Irina Ionica

75
Documents

Publications

Publications

Calibration of second harmonic generation technique to probe the field-effect passivation of Si(100) with Al2O3 dielectric layers

B. Obeid , Lionel Bastard , Aude Bouchard , V. Aubriet , K. Jouannic et al.
Journal of Applied Physics, 2024, 135 (9), ⟨10.1063/5.0188837⟩
Article dans une revue hal-04742978 v1

Low Temperature Junction Formation for EZ-FET

N. Zerhouni Abdou , P. Acosta Alba , L. Brunet , F. Milesi , M. Opprecht et al.
IEEE Journal of the Electron Devices Society, 2024, 12, pp.384-389. ⟨10.1109/JEDS.2023.3339306⟩
Article dans une revue hal-04742946 v1

Methodology for parameters extraction with undoped junctionless EZ-FETs

N. Zerhouni Abdou , S. Reboh , L. Brunet , M. Alepidis , P. Acosta Alba et al.
Solid-State Electronics, 2024, 217, pp.108897. ⟨10.1016/j.sse.2024.108897⟩
Article dans une revue hal-04742900 v1

Super-Nernstian pH detection using out-of-equilibrium body potential in silicon on insulator ISFET sensors: Proof-of-concept and optimization paths

Miltiadis Alepidis , Cécile Delacour , Maryline Bawedin , Irina Ionica
Sensors and Actuators A: Physical , 2024, 373, pp.115439. ⟨10.1016/j.sna.2024.115439⟩
Article dans une revue hal-04743221 v1

Undoped junctionless EZ-FET: Model and measurements

N. Zerhouni Abdou , S. Reboh , M. Alepidis , L. Brunet , P. Acosta Alba et al.
Solid-State Electronics, 2023, 208, pp.108731. ⟨10.1016/j.sse.2023.108731⟩
Article dans une revue hal-04742941 v1

Second harmonic generation in centrosymmetric multilayered structures: Theoretical approach for nonlinear boundary conditions

B. Obeid , Irina Ionica , G. Vitrant , D. Damianos , Lionel Bastard
Journal of Applied Physics, 2023, 134 (8), ⟨10.1063/5.0156004⟩
Article dans une revue hal-04742984 v1

Origin of the Out-of-Equilibrium Body Potential In Silicon on Insulator Devices With Metal Contacts

M. Alepidis , G. Ghibaudo , Maryline Bawedin , Irina Ionica
IEEE Electron Device Letters, 2021, 42 (12), pp.1834-1837. ⟨10.1109/LED.2021.3122472⟩
Article dans une revue hal-04742996 v1
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A simple test structure for the electrical characterization of front and back channels for advanced SOI technology development

M. Alepidis , Irina Ionica , F. Milesi , N. Bresson , G. Gaudin et al.
Solid-State Electronics, 2021, 185, pp.108047. ⟨10.1016/j.sse.2021.108047⟩
Article dans une revue hal-04743005 v1
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Neuron-gated silicon nanowire field effect transistors to follow single spike propagation within neuronal network

Cécile Delacour , F. Veliev , T. Crozes , G. Bres , J. Minet et al.
Advanced Engineering Materials, 2021, 23 (4), pp.2001226. ⟨10.1002/adem.202001226⟩
Article dans une revue hal-03089482 v1

Novel DNA Biosensor Based on the Out-of-Equilibrium Body Potential Method in Silicon-on-Insulator

Licinius Benea , Melania Popescu , Maryline Bawedin , Monica Simion , Irina Ionica
IEEE Sensors Journal, 2020, 20 (23), pp.14032-14041. ⟨10.1109/JSEN.2020.3008133⟩
Article dans une revue hal-04743020 v1
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Out-of-Equilibrium Body Potential Measurement on Silicon-on-Insulator With Deposited Metal Contacts

