KZ

Khatir Zoubir

139
Documents

Présentation

Publications

Publications

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Thermal Fatigue Effect on the Grain Groove Profile in the Case of Diffusion in Thin Polycrystalline Films of Power Electronic Devices

Tayssir Hamieh , Ali Ibrahim , Zoubir Khatir
Micromachines, 2023, 14 (9), pp.1781. ⟨10.3390/mi14091781⟩
Article dans une revue hal-04209549 v1
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New model of crack propagation of aluminium wire bonds in IGBT power modules under low temperature variations

Ayda Halouani , Zoubir Khatir , R. Lallemand , Ali Ibrahim , Nicolas Degrenne
Microelectronics Reliability, 2023, 147, pp.115066. ⟨10.1016/j.microrel.2023.115066⟩
Article dans une revue hal-04154649 v1
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Thermal Stress Analysis Comparison in IGBT Power Modules between DC and switching Power Cycling

Zoubir Khatir , Richard Lallemand , Ali Ibrahim , Damien Ingrosso
IEEE Transactions on Power Electronics, 2023, 38 (9), ⟨10.1109/TPEL.2023.3289890⟩
Article dans une revue hal-04154662 v1

Finite elements analyses of early-stage crack propagation in aluminum wire bonds due to power cycling

A Halouani , Mustafa Shqair , Zoubir Khatir , A Ibrahim , M Ouhab
Microelectronics Reliability, 2022, 138, pp.114610. ⟨10.1016/j.microrel.2022.114610⟩
Article dans une revue hal-04102314 v1
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An EBSD Study of Fatigue Crack Propagation in Bonded Aluminum Wires Cycled from 55°C to 85°C

Ayda Halouani , Zoubir Khatir , Mustafa Shqair , Ali Ibrahim , Pierre-Yves Pichon
Journal of Electronic Materials, 2022, 51 (12), pp.7353-7365. ⟨10.1007/s11664-022-09937-5⟩
Article dans une revue hal-04036851 v1

A Reduced Model Based on Proper Generalized Decomposition for the Fast Analysis of IGBT Power Modules Lifetime

Louis Schuler , Ludovic Chamoin , Zoubir Khatir , Mounira Bouarroudj-Berkani , Merouane Ouhab et al.
Journal of Electronic Packaging, 2022, 144 (3), ⟨10.1115/1.4053767⟩
Article dans une revue hal-03695544 v1
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A combined physicochemical-microstructural approach to predict the crack path at the topside interconnections in IGBT power devices

Mustafa Shqair , Zoubir Khatir , Ali Ibrahim , Mounira Bouarroudj-Berkani , Ayda Halouani et al.
Microelectronics Reliability, 2022, 132, pp.114516. ⟨10.1016/j.microrel.2022.114516⟩
Article dans une revue hal-03656143 v1
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Microstructural evolution during the crack propagation at the bond-wire contact area of IGBT power modules upon power cycling

Mustafa Shqair , Zoubir Khatir , Ali Ibrahim , Ayda Halouani , Mounira Bouarroudj-Berkani
Microelectronics Reliability, 2022, ⟨10.1016/j.microrel.2022.114635⟩
Article dans une revue hal-03788643 v1

Iterative PGD model reduction for the strongly-coupled thermomechanical analysis of crack propagation in power electronic modules

Louis Schuler , Ludovic Chamoin , Zoubir Khatir , Mounira Bouarroudj-Berkani , Merouane Ouhab et al.
Computational Mechanics, 2022, 70, pp.407-424. ⟨10.1007/s00466-022-02173-y⟩
Article dans une revue hal-03656142 v1
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Effect of load sequence interaction on bond-wire lifetime due to power cycling

Zoubir Khatir , Son-Ha Tran , Ali Ibrahim , Richard Lallemand , Nicolas Degrenne
Scientific Reports, 2021, 11, pp.5601. ⟨10.1038/s41598-021-84976-2⟩
Article dans une revue hal-03173035 v1

Thermal mapping at the cell level of chips in power modules through the silicone gel using thermoreflectance

Youssef Metayrek , Thierry Kociniewski , Zoubir Khatir
Microelectronics Reliability, 2020, 105, ⟨10.1016/j.microrel.2019.113563⟩
Article dans une revue hal-03151482 v1
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Thermal behaviour evolution of an IGBT module after aging measured by thermoreflectance

Youssef Metayrek , Thierry Kociniewski , Zoubir Khatir
Microelectronics Reliability, 2020, 114, ⟨10.1016/j.microrel.2020.113843⟩
Article dans une revue hal-03151313 v1
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Using of Bond-Wire Resistance as Ageing Indicator of Semiconductor Power Modules

Ali Ibrahim , Zoubir Khatir , Jean-Pierre Ousten , Richard Lallemand , Stefan V. Mollov et al.
Microelectronics Reliability, 2020, Microelectronics Reliability, 114, ⟨10.1016/j.microrel.2020.113757⟩
Article dans une revue hal-03153283 v1
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Wire-bond contact degradation modeling for remaining useful lifetime prognosis of IGBT power modules

M Nazar , Ali Ibrahim , Zoubir Khatir , Nicolas Degrenne , Z Al-Masry
Microelectronics Reliability, 2020, 114, ⟨10.1016/j.microrel.2020.113824⟩
Article dans une revue hal-03150944 v1

Analysis of the aging mechanism occurring at the bond-wire contact of IGBT power devices during power cycling

Nausicaa Dornic , Ali Ibrahim , Zoubir Khatir , N. Degrenne , S. Mollov et al.
Microelectronics Reliability, 2020, 114, pp.113873. ⟨10.1016/j.microrel.2020.113873⟩
Article dans une revue hal-03271785 v1
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New solution of the partial differential equation of the grain groove profile problem in the case of evaporation/condensation

Hamieh Tayssir , Zoubir Khatir , Ali Ibrahim
Scientific Reports, 2019, 17 p. ⟨10.1038/s41598-019-46537-6⟩
Article dans une revue hal-02186758 v1

Constant ΔTj Power Cycling Strategy in DC Mode for Top-Metal and Bond-Wire Contacts Degradation Investigations

Son-Ha Tran , Zoubir Khatir , Richard Lallemand , Ali Ibrahim , Jean Pierre Ousten et al.
IEEE Transactions on Power Electronics, 2019, 34 (3), pp.2171-2180. ⟨10.1109/TPEL.2018.2847234⟩
Article dans une revue hal-02195018 v1
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Stress-based Model for Lifetime Estimation of Bond-Wire Contacts using Power Cycling Tests and Finite Element Modelling

