Présentation
Dr Kamel HADDADI
Full Professor - Habilitation in Physics
University of Lille
Institute of Electronics, Microelectronics and Nanotechnology - IEMN
Unité Mixte de Recherche - Centre National de la Recherche Scientifique - UMR CNRS 8520
IEMN-DHS, Avenue Poincaré CS 60069
59652 Villeneuve d'Ascq Cedex France
Tél: 33-3 20 19 79 20
Tél: 33-6 37 74 83 63
Fax: 33-3 20 19 78 99
E-mail:kamel.haddadi@univ-lille.fr Short Biography
Kamel Haddadi (Member, IEEE) received the M.Sc. and Ph.D. degrees from the University of Lille, Villeneuve-d’Ascq, France, in 2003 and 2007, respectively. He is currently a Full Professor with the Institute of Electronics, Microelectronics and Nanotechnology, joint research unit between the University of Lille and the CNRS. He is the Head of the Lab-Space RF-2S (Radio-Frequency Sensing and Services) dedicated to the development of microwave/mm-wave instrumentation and sensors for nondestructive testing applications. The results achieved in this context led to publication of around 150 articles in peer-review international papers and conferences. He is a member of the International Committees: IEEE MTT-8 RF Nanotechnology and IEEE MTT-24 Microwave/mm-Wave Radar, Sensing and Array Systems, and a TPC member in various IEEE conferences. He is an Associate Editor of IEEE Transactions on Instrumentation and Measurement and IET Measurement Science and Technology. INFORMATIONS Head Lab-Space RF-2S - Radio-Frequency Sensing & Services IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY Member of the joint IEMN – ST Microelectronics laboratory Associate Editor IET Science, Measurement & Technology, IEEE TIM
Associate Editor IEEE Transactions on Instrumentation Measurement and Techniques (TIM) TPC Member IEEE Sensors, IEEE I2MTC, IEEE MARSS, IEEE ARFTG, ... International IEEE MTT committee Member :
‘TC IEEE MTT-8 RF Nanotechnology’ (https://mtt.org/profile/kamel-haddadi/)
‘TC IEEE MTT-24 Microwave/MM-Wave Radar, Sensing & Array’ (https://mtt.org/profile/kamel-haddadi/) Reviewer : Funding agencies Last PROJECTS & COLLABORATIONS Europe – H2020 – Nanotechnologies, Advanced Materials, Advanced Manufacturing and Processing, and Biotechnology (NMBP) – MMAMA - Microwave Microscopy for Advanced and Efficient Materials Analysis and Production
Consortium : Industry : Keysight Technologies GMBH (Austria). RTO (Research and Technology Organization) : Materia Nova ASBL (Belgium), METAS (Switzerland). Laboratoire académique : ETHZ (Switzerland). SME (Small and Medium-sized Enterprises) : QWED (Poland), Dracula Technologies (France), Adamant Composites LTD (Greece).
Coordinator Europe – Joint Research Project (JRP SRT-i17) - European Metrology Program for Innovation and Research (EMPIR)
Planar Cal - Microwave measurements for planar circuits and components
Consortium : METAS (Switzerland), NPL (United Kingdom), PTB (Germany), VSL (Netherlands). EPCOS AG (Germany), Forschungsverbund Berlin e.V. (Germany), Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V. (Germany), Friedrich-Alexander-Universität Erlangen - Nürnberg (Germany), ROHDE & SCHWARZ GmbH & Co. Kommanditgesellschaft (Germany), Technische Universiteit Delft (Netherlands), University of Leeds (United Kingdom)
Scientific Leader Europe – Joint Research Project (JRP SRT-i17) – European Metrology Program for Innovation and Research (EMPIR) 2019-2021
TEMMT-Traceability for electrical measurements at millimetre-wave and terahertz frequencies for communications and electronics technologies
Consortium : CMI (Czech Republic), GUM (Poland), INTI (Argentina), LNE (France), METAS (Switzerland), NPL (UK), PTB (Germany), TUBITAK (Turkey), VSL (Netherlands), Anritsu (UK), FormFactor (Germany), Keysight (Belgium), Rohde & Schwarz (R&S) (Germany), Virginia Diodes Inc (VDI) (USA), Forschungsverbund Berlin (FBH) (Germany), The University of Birmingham (BHAM)(UK), Chalmers university of technology (Chalmers) (Sweden), Wojskowa Akademia Techniczna im Jaroslawa Dabrowskiego (WAT), Poland
Scientific Leader Europe – Joint Research Project (JRP 20IND12) – European Metrology Program for Innovation and Research (EMPIR) 2021-2024
ELENA - Electrical nanoscale metrology in industry
Consortium: BAM (Germany), CMI (Czech Republic), DFM (Denmark), LNE (France), METAS (Switzerland), PTB (Germany), TUBITAK (Turkey), VSL (Netherlands), ISC (Germany), CEA-LETI (France), CNRS (France), JKU (Austria), University of Glasgow (UK), Université de Lille (France)
Scientific Leader ANR/DFG – 2015-2018
VACSMM: Vacuum Scanning Microwave Microscopy for quantitative characterization of sub-10 nm and atto-Farad scale capacitors and memories
Scientific Leader WP1 – Development of an RF interferometric or reflectometric setup for aF scale characterization Dissemination
-Tutorial
HADDADI K - Understanding scanning near-field microwave microscopy
International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2016, Taipei,
Taiwan, May 23-26, 2016, Measurements and Industrial Applications
http://2016.imtc.ieee-ims.org/tutorial-understanding-scanning-near-field-microwave-microscopy
-Tutorial
HADDADI K - H2020: Microwave Microscopy for Advanced and Efficient Materials Analysis and Production
International Instrumentation and Measurement Technology Conference, IEEE I2MTC 2020,
Dubrovnik, Croatia, May 25-28, 2020 [ONLINE]
-Tutorial
HADDADI K Multiscale Microwave and Millimeter-Wave Nondestructive Testing and Evaluation, International Instrumentation and Measurement Technology Conference,
IEEE I2MTC 2022, Ottawa, Canada, May 16-19, 2022.