Miltiadis Alepidis , Aude Bouchard , Cécile Delacour , Maryline Bawedin , Irina Ionica
IEEE Transactions on Electron Devices, 2020, 67 (11), pp.4582-4586. ⟨10.1109/TED.2020.3023872⟩
Article dans une revue hal-03090124 v1
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(Invited) Second Harmonic Generation: A Powerful Non-Destructive Characterization Technique for Dielectric-on-Semiconductor Interfaces

Irina Ionica , Dimitrios Damianos , Anne Kaminski-Cachopo , Danièle Blanc-Pelissier , Gérard Ghibaudo et al.
ECS Transactions, 2020, 97 (1), pp.119-130. ⟨10.1149/09701.0119ecst⟩
Article dans une revue hal-02861584 v1
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Experimental and simulation investigation of the out-of-equilibrium phenomena on the pseudo-MOSFET configuration under transient linear voltage ramps

Miltiadis Alepidis , Licinius Benea , Davide Bucci , Xavier Mescot , Irina Ionica et al.
Solid-State Electronics, 2020, 168, pp.107721. ⟨10.1016/j.sse.2019.107721⟩
Article dans une revue hal-03171017 v1

Impact of contact and channel resistance on the frequency-dependent capacitance and conductance of pseudo-MOSFET

S. Sato , G. Ghibaudo , L. Benea , I. Ionica , Y. Omura et al.
Solid-State Electronics, 2019, 159, pp.197-203. ⟨10.1016/j.sse.2019.03.059⟩
Article dans une revue hal-02321909 v1
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Second Harmonic Generation characterization of SOI wafers: Impact of layer thickness and interface electric field

D. Damianos , G. Vitrant , M. Lei , J. Changala , A. Kaminski-Cachopo et al.
Solid-State Electronics, 2018, 143, pp.90 - 96. ⟨10.1016/j.sse.2017.12.006⟩
Article dans une revue hal-01893421 v1
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Out-of-Equilibrium Body Potential Measurements in Pseudo-MOSFET for Sensing Applications

Licinius Benea , Bawedin M. , Cécile Delacour , Irina Ionica
Solid-State Electronics, 2018, 143, pp.69-76. ⟨10.1016/j.sse.2017.11.010⟩
Article dans une revue hal-01685404 v1
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Field-effect passivation of Si by ALD-Al2O3: second harmonic generation monitoring and simulation

D Damianos , G. Vitrant , A. Kaminski-Cachopo , D. Blanc-Pélissier , G. Ghibaudo et al.
Journal of Applied Physics, 2018, 124 (12), pp.125309. ⟨10.1063/1.5041062⟩
Article dans une revue hal-01883529 v1

Back-gated InGaAs-on-insulator lateral N+NN+ MOSFET: Fabrication and typical conduction mechanisms

H.J. Park , L. Pirro , L. Czornomaz , I. Ionica , M. Bawedin et al.
Solid-State Electronics, 2017, 128, pp.80-86. ⟨10.1016/j.sse.2016.10.019⟩
Article dans une revue hal-02003226 v1

Back-gate effects and mobility characterization in junctionless transistor

Mukta Singh Parihar , Fanyu Liu , Carlos Navarro , Sylvain Barraud , Bawedin M. et al.
Solid-State Electronics, 2016, 125, pp.154-160. ⟨10.1016/j.sse.2016.07.016⟩
Article dans une revue hal-02003150 v1

Low-frequency noise in bare SOI wafers: Experiments and model

L. Pirro , I. Ionica , S. Cristoloveanu , G. Ghibaudo
Solid-State Electronics, 2016, 125, pp.167-174. ⟨10.1016/j.sse.2016.07.012⟩
Article dans une revue hal-01947800 v1
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Non-destructive Characterization of Dielectric-Semiconductor Interfaces by Second Harmonic Generation

I. Ionica , D. Damianos , A. Kaminski , G. Vitrant , D. Blanc-Pélissier et al.
ECS Transactions, 2016, 72 (2), pp.139 - 151. ⟨10.1149/07202.0139ecst⟩
Article dans une revue hal-01890919 v1

