Jérôme Vaillant
Publications
Publications
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Metasurface-based planar microlenses for SPAD pixelsInternational Image Sensor Workshop, International Images Sensor Society, May 2023, Crieff, United Kingdom. ⟨10.60928/wfsx-vpij⟩ |
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Metasurface-based planar microlenses integrated on back-side illuminated CMOS pixelsIISW 2023 - International Image Sensor Workshop, Internal Image Sensor Society (IISS), May 2023, Crieff, United Kingdom. pp.28, ⟨10.60928/bt36-4xr8⟩ |
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Grayscale lithography process study for sub 5µm microlens patternsNovel Patterning Technologies for Semiconductors, MEMS/NEMS, and MOEMS 2019, SPIE, Feb 2019, San Jose, United States. pp.49, ⟨10.1117/12.2514712⟩ |
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Planar microlenses applied to SPAD pixelsIISW 2021 - International Image Sensor Workshop, Jun 2021, Online, France. ⟨10.60928/ygty-o9h9⟩ |
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Deep learning applied to quad-pixel plenoptic imagesComputational Optics 2021, Sep 2021, Online, Spain. ⟨10.1117/12.2597001⟩ |
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SPAD array sensitivity enhancement by diffractive microlensIISW 2019 - 2019 International Image Sensor Workshop, International Image Sensor Society, Jun 2019, Snowbird (UT), United States. ⟨10.60928/bl23-jmo6⟩ |
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Physical noise propagation in color image construction: a geometrical interpretationColor Imaging Conference 27, Oct 2019, Paris, France |
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Color correction matrix for sparse RGB-W image sensor without IR cutoff filterUnconventional Optical Imaging, Apr 2018, Strasbourg, France. pp.3, ⟨10.1117/12.2306123⟩ |
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Device modeling of solution-processed organic solar cells, photodiodes and photo-resistancesESSDERC 2018, Sep 2018, Dresden, Germany |
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Current status and challenges of the modeling of organic photodiodes and solar cellsInternational Electron Device Meeting 2016, Dec 2016, San Francisco, United States |
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An image quality evaluation tool simulating image sensors including Quantum Efficiency off-axis effectIS&T/SPIE Electronic Imaging - The annual IS&T/SPIE Electronic Imaging symposium, SPIE, Jan 2011, San Francisco, United States. pp.78760M, ⟨10.1117/12.871344⟩ |
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Characterization of pixel crosstalk and impact of Bayer patterning by quantum efficiency measurementIS&T/SPIE Electronic Imaging, SPIE, Jan 2011, San Francisco Airport, United States. pp.787613, ⟨10.1117/12.879603⟩ |
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Toward a quantitative visual noise evaluation of sensors and image processing pipesIS&T/SPIE Electronic Imaging -, SPIE, Jan 2011, San Francisco, United States. pp.78760Q, ⟨10.1117/12.870828⟩ |
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Evaluation of color error and noise on simulated imagesIS&T/SPIE Electronic Imaging, Jan 2010, San Jose, United States. pp.75370Y, ⟨10.1117/12.853669⟩ |
Evaluation of Color Error and Noise on Simulated Images", in Imai, F., Sampat, N. and Xiao, F., ed.,'DIGITAL PHOTOGRAPHY VIConference on Digital Photography VI, Jan 2010, San José, CA, United States |
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Grayscale lithography process study applied to zero-gap microlenses for sub 2µm CMOS image sensorsSPIE Advanced Lithography, SPIE, Feb 2010, San Jose, United States. ⟨10.1117/12.846507⟩ |
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Finite-difference time domain based electro-optical methodologies to improve CMOS image sensor pixels performancesSPIE Photonics Europe, May 2010, Brussels, Belgium. pp.772318, ⟨10.1117/12.854546⟩ |
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From photons to electrons: a complete 3D simulation flow for CMOS image sensorIISW 2009 - IEEE 2009 International Image Sensor Workshop, IEEE, Jun 2009, Bergen, Norway. pp.P15, ⟨10.60928/nooy-xlmg⟩ |
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1.1µm Backside Imager vs. Frontside Imager: an optics-dedicated FDTD approachInternational Image Sensor Workshop, International Image Sensor Society, Jun 2009, Bergen, Norway. ⟨10.60928/co26-wses⟩ |
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Improved colour separation for a backside illuminated image sensor with 1.4 µm pixel pitchIISW 2009 - International Image Sensor Workshop, Jun 2009, Bergen, Norway. ⟨10.60928/de8i-xe9l⟩ |
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FDTD-based optical simulations methodology for CMOS image sensors pixels architecture and process optimizationElectronic Imaging 2008, Feb 2008, San Jose, United States. pp.681609, ⟨10.1117/12.766391⟩ |
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Versatile method for optical performances characterization of off-axis CMOS pixels with microlens radial shiftElectronic Imaging 2008, SPIE, Mar 2008, San Jose, United States. pp.681707, ⟨10.1117/12.766463⟩ |
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Three-dimensional broadband FDTD optical simulations of CMOS image sensorOptical Systems Design, Sep 2008, Glasgow, United Kingdom. pp.71002J, ⟨10.1117/12.797417⟩ |
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Fully Optimized Cu based process with dedicated cavity etch for 1.75$\mu$m and 1.45$\mu$m pixel pitch CMOS Image SensorsIEDM 2006 - 2006 IEEE International Electron Devices Meeting, Dec 2006, San Francisco, United States. ⟨10.1109/IEDM.2006.346976⟩ |
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Source follower noise limitations in CMOS active pixel sensorsOptical Systems Design, SPIE, Feb 2004, St. Etienne, France. pp.187, ⟨10.1117/12.512969⟩ |
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Optical simulation for CMOS imager microlens optimizationPhotonics Europe, SPIE, Sep 2004, Strasbourg, France. pp.200, ⟨10.1117/12.546000⟩ |
ELP-OA: Final report of the feasibility studySF2A-2002: Semaine de l'Astrophysique Francaise, meeting held in Paris, France, June 24-29, 2002,, SFP, Jun 2002, Paris, France. pp.173 |
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ELPOA: data processing of chromatic differences of the tilt measured with a polychromatic laser guide starAstronomical Telescopes and Instrumentation, Jul 2000, Munich, Germany. pp.308-315, ⟨10.1117/12.390341⟩ |
Characterization of small microlens based on metasurface using Quadriwave Lateral Shearing InterferometryMETA, Jul 2025, Toyama, Japon, Japan |
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Bloch mode analysis of subwavelength polarizing planar opticsSPIE Photonics West, High Contrast Metastructures XII, proceedings SPIE, 12432, pp.1243204, 2023, ⟨10.1117/12.2646194⟩ |
Solution-Processed Organic PhotodiodesJacek Ulanski, Beata Luszczynska, Krzysztof Matyjaszewski. Solution-Processable Components for Organic Electronic Devices, Wiley-VCH Verlag GmbH & Co. KGaA, pp.537-589, 2019, ⟨10.1002/9783527813872.ch10⟩ |
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Mesure du tilt atmosphérique à partir de sa variation chromatique pour l'étoile laser polychromatiqueOptique [physics.optics]. Université Claude Bernard - Lyon I, 2002. Français. ⟨NNT : ⟩ |
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L'optique pour les pixels des capteurs d'images CMOSOptique [physics.optics]. UGA (Université Grenoble Alpes), 2017 |