-Seminar Series, IEEE UAE Microwave Theory and Techniques, Instrumentation and Measurement, Antennas and Propagation Joint Chapter,
HADDADI K., Microwave sensing in the modern society,
Thursday, 4 November 2021, Dubai, UAE.
-IEEE RWW 2022 – Technical Lectures. “Microwave Sensing in the Modern Society”
Speaker: Kamel Haddadi, Wednesday, 19 January 2022, Las Vegas, US. Session Organization & Chairing
-IEEE RWW 2015
-IEEE ICEAA 2018
-EuMW 2019 – Workshop ‘Microwave Characterization and Modelling at Nano and Micro-Scale of Advanced Materials to Enhance Emerging Products Manufacturing”, 29 September 2019, Paris.
-IEEE NEMO 2022 – Workshop ‘Electromagnetic and Multiphysics Multiscale Modelling and Characterization for Advanced and Efficient Material”, Limoges, France, 6-8 Juillet 2022.
-IEEE IMS 2022 –TPC member, Open forum (Phased Arrays and OTA Applications Day), June 2022.
-IEEE RWW 2022 – Technical Lectures, Las Vegas, US, Wednesday, 19 January 2022.
-IEEE RWW 2022 & 2023 – Judge for Student Paper Competition, Las Vegas, US, 16-19 January 2022
Domaines de recherche
Compétences
Publications
Publications
Experimental Study on the Repeatability of Nanoscale On-Wafer Calibration Structures on High Resistivity Silicon Substrate Up to 110 GHz2025 55th European Microwave Conference (EuMC), Sep 2025, Utrecht, Netherlands. pp.588-591, ⟨10.23919/EuMC65286.2025.11235077⟩ |
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Determination of EMI Shielding Efficiency of Graphene Composites with Silver Nanoparticles Prepared Under Low-dose Gamma Irradiation14th European Conference & Exhibition in Graphene and 2D Material (Graphene 2024), Jun 2024, Madrid, Spain |
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Microwave Imaging with Open-Ended Coaxial ProbesIEEE International Conference on Manipulation, Automation and Robotics at Small Scales, IEEE, Jul 2024, Delft, Netherlands |
[Invited] Key Factors in the Electromagnetic Interference Shielding by Graphene-Based Composites2024 IEEE Symposium on Wireless Technology & Applications (ISWTA), Jul 2024, Kuala Lumpur, Malaysia. pp.162-166, ⟨10.1109/ISWTA62130.2024.10651782⟩ |
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Twinning for graphene-based composites in EMI shieldingExcellMater Conference 2024, Apr 2024, Belgrade, Serbia. pp.79 |
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Technologie ultralarge bande appliquée aux systèmes à ondes millimétriques pour la géolocalisation basée sur la TDoAXXIII èmes Journées Nationales Microondes, Jun 2024, Antibes Juan-Les-Pins, France |
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Machine Learning-Based Microwave Techniques for Dielectric Material Classification2024 IEEE Symposium on Wireless Technology & Applications (ISWTA), Jul 2024, Kuala Lumpur, Malaysia. pp.250-253, ⟨10.1109/ISWTA62130.2024.10651951⟩ |
Multimodal Scanning Microwave and Electron Microscopy for nanoscale measurements under vacuum54th European Microwave Conference (EuMC), Sep 2024, Paris, France |
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Exploring Nanorobotics Integration with Microwave and Millimeter-Wave Techniques for Advanced On-wafer Measurement2024 5th International Conference in Electronic Engineering, Information Technology & Education (EEITE), May 2024, Chania, Greece. pp.1-6, ⟨10.1109/EEITE61750.2024.10654413⟩ |
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Nanorobotic Integration with Millimeter-Waves: Advancing Precise Free-Space Sensing2024 25th International Microwave and Radar Conference (MIKON), Jul 2024, Wroclaw, Poland. pp.324-326, ⟨10.23919/MIKON60251.2024.10633954⟩ |
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GrInShield for Graphene-Based Composites in Electromagnetic Interference Shielding2024 25th International Microwave and Radar Conference (MIKON), Jul 2024, Wroclaw, Poland. pp.318-320, ⟨10.23919/MIKON60251.2024.10633959⟩ |
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Near-Field Scanning Microwave Microscopy Simulation Using CST Microwave StudioIEEE MARSS 2023, IEEE International Conference on Manipulation, Automation and Robotics at Small Scales, Jul 2024, Delft, Netherlands |
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ELENA project – electrical nanoscale metrology in industry: key outcomesJournées Plénières GDR NAME 2024, Nov 2024, Lille (Villeneuve d'Ascq), France |
Exploring the Potential of Six-Port Technology in Microwave Nondestructive Testing: Current Status and Future Directions2024 International Conference on Electromagnetics in Advanced Applications (ICEAA), Sep 2024, Lisbon, Portugal. pp.752-753, ⟨10.1109/ICEAA61917.2024.10701996⟩ |
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On-Wafer TRL Calibration Design for Microwave Nanoscale and High Impedance Measurement2024 IEEE Symposium on Wireless Technology & Applications (ISWTA), Jul 2024, Kuala Lumpur, Malaysia. pp.260-263, ⟨10.1109/ISWTA62130.2024.10651788⟩ |
Automated and Robotic On-Wafer Probing Station2023 IEEE Symposium on Wireless Technology & Applications (ISWTA), Aug 2023, Kuala Lumpur, Malaysia. pp.99-102, ⟨10.1109/ISWTA58588.2023.10249964⟩ |
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Microwave Electromagnetic Shielding with Free-Standing Composites Based on Graphene Oxide and Silver Nanowires2023 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), Oct 2023, Abu Dhabi, United Arab Emirates. pp.1-6, ⟨10.1109/MARSS58567.2023.10294133⟩ |
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Impedance Standard Substrate EM-Simulation for On-Wafer GSG Probing2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Jun 2023, Winnipeg, Canada. pp.1-3, ⟨10.1109/NEMO56117.2023.10202375⟩ |
