

M. Alepidis , Maryline Bawedin , Irina Ionica

2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2019, Grenoble, France. pp.1-4, ⟨10.1109/EUROSOI-ULIS45800.2019.9041868⟩

Communication dans un congrès hal-04743141v1

Potential of nanonets for the 3D integration of biosensors on CMOS (invited)

Mireille Mouis , Maxime Legallais , Thibauld Cazimajou , Fanny Morisot , Thuy Thi Thu Nguyen et al.

Journées Nationales Nanofils Semiconducteurs Journées Nationales Nanofils Semiconducteurs, Lyon, 13-15 Nov. 2019, Nov 2019, Lyon, France

Communication dans un congrès hal-02400730v1

ψ-MOSFET Configuration for DNA Detection

Licinius Benea , Bawedin M. , Sorin Cristoloveanu , Irina Ionica , Melania Banu et al.

2018 International Semiconductor Conference (CAS), Oct 2018, Sinaia, Romania. pp.143-146, ⟨10.1109/SMICND.2018.8539753⟩

Communication dans un congrès hal-02007655v1

Nanoindentation effects on the electrical caracterizaron in Ψ-MOSFET configuration

Licinius Benea , Tiphaine Cerba , Bawedin M. , Cécile Delacour , Sorin Cristoloveanu et al.

2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Mar 2018, Granada, Spain. pp.141-144, ⟨10.1109/ULIS.2018.8354754⟩

Communication dans un congrès hal-01948053v1

Second Harmonic Generation: A Non-Destructive Characterization Method for Dielectric-Semiconductor Interfaces

I. Ionica , D. Damianos , A. Kaminski-Cachopo , A. Bouchard , Xavier Mescot et al.

2018 International Semiconductor Conference (CAS), Oct 2018, Sinaia, Romania. pp.35-42, ⟨10.1109/SMICND.2018.8539758⟩

Communication dans un congrès hal-01974421v1

Electrical detection of bacteria on SOI film using the pseudo-MOSFET configuration

Médéric Vindret , Licinius Benea , Irina Ionica , Cécile Delacour , Pascal Xavier et al.

International Workshop on Semi-conducting Nanomaterials for Health, Environment and Security Applications, Nanonets2Sense, Nov 2018, Grenoble, France

Communication dans un congrès hal-02016817v1

Layer thickness impact on Second Harmonic Generation characterization of SOI wafers

D. Damianos , I. Ionica , J. Changala , M. Lei , A. Kaminski-Cachopo et al.

2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, Greece. pp.184-187, ⟨10.1109/ULIS.2017.7962557⟩

Communication dans un congrès hal-01974416v1

Second Harmonic Generation as a Contactless Probe of Al2O3 Passivation Layer

Dimitrios Damianos , Irina Ionica , Anne Kaminski , Danièle Blanc-Pelissier , J. Changala et al.

Journées Énergie du Labex LANEF. Photovoltaïque: Couches MInces & Concepts avancés., R. André, V. Consonni, L. Grenet, J.P. Travers, May 2017, Grenoble, France

Communication dans un congrès hal-02016903v1

Out-of-equilibrium body potential measurements in pseudo-MOSFET for biosensing

Licinius Benea , Bawedin M. , Cécile Delacour , Sorin Cristoloveanu , Irina Ionica

2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, Greece. pp.19-22, ⟨10.1109/ULIS.2017.7962590⟩

Communication dans un congrès hal-02007128v1

(Invited) Non-Destructive Characterization of Dielectric - Semiconductor Interfaces by Second Harmonic Generation

I. Ionica , D. Damianos , A. Kaminski , G. Vitrant , D. Blanc-Pélissier et al.

229th ECS Meetings: 7th Int. Symposium on Dielectrics for Nanosystems: Materials Science, Processing, Reliability and Manufaturing - and - Solid State Topics General Session, D. Misra, K. Sundaram, H. Iwai, T. Chikyo, Y. Obeng, Z. Chen, D. Bauza, O. Leonte and K. Shimanura, May 2016, San Diego, United States

Communication dans un congrès hal-02007827v1

Volume and interface conduction in InGaAs junctionless transistors

L. Pirro , H. Park , I. Ionica , M. Bawedin , S. Cristoloveanu et al.

2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.104-107, ⟨10.1109/ULIS.2016.7440063⟩

Communication dans un congrès hal-02004340v1

Transient second harmonic generation and correlation with Ψ-MOSFET in SOI wafers

D. Damianos , I. Ionica , A. Kaminski-Cachopo , G. Vitrant , S. Cristoloveanu et al.

2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.222-225, ⟨10.1109/ULIS.2016.7440093⟩

Communication dans un congrès hal-01974394v1

Scanning microwave microscopy for non-destructive characterization of SOI wafers

L. Michalas , I. Ionica , E. Brinciotti , L. Pirro , F. Kienberger et al.

2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.238-241, ⟨10.1109/ULIS.2016.7440097⟩

Communication dans un congrès hal-02004364v1

Quasi-static capacitance measurements in pseudo-MOSFET configuration for D<inf>it</inf> extraction in SOI wafers

L. Pirro , I. Ionica , X. Mescot , S. Cristoloveanu , G. Ghibaudo et al.

2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2015, Bologna, Italy. pp.249-252, ⟨10.1109/ULIS.2015.7063820⟩

Communication dans un congrès hal-02004087v1

A simple compact model for carrier distribution and its application in single-, double- and triple-gate junctionless transistors

Fanyu Liu , Irina Ionica , Bawedin M. , Sorin Cristoloveanu

2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2015, Bologna, Italy. pp.277-280, ⟨10.1109/ULIS.2015.7063827⟩

Communication dans un congrès hal-02004057v1

Back-gate effects and detailed characterization of junctionless transistor

Mukta Singh Parihar , Fan Yu Liu , Carlos Navarro , Sylvain Barraud , Bawedin M. et al.

