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Jérôme Vaillant

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Rigorous Model-Based Mask Data Preparation Algorithm Applied to Grayscale Lithography for the Patterning at the Micrometer Scale

Pierre Chevalier , Patrick Quemere , Sebastien Berard-Bergery , Jean-Baptist Henry , Charlotte Beylier
Journal of Microelectromechanical Systems, 2021, 30 (3), pp.442 - 455. ⟨10.1109/jmems.2021.3067475⟩
Article dans une revue cea-04506422v1
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On the minimum thickness of doped Electron/Hole Transport Layers in organic semiconductor devices

D. Oussalah , R. Clerc , J. Baylet , R. Paquet , C. Sésé
Journal of Applied Physics, 2021, 130 (12), pp.125502. ⟨10.1063/5.0060429⟩
Article dans une revue hal-03358906v1
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The Geometry of Noise in Color and Spectral Image Sensors

Axel Clouet , Jérôme Vaillant , David Alleysson
Sensors, 2020, 20 (16), pp.4487. ⟨10.3390/s20164487⟩
Article dans une revue hal-02990998v1
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Planar microlenses for near infrared CMOS image sensors

L. Dilhan , Jérôme Vaillant , A. Ostrovsky , L. Masarotto , C. Pichard
Electronic Imaging, 2020, 32 (7), pp.144-1-144-7. ⟨10.2352/ISSN.2470-1173.2020.7.ISS-144⟩
Article dans une revue hal-04235049v1
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Visible to near infrared multispectral images dataset for image sensors design

Axel Clouet , Célia Viola , Jérôme Vaillant
Journal of Electronic Imaging, inPress, 106, ⟨10.2352/ISSN.2470-1173.2020.5.MAAP-082⟩
Article dans une revue cea-02890764v1
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Joint electromagnetic and ray-tracing simulations for quad-pixel sensor and computational imaging

Guillaume Chataignier , Benoit Vandame , Jérôme Vaillant
Optics Express, 2019, 27 (21), pp.30486. ⟨10.1364/OE.27.030486⟩
Article dans une revue hal-04241630v1
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Physical noise propagation in color image construction: a geometrical interpretation

Axel Clouet , Jérôme Vaillant , David Alleysson
Color and Imaging Conference, 2019, 27th Color and Imaging Conference Final Program and Proceedings, 2019, pp.375-380. ⟨10.2352/issn.2169-2629.2019.27.67⟩
Article dans une revue hal-02991028v1
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Impact of Blend Morphology on Interface State Recombination in Bulk Heterojunction Organic Solar Cells

Benjamin Bouthinon , Raphaël Clerc , Jérôme Vaillant , J.-M Verilhac , Jérôme Faure-Vincent
Advanced Functional Materials, 2015, pp.10.1002/adfm.201401633. ⟨10.1002/adfm.201401633⟩
Article dans une revue hal-01100102v1
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A complete SPICE subcircuit-based model library for organic photodiodes

Anis Daami , Jérôme Vaillant , Romain Gwoziecki , Christophe Serbutoviez
Solid-State Electronics, 2012, 75, pp.81-85. ⟨10.1016/j.sse.2012.04.035⟩
Article dans une revue cea-04229934v1
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High index spin-on photosensitive material and process optimization for image sensor devices

B. Mortini , C. Aumont , J.-P. Reynard , E. Mortini , A. Crocherie
Journal of Photopolymer Science and Technology, 2009, 22 (6), pp.707-711. ⟨10.2494/photopolymer.22.707⟩
Article dans une revue hal-04515172v1
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Uniform illumination and rigorous electromagnetic simulations applied to CMOS image sensors

Jérôme Vaillant , Axel Crocherie , Flavien Hirigoyen , Adam Cadien , James Pond
Optics Express, 2007, 15 (9), pp.5494. ⟨10.1364/OE.15.005494⟩
Article dans une revue hal-04516620v1
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Wavefront sensor architectures fully embedded in an image sensor

