|
Physical Explanation for the Higher Sensitivity to Ion-Induced Burnout in SiC Schottky Diodes Compared to Si Schottky Diodes
Cleiton Marques
,
Alain Michez
,
Frédéric Wrobel
,
S. Kuboyama
,
Frédéric Saigné
et al.
RADiation Effects on Components and Systems (RADECS), Sep 2024, Maspalomas, Canary Islands, Spain
Communication dans un congrès
hal-04715410
v1
|
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Reliability Analysis of a Low-Cost CCSDS 123 Hyperspectral Image Compressor
Wesley Grignani
,
Douglas A Santos
,
Luigi Dilillo
,
Douglas R Melo
37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom
Communication dans un congrès
hal-04715407
v1
|
|
Implementation and Reliability Evaluation of a ChaCha20 Stream Cipher Hardware Accelerator
Wesley Grignani
,
Khalil G Q Santana
,
Douglas Almeida dos Santos
,
Luigi Dilillo
,
Douglas R Melo
37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom
Communication dans un congrès
hal-04715408
v1
|
|
Reliability and Performance Evaluation of a RISC-V Vector Extension Unit for Vector Multiplication
Carolina Imianosky
,
Douglas A Santos
,
Douglas R Melo
,
Felipe Viel
,
Luigi Dilillo
37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom
Communication dans un congrès
hal-04715405
v1
|
|
Hardening a Real-Time Operating System for a Dependable RISC-V System-on-Chip
Benjamin Mezger
,
Douglas Santos
,
Luigi Dilillo
,
Douglas Melo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313566⟩
Communication dans un congrès
hal-04266886
v1
|
|
A Low-Cost Hardware Accelerator for CCSDS 123 Lossless Hyperspectral Image Compression
Wesley Grignani
,
Douglas Santos
,
Luigi Dilillo
,
Felipe Viel
,
Douglas Melo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313567⟩
Communication dans un congrès
hal-04266881
v1
|
|
Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-V
André Martins Pio de Mattos
,
Douglas Almeida dos Santos
,
Viyas Gupta
,
Thomas Borel
,
Luigi Dilillo
RADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Communication dans un congrès
hal-04266897
v1
|
|
Enhancement of System Observability During System-Level Radiation Testing through Total Current Consumption Monitoring
Ivan Slipukhin
,
Andrea Coronetti
,
Rubén García Alía
,
Frédéric Saigné
,
Jérôme Boch
et al.
2023 European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Communication dans un congrès
hal-04266900
v1
|
|
Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh Environments
André Martins Pio de Mattos
,
Douglas Almeida dos Santos
,
Carolina Imianosky
,
Douglas Rossi Melo
,
Luigi Dilillo
Communication dans un congrès
hal-04266899
v1
|
|
Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip
Douglas Almeida dos Santos
,
Pablo M. Aviles
,
André Martins Pio de Mattos
,
Mario García Valderas
,
Luis Entrena
et al.
RADECS 2023 - 23rd European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Communication dans un congrès
hal-04266891
v1
|
|
Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space Environments
Douglas Santos
,
André Martins Pio de Mattos
,
Douglas Melo
,
Luigi Dilillo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313549⟩
Communication dans un congrès
hal-04266887
v1
|
|
Implementation and Reliability Evaluation of a RISC-V Vector Extension Unit
Carolina Imianosky
,
Douglas Santos
,
Douglas Melo
,
Felipe Viel
,
Luigi Dilillo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313569⟩
Communication dans un congrès
hal-04266888
v1
|
|
CRATEBO: A High-speed, Radiation-Tolerant and Versatile Testing Platform for FPGA Radiation Qualification for High-Energy Particle Accelerator applications
Antonio Scialdone
,
Rudy Ferraro
,
Panagiotis Gkountoumis
,
Salvatore Danzeca
,
Luigi Dilillo
et al.
TWEPP 2023 Topical Workshop on Electronics for Particle Physics, Oct 2023, Geremeas, Italy
Communication dans un congrès
hal-04122431
v1
|
|
Hybrid Radiation Hardening Approach: a RISC-V System-on-Chip case study
Luigi Dilillo
,
Douglas Almeida dos Santos
,
Lucas Matana Luza
,
André Martins Pio de Mattos
,
Douglas Rossi de Melo
et al.
G-RADNEXT Workshop, Nov 2023, Geneva, Switzerland
Communication dans un congrès
hal-04296178
v1
|
|
Radiation-induced SEL in a COTS SRAM memory - test and flight data
Douglas Almeida dos Santos
,
Lucas Matana Luza
,
André Martins Pio de Mattos
,
Thomas Borel
,
Viyas Gupta
et al.
TEC-QEC Final Presentation Days, Jun 2023, Noordwijk, Netherlands
Communication dans un congrès
hal-04295893
v1
|
|
Objectives and outcomes of WP6 in the second year of RADNEXT: Methodologies for Radiation Test of Systems
Luigi Dilillo
,
Luis Entrena
RADNEXT 2nd Annual Meeting, May 2023, Seville, Spain
Communication dans un congrès
hal-04296158
v1
|
|
Qualification methodology for Radio Frequency Integrated Circuit for wireless-based platforms in radiation environments
Antonio Scialdone
,
Rudy Ferraro
,
Luigi Dilillo
,
Frédéric Saigné
,
Jérôme Boch
et al.
RADECS 2022 - 22nd European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy
Communication dans un congrès
hal-04124165
v1
|
|
Effects of High-Energy Protons on a Self-Refresh DRAM
Lucas Matana Luza
,
Carolina Imianosky
,
André Martins Pio de Mattos
,
Douglas Almeida dos Santos
,
Daniel Söderström
et al.
SELSE 2022 - 18th IEEE Workshop on Silicon Errors in Logic – System Effects, May 2022, Virtual Event, Italy
Communication dans un congrès
lirmm-03832662
v1
|
|
Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip
Douglas Almeida dos Santos
,
André Martins Pio de Mattos
,
Lucas Matana Luza
,
Carlo Cazzaniga
,
Maria Kastriotou
et al.
DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2022, Austin, United States. pp.1-6, ⟨10.1109/DFT56152.2022.9962335⟩
Communication dans un congrès
lirmm-03833983
v1
|
|
Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices
Lucas Matana Luza
,
Frédéric Wrobel
,
Luis Entrena
,
Luigi Dilillo
Communication dans un congrès
lirmm-03833958
v1
|
|
Objectives and outcomes of WP6 in the first year of RADNEXT Methodologies for Radiation test of Systems
Luigi Dilillo
RADNEXT DAYS 2022 - 1st Annual Meeting, Jun 2022, Geneva, Switzerland
Communication dans un congrès
hal-04295913
v1
|
|
A Model-Based Framework to Assess the Reliability of Safety-Critical Applications
Lucas Matana Luza
,
Annachiara Ruospo
,
Alberto Bosio
,
Ernesto Sanchez
,
Luigi Dilillo
DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩
Communication dans un congrès
hal-03266848
v1
|
|
Characterization of a RISC-V System-on-Chip under Neutron Radiation
Douglas Almeida dos Santos
,
Lucas Matana Luza
,
Maria Kastriotou
,
Carlo Cazzaniga
,
Cesar A Zeferino
et al.
DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505054⟩
Communication dans un congrès
lirmm-03357515
v1
|
|
Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip Router
Douglas Rossi de Melo
,
Cesar Albenes Zeferino
,
Eduardo Augusto Bezerra
,
Luigi Dilillo
DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505053⟩
Communication dans un congrès
lirmm-03358975
v1
|
|
Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study
Lucas Matana Luza
,
Daniel Söderström
,
André Martins Pio de Mattos
,
Eduardo Augusto Bezerra
,
Carlo Cazzaniga
et al.
DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
Communication dans un congrès
lirmm-03357444
v1
|
|
Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks
Annachiara Ruospo
,
Lucas Matana Luza
,
Alberto Bosio
,
Marcello Traiola
,
Luigi Dilillo
et al.
Communication dans un congrès
lirmm-03435567
v1
|
|
A Low-Cost Fault-Tolerant RISC-V Processor for Space Systems
Douglas Almeida dos Santos
,
Lucas Matana Luza
,
Cesar Albenes Zeferino
,
Luigi Dilillo
,
Douglas Rossi de Melo
DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-5, ⟨10.1109/DTIS48698.2020.9081185⟩
Communication dans un congrès
lirmm-03026132
v1
|
|
Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems
Lucas Matana Luza
,
Daniel Soderstrom
,
Georgios Tsiligiannis
,
Helmut Puchner
,
Carlo Cazzaniga
et al.
DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩
Communication dans un congrès
lirmm-03025736
v1
|
|
Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment
Daniel Soderstrom
,
Lucas Matana Luza
,
Heikki Kettunen
,
Arto Javanainen
,
Wilfrid Farabolini
et al.
NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference, Nov 2020, Santa Fe (virtual), United States
Communication dans un congrès
lirmm-03028881
v1
|
|
COTS Optocoupler radiation qualification process for LHC applications based on mixed-energy neutron irradiations
Rudy Ferraro
,
Gilles Foucard
,
Angelo Infantino
,
Luigi Dilillo
,
Markus Brugger
et al.
RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. pp.1395-1403, ⟨10.1109/TNS.2020.2972777⟩
Communication dans un congrès
hal-03363644
v1
|
|
Characterization of a RISC-V Microcontroller Through Fault Injection
Dario Asciolla
,
Luigi Dilillo
,
Douglas Almeida dos Santos
,
Douglas Melo
,
Alessandra Menicucci
et al.
APPLEPIES 2019 - International Conference on Applications in Electronics Pervading Industry, Environment and Society, Sep 2019, Pisa, Italy. pp.91-101, ⟨10.1007/978-3-030-37277-4_11⟩
Communication dans un congrès
lirmm-03025657
v1
|
|
Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
Lucas Matana Luza
,
Daniel Soderstrom
,
Helmut Puchner
,
Ruben Garcia Alia
,
Manon Letiche
et al.
DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩
Communication dans un congrès
lirmm-03025721
v1
|
|
On-board Compressing of Hyperspectral Images using CCSDS 123
Douglas Almeida dos Santos
,
Cesar Albenes Zeferino
,
Eduardo Augusto Bezerra
,
Luigi Dilillo
,
Douglas Rossi Melo
Communication dans un congrès
lirmm-03025767
v1
|
|
Stuck and Weakened Bits in SDRAM from a Heavy-Ion Microbeam
Daniel Söderström
,
Lucas Matana Luza
,
Alexandre Bosser
,
Thierry Gil
,
Kay-Obbe Voss
et al.
Communication dans un congrès
lirmm-03359010
v1
|
|
Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash
Viyas Gupta
,
Alexandre Louis Bosser
,
Lucas Matana Luza
,
Daniel Söderström
,
Arto Javanainen
et al.
Communication dans un congrès
lirmm-03358989
v1
|
|
Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory
Lucas Matana Luza
,
Alexandre Bosser
,
Viyas Gupta
,
Arto Javanainen
,
Ali Mohammadzadeh
et al.
DFT 2019 - 32th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2019, Noordwijk, Netherlands. pp.1-6, ⟨10.1109/DFT.2019.8875475⟩
Communication dans un congrès
lirmm-03025660
v1
|
|
Design and Implementation of a Flexible Interface for TID Detector
Iacopo Fara
,
Lucas Matana Luza
,
Jérôme Boch
,
Gianluca Furano
,
Marco Ottavi
et al.
IWASI 2019 - 8th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2019, Otranto, Italy. pp.158-162, ⟨10.1109/IWASI.2019.8791299⟩
Communication dans un congrès
lirmm-02415559
v1
|
|
A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites
Cézar Antônio Rigo
,
Lucas Matana Luza
,
Elder Dominghini Tramontin
,
Victor Martins
,
Sara Vega Martinez
et al.
Communication dans un congrès
lirmm-02008436
v1
|
|
Analyzing the Error Propagation in a Parameterizable Network-on-Chip Router
Douglas Rossi de Melo
,
Cesar Zeferino
,
Luigi Dilillo
,
Eduardo Augusto Bezerra
Communication dans un congrès
lirmm-02008414
v1
|
|
Study of the Impact of the LHC Radiation Environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic Components
Rudy Ferraro
,
Salvatore Danzeca
,
Luigi Dilillo
,
Chiara Cangialosi
,
Rubén García Alía
et al.
RADECS: Radiation Effects on Components and Systems, Sep 2018, Göteborg, Sweden
Communication dans un congrès
lirmm-02008384
v1
|
|
Implementation of fault tolerance techniques for integrated network interfaces
Douglas Rossi de Melo
,
Cesar Zeferino
,
Antonio Ramos
,
Luigi Dilillo
,
Eduardo Augusto Bezerra
3rd IAA Latin American CubeSat Workshop (IAA-LACW 2018), Dec 2018, Ubatuba, Brazil
Communication dans un congrès
lirmm-02008453
v1
|
|
Evaluation of the temperature influence on SEU vulnerability of DICE and 6T-SRAM cells
Emna Farjallah
,
Valentin Gherman
,
Jean-Marc Armani
,
Luigi Dilillo
DTIS 2018 - 13th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, LIRMM, Apr 2018, Taormina, Italy. ⟨10.1109/DTIS.2018.8368578⟩
Communication dans un congrès
lirmm-02008214
v1
|
|
Enabling deep-space CubeSat missions through state-of-the-art radiation-hardened technologies
Lucas Matana Luza
,
Cézar Antônio Rigo
,
Elder Dominghini Tramontin
,
Victor Manuel Goncalves Martins
,
Sara Vega Martinez
et al.