A review of electrical characterization techniques for ultrathin FDSOI materials and devices

Sorin Cristoloveanu , Bawedin M. , Irina Ionica
Solid-State Electronics, 2016, 117, pp.10-36. ⟨10.1016/j.sse.2015.11.007⟩
Article dans une revue hal-02003172 v1

Interface trap density evaluation on bare silicon-on-insulator wafers using the quasi-static capacitance technique

L. Pirro , I. Ionica , G. Ghibaudo , Xavier Mescot , L. Faraone et al.
Journal of Applied Physics, 2016, 119 (17), pp.175702. ⟨10.1063/1.4947498⟩
Article dans une revue hal-01947679 v1
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Second harmonic generation for contactless non-destructive characterization of silicon on insulator wafers

D. Damianos , L. Pirro , G. Soylu , I. Ionica , V. Nguyen et al.
Solid-State Electronics, 2016, 115, pp.237 - 243. ⟨10.1016/j.sse.2015.08.006⟩
Article dans une revue hal-01893414 v1

Extraction of the Parasitic Bipolar Gain Using the Back-Gate in Ultrathin FD SOI MOSFETs

Fanyu Liu , Irina Ionica , Bawedin M. , Sorin Cristoloveanu
IEEE Electron Device Letters, 2015, 36 (2), pp.96-98. ⟨10.1109/LED.2014.2385797⟩
Article dans une revue hal-02004030 v1

Split-Capacitance and Conductance-Frequency Characteristics of SOI Wafers in Pseudo-MOSFET Configuration

Luca Pirro , Amer Diab , Irina Ionica , Gérard Ghibaudo , Lorenzo Faraone et al.
IEEE Transactions on Electron Devices, 2015, 62 (9), pp.2717-2723. ⟨10.1109/TED.2015.2454438⟩
Article dans une revue hal-01947654 v1

Parasitic bipolar effect in ultra-thin FD SOI MOSFETs

F.Y. Liu , I. Ionica , M. Bawedin , S. Cristoloveanu
Solid-State Electronics, 2015, 112, pp.29-36. ⟨10.1016/j.sse.2015.02.009⟩
Article dans une revue hal-02003101 v1
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Impact of Blend Morphology on Interface State Recombination in Bulk Heterojunction Organic Solar Cells

Benjamin Bouthinon , Raphaël Clerc , Jérôme Vaillant , J.-M Verilhac , Jérôme Faure-Vincent et al.
Advanced Functional Materials, 2015, pp.10.1002/adfm.201401633. ⟨10.1002/adfm.201401633⟩
Article dans une revue hal-01100102 v1

Enhanced coupling effects in vertical double-gate FinFETs

Sung-Jae Chang , Mayline Bawedin , Yufeng Guo , Fanyu Liu , Kerem Akarvardar et al.
Solid-State Electronics, 2014, 97, pp.88-98. ⟨10.1016/j.sse.2014.04.024⟩
Article dans une revue hal-02002974 v1

Photo-pseudo-metal-oxide-semiconductor field effect transistor for characterization of surface recombination in silicon on insulator materials

M. Daanoune , A. Diab , S. Sirajeddine , A. Kaminski-Cachopo , I. Ionica et al.
Journ. Appl. Phys., 2013, 113 (Issue 18), pp.183702:1-5. ⟨10.1063/1.4804064⟩
Article dans une revue hal-00994579 v1

RC Model for Frequency Dependence of Split C-V Measurements on Bare SOI Wafers

A. Diab , I. Ionica , G. Ghibaudo , S. Cristoloveanu
IEEE Electron Device Letters, 2013, 34 (6), pp.792-794. ⟨10.1109/LED.2013.2257663⟩
Article dans une revue hal-00994383 v1

Characterization of heavily doped SOI wafers under pseudo-MOSFET configuration

F.Y. Liu , A. Diab , I. Ionica , K. Akarvardar , C. Hobbs et al.
Solid-State Electronics, 2013, 90, pp.65-72. ⟨10.1016/j.sse.2013.02.050⟩
Article dans une revue istex hal-01001965 v1