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Machine Learning-Based Monostatic Microwave Radar for Building Material Classification2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), May 2023, Kuala Lumpur, Malaysia. pp.1-5, ⟨10.1109/I2MTC53148.2023.10176071⟩ |
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Interlaboratory investigation of on-wafer S parameter measurements from 110 GHz to 1.1 THz53rd European Microwave Conference, EuMC 2023, Session EuMC31 - Calibration and deembedding, Sep 2023, Berlin, Germany |
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Plate-forme médicale intégrée à un simulateur immersif de conduiteCNRIUT 2023 Saint Pierre - La Réunion, IUT de Saint Pierre, Jun 2023, Saint Pierre (La Réunion), La Réunion |
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Plate-forme nano-robotique radar à 60 GHzCNRIUT 2023 Saint Pierre - La Réunion, IUT de Saint Pierre, Jun 2023, Saint Pierre (La Réunion), La Réunion |
Nanorobotics and Automatic On-Wafer Probe Station with Nanometer Positionning Accuracy2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Jun 2023, Winnipeg, Canada. pp.22-24, ⟨10.1109/NEMO56117.2023.10202165⟩ |
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Nanorobotics and automated platform for microwave characterization of liquids using coaxial evanescent probeNano, Meso, Micro: Science and Innovation for Radio and Photonic, URSI JS22, Mar 2022, Palaiseau, France. pp.46-52 |
Plate-forme robotisée et automatisée pour la caractérisation microonde par sonde coaxiale évanescente en milieu liquideXXIIèmes Journées Nationales Microondes, Jun 2022, Limoges, France |
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Measuring S-Parameters using millimetre-wave power measurementsEuropean Microwave Conference, EuMC 2021, Session WS09-EuMC – Workshop Research in Power and S-parameters Measurements at mmWave and Terahertz Frequencies, EuMIC/EuMC/EuMW, Apr 2022, London, United Kingdom |
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Calibration Six-Port Basée sur une Analyse de Fourier : Extension Record de 250% des Performances FréquentiellesXXIIèmes Journées Nationales Microondes, Jun 2022, Limoges, France |
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Mesures hyperfréquences ‘On-Wafer’ d’impédances extrêmes : Limitations et SolutionsXXIIèmes Journées Nationales Microondes, Jun 2022, Limoges, France |
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[Invited] Combined mm-Waves and Nanorobotics for Traceable Electronics TechnologyInternational Microwave Symposium, IMS2022, Workshop WMK: On-wafer mm-wave measurement, Jun 2022, Denver, CO, United States |
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[Invited workshop] MMAMA - Microwave Microscopy for Advanced and Efficient Materials AnalysisIEEE MTT-S International Conference on Electromagnetic and Multiphysics Modeling and Optimization (NEMO2022), Special Session WE3, Electromagnetic and Multiphysics Multiscale Modelling and Characterization for Advanced and Efficient Materials, IEEE, Jul 2022, Limoges, France |
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[Tutorial] Multiscale Microwave and Millimeter-Wave Nondestructive Testing and Evaluation2022 IEEE I2MTC, May 2022, Ottawa, Canada |
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A new faster filter based on optimizing the calculation burden of information and Kalman filters15th European/IFAC Workshop on Advanced Control and Diagnosis (ACD'2019), Nov 2019, Bologna, Italy. pp.453-467 |
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New Generation of On-Wafer Microwave Probe Station for Precision GSG Probing24th International Microwave and Radar Conference, MIKON 2022, Sep 2022, Gdansk, Poland |
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WR15 Six-port Interferometric Set-up for Millimeter-wave Characterization for Harsh Environments2022 Photonics & Electromagnetics Research Symposium (PIERS), Apr 2022, Hangzhou, China. pp.414-419, ⟨10.1109/PIERS55526.2022.9792652⟩ |
Aggregation of polymeric polysaccharide-based nanoparticles as a challenge in microwave tomography targetting breast cancer24th International Microwave and Radar Conference, MIKON 2022, Sep 2022, Gdansk, Poland |
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Instrumentation avancée pour la modélisation et la caractérisation multi-échellesColloque LN2 2022, Jul 2022, Balcons du lac d’Annecy, Sévrier, France |
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[Invited] Microwave Sensing in the Modern Society2022 IEEE Radio and Wireless Symposium, RWW2022, Jan 2022, Las Vegas, United States |
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Sub-nanosecond pulse technology applied to millimetre wave systems for TDoA-based geolocalization2022 IEEE Topical Conference on Wireless Sensors and Sensor Networks (WiSNeT), Jan 2022, Las Vegas, United States. pp.50-53, ⟨10.1109/WiSNet53095.2022.9721359⟩ |
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[Workshop] Nanorobotics automated on-wafer probing station for millimeter-wave coplanar waveguide (CPW) S-parameters measurement2022 17th European Microwave Integrated Circuits Conference (EuMIC), Sep 2022, Milan, Italy. Workshop Recent developments in millimetre-wave measurement: S-parameters and material properties |