Jérôme Vaillant
Applied optics, 2007, 46 (29), pp.7110. ⟨10.1364/AO.46.007110⟩
Article dans une revue hal-04515541v1

Feasibility study of the polychromatic laser guide star

Renaud Foy , J. P. Pique , Véronique Bellanger , Patrick Chevrou , D. Petit Alain
Proceedings of SPIE, the International Society for Optical Engineering, 2003, Adaptive Optical System Technologies II. Edited by Wizinowich, Peter L.; Bonaccini, Domenico., 4839, pp.484-491. ⟨10.1117/12.460080⟩
Article dans une revue hal-01118355v1

ELPOA: toward the tilt measurement from a polychromatic laser guide star

Renaud Foy , J. P. Pique , D. Petit Alain , Patrick Chevrou , Vincent Michau
Proceedings of SPIE, the International Society for Optical Engineering, 2000, Adaptive Optical Systems Technology, 4007, pp.284-295. ⟨10.1117/12.390401⟩
Article dans une revue hal-01118339v1
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ELP-OA: measuring the wavefront tilt without a natural guide star

Matthias, Schoeck , J. P. Pique , Alain D., Petit , Patrick, Chevrou , Vincent, Michau
Proceedings of SPIE, the International Society for Optical Engineering, 2000, 4125, pp.41 - 52. ⟨10.1117/12.409304⟩
Article dans une revue hal-01118345v1
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Polychromatic guide star: feasibility study

Renaud Foy , Jean-Paul Pique , Alain D. Petit , Patrick Chevrou , Vincent Michau
Proceedings of SPIE, the International Society for Optical Engineering, 2000, High-Power Laser Ablation III, Claude R. Phipps; Ed. Published, 4065, pp.312 - 323
Article dans une revue hal-01118342v1
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Metasurface-based planar microlenses for SPAD pixels

Jérôme Vaillant , Lucie Dilhan , Alain Ostrovsky , Quentin Abadie , Lilian Masarotto
International Image Sensor Workshop, International Images Sensor Society, May 2023, Crieff, United Kingdom
Communication dans un congrès cea-04510688v1
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Metasurface-based planar microlenses integrated on back-side illuminated CMOS pixels 1 st

Martin Lepers , Alain Ostrovsky , Patrice Genevet , Stéphane Lanteri , Jérôme Vaillant
IISW 2023 - International Image Sensor Workshop, Internal Image Sensor Society (IISS), May 2023, Crieff, United Kingdom
Communication dans un congrès cea-04510668v1
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Deep learning applied to quad-pixel plenoptic images

Guillaume Chataignier , Benoit Vandame , Jérôme Vaillant
Computational Optics 2021, Sep 2021, Online, Spain. ⟨10.1117/12.2597001⟩
Communication dans un congrès hal-04241632v1
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Physical noise propagation in color image construction: a geometrical interpretation

Axel Clouet , Jérôme Vaillant , David Alleysson
Color Imaging Conference 27, Oct 2019, Paris, France
Communication dans un congrès hal-02388962v1
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Grayscale lithography process study for sub 5µm microlens patterns

Chevalier Pierre , Patrick Quéméré , Charlotte Beylier , Sébastien Bérard-Bergery , Nacima Allouti
Novel Patterning Technologies for Semiconductors, MEMS/NEMS, and MOEMS 2019, SPIE, Feb 2019, San Jose, United States. pp.49, ⟨10.1117/12.2514712⟩
Communication dans un congrès hal-04511262v1
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Color correction matrix for sparse RGB-W image sensor without IR cutoff filter

Jérôme Vaillant , Axel Clouet , David Alleysson
Unconventional Optical Imaging, Apr 2018, Strasbourg, France. pp.3, ⟨10.1117/12.2306123⟩
Communication dans un congrès cea-02390508v1
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Device modeling of solution-processed organic solar cells, photodiodes and photo-resistances

Raphael Clerc , Jerome Vaillant , Lionel Hirsch
ESSDERC 2018, Sep 2018, Dresden, Germany
Communication dans un congrès hal-01886791v1
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SPAD array sensitivity enhancement by diffractive microlens

