LD

Luigi Dilillo

326
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Publications

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Physical Explanation for the Higher Sensitivity to Ion-Induced Burnout in SiC Schottky Diodes Compared to Si Schottky Diodes

C M Marques , A. Michez , F. Wrobel , S. Kuboyama , F. Saigné et al.
IEEE Transactions on Nuclear Science, 2025, pp.1-1. ⟨10.1109/TNS.2025.3561917⟩
Article dans une revue hal-05046464 v1
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Design and Characterization of a Radiation Tolerant Wireless Physical Layer for Control Applications in CERN Particle Accelerators

Antonio Scialdone , Rudy Ferraro , Salvatore Danzeca , Frederic Saigne , Jerome Boch et al.
IEEE Transactions on Nuclear Science, 2025, pp.1-1. ⟨10.1109/TNS.2025.3537402⟩
Article dans une revue hal-04928274 v1
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Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells

Cleiton Marques , Frédéric Wrobel , Ygor Aguiar , Alain Michez , Frédéric Saigné et al.
Electronics, 2024, 13 (10), pp.1954. ⟨10.3390/electronics13101954⟩
Article dans une revue hal-04607285 v1
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Investigation of Single-Event Effects for Space Applications: Instrumentation for In-Depth System Monitoring

André Martins Pio de Mattos , Douglas Almeida dos Santos , Lucas Matana Luza , Viyas Gupta , Luigi Dilillo
Electronics, 2024, 13 (10), pp.1822. ⟨10.3390/electronics13101822⟩
Article dans une revue hal-04666202 v1
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A Dependable and Low-Cost CCSDS 123 Hyperspectral Image Compressor

Wesley Grignani , Douglas A Santos , Felipe Viel , Luigi Dilillo , Douglas R Melo
IEEE Embedded Systems Letters, In press, ⟨10.1109/les.2024.3420934⟩
Article dans une revue hal-04666210 v1
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The CELESTA CubeSat In-Flight Radiation Measurements and their Comparison with Ground Facilities Predictions

Andrea Coronetti , Alessandro Zimmaro , Rubén García Alía , Salvatore Danzeca , Alessandro Masi et al.
IEEE Transactions on Nuclear Science, In press, ⟨10.1109/TNS.2024.3376749⟩
Article dans une revue hal-04526716 v1

Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring

Ivan Slipukhin , Andrea Coronetti , Rubén García Alía , Frédéric Saigné , Jérôme Boch et al.
IEEE Transactions on Nuclear Science, 2024, 71 (8), pp.1948-1955. ⟨10.1109/TNS.2024.3424201⟩
Article dans une revue hal-04715015 v1
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Characterization of Single-Event Effects in a Microcontroller with an Artificial Neural Network Accelerator

Carolina Imianosky , André Martins Pio de Mattos , Douglas Almeida dos Santos , Douglas Rossi de Melo , Maria Kastriotou et al.
Electronics, 2024, 13 (22), ⟨10.3390/electronics13224461⟩
Article dans une revue hal-04811422 v1
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SRAM-based heavy ion beam flux and LET dosimetry

Andrea Coronetti , Rubén García-Alía , Luigi Dilillo , Carolina Imianosky , Douglas Almeida dos Santos et al.
IEEE Transactions on Nuclear Science, In press, ⟨10.1109/TNS.2024.3487647⟩
Article dans une revue hal-04715265 v1
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Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip

Douglas Almeida dos Santos , Pablo M. Aviles , André Martins Pio de Mattos , Mario García-Valderas , Luis Entrena et al.
IEEE Transactions on Nuclear Science, In press, ⟨10.1109/tns.2024.3406021⟩
Article dans une revue hal-04666207 v1
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Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories On-Board PROBA-V

André Martins Pio de Mattos , Douglas Almeida dos Santos , Lucas Matana Luza , Viyas Gupta , Thomas Borel et al.
IEEE Transactions on Nuclear Science, 2024, 71 (8), pp.1614-1622. ⟨10.1109/tns.2024.3378668⟩
Article dans une revue hal-04526731 v1

CRaTeBo: a high-speed, radiation-tolerant and versatile testing platform for FPGA radiation qualification for high-energy particle accelerator applications

Antonio Scialdone , Panagiotis Gkountoumis , Rudy Ferraro , Manoel Barros Marin , Luigi Dilillo et al.
Journal of Instrumentation, 2024, 19 (01), pp.P01012. ⟨10.1088/1748-0221/19/01/P01012⟩
Article dans une revue hal-04412765 v1
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A Survey on Deep Learning Resilience Assessment Methodologies

Annachiara Ruospo , Ernesto Sanchez , Lucas Matana Luza , Luigi Dilillo , Marcello Traiola et al.
Computer, 2023, 56, pp.57-66. ⟨10.1109/MC.2022.3217841⟩
Article dans une revue lirmm-03834128 v1
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Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMs

Daniel Söderström , Lucas Matana Luza , André Martins Pio de Mattos , Thierry Gil , Heikki Kettunen et al.
IEEE Transactions on Nuclear Science, 2023, 70 (8), pp.1861-1869. ⟨10.1109/TNS.2023.3295435⟩
Article dans une revue hal-04192915 v1

Exploring Radiation-Induced Vulnerabilities in RFICs through Traditional RF Metrics

Antonio Scialdone , Rudy Ferraro , Luigi Dilillo , Frederic Saigne , Jérôme Boch et al.
IEEE Transactions on Nuclear Science, 2023, 70 (8), pp.2068-2075. ⟨10.1109/TNS.2023.3270206⟩
Article dans une revue hal-04120913 v1
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Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-Chip

Douglas Almeida dos Santos , André Martins Pio de Mattos , Douglas Melo , Luigi Dilillo
Electronics, 2023, 12 (12), pp.2557. ⟨10.3390/electronics12122557⟩
Article dans une revue hal-04120525 v1
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Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks

Lucas Matana Luza , Annachiara Ruospo , Daniel Soderstrom , Carlo Cazzaniga , Maria Kastriotou et al.
IEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882. ⟨10.1109/TETC.2021.3116999⟩
Article dans une revue lirmm-03382380 v1
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A Survey of the RISC-V Architecture Software Support

Benjamin William Mezger , Douglas Almeida dos Santos , Luigi Dilillo , Cesar A Zeferino , Douglas Rossi de Melo
IEEE Access, 2022, 10, pp.51394-51411. ⟨10.1109/ACCESS.2022.3174125⟩
Article dans une revue lirmm-03737820 v1
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Neutron-Induced Effects on a Self-Refresh DRAM

Lucas Matana Luza , Daniel Söderström , Helmut Puchner , Rubén García Alía , Manon Letiche et al.
Microelectronics Reliability, 2022, 128, pp.#114406. ⟨10.1016/j.microrel.2021.114406⟩
Article dans une revue lirmm-03435635 v1
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Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment

Daniel Söderström , Lucas Matana Luza , Heikki Kettunen , Arto Javanainen , Wilfrid Farabolini et al.
IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.716-723. ⟨10.1109/TNS.2021.3068186⟩
Article dans une revue lirmm-03358914 v1
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On the evaluation of FPGA radiation benchmarks

Gaetan Bricas , Georgios Tsiligiannis , Antoine Touboul , Jérôme Boch , Maria Kastriotou et al.
Microelectronics Reliability, 2021, 126, pp.#114276. ⟨10.1016/j.microrel.2021.114276⟩
Article dans une revue lirmm-03382368 v1
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Reliability analysis of a fault-tolerant RISC-V system-on-chip

Douglas Almeida dos Santos , Lucas Matana Luza , Luigi Dilillo , Cesar Albenes Zeferino , Douglas Rossi de Melo
Microelectronics Reliability, 2021, 125, pp.#114346. ⟨10.1016/j.microrel.2021.114346⟩
Article dans une revue lirmm-03358839 v1

COTS Optocoupler Radiation Qualification Process for LHC Applications Based on Mixed-Field Irradiations

Rudy Ferraro , Gilles Foucard , Angelo Infantino , Luigi Dilillo , Markus Brugger et al.
IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1395-1403. ⟨10.1109/TNS.2020.2972777⟩
Article dans une revue hal-02911961 v1
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Pre-flight qualification test procedure for nanosatellites using sounding rockets

Leonardo Kessler Slongo , João Gabriel Reis , Daniel Gaiki , Pedro von Hohendorff Seger , Bruno Vale Barbosa Eiterer et al.
Acta Astronautica, 2019, 159, pp.564-577. ⟨10.1016/j.actaastro.2019.01.035⟩
Article dans une revue lirmm-02415535 v1
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Maximizing the Inner Resilience of a Network-on-Chip through Router Controllers Design

Douglas Rossi de Melo , Cesar A. Zeferino , Luigi Dilillo , Eduardo Augusto Bezerra
Sensors, 2019, 19 (24), pp.5416-5439. ⟨10.3390/s19245416⟩
Article dans une revue lirmm-02547726 v1
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Improvement of the Tolerated Raw Bit Error Rate in NAND Flash-based SSDs with Selective Refresh

Emna Farjallah , Jean-Marc Armani , Valentin Gherman , Luigi Dilillo
Microelectronics Reliability, 2019, 96, pp.37-45. ⟨10.1016/j.microrel.2019.01.014⟩
Article dans une revue lirmm-02008002 v1

Study of the impact of the LHC radiation environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic Components

Rudy Ferraro , Salvatore Danzeca , Chiara Cangialosi , Rubén García Alía , Francesco Cerutti et al.
IEEE Transactions on Nuclear Science, 2019, 66 (7), pp.1548-1556. ⟨10.1109/TNS.2019.2902441⟩
Article dans une revue lirmm-02016480 v1
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Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere et al.
IEEE Transactions on Nuclear Science, 2018, 65 (8), pp.1708-1714. ⟨10.1109/TNS.2018.2797543⟩
Article dans une revue lirmm-02007922 v1

A calculation method to estimate single event upset cross section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Jérôme Boch et al.
Microelectronics Reliability, 2017, 76-77, pp.644-649. ⟨10.1016/j.microrel.2017.07.056⟩
Article dans une revue hal-01636059 v1
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Design of a radiation tolerant system for total ionizing dose monitoring using floating gate and RadFET dosimeters