Nausicaa Dornic , Zoubir Khatir , Son-Ha Tran , Ali Ibrahim , Richard Lallemand et al.
IEEE Journal of Emerging and Selected Topics in Power Electronics, 2019, 8 p. ⟨10.1109/JESTPE.2019.2918941⟩
Article dans une revue hal-02186162 v1

New Analytical Model for Real-Time Junction Temperature Estimation of Multichip Power Module Used in a Motor Drive

Merouane Ouhab , Zoubir Khatir , Ali Ibrahim , Jean Pierre Ousten , Radoslava Mitova et al.
IEEE Transactions on Power Electronics, 2018, 33 (6), pp.5292 - 5301. ⟨10.1109/TPEL.2017.2736534⟩
Article dans une revue hal-01723547 v1
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Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling

Nausicaa Dornic , Ali Ibrahim , Zoubir Khatir , Sh Tran , Jean Pierre Ousten et al.
Microelectronics Reliability, 2018, 88, p. 462 - 469. ⟨10.1016/j.microrel.2018.07.041⟩
Article dans une revue hal-02090201 v1

Theoretical investigation of the charges weight between interface and oxygen traps in barrier layer on the 2DEG density of Al2O3/AlGaN/GaN HEMTs

Fadi Zaki , Zoubir Khatir , R Escoffier , Ali Ibrahim
Journal of Computational Electronics, 2018, 17 (3), pp.1220-1228. ⟨10.1007/s10825-018-1186-9⟩
Article dans une revue hal-01815391 v1
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Analytical Solutions to the Problem of the Grain Groove Profile

Tayssir Hamieh , Zoubir Khatir , Ali Ibrahim
Nanoscience & Technology: Open Access, 2018, ⟨10.15226/2374-8141/5/2/00157⟩
Article dans une revue hal-02093930 v1

Effect of power cycling tests on traps under the gate of Al2O3/AlGaN/GaN normally-ON devices

Malika Elharizi , Fadi Zaki , Ali Ibrahim , Zoubir Khatir , Jean Pierre Ousten
Microelectronics Reliability, 2018, 88-90, pp. 671-676. ⟨10.1016/j.microrel.2018.07.070⟩
Article dans une revue hal-02093634 v1

Regenerative braking modeling, control and simulation of a hybrid energy storage system for an electric vehicle in extreme conditions

Khaled Itani , Alexandre de Bernardinis , Zoubir Khatir , Ahmad Jammal , Mohamad Oueidat
IEEE Transactions on Transportation Electrification, 2017, 2 (4), pp.465-479. ⟨10.1109/TTE.2016.2608763⟩
Article dans une revue hal-01671543 v1

Comparative analysis of two hybrid energy storage systems used in a two front wheel driven electric vehicle during extreme start-up and regenerative braking operations

Khaled Itani , Alexandre de Bernardinis , Zoubir Khatir , Ahmad Jammal
Energy Conversion and Management, 2017, 144, pp.69-87. ⟨10.1016/j.enconman.2017.04.036⟩
Article dans une revue hal-01671565 v1
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Electrothermal evaluation of single and multiple solder void effects on low-voltage Si MOSFET behavior in forward bias conditions

Son Ha Tran , Laurent Dupont , Zoubir Khatir
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2017, 99, ⟨10.1109/TCPMT.2016.2633582⟩
Article dans une revue hal-01466016 v1

Numerical and Experimental Evaluation of the Microsecond Pulsed Heating Curve Technique Dedicated to Die Interconnection Characterization

Benoit Thollin , Laurent Dupont , Yvan Avenas , Jean Christophe Crebier , Zoubir Khatir
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2016, 6 (6), pp. 835-45. ⟨10.1109/TCPMT.2016.2554538⟩
Article dans une revue hal-01466101 v1

Power Cycling Issues and Challenges of SiC-MOSFET Power Modules in High Temperature Conditions

Ali Ibrahim , Jean-Pierre Ousten , Richard Lallemand , Zoubir Khatir
Microelectronics Reliability, 2016, 58 (3), pp.204-210. ⟨10.1016/j.microrel.2015.11.030⟩
Article dans une revue hal-01671546 v1

Comparison between two braking control methods integrating energy recovery for a two-wheel front driven electric vehicle

Khaled Itani , Alexandre de Bernardinis , Zoubir Khatir , Ahmad Jammal
Energy Conversion and Management, 2016, 122, pp.330-343. ⟨10.1016/j.enconman.2016.05.094⟩
Article dans une revue hal-01671550 v1

Influence of repetitions of short-circuit conditions on IGBT lifetime

Frédéric Saint-Eve , Stéphane Lefebvre , Zoubir Khatir
EPE Journal - European Power Electronics and Drives, 2015, 15 (4), pp.7-12. ⟨10.1080/09398368.2005.11463598⟩
Article dans une revue hal-04154603 v1

A review on DC/DC converter architectures for power fuel cell applications

Abdelfatah Kolli , Arnaud Gaillard , Alexandre de Bernardinis , Olivier Béthoux , Daniel Hissel et al.
Energy Conversion and Management, 2015, 105, pp.716-730. ⟨10.1016/j.enconman.2015.07.060⟩
Article dans une revue hal-01271001 v1

Temperature mapping by µ-Raman spectroscopy over cross-section area of power diode in forward biased conditions

Thierry Kociniewski , Jeff Moussodji , Zoubir Khatir
Microelectronics Reliability, 2014, 55 (3), pp.547-551. ⟨10.1016/j.microrel.2014.12.007⟩
Article dans une revue hal-01675255 v1

Micro-Raman spectroscopy for stress analysis in high power silicon devices

Thierry Kociniewski , Jeff Moussodji , Zoubir Khatir
Microelectronics Reliability, 2014, 54 (10), pp. 1770-1773. ⟨10.1016/j.microrel.2014.07.149⟩
Article dans une revue hal-01319285 v1

Dynamic IGBT model. Application to top-metal ageing effects on chip electro-thermal distributions during short circuit operations

Jeff Moussodji , Thierry Kociniewski , Zoubir Khatir
European Journal of Electrical Engineering, 2014, 17 (5-6), pp.363-375. ⟨10.3166/ejee.17.363-375⟩
Article dans une revue hal-04154583 v1

