Access content directly

Marc Lacruche

Researcher identifiers
  • IdHAL marc-lacruche



Electromagnetic Activity vs. Logical Activity: Near Field Scans for Reverse Engineering

Marc Lacruche , Philippe Maurine
CARDIS 2018 - 17th International Conference on Smart Card Research and Advanced Applications, Nov 2018, Montpellier, France. pp.140-155, ⟨10.1007/978-3-030-15462-2_10⟩
Conference papers lirmm-01943151v1

Body Biasing Injection Attacks in Practice

Noemie Beringuier-Boher , Marc Lacruche , David El-Baze , Jean-Max Dutertre , Jean-Baptiste Rigaud
CS2: Cryptography and Security in Computing Systems, Jan 2016, Prague, Czech Republic. pp.49-54, ⟨10.1145/2858930.2858940⟩
Conference papers lirmm-01434143v1
Image document

On the Use of Forward Body Biasing to Decrease the Repeatability of Laser-Induced Faults

Marc Lacruche , Noemie Beringuier-Boher , Jean-Max Dutertre , Jean-Baptiste Rigaud , Edith Kussener
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2016, Dresde, Germany
Conference papers emse-01855866v1
Image document

Laser Fault Injection into SRAM cells: Picosecond versus Nanosecond pulses

Marc Lacruche , Nicolas Borrel , Clément Champeix , C. Roscian , A. Sarafianos
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International, Jul 2015, Halkidiki, France. ⟨10.1109/IOLTS.2015.7229820⟩
Conference papers emse-01227286v1

Laser-Induced Faults in SRAM Memory Cells: Experimental Results and Simulation-based Analysis

Jean-Max Dutertre , Cyril Roscian , Alexandre Sarafianos , Marc Lacruche
TRUDEVICE - WG Meetings, 2013, Dec 2013, Freiburg, Germany
Conference papers emse-01110358v1