Jérôme Vaillant

Documents

Publications

Rigorous Model-Based Mask Data Preparation Algorithm Applied to Grayscale Lithography for the Patterning at the Micrometer Scale

Pierre Chevalier , Patrick Quemere , Sebastien Berard-Bergery , Jean-Baptist Henry , Charlotte Beylier et al.

Journal of Microelectromechanical Systems, 2021, 30 (3), pp.442 - 455. ⟨10.1109/jmems.2021.3067475⟩

Article dans une revue cea-04506422v1

On the minimum thickness of doped Electron/Hole Transport Layers in organic semiconductor devices

D. Oussalah , R. Clerc , J. Baylet , R. Paquet , C. Sésé et al.

Journal of Applied Physics, 2021, 130 (12), pp.125502. ⟨10.1063/5.0060429⟩

Article dans une revue hal-03358906v1

Visible to near infrared multispectral images dataset for image sensors design

Axel Clouet , Célia Viola , Jérôme Vaillant

Journal of Electronic Imaging, 2020, 32, pp.art00006. ⟨10.2352/ISSN.2470-1173.2020.5.MAAP-106⟩

Article dans une revue cea-02890764v1

Planar microlenses for near infrared CMOS image sensors

L. Dilhan , Jérôme Vaillant , A. Ostrovsky , L. Masarotto , C. Pichard et al.

Electronic Imaging, 2020, 32 (7), pp.144-1-144-7. ⟨10.2352/ISSN.2470-1173.2020.7.ISS-144⟩

Article dans une revue hal-04235049v1

The Geometry of Noise in Color and Spectral Image Sensors

Axel Clouet , Jérôme Vaillant , David Alleysson

Sensors, 2020, 20 (16), pp.4487. ⟨10.3390/s20164487⟩

Article dans une revue hal-02990998v1

Joint electromagnetic and ray-tracing simulations for quad-pixel sensor and computational imaging

Guillaume Chataignier , Benoit Vandame , Jérôme Vaillant

Optics Express, 2019, 27 (21), pp.30486. ⟨10.1364/OE.27.030486⟩

Article dans une revue hal-04241630v1

Physical noise propagation in color image construction: a geometrical interpretation

Axel Clouet , Jérôme Vaillant , David Alleysson

Color and Imaging Conference, 2019, 27th Color and Imaging Conference Final Program and Proceedings, 2019, pp.375-380. ⟨10.2352/issn.2169-2629.2019.27.67⟩

Article dans une revue hal-02991028v1

Impact of Blend Morphology on Interface State Recombination in Bulk Heterojunction Organic Solar Cells

Benjamin Bouthinon , Raphaël Clerc , Jérôme Vaillant , J.-M Verilhac , Jérôme Faure-Vincent et al.

Advanced Functional Materials, 2015, pp.10.1002/adfm.201401633. ⟨10.1002/adfm.201401633⟩

Article dans une revue hal-01100102v1

A complete SPICE subcircuit-based model library for organic photodiodes

Anis Daami , Jérôme Vaillant , Romain Gwoziecki , Christophe Serbutoviez

Solid-State Electronics, 2012, 75, pp.81-85. ⟨10.1016/j.sse.2012.04.035⟩

Article dans une revue cea-04229934v1

High index spin-on photosensitive material and process optimization for image sensor devices

B. Mortini , C. Aumont , J.-P. Reynard , E. Mortini , A. Crocherie et al.

Journal of Photopolymer Science and Technology, 2009, 22 (6), pp.707-711. ⟨10.2494/photopolymer.22.707⟩

Article dans une revue hal-04515172v1

Uniform illumination and rigorous electromagnetic simulations applied to CMOS image sensors

Jérôme Vaillant , Axel Crocherie , Flavien Hirigoyen , Adam Cadien , James Pond

Optics Express, 2007, 15 (9), pp.5494. ⟨10.1364/OE.15.005494⟩

Article dans une revue hal-04516620v1

Wavefront sensor architectures fully embedded in an image sensor

Jérôme Vaillant

Applied optics, 2007, 46 (29), pp.7110. ⟨10.1364/AO.46.007110⟩

Article dans une revue hal-04515541v1

Feasibility study of the polychromatic laser guide star

Renaud Foy , J. P. Pique , Véronique Bellanger , Patrick Chevrou , D. Petit Alain et al.

Proceedings of SPIE, the International Society for Optical Engineering, 2003, Adaptive Optical System Technologies II. Edited by Wizinowich, Peter L.; Bonaccini, Domenico., 4839, pp.484-491. ⟨10.1117/12.460080⟩

Article dans une revue hal-01118355v1

Polychromatic guide star: feasibility study

Renaud Foy , Jean-Paul Pique , Alain D. Petit , Patrick Chevrou , Vincent Michau et al.