Solder void position and size effects on electro thermal behaviour of MOSFET transistors in forward bias conditions

S.H. Tran , L. Dupont , Zoubir Khatir
Microelectronics Reliability, 2014, 54 (9-10), pp.1921-1926. ⟨10.1016/j.microrel.2014.07.152⟩
Article dans une revue hal-04154592 v1

Saturation Current and On-Resistance Correlation during Repetitive Short Circuit Conditions on SiC JFETs Transistors

Mounira Bouarroudj-Berkani , Stéphane Lefebvre , Zoubir Khatir
IEEE Transactions on Power Electronics, 2013, 28 (2), pp.621 - 624. ⟨10.1109/TPEL.2012.2215629⟩
Article dans une revue hal-00743649 v1

Robustness of 1.2 kV SiC MOSFET devices

Dhouha Othman , Stéphane Lefebvre , Mounira Bouarroudj-Berkani , Zoubir Khatir , Ali Ibrahim et al.
Microelectronics Reliability, 2013, 53 (9-11), pp.1735-1738. ⟨10.1016/j.microrel.2013.07.072⟩
Article dans une revue istex hal-00876938 v1

Distributed electro-thermal model of IGBT chip – Application to top-metal ageing effects in short circuit conditions

J. Moussodji , T. Kociniewski , Z. Khatir
Microelectronics Reliability, 2013, 53 (9-11), pp.1725-1729. ⟨10.1016/j.microrel.2013.07.089⟩
Article dans une revue istex hal-04154597 v1

Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications

G Rostaing , M Berkani , D Mechouche , D Labrousse , S Lefebvre et al.
Microelectronics Reliability, 2013, 53 (9), pp.1703-1706. ⟨10.1016/j.microrel.2013.07.120⟩
Article dans une revue istex hal-01056353 v1

Comparison Study on Performances and Reliability between MOSFET & JFET Silicon carbide technologies - Abilities for Aeronautics Application

D Othman , Mounira Berkani , S Lefebvre , Ali Ibrahim , Zoubir Khatir et al.
Microelectronics Reliability, 2012, 52 (10), pp.1859-1864. ⟨10.1016/j.microrel.2012.06.078⟩
Article dans une revue istex hal-00868886 v1
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Temperature Measurement of Power Semiconductor Devices by Thermo-Sensitive Electrical Parameters – A Review

Yvan Avenas , Laurent Dupont , Zoubir Khatir
IEEE Transactions on Power Electronics, 2012, 27 (6), pp.3081-3092
Article dans une revue hal-01073933 v1

New Investigation Possibilities on Forward Biased Power Devices using Cross-Sections

Thierry Kociniewski , Jeff Moussodji , Zoubir Khatir , Mounira Berkani , Stéphane Lefebvre et al.
IEEE Electron Device Letters, 2012, 33 (4), pp.576-578. ⟨10.1109/LED.2011.2182492⟩
Article dans une revue hal-00795342 v1
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Temperature Measurement of Power Semiconductor Devices by Thermo-Sensitive Electrical Parameters - A Review

Yvan Avenas , Laurent Dupont , Zoubir Khatir
IEEE Transactions on Power Electronics, 2012, 27, p.3081-3092. ⟨10.1109/TPEL.2011.2178433⟩
Article dans une revue hal-01687280 v1

Junction Temperature Investigations Based on a General Semi-Analytical Formulation of Forward Voltage of Power Diodes

Zoubir Khatir
IEEE Transactions on Electron Devices, 2012, 59 (6), pp.1716-1722. ⟨10.1109/6144.974966⟩
Article dans une revue hal-00861671 v1

Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application

Dhouha Othman , Mounira Bouarroudj-Berkani , Stéphane Lefebvre , Zoubir Khatir , Ali Ibrahim et al.
Microelectronics Reliability, 2012, 52 (9-10), pp.1859-1864
Article dans une revue hal-00739653 v1

Characterization and aging test methodology for power electronic devices at high temperature

Ali Ibrahim , Zoubir Khatir , Laurent Dupont
Advanced Materials Research, 2011, 324, pp 411-414. ⟨10.4028/www.scientific.net/AMR.324.411⟩
Article dans une revue hal-01701988 v1

Investigations of thermal interfaces aging under thermal cycling conditions for power electronics applications

Jean Pierre Ousten , Zoubir Khatir
Microelectronics Reliability, 2011, 51 (9-11), pp 1830-1835. ⟨10.1016/j.microrel.2011.07.066⟩
Article dans une revue istex hal-00878177 v1

Ageing and Failure Modes of IGBT Modules in High Temperature Power Cycling

Vanessa Smet , François Forest , Jean-Jacques Huselstein , Frédéric Richardeau , Zoubir Khatir et al.
IEEE Transactions on Industrial Electronics, 2011, 58 (10), pp.4931 - 4941. ⟨10.1109/TIE.2011.2114313⟩
Article dans une revue hal-00713206 v1

Effect of die metallization layer ageing in the case of power semiconductor devices

Sylvie Pommier , Stéphane Lefebvre , Sylvain Pietranico , Mounira Berkani , Zoubir Khatir et al.
European Journal of Electrical Engineering, 2011, 14 (5), pp.569-585. ⟨10.3166/Geo.19.11-38⟩
Article dans une revue hal-00861667 v1

Investigations on junction temperature estimation based on junction voltage measurements

Zoubir Khatir , Laurent Dupont , Ali Ibrahim
Microelectronics Reliability, 2010, 50 (9-11), pp 1506-1510. ⟨10.1016/j.microrel.2010.07.102⟩
Article dans une revue hal-01704413 v1

Ageing of SiC JFET transistors under repetitive current limitation conditions

Mounira Berkani , Dhouha Othman , Stéphane Lefebvre , Sabrine Moumen , Zoubir Khatir et al.
Microelectronics Reliability, 2010, 50, pp.1532-1537
Article dans une revue hal-00538483 v1

Robustness of SiC JFET in Short-Circuit Modes

N. Boughrara , S. Moumen , S. Lefebvre , Zoubir Khatir , P. Friedrichs et al.
IEEE Electron Device Letters, 2009, 30 (1), pp.51-53. ⟨10.1109/LED.2008.2008668⟩
Article dans une revue hal-04154543 v1

