Luigi Dilillo
Présentation
Publications
Publications
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Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-based FPGA under Proton Irradiation27th IEEE Latin American Test Symposium, Mar 2026, Florianopolis, Brazil |
HARV-SoC - A Fault-tolerant RISC-V Microcontroller for Dependable Applications3rd TWIN-RELECT Training School on Fault-Tolerant AI Systems, Jan 2026, Manchester (UK), United Kingdom |
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Design and Reliability Analysis of a Pipeline RISC-V Processor Core27th IEEE Latin American Test Symposium, Mar 2026, Florianopolis, Brazil |
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Resilience Analysis of a Fault-Tolerant MPSoC Interconnection Architecture under SEU Fault Injection27th IEEE Latin American Test Symposium, Mar 2026, Florianopolis, Brazil |
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Reliability Analysis of Neural Network Inference on a Fault-Tolerant RISC-V SoC with Vector ExtensionRadiation and its Effects on Components and Systems Conference, Sep 2025, Antwerp, Belgium |
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Characterization of HARV-SoC for Reliable Avionics ApplicationsWorkshop on Reliable and Secure RISC-V architectures (RESCUER), May 2025, Tallinn, Estonia |
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Reliability and Performance Evaluation of a Fault-Tolerant MPSoC Interconnection Architecture38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2025, Barcelona, Spain |
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Analysis of In-System Performance of Point-of-Load Power Converters During System-Level IrradiationRadiation and its Effects on Components and Systems Conference (RADECS 2025), Sep 2025, Antwerp, Belgium |
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HARV-SoC Evaluation on SmartFusion2 and PolarFire FPGAs Under Neutron RadiationRadiation and its Effects on Components and Systems Conference, Sep 2025, Antwerp, Belgium |
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Efficient TinyML Inference on a Fault-Tolerant RISC-V SoC with Vector ExtensionInternational Workshop on Advances in Sensors and Interface (IWASI), Jul 2025, Manfredonia, Italy. pp.1-6, ⟨10.1109/IWASI66786.2025.11121981⟩ |
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HARV - Hardened RISC-V System-on-Chip2nd RISC-V in Space Workshop, Apr 2025, Gothenburg, Sweden |
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Compact SER Models for Line-Source-Induced Charge Collection Using Model Order Reduction38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2025, Barcelona, Spain |
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Special Session Paper: Simulation Methodologies and Experiments for Reliability Analysis of Devices in Radiation Harsh Environments38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2025, Barcelona, Spain |
Leadership and strategic management2nd Research Management & Administration Workshop, Jul 2025, Volos (Greece), Greece |
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Hardening an AMBA-AXI Network Interface for a Reliable Network-on-ChipIEEE Latin American Symposium on Circuits and Systems (LASCAS), Feb 2025, Bento Goncalves, Brazil. pp.1-5, ⟨10.1109/LASCAS64004.2025.10966348⟩ |
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TWIN-RELECT: Twinning for Excellence in Reliable ElectronicsDesign, Automation and Test in Europe Conference, Mar 2025, Lyon, France |
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Implementation and Reliability Evaluation of a ChaCha20 Stream Cipher Hardware Accelerator37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom |
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Reliability Analysis of a Low-Cost CCSDS 123 Hyperspectral Image Compressor37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom |
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Reliability and Performance Evaluation of a RISC-V Vector Extension Unit for Vector Multiplication37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom |
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Physical Explanation for the Higher Sensitivity to Ion-Induced Burnout in SiC Schottky Diodes Compared to Si Schottky DiodesRADiation Effects on Components and Systems (RADECS), Sep 2024, Maspalomas, Canary Islands, Spain |
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Implementation and Reliability Evaluation of a RISC-V Vector Extension UnitDFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313569⟩ |
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Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space EnvironmentsDFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313549⟩ |
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Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-ChipRADECS 2023 - 23rd European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France |
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Enhancement of System Observability During System-Level Radiation Testing through Total Current Consumption Monitoring2023 European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France |
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Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-VRADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France |
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Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh EnvironmentsIWASI 2023 - 9th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2023, Bari, Italy. pp.227-232, ⟨10.1109/IWASI58316.2023.10164578⟩ |
CRATEBO: A High-speed, Radiation-Tolerant and Versatile Testing Platform for FPGA Radiation Qualification for High-Energy Particle Accelerator applicationsTWEPP 2023 Topical Workshop on Electronics for Particle Physics, Oct 2023, Geremeas, Italy |
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Radiation-induced SEL in a COTS SRAM memory - test and flight dataTEC-QEC Final Presentation Days, Jun 2023, Noordwijk, Netherlands |
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Hybrid Radiation Hardening Approach: a RISC-V System-on-Chip case studyG-RADNEXT Workshop, Nov 2023, Geneva, Switzerland |
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Objectives and outcomes of WP6 in the second year of RADNEXT: Methodologies for Radiation Test of SystemsRADNEXT 2nd Annual Meeting, May 2023, Seville, Spain |
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A Low-Cost Hardware Accelerator for CCSDS 123 Lossless Hyperspectral Image CompressionDFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313567⟩ |