A new characterization technique for SOI wafers: Split C(V) in pseudo-MOSFET configuration

A. Diab , C. Fernandez , A. Ohata , N. Rodriguez , I. Ionica et al.
Solid-State Electronics, 2013, 90, pp.127-133. ⟨10.1016/j.sse.2013.02.041⟩
Article dans une revue istex hal-01001928 v1

Characterization of Silicon-On-Insulator films with pseudo metal-oxide-semiconductor field-effect transistor: correlation between contact pressure, crater morphology and series resistance.

I. Savin , I. Ionica , W. van den Daele , T. Nguyen , X. Mescot et al.
Applied Physics Letters, 2008, XX (XX, XX183511), pp.1-3
Article dans une revue hal-00391712 v1

Optical Switching of Porphyrin-Coated Silicon Nanowire Field Effect Transistors

Clemens Winkelmann , Irina Ionica , Xavier Chevalier , Guy Royal , Christophe Bucher et al.
Nano Letters, 2007, 7 (6), pp.1454-1458. ⟨10.1021/nl0630485⟩
Article dans une revue hal-00700064 v1

Undoped junctionless EZ-FET: Model and measurements

N. Zerhouni Abdou , S. Reboh , M. Alepidis , L. Brunet , P. Acosta Alba et al.
EuroSOI-ULIS 2023, May 2023, Tarragona, Spain
Communication dans un congrès hal-04743599 v1

EZ-FET junctions activation by nanosecond laser annealing

N. Zerhouni Abdou , P. Acosta-Alba , L. Brunet , M. Opprecht , F. Milesi et al.
2023 21st International Workshop on Junction Technology (IWJT), Jun 2023, Kyoto, Japan. pp.1-4, ⟨10.23919/IWJT59028.2023.10175175⟩
Communication dans un congrès hal-04743066 v1

Second Harmonic Generation: Non-Linear Optics for Characterization of Electrical Properties of Dielectric-on-Semiconductor Interfaces

Irina Ionica , D. Damianos , Baydaa Obeid , Anne Kaminski , Danièle Blanc-Pelissier et al.
symposium D02: Dielectrics for Nanosystems 9: Materials Science, Processing, Reliability, and Manufacturing, conference 241st ECS meeting, May 2022, Vancouver (CA), Canada
Communication dans un congrès hal-04743586 v1

(Digital Presentation) Characterization of Passivation Dielectrics on Silicon Through Second Harmonic Generation: Effect of Fixed Charge

Baydaa Obeid , Lionel Bastard , Valentin Aubriet , Kristell Courouble , Didier Dutartre et al.
symposium D02: Dielectrics for Nanosystems 9: Materials Science, Processing, Reliability, and Manufacturing, conference 241st ECS meeting, May 2022, Vancouver BC, Canada. pp.19-30, ⟨10.1149/10802.0019ecst⟩
Communication dans un congrès hal-04743087 v1

A simple test structure for the electrical characterization of front and back channels for advanced SOI technology development

M. Alepidis , Irina Ionica , F. Milesi , N. Bresson , G. Gaudin et al.
INFOS 2021, Jun 2021, Rende, Italy
Communication dans un congrès hal-04743644 v1

Fluctuation-enhanced sensing of charged micro-particles using Silicon-On-Insulator Bottom Gate Field Effect Transistors: some preliminary observations

I Kury Abi Nakhoul , T Miltiadis , Marianne Weidenhaupt , Elena Ionica , Irina Ionica et al.
IEEE SENSORS 2021, Oct 2021, Visio Conférence, France
Communication dans un congrès hal-04755301 v1

3D sequential integration: applications and associated key enabling modules (design & technology)

P. Batude , O. Billoint , S. Thuries , P. Malinge , C. Fenouillet-Beranger et al.
2021 IEEE International Electron Devices Meeting (IEDM), Dec 2021, San Francisco, France. pp.3.2.1-3.2.4, ⟨10.1109/IEDM19574.2021.9720671⟩
Communication dans un congrès cea-04456122 v1