3rd IAA Latin American CubeSat Workshop (IAA-LACW 2018), Dec 2018, Ubatuba, Brazil
Communication dans un congrès
lirmm-02008460
v1
|
|
A calculation method to estimate single event upset cross section
Frédéric Wrobel
,
Antoine Touboul
,
Vincent Pouget
,
Luigi Dilillo
,
Jérôme Boch
et al.
ESREF 2017 - 28th European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France. pp.644-649, ⟨10.1016/j.microrel.2017.07.056⟩
Communication dans un congrès
hal-01929212
v1
|
|
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random- Access Memory
Alexandre Louis Bosser
,
Viyas Gupta
,
Arto Javanainen
,
Georgios Tsiligiannis
,
Stephen D. Lalumondiere
et al.
RADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland
Communication dans un congrès
hal-01929267
v1
|
|
Improvement of the tolerated raw bit-error rate in NAND Flash-based SSDs with the help of embedded statistics
Valentin Gherman
,
Emna Farjallah
,
Jean-Marc Armani
,
Marcelino Seif
,
Luigi Dilillo
Communication dans un congrès
lirmm-01582185
v1
|
|
Refresh frequency reduction of data stored in SSDs based on A-timer and timestamps
Marcelino Seif
,
Emna Farjallah
,
Franck Badets
,
Emna Chabchoub
,
Christophe Layer
et al.
Communication dans un congrès
lirmm-01687675
v1
|
|
The Power Law Shape of Heavy Ions Experimental Cross Section
Frédéric Wrobel
,
Antoine Touboul
,
Vincent Pouget
,
Luigi Dilillo
,
Eric Lorfèvre
et al.
NSREC: Nuclear and Space Radiation Effects Conference, IEEE NPSS (Nuclear & Plasma Sciences Society ), Jul 2016, Portland, United States
Communication dans un congrès
lirmm-01298421
v1
|
|
An effective BIST architecture for power-gating mechanisms in low-power SRAMs
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Arnaud Virazel
,
Leonardo B. Zordan
ISQED 2016 - 17th International Symposium on Quality Electronic Design, Mar 2016, Santa Clara, CA, United States. pp.185-191, ⟨10.1109/ISQED.2016.7479198⟩
Communication dans un congrès
lirmm-01457424
v1
|
|
Muon effects on SRAMs
Luigi Dilillo
RADSOL: Electronique et rayonnements naturels au niveau du sol, CNRS - GDR ERRATA, Jun 2016, Paris, France
Communication dans un congrès
lirmm-01382532
v1
|
|
MTCube project: COTS memory SEE ground-test results and in-orbit error rate prediction
Viyas Gupta
,
Alexandre Louis Bosser
,
Frédéric Wrobel
,
Frédéric Saigné
,
Laurent Dusseau
et al.
4S: Small Satellites Systems and Services Symposium, Centre national d'études spatiales (CNES); European Space Agency (ESA), May 2016, La Valletta, Malta
Communication dans un congrès
lirmm-01298423
v1
|
|
Design of a Radiation Tolerant System for Total Ionizing Dose Monitoring Using Floating Gate and RadFET Dosimeters
Rudy Ferraro
,
Salvatore Danzeca
,
Matteo Brucoli
,
Alessandro Masi
,
Markus Brugger
et al.
TWEPP: Topical Workshop on Electronics for Particle Physics, Sep 2016, Karlsruhe, Germany
Communication dans un congrès
lirmm-01382578
v1
|
|
Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAM
Alexandre Louis Bosser
,
Viyas Gupta
,
Arto Javanainen
,
Georgios Tsiligiannis
,
Helmut Puchner
et al.
RADECS: Radiation and Its Effects on Components and Systems, Sep 2016, Bremen, Germany
Communication dans un congrès
lirmm-01337405
v1
|
|
Proton-Induced SDRAM Cell Degradation
Axel Rodriguez
,
Frédéric Wrobel
,
Anne Samaras
,
Francoise Bezerra
,
Benjamin Vandevelde
et al.
Communication dans un congrès
lirmm-01238408
v1
|
|
Methods for radiation test of memories
Luigi Dilillo
RADSOL: Electronique et rayonnements naturels au niveau du sol, GDR ERRATA (CNRS), Jun 2015, Paris, France
Communication dans un congrès
lirmm-01238437
v1
|
|
Scan-chain intra-cell defects grading
Aymen Touati
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Arnaud Virazel
et al.
Communication dans un congrès
lirmm-01272696
v1
|
|
An effective hybrid fault-tolerant architecture for pipelined cores
Imran Wali
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
Communication dans un congrès
lirmm-01272730
v1
|
|
An effective ATPG flow for Gate Delay Faults
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Arnaud Virazel
,
Paolo Bernardi
et al.
Communication dans un congrès
lirmm-01272719
v1
|
|
Real-Time SRAM Based Particle Detector
Luigi Dilillo
,
Alexandre Louis Bosser
,
Viyas Gupta
,
Frédéric Wrobel
,
Frédéric Saigné
IWASI: International Workshop on Advances in Sensors and Interfaces, Politecnico di Bari, Jun 2015, Gallipoli, Italy. pp.58-62, ⟨10.1109/IWASI.2015.7184968⟩
Communication dans un congrès
lirmm-01238435
v1
|
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Exploring the impact of functional test programs re-used for power-aware testing
Aymen Touati
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Arnaud Virazel
et al.
DATE 2015 - 18th Design, Automation and Test in Europe Conference and Exhibition, Mar 2015, Grenoble, France. pp.1277-1280, ⟨10.7873/DATE.2015.1031⟩
Communication dans un congrès
lirmm-01272937
v1
|
|
A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing
Alexandre Louis Bosser
,
Viyas Gupta
,
Georgios Tsiligiannis
,
Rudy Ferraro
,
Christopher Frost
et al.
Communication dans un congrès
lirmm-01238397
v1
|
|
Design-for-Diagnosis Architecture for Power Switches
Miroslav Valka
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Arnaud Virazel
et al.
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.43-48, ⟨10.1109/DDECS.2015.18⟩
Communication dans un congrès
lirmm-01272684
v1
|
|
An ATPG Flow to Generate Crosstalk-Aware Path Delay Pattern
Anu Asokan
,
Alberto Bosio
,
Arnaud Virazel
,
Luigi Dilillo
,
Patrick Girard
et al.
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.515-520, ⟨10.1109/ISVLSI.2015.99⟩
Communication dans un congrès
lirmm-01272933
v1
|
|
Generic Analytic Expression of Heavy Ion SEU Cross Section Derived from Monte-Carlo Diffusion-Based Prediction Code
Frédéric Wrobel
,
Antoine Touboul
,
Vincent Pouget
,
Luigi Dilillo
,
Robert Ecoffet
et al.
NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States
Communication dans un congrès
lirmm-01238388
v1
|
|
Impact of Stacked-Layer Structure on SEE Rate of SRAMs
Viyas Gupta
,
Alexandre Louis Bosser
,
Georgios Tsiligiannis
,
Ali Mohammadzadeh
,
Arto Javanainen
et al.
NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States
Communication dans un congrès
lirmm-01238384
v1
|
|
Heavy-ion radiation impact on a 4Mb FRAM under Different Test Conditions
Viyas Gupta
,
Alexandre Louis Bosser
,
Georgios Tsiligiannis
,
Ali Mohammadzadeh
,
Arto Javanainen
et al.
Communication dans un congrès
lirmm-01238392
v1
|
|
Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs
Alexandre Louis Bosser
,
Viyas Gupta
,
Georgios Tsiligiannis
,
Arto Javanainen
,
Heikki Kettunen
et al.
Communication dans un congrès
hal-01932433
v1
|
|
On the Generation of Diagnostic Test Set for Intra-cell Defects
Zhenzhou Sun
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Arnaud Virazel
et al.
Communication dans un congrès
lirmm-01272539
v1
|
|
Radiation Study of a 4Mbit Ferroelectric RAM for Space Applications
Helmut Puchner
,
Georgios Tsiligiannis
,
Luigi Dilillo
SEE: Single Event Effects, Aeroflex Corporation, the Aerospace Corporation, Brigham Young University, Lockheed Martin, the NASA Electronic Parts and Packaging Program, the Naval Research Laboratory, Sandia National Laboratories, and Vanderbilt University, May 2014, San Diego, United States
Communication dans un congrès
lirmm-01297441
v1
|
|
Timing-aware ATPG for critical paths with multiple TSVs
Carolina Momo Metzler
,
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Communication dans un congrès
lirmm-01248600
v1
|
|
Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components
Alexandre Louis Bosser
,
Luigi Dilillo
,
Viyas Gupta
,
Arto Javanainen
,
Heikki Kettunen
et al.
Physics Days, Finnish Physical Society, Tampere University of Technology (TUT), and Tavicon Ltd., Mar 2014, Tampere, Finland
Communication dans un congrès
lirmm-01238439
v1
|
|
An intra-cell defect grading tool
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
,
Stefano Bernabovi
et al.
Communication dans un congrès
lirmm-01248591
v1
|
|
Presentation of the MTCube CubeSat Project
Viyas Gupta
,
Luigi Dilillo
,
Frédéric Wrobel
,
Ali Mohammad Zadeh
,
Muriel Bernard
et al.
4S Symposium 2014 - Small Satellites Systems and Services, European Space Agency (ESA); Centre National d'Etudes Spatiales (CNES), May 2014, Majorca, Spain
Communication dans un congrès
lirmm-01272951
v1
|
|
TSV aware timing analysis and diagnosis in paths with multiple TSVs
Carolina Momo Metzler
,
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Communication dans un congrès
lirmm-01248594
v1
|
|
A Comprehensive Evaluation of Functional Programs for Power-Aware Test
Aymen Touati
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
NATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. pp.69-72, ⟨10.1109/NATW.2014.23⟩
Communication dans un congrès
lirmm-01248597
v1
|
|
Test of 90nm SRAMs at Concordia Station in Antarctica
Luigi Dilillo
RADSOL: Electronique et rayonnements naturels au niveau du sol, GDR ERRATA (CNRS); Institut Carnot STAR (Marseille), Jun 2014, Paris, France
Communication dans un congrès
lirmm-01238438
v1
|
|
A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply Noise
Anu Asokan
,
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2014, Tampa, FL, United States. pp.226-231, ⟨10.1109/ISVLSI.2014.42⟩
Communication dans un congrès
lirmm-01248592
v1
|
|
Test and diagnosis of power switches
Miroslav Valka
,
Alberto Bosio
,
Luigi Dilillo
,
Aida Todri-Sanial
,
Arnaud Virazel
et al.
Communication dans un congrès
lirmm-01248590
v1
|
|
Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude Vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation
Tarek Saad Saoud
,
Soilihi Moindjie
,
Jean-Luc Autran
,
Daniela Munteanu
,
Frédéric Wrobel
et al.
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès
lirmm-01237717
v1
|
|
Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce
Anu Asokan
,
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Communication dans un congrès
lirmm-01248599
v1
|
|
Single Event Upset Prediction from Heavy Ions Cross Sections with No Parameters
Frédéric Wrobel
,
Antoine Touboul
,
Vincent Pouget
,
Luigi Dilillo
,
Frédéric Saigné
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès
lirmm-01237668
v1
|
|
Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal consideration
Yuanqing Cheng
,
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Communication dans un congrès
lirmm-01248596
v1
|
|
iBoX — Jitter based Power Supply Noise sensor
Miroslav Valka
,
Alberto Bosio
,
Luigi Dilillo
,
Aida Todri-Sanial
,
Arnaud Virazel
et al.
Communication dans un congrès
lirmm-01248601
v1
|
|
Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès
lirmm-01237709
v1
|
|
Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation
Georgios Tsiligiannis
,
Luigi Dilillo
,
Viyas Gupta
,
Alberto Bosio
,
Patrick Girard
et al.
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès
lirmm-01237660
v1
|
|
Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults
Imran Wali
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Communication dans un congrès
lirmm-01248598
v1
|
|
SEU Cross Section Calculation Based on Experimental Data of Another kind of Particle
Annelise Touboul
,
Antoine Touboul
,
Frédéric Wrobel
,
V. Pouget
,
Luigi Dilillo
et al.
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès
hal-01934616
v1
|
|
Computing Detection Probability of Delay Defects in Signal Line TSVs
Carolina Momo Metzler
,
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Communication dans un congrès
lirmm-00839044
v1
|
|
An Integrated Solid Detector For Onboard Detection Of Natural Radiations In Atmosphere
Frédéric Wrobel
,
Jean-Roch Vaillé
,
Antoine Touboul
,
Luigi Dilillo
,
Frédéric Saigné
iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL synchrotron, Jun 2013, Paris, France
Communication dans un congrès
lirmm-01238432
v1
|
|
A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMs
Leonardo B. Zordan
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
Communication dans un congrès
lirmm-00805366
v1
|
|
Test Solution for Data Retention Faults in Low-Power SRAMs
Leonardo B. Zordan
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
DATE 2013 - 16th Design, Automation and Test in Europe Conference, Mar 2013, Grenoble, France. pp.442-447, ⟨10.7873/DATE.2013.099⟩
Communication dans un congrès
lirmm-00805140
v1
|
|
A novel method to mitigate TSV electromigration for 3D ICs
Yuanqing Cheng
,
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Communication dans un congrès
lirmm-01248617
v1
|
|
On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell
Elena Ioana Vatajelu
,
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
et al.
DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. pp.143-148, ⟨10.1109/DFT.2013.6653597⟩
Communication dans un congrès
lirmm-01238413
v1
|
|
Comparison of the transient current shapes obtained with the diffusion model and the double exponential law — Impact on the SER
Frédéric Wrobel
,
Luigi Dilillo
,
Antoine Touboul
,
Frédéric Saigné
Communication dans un congrès
lirmm-01237599
v1
|
|
SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variations
Georgios Tsiligiannis
,
Elena Ioana Vatajelu
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
et al.
