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Mariane Comte

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On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
Journal of Electronic Testing: : Theory and Applications, 2023, 39, pp.155-170. ⟨10.1007/s10836-023-06058-7⟩
Journal articles lirmm-04080259v1
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Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
Journal of Electronic Testing: : Theory and Applications, 2021, 37 (2), pp.225-242. ⟨10.1007/s10836-021-05934-4⟩
Journal articles lirmm-03426173v1
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Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
Journal of Electronic Testing: : Theory and Applications, 2020, 36 (2), pp.189-203. ⟨10.1007/s10836-020-05868-3⟩
Journal articles lirmm-03000864v1

Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies

Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell
Journal of Electronic Testing: : Theory and Applications, 2019, 35 (1), pp.59-75. ⟨10.1007/s10836-019-05776-1⟩
Journal articles lirmm-02075690v1

Influence of Body-Biasing, Supply Voltage, and Temperature on the Detection of Resistive Short Defects in FDSOI Technology

Amit Karel , Mariane Comte , Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell
IEEE Transactions on Nanotechnology, 2017, 16 (3), pp.417-430. ⟨10.1109/TNANO.2017.2664895⟩
Journal articles hal-01709588v1

Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies

Amit Karel , Mariane Comte , Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell
Journal of Electronic Testing: : Theory and Applications, 2017, 33 (4), pp.515-527. ⟨10.1007/s10836-017-5674-9⟩
Journal articles hal-01709587v1

Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies

Syhem Larguech , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
Microelectronics Journal, 2015, 46 (11), pp.1091-1102. ⟨10.1016/j.mejo.2015.09.014⟩
Journal articles lirmm-01232890v1

Testing for Gate Oxide Short Defects using the Detectability Interval Paradigm

Jean-Marc J.-M. Galliere , Florence Azaïs , Mariane Comte , Michel Renovell
Information Technology, 2014, 56 (4), pp.173-181. ⟨10.1515/itit-2013-1040⟩
Journal articles hal-01167054v1
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Enhancing Confidence in Indirect Analog/RF Testing against the Lack of Correlation between Regular Parameters and Indirect Measurements

Haithem Ayari , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
Microelectronics Journal, 2014, 45 (3), pp.336-344. ⟨10.1016/j.mejo.2013.12.006⟩
Journal articles lirmm-00936443v1
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A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC

Vincent Kerzérho , Serge Bernard , Florence Azaïs , Mariane Comte , Olivier Potin
Microelectronics Journal, 2013, 44 (9), pp.840-843. ⟨10.1016/j.mejo.2013.06.009⟩
Journal articles lirmm-00875985v1
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Digital Test Method for Embedded Converters with Unknown-Phase Harmonics

Vincent Kerzérho , Mariane Comte , Florence Azaïs , Philippe Cauvet , Serge Bernard
Journal of Electronic Testing: : Theory and Applications, 2011, 27 (3), pp.335-350. ⟨10.1007/s10836-011-5194-y⟩
Journal articles lirmm-00609243v1
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ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator

Vincent Kerzérho , Philippe Cauvet , Serge Bernard , Florence Azaïs , Michel Renovell
VLSI Design, 2008, 2008 (#482159), ⟨10.1155/2008/482159⟩
Journal articles lirmm-00346722v1
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Fully Digital Test Solution for a Set of ADCs and DACs embedded in a SiP or SoC

Vincent Kerzérho , Philippe Cauvet , Serge Bernard , Florence Azaïs , Mariane Comte
IET Computers & Digital Techniques, 2007, 1 (3), pp.146-153. ⟨10.1049/iet-cdt:20060136⟩
Journal articles lirmm-00195172v1
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A Novel DFT Technique to Test a Complete Set of ADC's and DAC's Embedded in a Complex SiP

Serge Bernard , Vincent Kerzérho , Philippe Cauvet , Florence Azaïs , Mariane Comte
IEEE Design & Test of Computers, 2006, 23 (3), pp.237-243. ⟨10.1109/MDT.2006.59⟩
Journal articles lirmm-00115131v1

Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications

Florence Azaïs , Serge Bernard , Mariane Comte , Yves Bertrand , Michel Renovell
Journal of Electronic Testing: : Theory and Applications, 2005, 21 (3), pp.291-298. ⟨10.1007/s10836-005-6358-4⟩
Journal articles lirmm-00105322v1

Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors

Mariane Comte , Florence Azaïs , Yves Bertrand , Michel Renovell
Journal of Electronic Testing: : Theory and Applications, 2004, Vol. 20 n°3, pp. 257-267. ⟨10.1023/B:JETT.0000029459.74815.56⟩
Journal articles hal-00004514v1
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Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure

