Laurent Latorre
166
Documents
Researcher identifiers
laurent-latorre-
0000-0003-0478-1572
- IdRef : 160859581
Presentation
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Digital generation of single tone FM/PM test stimuli: a theoretical analysisLATS 2024 - IEEE 25th Latin American Test Symposium, Apr 2024, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS62223.2024.10534627⟩
Conference papers
lirmm-04689333v1
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Low-cost digital solution for production test of ZigBee transmitters - Special Session “AMS-RF testing”LATS 2023 - IEEE 24th Latin American Test Symposium, Mar 2023, Veracruz, Mexico. pp.1-2, ⟨10.1109/LATS58125.2023.10154484⟩
Conference papers
lirmm-04257082v1
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Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuliETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-6, ⟨10.1109/ETS50041.2021.9465473⟩
Conference papers
lirmm-03426321v1
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Digital test of ZigBee transmitters: Validation in industrial test environmentDATE 2021 - 24th Design, Automation and Test in Europe Conference and Exhibition, Feb 2021, Grenoble, France. pp.396-401, ⟨10.23919/DATE51398.2021.9474090⟩
Conference papers
lirmm-03426209v1
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MEMS based Low-Power Multi-Sensors device for Bio-Logging ApplicationsDTIP 2021 - 23rd Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS, Aug 2021, Paris, France. pp.1-4, ⟨10.1109/DTIP54218.2021.9568669⟩
Conference papers
lirmm-03740384v1
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EVM measurement of RF ZigBee transceivers using standard digital ATEDFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250900⟩
Conference papers
lirmm-03000882v1
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Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICsIOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩
Conference papers
lirmm-02993384v1
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Low-cost testing of a 2.4GHz ZigBee transmitter using standard digital ATEETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia
Conference papers
lirmm-03001537v1
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Low-Power Embedded Audio Recording using MEMS MicrophonesDTIP 2020 - 22nd Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS, Jun 2020, Virtual, France. ⟨10.1109/DTIP51112.2020.9139147⟩
Conference papers
lirmm-02948842v1
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Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled AcquisitionETS 2019 - 24th IEEE European Test Symposium, May 2019, Baden-Baden, Germany. ⟨10.1109/ETS.2019.8791540⟩
Conference papers
lirmm-02274367v1
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Test of 2.4 GHz ZigBee Transmitter using Standard Digital ATESETS 2019 - South European Test Seminar, 2019, Pitztal, Austria
Conference papers
lirmm-02375880v1
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Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATEIOLTS: International On-Line Testing Symposium, Jul 2018, Platja d'Aro, Spain. pp.17-22, ⟨10.1109/IOLTS.2018.8474229⟩
Conference papers
lirmm-01997910v1
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Combo of innovative educational approaches to teach industrial test to undergraduate studentsEDUCON: Global Engineering Education Conference, Apr 2017, Athens, Greece. pp.56-64, ⟨10.1109/EDUCON.2017.7942824⟩
Conference papers
lirmm-01768840v1
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Problem-Based Learning Approach to Teach Printed Circuit Boards TestICL: Interactive Collaborative Learning, Sep 2016, Belfast, United Kingdom. pp.45-57, ⟨10.1007/978-3-319-50337-0_4⟩
Conference papers
lirmm-01385626v1
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Industrial Test Project Oriented EducationEDUCON: Global Engineering Education Conference, Apr 2016, Abu Dhabi, United Arab Emirates. pp.119-124, ⟨10.1109/EDUCON.2016.7474541⟩
Conference papers
lirmm-01256447v1
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Per Peers Learning Education Approach to Teach Industrial Test to Undergraduate StudentsEWME: European Workshop on Microelectronics Education, May 2016, Southampton, United Kingdom. ⟨10.1109/EWME.2016.7496485⟩
Conference papers
lirmm-01385619v1
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An ultra-low-power front-end for differential capacitive sensorsDTIP: Design, Test, Integration and Packaging, Apr 2015, Montpellier, France. ⟨10.1109/DTIP.2015.7160964⟩
Conference papers
lirmm-01235453v1
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A digital technique for the evaluation of SSB phase noise of analog/RF signalsLATS: Latin-American Test Symposium, Mar 2015, Puerto Vallarta, Mexico. ⟨10.1109/LATW.2015.7102407⟩