Communication dans un congrès
lirmm-00818955
v1
|
|
Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBT
Lionel Foro
,
Antoine Touboul
,
Frédéric Wrobel
,
Paolo Rech
,
Luigi Dilillo
et al.
Communication dans un congrès
lirmm-01237617
v1
|
|
On the Reuse of Read and Write Assist Circuits to Improve Test Efficiency in Low-Power SRAMs
Leonardo B. Zordan
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
Communication dans un congrès
lirmm-00818977
v1
|
|
Performance Characterization of TAS-MRAM Architectures in Presence of Capacitive Defects
João Azevedo
,
Arnaud Virazel
,
Yuanqing Cheng
,
Alberto Bosio
,
Luigi Dilillo
et al.
VALID: Advances in System Testing and Validation Lifecycle, Oct 2013, Venice, Italy. pp.39-44
Communication dans un congrès
lirmm-01433308
v1
|
|
Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation Environments
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
Communication dans un congrès
lirmm-00839046
v1
|
|
Analyzing resistive-open defects in SRAM core-cell under the effect of process variability
Elena Ioana Vatajelu
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
Communication dans un congrès
lirmm-01921630
v1
|
|
Temperature Impact on the Neutron SER of a Commercial 90nm SRAM
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2013, San Francisco, Ca, United States. pp.1-4
Communication dans un congrès
lirmm-00805291
v1
|
|
Fast and Accurate Electro-Thermal Analysis of Three-Dimensional Power Delivery Networks
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Arnaud Virazel
EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2013, Wroclaw, Poland. pp.1-4, ⟨10.1109/EuroSimE.2013.6529956⟩
Communication dans un congrès
lirmm-00839043
v1
|
|
Effect-Cause Intra-Cell Diagnosis at Transistor Level
Zhenzhou Sun
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
ISQED 2013 - 14th International Symposium on Quality Electronic Design, Mar 2013, Santa Clara, CA, United States. pp.460-467, ⟨10.1109/ISQED.2013.6523652⟩
Communication dans un congrès
lirmm-00817224
v1
|
|
Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic Mode
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
Communication dans un congrès
lirmm-00839062
v1
|
|
Mitigate TSV Electromigration for 3D ICs - From the Architecture Perspective
Yuanqing Cheng
,
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
International Symposium on VLSI, Natale, Brazil. pp.6
Communication dans un congrès
lirmm-00839052
v1
|
|
Evaluating An SEU Monitor For Mixed-Field Radiation Environments
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL Synchrotron, Jun 2013, Paris, France
Communication dans un congrès
lirmm-01238433
v1
|
|
Improving Defect Localization Accuracy by means of Effect-Cause Intra-Cell Diagnosis at Transistor Level
Zhenzhou Sun
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
SDD: Silicon Debug and Diagnosis, Sep 2013, Anaheim, CA, United States
Communication dans un congrès
lirmm-00806872
v1
|
|
SEU Monitoring in Mixed-Field Radiation Environments of Particle Accelerators
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
Communication dans un congrès
lirmm-00839085
v1
|
|
Worst-Case Power Supply Noise and Temperature Distribution Analysis for 3D PDNs with Multiple Clock Domains
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
Communication dans un congrès
lirmm-00839042
v1
|
|
Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures
Elena Ioana Vatajelu
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2013, Abu Dhabi, United Arab Emirates. pp.39-44, ⟨10.1109/DTIS.2013.6527775⟩
Communication dans un congrès
lirmm-01248603
v1
|
|
Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMs
João Azevedo
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Colloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès
lirmm-00806842
v1
|
|
Through-Silicon-Via Resistive-Open Defect Analysis
Carolina Momo Metzler
,
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Communication dans un congrès
lirmm-00806848
v1
|
|
An Error Resilient Platform for Data Transfer and Power Management for a Distributed SRAM-based Neutron Detection Test Bench
Luigi Dilillo
RADSOL: Electronique et rayonnements naturels au niveau du sol, Jun 2012, Paris, France
Communication dans un congrès
lirmm-00805398
v1
|
|
Why and How Controlling Power Consumption During Test: A Survey
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
,
Arnaud Virazel
Communication dans un congrès
lirmm-00818984
v1
|
|
Complete Framework for the Estimation of the SRAM Core-Cell Resilience to Radiation
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Aida Todri-Sanial
et al.
RADECS: Radiation and its Effects on Components and Systems, Sep 2012, Biarritz, France
Communication dans un congrès
hal-01935785
v1
|
|
Dynamic Mode Test of a Commercial 4Mb Toggle MRAM under Neutron Radiation
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Aida Todri-Sanial
et al.
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Communication dans un congrès
lirmm-00805165
v1
|
|
Alpha particle-induced transient currents in 65 nm and 40 nm technologies
Frédéric Wrobel
,
Luigi Dilillo
,
Antoine Touboul
,
Frédéric Saigné
SEE'2012: Single Event Effects Symposium, Apr 2012, San Diego, CA, United States. pp.1
Communication dans un congrès
lirmm-00805378
v1
|
|
Radiation Induced Effects on Electronic Systems and ICs
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
SETS: South European Test Seminar, Mar 2012, Sauze d'Oulx, Italy
Communication dans un congrès
lirmm-00807055
v1
|
|
Defect Localization Through an Effect-Cause based Intra-Cell Diagnosis
Zhenzhou Sun
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
Colloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès
lirmm-00806841
v1
|
|
Fault Localization Improvement through an Intra-Cell Diagnosis Approach
Zhenzhou Sun
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
ISTFA 2012 - 38th International Symposium for Testing and Failure Analysis, Nov 2012, Phoenix, AZ, United States. pp.509-519
Communication dans un congrès
lirmm-00806863
v1
|
|
Impact of Resistive-Open Defects on the Heat Current of TAS-MRAM Architectures
João Azevedo
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
DATE 2012 - 15th Design, Automation and Test in Europe Conference and Exhibition, Mar 2012, Dresden, Germany. pp.532-537, ⟨10.1109/DATE.2012.6176526⟩
Communication dans un congrès
lirmm-00689024
v1
|
|
Electro-Thermal Analysis of 3D Power Delivery Networks
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Arnaud Virazel
DAC: Design Automation Conference, 2012, San Francisco, United States
Communication dans un congrès
lirmm-00806836
v1
|
|
Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling
Frédéric Wrobel
,
Jean-Roch Vaillé
,
Denis Pantel
,
Luigi Dilillo
,
Jean-Marc J.-M. Galliere
et al.
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Communication dans un congrès
lirmm-00805150
v1
|
|
Power Supply Noise Sensor Based on Timing Uncertainty Measurements
Miroslav Valka
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
Communication dans un congrès
lirmm-00806890
v1
|
|
SRAM testing under Neutron Radiation for the evaluation of different algorithms stress
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Aida Todri-Sanial
et al.
