Luigi Dilillo

320

Documents

Researcher identifiers

luigi-dilillo
IdRef : 18891885X
0000-0002-1295-2688

Presentation

Publications

	Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells Cleiton Marques , Frédéric Wrobel , Ygor Aguiar , Alain Michez , Frédéric Saigné Electronics, 2024, 13 (10), pp.1954. ⟨10.3390/electronics13101954⟩ Journal articles hal-04607285v1
	SRAM-based heavy ion beam flux and LET dosimetry Andrea Coronetti , Rubén García-Alía , Luigi Dilillo , Carolina Imianosky , Douglas Almeida dos Santos IEEE Transactions on Nuclear Science, 2024, pp.1-1. ⟨10.1109/TNS.2024.3487647⟩ Journal articles hal-04715265v1
	Characterization of Single-Event Effects in a Microcontroller with an Artificial Neural Network Accelerator Carolina Imianosky , André M P Mattos , Douglas A Santos , Douglas R Melo , Maria Kastriotou Electronics, 2024, 13 (22), ⟨10.3390/electronics13224461⟩ Journal articles hal-04811422v1
	Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring Ivan Slipukhin , Andrea Coronetti , Rubén García Alía , Frédéric Saigné , Jérôme Boch IEEE Transactions on Nuclear Science, 2024, 71 (8), pp.1948-1955. ⟨10.1109/TNS.2024.3424201⟩ Journal articles hal-04715015v1
	CRaTeBo: a high-speed, radiation-tolerant and versatile testing platform for FPGA radiation qualification for high-energy particle accelerator applications Antonio Scialdone , Panagiotis Gkountoumis , Rudy Ferraro , Manoel Barros Marin , Luigi Dilillo Journal of Instrumentation, 2024, 19 (01), pp.P01012. ⟨10.1088/1748-0221/19/01/P01012⟩ Journal articles hal-04412765v1
	Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories On-Board PROBA-V André Martins Pio de Mattos , Douglas A Santos , Lucas M Luza , Viyas Gupta , Thomas Borel IEEE Transactions on Nuclear Science, inPress, ⟨10.1109/tns.2024.3378668⟩ Journal articles hal-04526731v1
	Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip Douglas A Santos , Pablo M Aviles , André M P Mattos , Mario García-Valderas , Luis Entrena IEEE Transactions on Nuclear Science, inPress, ⟨10.1109/tns.2024.3406021⟩ Journal articles hal-04666207v1
	The CELESTA CubeSat In-Flight Radiation Measurements and their Comparison with Ground Facilities Predictions Andrea Coronetti , Alessandro Zimmaro , Rubén García Alía , Salvatore Danzeca , Alessandro Masi IEEE Transactions on Nuclear Science, inPress, ⟨10.1109/TNS.2024.3376749⟩ Journal articles hal-04526716v1
	A Dependable and Low-Cost CCSDS 123 Hyperspectral Image Compressor Wesley Grignani , Douglas A Santos , Felipe Viel , Luigi Dilillo , Douglas R Melo IEEE Embedded Systems Letters, inPress, ⟨10.1109/les.2024.3420934⟩ Journal articles hal-04666210v1
	Investigation of Single-Event Effects for Space Applications: Instrumentation for In-Depth System Monitoring André Martins Pio de Mattos , Douglas A Santos , Lucas M Luza , Viyas Gupta , Luigi Dilillo Electronics, 2024, 13 (10), pp.1822. ⟨10.3390/electronics13101822⟩ Journal articles hal-04666202v1
	Exploring Radiation-Induced Vulnerabilities in RFICs through Traditional RF Metrics Antonio Scialdone , Rudy Ferraro , Luigi Dilillo , Frederic Saigne , Jérôme Boch IEEE Transactions on Nuclear Science, 2023, 70 (8), pp.2068-2075. ⟨10.1109/TNS.2023.3270206⟩ Journal articles hal-04120913v1
	Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMs Daniel Söderström , Lucas Matana Luza , André Martins Pio de Mattos , Thierry Gil , Heikki Kettunen IEEE Transactions on Nuclear Science, 2023, 70 (8), pp.1861-1869. ⟨10.1109/TNS.2023.3295435⟩ Journal articles hal-04192915v1
	Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-Chip Douglas Almeida dos Santos , André Martins Pio de Mattos , Douglas Melo , Luigi Dilillo Electronics, 2023, 12 (12), pp.2557. ⟨10.3390/electronics12122557⟩ Journal articles hal-04120525v1
	A Survey on Deep Learning Resilience Assessment Methodologies Annachiara Ruospo , Ernesto Sanchez , Lucas Matana Luza , Luigi Dilillo , Marcello Traiola Computer, 2023, 56, pp.57-66. ⟨10.1109/MC.2022.3217841⟩ Journal articles lirmm-03834128v1
	A Survey of the RISC-V Architecture Software Support Benjamin William Mezger , Douglas Almeida dos Santos , Luigi Dilillo , Cesar A Zeferino , Douglas Rossi de Melo IEEE Access, 2022, 10, pp.51394-51411. ⟨10.1109/ACCESS.2022.3174125⟩ Journal articles lirmm-03737820v1
	Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks Lucas Matana Luza , Annachiara Ruospo , Daniel Soderstrom , Carlo Cazzaniga , Maria Kastriotou IEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882. ⟨10.1109/TETC.2021.3116999⟩ Journal articles lirmm-03382380v1