Rudy Ferraro , Salvatore Danzeca , Matteo Brucoli , Alessandro Masi , Markus Brugger et al.
Journal of Instrumentation, 2017, 12 (4), pp.#C04007. ⟨10.1088/1748-0221/12/04/C04007⟩
Article dans une revue lirmm-01513884 v1

Design for Test and Diagnosis of Power Switches

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel et al.
Journal of Circuits, Systems, and Computers, 2016, 25 (3), pp.1640013. ⟨10.1142/S0218126616400132⟩
Article dans une revue lirmm-01272986 v1

Proton-Induced Single-Event Degradation in SDRAMs

Axel Rodriguez , Frédéric Wrobel , Anne Samaras , Francoise Bezerra , Benjamin Vandevelde et al.
IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2115-2121. ⟨10.1109/TNS.2016.2551733⟩
Article dans une revue lirmm-01382563 v1

Methodologies for the Statistical Analysis of Memory Response to Radiation

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Christopher Frost , Ali Mohammad Zadeh et al.
IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2122-2128. ⟨10.1109/TNS.2016.2527781⟩
Article dans une revue lirmm-01382508 v1

The Power Law Shape of Heavy Ions Experimental Cross Section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Eric Lorfèvre et al.
IEEE Transactions on Nuclear Science, 2016, 64 (1), pp.427-433. ⟨10.1109/TNS.2016.2608004⟩
Article dans une revue lirmm-01382480 v1

Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammad Zadeh , Arto Javanainen et al.
IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2010-2015. ⟨10.1109/TNS.2016.2559943⟩
Article dans une revue lirmm-01382552 v1

Soft errors in commercial off-the-shelf static random access memories

Luigi Dilillo , Georgios Tsiligiannis , Viyas Gupta , Alexandre Louis Bosser , Frédéric Saigné et al.
Semiconductor Science and Technology, 2016, Special Issue on Radiation Effects in Semiconductor Devices, 32 (1), ⟨10.1088/1361-6641/32/1/013006⟩
Article dans une revue lirmm-01434747 v1

SEE on Different Layers of Stacked-SRAMs

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Mathias Rousselet , Ali Mohammad Zadeh et al.
IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2673-2678. ⟨10.1109/TNS.2015.2496725⟩
Article dans une revue lirmm-01254148 v1

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen et al.
IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2620-2626. ⟨10.1109/TNS.2015.2496874⟩
Article dans une revue lirmm-01254157 v1

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2014, 22 (11), pp.2326-2335. ⟨10.1109/TVLSI.2013.2294080⟩
Article dans une revue lirmm-01248578 v1
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90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3389-3394. ⟨10.1109/TNS.2014.2363120⟩
Article dans une revue hal-04056468 v1

Dynamic Compact Model of Self-Referenced Magnetic Tunnel Junction

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
IEEE Transactions on Electron Devices, 2014, 61 (11), pp.3877-3882. ⟨10.1109/TED.2014.2355418⟩
Article dans une revue lirmm-01272978 v1
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Intra-Cell Defects Diagnosis

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
Journal of Electronic Testing: : Theory and Applications, 2014, 30 (5), pp.541-555. ⟨10.1007/s10836-014-5481-5⟩
Article dans une revue lirmm-01272964 v1

Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

Lionel Foro , Antoine Touboul , Alain Michez , Frédéric Wrobel , Paolo Rech et al.
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1739-1746. ⟨10.1109/TNS.2014.2332813⟩
Article dans une revue lirmm-01237646 v1

On the Test and Mitigation of Malfunctions in Low-Power SRAMs

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel et al.
Journal of Electronic Testing: : Theory and Applications, 2014, 30 (5), pp.611-627. ⟨10.1007/s10836-014-5479-z⟩
Article dans une revue lirmm-01238443 v1

Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Vincent Pouget , Frédéric Saigné
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1813-1818. ⟨10.1109/TNS.2014.2299762⟩
Article dans une revue lirmm-01234429 v1

Dynamic Test Methods for COTS SRAMs

Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard et al.
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3095-3102. ⟨10.1109/TNS.2014.2363123⟩
Article dans une revue lirmm-01234463 v1

A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and Systems

Ahn Duc Tran , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel et al.
Journal of Electronic Testing: : Theory and Applications, 2014, 30 (4), pp.401-413. ⟨10.1007/s10836-014-5459-3⟩
Article dans une revue lirmm-01272958 v1

An SRAM Based Monitor for Mixed-Field Radiation Environments

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1663-1670. ⟨10.1109/TNS.2014.2299733⟩
Article dans une revue lirmm-01234441 v1
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Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
Journal of Instrumentation, 2014, 9 (5), pp.#C05052. ⟨10.1088/1748-0221/9/05/C05052⟩
Article dans une revue lirmm-01234448 v1
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Globally Constrained Locally Optimized 3-D Power Delivery Networks

Aida Todri-Sanial , Sandip Kundu , Patrick Girard , Alberto Bosio , Luigi Dilillo et al.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2014, 22 (10), pp.2131-2144. ⟨10.1109/TVLSI.2013.2283800⟩
Article dans une revue lirmm-01255754 v1

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Robert Ecoffet et al.
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3564-3571. ⟨10.1109/TNS.2014.2368613⟩
Article dans une revue lirmm-01234461 v1
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Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Tarek Saad Saoud , Soilihi Moindjie , Jean-Luc Autran , Daniela Munteanu , Frédéric Wrobel et al.
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3380-3388. ⟨10.1109/TNS.2014.2365038⟩
Article dans une revue lirmm-01234455 v1

Multiple Cell Upset Classification in Commercial SRAMs

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1747-1754. ⟨10.1109/TNS.2014.2313742⟩
Article dans une revue lirmm-01234446 v1

Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere et al.
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2386-2391. ⟨10.1109/TNS.2013.2257847⟩
Article dans une revue lirmm-01234425 v1
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Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2013, 21 (5), pp.958-970. ⟨10.1109/TVLSI.2012.2197427⟩
Article dans une revue lirmm-00806774 v1
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A Study of Tapered 3-D TSVs for Power and Thermal Integrity

Aida Todri-Sanial , Sandip Kundu , Patrick Girard , Alberto Bosio , Luigi Dilillo et al.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2013, 21 (2), pp.306-319. ⟨10.1109/TVLSI.2012.2187081⟩
Article dans une revue lirmm-00806776 v1

Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption

Paolo Bernardi , Mauricio de Carvalho , Ernesto Sanchez , Matteo Sonza Reorda , Alberto Bosio et al.
Journal of Low Power Electronics, 2013, 9 (2), pp.253-263. ⟨10.1166/jolpe.2013.1259⟩
Article dans une revue lirmm-00934937 v1

Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial et al.
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2617-2622. ⟨10.1109/TNS.2013.2239311⟩
Article dans une revue lirmm-00805005 v1

Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM cell

Frédéric Wrobel , Antoine Touboul , Luigi Dilillo , Frédéric Saigné
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2537-2541. ⟨10.1109/TNS.2012.2235148⟩
Article dans une revue lirmm-00805001 v1

A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere et al.
IEEE Transactions on Nuclear Science, 2013, 60 (5), pp.3603-3608. ⟨10.1109/TNS.2013.2264957⟩
Article dans une revue lirmm-01234419 v1

Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Jérôme Boch et al.
IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩
Article dans une revue lirmm-00805031 v1

Embedded silicon detector to investigate the natural radiative environment

Denis Pantel , Jean-Roch Vaillé , Frédéric Wrobel , Luigi Dilillo , Jean-Marc J.-M. Galliere et al.
Journal of Instrumentation, 2012, 7 (5), pp.1-11. ⟨10.1088/1748-0221/7/05/P05007⟩
Article dans une revue lirmm-00805011 v1

Analysis and Fault Modeling of Actual Resistive Defects in ATMELtm eFlash Memories

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
Journal of Electronic Testing: : Theory and Applications, 2012, 28 (2), pp.215-228. ⟨10.1007/s10836-012-5277-4⟩
Article dans une revue istex lirmm-00806773 v1

Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
Journal of Electronic Testing: : Theory and Applications, 2012, 28 (3), pp.317-329. ⟨10.1007/s10836-012-5291-6⟩
Article dans une revue istex lirmm-00805017 v1

Neutron-Induced Failure in Silicon IGBTs, Silicon Super-Junction and SiC MOSFETs

Alessio Griffoni , Jeroen van Duivenbode , Dimitri Linten , Eddy Simoen , Paolo Rech et al.
IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.866-871. ⟨10.1109/TNS.2011.2180924⟩
Article dans une revue lirmm-00805039 v1

Experimental Characterization of Atmospheric Radiation Environment with Stratospheric Balloon

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Paolo Rech et al.
IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.945-951. ⟨10.1109/TNS.2011.2136359⟩
Article dans une revue lirmm-00805045 v1

Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné et al.
IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩
Article dans une revue lirmm-00805046 v1

SoC Yield Improvement - Using TMR Architectures for Manufacturing Defect Tolerance in Logic Cores

Julien Vial , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
International Journal On Advances in Systems and Measurements, 2010, 3 (1/2), pp.1-10
Article dans une revue lirmm-00553567 v1

A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for LOS and LOC Schemes

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
Journal of Low Power Electronics, 2010, 6 (2), pp.359-374. ⟨10.1166/jolpe.2010.1086⟩
Article dans une revue lirmm-00553548 v1

New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAM Memories

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri et al.
Journal of Integrated Circuits and Systems, 2008, 3 (1), pp.7-12. ⟨10.29292/jics.v3i1.276⟩
Article dans une revue lirmm-00341793 v1
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Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
Journal of Electronic Testing: : Theory and Applications, 2007, 23 (3), pp.435-444. ⟨10.1007/s10836-007-5003-9⟩
Article dans une revue lirmm-00194254 v1

Reducing Power Dissipation in SRAM During Test

Luigi Dilillo , Paul Rosinger , Bashir Al-Hashimi , Patrick Girard
Journal of Low Power Electronics, 2006, 2 (2), pp.271-280. ⟨10.1166/jolpe.2006.062⟩
Article dans une revue lirmm-00137590 v1

ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions

Patrick Girard , Luigi Dilillo , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan et al.
Journal of Electronic Testing: : Theory and Applications, 2006, 22 (3), pp.287-296. ⟨10.1007/s10836-006-7761-1⟩
Article dans une revue istex lirmm-00134769 v1
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Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri et al.
Journal of Electronic Testing: : Theory and Applications, 2005, 21 (5), pp.551-561. ⟨10.1007/s10836-005-1169-1⟩
Article dans une revue istex lirmm-00105314 v1
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Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test

Simone Borri , Magali Bastian Hage-Hassan , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
Journal of Electronic Testing: : Theory and Applications, 2005, 21 (2), pp.169-179. ⟨10.1007/s10836-005-6146-1⟩
Article dans une revue lirmm-00105313 v1
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Physical Explanation for the Higher Sensitivity to Ion-Induced Burnout in SiC Schottky Diodes Compared to Si Schottky Diodes

Cleiton Marques , Alain Michez , Frédéric Wrobel , S. Kuboyama , Frédéric Saigné et al.
RADiation Effects on Components and Systems (RADECS), Sep 2024, Maspalomas, Canary Islands, Spain
Communication dans un congrès hal-04715410 v1
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Reliability Analysis of a Low-Cost CCSDS 123 Hyperspectral Image Compressor

Wesley Grignani , Douglas A Santos , Luigi Dilillo , Douglas R Melo
37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom
Communication dans un congrès hal-04715407 v1
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Implementation and Reliability Evaluation of a ChaCha20 Stream Cipher Hardware Accelerator

Wesley Grignani , Khalil G Q Santana , Douglas Almeida dos Santos , Luigi Dilillo , Douglas R Melo
37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom
Communication dans un congrès hal-04715408 v1
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Reliability and Performance Evaluation of a RISC-V Vector Extension Unit for Vector Multiplication

Carolina Imianosky , Douglas A Santos , Douglas R Melo , Felipe Viel , Luigi Dilillo
37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom
Communication dans un congrès hal-04715405 v1
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Hardening a Real-Time Operating System for a Dependable RISC-V System-on-Chip

Benjamin Mezger , Douglas Santos , Luigi Dilillo , Douglas Melo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313566⟩
Communication dans un congrès hal-04266886 v1
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A Low-Cost Hardware Accelerator for CCSDS 123 Lossless Hyperspectral Image Compression

Wesley Grignani , Douglas Santos , Luigi Dilillo , Felipe Viel , Douglas Melo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313567⟩
Communication dans un congrès hal-04266881 v1
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Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-V

André Martins Pio de Mattos , Douglas Almeida dos Santos , Viyas Gupta , Thomas Borel , Luigi Dilillo
RADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Communication dans un congrès hal-04266897 v1
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Enhancement of System Observability During System-Level Radiation Testing through Total Current Consumption Monitoring

Ivan Slipukhin , Andrea Coronetti , Rubén García Alía , Frédéric Saigné , Jérôme Boch et al.
2023 European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Communication dans un congrès hal-04266900 v1
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Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh Environments

André Martins Pio de Mattos , Douglas Almeida dos Santos , Carolina Imianosky , Douglas Rossi Melo , Luigi Dilillo
IWASI 2023 - 9th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2023, Bari, Italy. pp.227-232, ⟨10.1109/IWASI58316.2023.10164578⟩
Communication dans un congrès hal-04266899 v1
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Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip

Douglas Almeida dos Santos , Pablo M. Aviles , André Martins Pio de Mattos , Mario García Valderas , Luis Entrena et al.
RADECS 2023 - 23rd European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Communication dans un congrès hal-04266891 v1
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Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space Environments

Douglas Santos , André Martins Pio de Mattos , Douglas Melo , Luigi Dilillo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313549⟩
Communication dans un congrès hal-04266887 v1
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Implementation and Reliability Evaluation of a RISC-V Vector Extension Unit

Carolina Imianosky , Douglas Santos , Douglas Melo , Felipe Viel , Luigi Dilillo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313569⟩
Communication dans un congrès hal-04266888 v1

CRATEBO: A High-speed, Radiation-Tolerant and Versatile Testing Platform for FPGA Radiation Qualification for High-Energy Particle Accelerator applications

Antonio Scialdone , Rudy Ferraro , Panagiotis Gkountoumis , Salvatore Danzeca , Luigi Dilillo et al.
TWEPP 2023 Topical Workshop on Electronics for Particle Physics, Oct 2023, Geremeas, Italy
Communication dans un congrès hal-04122431 v1

Hybrid Radiation Hardening Approach: a RISC-V System-on-Chip case study

Luigi Dilillo , Douglas Almeida dos Santos , Lucas Matana Luza , André Martins Pio de Mattos , Douglas Rossi de Melo et al.
G-RADNEXT Workshop, Nov 2023, Geneva, Switzerland
Communication dans un congrès hal-04296178 v1

Radiation-induced SEL in a COTS SRAM memory - test and flight data

Douglas Almeida dos Santos , Lucas Matana Luza , André Martins Pio de Mattos , Thomas Borel , Viyas Gupta et al.
TEC-QEC Final Presentation Days, Jun 2023, Noordwijk, Netherlands
Communication dans un congrès hal-04295893 v1

Objectives and outcomes of WP6 in the second year of RADNEXT: Methodologies for Radiation Test of Systems

Luigi Dilillo , Luis Entrena
RADNEXT 2nd Annual Meeting, May 2023, Seville, Spain
Communication dans un congrès hal-04296158 v1
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Qualification methodology for Radio Frequency Integrated Circuit for wireless-based platforms in radiation environments

Antonio Scialdone , Rudy Ferraro , Luigi Dilillo , Frédéric Saigné , Jérôme Boch et al.
RADECS 2022 - 22nd European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy
Communication dans un congrès hal-04124165 v1
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Effects of High-Energy Protons on a Self-Refresh DRAM

Lucas Matana Luza , Carolina Imianosky , André Martins Pio de Mattos , Douglas Almeida dos Santos , Daniel Söderström et al.
SELSE 2022 - 18th IEEE Workshop on Silicon Errors in Logic – System Effects, May 2022, Virtual Event, Italy
Communication dans un congrès lirmm-03832662 v1
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Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Douglas Almeida dos Santos , André Martins Pio de Mattos , Lucas Matana Luza , Carlo Cazzaniga , Maria Kastriotou et al.
DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2022, Austin, United States. pp.1-6, ⟨10.1109/DFT56152.2022.9962335⟩
Communication dans un congrès lirmm-03833983 v1
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Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices

Lucas Matana Luza , Frédéric Wrobel , Luis Entrena , Luigi Dilillo
ETS 2022 - 27th IEEE European Test Symposium, May 2022, Barcelona, Spain. pp.1-10, ⟨10.1109/ets54262.2022.9810454⟩
Communication dans un congrès lirmm-03833958 v1

Objectives and outcomes of WP6 in the first year of RADNEXT Methodologies for Radiation test of Systems

Luigi Dilillo
RADNEXT DAYS 2022 - 1st Annual Meeting, Jun 2022, Geneva, Switzerland
Communication dans un congrès hal-04295913 v1
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A Model-Based Framework to Assess the Reliability of Safety-Critical Applications

Lucas Matana Luza , Annachiara Ruospo , Alberto Bosio , Ernesto Sanchez , Luigi Dilillo
DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩
Communication dans un congrès hal-03266848 v1
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Characterization of a RISC-V System-on-Chip under Neutron Radiation

Douglas Almeida dos Santos , Lucas Matana Luza , Maria Kastriotou , Carlo Cazzaniga , Cesar A Zeferino et al.
DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505054⟩
Communication dans un congrès lirmm-03357515 v1
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Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip Router

Douglas Rossi de Melo , Cesar Albenes Zeferino , Eduardo Augusto Bezerra , Luigi Dilillo
DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505053⟩
Communication dans un congrès lirmm-03358975 v1
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Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study

Lucas Matana Luza , Daniel Söderström , André Martins Pio de Mattos , Eduardo Augusto Bezerra , Carlo Cazzaniga et al.
DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
Communication dans un congrès lirmm-03357444 v1
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Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks

Annachiara Ruospo , Lucas Matana Luza , Alberto Bosio , Marcello Traiola , Luigi Dilillo et al.
LATS 2021 - 22nd IEEE Latin American Test Symposium, Oct 2021, Punta del Este, Uruguay. pp.1-5, ⟨10.1109/LATS53581.2021.9651807⟩
Communication dans un congrès lirmm-03435567 v1
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A Low-Cost Fault-Tolerant RISC-V Processor for Space Systems

Douglas Almeida dos Santos , Lucas Matana Luza , Cesar Albenes Zeferino , Luigi Dilillo , Douglas Rossi de Melo
DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-5, ⟨10.1109/DTIS48698.2020.9081185⟩
Communication dans un congrès lirmm-03026132 v1
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Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

Lucas Matana Luza , Daniel Soderstrom , Georgios Tsiligiannis , Helmut Puchner , Carlo Cazzaniga et al.
DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩
Communication dans un congrès lirmm-03025736 v1
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Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment

Daniel Soderstrom , Lucas Matana Luza , Heikki Kettunen , Arto Javanainen , Wilfrid Farabolini et al.
NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference, Nov 2020, Santa Fe (virtual), United States
Communication dans un congrès lirmm-03028881 v1

COTS Optocoupler radiation qualification process for LHC applications based on mixed-energy neutron irradiations

Rudy Ferraro , Gilles Foucard , Angelo Infantino , Luigi Dilillo , Markus Brugger et al.
RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. pp.1395-1403, ⟨10.1109/TNS.2020.2972777⟩
Communication dans un congrès hal-03363644 v1
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Characterization of a RISC-V Microcontroller Through Fault Injection

Dario Asciolla , Luigi Dilillo , Douglas Almeida dos Santos , Douglas Melo , Alessandra Menicucci et al.
APPLEPIES 2019 - International Conference on Applications in Electronics Pervading Industry, Environment and Society, Sep 2019, Pisa, Italy. pp.91-101, ⟨10.1007/978-3-030-37277-4_11⟩
Communication dans un congrès lirmm-03025657 v1
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Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

