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| Electromagnetic Activity vs. Logical Activity: Near Field Scans for Reverse EngineeringCARDIS 2018 - 17th International Conference on Smart Card Research and Advanced Applications, Nov 2018, Montpellier, France. pp.140-155, ⟨10.1007/978-3-030-15462-2_10⟩Communication dans un congrès
                    
        
        
            
                
                    lirmm-01943151
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| Body Biasing Injection Attacks in PracticeCS2: Cryptography and Security in Computing Systems, Jan 2016, Prague, Czech Republic. pp.49-54, ⟨10.1145/2858930.2858940⟩Communication dans un congrès
                    
        
        
            
                
                    lirmm-01434143
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|  | On the Use of Forward Body Biasing to Decrease the Repeatability of Laser-Induced Faults2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2016, Dresde, GermanyCommunication dans un congrès
                    
        
        
            
                
                    emse-01855866
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|  | Laser Fault Injection into SRAM cells: Picosecond versus Nanosecond pulsesOn-Line Testing Symposium (IOLTS), 2015 IEEE 21st International, Jul 2015, Halkidiki, France. ⟨10.1109/IOLTS.2015.7229820⟩Communication dans un congrès
                    
        
        
            
                
                    emse-01227286
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| Laser-Induced Faults in SRAM Memory Cells: Experimental Results and Simulation-based AnalysisTRUDEVICE - WG Meetings, 2013, Dec 2013, Freiburg, GermanyCommunication dans un congrès
                    
        
        
            
                
                    emse-01110358
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