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Hardening a Real-Time Operating System for a Dependable RISC-V System-on-ChipDFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313566⟩ |
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Qualification methodology for Radio Frequency Integrated Circuit for wireless-based platforms in radiation environmentsRADECS 2022 - 22nd European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy |
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Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-ChipDFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2022, Austin, United States. pp.1-6, ⟨10.1109/DFT56152.2022.9962335⟩ |
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Effects of High-Energy Protons on a Self-Refresh DRAMSELSE 2022 - 18th IEEE Workshop on Silicon Errors in Logic – System Effects, May 2022, Virtual Event, Italy |
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Impact of Atmospheric and Space Radiation on Sensitive Electronic DevicesETS 2022 - 27th IEEE European Test Symposium, May 2022, Barcelona, Spain. pp.1-10, ⟨10.1109/ets54262.2022.9810454⟩ |
Objectives and outcomes of WP6 in the first year of RADNEXT Methodologies for Radiation test of SystemsRADNEXT DAYS 2022 - 1st Annual Meeting, Jun 2022, Geneva, Switzerland |
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Characterization of a RISC-V System-on-Chip under Neutron RadiationDTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505054⟩ |
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Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip RouterDTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505053⟩ |
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Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative StudyDTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩ |
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Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural NetworksLATS 2021 - 22nd IEEE Latin American Test Symposium, Oct 2021, Punta del Este, Uruguay. pp.1-5, ⟨10.1109/LATS53581.2021.9651807⟩ |
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A Model-Based Framework to Assess the Reliability of Safety-Critical ApplicationsDDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩ |
COTS Optocoupler radiation qualification process for LHC applications based on mixed-energy neutron irradiationsRADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. pp.1395-1403, ⟨10.1109/TNS.2020.2972777⟩ |
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Characterization of a RISC-V Microcontroller Through Fault InjectionAPPLEPIES 2019 - International Conference on Applications in Electronics Pervading Industry, Environment and Society, Sep 2019, Pisa, Italy. pp.91-101, ⟨10.1007/978-3-030-37277-4_11⟩ |
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Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian EnvironmentNSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference, Nov 2020, Santa Fe (virtual), United States |
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Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing SystemsDFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩ |
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Effects of Thermal Neutron Irradiation on a Self-Refresh DRAMDTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩ |
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On-board Compressing of Hyperspectral Images using CCSDS 123COTB 2020 - Anais do XI Computer on the Beach, Sep 2020, Balneário Camboriú, Brazil. pp.332-336, ⟨10.14210/cotb.v11n1.p332-336⟩ |
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A Low-Cost Fault-Tolerant RISC-V Processor for Space SystemsDTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-5, ⟨10.1109/DTIS48698.2020.9081185⟩ |
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Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND FlashRADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. ⟨10.1109/RADECS47380.2019.9745668⟩ |
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Stuck and Weakened Bits in SDRAM from a Heavy-Ion MicrobeamRADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. ⟨10.1109/RADECS47380.2019.9745715⟩ |
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Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash MemoryDFT 2019 - 32th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2019, Noordwijk, Netherlands. pp.1-6, ⟨10.1109/DFT.2019.8875475⟩ |
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Design and Implementation of a Flexible Interface for TID DetectorIWASI 2019 - 8th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2019, Otranto, Italy. pp.158-162, ⟨10.1109/IWASI.2019.8791299⟩ |
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Analyzing the Error Propagation in a Parameterizable Network-on-Chip RouterLATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. ⟨10.1109/LATW.2019.8704580⟩ |
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A Fault-Tolerant Reconfigurable Platform for Communication Modules of SatellitesLATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. ⟨10.1109/LATW.2019.8704551⟩ |
Study of the Impact of the LHC Radiation Environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic ComponentsRADECS: Radiation Effects on Components and Systems, Sep 2018, Göteborg, Sweden |
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Implementation of fault tolerance techniques for integrated network interfaces3rd IAA Latin American CubeSat Workshop (IAA-LACW 2018), Dec 2018, Ubatuba, Brazil |
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Evaluation of the temperature influence on SEU vulnerability of DICE and 6T-SRAM cellsDTIS 2018 - 13th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, LIRMM, Apr 2018, Taormina, Italy. ⟨10.1109/DTIS.2018.8368578⟩ |
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Enabling deep-space CubeSat missions through state-of-the-art radiation-hardened technologies3rd IAA Latin American CubeSat Workshop (IAA-LACW 2018), Dec 2018, Ubatuba, Brazil |
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random- Access MemoryRADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland |
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Improvement of the tolerated raw bit-error rate in NAND Flash-based SSDs with the help of embedded statisticsITC 2017 - 48th International Test Conference, Oct 2017, Fort Worth, United States. ⟨10.1109/TEST.2017.8242066⟩ |
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Refresh frequency reduction of data stored in SSDs based on A-timer and timestampsETS 2017 - 22nd IEEE European Test Symposium, May 2017, Limassol, Cyprus. pp.7968233, ⟨10.1109/ETS.2017.7968233⟩ |