Rupture fragile et fatigue des substrats DBC. Applications haute température

Sylvain Pietranico , Sylvie Pommier , Stéphane Lefebvre , Zoubir Khatir
Revue Internationale de Génie Electrique, 2009, 12 (2), pp.271 - 289. ⟨10.3166/EJEE.12.271-289⟩
Article dans une revue istex hal-01636563 v1

Characterisation of power modules ceramic substrates for reliability aspects

Sylvie Pommier , Sylvain Pietranico , Stéphane Lefebvre , Zoubir Khatir , Sylvain Bontemps
Microelectronics Reliability, 2009, 49, pp.1260-1266
Article dans une revue hal-00417911 v1

Estimation of SiC JFET temperature during short-circuit operations

Mounira Berkani , Stéphane Lefebvre , Narjes Boughrara , Zoubir Khatir , J.C. Faugières et al.
Microelectronics Reliability, 2009, 49, pp.1358-1362
Article dans une revue hal-00538538 v1

Temperature Levels Effect on Solder Lifetime During Thermal Cycling of Power Modules

Mounira Bouarroudj-Berkani , Zoubir Khatir , Jean-Pierre Ousten , Stéphane Lefebvre
IEEE Transactions on Device and Materials Reliability, 2008, 8, pp.471 - 477. ⟨10.1109/TDMR.2008.2002354⟩
Article dans une revue hal-00869423 v1

Failure modes on low voltage power MOSFETs under high temperature application

Laurent Dupont , Stéphane Lefebvre , Mounira Bouarroudj , Zoubir Khatir , Jean-Claude Faugieres
Microelectronics Reliability, 2007, 47 (9), p1767-1772. ⟨10.1016/j.microrel.2007.07.066⟩
Article dans une revue istex hal-01704346 v1
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Experimental and numerical investigations on delayed short-circuit failure mode of single chip IGBT devices

Zoubir Khatir , Stéphane Lefebvre , F. Saint-Eve
Microelectronics Reliability, 2007, 47 (2-3), pp.422-428. ⟨10.1016/j.microrel.2006.05.004⟩
Article dans une revue hal-04153222 v1

Degradation behavior of 600 V-200 A IGBT modules under power cycling and high temperature environment conditions

Mounira Bouarroudj-Berkani , Zoubir Khatir , Jean-Pierre Ousten , F. Badel , Laurent Dupont et al.
Microelectronics Reliability, 2007, 47, pp.719-1724
Article dans une revue hal-00869421 v1
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Evaluation de technologies de substrats céramiques sous des cyclages en température de forte amplitude

Laurent Dupont , Zoubir Khatir , Stéphane Lefebvre , Serge Bontemps , Régis Meuret
Revue Internationale de Génie Électrique, 2007, 10 (5), p625-639
Article dans une revue hal-01704096 v1

Effects of metallization thickness of ceramic substrates on the reliability of power assemblies under high temperature cycling

Laurent Dupont , Zoubir Khatir , Stéphane Lefebvre , Serge Bontemps
Microelectronics Reliability, 2006, 46 (9-11), pp.1766-1771. ⟨10.1016/j.microrel.2006.07.057⟩
Article dans une revue istex hal-01703983 v1
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Experimental Behavior of Single-Chip IGBT and COOLMOS Devices Under Repetitive Short-Circuit Conditions

Stéphane Lefebvre , Zoubir Khatir , F. Saint-Eve
IEEE Transactions on Electron Devices, 2005, 52 (2), pp.276-283. ⟨10.1109/TED.2004.842714⟩
Article dans une revue hal-04153233 v1
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Composants à semi-conducteur de puissance pour des applications à haute température de fonctionnement

Bruno Allard , Gérard Coquery , Laurent Dupont , Zoubir Khatir , Mihai Lazar et al.
Journal sur l'enseignement des sciences et technologies de l'information et des systèmes, 2005, 4 (HS), pp. 18-19. ⟨10.1051/bib-j3ea:2005610⟩
Article dans une revue hal-01702019 v1

Banc de cyclage actif pour l'analyse de la fatigue thermique des brasures de composants IGBTs

Laurent Dupont , Stéphane Lefebvre , Zoubir Khatir , Gérard Coquery , Jean-Claude Faugiere
La Revue de l'électricité et de l'électronique, 2004, 2, pp.45-51
Article dans une revue hal-00861641 v1

Boundary element analysis of thermal fatigue effects on high power IGBT modules

Zoubir Khatir , Stéphane Lefebvre
Microelectronics Reliability, 2004, 44 (6), pp.929-938. ⟨10.1016/j.microrel.2004.02.007⟩
Article dans une revue istex hal-04154624 v1

Real-Time Computation of Thermal Constraints in Multichip Power Electronic Devices

Zoubir Khatir , S. Carubelli , F. Lecoq
IEEE Transactions on Components and Packaging Technologies, 2004, 27 (2), pp.337-344. ⟨10.1109/TCAPT.2004.828563⟩
Article dans une revue hal-04154621 v1

Experimental validation of a thermal modelling method dedicated to multichip power modules in operating conditions

S. Carubelli , Z. Khatir
Microelectronics Journal, 2003, 34 (12), pp.1143-1151. ⟨10.1016/S0026-2692(03)00205-2⟩
Article dans une revue istex hal-04154627 v1

Experimental and numerical analysis of GTO's snubberless turn-off operations

Z. Khatir , Ph. Larguier , D. Sebille
Microelectronics Journal, 1996, 27 (2-3), pp.231-241. ⟨10.1016/0026-2692(95)00092-5⟩
Article dans une revue istex hal-04154633 v1

Prédiction de la durée de vie restante d'un module de puissance par inférence bayesienne

Louis Schuler , Ludovic Chamoin , Zoubir Khatir , Mounira Bouarroudj-Berkani , Merouane Ouhab
Journée thématique de la F2M: Approches probabilistes en mécanique, 2023, Marne la Vallée, France
Communication dans un congrès hal-04425601 v1

Non-intrusive electro-mechanical reduced model of IGBT power modules

Louis Schuler , Ludovic Chamoin , Zoubir Khatir , Mounira Bouarroudj-Berkani , Merouane Ouhab et al.
24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EUROSIME 2023), 2023, Graz, Austria
Communication dans un congrès hal-04424575 v1

Non-intrusive reduced order modelling for a coupled electro-thermo-mechanical problem