Lucas Matana Luza , Daniel Soderstrom , Helmut Puchner , Ruben Garcia Alia , Manon Letiche et al.
DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩
Communication dans un congrès lirmm-03025721 v1
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On-board Compressing of Hyperspectral Images using CCSDS 123

Douglas Almeida dos Santos , Cesar Albenes Zeferino , Eduardo Augusto Bezerra , Luigi Dilillo , Douglas Rossi Melo
COTB 2020 - Anais do XI Computer on the Beach, Sep 2020, Balneário Camboriú, Brazil. pp.332-336, ⟨10.14210/cotb.v11n1.p332-336⟩
Communication dans un congrès lirmm-03025767 v1
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Stuck and Weakened Bits in SDRAM from a Heavy-Ion Microbeam

Daniel Söderström , Lucas Matana Luza , Alexandre Bosser , Thierry Gil , Kay-Obbe Voss et al.
RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. ⟨10.1109/RADECS47380.2019.9745715⟩
Communication dans un congrès lirmm-03359010 v1
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Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash

Viyas Gupta , Alexandre Louis Bosser , Lucas Matana Luza , Daniel Söderström , Arto Javanainen et al.
RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. ⟨10.1109/RADECS47380.2019.9745668⟩
Communication dans un congrès lirmm-03358989 v1
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Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory

Lucas Matana Luza , Alexandre Bosser , Viyas Gupta , Arto Javanainen , Ali Mohammadzadeh et al.
DFT 2019 - 32th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2019, Noordwijk, Netherlands. pp.1-6, ⟨10.1109/DFT.2019.8875475⟩
Communication dans un congrès lirmm-03025660 v1
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Design and Implementation of a Flexible Interface for TID Detector

Iacopo Fara , Lucas Matana Luza , Jérôme Boch , Gianluca Furano , Marco Ottavi et al.
IWASI 2019 - 8th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2019, Otranto, Italy. pp.158-162, ⟨10.1109/IWASI.2019.8791299⟩
Communication dans un congrès lirmm-02415559 v1
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A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites

Cézar Antônio Rigo , Lucas Matana Luza , Elder Dominghini Tramontin , Victor Martins , Sara Vega Martinez et al.
LATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. ⟨10.1109/LATW.2019.8704551⟩
Communication dans un congrès lirmm-02008436 v1
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Analyzing the Error Propagation in a Parameterizable Network-on-Chip Router

Douglas Rossi de Melo , Cesar Zeferino , Luigi Dilillo , Eduardo Augusto Bezerra
LATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. ⟨10.1109/LATW.2019.8704580⟩
Communication dans un congrès lirmm-02008414 v1

Study of the Impact of the LHC Radiation Environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic Components

Rudy Ferraro , Salvatore Danzeca , Luigi Dilillo , Chiara Cangialosi , Rubén García Alía et al.
RADECS: Radiation Effects on Components and Systems, Sep 2018, Göteborg, Sweden
Communication dans un congrès lirmm-02008384 v1
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Implementation of fault tolerance techniques for integrated network interfaces

Douglas Rossi de Melo , Cesar Zeferino , Antonio Ramos , Luigi Dilillo , Eduardo Augusto Bezerra
3rd IAA Latin American CubeSat Workshop (IAA-LACW 2018), Dec 2018, Ubatuba, Brazil
Communication dans un congrès lirmm-02008453 v1
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Evaluation of the temperature influence on SEU vulnerability of DICE and 6T-SRAM cells

Emna Farjallah , Valentin Gherman , Jean-Marc Armani , Luigi Dilillo
DTIS 2018 - 13th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, LIRMM, Apr 2018, Taormina, Italy. ⟨10.1109/DTIS.2018.8368578⟩
Communication dans un congrès lirmm-02008214 v1
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Enabling deep-space CubeSat missions through state-of-the-art radiation-hardened technologies

Lucas Matana Luza , Cézar Antônio Rigo , Elder Dominghini Tramontin , Victor Manuel Goncalves Martins , Sara Vega Martinez et al.
3rd IAA Latin American CubeSat Workshop (IAA-LACW 2018), Dec 2018, Ubatuba, Brazil
Communication dans un congrès lirmm-02008460 v1

A calculation method to estimate single event upset cross section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Jérôme Boch et al.
ESREF 2017 - 28th European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France. pp.644-649, ⟨10.1016/j.microrel.2017.07.056⟩
Communication dans un congrès hal-01929212 v1

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random- Access Memory

Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere et al.
RADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland
Communication dans un congrès hal-01929267 v1
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Improvement of the tolerated raw bit-error rate in NAND Flash-based SSDs with the help of embedded statistics

Valentin Gherman , Emna Farjallah , Jean-Marc Armani , Marcelino Seif , Luigi Dilillo
ITC 2017 - 48th International Test Conference, Oct 2017, Fort Worth, United States. ⟨10.1109/TEST.2017.8242066⟩
Communication dans un congrès lirmm-01582185 v1
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Refresh frequency reduction of data stored in SSDs based on A-timer and timestamps

Marcelino Seif , Emna Farjallah , Franck Badets , Emna Chabchoub , Christophe Layer et al.
ETS 2017 - 22nd IEEE European Test Symposium, May 2017, Limassol, Cyprus. pp.7968233, ⟨10.1109/ETS.2017.7968233⟩
Communication dans un congrès lirmm-01687675 v1

The Power Law Shape of Heavy Ions Experimental Cross Section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Eric Lorfèvre et al.
NSREC: Nuclear and Space Radiation Effects Conference, IEEE NPSS (Nuclear & Plasma Sciences Society ), Jul 2016, Portland, United States
Communication dans un congrès lirmm-01298421 v1

An effective BIST architecture for power-gating mechanisms in low-power SRAMs

Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel , Leonardo B. Zordan
ISQED 2016 - 17th International Symposium on Quality Electronic Design, Mar 2016, Santa Clara, CA, United States. pp.185-191, ⟨10.1109/ISQED.2016.7479198⟩
Communication dans un congrès lirmm-01457424 v1

Muon effects on SRAMs

Luigi Dilillo
RADSOL: Electronique et rayonnements naturels au niveau du sol, CNRS - GDR ERRATA, Jun 2016, Paris, France
Communication dans un congrès lirmm-01382532 v1

MTCube project: COTS memory SEE ground-test results and in-orbit error rate prediction

Viyas Gupta , Alexandre Louis Bosser , Frédéric Wrobel , Frédéric Saigné , Laurent Dusseau et al.
4S: Small Satellites Systems and Services Symposium, Centre national d'études spatiales (CNES); European Space Agency (ESA), May 2016, La Valletta, Malta
Communication dans un congrès lirmm-01298423 v1
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Design of a Radiation Tolerant System for Total Ionizing Dose Monitoring Using Floating Gate and RadFET Dosimeters

Rudy Ferraro , Salvatore Danzeca , Matteo Brucoli , Alessandro Masi , Markus Brugger et al.
TWEPP: Topical Workshop on Electronics for Particle Physics, Sep 2016, Karlsruhe, Germany
Communication dans un congrès lirmm-01382578 v1

Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAM

Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Helmut Puchner et al.
RADECS: Radiation and Its Effects on Components and Systems, Sep 2016, Bremen, Germany
Communication dans un congrès lirmm-01337405 v1

Proton-Induced SDRAM Cell Degradation

Axel Rodriguez , Frédéric Wrobel , Anne Samaras , Francoise Bezerra , Benjamin Vandevelde et al.
RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365650⟩
Communication dans un congrès lirmm-01238408 v1

Methods for radiation test of memories

Luigi Dilillo
RADSOL: Electronique et rayonnements naturels au niveau du sol, GDR ERRATA (CNRS), Jun 2015, Paris, France
Communication dans un congrès lirmm-01238437 v1

Scan-chain intra-cell defects grading

Aymen Touati , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel et al.
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127349⟩
Communication dans un congrès lirmm-01272696 v1

An effective hybrid fault-tolerant architecture for pipelined cores

Imran Wali , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. ⟨10.1109/ETS.2015.7138733⟩
Communication dans un congrès lirmm-01272730 v1

An effective ATPG flow for Gate Delay Faults

Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel , Paolo Bernardi et al.
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127350⟩
Communication dans un congrès lirmm-01272719 v1

Real-Time SRAM Based Particle Detector

Luigi Dilillo , Alexandre Louis Bosser , Viyas Gupta , Frédéric Wrobel , Frédéric Saigné
IWASI: International Workshop on Advances in Sensors and Interfaces, Politecnico di Bari, Jun 2015, Gallipoli, Italy. pp.58-62, ⟨10.1109/IWASI.2015.7184968⟩
Communication dans un congrès lirmm-01238435 v1
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Exploring the impact of functional test programs re-used for power-aware testing

Aymen Touati , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel et al.
DATE 2015 - 18th Design, Automation and Test in Europe Conference and Exhibition, Mar 2015, Grenoble, France. pp.1277-1280, ⟨10.7873/DATE.2015.1031⟩
Communication dans un congrès lirmm-01272937 v1

A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Rudy Ferraro , Christopher Frost et al.
RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365578⟩
Communication dans un congrès lirmm-01238397 v1

Design-for-Diagnosis Architecture for Power Switches

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel et al.
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.43-48, ⟨10.1109/DDECS.2015.18⟩
Communication dans un congrès lirmm-01272684 v1

An ATPG Flow to Generate Crosstalk-Aware Path Delay Pattern

Anu Asokan , Alberto Bosio , Arnaud Virazel , Luigi Dilillo , Patrick Girard et al.
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.515-520, ⟨10.1109/ISVLSI.2015.99⟩
Communication dans un congrès lirmm-01272933 v1

Generic Analytic Expression of Heavy Ion SEU Cross Section Derived from Monte-Carlo Diffusion-Based Prediction Code

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Robert Ecoffet et al.
NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States
Communication dans un congrès lirmm-01238388 v1

Impact of Stacked-Layer Structure on SEE Rate of SRAMs

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammadzadeh , Arto Javanainen et al.
NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States
Communication dans un congrès lirmm-01238384 v1