Novel pH Sensor Based on out-of-Equilibrium Body Potential Monitored in Silicon on Insulator with Metal Contacts

Miltiadis Alepidis , Aude Bouchard , Cécile Delacour , Maryline Bawedin , Irina Ionica
18th International Meeting on Chemical Sensors (ICMS), May 2021, Virtual conference, United States. pp.1589, ⟨10.1149/MA2021-01591589mtgabs⟩
Communication dans un congrès hal-04743123 v1

Out-of-Equilibrium Body Potential Measurement on Silicon-on-Insulator With Deposited Metal Contacts

Miltiadis Alepidis , Aude Bouchard , Cécile Delacour , Maryline Bawedin , Irina Ionica
ESSDERC (European Solid-State Device Research Conference), 2021, Virtual conference, France
Communication dans un congrès hal-04743635 v1

Pseudo-MOSFET response to transient ramp signal applied to the gate

M. Alepidis , Maryline Bawedin , Irina Ionica
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2019, Grenoble, France. pp.1-4, ⟨10.1109/EUROSOI-ULIS45800.2019.9041868⟩
Communication dans un congrès hal-04743141 v1

Potential of nanonets for the 3D integration of biosensors on CMOS (invited)

Mireille Mouis , Maxime Legallais , Thibauld Cazimajou , Fanny Morisot , Thuy Thi Thu Nguyen et al.
Journées Nationales Nanofils Semiconducteurs Journées Nationales Nanofils Semiconducteurs, Lyon, 13-15 Nov. 2019, Nov 2019, Lyon, France
Communication dans un congrès hal-02400730 v1

Second Harmonic Generation: A Non-Destructive Characterization Method for Dielectric-Semiconductor Interfaces

I. Ionica , D. Damianos , A. Kaminski-Cachopo , A. Bouchard , Xavier Mescot et al.
2018 International Semiconductor Conference (CAS), Oct 2018, Sinaia, Romania. pp.35-42, ⟨10.1109/SMICND.2018.8539758⟩
Communication dans un congrès hal-01974421 v1

Electrical detection of bacteria on SOI film using the pseudo-MOSFET configuration

Médéric Vindret , Licinius Benea , Irina Ionica , Cécile Delacour , Pascal Xavier et al.
International Workshop on Semi-conducting Nanomaterials for Health, Environment and Security Applications, Nanonets2Sense, Nov 2018, Grenoble, France
Communication dans un congrès hal-02016817 v1

ψ-MOSFET Configuration for DNA Detection

Licinius Benea , Bawedin M. , Sorin Cristoloveanu , Irina Ionica , Melania Banu et al.
2018 International Semiconductor Conference (CAS), Oct 2018, Sinaia, Romania. pp.143-146, ⟨10.1109/SMICND.2018.8539753⟩
Communication dans un congrès hal-02007655 v1

Nanoindentation effects on the electrical caracterizaron in Ψ-MOSFET configuration

Licinius Benea , Tiphaine Cerba , Bawedin M. , Cécile Delacour , Sorin Cristoloveanu et al.
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Mar 2018, Granada, Spain. pp.141-144, ⟨10.1109/ULIS.2018.8354754⟩
Communication dans un congrès hal-01948053 v1

Out-of-equilibrium body potential measurements in pseudo-MOSFET for biosensing

Licinius Benea , Bawedin M. , Cécile Delacour , Sorin Cristoloveanu , Irina Ionica
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, Greece. pp.19-22, ⟨10.1109/ULIS.2017.7962590⟩
Communication dans un congrès hal-02007128 v1

Layer thickness impact on Second Harmonic Generation characterization of SOI wafers

D. Damianos , I. Ionica , J. Changala , M. Lei , A. Kaminski-Cachopo et al.
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, Greece. pp.184-187, ⟨10.1109/ULIS.2017.7962557⟩
Communication dans un congrès hal-01974416 v1