A calculation method to estimate single event upset cross sectionESREF 2017 - 28th European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France. pp.644-649, ⟨10.1016/j.microrel.2017.07.056⟩ |
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Muon effects on SRAMsRADSOL: Electronique et rayonnements naturels au niveau du sol, CNRS - GDR ERRATA, Jun 2016, Paris, France |
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An effective BIST architecture for power-gating mechanisms in low-power SRAMsISQED 2016 - 17th International Symposium on Quality Electronic Design, Mar 2016, Santa Clara, CA, United States. pp.185-191, ⟨10.1109/ISQED.2016.7479198⟩ |
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MTCube project: COTS memory SEE ground-test results and in-orbit error rate prediction4S: Small Satellites Systems and Services Symposium, Centre national d'études spatiales (CNES); European Space Agency (ESA), May 2016, La Valletta, Malta |
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Design of a Radiation Tolerant System for Total Ionizing Dose Monitoring Using Floating Gate and RadFET DosimetersTWEPP: Topical Workshop on Electronics for Particle Physics, Sep 2016, Karlsruhe, Germany |
Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAMRADECS: Radiation and Its Effects on Components and Systems, Sep 2016, Bremen, Germany |
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The Power Law Shape of Heavy Ions Experimental Cross SectionNSREC: Nuclear and Space Radiation Effects Conference, IEEE NPSS (Nuclear & Plasma Sciences Society ), Jul 2016, Portland, United States |
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Real-Time SRAM Based Particle DetectorIWASI: International Workshop on Advances in Sensors and Interfaces, Politecnico di Bari, Jun 2015, Gallipoli, Italy. pp.58-62, ⟨10.1109/IWASI.2015.7184968⟩ |
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Exploring the impact of functional test programs re-used for power-aware testingDATE 2015 - 18th Design, Automation and Test in Europe Conference and Exhibition, Mar 2015, Grenoble, France. pp.1277-1280, ⟨10.7873/DATE.2015.1031⟩ |
Proton-Induced SDRAM Cell DegradationRADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365650⟩ |
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An effective hybrid fault-tolerant architecture for pipelined coresETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. ⟨10.1109/ETS.2015.7138733⟩ |
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An effective ATPG flow for Gate Delay FaultsDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127350⟩ |
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Scan-chain intra-cell defects gradingDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127349⟩ |
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Methods for radiation test of memoriesRADSOL: Electronique et rayonnements naturels au niveau du sol, GDR ERRATA (CNRS), Jun 2015, Paris, France |
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Design-for-Diagnosis Architecture for Power SwitchesDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.43-48, ⟨10.1109/DDECS.2015.18⟩ |
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A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and SlicingRADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365578⟩ |
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An ATPG Flow to Generate Crosstalk-Aware Path Delay PatternISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.515-520, ⟨10.1109/ISVLSI.2015.99⟩ |
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Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMsNSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, MA, United States. ⟨10.1109/TNS.2015.2496874⟩ |
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Generic Analytic Expression of Heavy Ion SEU Cross Section Derived from Monte-Carlo Diffusion-Based Prediction CodeNSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States |
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Impact of Stacked-Layer Structure on SEE Rate of SRAMsNSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States |
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Heavy-ion radiation impact on a 4Mb FRAM under Different Test ConditionsRADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365617⟩ |
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Single Event Upset Prediction from Heavy Ions Cross Sections with No ParametersNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France |
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Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounceDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.207-212, ⟨10.1109/DDECS.2014.6868791⟩ |
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Timing-aware ATPG for critical paths with multiple TSVsDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.116-121, ⟨10.1109/DDECS.2014.6868774⟩ |
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Radiation Study of a 4Mbit Ferroelectric RAM for Space ApplicationsSEE: Single Event Effects, Aeroflex Corporation, the Aerospace Corporation, Brigham Young University, Lockheed Martin, the NASA Electronic Parts and Packaging Program, the Naval Research Laboratory, Sandia National Laboratories, and Vanderbilt University, May 2014, San Diego, United States |
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Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory ComponentsPhysics Days, Finnish Physical Society, Tampere University of Technology (TUT), and Tavicon Ltd., Mar 2014, Tampere, Finland |
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An intra-cell defect grading toolDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.298-301, ⟨10.1109/DDECS.2014.6868814⟩ |
Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude Vs. Underground Experiments, Modeling and Numerical Monte Carlo SimulationNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France |
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A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply NoiseISVLSI: International Symposium on Very Large Scale Integration, Jul 2014, Tampa, FL, United States. pp.226-231, ⟨10.1109/ISVLSI.2014.42⟩ |
Test of 90nm SRAMs at Concordia Station in AntarcticaRADSOL: Electronique et rayonnements naturels au niveau du sol, GDR ERRATA (CNRS); Institut Carnot STAR (Marseille), Jun 2014, Paris, France |
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Test and diagnosis of power switchesDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.213-218, ⟨10.1109/DDECS.2014.6868792⟩ |
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TSV aware timing analysis and diagnosis in paths with multiple TSVsVTS: VLSI Test Symposium, Apr 2014, Napa, CA, United States. ⟨10.1109/VTS.2014.6818772⟩ |
