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Luigi Dilillo

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Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-Chip

Douglas Almeida dos Santos , André Mattos , Douglas Melo , Luigi Dilillo
Electronics, 2023, 12 (12), pp.2557. ⟨10.3390/electronics12122557⟩
Journal articles hal-04120525v1
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A Survey on Deep Learning Resilience Assessment Methodologies

Annachiara Ruospo , Ernesto Sanchez , Lucas Matana Luza , Luigi Dilillo , Marcello Traiola
Computer, 2023, 56, pp.57-66. ⟨10.1109/MC.2022.3217841⟩
Journal articles lirmm-03834128v1
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Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMs

Daniel Söderström , Lucas Matana Luza , André Martins Pio de Mattos , Thierry Gil , Heikki Kettunen
IEEE Transactions on Nuclear Science, 2023, 70 (8), pp.1861-1869. ⟨10.1109/TNS.2023.3295435⟩
Journal articles hal-04192915v1

Exploring Radiation-Induced Vulnerabilities in RFICs through Traditional RF Metrics

Antonio Scialdone , Rudy Ferraro , Luigi Dilillo , Frederic Saigne , Jérôme Boch
IEEE Transactions on Nuclear Science, 2023, pp.1-1. ⟨10.1109/TNS.2023.3270206⟩
Journal articles hal-04120913v1
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Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks

Lucas Matana Luza , Annachiara Ruospo , Daniel Soderstrom , Carlo Cazzaniga , Maria Kastriotou
IEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882. ⟨10.1109/TETC.2021.3116999⟩
Journal articles lirmm-03382380v1
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Neutron-Induced Effects on a Self-Refresh DRAM

Lucas Matana Luza , Daniel Söderström , Helmut Puchner , Rubén García Alía , Manon Letiche
Microelectronics Reliability, 2022, 128, pp.#114406. ⟨10.1016/j.microrel.2021.114406⟩
Journal articles lirmm-03435635v1
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A Survey of the RISC-V Architecture Software Support

Benjamin William Mezger , Douglas Almeida dos Santos , Luigi Dilillo , Cesar A Zeferino , Douglas Rossi de Melo
IEEE Access, 2022, 10, pp.51394-51411. ⟨10.1109/ACCESS.2022.3174125⟩
Journal articles lirmm-03737820v1
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On the evaluation of FPGA radiation benchmarks

Gaetan Bricas , Georgios Tsiligiannis , Antoine Touboul , Jérôme Boch , Maria Kastriotou
Microelectronics Reliability, 2021, 126, pp.#114276. ⟨10.1016/j.microrel.2021.114276⟩
Journal articles lirmm-03382368v1
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Reliability analysis of a fault-tolerant RISC-V system-on-chip

Douglas Almeida dos Santos , Lucas Matana Luza , Luigi Dilillo , Cesar Albenes Zeferino , Douglas Rossi de Melo
Microelectronics Reliability, 2021, 125, pp.#114346. ⟨10.1016/j.microrel.2021.114346⟩
Journal articles lirmm-03358839v1
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Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment

Daniel Söderström , Lucas Matana Luza , Heikki Kettunen , Arto Javanainen , Wilfrid Farabolini
IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.716-723. ⟨10.1109/TNS.2021.3068186⟩
Journal articles lirmm-03358914v1

COTS Optocoupler Radiation Qualification Process for LHC Applications Based on Mixed-Field Irradiations

Rudy Ferraro , Gilles Foucard , Angelo Infantino , Luigi Dilillo , Markus Brugger
IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1395-1403. ⟨10.1109/TNS.2020.2972777⟩
Journal articles hal-02911961v1

Study of the impact of the LHC radiation environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic Components

Rudy Ferraro , Salvatore Danzeca , Chiara Cangialosi , Rubén García Alía , Francesco Cerutti
IEEE Transactions on Nuclear Science, 2019, 66 (7), pp.1548-1556. ⟨10.1109/TNS.2019.2902441⟩
Journal articles lirmm-02016480v1
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Pre-flight qualification test procedure for nanosatellites using sounding rockets