Conference papers
lirmm-01233125v1
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Digital on-chip measurement circuit for built-in phase noise testingIMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. ⟨10.1109/IMS3TW.2015.7177880⟩
Conference papers
lirmm-01233161v1
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Embedded test instrument for on-chip phase noise evaluation of analog/IF signalsDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.237-242, ⟨10.1109/DDECS.2015.11⟩
Conference papers
lirmm-01233136v1
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A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal AcquisitionETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. pp.1-6, ⟨10.1109/ETS.2015.7138761⟩
Conference papers
lirmm-01233093v1
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Une pedagogie par projet pour des etudiants acteurs et auteurs de leur apprentissageQPES: Questions de Pédagogie dans l’Enseignement Supérieur, Jun 2015, Brest, France
Conference papers
lirmm-01256445v1
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MEMS based Inertial Measurement UnitsDTIP: Design, Test, Integration and Packaging, Apr 2015, Montpellier, France. ⟨10.1109/DTIP.2015.7160966⟩
Conference papers
lirmm-01235526v1
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Low-cost phase noise testing of complex RF ICs using standard digital ATEITC: International Test Conference, Oct 2014, Seattle, WA, United States. ⟨10.1109/TEST.2014.7035301⟩
Conference papers
lirmm-01119356v1
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Phase noise measurement on IF analog signals using standard digital ATE resourcesNEWCAS: New Circuits and Systems, Jun 2014, Trois-Rivieres, Canada. pp.121-124, ⟨10.1109/NEWCAS.2014.6933998⟩
Conference papers
lirmm-01119359v1
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CMOS implementation of a 3-axis thermal convective accelerometerIEEE SENSORS, Nov 2014, Valencia, Spain. pp.1471-1474, ⟨10.1109/ICSENS.2014.6985292⟩
Conference papers
lirmm-01166836v1
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Une expérience de pédagogie par projet pour la formation au test industrielCETSIS: Colloque sur l'Enseignement des Technologies et des Sciences de l'Information et des Systèmes, Oct 2014, Besançon, France
Conference papers
lirmm-01256441v1
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Stochastic model for phase noise measurement from 1-bit signal acquisitionIMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto Alegre, Brazil. ⟨10.1109/IMS3TW.2014.6997400⟩
Conference papers
lirmm-01119368v1
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Design of a Monolithic 3-axis Thermal Convective AccelerometerDTIP: Design, Test, Integration and Packaging, Apr 2013, Barcelona, Spain. pp.235-238
Conference papers
lirmm-00814222v1
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Low-cost SNR estimation of analog signals using standard digital Automated Test Equipment (ATE)NEWCAS: International New Circuits and Systems Conference, Jun 2012, Montréal, Canada. pp.197-200, ⟨10.1109/NEWCAS.2012.6328990⟩
Conference papers
lirmm-00803558v1
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Testabilité d'un circuit intégré mixte dédié à la mesure d'un champ magnétique12èmes Journées Pédagogiques du CNFM (JPCNFM 2012), Nov 2012, Saint Malo, France. pp. 45-50
Conference papers
hal-00769886v1
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Modeling and simulation of CMOS integrated MEMS: application to low-cost sensorsSSDM'2012: International Conference on Solid State Devices and Materials, Sep 2012, Kyoto, Japan. pp.1117-1119
Conference papers
lirmm-00814386v1
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Study of a high-resolution and low-power CMOS temperature sensorNEWCAS: International New Circuits and Systems Conference, Jun 2012, Montreal, Canada. pp.205-208, ⟨10.1109/NEWCAS.2012.6328992⟩
Conference papers
lirmm-00814184v1
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De l'étude de la testabilité d'un circuit logique à sa vérification sur testeur industriel : Une expérience pédagogique sur les approches de test structurel et fonctionnel12èmes Journées Pédagogiques du CNFM (JPCNFM 2012), Nov 2012, Saint Malo, France. pp.39-44
Conference papers
hal-00769876v1
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A Novel Integrated Solution for the Control and Diagnosis of Electrostatic MEMS SwitchesDTIP'11: Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Aix-en-Provence, France. pp.315-319
Conference papers
lirmm-00632583v1