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Presentation of the MTCube CubeSat Project4S Symposium 2014 - Small Satellites Systems and Services, European Space Agency (ESA); Centre National d'Etudes Spatiales (CNES), May 2014, Majorca, Spain |
A Comprehensive Evaluation of Functional Programs for Power-Aware TestNATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. pp.69-72, ⟨10.1109/NATW.2014.23⟩ |
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Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal considerationASP-DAC: Asia and South Pacific Design Automation Conference, Jan 2014, Singapore, Singapore. pp.544-549, ⟨10.1109/ASPDAC.2014.6742948⟩ |
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iBoX — Jitter based Power Supply Noise sensorETS: European Test Symposium, May 2014, Paderborn, United States. ⟨10.1109/ETS.2014.6847830⟩ |
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Real-Time Testing of 90nm COTS SRAMs at Concordia Station in AntarcticaNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France |
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Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion IrradiationNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France |
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Protecting combinational logic in pipelined microprocessor cores against transient and permanent faultsDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.223-225, ⟨10.1109/DDECS.2014.6868794⟩ |
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SEU Cross Section Calculation Based on Experimental Data of Another kind of ParticleNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France |
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On the Generation of Diagnostic Test Set for Intra-cell DefectsATS: Asian Test Symposium, Nov 2014, Hangzhou, China. pp.312-317, ⟨10.1109/ATS.2014.57⟩ |
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Analyzing resistive-open defects in SRAM core-cell under the effect of process variabilityETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569373⟩ |
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Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation EnvironmentsIWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2013, Bari, Italy. pp.75-80, ⟨10.1109/IWASI.2013.6576070⟩ |
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Performance Characterization of TAS-MRAM Architectures in Presence of Capacitive DefectsVALID: Advances in System Testing and Validation Lifecycle, Oct 2013, Venice, Italy. pp.39-44 |
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Test Solution for Data Retention Faults in Low-Power SRAMsDATE 2013 - 16th Design, Automation and Test in Europe Conference, Mar 2013, Grenoble, France. pp.442-447, ⟨10.7873/DATE.2013.099⟩ |
A novel method to mitigate TSV electromigration for 3D ICsISVLSI: IEEE Computer Society Annual Symposium on VLSI, Aug 2013, Natal, Brazil. pp.121-126, ⟨10.1109/ISVLSI.2013.6654633⟩ |
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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cellDFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. pp.143-148, ⟨10.1109/DFT.2013.6653597⟩ |
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Comparison of the transient current shapes obtained with the diffusion model and the double exponential law — Impact on the SERRADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937441⟩ |
Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBTRADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937428⟩ |
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On the Reuse of Read and Write Assist Circuits to Improve Test Efficiency in Low-Power SRAMsITC: International Test conference, Sep 2013, Anaheim, CA, United States. pp.1-10, ⟨10.1109/TEST.2013.6651927⟩ |
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SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variationsIOLTS: International On-Line Testing Symposium, Jul 2013, Chania, Crete, Greece. pp.145-150, ⟨10.1109/IOLTS.2013.6604066⟩ |
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Effect-Cause Intra-Cell Diagnosis at Transistor LevelISQED 2013 - 14th International Symposium on Quality Electronic Design, Mar 2013, Santa Clara, CA, United States. pp.460-467, ⟨10.1109/ISQED.2013.6523652⟩ |
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Fast and Accurate Electro-Thermal Analysis of Three-Dimensional Power Delivery NetworksEuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2013, Wroclaw, Poland. pp.1-4, ⟨10.1109/EuroSimE.2013.6529956⟩ |
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Temperature Impact on the Neutron SER of a Commercial 90nm SRAMNSREC: Nuclear and Space Radiation Effects Conference, Jul 2013, San Francisco, Ca, United States. pp.1-4 |
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Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic ModeRADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937429⟩ |
Mitigate TSV Electromigration for 3D ICs - From the Architecture PerspectiveInternational Symposium on VLSI, Natale, Brazil. pp.6 |
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Evaluating An SEU Monitor For Mixed-Field Radiation EnvironmentsiWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL Synchrotron, Jun 2013, Paris, France |
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Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failuresDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2013, Abu Dhabi, United Arab Emirates. pp.39-44, ⟨10.1109/DTIS.2013.6527775⟩ |
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SEU Monitoring in Mixed-Field Radiation Environments of Particle AcceleratorsRADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937419⟩ |
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Improving Defect Localization Accuracy by means of Effect-Cause Intra-Cell Diagnosis at Transistor LevelSDD: Silicon Debug and Diagnosis, Sep 2013, Anaheim, CA, United States |
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Worst-Case Power Supply Noise and Temperature Distribution Analysis for 3D PDNs with Multiple Clock DomainsNEWCAS: New Circuits and Systems, Jun 2013, Paris, France. ⟨10.1109/NEWCAS.2013.6573628⟩ |
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An Integrated Solid Detector For Onboard Detection Of Natural Radiations In AtmosphereiWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL synchrotron, Jun 2013, Paris, France |
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A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMsVTS: VLSI Test Symposium, Apr 2013, Berkeley, CA, United States. pp.1-6, ⟨10.1109/VTS.2013.6548894⟩ |
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Computing Detection Probability of Delay Defects in Signal Line TSVsETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569349⟩ |