Heavy-ion radiation impact on a 4Mb FRAM under Different Test Conditions

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammadzadeh , Arto Javanainen et al.
RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365617⟩
Communication dans un congrès lirmm-01238392 v1

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen et al.
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, MA, United States. ⟨10.1109/TNS.2015.2496874⟩
Communication dans un congrès hal-01932433 v1

On the Generation of Diagnostic Test Set for Intra-cell Defects

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel et al.
ATS: Asian Test Symposium, Nov 2014, Hangzhou, China. pp.312-317, ⟨10.1109/ATS.2014.57⟩
Communication dans un congrès lirmm-01272539 v1

Radiation Study of a 4Mbit Ferroelectric RAM for Space Applications

Helmut Puchner , Georgios Tsiligiannis , Luigi Dilillo
SEE: Single Event Effects, Aeroflex Corporation, the Aerospace Corporation, Brigham Young University, Lockheed Martin, the NASA Electronic Parts and Packaging Program, the Naval Research Laboratory, Sandia National Laboratories, and Vanderbilt University, May 2014, San Diego, United States
Communication dans un congrès lirmm-01297441 v1

Timing-aware ATPG for critical paths with multiple TSVs

Carolina Momo Metzler , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.116-121, ⟨10.1109/DDECS.2014.6868774⟩
Communication dans un congrès lirmm-01248600 v1
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Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components

Alexandre Louis Bosser , Luigi Dilillo , Viyas Gupta , Arto Javanainen , Heikki Kettunen et al.
Physics Days, Finnish Physical Society, Tampere University of Technology (TUT), and Tavicon Ltd., Mar 2014, Tampere, Finland
Communication dans un congrès lirmm-01238439 v1
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An intra-cell defect grading tool

Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial , Stefano Bernabovi et al.
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.298-301, ⟨10.1109/DDECS.2014.6868814⟩
Communication dans un congrès lirmm-01248591 v1
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Presentation of the MTCube CubeSat Project

Viyas Gupta , Luigi Dilillo , Frédéric Wrobel , Ali Mohammad Zadeh , Muriel Bernard et al.
4S Symposium 2014 - Small Satellites Systems and Services, European Space Agency (ESA); Centre National d'Etudes Spatiales (CNES), May 2014, Majorca, Spain
Communication dans un congrès lirmm-01272951 v1
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TSV aware timing analysis and diagnosis in paths with multiple TSVs

Carolina Momo Metzler , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
VTS: VLSI Test Symposium, Apr 2014, Napa, CA, United States. ⟨10.1109/VTS.2014.6818772⟩
Communication dans un congrès lirmm-01248594 v1

A Comprehensive Evaluation of Functional Programs for Power-Aware Test

Aymen Touati , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
NATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. pp.69-72, ⟨10.1109/NATW.2014.23⟩
Communication dans un congrès lirmm-01248597 v1

Test of 90nm SRAMs at Concordia Station in Antarctica

Luigi Dilillo
RADSOL: Electronique et rayonnements naturels au niveau du sol, GDR ERRATA (CNRS); Institut Carnot STAR (Marseille), Jun 2014, Paris, France
Communication dans un congrès lirmm-01238438 v1
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A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply Noise

Anu Asokan , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2014, Tampa, FL, United States. pp.226-231, ⟨10.1109/ISVLSI.2014.42⟩
Communication dans un congrès lirmm-01248592 v1

Test and diagnosis of power switches

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Aida Todri-Sanial , Arnaud Virazel et al.
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.213-218, ⟨10.1109/DDECS.2014.6868792⟩
Communication dans un congrès lirmm-01248590 v1

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude Vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Tarek Saad Saoud , Soilihi Moindjie , Jean-Luc Autran , Daniela Munteanu , Frédéric Wrobel et al.
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès lirmm-01237717 v1

Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce

Anu Asokan , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.207-212, ⟨10.1109/DDECS.2014.6868791⟩
Communication dans un congrès lirmm-01248599 v1

Single Event Upset Prediction from Heavy Ions Cross Sections with No Parameters

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Frédéric Saigné
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès lirmm-01237668 v1

Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal consideration

Yuanqing Cheng , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
ASP-DAC: Asia and South Pacific Design Automation Conference, Jan 2014, Singapore, Singapore. pp.544-549, ⟨10.1109/ASPDAC.2014.6742948⟩
Communication dans un congrès lirmm-01248596 v1

iBoX — Jitter based Power Supply Noise sensor

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Aida Todri-Sanial , Arnaud Virazel et al.
ETS: European Test Symposium, May 2014, Paderborn, United States. ⟨10.1109/ETS.2014.6847830⟩
Communication dans un congrès lirmm-01248601 v1

Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès lirmm-01237709 v1

Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation

Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard et al.
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès lirmm-01237660 v1

Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults

Imran Wali , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.223-225, ⟨10.1109/DDECS.2014.6868794⟩
Communication dans un congrès lirmm-01248598 v1

SEU Cross Section Calculation Based on Experimental Data of Another kind of Particle

Annelise Touboul , Antoine Touboul , Frédéric Wrobel , V. Pouget , Luigi Dilillo et al.
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès hal-01934616 v1

Computing Detection Probability of Delay Defects in Signal Line TSVs

Carolina Momo Metzler , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
ETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569349⟩
Communication dans un congrès lirmm-00839044 v1

An Integrated Solid Detector For Onboard Detection Of Natural Radiations In Atmosphere

Frédéric Wrobel , Jean-Roch Vaillé , Antoine Touboul , Luigi Dilillo , Frédéric Saigné
iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL synchrotron, Jun 2013, Paris, France
Communication dans un congrès lirmm-01238432 v1

A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMs

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
VTS: VLSI Test Symposium, Apr 2013, Berkeley, CA, United States. pp.1-6, ⟨10.1109/VTS.2013.6548894⟩
Communication dans un congrès lirmm-00805366 v1
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Test Solution for Data Retention Faults in Low-Power SRAMs

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
DATE 2013 - 16th Design, Automation and Test in Europe Conference, Mar 2013, Grenoble, France. pp.442-447, ⟨10.7873/DATE.2013.099⟩
Communication dans un congrès lirmm-00805140 v1

A novel method to mitigate TSV electromigration for 3D ICs

Yuanqing Cheng , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Aug 2013, Natal, Brazil. pp.121-126, ⟨10.1109/ISVLSI.2013.6654633⟩
Communication dans un congrès lirmm-01248617 v1

On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell

Elena Ioana Vatajelu , Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard et al.
DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. pp.143-148, ⟨10.1109/DFT.2013.6653597⟩
Communication dans un congrès lirmm-01238413 v1
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Comparison of the transient current shapes obtained with the diffusion model and the double exponential law — Impact on the SER

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Frédéric Saigné
RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937441⟩
Communication dans un congrès lirmm-01237599 v1

SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variations

Georgios Tsiligiannis , Elena Ioana Vatajelu , Luigi Dilillo , Alberto Bosio , Patrick Girard et al.
IOLTS: International On-Line Testing Symposium, Jul 2013, Chania, Crete, Greece. pp.145-150, ⟨10.1109/IOLTS.2013.6604066⟩
Communication dans un congrès lirmm-00818955 v1

Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBT

Lionel Foro , Antoine Touboul , Frédéric Wrobel , Paolo Rech , Luigi Dilillo et al.
RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937428⟩
Communication dans un congrès lirmm-01237617 v1

On the Reuse of Read and Write Assist Circuits to Improve Test Efficiency in Low-Power SRAMs

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
ITC: International Test conference, Sep 2013, Anaheim, CA, United States. pp.1-10, ⟨10.1109/TEST.2013.6651927⟩
Communication dans un congrès lirmm-00818977 v1
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Performance Characterization of TAS-MRAM Architectures in Presence of Capacitive Defects

João Azevedo , Arnaud Virazel , Yuanqing Cheng , Alberto Bosio , Luigi Dilillo et al.
VALID: Advances in System Testing and Validation Lifecycle, Oct 2013, Venice, Italy. pp.39-44
Communication dans un congrès lirmm-01433308 v1

Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation Environments

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2013, Bari, Italy. pp.75-80, ⟨10.1109/IWASI.2013.6576070⟩
Communication dans un congrès lirmm-00839046 v1

Analyzing resistive-open defects in SRAM core-cell under the effect of process variability

Elena Ioana Vatajelu , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
ETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569373⟩
Communication dans un congrès lirmm-01921630 v1

Temperature Impact on the Neutron SER of a Commercial 90nm SRAM

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2013, San Francisco, Ca, United States. pp.1-4
Communication dans un congrès lirmm-00805291 v1

Fast and Accurate Electro-Thermal Analysis of Three-Dimensional Power Delivery Networks

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2013, Wroclaw, Poland. pp.1-4, ⟨10.1109/EuroSimE.2013.6529956⟩
Communication dans un congrès lirmm-00839043 v1

Effect-Cause Intra-Cell Diagnosis at Transistor Level

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
ISQED 2013 - 14th International Symposium on Quality Electronic Design, Mar 2013, Santa Clara, CA, United States. pp.460-467, ⟨10.1109/ISQED.2013.6523652⟩
Communication dans un congrès lirmm-00817224 v1
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Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic Mode

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937429⟩
Communication dans un congrès lirmm-00839062 v1

Mitigate TSV Electromigration for 3D ICs - From the Architecture Perspective

Yuanqing Cheng , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
International Symposium on VLSI, Natale, Brazil. pp.6
Communication dans un congrès lirmm-00839052 v1

Evaluating An SEU Monitor For Mixed-Field Radiation Environments

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL Synchrotron, Jun 2013, Paris, France
Communication dans un congrès lirmm-01238433 v1

Improving Defect Localization Accuracy by means of Effect-Cause Intra-Cell Diagnosis at Transistor Level

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
SDD: Silicon Debug and Diagnosis, Sep 2013, Anaheim, CA, United States
Communication dans un congrès lirmm-00806872 v1

SEU Monitoring in Mixed-Field Radiation Environments of Particle Accelerators

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937419⟩
Communication dans un congrès lirmm-00839085 v1