15ème Journées Nationales du Réseau Doctoral en Microélectronique, Jun 2012, Marseille, France
Communication dans un congrès
lirmm-00807054
v1
|
|
A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in Altitude
Denis Pantel
,
Jean-Roch Vaillé
,
Frédéric Wrobel
,
Luigi Dilillo
,
Jean-Marc J.-M. Galliere
et al.
Communication dans un congrès
lirmm-00805169
v1
|
|
Peak Power Estimation: A Case Study on CPU Cores
Paolo Bernardi
,
Mauricio de Carvalho
,
Ernesto Sanchez
,
Matteo Sonza Reorda
,
Alberto Bosio
et al.
Communication dans un congrès
lirmm-00805389
v1
|
|
Low-power SRAMs Power Mode Control Logic: Failure Analysis and Test Solutions
Leonardo B. Zordan
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
Communication dans un congrès
lirmm-00805143
v1
|
|
A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to Neutrons
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Aida Todri-Sanial
et al.
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Communication dans un congrès
lirmm-00805163
v1
|
|
Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS Transistor
Frédéric Wrobel
,
Luigi Dilillo
,
Antoine Touboul
,
Jean-Roch Vaillé
,
Frédéric Saigné
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States. pp.1-4
Communication dans un congrès
lirmm-00805275
v1
|
|
Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM Architectures
João Azevedo
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
JNRDM: Journées Nationales du Réseau Doctoral en Microélectronique, 2012, Paris, France
Communication dans un congrès
lirmm-00806827
v1
|
|
On Using Address Scrambling for Defect Tolerance in SRAMs
Renan Alves Fonseca
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
Communication dans un congrès
lirmm-00805334
v1
|
|
Resistive-Open Defect Analysis for Through-Silicon-Vias
Carolina Momo Metzler
,
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
DCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France
Communication dans un congrès
lirmm-00806803
v1
|
|
Dynamic Mode Testing of SRAMS under Neutron Radiation
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Aida Todri-Sanial
et al.
Sixième colloque du GDR SOC-SIP du CNRS, Jun 2012, Paris, France
Communication dans un congrès
lirmm-00807053
v1
|
|
Defect Analysis in Power Mode Control Logic of Low-Power SRAMs
Leonardo B. Zordan
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
Communication dans un congrès
lirmm-00805374
v1
|
|
Impact of Resistive-Bridge Defects in TAS-MRAM Architectures
João Azevedo
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Communication dans un congrès
lirmm-00806809
v1
|
|
A Pseudo-Dynamic Comparator for Error Detection in Fault Tolerant Architectures
Ahn Duc Tran
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Communication dans un congrès
lirmm-00806778
v1
|
|
Advanced Test Methods for SRAMs
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
Communication dans un congrès
lirmm-00805049
v1
|
|
Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty Measurements
Miroslav Valka
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
Colloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès
lirmm-00806859
v1
|
|
Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron Radiation
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Aida Todri-Sanial
et al.
Communication dans un congrès
lirmm-00805373
v1
|
|
Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant Architecture
Ahn Duc Tran
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
JNRDM'11: Journées Nationales du Réseau Doctoral de Microélectronique, Paris, France
Communication dans un congrès
lirmm-00679509
v1
|
|
Robust Structure for Data Collection and Transfer in a Distributed SRAM Based Neutron Test Bench
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
Workshop on Dependability Issues in Deep-Submicron Technologies, Trondheim, Norway
Communication dans un congrès
lirmm-00651796
v1
|
|
Simultaneous Power and Thermal Integrity Analysis for 3D Integrated Systems
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway
Communication dans un congrès
lirmm-00651802
v1
|
|
Analysis of Resistive-Open Defects in TAS-MRAM Array
João Azevedo
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
ITC: International Test Conference, Sep 2011, Anaheim, CA, United States
Communication dans un congrès
lirmm-00679524
v1
|
|
A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits
Ahn Duc Tran
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
GDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France
Communication dans un congrès
lirmm-00679513
v1
|
|
Variability Analysis of an SRAM Test Chip
Renan Alves Fonseca
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
ETS: European Test Symposium, May 2011, Trondheim, Norway
Communication dans un congrès
lirmm-00651791
v1
|
|
Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays
Paolo Rech
,
Jean-Marc J.-M. Galliere
,
Patrick Girard
,
Alessio Griffoni
,
Frédéric Wrobel
et al.
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩
Communication dans un congrès
lirmm-00805314
v1
|
|
A DfT Solution for Oxide Thickness Varitions in ATMEL eFlash Technology
Pierre-Didier Mauroux
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece
Communication dans un congrès
lirmm-00647750
v1
|
|
Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing
Fangmei Wu
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
Communication dans un congrès
lirmm-00647760
v1
|
|
On using a SPICE-like TSTAC™ eFlash model for design and test
Pierre-Didier Mauroux
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Communication dans un congrès
lirmm-00592203
v1
|
|
Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power Devices
Alessio Griffoni
,
Jeroen van Duivenbode
,
Dimitri Linten
,
Eddy Simoen
,
Paolo Rech
et al.
Communication dans un congrès
lirmm-00805339
v1
|
|
Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line Coupling
Leonardo B. Zordan
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
GDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France
Communication dans un congrès
lirmm-00679522
v1
|
|
Error Resilient Infrastructure for Data Transfer in a Distributed Neutron Detector
Luigi Dilillo
,
Alberto Bosio
,
Miroslav Valka
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
DFT 2011 - International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.294-301, ⟨10.1109/DFT.2011.41⟩
Communication dans un congrès
lirmm-00651226
v1
|
|
Dynamic-Stress Neutrons Test of Commercial SRAMs
Paolo Rech
,
Jean-Marc J.-M. Galliere
,
Patrick Girard
,
Frédéric Wrobel
,
Frédéric Saigné
et al.
IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4
Communication dans un congrès
lirmm-00805349
v1
|
|
Failure Analysis and Test Solutions for Low-Power SRAMs
Leonardo B. Zordan
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
Communication dans un congrès
lirmm-00805123
v1
|
|
Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme
Fangmei Wu
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway
Communication dans un congrès
lirmm-00651905
v1
|
|
Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling
Kohei Miyase
,
Yuta Uchinodan
,
Kazunari Enokimoto
,
Yuta Yamato
,
Xiaoqing Wen
et al.
ATS: Asian Test Symposium, 2011, New Delhi, India. pp.21-23
Communication dans un congrès
lirmm-00651247
v1
|
|
A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits
Ahn Duc Tran
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Communication dans un congrès
lirmm-00651238
v1
|
|
Impact of Atmospheric Neutrons on SRAMs through a Modular Test Bench
Luigi Dilillo
RADSOL - Electronique et rayonnements naturels au niveau du sol, Jun 2011, Paris, France
Communication dans un congrès
lirmm-00805407
v1
|
|
Test and Reliability of Magnetic Random Access Memories
João Azevedo
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
GDR SOC-SIP'11: Colloque GDR SoC-SiP, Lyon, France
Communication dans un congrès
lirmm-00679516
v1
|
|
Robust Data Collection and Transfer Framework for a Distributed SRAM Based Neutron Sensor
Luigi Dilillo
,
Alberto Bosio
,
Paolo Rech
,
Patrick Girard
,
Frédéric Wrobel
et al.
IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2011, Savelletri di Fasano, Italy. pp.176-180, ⟨10.1109/IWASI.2011.6004712⟩
Communication dans un congrès
lirmm-00805394
v1
|
|
Versatile March Test Generator for Hands-on Memory Testing Laboratory
Jean-Marc J.-M. Galliere
,
Luigi Dilillo
Communication dans un congrès
lirmm-00805300
v1
|
|
A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing
Miroslav Valka
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
ETS 2011 - 16th IEEE European Test Symposium, May 2011, Trondheim, Norway. pp.153-158, ⟨10.1109/ETS.2011.21⟩
Communication dans un congrès
lirmm-00647822
v1
|
|
Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench
Luigi Dilillo
,
Paolo Rech
,
Jean-Marc J.-M. Galliere
,
Patrick Girard
,
Frédéric Wrobel
et al.
IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6
Communication dans un congrès
lirmm-00805120
v1
|
|
On Using Address Scrambling to Implement Defect Tolerance in SRAMs
Renan Alves Fonseca
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
ITC'2011: International Test Conference, Sep 2011, Anaheim, CA, United States. pp.N/A
Communication dans un congrès
lirmm-00647773
v1
|
|
Power Supply Noise and Ground Bounce Aware Pattern Generation for Delay Testing
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
Communication dans un congrès
lirmm-00647815
v1
|
|
A Study of Path Delay Variations in the Presence of Uncorrelated Power and Ground Supply Noise
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
Communication dans un congrès
lirmm-00592000
v1
|
|
Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line Coupling
Leonardo B. Zordan
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
DDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, Netherlands. pp.353-358
Communication dans un congrès
lirmm-00592182
v1
|
|
Power-Aware Test Pattern Generation for At-Speed LOS Testing
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
,
Arnaud Virazel
et al.
ATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.506-510
Communication dans un congrès
lirmm-00651917
v1
|
|
A Statistical Simulation Method for Reliability Analysis of SRAM Core-Cells
Renan Alves Fonseca
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
DAC: Design Automation Conference, Jun 2010, Anaheim, United States. pp.853-856
Communication dans un congrès
lirmm-00553619
v1
|
|
A Comprehensive System-on-Chip Logic Diagnosis
Youssef Benabboud
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
ATS: Asian Test Symposium, 2010, Shanghai, China. pp.237-242
Communication dans un congrès
lirmm-00545131
v1
|
|
Analysis of Resistive-Bridging Defects in SRAM Core-Cells: a Comparative Study from 90nm down to 40nm Technology Nodes
Renan Alves Fonseca
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.132-137
Communication dans un congrès
lirmm-00493236
v1
|
|
A Two-Layer SPICE Model of the ATMEL TSTAC eFlash Memory Technology for Defect Injection and Faulty Behavior Prediction
Pierre-Didier Mauroux
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.81-86
Communication dans un congrès
lirmm-00493204
v1
|
|
Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors
Paolo Rech
,
Jean-Marc J.-M. Galliere
,
Patrick Girard
,
Frédéric Wrobel
,
Frédéric Saigné
et al.
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria
Communication dans un congrès
lirmm-00566847
v1
|
|
X-Identification of Transition Delay Fault Tests for Launch-off Shift Scheme
Kohei Miyase
,
Fangmei Wu
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
et al.
WRTLT'10: 11th IEEE Workshop On RTL and High Level Testing, Shanghai, China. pp.N/A
Communication dans un congrès
lirmm-00566869
v1
|
|
Tolérance aux fautes et rendement de fabrication
Ahn Duc Tran
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France
Communication dans un congrès
lirmm-00553995
v1
|
|
Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts
Paolo Rech
,
Michelangelo Grosso
,
Fabio Melchiori
,
Domenico Loparco
,
Davide Appello
et al.
Communication dans un congrès
lirmm-00559034
v1
|
|
Test Relaxation and X-filling to Reduce Peak Power During At-Speed LOS Testing
Fangmei Wu
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France
Communication dans un congrès
lirmm-00553989
v1
|
|
Detecting NBTI Induced Failures in SRAM Core-Cells
Renan Alves Fonseca
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
VTS'10: VLSI Test Symposium, Santa Cruz, CA, United States. pp.75-80
Communication dans un congrès
lirmm-00553612
v1
|
|
Setting Test Conditions for Improving SRAM Reliability
Renan Alves Fonseca
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.257-262
Communication dans un congrès
lirmm-00492741
v1
|
|
Impact of Resistive-Bridging Defects in SRAM Core-Cell
Renan Alves Fonseca
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
DELTA'10: International Symposium on Electronic Design, Test & Applications, Ho Chi Minh, Vietnam. pp.265-270
Communication dans un congrès
lirmm-00553592
v1
|
|
Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing
Fangmei Wu
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
LPonTR:
Impact of Low-Power design on Test and Reliability, May 2010, Prague, Czech Republic
Communication dans un congrès
lirmm-00553930
v1
|
|
A Memory Fault Simulator for Radiation-Induced Effects in SRAMs
Paolo Rech
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
et al.
ATS: Asian Test Symposium, 2010, Shanghai, China. pp.100-105
Communication dans un congrès
lirmm-00545102
v1
|
|
Analysis and Fault Modeling of Actual Resistive Defects in Flash Memories
Pierre-Didier Mauroux
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
JNRDM'10 : Journées Nationales du Réseau Doctoral de Microélectronique, Montpellier, France
Communication dans un congrès
lirmm-00553935
v1
|
|
Analyse et modélisation des défauts résistifs affectant les mémoires Flash
Pierre-Didier Mauroux
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France
Communication dans un congrès
lirmm-00553947
v1
|
|
Analysis of Power Consumption and Transition Fault Coverage for LOS and LOC Testing Schemes
Wu Fangmei
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
DDECS'10: 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2010, Vienna, Austria. pp.376-381
Communication dans un congrès
lirmm-00475734
v1
|
|
Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-Cells
Renan Alves Fonseca
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
VARI: Workshop on CMOS Variability, 2010, Montpellier, France
Communication dans un congrès
lirmm-00553626
v1
|
|
Neutron Detection through an SRAM-Based Test Bench
Luigi Dilillo
,
Frédéric Wrobel
,
Jean-Marc J.-M. Galliere
,
Frédéric Saigné
Communication dans un congrès
lirmm-00438842
v1
|
|
Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split Models
Jean-Marc J.-M. Galliere
,
Florence Azaïs
,
Michel Renovell
,
Luigi Dilillo
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229
Communication dans un congrès
lirmm-00370798
v1
|
|
Use of BOBST for the Detection of Neutrons Induced Errors in SRAM
Luigi Dilillo
,
Frédéric Wrobel
,
Jean-Marc J.-M. Galliere
,
F. Saigné
IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2009, Trani, Italy
Communication dans un congrès
hal-01957246
v1
|
|
Delay Fault Diagnosis in Sequential Circuits
Youssef Benabboud
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
ATS: Asian Test Symposium, Nov 2009, Taichung, Taiwan. pp.355-360
Communication dans un congrès
lirmm-00406968
v1
|
|
A Fault-Simulation-Based Approach for Logic Diagnosis
Youssef Benabboud
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
et al.