2015 ESSDERC - 45th European Solid-State Device Research Conference, Sep 2015, Graz, Austria. pp.282-285, ⟨10.1109/ESSDERC.2015.7324769⟩

Communication dans un congrès hal-02004181v1

Second harmonic generation for non-destructive characterization of silicon-on-insulator substrates

I. Ionica , L. Pirro , V. Nguyen , A. Kaminski , G. Vitrant et al.

2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2015, Bologna, Italy. pp.185-188, ⟨10.1109/ULIS.2015.7063744⟩

Communication dans un congrès hal-02004048v1

Low-frequency noise in bare SOI wafers: Experiments and model

Luca Pirro , Irina Ionica , Sorin Cristoloveanu , Gérard Ghibaudo

2015 ESSDERC - 45th European Solid-State Device Research Conference, Sep 2015, Graz, Austria. pp.286-289, ⟨10.1109/ESSDERC.2015.7324770⟩

Communication dans un congrès hal-02004194v1

Special characterization techniques for advanced FDSOI process

S. Cristoloveanu , M. Bawedin , I. Ionica

2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, United States. pp.9a.1, ⟨10.1109/S3S.2015.7333543⟩

Communication dans un congrès hal-02004273v1

A review of the pseudo-MOSFET and recent developments

Sorin Cristoloveanu, , Irina Ionica , Amer Diab , Luca Pirro , F.Y. Liu et al.

18th Int. Workshop on Dielectrics in Microelectronics (WODIM 2014), Jun 2014, Kinsale, Ireland

Communication dans un congrès hal-02009825v1

Surface effects on split C-V measurements on SOI wafers

L. Pirro , Ionica I. , Gérard Ghibaudo , Sorin Cristoloveanu,

10th EUROSOI Workshop, Jan 2014, Tarragone, Spain

Communication dans un congrès hal-01182138v1

Split-CV for pseudo-MOSFET characterization: Experimental setups and associated parameter extraction methods

L. Pirro , I. Ionica , G. Ghibaudo , S. Cristoloveanu

2014 International Conference on Microelectronic Test Structures (ICMTS), Mar 2014, Udine, Italy. pp.14-19, ⟨10.1109/ICMTS.2014.6841461⟩

Communication dans un congrès hal-02003797v1

Parasitic bipolar effect in advanced FD SOI MOSFETs: experimental evidence and gain extraction

Fanyu Liu , Irina Ionica , Mayline Bawedin , Sorin Cristoloveanu,

10th EUROSOI Workshop, Jan 2014, Tarrogona, Spain

Communication dans un congrès hal-02008226v1

Effect of back gate on parasitic bipolar effect in FD SOI MOSFETs

Fanyu Liu , Irina Ionica , Mayline Bawedin , Sorin Cristoloveanu

2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2014, Millbrae, United States. pp.5.8, ⟨10.1109/S3S.2014.7028210⟩

Communication dans un congrès hal-02003967v1

Effective mobility in extra-thin film and ultra-thin BOX SOI wafers.

A. Diab , C. Fernández , L. Pirro , N. Rodriguez , I. Ionica et al.

EuroSOI 2013, Jan 2013, Paris, France. pp.2.4

Communication dans un congrès hal-01068430v1

A new extraction method for estimating the bonding quality of metal bonding wafers.

F.Y. Liu , L. Di Cioccio , I. Ionica , Y. Guo , S. Cristoloveanu

EuroSOI 2013, Jan 2013, Paris, France. pp.P1.1

Communication dans un congrès hal-01068000v1

Pseudo-MOSFET under illumination: a novel method for extraction of carrier lifetime.

M. Daanoune , S. Sirajeddine , A. Diab , A. Kaminski-Cachopo , I. Ionica et al.

EuroSOI 2013, Jan 2013, Paris, France. pp.P1.2

Communication dans un congrès hal-01067987v1

Electrical characterization of ultra-thin silicon-on-insulator substrates : static and split C–V measurements in the Pseudo–MOSFET configuration

Piro L. , Diab A. , Ionica I. , Gérard Ghibaudo , Cristoloveanu S.

4th Int. Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Technology (ULSIC ), Jul 2013, Villard de Lans, France. pp.203-208

Communication dans un congrès hal-01182173v1

Selected SOI puzzles and tentative answers

K.-I. Na , W. van den Daele , L. Pham-Nguyen , M. Bawedin , K.-H. Park et al.

1st Ukrainian-French Symposium 'Semiconductor-On-Insulator Materials, Devices and Circuits: Physics, Technology and Diagnostics, Oct 2010, Kiev, Ukraine

Communication dans un congrès hal-00604923v1

Advances in the pseudo-MOSFET characterization method

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