	Neutron-Induced Effects on a Self-Refresh DRAM Lucas Matana Luza , Daniel Söderström , Helmut Puchner , Rubén García Alía , Manon Letiche Microelectronics Reliability, 2022, 128, pp.#114406. ⟨10.1016/j.microrel.2021.114406⟩ Journal articles lirmm-03435635v1
	Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment Daniel Söderström , Lucas Matana Luza , Heikki Kettunen , Arto Javanainen , Wilfrid Farabolini IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.716-723. ⟨10.1109/TNS.2021.3068186⟩ Journal articles lirmm-03358914v1
	Reliability analysis of a fault-tolerant RISC-V system-on-chip Douglas Almeida dos Santos , Lucas Matana Luza , Luigi Dilillo , Cesar Albenes Zeferino , Douglas Rossi de Melo Microelectronics Reliability, 2021, 125, pp.#114346. ⟨10.1016/j.microrel.2021.114346⟩ Journal articles lirmm-03358839v1
	On the evaluation of FPGA radiation benchmarks Gaetan Bricas , Georgios Tsiligiannis , Antoine Touboul , Jérôme Boch , Maria Kastriotou Microelectronics Reliability, 2021, 126, pp.#114276. ⟨10.1016/j.microrel.2021.114276⟩ Journal articles lirmm-03382368v1
	COTS Optocoupler Radiation Qualification Process for LHC Applications Based on Mixed-Field Irradiations Rudy Ferraro , Gilles Foucard , Angelo Infantino , Luigi Dilillo , Markus Brugger IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1395-1403. ⟨10.1109/TNS.2020.2972777⟩ Journal articles hal-02911961v1
	Improvement of the Tolerated Raw Bit Error Rate in NAND Flash-based SSDs with Selective Refresh Emna Farjallah , Jean-Marc Armani , Valentin Gherman , Luigi Dilillo Microelectronics Reliability, 2019, 96, pp.37-45. ⟨10.1016/j.microrel.2019.01.014⟩ Journal articles lirmm-02008002v1
	Study of the impact of the LHC radiation environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic Components Rudy Ferraro , Salvatore Danzeca , Chiara Cangialosi , Rubén García Alía , Francesco Cerutti IEEE Transactions on Nuclear Science, 2019, 66 (7), pp.1548-1556. ⟨10.1109/TNS.2019.2902441⟩ Journal articles lirmm-02016480v1
	Maximizing the Inner Resilience of a Network-on-Chip through Router Controllers Design Douglas Rossi de Melo , Cesar A. Zeferino , Luigi Dilillo , Eduardo Augusto Bezerra Sensors, 2019, 19 (24), pp.5416-5439. ⟨10.3390/s19245416⟩ Journal articles lirmm-02547726v1
	Pre-flight qualification test procedure for nanosatellites using sounding rockets Leonardo Kessler Slongo , João Gabriel Reis , Daniel Gaiki , Pedro von Hohendorff Seger , Bruno Vale Barbosa Eiterer Acta Astronautica, 2019, 159, pp.564-577. ⟨10.1016/j.actaastro.2019.01.035⟩ Journal articles lirmm-02415535v1
	Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere IEEE Transactions on Nuclear Science, 2018, 65 (8), pp.1708-1714. ⟨10.1109/TNS.2018.2797543⟩ Journal articles lirmm-02007922v1
	Design of a radiation tolerant system for total ionizing dose monitoring using floating gate and RadFET dosimeters Rudy Ferraro , Salvatore Danzeca , Matteo Brucoli , Alessandro Masi , Markus Brugger Journal of Instrumentation, 2017, 12 (4), pp.#C04007. ⟨10.1088/1748-0221/12/04/C04007⟩ Journal articles lirmm-01513884v1
	A calculation method to estimate single event upset cross section Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Jérôme Boch Microelectronics Reliability, 2017, 76-77, pp.644-649. ⟨10.1016/j.microrel.2017.07.056⟩ Journal articles hal-01636059v1
	Methodologies for the Statistical Analysis of Memory Response to Radiation Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Christopher Frost , Ali Mohammad Zadeh IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2122-2128. ⟨10.1109/TNS.2016.2527781⟩ Journal articles lirmm-01382508v1
	The Power Law Shape of Heavy Ions Experimental Cross Section Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Eric Lorfèvre IEEE Transactions on Nuclear Science, 2016, 64 (1), pp.427-433. ⟨10.1109/TNS.2016.2608004⟩ Journal articles lirmm-01382480v1
	Proton-Induced Single-Event Degradation in SDRAMs Axel Rodriguez , Frédéric Wrobel , Anne Samaras , Francoise Bezerra , Benjamin Vandevelde IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2115-2121. ⟨10.1109/TNS.2016.2551733⟩ Journal articles lirmm-01382563v1
	Soft errors in commercial off-the-shelf static random access memories Luigi Dilillo , Georgios Tsiligiannis , Viyas Gupta , Alexandre Louis Bosser , Frédéric Saigné Semiconductor Science and Technology, 2016, Special Issue on Radiation Effects in Semiconductor Devices, 32 (1), ⟨10.1088/1361-6641/32/1/013006⟩ Journal articles lirmm-01434747v1
	Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammad Zadeh , Arto Javanainen IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2010-2015. ⟨10.1109/TNS.2016.2559943⟩ Journal articles lirmm-01382552v1
	Design for Test and Diagnosis of Power Switches Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel Journal of Circuits, Systems, and Computers, 2016, 25 (3), pp.1640013. ⟨10.1142/S0218126616400132⟩ Journal articles lirmm-01272986v1
	SEE on Different Layers of Stacked-SRAMs Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Mathias Rousselet , Ali Mohammad Zadeh IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2673-2678. ⟨10.1109/TNS.2015.2496725⟩ Journal articles lirmm-01254148v1
	Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2620-2626. ⟨10.1109/TNS.2015.2496874⟩ Journal articles lirmm-01254157v1
	A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2014, 22 (11), pp.2326-2335. ⟨10.1109/TVLSI.2013.2294080⟩ Journal articles lirmm-01248578v1
	Globally Constrained Locally Optimized 3-D Power Delivery Networks Aida Todri-Sanial , Sandip Kundu , Patrick Girard , Alberto Bosio , Luigi Dilillo IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2014, 22 (10), pp.2131-2144. ⟨10.1109/TVLSI.2013.2283800⟩ Journal articles lirmm-01255754v1
	Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Robert Ecoffet IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3564-3571. ⟨10.1109/TNS.2014.2368613⟩ Journal articles lirmm-01234461v1
	An SRAM Based Monitor for Mixed-Field Radiation Environments Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1663-1670. ⟨10.1109/TNS.2014.2299733⟩ Journal articles lirmm-01234441v1
	Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch Journal of Instrumentation, 2014, 9 (5), pp.#C05052. ⟨10.1088/1748-0221/9/05/C05052⟩ Journal articles lirmm-01234448v1
	Multiple Cell Upset Classification in Commercial SRAMs Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1747-1754. ⟨10.1109/TNS.2014.2313742⟩ Journal articles lirmm-01234446v1
	Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation Tarek Saad Saoud , Soilihi Moindjie , Jean-Luc Autran , Daniela Munteanu , Frédéric Wrobel IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3380-3388. ⟨10.1109/TNS.2014.2365038⟩ Journal articles lirmm-01234455v1
	Intra-Cell Defects Diagnosis Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch Journal of Electronic Testing: : Theory and Applications, 2014, 30 (5), pp.541-555. ⟨10.1007/s10836-014-5481-5⟩ Journal articles lirmm-01272964v1
	Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT Lionel Foro , Antoine Touboul , Alain Michez , Frédéric Wrobel , Paolo Rech IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1739-1746. ⟨10.1109/TNS.2014.2332813⟩ Journal articles lirmm-01237646v1
	On the Test and Mitigation of Malfunctions in Low-Power SRAMs Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel Journal of Electronic Testing: : Theory and Applications, 2014, 30 (5), pp.611-627. ⟨10.1007/s10836-014-5479-z⟩ Journal articles lirmm-01238443v1
	A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and Systems Ahn Duc Tran , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel Journal of Electronic Testing: : Theory and Applications, 2014, 30 (4), pp.401-413. ⟨10.1007/s10836-014-5459-3⟩ Journal articles lirmm-01272958v1
	Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Vincent Pouget , Frédéric Saigné IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1813-1818. ⟨10.1109/TNS.2014.2299762⟩ Journal articles lirmm-01234429v1
	Dynamic Test Methods for COTS SRAMs Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3095-3102. ⟨10.1109/TNS.2014.2363123⟩ Journal articles lirmm-01234463v1
	Dynamic Compact Model of Self-Referenced Magnetic Tunnel Junction João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard IEEE Transactions on Electron Devices, 2014, 61 (11), pp.3877-3882. ⟨10.1109/TED.2014.2355418⟩ Journal articles lirmm-01272978v1
	90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3389-3394. ⟨10.1109/TNS.2014.2363120⟩ Journal articles hal-04056468v1
	Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2013, 21 (5), pp.958-970. ⟨10.1109/TVLSI.2012.2197427⟩ Journal articles lirmm-00806774v1
	Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2386-2391. ⟨10.1109/TNS.2013.2257847⟩ Journal articles lirmm-01234425v1
	A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere IEEE Transactions on Nuclear Science, 2013, 60 (5), pp.3603-3608. ⟨10.1109/TNS.2013.2264957⟩ Journal articles lirmm-01234419v1
	Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM cell Frédéric Wrobel , Antoine Touboul , Luigi Dilillo , Frédéric Saigné IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2537-2541. ⟨10.1109/TNS.2012.2235148⟩ Journal articles lirmm-00805001v1
	A Study of Tapered 3-D TSVs for Power and Thermal Integrity Aida Todri-Sanial , Sandip Kundu , Patrick Girard , Alberto Bosio , Luigi Dilillo IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2013, 21 (2), pp.306-319. ⟨10.1109/TVLSI.2012.2187081⟩ Journal articles lirmm-00806776v1
	Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption Paolo Bernardi , Mauricio de Carvalho , Ernesto Sanchez , Matteo Sonza Reorda , Alberto Bosio Journal of Low Power Electronics, 2013, 9 (2), pp.253-263. ⟨10.1166/jolpe.2013.1259⟩ Journal articles lirmm-00934937v1
	Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2617-2622. ⟨10.1109/TNS.2013.2239311⟩ Journal articles lirmm-00805005v1
	Neutron-Induced Failure in Silicon IGBTs, Silicon Super-Junction and SiC MOSFETs Alessio Griffoni , Jeroen van Duivenbode , Dimitri Linten , Eddy Simoen , Paolo Rech IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.866-871. ⟨10.1109/TNS.2011.2180924⟩ Journal articles lirmm-00805039v1
	Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch Journal of Electronic Testing: : Theory and Applications, 2012, 28 (3), pp.317-329. ⟨10.1007/s10836-012-5291-6⟩ Journal articles lirmm-00805017v1
	Analysis and Fault Modeling of Actual Resistive Defects in ATMELtm eFlash Memories Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard Journal of Electronic Testing: : Theory and Applications, 2012, 28 (2), pp.215-228. ⟨10.1007/s10836-012-5277-4⟩ Journal articles lirmm-00806773v1
	Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Jérôme Boch IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩ Journal articles lirmm-00805031v1
	Embedded silicon detector to investigate the natural radiative environment Denis Pantel , Jean-Roch Vaillé , Frédéric Wrobel , Luigi Dilillo , Jean-Marc J.-M. Galliere Journal of Instrumentation, 2012, 7 (5), pp.1-11. ⟨10.1088/1748-0221/7/05/P05007⟩ Journal articles lirmm-00805011v1
	Experimental Characterization of Atmospheric Radiation Environment with Stratospheric Balloon Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Paolo Rech IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.945-951. ⟨10.1109/TNS.2011.2136359⟩ Journal articles lirmm-00805045v1
	Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩ Journal articles lirmm-00805046v1
	SoC Yield Improvement - Using TMR Architectures for Manufacturing Defect Tolerance in Logic Cores Julien Vial , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard International Journal On Advances in Systems and Measurements, 2010, 3 (1/2), pp.1-10 Journal articles lirmm-00553567v1
	A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for LOS and LOC Schemes Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch Journal of Low Power Electronics, 2010, 6 (2), pp.359-374. ⟨10.1166/jolpe.2010.1086⟩ Journal articles lirmm-00553548v1
	New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAM Memories Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri Journal of Integrated Circuits and Systems, 2008, 3 (1), pp.7-12. ⟨10.29292/jics.v3i1.276⟩ Journal articles lirmm-00341793v1
	Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan Journal of Electronic Testing: : Theory and Applications, 2007, 23 (3), pp.435-444. ⟨10.1007/s10836-007-5003-9⟩ Journal articles lirmm-00194254v1
	ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions Patrick Girard , Luigi Dilillo , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan Journal of Electronic Testing: : Theory and Applications, 2006, 22 (3), pp.287-296. ⟨10.1007/s10836-006-7761-1⟩ Journal articles lirmm-00134769v1
	Reducing Power Dissipation in SRAM During Test Luigi Dilillo , Paul Rosinger , Bashir Al-Hashimi , Patrick Girard Journal of Low Power Electronics, 2006, 2 (2), pp.271-280. ⟨10.1166/jolpe.2006.062⟩ Journal articles lirmm-00137590v1
	Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test Simone Borri , Magali Bastian Hage-Hassan , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch Journal of Electronic Testing: : Theory and Applications, 2005, 21 (2), pp.169-179. ⟨10.1007/s10836-005-6146-1⟩ Journal articles lirmm-00105313v1
	Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri Journal of Electronic Testing: : Theory and Applications, 2005, 21 (5), pp.551-561. ⟨10.1007/s10836-005-1169-1⟩ Journal articles lirmm-00105314v1