Proceedings of SPIE, the International Society for Optical Engineering, 2000, High-Power Laser Ablation III, Claude R. Phipps; Ed. Published, 4065, pp.312 - 323

Article dans une revue hal-01118342v1

ELP-OA: measuring the wavefront tilt without a natural guide star

Matthias Schöck , Jean-Paul Pique , Alain D. Petit , Patrick Chevrou , Vincent Michau et al.

Proceedings of SPIE, the International Society for Optical Engineering, 2000, 4125, pp.41-52. ⟨10.1117/12.409304⟩

Article dans une revue hal-01118345v1

ELPOA: toward the tilt measurement from a polychromatic laser guide star

Renaud Foy , J. P. Pique , D. Petit Alain , Patrick Chevrou , Vincent Michau et al.

Proceedings of SPIE, the International Society for Optical Engineering, 2000, Adaptive Optical Systems Technology, 4007, pp.284-295. ⟨10.1117/12.390401⟩

Article dans une revue hal-01118339v1

Metasurface-based planar microlenses for SPAD pixels

Jérôme Vaillant , Lucie Dilhan , Alain Ostrovsky , Quentin Abadie , Lilian Masarotto et al.

International Image Sensor Workshop, International Images Sensor Society, May 2023, Crieff, United Kingdom. ⟨10.60928/wfsx-vpij⟩

Communication dans un congrès cea-04510688v1

Metasurface-based planar microlenses integrated on back-side illuminated CMOS pixels

Martin Lepers , Alain Ostrovsky , Patrice Genevet , Stéphane Lanteri , Jérôme Vaillant

IISW 2023 - International Image Sensor Workshop, Internal Image Sensor Society (IISS), May 2023, Crieff, United Kingdom. pp.28, ⟨10.60928/bt36-4xr8⟩

Communication dans un congrès cea-04510668v1

Grayscale lithography process study for sub 5µm microlens patterns

Chevalier Pierre , Patrick Quéméré , Charlotte Beylier , Sébastien Bérard-Bergery , Nacima Allouti et al.

Novel Patterning Technologies for Semiconductors, MEMS/NEMS, and MOEMS 2019, SPIE, Feb 2019, San Jose, United States. pp.49, ⟨10.1117/12.2514712⟩

Communication dans un congrès hal-04511262v1

Planar microlenses applied to SPAD pixels

Lucie Dilhan , Jérôme Vaillant , Quentin Abadie , Alain Ostrovsky , Sébastien Verdet et al.

IISW 2021 - International Image Sensor Workshop, Jun 2021, Online, France. ⟨10.60928/ygty-o9h9⟩

Communication dans un congrès hal-04617453v1

Deep learning applied to quad-pixel plenoptic images

Guillaume Chataignier , Benoit Vandame , Jérôme Vaillant

Computational Optics 2021, Sep 2021, Online, Spain. ⟨10.1117/12.2597001⟩

Communication dans un congrès hal-04241632v1

Physical noise propagation in color image construction: a geometrical interpretation

Axel Clouet , Jérôme Vaillant , David Alleysson

Color Imaging Conference 27, Oct 2019, Paris, France

Communication dans un congrès hal-02388962v1

SPAD array sensitivity enhancement by diffractive microlens

Jérôme Vaillant , Lilian Masarotto , Romain Paquet , Véronique Lecoutre , Catherine Pellé et al.

IISW 2019 - 2019 International Image Sensor Workshop, International Image Sensor Society, Jun 2019, Snowbird (UT), United States. ⟨10.60928/bl23-jmo6⟩

Communication dans un congrès hal-04235027v1

Color correction matrix for sparse RGB-W image sensor without IR cutoff filter

Jérôme Vaillant , Axel Clouet , David Alleysson

Unconventional Optical Imaging, Apr 2018, Strasbourg, France. pp.3, ⟨10.1117/12.2306123⟩

Communication dans un congrès cea-02390508v1

Device modeling of solution-processed organic solar cells, photodiodes and photo-resistances

Raphael Clerc , Jerome Vaillant , Lionel Hirsch

ESSDERC 2018, Sep 2018, Dresden, Germany

Communication dans un congrès hal-01886791v1

Current status and challenges of the modeling of organic photodiodes and solar cells

Raphael Clerc , B Bouthinon , A M Mohankumar , Patrice Rannou , J Vaillant et al.