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A Micro-Power High-Resolution Sigma-Delta CMOS Temperature SensorIEEE Sensors 2011, Limerik, Ireland. pp.1530-1533
Conference papers
lirmm-00651052v1
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A Tracking Converter for Resistive Sensors Based on a Feedback Active BridgeIEEE International Conference NEWCAS 2011, Jun 2011, France. pp.458-461, ⟨10.1109/NEWCAS.2011.5981269⟩
Conference papers
lirmm-00743354v1
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An Ultra Low Power Temperature Sensor for Smart Packaging MonitoringDTIP'11: Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Aix-en-Provence, France. pp.320-323
Conference papers
lirmm-00632577v1
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Level-Crossing based QAM Demodulation for Low-Cost Analog/RF TestingNEWCAS: International New Circuits and Systems Conference, Jun 2011, Bordeaux, France. pp.309-312, ⟨10.1109/NEWCAS.2011.5981317⟩
Conference papers
lirmm-00702763v1
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An Optimized Electronic Architecture for Resistive SensorsDTIP'10: Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, Seville, Spain. pp.372-375
Conference papers
lirmm-00547712v1
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Projet d'enseignement Master MNE Strasbourg - CRTC10èmes Journées Pédagogiques du CNFM, Nov 2010, Saint-Malo, France. pp.Actes P17
Conference papers
hal-00547763v1
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Nonlinear Behaviour of a Micromachined SOI Device for Energy Harvesting ApplicationDTIP'10: Design, Test, Integration and Packaging of MEMS/MOEMS, May 2010, Seville, Spain. pp.263-265
Conference papers
lirmm-00489036v1
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AM-Demodulation of Analog/RF Signals Using Digital Tester ChannelsIMS3TW 2010 - 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, Jun 2010, La Grande Motte, France. ⟨10.1109/IMS3TW.2010.5503013⟩
Conference papers
lirmm-00494546v1
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Design of a Smart CMOS High-Voltage Driver for Electrostatic MEMS SwitchesDTIP'10: Design, Test, Integration and Packaging of MEMS/MOEMS, Seville, Spain. pp.44-47
Conference papers
lirmm-00489031v1
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Projet pédagogique Master Micro-Nano Électronique de Strasbourg ¬ CRTC: Testabilité numérique-analogique sur circuit intégré mixte dédié11èmes Journées Pédagogiques du CNFM (JPCNFM 2010), Nov 2010, Sainr-Malo, France. Actes pp. 7-12
Conference papers
hal-00597329v1
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A CMOS-MEMS Inertial Measurement UnitIEEE SENSORS, Nov 2010, Waikoloa, Hawaii, United States. pp.1033-1036
Conference papers
lirmm-00547694v1
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On the Use of Standard Digital ATE for the Analysis of RF SignalsETS 2010 - 15th IEEE European Test Symposium, May 2010, Prague, Czech Republic. pp.43-48, ⟨10.1109/ETSYM.2010.5512782⟩
Conference papers
lirmm-00492828v1
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A Low Power Interface Circuit for Resistive Sensors with Digital Offset CompensationISCAS'10: IEEE International Symposium on Circuits and Systems, Paris, France. pp.3092-3095
Conference papers
lirmm-00498468v1
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Smart Drivers for Online Diagnosis of Electrostatic MEMS ActuatorsIMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Conference papers
lirmm-00494515v1
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Experiments on the Analysis of Phase/Frequency-Modulated RF Signals Using Digital Tester ChannelsLATW'10: 11th Latin-American Test Workshop, Punta del Este, Uruguay. pp.N/A
Conference papers
lirmm-00473524v1
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The Active Bridge: an Alternative to the Wheatstone Bridge for Efficient Conditioning of Resistive MEMS SensorsDTIP 2009 - Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, Apr 2009, Rome, Italy. pp.265-268
Conference papers
lirmm-00373800v1
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An Innovative, Offset Imune, Conditionning and Read-out Circuitry for Resistive MEMS SensorsJoint Conference IEEE NEWCAS - TAISA'09, Toulouse, France, pp.4
Conference papers
lirmm-00406936v1
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Méthodes alternatives pour le test de MEMSJournées Nationales du GDR Micro et Nano Systèmes, France
Conference papers
lirmm-00406946v1
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Linearity optimization using dithering in a 1st order thermal modulatorJoint Conference IEEE NEWCAS - TAISA'09, Toulouse, France, pp.4
Conference papers
lirmm-00406937v1