Leonardo Kessler Slongo , João Gabriel Reis , Daniel Gaiki , Pedro von Hohendorff Seger , Sara Vega Martínez
Acta Astronautica, 2019, 159, pp.564-577. ⟨10.1016/j.actaastro.2019.01.035⟩
Journal articles lirmm-02415535v1
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Maximizing the Inner Resilience of a Network-on-Chip through Router Controllers Design

Douglas Rossi de Melo , Cesar A. Zeferino , Luigi Dilillo , Eduardo Augusto Bezerra
Sensors, 2019, 19 (24), pp.5416-5439. ⟨10.3390/s19245416⟩
Journal articles lirmm-02547726v1
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Improvement of the Tolerated Raw Bit Error Rate in NAND Flash-based SSDs with Selective Refresh

Emna Farjallah , Jean-Marc Armani , Valentin Gherman , Luigi Dilillo
Microelectronics Reliability, 2019, 96, pp.37-45. ⟨10.1016/j.microrel.2019.01.014⟩
Journal articles lirmm-02008002v1
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Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere
IEEE Transactions on Nuclear Science, 2018, 65 (8), pp.1708-1714. ⟨10.1109/TNS.2018.2797543⟩
Journal articles lirmm-02007922v1

A calculation method to estimate single event upset cross section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Jérôme Boch
Microelectronics Reliability, 2017, 76-77, pp.644-649. ⟨10.1016/j.microrel.2017.07.056⟩
Journal articles hal-01636059v1
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Design of a radiation tolerant system for total ionizing dose monitoring using floating gate and RadFET dosimeters

Rudy Ferraro , Salvatore Danzeca , Matteo Brucoli , Alessandro Masi , Markus Brugger
Journal of Instrumentation, 2017, 12 (4), pp.#C04007. ⟨10.1088/1748-0221/12/04/C04007⟩
Journal articles lirmm-01513884v1

Soft errors in commercial off-the-shelf static random access memories

Luigi Dilillo , Georgios Tsiligiannis , Viyas Gupta , Alexandre Louis Bosser , Frédéric Saigné
Semiconductor Science and Technology, 2016, Special Issue on Radiation Effects in Semiconductor Devices, 32 (1), ⟨10.1088/1361-6641/32/1/013006⟩
Journal articles lirmm-01434747v1

Design for Test and Diagnosis of Power Switches

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
Journal of Circuits, Systems, and Computers, 2016, 25 (3), pp.1640013. ⟨10.1142/S0218126616400132⟩
Journal articles lirmm-01272986v1

Proton-Induced Single-Event Degradation in SDRAMs

Axel Rodriguez , Frédéric Wrobel , Anne Samaras , Francoise Bezerra , Benjamin Vandevelde
IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2115-2121. ⟨10.1109/TNS.2016.2551733⟩
Journal articles lirmm-01382563v1

Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammad Zadeh , Arto Javanainen
IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2010-2015. ⟨10.1109/TNS.2016.2559943⟩
Journal articles lirmm-01382552v1

Methodologies for the Statistical Analysis of Memory Response to Radiation

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Christopher Frost , Ali Mohammad Zadeh
IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2122-2128. ⟨10.1109/TNS.2016.2527781⟩
Journal articles lirmm-01382508v1

The Power Law Shape of Heavy Ions Experimental Cross Section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Eric Lorfèvre
IEEE Transactions on Nuclear Science, 2016, 64 (1), pp.427-433. ⟨10.1109/TNS.2016.2608004⟩
Journal articles lirmm-01382480v1

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen
IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2620-2626. ⟨10.1109/TNS.2015.2496874⟩
Journal articles lirmm-01254157v1

SEE on Different Layers of Stacked-SRAMs

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Mathias Rousselet , Ali Mohammad Zadeh
IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2673-2678. ⟨10.1109/TNS.2015.2496725⟩
Journal articles lirmm-01254148v1

