CV HAL - JULES QUENTIN KOUAMO

Publications

Integrating Standardized Defect Modeling and Machine Learning for Alternative Testing of AMS Circuits

Jules Kouamo , Emmanuel Simeu , Michele Portolan

International Conference on Control, Automation and Diagnosis (ICCAD 2026), Jul 2026, Lisbon, Portugal. ⟨10.1109/ICCAD69956.2026.11643112⟩

Communication dans un congrès hal-05742784v1

IABIST: An IJTAG-Compliant Machine Learning-Based Analog BIST Framework for SoC Verification

Jules Kouamo , Emmanuel Simeu , Michele Portolan

IEEE 44th VLSI Test Symposium (VTS 2026), Apr 2026, Napa (CA), United States. ⟨10.1109/VTS69484.2026.11563361⟩

Communication dans un congrès hal-05666839v1

Enhanced BIST Architecture for Analog and Mixed-Signal Systems with On-Chip APRMLS and Machine Learning Analysis

Jules Kouamo , Emmanuel Simeu , Michele Portolan

2025 International Conference on Control, Automation and Diagnosis (ICCAD), Jul 2025, Barcelona, France. pp.1-6, ⟨10.1109/iccad64771.2025.11099465⟩

Communication dans un congrès hal-05207013v1

Machine Learning-Based Parametric Fault Detection in Analog and Mixed-Signal Circuits

Jules Kouamo , Emmanuel Simeu , Michele Portolan

IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS 2025), IEEE, Jul 2025, Ischia, Italy. pp.1-5, ⟨10.1109/IOLTS65288.2025.11116895⟩

Communication dans un congrès hal-05221593v1

BUILDING AND VALIDATING AN ONTOLOGY FOR PUBLIC PROCUREMENT: THE CASE OF CAMEROON

Jules Kouamo , Etienne Kouokam , Ghislain Auguste Atemezing

Conference on Research in Computer Science (CRI 2023), Dec 2023, Yaounde, Cameroon

Communication dans un congrès hal-04420667v1

JULES QUENTIN KOUAMO

Domaines de recherche

Compétences

Publications

Publications

Integrating Standardized Defect Modeling and Machine Learning for Alternative Testing of AMS Circuits

IABIST: An IJTAG-Compliant Machine Learning-Based Analog BIST Framework for SoC Verification

Enhanced BIST Architecture for Analog and Mixed-Signal Systems with On-Chip APRMLS and Machine Learning Analysis

Machine Learning-Based Parametric Fault Detection in Analog and Mixed-Signal Circuits

BUILDING AND VALIDATING AN ONTOLOGY FOR PUBLIC PROCUREMENT: THE CASE OF CAMEROON