Second Harmonic Generation as a Contactless Probe of Al2O3 Passivation Layer

Dimitrios Damianos , Irina Ionica , Anne Kaminski , Danièle Blanc-Pelissier , J. Changala et al.
Journées Énergie du Labex LANEF. Photovoltaïque: Couches MInces & Concepts avancés., R. André, V. Consonni, L. Grenet, J.P. Travers, May 2017, Grenoble, France
Communication dans un congrès hal-02016903 v1

Scanning microwave microscopy for non-destructive characterization of SOI wafers

L. Michalas , I. Ionica , E. Brinciotti , L. Pirro , F. Kienberger et al.
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.238-241, ⟨10.1109/ULIS.2016.7440097⟩
Communication dans un congrès hal-02004364 v1

(Invited) Non-Destructive Characterization of Dielectric - Semiconductor Interfaces by Second Harmonic Generation

I. Ionica , D. Damianos , A. Kaminski , G. Vitrant , D. Blanc-Pélissier et al.
229th ECS Meetings: 7th Int. Symposium on Dielectrics for Nanosystems: Materials Science, Processing, Reliability and Manufaturing - and - Solid State Topics General Session, D. Misra, K. Sundaram, H. Iwai, T. Chikyo, Y. Obeng, Z. Chen, D. Bauza, O. Leonte and K. Shimanura, May 2016, San Diego, United States
Communication dans un congrès hal-02007827 v1

Volume and interface conduction in InGaAs junctionless transistors

L. Pirro , H. Park , I. Ionica , M. Bawedin , S. Cristoloveanu et al.
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.104-107, ⟨10.1109/ULIS.2016.7440063⟩
Communication dans un congrès hal-02004340 v1

Transient second harmonic generation and correlation with Ψ-MOSFET in SOI wafers

D. Damianos , I. Ionica , A. Kaminski-Cachopo , G. Vitrant , S. Cristoloveanu et al.
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria. pp.222-225, ⟨10.1109/ULIS.2016.7440093⟩
Communication dans un congrès hal-01974394 v1

Special characterization techniques for advanced FDSOI process

S. Cristoloveanu , M. Bawedin , I. Ionica
2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, United States. pp.9a.1, ⟨10.1109/S3S.2015.7333543⟩
Communication dans un congrès hal-02004273 v1

Second harmonic generation for non-destructive characterization of silicon-on-insulator substrates

I. Ionica , L. Pirro , V. Nguyen , A. Kaminski , G. Vitrant et al.
2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2015, Bologna, Italy. pp.185-188, ⟨10.1109/ULIS.2015.7063744⟩
Communication dans un congrès hal-02004048 v1

Back-gate effects and detailed characterization of junctionless transistor

Mukta Singh Parihar , Fan Yu Liu , Carlos Navarro , Sylvain Barraud , Bawedin M. et al.
2015 ESSDERC - 45th European Solid-State Device Research Conference, Sep 2015, Graz, Austria. pp.282-285, ⟨10.1109/ESSDERC.2015.7324769⟩
Communication dans un congrès hal-02004181 v1

A simple compact model for carrier distribution and its application in single-, double- and triple-gate junctionless transistors

Fanyu Liu , Irina Ionica , Bawedin M. , Sorin Cristoloveanu
2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2015, Bologna, Italy. pp.277-280, ⟨10.1109/ULIS.2015.7063827⟩
Communication dans un congrès hal-02004057 v1

Quasi-static capacitance measurements in pseudo-MOSFET configuration for D<inf>it</inf> extraction in SOI wafers

L. Pirro , I. Ionica , X. Mescot , S. Cristoloveanu , G. Ghibaudo et al.
2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2015, Bologna, Italy. pp.249-252, ⟨10.1109/ULIS.2015.7063820⟩
Communication dans un congrès hal-02004087 v1