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On Using Address Scrambling for Defect Tolerance in SRAMsInternational test Conference, Sep 2011, Anaheim, CA, United States. pp.1-8, ⟨10.1109/TEST.2011.6139149⟩ |
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Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM ArchitecturesJNRDM: Journées Nationales du Réseau Doctoral en Microélectronique, 2012, Paris, France |
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Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS TransistorNSREC: Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States. pp.1-4 |
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A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to NeutronsRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4 |
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Impact of Resistive-Open Defects on the Heat Current of TAS-MRAM ArchitecturesDATE 2012 - 15th Design, Automation and Test in Europe Conference and Exhibition, Mar 2012, Dresden, Germany. pp.532-537, ⟨10.1109/DATE.2012.6176526⟩ |
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Fault Localization Improvement through an Intra-Cell Diagnosis ApproachISTFA 2012 - 38th International Symposium for Testing and Failure Analysis, Nov 2012, Phoenix, AZ, United States. pp.509-519 |
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Radiation Induced Effects on Electronic Systems and ICsSETS: South European Test Seminar, Mar 2012, Sauze d'Oulx, Italy |
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Dynamic Mode Test of a Commercial 4Mb Toggle MRAM under Neutron RadiationRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4 |
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Alpha particle-induced transient currents in 65 nm and 40 nm technologiesSEE'2012: Single Event Effects Symposium, Apr 2012, San Diego, CA, United States. pp.1 |
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Defect Localization Through an Effect-Cause based Intra-Cell DiagnosisColloque GDR SoC-SiP, 2012, Paris, France |
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Power Supply Noise Sensor Based on Timing Uncertainty MeasurementsATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.161-166, ⟨10.1109/ATS.2012.46⟩ |
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Peak Power Estimation: A Case Study on CPU CoresIEEE Asian Test Symposium, Nov 2012, Niigata, Japan. pp.167-172, ⟨10.1109/ATS.2012.58⟩ |
Low-power SRAMs Power Mode Control Logic: Failure Analysis and Test SolutionsITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.1-10, ⟨10.1109/TEST.2012.6401578⟩ |
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A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in AltitudeIEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, ⟨10.1109/RTC.2012.6418104⟩ |
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SRAM testing under Neutron Radiation for the evaluation of different algorithms stress15ème Journées Nationales du Réseau Doctoral en Microélectronique, Jun 2012, Marseille, France |
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Proton Flux Anisotropy in the Atmosphere: Experiment and ModelingRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4 |
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Electro-Thermal Analysis of 3D Power Delivery NetworksDAC: Design Automation Conference, 2012, San Francisco, United States |
Dynamic Mode Testing of SRAMS under Neutron RadiationSixième colloque du GDR SOC-SIP du CNRS, Jun 2012, Paris, France |
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Resistive-Open Defect Analysis for Through-Silicon-ViasDCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France |
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Defect Analysis in Power Mode Control Logic of Low-Power SRAMsETS: European Test Symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233033⟩ |
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Impact of Resistive-Bridge Defects in TAS-MRAM ArchitecturesATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.125-130, ⟨10.1109/ATS.2012.37⟩ |
A Pseudo-Dynamic Comparator for Error Detection in Fault Tolerant ArchitecturesVTS: VLSI Test Symposium, Apr 2012, Hawaii, United States. pp.50-55, ⟨10.1109/VTS.2012.6231079⟩ |
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Advanced Test Methods for SRAMsVTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.300-301, ⟨10.1109/VTS.2012.6231070⟩ |
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Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron RadiationIOLTS: International On-Line Testing Symposium, Jun 2012, Sitges, Spain. pp.212-222, ⟨10.1109/IOLTS.2012.6313853⟩ |
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Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty MeasurementsColloque GDR SoC-SiP, 2012, Paris, France |
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Complete Framework for the Estimation of the SRAM Core-Cell Resilience to RadiationRADECS: Radiation and its Effects on Components and Systems, Sep 2012, Biarritz, France |
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Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMsColloque GDR SoC-SiP, 2012, Paris, France |
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An Error Resilient Platform for Data Transfer and Power Management for a Distributed SRAM-based Neutron Detection Test BenchRADSOL: Electronique et rayonnements naturels au niveau du sol, Jun 2012, Paris, France |
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Why and How Controlling Power Consumption During Test: A SurveyATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp. 221-226, ⟨10.1109/ATS.2012.30⟩ |
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Through-Silicon-Via Resistive-Open Defect AnalysisETS: European Test Symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233037⟩ |
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A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital CircuitsATS 2011 - 20th IEEE Asian Test Symposium, Nov 2011, New Delhi, India. pp.136-141, ⟨10.1109/ATS.2011.89⟩ |
Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-FillingATS: Asian Test Symposium, 2011, New Delhi, India. pp.21-23 |
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On using a SPICE-like TSTAC™ eFlash model for design and testDDECS: Design and Diagnostics of Electronic Circuits ans Systems, Apr 2011, Cottbus, Germany. pp.359-370, ⟨10.1109/DDECS.2011.5783111⟩ |
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Variability Analysis of an SRAM Test ChipETS: European Test Symposium, May 2011, Trondheim, Norway |