Louis Schuler , Ludovic Chamoin , Zoubir Khatir , Mounira Bouarroudj-Berkani , Merouane Ouhab
10th International Conference on Computational Methods for Coupled Problems in Science and Engineering (COUPLED 2023), 2023, Chania, Greece
Communication dans un congrès hal-04424592 v1

A non-intrusive multi-physics PGD-based reduced model for the prediction of power electronic module lifetime

Louis Schuler , Ludovic Chamoin , Zoubir Khatir , Mounira Bouarroudj-Berkani , Merouane Ouhab
6th International Workshop on Model Reduction Techniques, Nov 2023, Paris-Saclay, France
Communication dans un congrès hal-04425570 v1

Subpixel Cross Correlation Registration for High Spatial Resolution Thermal Image on IGBT Emitter Metallization by Thermoreflectance Measurements

Kociniewski Thierry , Metayrek Youssef , Zoubir Khatir
2023 39th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), Mar 2023, San Jose, United States. pp.1-6, ⟨10.23919/SEMI-THERM59981.2023.10267896⟩
Communication dans un congrès hal-04451137 v1
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Non-intrusive electro-thermo-mechanical reduced model for diagnosis and prognostic on IGBT power modules

Louis Schuler , Ludovic Chamoin , Zoubir Khatir , Mounira Bouarroudj , Merouane Ouhab
2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Apr 2023, Graz, Austria. pp.1-9, ⟨10.1109/EuroSimE56861.2023.10100766⟩
Communication dans un congrès hal-04363889 v1
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Construction d'un modèle réduit PGD pour l'étude de la fissuration thermo-mécanique des modules de puissance

Louis Schuler , Ludovic Chamoin , Zoubir Khatir , Mounira Berkani , Merouane Ouhab et al.
15ème colloque national en calcul des structures, Université Polytechnique Hauts-de-France [UPHF], May 2022, 83400 Hyères-les-Palmiers, France
Communication dans un congrès hal-03717595 v1
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Physicochemical-microstructural approach for modeling the crack passage at topside metallic parts in IGBT semiconductor power electronics

Mustafa Shqair , Zoubir Khatir , Ali Ibrahim , Mounira Bouarroudj-Berkani , Ayda Halouani et al.
2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Apr 2022, St Julian, Malta. pp.1-6, ⟨10.1109/EuroSimE54907.2022.9758895⟩
Communication dans un congrès hal-03656147 v1

Non-intrusive multi-physics PGD-based reduced model for the modeling of power electronic modules

Louis Schuler , Ludovic Chamoin , Zoubir Khatir , Mounira Bouarroudj-Berkani , Merouane Ouhab et al.
Model Reduction and Surrogate Modeling, 2022, Berlin, Germany
Communication dans un congrès hal-04424548 v1
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Analytical Model for Real-Time Junction Temperature Estimation of Multi-chip Power Module in PWM operation

Ali Ibrahim , Zoubir Khatir
2022 IEEE 13th International Symposium on Power Electronics for Distributed Generation Systems (PEDG), Jun 2022, Kiel, Germany. pp.1-6, ⟨10.1109/PEDG54999.2022.9923091⟩
Communication dans un congrès hal-04154674 v1
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Model reduction for sensitivity analysis of solder joint fracture in power electronic modules

Louis Schuler , Ludovic Chamoin , Zoubir Khatir , Mounira Bouarroudj-Berkani , Merouane Ouhab et al.
International Conference on integrated Power Electronics Systems (CIPS), Mar 2022, Berlin, Germany
Communication dans un congrès hal-03656148 v1
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Condition monitoring and evaluation of Ron degradation during power cycling in switching mode of SiC-Mosfets power modules

Ali Ibrahim , Richard Lallemand , Zoubir Khatir , Mounira Bouarroudj-Berkani , Damien Ingrosso
12th International Conference on Integrated Power Electronics Systems (CIPS 2022), Mar 2022, Berlin, Germany
Communication dans un congrès hal-03656145 v1
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Wire-bond Contact Degradation Modelling for Remaining Useful Lifetime Prognosis of IGBT Power Modules

Mohamad Nazar , Ali Ibrahim , Zoubir Khatir , Nicolas Degrenne , Zeina Al Masry
ESREF 2020, 31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2020, Athènes, Greece
Communication dans un congrès hal-03153075 v1

Cross Correlation Method for Images Alignment: Application to 4 Buckets Calculation in Thermoreflectance

Youssef Metayrek , Thierry Kociniewski , Zoubir Khatir
2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), Mar 2020, San Jose, United States. pp.137-142, ⟨10.23919/SEMI-THERM50369.2020.9142843⟩
Communication dans un congrès hal-03271805 v1
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Remaining Useful Lifetime estimation for Electronic Power modules using an analytical degradation model

Mohamad Nazar , Ali Ibrahim , Zoubir Khatir , Nicolas Degrenne , Zeina Al Masry
Fifth European Conference of the PHM Society 2020 (The Prognostics and Health Management), Jul 2020, Turin (virtual conference), Italy. pp.10
Communication dans un congrès hal-03152503 v1

Investigations on the evolution of dynamic Ron of GaN power transistors during switching cycles

Malika Elharizi , Zoubir Khatir , Richard Lallemand
International Conference on integrated Power Electronics Systems (CIPS), Mar 2018, Nuremberg, Germany
Communication dans un congrès hal-03656150 v1

Evaluation of multi-void and drain metallization thickness effects on the electro thermal behavior of Si MOSFET under forward bias conditions

Son Ha Tran , Laurent Dupont , Zoubir Khatir
EPE'17 ECCE Europe - 19th European Conference on Power Electronics and Applications, Sep 2010, Varsovie, Poland. pp.1-10, ⟨10.23919/EPE17ECCEEurope.2017.8099235⟩
Communication dans un congrès hal-01703938 v1

New Electro-Thermal Model for a Multichip Power Module Used in a Motor Drive

Merouane Ouhab , Zoubir Khatir , Ali Ibrahim , Jean-Pierre Ousten , Radoslava Mitova et al.
2017 International Exhibition and Conference for Power Electronics and Energy Management (PCIM 2017), May 2017, Nuremberg, Germany. 8p
Communication dans un congrès hal-01671574 v1

Dispersion of electrical characteristics and short-circuit robustness of 600V E-mode GaN transistors