Worst-Case Power Supply Noise and Temperature Distribution Analysis for 3D PDNs with Multiple Clock Domains

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
NEWCAS: New Circuits and Systems, Jun 2013, Paris, France. ⟨10.1109/NEWCAS.2013.6573628⟩
Communication dans un congrès lirmm-00839042 v1

Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures

Elena Ioana Vatajelu , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2013, Abu Dhabi, United Arab Emirates. pp.39-44, ⟨10.1109/DTIS.2013.6527775⟩
Communication dans un congrès lirmm-01248603 v1

Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMs

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
Colloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès lirmm-00806842 v1

Through-Silicon-Via Resistive-Open Defect Analysis

Carolina Momo Metzler , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
ETS: European Test Symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233037⟩
Communication dans un congrès lirmm-00806848 v1

An Error Resilient Platform for Data Transfer and Power Management for a Distributed SRAM-based Neutron Detection Test Bench

Luigi Dilillo
RADSOL: Electronique et rayonnements naturels au niveau du sol, Jun 2012, Paris, France
Communication dans un congrès lirmm-00805398 v1

Why and How Controlling Power Consumption During Test: A Survey

Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial , Arnaud Virazel
ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp. 221-226, ⟨10.1109/ATS.2012.30⟩
Communication dans un congrès lirmm-00818984 v1

Complete Framework for the Estimation of the SRAM Core-Cell Resilience to Radiation

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial et al.
RADECS: Radiation and its Effects on Components and Systems, Sep 2012, Biarritz, France
Communication dans un congrès hal-01935785 v1

Dynamic Mode Test of a Commercial 4Mb Toggle MRAM under Neutron Radiation

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial et al.
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Communication dans un congrès lirmm-00805165 v1

Alpha particle-induced transient currents in 65 nm and 40 nm technologies

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Frédéric Saigné
SEE'2012: Single Event Effects Symposium, Apr 2012, San Diego, CA, United States. pp.1
Communication dans un congrès lirmm-00805378 v1

Radiation Induced Effects on Electronic Systems and ICs

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
SETS: South European Test Seminar, Mar 2012, Sauze d'Oulx, Italy
Communication dans un congrès lirmm-00807055 v1

Defect Localization Through an Effect-Cause based Intra-Cell Diagnosis

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
Colloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès lirmm-00806841 v1

Fault Localization Improvement through an Intra-Cell Diagnosis Approach

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
ISTFA 2012 - 38th International Symposium for Testing and Failure Analysis, Nov 2012, Phoenix, AZ, United States. pp.509-519
Communication dans un congrès lirmm-00806863 v1

Impact of Resistive-Open Defects on the Heat Current of TAS-MRAM Architectures

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
DATE 2012 - 15th Design, Automation and Test in Europe Conference and Exhibition, Mar 2012, Dresden, Germany. pp.532-537, ⟨10.1109/DATE.2012.6176526⟩
Communication dans un congrès lirmm-00689024 v1
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Electro-Thermal Analysis of 3D Power Delivery Networks

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
DAC: Design Automation Conference, 2012, San Francisco, United States
Communication dans un congrès lirmm-00806836 v1

Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere et al.
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Communication dans un congrès lirmm-00805150 v1

Power Supply Noise Sensor Based on Timing Uncertainty Measurements

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.161-166, ⟨10.1109/ATS.2012.46⟩
Communication dans un congrès lirmm-00806890 v1

SRAM testing under Neutron Radiation for the evaluation of different algorithms stress

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial et al.
15ème Journées Nationales du Réseau Doctoral en Microélectronique, Jun 2012, Marseille, France
Communication dans un congrès lirmm-00807054 v1

A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in Altitude

Denis Pantel , Jean-Roch Vaillé , Frédéric Wrobel , Luigi Dilillo , Jean-Marc J.-M. Galliere et al.
IEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, ⟨10.1109/RTC.2012.6418104⟩
Communication dans un congrès lirmm-00805169 v1

Peak Power Estimation: A Case Study on CPU Cores

Paolo Bernardi , Mauricio de Carvalho , Ernesto Sanchez , Matteo Sonza Reorda , Alberto Bosio et al.
IEEE Asian Test Symposium, Nov 2012, Niigata, Japan. pp.167-172, ⟨10.1109/ATS.2012.58⟩
Communication dans un congrès lirmm-00805389 v1

Low-power SRAMs Power Mode Control Logic: Failure Analysis and Test Solutions

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
ITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.1-10, ⟨10.1109/TEST.2012.6401578⟩
Communication dans un congrès lirmm-00805143 v1

A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to Neutrons

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial et al.
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Communication dans un congrès lirmm-00805163 v1

Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS Transistor

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Jean-Roch Vaillé , Frédéric Saigné
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States. pp.1-4
Communication dans un congrès lirmm-00805275 v1

Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM Architectures

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
JNRDM: Journées Nationales du Réseau Doctoral en Microélectronique, 2012, Paris, France
Communication dans un congrès lirmm-00806827 v1

On Using Address Scrambling for Defect Tolerance in SRAMs

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
International test Conference, Sep 2011, Anaheim, CA, United States. pp.1-8, ⟨10.1109/TEST.2011.6139149⟩
Communication dans un congrès lirmm-00805334 v1

Resistive-Open Defect Analysis for Through-Silicon-Vias

Carolina Momo Metzler , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
DCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France
Communication dans un congrès lirmm-00806803 v1

Dynamic Mode Testing of SRAMS under Neutron Radiation

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial et al.
Sixième colloque du GDR SOC-SIP du CNRS, Jun 2012, Paris, France
Communication dans un congrès lirmm-00807053 v1

Defect Analysis in Power Mode Control Logic of Low-Power SRAMs

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
ETS: European Test Symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233033⟩
Communication dans un congrès lirmm-00805374 v1
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Impact of Resistive-Bridge Defects in TAS-MRAM Architectures

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.125-130, ⟨10.1109/ATS.2012.37⟩
Communication dans un congrès lirmm-00806809 v1

A Pseudo-Dynamic Comparator for Error Detection in Fault Tolerant Architectures

Ahn Duc Tran , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
VTS: VLSI Test Symposium, Apr 2012, Hawaii, United States. pp.50-55, ⟨10.1109/VTS.2012.6231079⟩
Communication dans un congrès lirmm-00806778 v1

Advanced Test Methods for SRAMs

Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel
VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.300-301, ⟨10.1109/VTS.2012.6231070⟩
Communication dans un congrès lirmm-00805049 v1

Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty Measurements

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
Colloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès lirmm-00806859 v1

Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron Radiation

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial et al.
IOLTS: International On-Line Testing Symposium, Jun 2012, Sitges, Spain. pp.212-222, ⟨10.1109/IOLTS.2012.6313853⟩
Communication dans un congrès lirmm-00805373 v1

Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant Architecture

Ahn Duc Tran , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
JNRDM'11: Journées Nationales du Réseau Doctoral de Microélectronique, Paris, France
Communication dans un congrès lirmm-00679509 v1

Robust Structure for Data Collection and Transfer in a Distributed SRAM Based Neutron Test Bench

Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel
Workshop on Dependability Issues in Deep-Submicron Technologies, Trondheim, Norway
Communication dans un congrès lirmm-00651796 v1

Simultaneous Power and Thermal Integrity Analysis for 3D Integrated Systems

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway
Communication dans un congrès lirmm-00651802 v1

Analysis of Resistive-Open Defects in TAS-MRAM Array

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
ITC: International Test Conference, Sep 2011, Anaheim, CA, United States
Communication dans un congrès lirmm-00679524 v1

A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits

Ahn Duc Tran , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
GDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France
Communication dans un congrès lirmm-00679513 v1

Variability Analysis of an SRAM Test Chip

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
ETS: European Test Symposium, May 2011, Trondheim, Norway
Communication dans un congrès lirmm-00651791 v1

Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Frédéric Wrobel et al.
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩
Communication dans un congrès lirmm-00805314 v1

A DfT Solution for Oxide Thickness Varitions in ATMEL eFlash Technology

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece
Communication dans un congrès lirmm-00647750 v1

Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece. ⟨10.1109/DTIS.2011.5941434⟩
Communication dans un congrès lirmm-00647760 v1

On using a SPICE-like TSTAC™ eFlash model for design and test

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
DDECS: Design and Diagnostics of Electronic Circuits ans Systems, Apr 2011, Cottbus, Germany. pp.359-370, ⟨10.1109/DDECS.2011.5783111⟩
Communication dans un congrès lirmm-00592203 v1

Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power Devices

Alessio Griffoni , Jeroen van Duivenbode , Dimitri Linten , Eddy Simoen , Paolo Rech et al.
RADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.226-231, ⟨10.1109/RADECS.2011.6131395⟩
Communication dans un congrès lirmm-00805339 v1

Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line Coupling

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
GDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France
Communication dans un congrès lirmm-00679522 v1

Error Resilient Infrastructure for Data Transfer in a Distributed Neutron Detector

Luigi Dilillo , Alberto Bosio , Miroslav Valka , Patrick Girard , Serge Pravossoudovitch et al.
DFT 2011 - International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.294-301, ⟨10.1109/DFT.2011.41⟩
Communication dans un congrès lirmm-00651226 v1

Dynamic-Stress Neutrons Test of Commercial SRAMs

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné et al.
IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4
Communication dans un congrès lirmm-00805349 v1

Failure Analysis and Test Solutions for Low-Power SRAMs

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
ATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.459-460, ⟨10.1109/ATS.2011.97⟩
Communication dans un congrès lirmm-00805123 v1

Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway
Communication dans un congrès lirmm-00651905 v1

Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling

Kohei Miyase , Yuta Uchinodan , Kazunari Enokimoto , Yuta Yamato , Xiaoqing Wen et al.
ATS: Asian Test Symposium, 2011, New Delhi, India. pp.21-23
Communication dans un congrès lirmm-00651247 v1
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A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits

Ahn Duc Tran , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
ATS 2011 - 20th IEEE Asian Test Symposium, Nov 2011, New Delhi, India. pp.136-141, ⟨10.1109/ATS.2011.89⟩
Communication dans un congrès lirmm-00651238 v1