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[Invited workshop] Nanorobotic On-Wafer Probe Station Under Scanning Electron Microscope15th European Microwave Week - Workshop Measurements at mmWave and Terahertz Frequencies of Three Measurement Quantities: S-Parameters, Power, and Complex Permittivity of Dielectric Materials, Jan 2021, Utrecht, Netherlands |
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Impact of GSG probe to pads contact repeatability for on-wafer RF measurementsIEEE 7th International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA 2021), Session 4A: Medical Instrumentation, Aug 2021, Bandung, Indonesia. pp.241-246, ⟨10.1109/ICSIMA50015.2021.9526303⟩ |
Extend IQ Six-Port Demodulator RF Bandwidth by 250% Using Fourier Based Modelling2021 IEEE Conference on Antenna Measurements & Applications (CAMA), Nov 2021, Antibes Juan-les-Pins, France. pp.284-288, ⟨10.1109/CAMA49227.2021.9703607⟩ |
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Nano-Positioning Test platform for Free-Space Six-Port Interferometric Distance MeasurementsInternational Conference on Antenna Measurements and Applications, CAMA 2021, Nov 2021, Antibes Juan-les-Pins, France. ⟨10.1109/CAMA49227.2021.9703650⟩ |
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Quadratic detection-based millimeter-wave MMIC for TDoA and AoA measurement2021 International Conference on Electromagnetics in Advanced Applications (ICEAA), Aug 2021, Honolulu, United States. pp.321-324, ⟨10.1109/ICEAA52647.2021.9539767⟩ |
Identification of Sources of Uncertainties in CW Microwave Noncontact Vital Sign MeasurementInternational Conference on Antenna Measurements and Applications, CAMA 2021, Nov 2021, Antibes Juan-les-Pins, France. pp.614-617, ⟨10.1109/CAMA49227.2021.9703622⟩ |
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RF and Six-Port Microwave Sensing Techniques for Nondestructive Testing and Evaluation2021 International Conference on Electromagnetics in Advanced Applications (ICEAA), Aug 2021, Honolulu, United States. pp.320-320, ⟨10.1109/ICEAA52647.2021.9539773⟩ |
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Quadratic detection-based millimeter-wave MMIC for wireless communication and localization2021 International Symposium on Networks, Computers and Communications (ISNCC), Session A10 - Signals and Communication Systems, Oct 2021, Dubai (virtual), United Arab Emirates. pp.1-5, ⟨10.1109/ISNCC52172.2021.9615694⟩ |
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Fast and Real-Time Sensor-Fault Detection using Shannon’s Entropy5th International Conference on Control and Fault-Tolerant Systems, Sep 2021, Saint-Raphaël, France. pp.273-278, ⟨10.1109/SysTol52990.2021.9595413⟩ |
Proof-of-concept millimeter-wave free-space nondestructive testing implemented on collaborative mobile robotsInternational Workshop on Metrology for Industry 4.0 & IoT 2020, MetroInd4.0&IoT 2020, Jun 2020, Roma, Italy. pp.354-359, ⟨10.1109/MetroInd4.0IoT48571.2020.9138237⟩ |
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Operation of near-field scanning millimeter-wave microscopy up to 67 GHz under scanning electron microscopy visionIEEE MTT International Microwave Symposium, IMS 2020, Aug 2020, Los Angeles (On-line event), United States. pp.95-98, ⟨10.1109/IMS30576.2020.9224090⟩ |
A 60-GHz six-port system for localization based on time difference of arrivalIEEE Radio and Wireless Symposium, RWS 2019, Jan 2019, Orlando, FL, United States. pp.513-516, ⟨10.1109/RWS.2019.8714390⟩ |
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Building a near-field scanning millimeter-wave microscope integrated in a scanning electron microscopeInternational Conference on Manipulation, Automation, and Robotics at Small Scales, MARSS 2019, Jul 2019, Helsinki, Finland. 3 p |
Combined Atomic, Microwave and Electron Microscope: A tool for Hybrid Characterization of Nanomaterials49th European Microwave Conference (EuMC), Sep 2019, Paris, France. ⟨10.5281/zenodo.3550534⟩ |
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RF and microwave sensing methods and instruments for nondestructive testing and evaluation2nd International Seminar on Environmental Sustainability, Disaster Prevention and Reduction, and Engineering Education, ESDPR&EE 2019, Jan 2019, Gifu, Japan. 13 p |
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Six-port technology for millimeter-wave metrology6th IEEE-Antennas-and-Propagation-Society (IEEE AP-S) Topical Meeting on Antenna Measurements & Applications (CAMA), Oct 2019, Bali, Indonesia. pp.81-84, ⟨10.1109/CAMA47423.2019.8959806⟩ |
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Contrôle non destructif d’une structure à partir d’un capteur bi-statique micro-ondes embarqué sur robots mobiles collaboratifsXXIèmes Journées Nationales Microondes (IEEE), May 2019, Caen, France |
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Robots mobiles collaboratifs pour le contrôle non destructif hyperfréquence de structures planairesColloque international Télécom’2019 & 11èmes JFMMA, Jun 2019, Saïda, Maroc |
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Multiport Vector Network Analyzer Configured in RF Interferometric Mode for Reference Impedance Renormalization2019 IEEE/MTT-S International Microwave Symposium - IMS 2019, Jun 2019, Boston, France. pp.1276-1278, ⟨10.1109/MWSYM.2019.8700783⟩ |
Using an adaptive entropy-based threshold for change detection methods – Application to fault-tolerant fusion in collaborative mobile robotics2019 6th International Conference on Control, Decision and Information Technologies (CoDIT), Apr 2019, Paris, France. pp.1173-1178, ⟨10.1109/CoDIT.2019.8820667⟩ |