International Electron Device Meeting 2016, Dec 2016, San Francisco, United States

Communication dans un congrès hal-01385518v1

An image quality evaluation tool simulating image sensors including Quantum Efficiency off-axis effect

Clémence Mornet , Jérôme Vaillant , Thomas Decroux , Nicolas Virollet , Didier Herault et al.

IS&T/SPIE Electronic Imaging - The annual IS&T/SPIE Electronic Imaging symposium, SPIE, Jan 2011, San Francisco, United States. pp.78760M, ⟨10.1117/12.871344⟩

Communication dans un congrès hal-04512696v1

Characterization of pixel crosstalk and impact of Bayer patterning by quantum efficiency measurement

Jérôme Vaillant , Clémence Mornet , Thomas Decroux , Didier Hérault , Isabelle Schanen

IS&T/SPIE Electronic Imaging, SPIE, Jan 2011, San Francisco Airport, United States. pp.787613, ⟨10.1117/12.879603⟩

Communication dans un congrès hal-04511580v1

Toward a quantitative visual noise evaluation of sensors and image processing pipes

Clémence Mornet , Donald Baxter , Jérôme Vaillant , Thomas Decroux , Didier Herault et al.

IS&T/SPIE Electronic Imaging -, SPIE, Jan 2011, San Francisco, United States. pp.78760Q, ⟨10.1117/12.870828⟩

Communication dans un congrès hal-04513253v1

Evaluation of Color Error and Noise on Simulated Images", in Imai, F., Sampat, N. and Xiao, F., ed.,'DIGITAL PHOTOGRAPHY VI

C. Mornet , J. Vaillant , T. Decroux , D. Herault , I. Schanen

Conference on Digital Photography VI, Jan 2010, San José, CA, United States

Communication dans un congrès hal-00603659v1

Evaluation of color error and noise on simulated images

Clémence Mornet , Jérôme Vaillant , Thomas Decroux , Didier Hérault , Isabelle Schanen

IS&T/SPIE Electronic Imaging, Jan 2010, San Jose, United States. pp.75370Y, ⟨10.1117/12.853669⟩

Communication dans un congrès hal-04235684v1

Grayscale lithography process study applied to zero-gap microlenses for sub 2µm CMOS image sensors

S. Audran , Jérôme Vaillant , V. Farys , F. Hirigoyen , E. Huss et al.

SPIE Advanced Lithography, SPIE, Feb 2010, San Jose, United States. ⟨10.1117/12.846507⟩

Communication dans un congrès hal-04235566v1

Finite-difference time domain based electro-optical methodologies to improve CMOS image sensor pixels performances

Flavien Hirigoyen , Axel Crocherie , Pierre Boulenc , Jérôme Vaillant , Clément Tavernier et al.

SPIE Photonics Europe, May 2010, Brussels, Belgium. pp.772318, ⟨10.1117/12.854546⟩

Communication dans un congrès hal-04235577v1

1.1µm Backside Imager vs. Frontside Imager: an optics-dedicated FDTD approach

Flavien Hirigoyen , Jérôme Vaillant , Emilie Huss , Frederic Barbier , Jens Prima et al.

International Image Sensor Workshop, International Image Sensor Society, Jun 2009, Bergen, Norway. ⟨10.60928/co26-wses⟩

Communication dans un congrès hal-04617416v1

From photons to electrons: a complete 3D simulation flow for CMOS image sensor

Crocherie Axel , Boulenc Pierre , Jérôme Vaillant , Hirigoyen Flavien , Hérault Didier et al.

IISW 2009 - IEEE 2009 International Image Sensor Workshop, IEEE, Jun 2009, Bergen, Norway. pp.P15, ⟨10.60928/nooy-xlmg⟩

Communication dans un congrès hal-04235628v1

Improved colour separation for a backside illuminated image sensor with 1.4 µm pixel pitch

Jens Prima , Francois Roy , Hugues Leininger , Christophe Cowache , Jérôme Vaillant et al.

IISW 2009 - International Image Sensor Workshop, Jun 2009, Bergen, Norway. ⟨10.60928/de8i-xe9l⟩

Communication dans un congrès hal-04235663v1

Three-dimensional broadband FDTD optical simulations of CMOS image sensor

A. Crocherie , Jérôme Vaillant , F. Hirigoyen

Optical Systems Design, Sep 2008, Glasgow, United Kingdom. pp.71002J, ⟨10.1117/12.797417⟩

Communication dans un congrès hal-04241635v1

Versatile method for optical performances characterization of off-axis CMOS pixels with microlens radial shift

Jérôme Vaillant , Thomas Decroux , Emilie Huss , Frédéric Barbier , Didier Hérault et al.