Matthieu Landel , Stéphane Lefebvre , Denis Labrousse , Cyrille Gautier , Fadi Zaki et al.
2017 International Exhibition and Conference for Power Electronics and Energy Management (PCIM 2017), May 2017, Nuremberg, Germany. pp.1-9
Communication dans un congrès hal-01671585 v1

Integration of different modules of an electric vehicle powered by a battery-flywheel storage system during traction operation

Khaled Itani , Alexandre de Bernardinis , Zoubir Khatir , Ahmed Jammal
IMCET - IEEE International Multidisciplinary Conference on Engineering Technology, Dec 2016, Beyrouth, France. pp.126 - 131, ⟨10.1109/IMCET.2016.7777439⟩
Communication dans un congrès hal-01671656 v1

Optimal Traction and Regenerative Braking Reference Current Synthesis for an IPMSM Motor using Three Combined Torque Control Methods for an Electric Vehicle

Khaled Itani , Alexandre de Bernardinis , Zoubir Khatir , Ahmad Jammal
ITEC 2016 - IEEE Transportation Electrification Conference and Expo, Jun 2016, Dearborn, United States. 6p, ⟨10.1109/ITEC.2016.7520214⟩
Communication dans un congrès hal-01671641 v1

Control strategy for extreme conditions regenerative braking of a hybrid energy storage system for an electric vehicle

Khaled Itani , Alexandre de Bernardinis , Zoubir Khatir , Ahmad Jammal , Mohamad Oueidat
INDIN 2016 - IEEE 14th International Conference on Industrial Informatics, Jul 2016, Poitiers, France. 6p, ⟨10.1109/INDIN.2016.7819170⟩
Communication dans un congrès hal-01671601 v1

Integration of different modules for regenerative braking control of a two front wheel-driven EV

Khaled Itani , Alexandre de Bernardinis , Zoubir Khatir , Ahmad Jammal
REDEC 2016 - 3rd International Conference on Renewable Energies for Developing Countries, Jul 2016, Zouk Mosbeh, Lebanon. 6p, ⟨10.1109/REDEC.2016.7577539⟩
Communication dans un congrès hal-01671593 v1

Design of a GaN HEMT based inverter leg power module for aeronautic applications

Benoit Thollin , Fadi Zaki , Zoubir Khatir , Regis Meuret , Donatien Martineau et al.
2016 6th Electronic System-Integration Technology Conference (ESTC), Sep 2016, Grenoble, France. pp.1-6, ⟨10.1109/ESTC.2016.7764473⟩
Communication dans un congrès hal-04156066 v1

Energy management of a battery-flywheel storage system used for regenerative braking recuperation of an electric vehicle

Khaled Itani , Alexndre de Bernardinis , Zoubir Khatir , Ahmed Jammal
IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society, Oct 2016, Florence, Italy. pp. 2034 - 2039, ⟨10.1109/IECON.2016.7793595⟩
Communication dans un congrès hal-01675187 v1

Power Cycling Tests in High Temperature Conditions of SiC-MOSFET Power Modules and Ageing Assessment

Ali Ibrahim , Jean-Pierre Ousten , Richard Lallemand , Zoubir Khatir
CIPS 2016 - 9th International Conference on integrated Power Electronics Systems, Mar 2016, Nuremberg, Germany. 6p
Communication dans un congrès hal-01675215 v1

Temperature and strain mappings over forward biased power IGBT cross-section area by Œ-Raman spectroscopy

Thierry Kociniewski , Zoubir Khatir
EPE'15 ECCE-Europe, 2015 17th European Conference on Power Electronics and Applications, Sep 2015, Geneve, Switzerland. 9p, ⟨10.1109/EPE.2015.7309315⟩
Communication dans un congrès hal-01675271 v1

Design and control of a high frequency six-phase interleaved DC/DC converter based on SiC power MOSFETs for a PEMFC

Kolli Abdelfatah , Arnaud Gaillard , Alexandre de Bernardinis , Olivier Béthoux , Hissel Daniel et al.
6th International Conference on Fundamentals & Development of Fuel Cells (FDFC2015), Feb 2015, Toulouse, France. pp.OPR3-25
Communication dans un congrès hal-01283676 v1

Part-load control stategy of a 20kW SiC power converter for embedded PEMFC multi-stack architectures

Abdelfatah Kolli , Alexandre de Bernardinis , Zoubir Khatir , Arnaud Gaillard , Olivier Béthoux et al.
41st Annual Conference of the IEEE Industrial Electronics Society (IECON 2015), Nov 2015, Yokohama, Japan. pp.004627 - 004632, ⟨10.1109/IECON.2015.7392821⟩
Communication dans un congrès hal-01271085 v1

Mechanical and Thermal Stresses Characterization Maps on Cross-sections of Forward Biased Electronic Power Devices

Thierry Kociniewski , Zoubir Khatir
IRPS 2015 - IEEE International Reliability Physics Symposium, Apr 2015, Monterey, United States. 10p, ⟨10.1109/IRPS.2015.7112800⟩
Communication dans un congrès hal-01675290 v1
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Solder void position and size effects on electro thermal behaviour of MOSFET transistors in forward bias conditions

Son Ha Tran , Laurent Dupont , Zoubir Khatir
ESREF-25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Sep 2014, BERLIN, Germany. pp.PP.1921-1926, ⟨10.1016/j.microrel.2014.07.152⟩
Communication dans un congrès hal-01471815 v1
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Modélisation Electrothermique distribuée d'une puce IGBT : Application aux effets du vieillissement de la métallisation sur les régimes de court-circuit

Jeff Moussodji Moussodji , Thierry Kociniewski , Zoubir Khatir
Symposium de Génie Électrique 2014, Jul 2014, Cachan, France
Communication dans un congrès hal-01065181 v1
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Evaluation du comportement électrothermique de transistors MOSFET en conduction en présence de défaut dans la brasure

Son Ha Tran , Laurent Dupont , Zoubir Khatir
Symposium de Génie Électrique 2014, Jul 2014, Cachan, France
Communication dans un congrès hal-01065178 v1

Power cycling ageing tests at 200°C of SiC assemblies for high temperature electronics

Ali Ibrahim , Zoubir Khatir
European Conference on Power Electronics and Applications, Sep 2013, France. 10p
Communication dans un congrès hal-01056984 v1

Investigation of 1.2 kV investigation of SiC MOSFETs for aeronautics applications