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An adaptive threshold for change detection methods using a windowed entropy-based criterion - Application to fault-tolerant fusion in collaborative mobile robotics2019 4th Conference on Control and Fault Tolerant Systems (SysTol), Sep 2019, Casablanca, Morocco. pp.56-61, ⟨10.1109/SYSTOL.2019.8864768⟩ |
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An adaptive threshold for change detection methods using an entropy criterion - Application to fault-tolerant fusion in mobile robotics1st International Conference on Advances in Signal Processing and Artificial Intelligence, ASPAI’2019 (IFSA), Mar 2019, Barcelona, Spain. pp.93-97 |
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Contrôle non destructif par capteur bi-statique micro-ondes embarqué sur robots mobiles collaboratifsJournées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2019), Jun 2019, Montpellier, France |
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Interféromètre six-port intégré en bande V pour applications radar et communicationsTELECOM'2019 & 11èmes Journées Franco-Maghrébines des Micro-ondes et leurs Applications, Jun 2019, Saïdia, Maroc |
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Développement de solutions hyperfréquences pour la société moderne: bio-radar et microscopie électromagnétique15èmes Journées Pédagogiques du CNFM, JPCNFM 2018, Nov 2018, Saint-Malo, France. 1013, 9 p., ⟨10.1051/j3ea/20191013⟩ |
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Quantitative Error Analysis in Near-Field Scanning Microwave Microscopy2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), Jul 2018, Nagoya, Japan. ⟨10.1109/MARSS.2018.8481160⟩ |
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On-Wafer Broadband Microwave Measurement of High impedance Devices-CPW Test Structures with Integrated Metallic Nano-resistances2018 48th European Microwave Conference (EuMC), Sep 2018, Madrid, Spain. pp.25-28, ⟨10.23919/EuMC.2018.8541607⟩ |
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Scanning microwave microscopy of vital mitochondria in respiration bufferIEEE/MTT-S International Microwave Symposium, IMS 2018, Jun 2018, Philadelphia, PA, United States. pp.115-118, ⟨10.1109/MWSYM.2018.8439645⟩ |
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Electromagnetic Modeling in Near-Field Scanning Microwave Microscopy Highlighting Limitations in Spatial and Electrical Resolutions2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Aug 2018, Reykjavik, Iceland. pp.1-4, ⟨10.1109/NEMO.2018.8503487⟩ |
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Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), Jul 2018, Paris, France. pp.1-2, ⟨10.1109/CPEM.2018.8500810⟩ |
[Review] A review of the six-port technique for metrology applications2018 22nd International Microwave and Radar Conference (MIKON), May 2018, Poznan, Poland. ⟨10.23919/MIKON.2018.8405340⟩ |
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Six-Port Technology for 5G Millimeter-Wave Localization Systems2018 International Conference on Electromagnetics in Advanced Applications (ICEAA), Sep 2018, Cartagena des Indias, Colombia. pp.272-275, ⟨10.1109/ICEAA.2018.8520353⟩ |
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Six-Port Reflectometer in WR15 Metallic Waveguide for Free-Space Sensing Applications2018 IEEE Topical Conference on Wireless Sensors and Sensor Networks (WiSNet 2018), Jan 2018, Anaheim, United States |
Device-free human activity microwave detectionIEEE Topical Conference on Wireless Sensors and Sensor Networks, WiSNet 2018, Jan 2018, Anaheim, CA, Canada. pp.38-40, ⟨10.1109/WISNET.2018.8311558⟩ |
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[Invited] SMM characterization of Au nanodots and FcC11SH moleculesXX Annual Linz Winter Workshop, Advances in Single-Molecule Research for Biology & Nanoscience, Feb 2018, Linz, Austria |
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Memristor Device Characterization by Scanning Microwave MicroscopyInternational Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), Jul 2017, Montréal, Canada. ⟨10.1109/MARSS.2017.8016537⟩ |
Quantitative determination of small dielectric and loss tangent contrasts in liquidsIEEE International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2017, May 2017, Torino, Italy. pp.909-914, ⟨10.1109/I2MTC.2017.7969796⟩ |
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Pilotage de nano-manipulateurs – Application à la nanocaractérisation électriqueCongrès National de la Recherche en IUT (CNRIUT’2017), May 2017, Auxerre, France |
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Combined scanning microwave and electron microscopy: a novel toolbox for hybrid nanoscale material analysisIEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes, IMWS-AMP 2017, Sep 2017, Pavia, Italy. 3 p., ⟨10.1109/IMWS-AMP.2017.8247419⟩ |
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Near-Field Scanning Millimeter-wave Microscope Combined with a Scanning Electron MicroscopeIEEE-Microwave-Theory-and-Techniques-Society International Microwave Symposium, IMS 2017, Jun 2017, Honolulu, HI, United States. pp.1656-1659 |
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Nano-probing station incorporating MEMS probes for 1D device RF on-wafer characterization2017 47th European Microwave Conference (EuMC), Oct 2017, Nuremberg, Germany. ⟨10.23919/EuMC.2017.8230973⟩ |
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Development of a reference wafer for on-wafer testing of extreme impedance devices88th ARFTG Microwave Measurement Symposium, ARFTG 2016, Dec 2016, Austin, United States. 4 p., ⟨10.1109/ARFTG.2016.7839719⟩ |