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A DfT Solution for Oxide Thickness Varitions in ATMEL eFlash TechnologyDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece |
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Power Reduction Through X-filling of Transition Fault Test Vectors for LOS TestingDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece. ⟨10.1109/DTIS.2011.5941434⟩ |
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A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital CircuitsGDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France |
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Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM ArraysRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩ |
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Mapping Test Power to Functional Power through Smart X-Filling for LOS SchemeLPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway |
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Error Resilient Infrastructure for Data Transfer in a Distributed Neutron DetectorDFT 2011 - International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.294-301, ⟨10.1109/DFT.2011.41⟩ |
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Dynamic-Stress Neutrons Test of Commercial SRAMsIEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4 |
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Failure Analysis and Test Solutions for Low-Power SRAMsATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.459-460, ⟨10.1109/ATS.2011.97⟩ |
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Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line CouplingGDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France |
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Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power DevicesRADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.226-231, ⟨10.1109/RADECS.2011.6131395⟩ |
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Impact of Atmospheric Neutrons on SRAMs through a Modular Test BenchRADSOL - Electronique et rayonnements naturels au niveau du sol, Jun 2011, Paris, France |
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Test and Reliability of Magnetic Random Access MemoriesGDR SOC-SIP'11: Colloque GDR SoC-SiP, Lyon, France |
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Versatile March Test Generator for Hands-on Memory Testing LaboratoryMSE: Microelectronic Systems Education, Jun 2011, San Diego, CA, United States. pp.41-42, ⟨10.1109/MSE.2011.5937088⟩ |
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A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay TestingETS 2011 - 16th IEEE European Test Symposium, May 2011, Trondheim, Norway. pp.153-158, ⟨10.1109/ETS.2011.21⟩ |
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Robust Data Collection and Transfer Framework for a Distributed SRAM Based Neutron SensorIEEE International Workshop on Advances in Sensors and Interfaces, Jun 2011, Savelletri di Fasano, Italy. pp.176-180, ⟨10.1109/IWASI.2011.6004712⟩ |
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Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test BenchIEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6 |
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A Study of Path Delay Variations in the Presence of Uncorrelated Power and Ground Supply NoiseDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2011, Cottbus, Germany. pp.189-194, ⟨10.1109/DDECS.2011.5783078⟩ |
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Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line CouplingDDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, Netherlands. pp.353-358 |
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Power-Aware Test Pattern Generation for At-Speed LOS TestingATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.506-510 |
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Power Supply Noise and Ground Bounce Aware Pattern Generation for Delay TestingNEWCAS: International New Circuits and Systems Conference, Jun 2011, Bordeaux, France. pp.73-76, ⟨10.1109/NEWCAS.2011.5981222⟩ |
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On Using Address Scrambling to Implement Defect Tolerance in SRAMsITC'2011: International Test Conference, Sep 2011, Anaheim, CA, United States. pp.N/A |
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Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant ArchitectureJNRDM'11: Journées Nationales du Réseau Doctoral de Microélectronique, Paris, France |
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Analysis of Resistive-Open Defects in TAS-MRAM ArrayITC: International Test Conference, Sep 2011, Anaheim, CA, United States |
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Robust Structure for Data Collection and Transfer in a Distributed SRAM Based Neutron Test BenchWorkshop on Dependability Issues in Deep-Submicron Technologies, Trondheim, Norway |
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Simultaneous Power and Thermal Integrity Analysis for 3D Integrated SystemsLPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway |
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Setting Test Conditions for Improving SRAM ReliabilityETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.257-262 |
Detecting NBTI Induced Failures in SRAM Core-CellsVTS'10: VLSI Test Symposium, Santa Cruz, CA, United States. pp.75-80 |
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Test Relaxation and X-filling to Reduce Peak Power During At-Speed LOS TestingGDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France |
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Impact of Resistive-Open Defects on SRAM sensitivity to Soft ErrorsRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria |
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X-Identification of Transition Delay Fault Tests for Launch-off Shift SchemeWRTLT'10: 11th IEEE Workshop On RTL and High Level Testing, Shanghai, China. pp.N/A |
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Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell LayoutsIOLTS: International On-Line Testing Symposium, Jul 2010, Corfu, Greece. pp.29-34, ⟨10.1109/IOLTS.2010.5560236⟩ |
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Tolérance aux fautes et rendement de fabricationGDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France |
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A Two-Layer SPICE Model of the ATMEL TSTAC eFlash Memory Technology for Defect Injection and Faulty Behavior PredictionETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.81-86 |