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2009, Cairo, Egypt. pp.216-221
Communication dans un congrès
lirmm-00371377
v1
|
|
Comprehensive Bridging Fault Diagnosis based on the SLAT Paradigm
Youssef Benabboud
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Arnaud Virazel
et al.
DDECS'09: 12th IEEE Symposium on Design and Diagnostics of Electronic Systems, pp.264-269
Communication dans un congrès
lirmm-00371198
v1
|
|
A New Design-for-Test Technique for SRAM Core-Cell Stability Faults
Alexandre Ney
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
et al.
Communication dans un congrès
lirmm-00371374
v1
|
|
Trade-off Between Power Dissipation and Delay Fault Coverage For LOS and LOC Testing Schemes
Fangmei Wu
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
Impact of Low-Power Design on Test and Reliability, Spain
Communication dans un congrès
lirmm-00435005
v1
|
|
Using TMR Architectures for SoC Yield Improvement
Julien Vial
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
VALID'09: The First International Conference on Advances in System Testing and Validation Lifecycle, 2009, Porto, Portugal. pp.155-160
Communication dans un congrès
lirmm-00406967
v1
|
|
A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs
Alexandre Ney
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
Communication dans un congrès
lirmm-00341798
v1
|
|
A History-Based Technique for Faults Diagnosis in SRAMs
Alexandre Ney
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
Colloque GDR SoC-SiP, France
Communication dans un congrès
lirmm-00341821
v1
|
|
Impact of Technology Scaling on Defects and Parameter Deviations in Embedded SRAMs
Luigi Dilillo
,
Patrick Girard
,
Christian Landrault
,
Serge Pravossoudovitch
,
Arnaud Virazel
et al.
VLSI Test Symposium, Apr 2008, San Diego, California, United States. pp.336
Communication dans un congrès
lirmm-00324151
v1
|
|
A Signature-based Approach for Diagnosis of Dynamic Faults in SRAMs
Alexandre Ney
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
Communication dans un congrès
lirmm-00324143
v1
|
|
March CRF: an Efficient Test for Complex Read Faults in SRAM Memories
Luigi Dilillo
,
Bashir M. Al Hashimi
Communication dans un congrès
lirmm-01239052
v1
|
|
Minimizing Test Power in SRAM through Pre-charge Activity Reduction
Luigi Dilillo
,
Paul Rosinger
,
Patrick Girard
,
Bashir Al-Hashimi
Communication dans un congrès
lirmm-00137598
v1
|
|
Leakage Read Fault in Nanoscale SRAM: Analysis, Test and Diagnosis
Luigi Dilillo
,
Bashir Al-Hashimi
,
Paul Rosinger
,
Patrick Girard
IDT'06: IEEE International Design and Test Workshop, Nov 2006, Dubai, United Arab Emirates. pp.110-115
Communication dans un congrès
lirmm-00137603
v1
|
|
March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit
Luigi Dilillo
,
Patrick Girard
,
Magali Bastian Hage-Hassan
,
Serge Pravossoudovitch
,
Arnaud Virazel
DDECS'06: Design and Diagnostics of Electronic Circuits and Systems, Apr 2006, Prague, République Tchèque, pp.256-261
Communication dans un congrès
lirmm-00134776
v1
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Incidence des Défauts Résistifs dans les Circuits de Précharge des Mémoires SRAM
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
,
Magali Bastian Hage-Hassan
JNRDM 2005 - 8e Journées Nationales du Réseau Doctoral de Microélectronique, May 2005, Paris, France
Communication dans un congrès
lirmm-00106529
v1
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Resistive-Open Defect Influence in SRAM Pre-Charge Circuits: Analysis and Characterization
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
,
Magali Bastian Hage-Hassan
Communication dans un congrès
lirmm-00106010
v1
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Efficient Test of Dynamic Read Destructive Faults in SRAM Memories
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
,
Magali Bastian Hage-Hassan
LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.40-45
Communication dans un congrès
lirmm-00106515
v1
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Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison Between 0.13 um and 90 nm Technologies
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
,
Magali Bastian Hage-Hassan
DAC: Design Automation Conference, Jun 2005, Anaheim, CA, United States. pp.857-862
Communication dans un congrès
lirmm-00136906
v1
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Data Retention Fault in SRAM Memories: Analysis and Detection Procedures
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
,
Magali Bastian Hage-Hassan
VTS 2005 - 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA, United States. pp.183-188, ⟨10.1109/VTS.2005.37⟩
Communication dans un congrès
lirmm-00105995
v1
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Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison between 0.13μm and 90nm Technologies
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
,
Magali Bastian Hage-Hassan
Communication dans un congrès
lirmm-00106558
v1
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Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
,
Simone Borri
et al.
ATS: Asian Test Symposium, Nov 2004, Kenting, Taiwan. pp.266-271
Communication dans un congrès
lirmm-00108800
v1
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March Tests Improvements for Address Decoder Open and Resistive Open Fault Detection
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
,
Simone Borri
et al.
LATW: Latin American Test Workshop, Mar 2004, Cartagena, Colombia. pp.31-36
Communication dans un congrès
lirmm-00108642
v1
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Dynamic Read Destructive Faults in Embedded-SRAMs: Analysis and March Test Solution
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
,
Simone Borri
et al.
ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.140-145
Communication dans un congrès
lirmm-00108795
v1
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An A/D Interface for Resonant Piezoresistive MEMS Sensor
Luigi Dilillo
,
Vincent Beroulle
,
Norbert Dumas
,
Laurent Latorre
,
Pascal Nouet
Communication dans un congrès
lirmm-00108896
v1
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March iC-: An Improved Version of March C- for ADOFs Detection
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
,
Simone Borri
Communication dans un congrès
lirmm-00108772
v1
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Test March pour la Détection des Fautes Dynamiques dans les Décodeurs de Mémoires SRAM
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
,
Simone Borri
et al.
JNRDM'04 : 7ièmes Journées Nationales du Réseau Doctoral de Microélectronique, May 2004, Marseille, France. pp.495-497
Communication dans un congrès
lirmm-00108644
v1
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Comparison of open and resistive-open defect test conditions in SRAM address decoders
Luigi Dilillo
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
,
Simone Borri
et al.
Communication dans un congrès
lirmm-01238821
v1
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