Electronic Imaging 2008, SPIE, Mar 2008, San Jose, United States. pp.681707, ⟨10.1117/12.766463⟩

Communication dans un congrès hal-04512783v1

FDTD-based optical simulations methodology for CMOS image sensors pixels architecture and process optimization

Flavien Hirigoyen , Axel Crocherie , Jérôme Vaillant , Yvon Cazaux

Electronic Imaging 2008, Feb 2008, San Jose, United States. pp.681609, ⟨10.1117/12.766391⟩

Communication dans un congrès hal-04241641v1

Fully Optimized Cu based process with dedicated cavity etch for 1.75$\mu$m and 1.45$\mu$m pixel pitch CMOS Image Sensors

M. Cohen , F. Roy , D. Herault , Y. Cazaux , A. Gandolfi et al.

IEDM 2006 - 2006 IEEE International Electron Devices Meeting, Dec 2006, San Francisco, United States. ⟨10.1109/IEDM.2006.346976⟩

Communication dans un congrès hal-04235559v1

Source follower noise limitations in CMOS active pixel sensors

Keith Findlater , Jérôme Vaillant , Donald Baxter , Christine Augier , Didier Herault et al.

Optical Systems Design, SPIE, Feb 2004, St. Etienne, France. pp.187, ⟨10.1117/12.512969⟩

Communication dans un congrès hal-04514614v1

Optical simulation for CMOS imager microlens optimization

Jérôme Vaillant , Flavien Hirigoyen

Photonics Europe, SPIE, Sep 2004, Strasbourg, France. pp.200, ⟨10.1117/12.546000⟩

Communication dans un congrès hal-04514509v1

ELP-OA: Final report of the feasibility study

R., Foy , J. P. Pique , V., Bellanger , P., Chevrou , A., Petit et al.

SF2A-2002: Semaine de l'Astrophysique Francaise, meeting held in Paris, France, June 24-29, 2002,, SFP, Jun 2002, Paris, France. pp.173

Communication dans un congrès hal-01118347v1

ELPOA: data processing of chromatic differences of the tilt measured with a polychromatic laser guide star

Jérôme Vaillant , Eric Thiebaut , Michel Tallon

Astronomical Telescopes and Instrumentation, Jul 2000, Munich, Germany. pp.308-315, ⟨10.1117/12.390341⟩

Communication dans un congrès hal-04234977v1

Characterization of small microlens based on metasurface using Quadriwave Lateral Shearing Interferometry

Martin Lepers , Alain Ostrovsky , Jérôme Vaillant , Samira Khadir , Jean-Yves Duboz

META, Jul 2025, Toyama, Japon, Japan

Poster de conférence hal-05343789v1

Bloch mode analysis of subwavelength polarizing planar optics

Raphaël Mulin , François Deneuville , Olivier Jeannin , Matthieu Boffety , Jerome Vaillant

SPIE Photonics West, High Contrast Metastructures XII, proceedings SPIE, 12432, pp.1243204, 2023, ⟨10.1117/12.2646194⟩

Proceedings/Recueil des communications hal-04134147v1

Direction du dossier : La Bundeswehr entre géopolitique et débats de société

Jean-Louis Georget , Hans Stark , Jérémie Thérond , Vaillant Jérôme

Allemagne d'aujourd'hui : revue francaise d'information sur l'Allemagne, 1 (235), 2021, ⟨10.3917/all.235.0003⟩

N°spécial de revue/special issue halshs-03902365v1

Solution-Processed Organic Photodiodes

Raphaël Clerc , Jean-Marie Verilhac , Mehdi Daanoune , Benjamin Bouthinon , Jerome Vaillant

Jacek Ulanski, Beata Luszczynska, Krzysztof Matyjaszewski. Solution-Processable Components for Organic Electronic Devices, Wiley-VCH Verlag GmbH & Co. KGaA, pp.537-589, 2019, ⟨10.1002/9783527813872.ch10⟩

Chapitre d'ouvrage hal-02173176v1

Mesure du tilt atmosphérique à partir de sa variation chromatique pour l'étoile laser polychromatique

Jérôme Vaillant

Optique [physics.optics]. Université Claude Bernard - Lyon I, 2002. Français. ⟨NNT : ⟩

Thèse tel-01025615v1

L'optique pour les pixels des capteurs d'images CMOS

Jérôme Vaillant

Optique [physics.optics]. UGA (Université Grenoble Alpes), 2017

HDR tel-02119299v1

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