Sensitivity and Accuracy Analysis in Scanning Microwave MicroscopyIEEE MTT-S International Microwave Symposium, IMS 2016, May 2016, San Francisco, CA, United States. 4 p., ⟨10.1109/MWSYM.2016.7540188⟩ |
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65 nm SOI CMOS 60 GHz passive mixer for six-port technologyIEEE Topical Conference on Wireless Sensors and Sensor Networks, WiSNet 2016, Jan 2016, Austin, TX, United States. pp.52-55, ⟨10.1109/WISNET.2016.7444320⟩ |
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RF wafer probing with improved contact repeatability using nanometer positioning2016 87th ARFTG Microwave Measurement Conference (ARFTG), May 2016, San Francisco, United States. pp.1-4, ⟨10.1109/ARFTG.2016.7501967⟩ |
Millimeter-wave six-port IQ demodulator in 65 nm SOI CMOS technology30th International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2016, May 2016, Taipei, Taiwan. pp.375-379, ⟨10.1109/I2MTC.2016.7520391⟩ |
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Nanorobotic RF probe station for calibrated on-wafer measurements2015 European Microwave Conference (EuMC 2015), Sep 2015, Paris, France. pp.163-166, ⟨10.1109/EuMC.2015.7345725⟩ |
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Measurement Accuracy and Repeatability in Near-Field Scanning Microwave MicroscopyIEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015, IEEE, May 2015, Pisa, Italie. pp.1735-1740, ⟨10.1109/I2MTC.2015.7151542⟩ |
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Forward V-band Vector Network Analyzer Based on a Modified Six-port Technique2015 IEEE Topical Conference on Wireless Sensors and Sensor Networks, WiSNet 2015, 9th IEEE Radio & Wireless Week, RWW 2015, Jan 2015, San Diego, CA, États-Unis. pp.23-25, ⟨10.1109/WISNET.2015.7127400⟩ |
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Dielectric Properties Extraction of Coplanar Propagation Waveguides on High Resistivity Silicon SubstratesInternational Conference on Mechatronics, Electronic, Industrial and Control Engineering (MEIC), Apr 2015, Shenyang, PEOPLES R, China. pp.539-542 |
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MEMS-based RF probes for on-wafer microwave characterization of micro/nanoelectronics2015 28th IEEE International Conference on Micro Electro Mechanical Systems (MEMS), Jan 2015, Estoril, Portugal. pp.1012-1015, ⟨10.1109/MEMSYS.2015.7051133⟩ |
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Near-field scanning microwave microscope for subsurface non-destructive characterization45th European Microwave Conference (EuMC), Sep 2015, Paris, France. pp.155-158, ⟨10.1109/EuMC.2015.7345723⟩ |
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Robotic on-wafer probe station for microwave characterization in a scanning electron microscope2015 IEEE MTT-S International Microwave Symposium (IMS2015), May 2015, Phoenix, Arizona, United States. pp.1-3, ⟨10.1109/MWSYM.2015.7166970⟩ |
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On-wafer probe station for microwave metrology at the nanoscale2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), May 2015, Pisa, Italy. pp.1960-1964, ⟨10.1109/I2MTC.2015.7151582⟩ |
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Sub-10 nm-scale capacitors and tunnel junctions measurements by SMM coupled to RF interferometry45th European Microwave Conference EuMC 2015, Sep 2015, Paris, France. ⟨10.1109/EuMC.2015.7345849⟩ |
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CW Radar for Monitoring Water-to-Cellular Concrete44th European Microwave Conference (EuMC), Oct 2014, Rome, Italie. pp.1832-1835 |
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Microscopie champ proche micro-ondes pour la caractérisation de liquides17èmes Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique, JNRDM 2014, 2014, Villeneuve d'Ascq, France. 4 p |
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Miniaturized MEMS-based GSG probes for microwave characterization2014 44th European Microwave Conference (EuMC), Oct 2014, Rome, Italy. pp.1150-1153, ⟨10.1109/EuMC.2014.6986644⟩ |
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Six-port technology for millimeter-wave radar and imaging applicationsIEEE Topical Conference on Wireless Sensors and Sensor Networks, WiSNet 2014, 9th Annual IEEE Radio Wireless Week, RWW 2014, 2014, Newport Beach, CA, United States. paper WE1A-1, 3 p., ⟨10.1109/WiSNet.2014.6825508⟩ |
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1 – 20 GHz kΩ -range BiCMOS 55 nm ReflectometerIEEE International New Circuits and Systems Conference (NEWCAS), Jun 2014, Trois-Rivieres, QC, Canada. ⟨10.1109/NEWCAS.2014.6934063⟩ |
Near-field Microwave Microscopy for Liquid Characterization44th European Microwave Conference (EuMC), Oct 2014, Rome, Italie. pp.628--631 |
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1-20 GHz k Omega-range BiCMOS 55 nm Reflectometer12th IEEE International New Circuits and Systems Conference (IEEE NEWCAS), Jun 2014, Trois-Rivieres, Canada. pp.385-388 |
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Three-paths microwave interferometric system based on a six-port technique10th European Radar Conference, EuRAD 2013, and 43rd European Microwave Conference, EuMC 2013, European Microwave Week 2013, 2013, Nuremberg, Germany. paper EuMC/EuRAD02-5, 291-294 |
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Microwave microscopy platform for measurement in liquids and moist materials10th International Conference on Electromagnetic Wave Interaction with Water and Moist Substances, 2013, Weimar, Germany. pp.80-85 |