Jérôme Vaillant , Lilian Masarotto , Romain Paquet , Véronique Lecoutre , Catherine Pellé
IISW 2017 - 2017 International Image Sensor Workshop, International Image Sensor Society, May 2017, Hiroshima, Japan
Communication dans un congrès hal-04235027v1
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Current status and challenges of the modeling of organic photodiodes and solar cells

Raphael Clerc , B Bouthinon , A M Mohankumar , Patrice Rannou , J Vaillant
International Electron Device Meeting 2016, Dec 2016, San Francisco, United States
Communication dans un congrès hal-01385518v1
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Characterization of pixel crosstalk and impact of Bayer patterning by quantum efficiency measurement

Jérôme Vaillant , Clémence Mornet , Thomas Decroux , Didier Hérault , Isabelle Schanen
IS&T/SPIE Electronic Imaging, SPIE, Jan 2011, San Francisco Airport, United States. pp.787613, ⟨10.1117/12.879603⟩
Communication dans un congrès hal-04511580v1
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Toward a quantitative visual noise evaluation of sensors and image processing pipes

Clémence Mornet , Donald Baxter , Jérôme Vaillant , Thomas Decroux , Didier Herault
IS&T/SPIE Electronic Imaging -, SPIE, Jan 2011, San Francisco, United States. pp.78760Q, ⟨10.1117/12.870828⟩
Communication dans un congrès hal-04513253v1
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An image quality evaluation tool simulating image sensors including Quantum Efficiency off-axis effect

Clémence Mornet , Jérôme Vaillant , Thomas Decroux , Nicolas Virollet , Didier Herault
IS&T/SPIE Electronic Imaging - The annual IS&T/SPIE Electronic Imaging symposium, SPIE, Jan 2011, San Francisco, United States. pp.78760M, ⟨10.1117/12.871344⟩
Communication dans un congrès hal-04512696v1
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Evaluation of color error and noise on simulated images

Clémence Mornet , Jérôme Vaillant , Thomas Decroux , Didier Hérault , Isabelle Schanen
IS&T/SPIE Electronic Imaging, Jan 2010, San Jose, United States. pp.75370Y, ⟨10.1117/12.853669⟩
Communication dans un congrès hal-04235684v1
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Finite-difference time domain based electro-optical methodologies to improve CMOS image sensor pixels performances

Flavien Hirigoyen , Axel Crocherie , Pierre Boulenc , Jérôme Vaillant , Clément Tavernier
SPIE Photonics Europe, May 2010, Brussels, Belgium. pp.772318, ⟨10.1117/12.854546⟩
Communication dans un congrès hal-04235577v1
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Grayscale lithography process study applied to zero-gap microlenses for sub 2µm CMOS image sensors

S. Audran , Jérôme Vaillant , V. Farys , F. Hirigoyen , E. Huss
SPIE Advanced Lithography, SPIE, Feb 2010, San Jose, United States. ⟨10.1117/12.846507⟩
Communication dans un congrès hal-04235566v1

"Evaluation of Color Error and Noise on Simulated Images", in Imai, F., Sampat, N. and Xiao, F., ed.,'DIGITAL PHOTOGRAPHY VI'

C. Mornet , J. Vaillant , T. Decroux , D. Herault , I. Schanen
Conference on Digital Photography VI, Jan 2010, San José, CA, United States
Communication dans un congrès hal-00603659v1
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Improved colour separation for a backside illuminated image sensor with 1.4 µm pixel pitch

Jens Prima , Francois Roy , Hugues Leininger , Christophe Cowache , Jérôme Vaillant
IISW 2009 - International Image Sensor Workshop, Jun 2009, Bergen, Norway
Communication dans un congrès hal-04235663v1
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From photons to electrons: a complete 3D simulation flow for CMOS image sensor