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A Novel Low Power Interface for Resistive MEMS SensorsSCS: Signals, Circuits and Systems, Nov 2009, Medenine, Tunisia. ⟨10.1109/ICSCS.2009.5412550⟩
Conference papers
lirmm-00436253v1
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Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals using Digital ATEATS: Asian Test Symposium, 2009, Taichung, Taiwan. pp.261-266, ⟨10.1109/ATS.2009.56⟩
Conference papers
lirmm-00436384v1
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A Wide Bandwidth, Wide Dynamic Range Thermal Architecture for Convective AccelerometersIEEE Sensors 2009 Conference, Oct 2009, Nouvelle Zélande, pp.N/A
Conference papers
lirmm-00406935v1
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An Efficient Low Power Interface Circuit for Resistive MEMs SensorFTFC'09: 8èmes Journées Faible Tension Faible Consommation, Neufchatel, Suisse, pp.3
Conference papers
lirmm-00406942v1
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A MEMS-Based Multi-Sensor Platform for Consumer ApplicationsPRIME'09: Research in Microelectronics and Electronics, Jul 2009, Cork, Ireland. pp.320-323
Conference papers
lirmm-00423604v1
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A MEMS Multi-Sensor System for Attitude DeterminationDTIP'09: Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, Apr 2009, pp.261-264
Conference papers
lirmm-00373753v1
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Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical SystemsVTS'02: 20th IEEE VLSI Test Symposium, Monterey, CA, USA, pp.439-444
Conference papers
lirmm-00268484v1
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European Network for Test EducationDELTA'02: 1st International Workshop on Electronic DesignTest and Applications, Christchurch, New Zeland, pp.230-239
Conference papers
lirmm-00268490v1
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Micromachined CMOS Magnetic Field Sensors with Low-Noise Signal ConditioningMEMS'02: IEEE International Conference on Micro Electro Mechanical Systems, Las Vegas, Nevada, USA, pp.256-259
Conference papers
lirmm-00268486v1
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Towards New Low-Cost Multi-Sensor SystemsEUROSENSORS, Sep 2008, Desden, Germany. pp.549-552
Conference papers
lirmm-00325075v1
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Conception de MEMS : de l'idée à l'integration SoC/SiPGDR SoC-SiP: System-On-Chip & Sytem-In-Package, Jun 2008, Paris, France
Conference papers
lirmm-00361232v1
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STUDY OF FIRST-ORDER THERMAL SIGMA-DELTA ARCHITECTURE FOR CONVECTIVE ACCELEROMETERSDTIP 2008, Apr 2008, Nice, France. pp.100-104
Conference papers
hal-00277687v1
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Study of First-Order Thermal SIGMA-DELTA Architecture for Convective AccelerometersDTIP: Design, Test, Integration and Packaging of MEMS/MOEMS, Apr 2008, Nice, France. pp.100-104, ⟨10.1109/DTIP.2008.4752961⟩
Conference papers
lirmm-00333632v1
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Conception et Test d'une Micro-Boussole Electromécanique IntégréeColloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 97-100
Conference papers
lirmm-00269324v1
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A CMOS Multi-Sensor System for 3D Orientation DeterminationISVLSI'08: IEEE Computer Society Annual Symposium on VLSI, Apr 2008, Montpellier, France, pp.57-62
Conference papers
lirmm-00280806v1
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An Approach to Integrate MEMS into High-Level System design FlowsJoint conference IEEE NEWCAS - TAISA'08, Jun 2008, Montreal, Canada. pp.273-276
Conference papers
lirmm-00333697v1
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A Closed-Loop Architecture with Digital Output for Convective AccelerometersISVLSI'08: IEEE Computer Society Annual Symposium on VLSI, Apr 2008, Montpellier, France, pp.51-56
Conference papers
lirmm-00280803v1
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A 2-D VHDL-AMS Model for Disk-Shape Piezoelectric TransducersBMAS 2008 - IEEE International Workshop on Behavioral Modeling and Simulation, Sep 2008, San Jose, United States. pp.148-152, ⟨10.1109/BMAS.2008.4751257⟩
Conference papers
lirmm-00370390v1
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The Active Bridge: an Alternative to the Wheatstone BridgeJournées Nationales du Groupement de Recherche Micro et Nano Systèmes (GDR MNS), Dec 2008, Montpellier, France
Conference papers
lirmm-00363892v1
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Rejection of Power Supply Noise in Wheatstone Bridges: Application to Piezoresistive MEMSDTIP 2008 - 10th Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Apr 2008, Nice, France. pp.96-99, ⟨10.1109/DTIP.2008.4752960⟩