Dhouha Othman , Stéphane Lefebvre , Mounira Berkani , Zoubir Khatir , Ali Ibrahim et al.
Power Electronics and Applications (EPE), 2013 15th European Conference on, Sep 2013, Lille, France. pp.1-9, ⟨10.1109/EPE.2013.6634665⟩
Communication dans un congrès hal-00881162 v1

Top-metal ageing effects on electro-thermal distributions in an IGBT chip under short circuit conditions

Jeff Moussodji , Thierry Kociniewski , Zoubir Khatir
European Conference on Power Electronics and Applications, Sep 2013, France. 9p
Communication dans un congrès hal-01056852 v1

Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications

Gilles Rostaing , Mounira Berkani , Stéphane Lefebvre , Zoubir Khatir , Philippe Dupuy
ESREF, 2013, Arcachon, France
Communication dans un congrès hal-01700479 v1

Main issues and limitations in Power cycling tests for future integrated power converters

Zoubir Khatir , Stéphane Lefebvre
Automotive Power Electronics, Apr 2013, France. 6p
Communication dans un congrès hal-01057001 v1

Robustness of 1.2 kV SiC MOSFET devices

Othman Dhouha , Stéphane Lefebvre , Mounira Berkani , Zoubir Khatir , Ali Ibrahim et al.
ESREF, 2013, Arcachon, France
Communication dans un congrès hal-01700475 v1

Power cycling aging tests at 200°C of SiC assemblies for high temperature electronics

Ali Ibrahim , Zoubir Khatir
EPE 13 - European Conference on Power Electronics and Applications, Sep 2013, Lille, France. 10p
Communication dans un congrès hal-01671569 v1

Partial Thermal Impedance Measurement for Die Interconnection Characterization by a Microsecond 'Pulsed Heating Curve Technique

Benoit Thollin , Laurent Dupont , Zoubir Khatir , Yvan Avenas , Jean Christophe Crebier et al.
European Conference on Power Electronics and Applications, Sep 2013, France. 10p
Communication dans un congrès hal-01056909 v1

Partial Thermal Impedance Measurement for Die Interconnection Characterization by a microsecond "Pulsed Heating Curve Technique

Benoît Thollin , Laurent Dupont , Zoubir Khatir , Yvan Avenas , Jean-Christophe Crébier et al.
EPE'13 ECCE Europe, 2013, Lille, France
Communication dans un congrès hal-00988257 v1
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Study of Thermal Interfaces Aging for Power Electronics Applications

Jean-Pierre Ousten , Zoubir Khatir , Ludovic Menager
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE, Mar 2011, San José, United States. pp.10-17, ⟨10.1109/STHERM.2011.5767171⟩
Communication dans un congrès hal-00628901 v1

Development and electrical characterization of a vertical electrical and thermal test chip (VTTC)

Benoit Thollin , Jean-Christophe Crebier , Yvan Avenas , Pierre-Olivier Jeannin , Zoubir Khatir et al.
ECCE 2011 - IEEE Energy Conversion Congress and Exposition: Energy Conversion Innovation for a Clean Energy Future, Sep 2011, PHOENIX, United States. pp.60-67, ⟨10.1109/ECCE.2011.6063749⟩
Communication dans un congrès hal-00881531 v1

Etude du vieillissement de la couche de métallisation de composants de puissance à semi-conducteur

Sylvain Pietranico , Sylvie Pommier , Stéphane Lefebvre , Mounira Berkani , Zoubir Khatir et al.
Électronique de Puissance du Futur, Jun 2010, Saint Nazaire, France. pp.1-10
Communication dans un congrès hal-00713099 v1

Failure modes and robustness of SiC JFET transistors under current limiting operations

Mounira Berkani , Stéphane Lefebvre , Othman Dhouha , Moumen Sabrine , Zoubir Khatir et al.
Power Electronics and Applications (EPE 2011),, Aug 2011, Birmingham, United Kingdom. pp.1-10
Communication dans un congrès hal-00713076 v1
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Study of thermal interfaces aging for power electronics applications

Jean-Pierre Ousten , Zoubir Khatir
EPE'11 ECCE Europe Power Electronics and Adjustable Speed Drives: Towards the 20-20-20 Target, Aug 2011, Birmingham, United Kingdom. pp.1 - 10
Communication dans un congrès hal-00628876 v1

Modes de vieillissement et de défaillance de modules IGBT sous cyclage actif à haute température

V. Smet , F. Forest , J.-J. Huselstein , Frédéric Richardeau , M. Berkani et al.
Congrès national EPF2010, 2010, Saint Nazaire, France
Communication dans un congrès hal-01913792 v1
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Etude d'interfaces thermiques pour le management thermique des modules de puissance

Jean Pierre Ousten , Ludovic Menager , Zoubir Khatir , Laurent Dupont
EPF 2010 - 10th European Power Electronics Conference, Jun 2010, St Nazaire, France. 5p
Communication dans un congrès hal-01704057 v1
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Thermo-mechanical simulations in double-sided heat transfer power assemblies

Eric Woirgard , Isabelle Favre , Jean-Yves Delétage , Stephane Azzopardi , Renan Léon et al.
EUROSIME, Apr 2010, Bordeaux, France. pp.73
Communication dans un congrès hal-00584904 v1

Fabrication of bottom die substrate solderless interconnection based on nano copper wires

Zoubir Khatir , Philippe Castelan , Vincent Bley
European Conference on Power Electronics and Applications, 2009, Barcelone, Spain
Communication dans un congrès hal-04156080 v1

Investigations on ageing of IGBT transistors under repetitive short-circuits operations

Mounira Berkani , Stéphane Lefebvre , Zoubir Khatir , Serge Bontemps
International Conference & Exhibition on Power Electronics/Intelligent Motion/Power Quality, Jun 2009, Shanghai, China. pp.237-242
Communication dans un congrès hal-00538554 v1

Fabrication of bottom die substrate solderless interconnection based on nano copper wires

van Hai Nguyen , Philippe Castelan , Z. Khatir , Thierry Lebey , Vincent Bley et al.
EPE 2009: 13th European Conference on Power Electronics and Applications, Barcelone,SPAIN, 2009, Barcelone, Spain
Communication dans un congrès hal-03964660 v1
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Etude de l'Elaboration d'Interconnexions Electrodéposées en Electronique de Puissance