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Analysis of Resistive-Bridging Defects in SRAM Core-Cells: a Comparative Study from 90nm down to 40nm Technology NodesETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.132-137 |
Power Reduction Through X-filling of Transition Fault Test Vectors for LOS TestingLPonTR: Impact of Low-Power design on Test and Reliability, May 2010, Prague, Czech Republic |
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Impact of Resistive-Bridging Defects in SRAM Core-CellDELTA'10: International Symposium on Electronic Design, Test & Applications, Ho Chi Minh, Vietnam. pp.265-270 |
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A Memory Fault Simulator for Radiation-Induced Effects in SRAMsATS: Asian Test Symposium, 2010, Shanghai, China. pp.100-105 |
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Analysis of Power Consumption and Transition Fault Coverage for LOS and LOC Testing SchemesDDECS'10: 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2010, Vienna, Austria. pp.376-381 |
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Analyse et modélisation des défauts résistifs affectant les mémoires FlashGDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France |
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Analysis and Fault Modeling of Actual Resistive Defects in Flash MemoriesJNRDM'10 : Journées Nationales du Réseau Doctoral de Microélectronique, Montpellier, France |
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Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-CellsVARI: Workshop on CMOS Variability, 2010, Montpellier, France |
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A Statistical Simulation Method for Reliability Analysis of SRAM Core-CellsDAC: Design Automation Conference, Jun 2010, Anaheim, United States. pp.853-856 |
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A Comprehensive System-on-Chip Logic DiagnosisATS: Asian Test Symposium, 2010, Shanghai, China. pp.237-242 |
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Delay Fault Diagnosis in Sequential CircuitsATS: Asian Test Symposium, Nov 2009, Taichung, Taiwan. pp.355-360 |
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Neutron Detection through an SRAM-Based Test BenchIWASI'09: International Workshop On Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. pp.64-69, ⟨10.1109/IWASI.2009.5184769⟩ |
Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split ModelsDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229 |
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Use of BOBST for the Detection of Neutrons Induced Errors in SRAMIWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2009, Trani, Italy |
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A Fault-Simulation-Based Approach for Logic DiagnosisDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2009, Cairo, Egypt. pp.216-221 |
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Trade-off Between Power Dissipation and Delay Fault Coverage For LOS and LOC Testing SchemesImpact of Low-Power Design on Test and Reliability, Spain |
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Comprehensive Bridging Fault Diagnosis based on the SLAT ParadigmDDECS'09: 12th IEEE Symposium on Design and Diagnostics of Electronic Systems, pp.264-269 |
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A New Design-for-Test Technique for SRAM Core-Cell Stability FaultsDATE: Design, Automation and Test in Europe, Apr 2009, Nice, France. pp.1344-1348, ⟨10.1109/DATE.2009.5090873⟩ |
Using TMR Architectures for SoC Yield ImprovementVALID'09: The First International Conference on Advances in System Testing and Validation Lifecycle, 2009, Porto, Portugal. pp.155-160 |
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A History-Based Technique for Faults Diagnosis in SRAMsColloque GDR SoC-SiP, France |
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A Signature-based Approach for Diagnosis of Dynamic Faults in SRAMsDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2008, Tunis, Tunisia. pp.001-006, ⟨10.1109/DTIS.2008.4540243⟩ |
Impact of Technology Scaling on Defects and Parameter Deviations in Embedded SRAMsVLSI Test Symposium, Apr 2008, San Diego, California, United States. pp.336 |
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A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMsITC'2008: International Test Conference, Oct 2008, Santa Clara, CA, United States. pp.1-10, ⟨10.1109/TEST.2008.4700555⟩ |
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March CRF: an Efficient Test for Complex Read Faults in SRAM MemoriesDDECS: Design and Diagnostics of Electronic Circuits and Systems, IEEE, Apr 2007, Cracovie, Poland. ⟨10.1109/DDECS.2007.4295276⟩ |
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Minimizing Test Power in SRAM through Pre-charge Activity ReductionDATE: Design, Automation and Test in Europe, Mar 2006, Munich, Germany. pp.1159-1165, ⟨10.1109/DATE.2006.244016⟩ |
March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge CircuitDDECS'06: Design and Diagnostics of Electronic Circuits and Systems, Apr 2006, Prague, République Tchèque, pp.256-261 |
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Leakage Read Fault in Nanoscale SRAM: Analysis, Test and DiagnosisIDT'06: IEEE International Design and Test Workshop, Nov 2006, Dubai, United Arab Emirates. pp.110-115 |
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Data Retention Fault in SRAM Memories: Analysis and Detection ProceduresVTS 2005 - 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA, United States. pp.183-188, ⟨10.1109/VTS.2005.37⟩ |
Resistive-Open Defect Influence in SRAM Pre-Charge Circuits: Analysis and CharacterizationETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.116-121, ⟨10.1109/ETS.2005.33⟩ |
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Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison Between 0.13 um and 90 nm TechnologiesDAC: Design Automation Conference, Jun 2005, Anaheim, CA, United States. pp.857-862 |
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Efficient Test of Dynamic Read Destructive Faults in SRAM MemoriesLATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.40-45 |
Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison between 0.13μm and 90nm TechnologiesDAC: Design Automation Conference, May 2005, Anaheim, CA, United States. pp.857-862, ⟨10.1145/1065579.1065804⟩ |
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Incidence des Défauts Résistifs dans les Circuits de Précharge des Mémoires SRAMJNRDM 2005 - 8e Journées Nationales du Réseau Doctoral de Microélectronique, May 2005, Paris, France |
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March iC-: An Improved Version of March C- for ADOFs DetectionVTS: VLSI Test Symposium, Apr 2004, Napa Valley, CA, United States. pp.129-134, ⟨10.1109/VTEST.2004.1299236⟩ |