Conference papers
hal-00277686v1
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A Unified Electrical SPICE Model for Piezoelectric TransducersBMAS: Behavioral Modeling and Simulation, Sep 2007, San Jose, SA, United States. ⟨10.1109/BMAS.2007.4437540⟩
Conference papers
lirmm-00370388v1
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A Comparative Study of Conditioning Architectures for Convective Accelerometers6th IEEE Conference on SENSORS 2007, Oct 2007, pp.107-110
Conference papers
lirmm-00194571v1
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Réjection du bruit d'alimentation du pont de Wheatstone : application aux MEMS piézorésistifsTAISA'07 : 8ème colloque sur le Traitement Analogique de l'Information, du Signal et ses Applications, Oct 2007, Lyon, France. Session 4A : Capteurs
Conference papers
lirmm-00202769v1
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Accéléromètre convectif CMOS en boucle ferméeTAISA'2007 : 8ème colloque sur le Traitement Analogique de l'Information, du Signal et ses Applications, pp.107-110
Conference papers
lirmm-00181093v1
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Modeling of a CMOS Convective Accelerometer for HDL IntegrationESSDERC'06: 36th European Solid-State Device Research Conference - ESSCIRC'06: 32nd European Solid-State Circuits Conference, Sep 2006, Montreux (Switzerland), pp.134-137
Conference papers
lirmm-00102127v1
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HDL Simulation of a Thermal Accelerometer for System DesignXX EUROSENSORS, Sep 2006, Göteborg (Sweden)
Conference papers
lirmm-00102170v1
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On the Testing of the Electronic Conditioning Chain of a CMOS MEMS Based Magnetic Field SensorLATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, Argentina. pp.29-34
Conference papers
lirmm-00102750v1
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Test Engineering Education in Europe: The EuNICE Test ProjectEDUTECH'05, 2005, France
Conference papers
lirmm-00106506v1
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Absolute Pitch, Roll and Yaw Measurement on CMOS4th IEEE Conference on Sensors, Oct 2005, Irvine, CA (USA), pp.133-136
Conference papers
lirmm-00154128v1
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Design of a CMOS Micro Compass2nd PATENT-DfMM Summer School, Sep 2005
Conference papers
lirmm-00106561v1
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Superposition vs. Modulation: A Comparative Analysis for Electro-Thermal On-Line MEMS TestingIMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.212-219
Conference papers
lirmm-00106522v1
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Experimental and Finite-Element Study of Convective Accelerometer on CMOSEUROSENSORS, Sep 2005, Barcelona, Spain
Conference papers
lirmm-00106544v1
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BIST Implementation of Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field SensorLATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.207-212
Conference papers
lirmm-00106516v1
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Offset and Noise Rejection Analysis in CMOS Piezoresistive SensorsEUROSENSORS, Sep 2005, Barcelona, Spain
Conference papers
lirmm-00106543v1
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A Monolithic CMOS 3-Axis Accelerometer Combining Piezoresistive and Heat Transfer EffectsPRIME'05: PhD Research in Microelectronics and Electronics, Jul 2005, Lausanne (Switzerland), pp.219-222
Conference papers
lirmm-00106064v1
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Electro-Thermal On-Line Testing of a MEMS Magnetometer Through Bias ModulationLATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.213-218
Conference papers
lirmm-00106517v1
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Design of a Micromachined CMOS CompassTRANSDUCERS'05, Jun 2005, Séoul (Corée), pp.405-408
Conference papers
lirmm-00106457v1
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On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field SensorVTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.213-218
Conference papers
lirmm-00105996v1
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Towards On-Line Testing of MEMS Using Electro-Thermal ExcitationETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.76-81
Conference papers
lirmm-00106009v1
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Introduction aux Outils CADENCECNFM'04 : 8ème Journées Pédagogiques du Comité National de Formation en Microélectronique, 2004, Saint-Malo, pp.9-15
Conference papers
lirmm-00108670v1