Ludovic Ménager , Quoc Hung Luan , Van Hai N'Guyen , Bruno Allard , Vincent Bley et al.
MGE'2008, May 2008, Toulouse, France. pp.on CD - 78-81/215
Communication dans un congrès hal-00412449 v1

Temperature Levels Effects on the Thermo-Mechanical Behaviour of Solder Attach During Thermal Cycling of Power Electronic Modules

Mounira Bouarroudj-Berkani , Zoubir Khatir , Stéphane Lefebvre
Power Electronics Specialists Conference, 2008. PESC 2008. IEEE, Jun 2008, Rhodes, Greece
Communication dans un congrès hal-01677164 v1

Programme EPO-Auto+ : Électronique de puissance pour l'automobile de demain: du module au système

Eric Woirgard , J. Razafiarivelo , Patrick Lagonotte , Zoubir Khatir
EPF'2008, ÉLECTRONIQUE DE PUISSANCE DU FUTUR, Jul 2008, TOURS, France. pp.00
Communication dans un congrès hal-00418221 v1

Comparison of stress distributions and failure modes during thermal cycling and power cycling on high power IGBT modules

Mounira Bouarroudj , Zoubir Khatir , Jean Pierre Ousten , Laurent Dupont , Stéphane Lefebvre et al.
EPE 2007 - 12th European Conference on Power Electronics and Applications, Sep 2007, Aalborg, Denmark. 10p, ⟨10.1109/EPE.2007.4417457⟩
Communication dans un congrès hal-01702003 v1
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Degradation behavior of 600V-200A IGBT modules under Power cycling and high temperature environment conditions

Mounira Bouarroudj , Zoubir Khatir , Jean Pierre Ousten , Frédéric Badel , Laurent Dupont et al.
18th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2007, BORDEAUX, France. pp. 1719-1724, ⟨10.1016/j.microrel.2007.07.027⟩
Communication dans un congrès hal-01702036 v1

Ageing Test Results of low voltage MOSFET Modules for Electrical Vehicles

Laurent Dupont , Stéphane Lefebvre , Mounira Bouarroudj , Zoubir Khatir , Jean-Claude Faugieres et al.
EPE 2007 - 12th European Conference on Power Electronics and Applications, Sep 2007, Aalborg, Denmark. 10p
Communication dans un congrès hal-01701952 v1
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Evaluation de technologies de substrats céramiques sous des cyclages en température de forte amplitude

Laurent Dupont , Stéphane Lefebvre , Zoubir Khatir , Serge Bontemps , Régis Meuret
EPF 2006 - Electronique de Puissance du Futur, Jul 2006, Grenoble, France. 6p
Communication dans un congrès hal-01704147 v1

Fiabilité des composants de puissance dans des environnements hautes températures

Laurent Dupont , Zoubir Khatir , Stéphane Lefebvre , Régis Meuret , Serge Bontemps
(ITCT 2006 - Journées internationales d'études Ingénieries des Technologies Communes aux Transports terrestres, maritimes, aériens et spatiaux, Nov 2006, Paris, France. 6p
Communication dans un congrès hal-01704363 v1

Evaluation of Substrate Technologies under High Temperature Cycling

Laurent Dupont , Stéphane Lefebvre , Zoubir Khatir , Serge Bontemps
CIPS 2006 - 4th International Conference on Integrated Power Electronics Systems, Jun 2006, Naples, Italy. 6p
Communication dans un congrès hal-01704198 v1
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Electrical Characterizations and evaluation of thermo-mechanical stresses of a power module dedicated to high temperature applications

Laurent Dupont , Zoubir Khatir , Stéphane Lefebvre , Régis Meuret , B Parmentier et al.
EPE 2005 - 11th European Conférence on Power Electronics and Applications, Sep 2005, Dresde, Germany. 11p, ⟨10.1109/EPE.2005.219580⟩
Communication dans un congrès hal-01704015 v1
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Evaluation of thermo-mechanical stresses of a power module dedicated to high temperature applications

Laurent Dupont , Régis Meuret , Zoubir Khatir , B Parmentier , Stéphane Lefebvre et al.
HITEN 2005 - International Conference on High Temperature Electronics, Sep 2005, Paris, France. 6p
Communication dans un congrès hal-01704218 v1

Characterisation of silicon carbide schottky diodes and COOLMOS transistors at high temperature

Laurent Dupont , Stéphane Lefebvre , Zoubir Khatir , Serge Bontemps , Régis Meuret
PESC 04 - IEEE 35th annual Power Electronics Specialists Conference, Jun 2004, AIX LA CHAPELLE, Germany. ⟨10.1109/PESC.2004.1355810⟩
Communication dans un congrès hal-01701982 v1

Development of high temperature power module for avionics applications

Laurent Dupont , Stéphane Lefebvre , Serge Bontemps , Zoubir Khatir , Régis Meuret
PCIM 2004 - International conference power electronics, intelligent motion, power quality, May 2004, Nuremberg, Germany. pp.6P
Communication dans un congrès hal-01702065 v1
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Développement d'un module de puissance pour tester la fiabilité d'un convertisseur haute température

Laurent Dupont , Stéphane Lefebvre , Zoubir Khatir , Serge Bontemps , Régis Meuret
SAAEI-EPF 2004 - Annual seminar on automatic control, industrial electronics and instrumentation, Electronique de puissance du futur, Sep 2004, Toulouse, France. pp.3-6
Communication dans un congrès hal-01702105 v1
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Power Cycling Test Circuit for Thermal Fatigue Resistance Analysis of Solder Joints in IGBT

Laurent Dupont , Stéphane Lefebvre , Zoubir Khatir , Jean Claude Faugiere
10th European Conférence on Power Electronics and Applications, Sep 2003, France. 8p
Communication dans un congrès hal-00868868 v1

Détection et Diagnostic de défauts dans un convertisseur statique

Mohamed Benbouzid , Claude Delpha , Zoubir Khatir , S. Lefebvre , Demba Diallo
Trigeassou J.C. Diagnostic des Machines Electriques, Hermès / Lavoisier, pp.317-371, 2011
Chapitre d'ouvrage hal-00617349 v1

Faults Detection and Diagnosis in a Static Converter

Mohamed Benbouzid , Claude Delpha , Zoubir Khatir , S. Lefebvre , Demba Diallo
J.C. Trigeassou. Electrical Machines Diagnosis, Wiley, ISTE, pp.271-316, 2011
Chapitre d'ouvrage hal-00659387 v1