Multiple Cell Upset Classification in Commercial SRAMs

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1747-1754. ⟨10.1109/TNS.2014.2313742⟩
Journal articles lirmm-01234446v1

Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

Lionel Foro , Antoine Touboul , Alain Michez , Frédéric Wrobel , Paolo Rech
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1739-1746. ⟨10.1109/TNS.2014.2332813⟩
Journal articles lirmm-01237646v1

On the Test and Mitigation of Malfunctions in Low-Power SRAMs

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
Journal of Electronic Testing: : Theory and Applications, 2014, 30 (5), pp.611-627. ⟨10.1007/s10836-014-5479-z⟩
Journal articles lirmm-01238443v1
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Intra-Cell Defects Diagnosis

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
Journal of Electronic Testing: : Theory and Applications, 2014, 30 (5), pp.541-555. ⟨10.1007/s10836-014-5481-5⟩
Journal articles lirmm-01272964v1
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90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3389-3394. ⟨10.1109/TNS.2014.2363120⟩
Journal articles hal-04056468v1

Dynamic Compact Model of Self-Referenced Magnetic Tunnel Junction

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
IEEE Transactions on Electron Devices, 2014, 61 (11), pp.3877-3882. ⟨10.1109/TED.2014.2355418⟩
Journal articles lirmm-01272978v1

A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and Systems

Ahn Duc Tran , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
Journal of Electronic Testing: : Theory and Applications, 2014, 30 (4), pp.401-413. ⟨10.1007/s10836-014-5459-3⟩
Journal articles lirmm-01272958v1

Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Vincent Pouget , Frédéric Saigné
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1813-1818. ⟨10.1109/TNS.2014.2299762⟩
Journal articles lirmm-01234429v1

Dynamic Test Methods for COTS SRAMs

Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3095-3102. ⟨10.1109/TNS.2014.2363123⟩
Journal articles lirmm-01234463v1

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2014, 22 (11), pp.2326-2335. ⟨10.1109/TVLSI.2013.2294080⟩
Journal articles lirmm-01248578v1
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Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
Journal of Instrumentation, 2014, 9 (5), pp.#C05052. ⟨10.1088/1748-0221/9/05/C05052⟩
Journal articles lirmm-01234448v1

An SRAM Based Monitor for Mixed-Field Radiation Environments

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1663-1670. ⟨10.1109/TNS.2014.2299733⟩
Journal articles lirmm-01234441v1
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Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Tarek Saad Saoud , Soilihi Moindjie , Jean-Luc Autran , Daniela Munteanu , Frédéric Wrobel
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3380-3388. ⟨10.1109/TNS.2014.2365038⟩
Journal articles lirmm-01234455v1

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Robert Ecoffet
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3564-3571. ⟨10.1109/TNS.2014.2368613⟩
Journal articles lirmm-01234461v1
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Globally Constrained Locally Optimized 3-D Power Delivery Networks

Aida Todri-Sanial , Sandip Kundu , Patrick Girard , Alberto Bosio , Luigi Dilillo
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2014, 22 (10), pp.2131-2144. ⟨10.1109/TVLSI.2013.2283800⟩
Journal articles lirmm-01255754v1

A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere
IEEE Transactions on Nuclear Science, 2013, 60 (5), pp.3603-3608. ⟨10.1109/TNS.2013.2264957⟩
Journal articles lirmm-01234419v1
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A Study of Tapered 3-D TSVs for Power and Thermal Integrity

Aida Todri-Sanial , Sandip Kundu , Patrick Girard , Alberto Bosio , Luigi Dilillo
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2013, 21 (2), pp.306-319. ⟨10.1109/TVLSI.2012.2187081⟩
Journal articles lirmm-00806776v1

Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2617-2622. ⟨10.1109/TNS.2013.2239311⟩
Journal articles lirmm-00805005v1

Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption

Paolo Bernardi , Mauricio de Carvalho , Ernesto Sanchez , Matteo Sonza Reorda , Alberto Bosio
Journal of Low Power Electronics, 2013, 9 (2), pp.253-263. ⟨10.1166/jolpe.2013.1259⟩
Journal articles lirmm-00934937v1
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Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2013, 21 (5), pp.958-970. ⟨10.1109/TVLSI.2012.2197427⟩
Journal articles lirmm-00806774v1

Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2386-2391. ⟨10.1109/TNS.2013.2257847⟩
Journal articles lirmm-01234425v1

Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM cell

Frédéric Wrobel , Antoine Touboul , Luigi Dilillo , Frédéric Saigné
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2537-2541. ⟨10.1109/TNS.2012.2235148⟩
Journal articles lirmm-00805001v1

Analysis and Fault Modeling of Actual Resistive Defects in ATMELtm eFlash Memories

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
Journal of Electronic Testing: : Theory and Applications, 2012, 28 (2), pp.215-228. ⟨10.1007/s10836-012-5277-4⟩
Journal articles lirmm-00806773v1

Embedded silicon detector to investigate the natural radiative environment

Denis Pantel , Jean-Roch Vaillé , Frédéric Wrobel , Luigi Dilillo , Jean-Marc J.-M. Galliere
Journal of Instrumentation, 2012, 7 (5), pp.1-11. ⟨10.1088/1748-0221/7/05/P05007⟩
Journal articles lirmm-00805011v1

Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Jérôme Boch
IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩
Journal articles lirmm-00805031v1

Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
Journal of Electronic Testing: : Theory and Applications, 2012, 28 (3), pp.317-329. ⟨10.1007/s10836-012-5291-6⟩
Journal articles lirmm-00805017v1

Neutron-Induced Failure in Silicon IGBTs, Silicon Super-Junction and SiC MOSFETs

Alessio Griffoni , Jeroen van Duivenbode , Dimitri Linten , Eddy Simoen , Paolo Rech
IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.866-871. ⟨10.1109/TNS.2011.2180924⟩
Journal articles lirmm-00805039v1

Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné
IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩
Journal articles lirmm-00805046v1

Experimental Characterization of Atmospheric Radiation Environment with Stratospheric Balloon

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Paolo Rech
IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.945-951. ⟨10.1109/TNS.2011.2136359⟩
Journal articles lirmm-00805045v1

SoC Yield Improvement - Using TMR Architectures for Manufacturing Defect Tolerance in Logic Cores

Julien Vial , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
International Journal On Advances in Systems and Measurements, 2010, 3 (1/2), pp.1-10
Journal articles lirmm-00553567v1

A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for LOS and LOC Schemes

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
Journal of Low Power Electronics, 2010, 6 (2), pp.359-374. ⟨10.1166/jolpe.2010.1086⟩
Journal articles lirmm-00553548v1

New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAM Memories

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri
Journal of Integrated Circuits and Systems, 2008, 3 (1), pp.7-12. ⟨10.29292/jics.v3i1.276⟩
Journal articles lirmm-00341793v1
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Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
Journal of Electronic Testing: : Theory and Applications, 2007, 23 (3), pp.435-444. ⟨10.1007/s10836-007-5003-9⟩
Journal articles lirmm-00194254v1

Reducing Power Dissipation in SRAM During Test

Luigi Dilillo , Paul Rosinger , Bashir Al-Hashimi , Patrick Girard
Journal of Low Power Electronics, 2006, 2 (2), pp.271-280. ⟨10.1166/jolpe.2006.062⟩
Journal articles lirmm-00137590v1

ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions

Patrick Girard , Luigi Dilillo , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
Journal of Electronic Testing: : Theory and Applications, 2006, 22 (3), pp.287-296. ⟨10.1007/s10836-006-7761-1⟩
Journal articles lirmm-00134769v1
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Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri
Journal of Electronic Testing: : Theory and Applications, 2005, 21 (5), pp.551-561. ⟨10.1007/s10836-005-1169-1⟩
Journal articles lirmm-00105314v1
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Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test