	Physical Explanation for the Higher Sensitivity to Ion-Induced Burnout in SiC Schottky Diodes Compared to Si Schottky Diodes Cleiton Marques , Alain Michez , Frédéric Wrobel , S. Kuboyama , Frédéric Saigné RADiation Effects on Components and Systems (RADECS), Sep 2024, Maspalomas, Canary Islands, Spain Conference papers hal-04715410v1
	Reliability and Performance Evaluation of a RISC-V Vector Extension Unit for Vector Multiplication Carolina Imianosky , Douglas A Santos , Douglas R Melo , Felipe Viel , Luigi Dilillo 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom Conference papers hal-04715405v1
	Reliability Analysis of a Low-Cost CCSDS 123 Hyperspectral Image Compressor Wesley Grignani , Douglas A Santos , Luigi Dilillo , Douglas R Melo 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom Conference papers hal-04715407v1
	Implementation and Reliability Evaluation of a ChaCha20 Stream Cipher Hardware Accelerator Wesley Grignani , Khalil G Q Santana , Douglas Almeida dos Santos , Luigi Dilillo , Douglas R Melo 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom Conference papers hal-04715408v1
	Hardening a Real-Time Operating System for a Dependable RISC-V System-on-Chip Benjamin Mezger , Douglas Santos , Luigi Dilillo , Douglas Melo DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313566⟩ Conference papers hal-04266886v1
	A Low-Cost Hardware Accelerator for CCSDS 123 Lossless Hyperspectral Image Compression Wesley Grignani , Douglas Santos ,