Crocherie Axel , Boulenc Pierre , Jérôme Vaillant , Hirigoyen Flavien , Hérault Didier
IISW 2009 - IEEE 2009 International Image Sensor Workshop, IEEE, Jun 2009, Bergen, Norway. pp.P15
Communication dans un congrès hal-04235628v1
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Three-dimensional broadband FDTD optical simulations of CMOS image sensor

A. Crocherie , Jérôme Vaillant , F. Hirigoyen
Optical Systems Design, Sep 2008, Glasgow, United Kingdom. pp.71002J, ⟨10.1117/12.797417⟩
Communication dans un congrès hal-04241635v1
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Versatile method for optical performances characterization of off-axis CMOS pixels with microlens radial shift

Jérôme Vaillant , Thomas Decroux , Emilie Huss , Frédéric Barbier , Didier Hérault
Electronic Imaging 2008, SPIE, Mar 2008, San Jose, United States. pp.681707, ⟨10.1117/12.766463⟩
Communication dans un congrès hal-04512783v1
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FDTD-based optical simulations methodology for CMOS image sensors pixels architecture and process optimization

Flavien Hirigoyen , Axel Crocherie , Jérôme Vaillant , Yvon Cazaux
Electronic Imaging 2008, Feb 2008, San Jose, United States. pp.681609, ⟨10.1117/12.766391⟩
Communication dans un congrès hal-04241641v1
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Fully Optimized Cu based process with dedicated cavity etch for 1.75$\mu$m and 1.45$\mu$m pixel pitch CMOS Image Sensors

M. Cohen , F. Roy , D. Herault , Y. Cazaux , A. Gandolfi
IEDM 2006 - 2006 IEEE International Electron Devices Meeting, Dec 2006, San Francisco, United States. ⟨10.1109/IEDM.2006.346976⟩
Communication dans un congrès hal-04235559v1
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Optical simulation for CMOS imager microlens optimization

Jérôme Vaillant , Flavien Hirigoyen
Photonics Europe, SPIE, Sep 2004, Strasbourg, France. pp.200, ⟨10.1117/12.546000⟩
Communication dans un congrès hal-04514509v1
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Source follower noise limitations in CMOS active pixel sensors

Keith Findlater , Jérôme Vaillant , Donald Baxter , Christine Augier , Didier Herault
Optical Systems Design, SPIE, Feb 2004, St. Etienne, France. pp.187, ⟨10.1117/12.512969⟩
Communication dans un congrès hal-04514614v1

ELP-OA: Final report of the feasibility study

R., Foy , J. P. Pique , V., Bellanger , P., Chevrou , A., Petit
SF2A-2002: Semaine de l'Astrophysique Francaise, meeting held in Paris, France, June 24-29, 2002,, SFP, Jun 2002, Paris, France. pp.173
Communication dans un congrès hal-01118347v1
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ELPOA: data processing of chromatic differences of the tilt measured with a polychromatic laser guide star

Jérôme Vaillant , Eric Thiebaut , Michel Tallon
Astronomical Telescopes and Instrumentation, Jul 2000, Munich, Germany. pp.308-315, ⟨10.1117/12.390341⟩
Communication dans un congrès hal-04234977v1

Bloch mode analysis of subwavelength polarizing planar optics

Raphaël Mulin , François Deneuville , Olivier Jeannin , Matthieu Boffety , Jerome Vaillant
Proceedings SPIE Volume 12432, High Contrast Metastructures XII, 12432, SPIE, pp.1243204, 2023, ⟨10.1117/12.2646194⟩
Proceedings/Recueil des communications hal-04134147v1

Solution-Processed Organic Photodiodes

Raphaël Clerc , Jean-Marie Verilhac , Mehdi Daanoune , Benjamin Bouthinon , Jerome Vaillant
Solution-Processable Components for Organic Electronic Devices, Wiley-VCH Verlag GmbH & Co. KGaA, pp.537-589, 2019
Chapitre d'ouvrage hal-02173176v1
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L'optique pour les pixels des capteurs d'images CMOS

Jérôme Vaillant
Optique [physics.optics]. UGA (Université Grenoble Alpes), 2017
HDR tel-02119299v1