Simone Borri , Magali Bastian Hage-Hassan , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
Journal of Electronic Testing: : Theory and Applications, 2005, 21 (2), pp.169-179. ⟨10.1007/s10836-005-6146-1⟩
Journal articles lirmm-00105313v1
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Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-V

André Martins Pio de Mattos , Douglas Almeida dos Santos , Viyas Gupta , Thomas Borel , Luigi Dilillo
RADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Conference papers hal-04266897v1
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Enhancement of System Observability During System-Level Radiation Testing through Total Current Consumption Monitoring

Ivan Slipukhin , Andrea Coronetti , Rubén García Alía , Frédéric Saigné , Jérôme Boch
2023 European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Conference papers hal-04266900v1
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Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh Environments

André Martins Pio de Mattos , Douglas Almeida dos Santos , Carolina Imianosky , Douglas Rossi Melo , Luigi Dilillo
IWASI 2023 - 9th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2023, Bari, Italy. pp.227-232, ⟨10.1109/IWASI58316.2023.10164578⟩
Conference papers hal-04266899v1
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Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip

Douglas Almeida dos Santos , Pablo M. Aviles , André Martins Pio de Mattos , Mario García Valderas , Luis Entrena
RADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Conference papers hal-04266891v1
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Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space Environments

Douglas Santos , André Mattos , Douglas Melo , Luigi Dilillo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313549⟩
Conference papers hal-04266887v1
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A Low-Cost Hardware Accelerator for CCSDS 123 Lossless Hyperspectral Image Compression

Wesley Grignani , Douglas Santos , Luigi Dilillo , Felipe Viel , Douglas Melo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313567⟩
Conference papers hal-04266881v1
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Hardening a Real-Time Operating System for a Dependable RISC-V System-on-Chip

Benjamin Mezger , Douglas Santos , Luigi Dilillo , Douglas Melo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313566⟩
Conference papers hal-04266886v1
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Implementation and Reliability Evaluation of a RISC-V Vector Extension Unit

Carolina Imianosky , Douglas Santos , Douglas Melo , Felipe Viel , Luigi Dilillo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313569⟩
Conference papers hal-04266888v1

Objectives and outcomes of WP6 in the second year of RADNEXT: Methodologies for Radiation Test of Systems

Luigi Dilillo , Luis Entrena
RADNEXT 2nd Annual Meeting, May 2023, Seville, Spain
Conference papers hal-04296158v1

Radiation-induced SEL in a COTS SRAM memory - test and flight data

Douglas Almeida dos Santos , Lucas Matana Luza , André Martins Pio de Mattos , Thomas Borel , Viyas Gupta
TEC-QEC Final Presentation Days, Jun 2023, Noordwijk, Netherlands
Conference papers hal-04295893v1

CRATEBO: A High-speed, Radiation-Tolerant and Versatile Testing Platform for FPGA Radiation Qualification for High-Energy Particle Accelerator applications

Antonio Scialdone , Rudy Ferraro , Panagiotis Gkountoumis , Salvatore Danzeca , Luigi Dilillo
TWEPP 2023 Topical Workshop on Electronics for Particle Physics, Oct 2023, Geremeas, Italy
Conference papers hal-04122431v1

Hybrid Radiation Hardening Approach: a RISC-V System-on-Chip case study

Luigi Dilillo , Douglas Almeida dos Santos , Lucas Matana Luza , André Martins Pio de Mattos , Douglas Rossi de Melo
G-RADNEXT Workshop, Nov 2023, Geneva, Switzerland
Conference papers hal-04296178v1

Objectives and outcomes of WP6 in the first year of RADNEXT Methodologies for Radiation test of Systems

Luigi Dilillo
RADNEXT DAYS 2022 - 1st Annual Meeting, Jun 2022, Geneva, Switzerland
Conference papers hal-04295913v1
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Effects of High-Energy Protons on a Self-Refresh DRAM

Lucas Matana Luza , Carolina Imianosky , André Martins Pio de Mattos , Douglas Almeida dos Santos , Daniel Söderström
SELSE 2022 - 18th IEEE Workshop on Silicon Errors in Logic – System Effects, May 2022, Virtual Event, Italy
Conference papers lirmm-03832662v1
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Qualification methodology for Radio Frequency Integrated Circuit for wireless-based platforms in radiation environments