Luigi Dilillo

Presentation

Publications

Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells

SRAM-based heavy ion beam flux and LET dosimetry

Characterization of Single-Event Effects in a Microcontroller with an Artificial Neural Network Accelerator

Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring

CRaTeBo: a high-speed, radiation-tolerant and versatile testing platform for FPGA radiation qualification for high-energy particle accelerator applications

Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories On-Board PROBA-V

Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip

The CELESTA CubeSat In-Flight Radiation Measurements and their Comparison with Ground Facilities Predictions

A Dependable and Low-Cost CCSDS 123 Hyperspectral Image Compressor

Investigation of Single-Event Effects for Space Applications: Instrumentation for In-Depth System Monitoring

Exploring Radiation-Induced Vulnerabilities in RFICs through Traditional RF Metrics

Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMs

Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-Chip

A Survey on Deep Learning Resilience Assessment Methodologies

A Survey of the RISC-V Architecture Software Support

Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks

Neutron-Induced Effects on a Self-Refresh DRAM

Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment

Reliability analysis of a fault-tolerant RISC-V system-on-chip

On the evaluation of FPGA radiation benchmarks

COTS Optocoupler Radiation Qualification Process for LHC Applications Based on Mixed-Field Irradiations

Improvement of the Tolerated Raw Bit Error Rate in NAND Flash-based SSDs with Selective Refresh

Study of the impact of the LHC radiation environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic Components

Maximizing the Inner Resilience of a Network-on-Chip through Router Controllers Design

Pre-flight qualification test procedure for nanosatellites using sounding rockets

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

Design of a radiation tolerant system for total ionizing dose monitoring using floating gate and RadFET dosimeters

A calculation method to estimate single event upset cross section

Methodologies for the Statistical Analysis of Memory Response to Radiation

The Power Law Shape of Heavy Ions Experimental Cross Section

Proton-Induced Single-Event Degradation in SDRAMs

Soft errors in commercial off-the-shelf static random access memories

Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions

Design for Test and Diagnosis of Power Switches

SEE on Different Layers of Stacked-SRAMs

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Globally Constrained Locally Optimized 3-D Power Delivery Networks

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

An SRAM Based Monitor for Mixed-Field Radiation Environments

Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology

Multiple Cell Upset Classification in Commercial SRAMs

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Intra-Cell Defects Diagnosis

Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

On the Test and Mitigation of Malfunctions in Low-Power SRAMs

A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and Systems

Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses

Dynamic Test Methods for COTS SRAMs

Dynamic Compact Model of Self-Referenced Magnetic Tunnel Junction

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation

Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling

A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation

Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM cell

A Study of Tapered 3-D TSVs for Power and Thermal Integrity

Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption

Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode

Neutron-Induced Failure in Silicon IGBTs, Silicon Super-Junction and SiC MOSFETs

Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes

Analysis and Fault Modeling of Actual Resistive Defects in ATMELtm eFlash Memories

Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress

Embedded silicon detector to investigate the natural radiative environment

Experimental Characterization of Atmospheric Radiation Environment with Stratospheric Balloon

Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons

SoC Yield Improvement - Using TMR Architectures for Manufacturing Defect Tolerance in Logic Cores

A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for LOS and LOC Schemes

New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAM Memories

Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits

ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions

Reducing Power Dissipation in SRAM During Test

Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test

Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories

Physical Explanation for the Higher Sensitivity to Ion-Induced Burnout in SiC Schottky Diodes Compared to Si Schottky Diodes

Reliability and Performance Evaluation of a RISC-V Vector Extension Unit for Vector Multiplication

Reliability Analysis of a Low-Cost CCSDS 123 Hyperspectral Image Compressor

Implementation and Reliability Evaluation of a ChaCha20 Stream Cipher Hardware Accelerator