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High frequency characterization at the nanoscale4th China-French Symposium on Functional Materials and Devices, 2013, Shanghai, China |
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Three-Paths Microwave Inteferometric System Based on a Six-Port technique43rd European Microwave Conference (EuMC), Oct 2013, Nuremberg, Allemagne. pp.1603-1606 |
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Broadband microwave interferometry for non destructive evaluation13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII, 2013, Le Mans, France. paper 15526, 10 p |
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Interferometric technique for scanning near-field microwave microscopy applicationsIEEE International Instrumentation and Measurement Technology Conference, I2MTC 2013, 2013, Minneapolis, MN, United States. pp.1694-1698, ⟨10.1109/I2MTC.2013.6555703⟩ |
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Technique interférométrique pour la caractérisation diélectrique en milieu liquide par ligne coaxiale ouverteTELECOM'2013 and 8èmes Journées Franco-Maghrébines des Micro-ondes et leurs Applications, 2013, Marrakech, Maroc. papier 266, 1-4 |
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Technique multi-port pour la microscopie champ proche microonde2èmes Journées de Caractérisation Microondes et Matériaux, JCMM 2012, 2012, Chambéry, France. session S8, papier ID18, 1-4 |
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Interferometric technique for microwave measurement of high impedances60th IEEE MTT-S International Microwave Symposium, IMS 2012, 2012, Montréal, Canada. pp.1-3, ⟨10.1109/MWSYM.2012.6259554⟩ |
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The multi-port technology for microwave sensing applications60th IEEE MTT-S International Microwave Symposium, IMS 2012, 2012, Montréal, Canada. pp.1-3, ⟨10.1109/MWSYM.2012.6258266⟩ |
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[Invited] High frequency characterization of nanotechnologies : toward new instrumentations and techniques36th Workshop on Compound Semiconductor Devices and Integrated Circuits, WOCSDICE 2012, 2012, Porquerolles, France. pp.1-4 |
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V-band two-tone continuous wave radar operating in monostatic/bistatic mode9th European Radar Conference, EuRAD 2012, 2012, Amsterdam, Netherlands. pp.266-269 |
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Microscopie hyperfréquence champ proche en transmission pour la caractérisation diélectrique locale15èmes Journées Nationales du Réseau Doctoral en Micro-nanoélectronique, JNRDM 2012, 2012, Marseille, France. pp.1-4 |
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Instrumentation hyperfréquence dédiée à la caractérisation diélectrique en environnement intra-bâtiment17èmes Journées Nationales Micro-ondes, JNM 2011, 2011, Brest, France. papier 130, 2F7, 1-4 |
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Wide-band near-field microwave microscope operating in transmission-mode5th International Conference on Electromagnetic Near-Field Characterization and Imaging, ICONIC 2011, 2011, Rouen, France. CDROM, paper 2A, 1-5, 2nd Best paper award |
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Near-field scanning microscopy in liquid media based on microwave interferometry9th International Conference on Electromagnetic Wave Interaction with Water and Moist Substances, ISEMA 2011, 2011, United States. pp.185-192 |
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Miniature interferometric down-converter for V-band radar applications8th European Radar Conference, EuRAD 2011, 2011, Manchester, United Kingdom. pp.29-32 |
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Nouvelle topologie quatre-port pour la mesure large bande de coefficients de réflexion en gamme micro-onde17èmes Journées Nationales Micro-ondes, JNM 2011, 2011, Brest, France. papier 55, 2F3, 1-4 |
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Microscope pour l'imagerie activeTELECOM'2011 & 7èmes Journées Franco-Maghrébines des Micro-ondes et leurs Applications, 2011, Maroc. CDROM, session A2, papier 55, 1-4 |
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High impedance RF four-port reflectometer41st European Microwave Conference, EuMC 2011, 2011, Manchester, United Kingdom. pp.491-494 |
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Compact near-field microwave microscope based on the multi-port technique40th European Microwave Conference, EuMC 2010, 2010, France. pp.771-774 |
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Miniature dual six-port millimeter-wave network analyzer on alumina ceramic substrate40th European Microwave Conference, EuMC 2010, 2010, France. pp.1564-1567 |
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GHz characterization of carbon nanotube devicesEuropean Microwave Week Workshops and Short Courses, Microwave Nanocharacterisation : Challenges and Breakthroughs, 2010, Paris, France |
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Double réflectomètre millimétrique six-port16èmes Journées Nationales Microondes, JNM 2009, 2009, France. pp.6D-7, 1-4 |
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Systèmes multi-port hyperfréquences et techniques de calibrage associéesAssemblée Générale du GDR Interférences d'Ondes, 2009, Châtillon, France. pp.218-219 |