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Test Digital, Test de Mémoires, Test Mixte : 5 Centres de Compétence pour la Formation en EuropeCNFM'04 : 8ème Journées Pédagogiques du Comité National de Formation en Microélectronique, 2004, Saint Malo, France. p. 242
Conference papers
lirmm-00108671v1
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An A/D Interface for Resonant Piezoresistive MEMS SensorISIE 2004 - IEEE International Symposium on Industrial Electronics, May 2004, Ajaccio, France. pp.83-88, ⟨10.1109/ISIE.2004.1571786⟩
Conference papers
lirmm-00108896v1
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A CMOS MEMS Accelerometer with Bulk MicromachiningEUROSENSORS, Sep 2004, Rome, Italy
Conference papers
lirmm-00108794v1
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On the Use of Electrical Stimuli for MEMS TestingLATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.118-122
Conference papers
lirmm-00108651v1
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Electrically-Induced Thermal Stimuli for MEMS TestingETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.60-65
Conference papers
lirmm-00108904v1
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Amplificateur CMOS Faible Bruit pour Micro Capteur MEMSTAISA'03: Traitement Analogique de l'Information, du Signal et ses Applications, Oct 2003, Louvain, Belgique. pp.71-74
Conference papers
lirmm-00269460v1
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Design and Simulation of a CMOS MEMS Using Standard Microelectronic CAD EnvironmentNANOTECH 2003 - Nanotechnology Conference and Trade Show, Feb 2003, San Francisco, CA, United States. pp.472-475
Conference papers
lirmm-00269546v1
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Improving the Efficiency of the Oscillation-Based Test Methodology for Parametric FaultsLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.234-237
Conference papers
lirmm-00269433v1
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Piezoresistive CMOS Beams for Inertial SensingIEEE SENSORS, Oct 2003, Toronto, Canada. pp.451-456, ⟨10.1109/ICSENS.2003.1278978⟩
Conference papers
lirmm-00269470v1
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Low Noise CMOS Amplifier for a Piezoresistive Magnetic Field SensorDCIS: Design of Circuits and Integrated Systems, Nov 2003, Ciudad Real, Spain. pp.639-644
Conference papers
lirmm-00269472v1
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Use of a Statistical Approach for Efficient Implementation of Oscillation-Based Test StrategyIMSTW 2003 - 9th IEEE International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.99-103
Conference papers
lirmm-00269582v1
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A Remote Access to Engineering Test Facilities for the Distant Education of European Microelectronics Students32nd Annual Frontiers in Education (FIE), Nov 2002, Boston, MA, United States. pp.T2E-24, ⟨10.1109/FIE.2002.1157943⟩
Conference papers
lirmm-00269423v1
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On the Use of CMOS 0n-Chip Mechanical Devices for Spectral AnalysisEUROSENSORS, Sep 2002, Prague, Czech Republic. pp.191-192
Conference papers
lirmm-00268509v1
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Impact of Environmental Parameters on CMOS MEMS StructuresCANEUS, Aug 2002, Montreal, Canada
Conference papers
lirmm-00269356v1
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On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanichal SystemsDATE: Design, Automation and Test in Europe, Mar 2002, Paris, France. pp.1120-1120, ⟨10.1109/DATE.2002.998476⟩
Conference papers
lirmm-00268488v1
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Testing Reasonant Micro-Electro-Mechanical Sensors Using the Oscillation-Based Test MethodologyLATW 2002 - 3rd IEEE Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.99-104
Conference papers
lirmm-00269323v1
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EuNICE-Test Project: A remote Access to Engineering Test for European UniversitiesEWME: European Workshop on Microelectronics Education, 2002, Vigo, Spain. pp.133-136
Conference papers
lirmm-00268489v1
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FEM study of a 3-axis thermal accelerometer based on free convection in a microcavityMSM'2012: Modeling & Simulation of Microsystems, Microtech Conference & Expo, Santa Clara, United States. pp.4, 2012
Conference poster
lirmm-00814247v1
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Analog Measurements based on Digital Test Equipment for Low-Cost Testing of Analog/RF CircuitsConference poster lirmm-00820084v1 |
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A Time-Efficient Simulation Flow for DAC Characterization & OptimizationDCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.298-299, 2012