Impact of Atmospheric Neutrons on SRAMs through a Modular Test Bench

Luigi Dilillo
RADSOL - Electronique et rayonnements naturels au niveau du sol, Jun 2011, Paris, France
Communication dans un congrès lirmm-00805407 v1

Test and Reliability of Magnetic Random Access Memories

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
GDR SOC-SIP'11: Colloque GDR SoC-SiP, Lyon, France
Communication dans un congrès lirmm-00679516 v1

Robust Data Collection and Transfer Framework for a Distributed SRAM Based Neutron Sensor

Luigi Dilillo , Alberto Bosio , Paolo Rech , Patrick Girard , Frédéric Wrobel et al.
IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2011, Savelletri di Fasano, Italy. pp.176-180, ⟨10.1109/IWASI.2011.6004712⟩
Communication dans un congrès lirmm-00805394 v1

Versatile March Test Generator for Hands-on Memory Testing Laboratory

Jean-Marc J.-M. Galliere , Luigi Dilillo
MSE: Microelectronic Systems Education, Jun 2011, San Diego, CA, United States. pp.41-42, ⟨10.1109/MSE.2011.5937088⟩
Communication dans un congrès lirmm-00805300 v1

A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
ETS 2011 - 16th IEEE European Test Symposium, May 2011, Trondheim, Norway. pp.153-158, ⟨10.1109/ETS.2011.21⟩
Communication dans un congrès lirmm-00647822 v1

Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench

Luigi Dilillo , Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel et al.
IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6
Communication dans un congrès lirmm-00805120 v1

On Using Address Scrambling to Implement Defect Tolerance in SRAMs

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
ITC'2011: International Test Conference, Sep 2011, Anaheim, CA, United States. pp.N/A
Communication dans un congrès lirmm-00647773 v1

Power Supply Noise and Ground Bounce Aware Pattern Generation for Delay Testing

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
NEWCAS: International New Circuits and Systems Conference, Jun 2011, Bordeaux, France. pp.73-76, ⟨10.1109/NEWCAS.2011.5981222⟩
Communication dans un congrès lirmm-00647815 v1

A Study of Path Delay Variations in the Presence of Uncorrelated Power and Ground Supply Noise

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2011, Cottbus, Germany. pp.189-194, ⟨10.1109/DDECS.2011.5783078⟩
Communication dans un congrès lirmm-00592000 v1

Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line Coupling

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
DDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, Netherlands. pp.353-358
Communication dans un congrès lirmm-00592182 v1

Power-Aware Test Pattern Generation for At-Speed LOS Testing

Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial , Arnaud Virazel et al.
ATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.506-510
Communication dans un congrès lirmm-00651917 v1

A Statistical Simulation Method for Reliability Analysis of SRAM Core-Cells

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
DAC: Design Automation Conference, Jun 2010, Anaheim, United States. pp.853-856
Communication dans un congrès lirmm-00553619 v1

A Comprehensive System-on-Chip Logic Diagnosis

Youssef Benabboud , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
ATS: Asian Test Symposium, 2010, Shanghai, China. pp.237-242
Communication dans un congrès lirmm-00545131 v1
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Analysis of Resistive-Bridging Defects in SRAM Core-Cells: a Comparative Study from 90nm down to 40nm Technology Nodes

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.132-137
Communication dans un congrès lirmm-00493236 v1
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A Two-Layer SPICE Model of the ATMEL TSTAC eFlash Memory Technology for Defect Injection and Faulty Behavior Prediction

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.81-86
Communication dans un congrès lirmm-00493204 v1

Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné et al.
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria
Communication dans un congrès lirmm-00566847 v1

X-Identification of Transition Delay Fault Tests for Launch-off Shift Scheme

Kohei Miyase , Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard et al.
WRTLT'10: 11th IEEE Workshop On RTL and High Level Testing, Shanghai, China. pp.N/A
Communication dans un congrès lirmm-00566869 v1

Tolérance aux fautes et rendement de fabrication

Ahn Duc Tran , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France
Communication dans un congrès lirmm-00553995 v1

Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts

Paolo Rech , Michelangelo Grosso , Fabio Melchiori , Domenico Loparco , Davide Appello et al.
IOLTS: International On-Line Testing Symposium, Jul 2010, Corfu, Greece. pp.29-34, ⟨10.1109/IOLTS.2010.5560236⟩
Communication dans un congrès lirmm-00559034 v1

Test Relaxation and X-filling to Reduce Peak Power During At-Speed LOS Testing

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France
Communication dans un congrès lirmm-00553989 v1

Detecting NBTI Induced Failures in SRAM Core-Cells

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
VTS'10: VLSI Test Symposium, Santa Cruz, CA, United States. pp.75-80
Communication dans un congrès lirmm-00553612 v1
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Setting Test Conditions for Improving SRAM Reliability

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.257-262
Communication dans un congrès lirmm-00492741 v1

Impact of Resistive-Bridging Defects in SRAM Core-Cell

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
DELTA'10: International Symposium on Electronic Design, Test & Applications, Ho Chi Minh, Vietnam. pp.265-270
Communication dans un congrès lirmm-00553592 v1

Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
LPonTR: 
Impact of Low-Power design on Test and Reliability, May 2010, Prague, Czech Republic
Communication dans un congrès lirmm-00553930 v1

A Memory Fault Simulator for Radiation-Induced Effects in SRAMs

Paolo Rech , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel et al.
ATS: Asian Test Symposium, 2010, Shanghai, China. pp.100-105
Communication dans un congrès lirmm-00545102 v1

Analysis and Fault Modeling of Actual Resistive Defects in Flash Memories

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
JNRDM'10 : Journées Nationales du Réseau Doctoral de Microélectronique, Montpellier, France
Communication dans un congrès lirmm-00553935 v1

Analyse et modélisation des défauts résistifs affectant les mémoires Flash

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France
Communication dans un congrès lirmm-00553947 v1

Analysis of Power Consumption and Transition Fault Coverage for LOS and LOC Testing Schemes

Wu Fangmei , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
DDECS'10: 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2010, Vienna, Austria. pp.376-381
Communication dans un congrès lirmm-00475734 v1

Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-Cells

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
VARI: Workshop on CMOS Variability, 2010, Montpellier, France
Communication dans un congrès lirmm-00553626 v1
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Neutron Detection through an SRAM-Based Test Bench

Luigi Dilillo , Frédéric Wrobel , Jean-Marc J.-M. Galliere , Frédéric Saigné
IWASI'09: International Workshop On Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. pp.64-69, ⟨10.1109/IWASI.2009.5184769⟩
Communication dans un congrès lirmm-00438842 v1

Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split Models

Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell , Luigi Dilillo
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229
Communication dans un congrès lirmm-00370798 v1

Use of BOBST for the Detection of Neutrons Induced Errors in SRAM

Luigi Dilillo , Frédéric Wrobel , Jean-Marc J.-M. Galliere , F. Saigné
IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2009, Trani, Italy
Communication dans un congrès hal-01957246 v1

Delay Fault Diagnosis in Sequential Circuits

Youssef Benabboud , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
ATS: Asian Test Symposium, Nov 2009, Taichung, Taiwan. pp.355-360
Communication dans un congrès lirmm-00406968 v1

A Fault-Simulation-Based Approach for Logic Diagnosis

Youssef Benabboud , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel et al.
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2009, Cairo, Egypt. pp.216-221
Communication dans un congrès lirmm-00371377 v1

Comprehensive Bridging Fault Diagnosis based on the SLAT Paradigm

Youssef Benabboud , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel et al.
DDECS'09: 12th IEEE Symposium on Design and Diagnostics of Electronic Systems, pp.264-269
Communication dans un congrès lirmm-00371198 v1
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A New Design-for-Test Technique for SRAM Core-Cell Stability Faults

Alexandre Ney , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel et al.
DATE: Design, Automation and Test in Europe, Apr 2009, Nice, France. pp.1344-1348, ⟨10.1109/DATE.2009.5090873⟩
Communication dans un congrès lirmm-00371374 v1

Trade-off Between Power Dissipation and Delay Fault Coverage For LOS and LOC Testing Schemes

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
Impact of Low-Power Design on Test and Reliability, Spain
Communication dans un congrès lirmm-00435005 v1

Using TMR Architectures for SoC Yield Improvement

Julien Vial , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
VALID'09: The First International Conference on Advances in System Testing and Validation Lifecycle, 2009, Porto, Portugal. pp.155-160
Communication dans un congrès lirmm-00406967 v1

A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs

Alexandre Ney , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
ITC'2008: International Test Conference, Oct 2008, Santa Clara, CA, United States. pp.1-10, ⟨10.1109/TEST.2008.4700555⟩
Communication dans un congrès lirmm-00341798 v1

A History-Based Technique for Faults Diagnosis in SRAMs

Alexandre Ney , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
Colloque GDR SoC-SiP, France
Communication dans un congrès lirmm-00341821 v1

Impact of Technology Scaling on Defects and Parameter Deviations in Embedded SRAMs

Luigi Dilillo , Patrick Girard , Christian Landrault , Serge Pravossoudovitch , Arnaud Virazel et al.
VLSI Test Symposium, Apr 2008, San Diego, California, United States. pp.336
Communication dans un congrès lirmm-00324151 v1
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A Signature-based Approach for Diagnosis of Dynamic Faults in SRAMs

Alexandre Ney , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2008, Tunis, Tunisia. pp.001-006, ⟨10.1109/DTIS.2008.4540243⟩
Communication dans un congrès lirmm-00324143 v1

March CRF: an Efficient Test for Complex Read Faults in SRAM Memories

Luigi Dilillo , Bashir M. Al Hashimi
DDECS: Design and Diagnostics of Electronic Circuits and Systems, IEEE, Apr 2007, Cracovie, Poland. ⟨10.1109/DDECS.2007.4295276⟩
Communication dans un congrès lirmm-01239052 v1
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Minimizing Test Power in SRAM through Pre-charge Activity Reduction

Luigi Dilillo , Paul Rosinger , Patrick Girard , Bashir Al-Hashimi
DATE: Design, Automation and Test in Europe, Mar 2006, Munich, Germany. pp.1159-1165, ⟨10.1109/DATE.2006.244016⟩
Communication dans un congrès lirmm-00137598 v1