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An A/D Interface for Resonant Piezoresistive MEMS SensorISIE 2004 - IEEE International Symposium on Industrial Electronics, May 2004, Ajaccio, France. pp.83-88, ⟨10.1109/ISIE.2004.1571786⟩ |
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Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test SolutionATS: Asian Test Symposium, Nov 2004, Kenting, Taiwan. pp.266-271 |
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Dynamic Read Destructive Faults in Embedded-SRAMs: Analysis and March Test SolutionETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.140-145 |
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March Tests Improvements for Address Decoder Open and Resistive Open Fault DetectionLATW: Latin American Test Workshop, Mar 2004, Cartagena, Colombia. pp.31-36 |
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Test March pour la Détection des Fautes Dynamiques dans les Décodeurs de Mémoires SRAMJNRDM'04 : 7ièmes Journées Nationales du Réseau Doctoral de Microélectronique, May 2004, Marseille, France. pp.495-497 |
Comparison of open and resistive-open defect test conditions in SRAM address decodersATS: Asian Test Symposium, Nov 2003, Xian, China. pp.250-255, ⟨10.1109/ATS.2003.1250818⟩ |
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Machine learning application to space particle discrimination from multiple-cell upsets in a memory deviceRADECS 2022 - 22nd European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy. , 2022 |
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Technology Dependence of Stuck Bits and Single Event Upsets in 110, 72, and 63-nm SDRAMsRADECS 2022 - 22nd European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy. |
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A Performance Evaluation of a Fault-tolerant RISC-V with Vector Instruction Support to Space ApplicationsLASSS/LACW 2022 - Joint 3rd IAA Latin American Symposium on Small Satellites and 5th IAA Latin American CubeSat Workshop, Nov 2022, Brasilia, Brazil. , 2022 |
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Assessing the Reliability of a Network-on-Chip through Physical ValidationLASSS/LACW 2022 - Joint 3rd IAA Latin American Symposium on Small Satellites and 5th IAA Latin American CubeSat Workshop, Nov 2022, Brasilia, Brazil. , 2022 |
Interconnection Architecture for Dependable Multicore SystemsPhD Forum - 26th IFIP/IEEE International Conference on Very Large Scale Integration, Oct 2018, Torino, Italy. 2018 |
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Fault-Effect Propagation Based Intra-cell Scan Chain DiagnosisColloque GDR SoC-SiP, Jun 2013, Lyon, France. 2013 |
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Performance Evaluation of Capacitive defects on TAS-MRAMsColloque GDR SoC-SiP, 2013, Lyon, France. 2013 |
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Investigating Multiple-Cell-Upsets on a 90mn SRAMColloque GDR SoC-SiP, 2013, Lyon, France. 2013 |
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Coupling-Based Resistive-Open Defects in TAS-MRAM ArchitecturesETS: European Test Symposium, May 2012, Annecy, France. Test Symposium (ETS), 2012 17th IEEE European, 2012, ⟨10.1109/ETS.2012.6233034⟩ |
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Resistive Open Defect Analysis for Through-Silicon-ViasETS: European Test Symposium, May 2012, Annecy, France. 17th IEEE European Test Symposium, pp.183, 2012 |
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Parity Prediction Synthesis for Nano-Electronic Gate DesignsITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. pp.N/A, 2010 |
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Is Test Power Reduction Through X-Filling Good Enough?ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. 2010 |
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A Roaming Memory Test Bench for Detecting Particle Induced SEUsITC 2010 - International Test Conference, Nov 2010, Austin, TX, United States. 2010, ⟨10.1109/TEST.2010.5699302⟩ |
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Analysis of Resistive-Bridging Defects in SRAM Core-Cell: Impact within the Core-Cell and in the Memory ArrayETS: European Test Symposium, May 2009, Sevilla, Spain. 14th IEEE European Test Symposium, 2009 |
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A Logic Diagnosis Approach for Sequential CircuitsETS 2009 - 14th IEEE European Test Symposium, May 2009, Sevilla, Spain. , 2009, Ph. D. Forum |
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SoC Yield Improvement for Future Nanoscale TechnologiesETS 2009 - 14th IEEE European Test Symposium | PhD Forum, May 2009, Sevilla, Spain. 2009 |
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SRAM Core-cell Quality MetricsGDR SOC SIP, France. 2009 |
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NAND Flash Testing: A Preliminary Study on Actual DefectsITC: International Test Conference, Nov 2009, Austin, TX, United States. 2009, ⟨10.1109/TEST.2009.5355898⟩ |
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Trade-off Between Power Dissipation and Delay Fault Coverage for LOS and LOC Testing SchemesGDR SOC SIP, France. 2009 |
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Test des Mémoires FLASH NANDColloque GDR SoC-SiP, France. 2009 |
Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled TechnologiesSpringer, 171 p., 2009, 978-1-4419-0937-4 |
Space Radiation Effects in ElectronicsRad-hard Semiconductor Memories, Series in Electronic Materials and Devices, River Publishers, pp.1-56, 2018, 9788770220200 |
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Electromigration Alleviation Techniques for 3D Integrated CircuitsChao Wang. High Performance Computing for Big Data: Methodologies and Applications, CRC Press, pp.37-58, 2017, 9781498783996 |
Effect of space radiation on COTS memories: the MTCUBE project2019 |
Rapport Technique intermédiaire, Contrat TOETS CT 302, Programme CEE CATRENE2011 |
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Rapport Technique de fin d'année, Contrat TOETS CT 302, Programme CEE CATRENE2011 |
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Contrat TOETS CT 302 - Programme CEE CATRENE (Rapport Intermédiaire)2010 |
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TOETS CT302 - Programme CEE CATRENE - Summary Technical Report 2S-2009 - Rapport Technique de Fin d'année2010 |
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Rapport Technique de fin de Contrat NanoTEST 2A702, Programme CEE MEDEA+2009 |
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Test and Reliability of Electronic Circuits in Natural and Radiative EnvironmentElectronics. Université de Montpellier, 2015 |