Antonio Scialdone , Rudy Ferraro , Luigi Dilillo , Frédéric Saigné , Jérôme Boch
RADECS 2022 - European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy
Conference papers hal-04124165v1
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Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Douglas Almeida dos Santos , André Martins Pio de Mattos , Lucas Matana Luza , Carlo Cazzaniga , Maria Kastriotou
DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2022, Austin, United States. pp.1-6, ⟨10.1109/DFT56152.2022.9962335⟩
Conference papers lirmm-03833983v1
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Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices

Lucas Matana Luza , Frédéric Wrobel , Luis Entrena , Luigi Dilillo
ETS 2022 - 27th IEEE European Test Symposium, May 2022, Barcelona, Spain. pp.1-10, ⟨10.1109/ets54262.2022.9810454⟩
Conference papers lirmm-03833958v1
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Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks

Annachiara Ruospo , Lucas Matana Luza , Alberto Bosio , Marcello Traiola , Luigi Dilillo
LATS 2021 - IEEE 22nd Latin American Test Symposium, Oct 2021, Punta del Este, Uruguay. pp.1-5, ⟨10.1109/LATS53581.2021.9651807⟩
Conference papers lirmm-03435567v1
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Characterization of a RISC-V System-on-Chip under Neutron Radiation

Douglas Almeida dos Santos , Lucas Matana Luza , Maria Kastriotou , Carlo Cazzaniga , Cesar A Zeferino
DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505054⟩
Conference papers lirmm-03357515v1
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Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip Router

Douglas Rossi de Melo , Cesar Albenes Zeferino , Eduardo Augusto Bezerra , Luigi Dilillo
DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505053⟩
Conference papers lirmm-03358975v1
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A Model-Based Framework to Assess the Reliability of Safety-Critical Applications

Lucas Matana Luza , Annachiara Ruospo , Alberto Bosio , Ernesto Sanchez , Luigi Dilillo
DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩
Conference papers hal-03266848v1
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Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study

Lucas Matana Luza , Daniel Söderström , André Martins Pio De Mattos , Eduardo Augusto Bezerra , Carlo Cazzaniga
DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
Conference papers lirmm-03357444v1
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Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment

Daniel Soderstrom , Lucas Matana Luza , Heikki Kettunen , Arto Javanainen , Wilfrid Farabolini
NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference, Nov 2020, Santa Fe (virtual), United States
Conference papers lirmm-03028881v1
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Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

Lucas Matana Luza , Daniel Soderstrom , Georgios Tsiligiannis , Helmut Puchner , Carlo Cazzaniga
DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩
Conference papers lirmm-03025736v1
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A Low-Cost Fault-Tolerant RISC-V Processor for Space Systems

Douglas Almeida dos Santos , Lucas Matana Luza , Cesar Albenes Zeferino , Luigi Dilillo , Douglas Rossi de Melo
DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-5, ⟨10.1109/DTIS48698.2020.9081185⟩
Conference papers lirmm-03026132v1

On-board Compressing of Hyperspectral Images using CCSDS 123

Douglas Almeida dos Santos , Cesar Albenes Zeferino , Eduardo Augusto Bezerra , Luigi Dilillo , Douglas Rossi Melo
Computer on the Beach, Sep 2020, Balneário Camboriú, Brazil. pp.332-336, ⟨10.14210/cotb.v11n1.p332-336⟩
Conference papers lirmm-03025767v1
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Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

Lucas Matana Luza , Daniel Soderstrom , Helmut Puchner , Ruben Garcia Alia , Manon Letiche
DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩
Conference papers lirmm-03025721v1
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A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites

Cézar Antônio Rigo , Lucas Matana Luza , Elder Dominghini Tramontin , Victor Martins , Sara Vega Martinez
LATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. ⟨10.1109/LATW.2019.8704551⟩
Conference papers