Leakage Read Fault in Nanoscale SRAM: Analysis, Test and Diagnosis

Luigi Dilillo , Bashir Al-Hashimi , Paul Rosinger , Patrick Girard
IDT'06: IEEE International Design and Test Workshop, Nov 2006, Dubai, United Arab Emirates. pp.110-115
Communication dans un congrès lirmm-00137603 v1

March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit

Luigi Dilillo , Patrick Girard , Magali Bastian Hage-Hassan , Serge Pravossoudovitch , Arnaud Virazel
DDECS'06: Design and Diagnostics of Electronic Circuits and Systems, Apr 2006, Prague, République Tchèque, pp.256-261
Communication dans un congrès lirmm-00134776 v1

Incidence des Défauts Résistifs dans les Circuits de Précharge des Mémoires SRAM

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
JNRDM 2005 - 8e Journées Nationales du Réseau Doctoral de Microélectronique, May 2005, Paris, France
Communication dans un congrès lirmm-00106529 v1

Resistive-Open Defect Influence in SRAM Pre-Charge Circuits: Analysis and Characterization

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
ETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.116-121, ⟨10.1109/ETS.2005.33⟩
Communication dans un congrès lirmm-00106010 v1
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Efficient Test of Dynamic Read Destructive Faults in SRAM Memories

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.40-45
Communication dans un congrès lirmm-00106515 v1

Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison Between 0.13 um and 90 nm Technologies

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
DAC: Design Automation Conference, Jun 2005, Anaheim, CA, United States. pp.857-862
Communication dans un congrès lirmm-00136906 v1
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Data Retention Fault in SRAM Memories: Analysis and Detection Procedures

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
VTS 2005 - 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA, United States. pp.183-188, ⟨10.1109/VTS.2005.37⟩
Communication dans un congrès lirmm-00105995 v1

Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison between 0.13μm and 90nm Technologies

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
DAC: Design Automation Conference, May 2005, Anaheim, CA, United States. pp.857-862, ⟨10.1145/1065579.1065804⟩
Communication dans un congrès lirmm-00106558 v1
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Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri et al.
ATS: Asian Test Symposium, Nov 2004, Kenting, Taiwan. pp.266-271
Communication dans un congrès lirmm-00108800 v1
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March Tests Improvements for Address Decoder Open and Resistive Open Fault Detection

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri et al.
LATW: Latin American Test Workshop, Mar 2004, Cartagena, Colombia. pp.31-36
Communication dans un congrès lirmm-00108642 v1
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Dynamic Read Destructive Faults in Embedded-SRAMs: Analysis and March Test Solution

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri et al.
ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.140-145
Communication dans un congrès lirmm-00108795 v1
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An A/D Interface for Resonant Piezoresistive MEMS Sensor

Luigi Dilillo , Vincent Beroulle , Norbert Dumas , Laurent Latorre , Pascal Nouet
ISIE 2004 - IEEE International Symposium on Industrial Electronics, May 2004, Ajaccio, France. pp.83-88, ⟨10.1109/ISIE.2004.1571786⟩
Communication dans un congrès lirmm-00108896 v1
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March iC-: An Improved Version of March C- for ADOFs Detection

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri
VTS: VLSI Test Symposium, Apr 2004, Napa Valley, CA, United States. pp.129-134, ⟨10.1109/VTEST.2004.1299236⟩
Communication dans un congrès lirmm-00108772 v1
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Test March pour la Détection des Fautes Dynamiques dans les Décodeurs de Mémoires SRAM

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri et al.
JNRDM'04 : 7ièmes Journées Nationales du Réseau Doctoral de Microélectronique, May 2004, Marseille, France. pp.495-497
Communication dans un congrès lirmm-00108644 v1

Comparison of open and resistive-open defect test conditions in SRAM address decoders

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri et al.
ATS: Asian Test Symposium, Nov 2003, Xian, China. pp.250-255, ⟨10.1109/ATS.2003.1250818⟩
Communication dans un congrès lirmm-01238821 v1
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Technology Dependence of Stuck Bits and Single Event Upsets in 110, 72, and 63-nm SDRAMs

Daniel Söderström , Lucas Matana Luza , André Martins Pio de Mattos , Thierry Gil , Heikki Kettunen et al.
RADECS 2022 - 22nd European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy.
Poster de conférence lirmm-03834026 v1
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Machine learning application to space particle discrimination from multiple-cell upsets in a memory device

Andrea Coronetti , Lucas Matana Luza , Sanaa Barik , Alexandre Bosser , Ruben Garcia Alia et al.
RADECS 2022 - 22nd European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy. , 2022
Poster de conférence lirmm-03837246 v1
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A Performance Evaluation of a Fault-tolerant RISC-V with Vector Instruction Support to Space Applications

Carolina Imianosky , Douglas Almeida dos Santos , Douglas Rossi de Melo , Luigi Dilillo , Cesar Albenes Zeferino et al.
LASSS/LACW 2022 - Joint 3rd IAA Latin American Symposium on Small Satellites and 5th IAA Latin American CubeSat Workshop, Nov 2022, Brasilia, Brazil. , 2022
Poster de conférence lirmm-03834121 v1
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Assessing the Reliability of a Network-on-Chip through Physical Validation

Gustavo S. Mafra , Thiago H. Rausch , Douglas Almeida dos Santos , Luigi Dilillo , Eduardo Augusto Bezerra et al.
LASSS/LACW 2022 - Joint 3rd IAA Latin American Symposium on Small Satellites and 5th IAA Latin American CubeSat Workshop, Nov 2022, Brasilia, Brazil. , 2022
Poster de conférence lirmm-03834119 v1

Interconnection Architecture for Dependable Multicore Systems

Douglas Rossi de Melo , Cesar Zeferino , Luigi Dilillo , Eduardo Augusto Bezerra
PhD Forum - 26th IFIP/IEEE International Conference on Very Large Scale Integration, Oct 2018, Torino, Italy. 2018
Poster de conférence lirmm-02008476 v1

Fault-Effect Propagation Based Intra-cell Scan Chain Diagnosis

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
Colloque GDR SoC-SiP, Jun 2013, Lyon, France. 2013
Poster de conférence lirmm-00839113 v1

Performance Evaluation of Capacitive defects on TAS-MRAMs

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
Colloque GDR SoC-SiP, 2013, Lyon, France. 2013
Poster de conférence lirmm-00839093 v1

Investigating Multiple-Cell-Upsets on a 90mn SRAM

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
Colloque GDR SoC-SiP, 2013, Lyon, France. 2013
Poster de conférence lirmm-00839108 v1

Coupling-Based Resistive-Open Defects in TAS-MRAM Architectures

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
ETS: European Test Symposium, May 2012, Annecy, France. Test Symposium (ETS), 2012 17th IEEE European, 2012, ⟨10.1109/ETS.2012.6233034⟩
Poster de conférence lirmm-00806793 v1

Resistive Open Defect Analysis for Through-Silicon-Vias

Carolina Momo Metzler , Aida Todri-Sanial , Arnaud Virazel , Alberto Bosio , Luigi Dilillo et al.
ETS: European Test Symposium, May 2012, Annecy, France. 17th IEEE European Test Symposium, pp.183, 2012
Poster de conférence lirmm-00806795 v1

A Roaming Memory Test Bench for Detecting Particle Induced SEUs

Jean-Marc J.-M. Galliere , Paolo Rech , Patrick Girard , Luigi Dilillo
ITC 2010 - International Test Conference, Nov 2010, Austin, TX, United States. 2010, ⟨10.1109/TEST.2010.5699302⟩
Poster de conférence lirmm-00537879 v1

Parity Prediction Synthesis for Nano-Electronic Gate Designs

Ahn Duc Tran , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. pp.N/A, 2010
Poster de conférence lirmm-00537938 v1

Is Test Power Reduction Through X-Filling Good Enough?

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. 2010
Poster de conférence lirmm-00537926 v1

SoC Yield Improvement for Future Nanoscale Technologies

Julien Vial , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
ETS 2009 - 14th IEEE European Test Symposium | PhD Forum, May 2009, Sevilla, Spain. 2009
Poster de conférence lirmm-00433798 v1

A Logic Diagnosis Approach for Sequential Circuits

Youssef Benabboud , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch et al.
ETS 2009 - 14th IEEE European Test Symposium, May 2009, Sevilla, Spain. , 2009, Ph. D. Forum
Poster de conférence lirmm-00433792 v1

Analysis of Resistive-Bridging Defects in SRAM Core-Cell: Impact within the Core-Cell and in the Memory Array

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
ETS: European Test Symposium, May 2009, Sevilla, Spain. 14th IEEE European Test Symposium, 2009
Poster de conférence lirmm-00433796 v1

NAND Flash Testing: A Preliminary Study on Actual Defects

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
ITC: International Test Conference, Nov 2009, Austin, TX, United States. 2009, ⟨10.1109/TEST.2009.5355898⟩
Poster de conférence lirmm-00433765 v1

SRAM Core-cell Quality Metrics

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
GDR SOC SIP, France. 2009
Poster de conférence lirmm-00434962 v1

Trade-off Between Power Dissipation and Delay Fault Coverage for LOS and LOC Testing Schemes

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
GDR SOC SIP, France. 2009
Poster de conférence lirmm-00434959 v1

Test des Mémoires FLASH NAND

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
Colloque GDR SoC-SiP, France. 2009
Poster de conférence lirmm-00433770 v1

Space Radiation Effects in Electronics

Luigi Dilillo , Alexandre Louis Bosser , Arto Javanainen , Ari Virtanen
Rad-hard Semiconductor Memories, Series in Electronic Materials and Devices, River Publishers, pp.1-56, 2018, 9788770220200
Chapitre d'ouvrage lirmm-02007913 v1

Electromigration Alleviation Techniques for 3D Integrated Circuits

Yuanqing Cheng , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
Chao Wang. High Performance Computing for Big Data: Methodologies and Applications, CRC Press, pp.37-58, 2017, 9781498783996
Chapitre d'ouvrage lirmm-01800220 v1