Conference poster
lirmm-00814994v1
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Pressure Sensor for Smart Wafer-Level Packaging of MEMSEUROSENSORS, Sep 2008, Dresden, Germany. 22nd European Conference on Solid-State Transducers, pp.408-411, 2008
Conference poster
lirmm-00325109v1
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Design of CMOS Cantilevers for Intertial SensingEUSPEN: European Society for Precision Engineering and Nanotechnology, May 2005, Montpellier, France. 5th International Conference of the European Society for Precision Engineering and Nanotechnology, pp.341-344, 2005
Conference poster
lirmm-00106001v1
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Test Engineering Education in Europe: The CRTC Experience Through the EuNICE-Test ProjectAchim Rettberg and Christophe Bobda. IFIP TC10 Working Conference: EduTech'05, Oct 2005, France. , pp.63-77, 2005
Conference poster
lirmm-00106564v1
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Design of a High Resolution MEMS-Based CMOS MagnetometerEUSPEN: European Society for Precision Engineering and Nanotechnology, May 2005, Montpellier, France. 5th International Conference of the European Society for Precision Engineering and Nanotechnology, pp.287-290, 2005
Conference poster
lirmm-00105999v1
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Test de Circuits et de Systèmes IntégrésCollection EGEM, Ed.Hermès, 2004, 2-7462-0864-4
Books
lirmm-00109158v1
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Ultra-Low-Power SensorsM. Belleville and C. Condemine. Energy Autonomous Micro and Nano Systems, ISTE Ltd and John Wiley & Sons Inc, pp.207-237, 2012, 978-1-84821-359-9
Book sections
lirmm-00803687v1
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Les capteurs à ultra-basse consommationM. Belleville et C. Condemine. Micro et nanosystèmes autonomes en énergie, des applications aux fonctions et technologies, Hermès-Lavoisier, pp.237-269, 2012, 978-2-7462-2517-6
Book sections
lirmm-00803681v1
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Impact of Technology Spreading on MEMS Design RobustnessSOC Design Methodologies, 90, Kluwer Academic Publishers, pp.241-251, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_21⟩
Book sections
lirmm-00268485v1
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Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensingSOC Design Methodologies, 90, Kluwer Academic Publishers, pp.461-472, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_39⟩
Book sections
hal-01105261v1
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Noise Optimisatioin of a Piezoresistive CMOS MEMS for Magnetic Field SensingSOC Design Methodologies, 90, Kluwer Academic Publishers, pp.461-472, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_40⟩
Book sections
lirmm-00268487v1
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MEMS monolithiques.Hermès science publication, 1 (1), 2000, Nano et Micro Technologies, micro-capteurs et microsystèmes intégrés, 9-782746-202422
Book sections
hal-01105274v1
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Method And Apparatus For Measuring Phase NoiseFrance, Patent n° : 81582852EP01. 2013, pp.32
Patents
lirmm-00985404v1
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Circuit d'amplification d'un signal représentant une variation de résistance d'une résistance variable et capteur correspondantFrance, N° de brevet: FR0854585A; FR2009051324W. 2008
Patents
lirmm-00363897v1
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3D Orientation Determination DEMO2008
Other publications
lirmm-00361236v1
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Remote Access to Manufacturing Test Facilities: a Reality in IC, a dream in MEMS2006, pp.39-41
Other publications
lirmm-00128278v1
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Project Management and Trainer Education Deliverable: Management Report, Attendees and Training Contents, Training Evaluation2002
Other publications
lirmm-00268593v1
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Evaluation des techniques microélectroniques contribuant à la réalisation de microsystèmes : application à la mesure du champ magnétiqueMicro et nanotechnologies/Microélectronique. Université Montpellier II - Sciences et Techniques du Languedoc, 1999. Français. ⟨NNT : ⟩
Theses
tel-00397734v1
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Conception et Test de Microsystèmes Monolithiques CMOSMicro et nanotechnologies/Microélectronique. Université Montpellier II - Sciences et Techniques du Languedoc, 2008
Habilitation à diriger des recherches
tel-00397833v1
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