Low-frequency noise in bare SOI wafers: Experiments and model

Luca Pirro , Irina Ionica , Sorin Cristoloveanu , Gérard Ghibaudo
2015 ESSDERC - 45th European Solid-State Device Research Conference, Sep 2015, Graz, Austria. pp.286-289, ⟨10.1109/ESSDERC.2015.7324770⟩
Communication dans un congrès hal-02004194 v1

Effect of back gate on parasitic bipolar effect in FD SOI MOSFETs

Fanyu Liu , Irina Ionica , Mayline Bawedin , Sorin Cristoloveanu
2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2014, Millbrae, United States. pp.5.8, ⟨10.1109/S3S.2014.7028210⟩
Communication dans un congrès hal-02003967 v1

Surface effects on split C-V measurements on SOI wafers

L. Pirro , Ionica I. , Gérard Ghibaudo , Sorin Cristoloveanu,
10th EUROSOI Workshop, Jan 2014, Tarragone, Spain
Communication dans un congrès hal-01182138 v1

Split-CV for pseudo-MOSFET characterization: Experimental setups and associated parameter extraction methods

L. Pirro , I. Ionica , G. Ghibaudo , S. Cristoloveanu
2014 International Conference on Microelectronic Test Structures (ICMTS), Mar 2014, Udine, Italy. pp.14-19, ⟨10.1109/ICMTS.2014.6841461⟩
Communication dans un congrès hal-02003797 v1

A review of the pseudo-MOSFET and recent developments

Sorin Cristoloveanu, , Irina Ionica , Amer Diab , Luca Pirro , F.Y. Liu et al.
18th Int. Workshop on Dielectrics in Microelectronics (WODIM 2014), Jun 2014, Kinsale, Ireland
Communication dans un congrès hal-02009825 v1

Parasitic bipolar effect in advanced FD SOI MOSFETs: experimental evidence and gain extraction

Fanyu Liu , Irina Ionica , Mayline Bawedin , Sorin Cristoloveanu,
10th EUROSOI Workshop, Jan 2014, Tarrogona, Spain
Communication dans un congrès hal-02008226 v1

A new extraction method for estimating the bonding quality of metal bonding wafers.

F.Y. Liu , L. Di Cioccio , I. Ionica , Y. Guo , S. Cristoloveanu
EuroSOI 2013, Jan 2013, Paris, France. pp.P1.1
Communication dans un congrès hal-01068000 v1

Effective mobility in extra-thin film and ultra-thin BOX SOI wafers.

A. Diab , C. Fernández , L. Pirro , N. Rodriguez , I. Ionica et al.
EuroSOI 2013, Jan 2013, Paris, France. pp.2.4
Communication dans un congrès hal-01068430 v1

Pseudo-MOSFET under illumination: a novel method for extraction of carrier lifetime.

M. Daanoune , S. Sirajeddine , A. Diab , A. Kaminski-Cachopo , I. Ionica et al.
EuroSOI 2013, Jan 2013, Paris, France. pp.P1.2
Communication dans un congrès hal-01067987 v1

Electrical characterization of ultra-thin silicon-on-insulator substrates : static and split C–V measurements in the Pseudo–MOSFET configuration

Piro L. , Diab A. , Ionica I. , Gérard Ghibaudo , Cristoloveanu S.
4th Int. Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Technology (ULSIC ), Jul 2013, Villard de Lans, France. pp.203-208
Communication dans un congrès hal-01182173 v1

Selected SOI puzzles and tentative answers

K.-I. Na , W. van den Daele , L. Pham-Nguyen , M. Bawedin , K.-H. Park et al.
1st Ukrainian-French Symposium 'Semiconductor-On-Insulator Materials, Devices and Circuits: Physics, Technology and Diagnostics, Oct 2010, Kiev, Ukraine
Communication dans un congrès hal-00604923 v1

Advances in the pseudo-MOSFET characterization method

I. Ionica , A. El Hajj Diab , Y.H. Bae , X. Mescot , A. Ohata et al.
IEEE Conference Proceedings., 2010, France. pp.45-51
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