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Ku-band filters and diplexers with rounded corners in waveguide technology1st International Conference on Image and Signal Processing and their Applications, ISPA 2009, 2009, Mostaganem, Algeria |
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Free-space microwave moisture content evaluation by means of a low-cost four-port based reflectometer8th International Conference on Electromagnetic Wave Interaction with Water and Moist Substances, ISEMA 2009, 2009, Finland. pp.63-70 |
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Conception et réalisation d'une transition en paliers et d'un filtre micro-onde inductif en technologie SIW 'Substrate Integrated WaveguideTELECOM'2009 & 6èmes Journées Franco-Maghrébines des Micro-ondes et leurs Applications, 2009, Maroc. pp.A3-5, 1-4 |
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Technique d'imagerie à ondes évanescentes basée sur la réflectométrie six-port à 35 GHz16èmes Journées Nationales Microondes, JNM 2009, 2009, France. pp.6D-3, 1-4 |
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Analyseur de réseaux millimétrique six-port et calibrage associéTELECOM'2009 & 6èmes Journées Franco-Maghrébines des Micro-ondes et leurs Applications, 2009, Maroc. pp.A4-3, 1-4 |
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Six-port based near-field millimeter-wave microscope using a slit scanning probe4th International Conference on Electromagnetic Near-Field Characterization and Imaging, ICONIC 2009, 2009, Taiwan. pp.17-22, Honorable Award |
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Inductive-post filter with stepped transitions around 5 GHz for substrate integrated waveguide1st International Conference on Image and Signal Processing and their Applications, ISPA 2009, 2009, Mostaganem, Algeria |
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Ultra wide-band four-port reflectometer using only two quadratic detectorsIEEE MTT-S International Microwave Symposium, IMS 2008, 2008, United States. pp.379-382, ⟨10.1109/MWSYM.2008.4633182⟩ |
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Développement d'une technique de calibrage pour la mesure bistatique en espace libre sans filtrage temporelTELECOM'2007 & 5èmes Journées Franco-Maghrébines des Micro-ondes et leurs Applications, 2007, Maroc. pp.147-150 |
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Evaluation non destructive micro-onde à base de réseaux de neurones artificiels : application au génie civilTELECOM'2007 & 5èmes Journées Franco-Maghrébines des Micro-ondes et leurs Applications, 2007, Maroc. pp.161-164 |
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Technique de mesure bistatique en espace libre s'affranchissant du filtrage temporel et des antennes à faisceaux focalisés : application à la caractérisation de matériaux épais15èmes Journées Nationales Microondes, JNM 2007, 2007, France. pp.3A3-1-4 |
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A vector coding technique using evanescent microwaves3rd International Conference on Electromagnetic Near-Field Characterization and Imaging, ICONIC 2007, 2007, United States. pp.63-68 |
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Homodyne dual six-port network analyzer and associated calibration technique for millimeter wave measurement2006, 4 pp |
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A fully InP monolithic integrated millimeter-wave reflectometer2006, pp.703-706 |
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Développement d'une technique de calibrage adaptatif pour la mesure de paramètres S en gamme millimétriqueActes des 4èmes Journées Franco-Maghrébines des Microondes et leurs Applications, 2005, Rabat, Maroc |
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Système et technique de calibrage associée pour la mesure de paramètre S à 60 GHzActes des 14èmes Journées Nationales Microondes, 2005, Nantes, France |
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Systems conception and adaptative calibration technique for S-parameters measurement at 35 GHz2004, pp.Session 4A |
ELENA : a European project for electrical nanoscale metrology in industry24ème Forum des Microscopies à sonde locale, Apr 2023, Obernai (Alsace), France |
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A near-field scanning microwave microscope in a scanning electron microscope: design and challenges21st International Scanning Probe Microscopy, May 2019, Louvain la Neuve, France |
Approches informationnelles pour la fusion tolérante aux fautes – Application à la robotique mobile5ème Journée Régionale des Doctorants en Automatique, Jul 2018, Amiens, France |
Étonnante physiqueSéverine Martrenchard. CNRS Éditions, pp.422, 2023, 9782271148902 |
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CW Radar for Monitoring Water-to-Cellular Concretepp.529-532, 2014, European Radar Conference EuRAD, 978-2-87487-037-8. ⟨10.1109/EuRAD.2014.6991324⟩ |
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Control and automation for miniaturized microwave GSG nanoprobingMachine Vision and Navigation, Springer International Publishing, pp.751-768, 2020, ⟨10.1007/978-3-030-22587-2_24⟩ |
[Tutorial] Microfabrication of THz on-wafer calibration kits and nanorobotics on-wafer probing stationTEMMT Project Training Courses, 2022 |
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Systèmes à base de six-port en gammes micro-onde et millimétrique et techniques de calibrage associées : application à l'analyse de réseaux, aux télécommunications et au contrôle non destructif2007 |