Florence Azaïs , Serge Bernard , Yves Bertrand , Mariane Comte , Michel Renovell
Journal of Electronic Testing: : Theory and Applications, 2004, 20 (4), pp.375-387. ⟨10.1023/B:JETT.0000039605.02565.ef⟩
Journal articles lirmm-00108545v1

A-to-D Converter Static Error Detection from Dynamic Parameter Measurements

Florence Azaïs , Serge Bernard , Yves Bertrand , Mariane Comte , Michel Renovell
Microelectronics Journal, 2003, 34 (10), pp. 945-953. ⟨10.1016/S0026-2692(03)00161-7⟩
Journal articles lirmm-00269601v1
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Exploring on-line RF performance monitoring based on the indirect test strategy

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
LATS 2021 - IEEE 22nd Latin American Test Symposium, Oct 2021, Punta del Este (virtual), Uruguay. pp.1-7, ⟨10.1109/LATS53581.2021.9651743⟩
Conference papers lirmm-03426373v1
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Implementing indirect test of RF circuits without compromising test quality: a practical case study

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
LATS 2020 - 21st IEEE Latin American Test Symposium, Mar 2020, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS49555.2020.9093666⟩
Conference papers lirmm-03000910v1
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Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs

Florence Azaïs , Serge Bernard , Mariane Comte , Bastien Deveautour , Sophie Dupuis
IOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩
Conference papers lirmm-02993384v1
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Indirect test of RF circuits using ensemble methods

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia
Conference papers lirmm-03001530v1
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Which metrics to use for RF indirect test strategy?

Hassan El Badawi , Mariane Comte , Florence Azaïs , Vincent Kerzérho , Serge Bernard
SMACD 2019 - 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Jul 2019, Lausanne, Switzerland. pp.73-76, ⟨10.1109/SMACD.2019.8795302⟩
Conference papers lirmm-02338027v1
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Use of ensemble methods for indirect test of RF circuits: can it bring benefits?

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
LATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. pp.1-6, ⟨10.1109/LATW.2019.8704641⟩
Conference papers lirmm-02338047v1

The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated Circuits

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
SETS 2019 - South European Test Seminar, 2019, Pitztal, Austria
Conference papers lirmm-02375866v1
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The use of ensemble methods for indirect test of RF circuits

Hassan El Badawi , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
13e Colloque National du GDR SOC², Jun 2019, Montpellier, France
Conference papers lirmm-02375900v1

Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies

Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell
LATS 2018 - 19th IEEE Latin American Test Symposium, Mar 2018, Sao Paulo, Brazil. ⟨10.1109/LATW.2018.8349696⟩
Conference papers lirmm-02064921v1

Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology

Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.320-325, ⟨10.1109/ISVLSI.2017.63⟩
Conference papers hal-01709614v1

Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions

Amit Karel , Florence Azaïs , Mariane Comte , Jean-Marc J.-M. Galliere , Michel Renovell
ETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968208⟩
Conference papers hal-01709615v1

Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect

Amit Karel , Mariane Comte , Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell
LATS: Latin-American Test Symposium, Mar 2016, Foz do Iguacu, Brazil. pp.129-134, ⟨10.1109/LATW.2016.7483352⟩
Conference papers lirmm-01374300v1

Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurations

Amit Karel , Mariane Comte , Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, PA, United States. pp.164-169, ⟨10.1109/ISVLSI.2016.102⟩
Conference papers lirmm-01374292v1

Mixed-level simulation tool for design optimization of electrical impedance spectroscopy systems

Achraf Lamlih , Vincent Kerzérho , Serge Bernard , Fabien Soulier , Mariane Comte
IWIS: International Workshop on Impedance Spectroscopy, Sep 2016, Chemnitz, Germany
Conference papers lirmm-01457544v1

A generic methodology for building efficient prediction models in the context of alternate testing

Syhem Larguech , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
IMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. ⟨10.1109/IMS3TW.2015.7177873⟩
Conference papers lirmm-01233150v1

Toward adaptation of ADCs to operating conditions through on-chip correction

Vincent Kerzérho , Ludovic Guillaume-Sage , Florence Azaïs , Mariane Comte , Michel Renovell
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.634-639, ⟨10.1109/ISVLSI.2015.62⟩
Conference papers lirmm-01233117v1

A framework for efficient implementation of analog/RF alternate test with model redundancy

Syhem Larguech , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.621-626, ⟨10.1109/ISVLSI.2015.30⟩
Conference papers lirmm-01233104v1

Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter module

Mouhamadou Dieng , Florence Azaïs , Mariane Comte , Serge Bernard , Vincent Kerzérho
IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto ALegre, Brazil. ⟨10.1109/IMS3TW.2014.6997401⟩
Conference papers lirmm-01119365v1

Solutions for the self-adaptation of communicating systems in operation

Martin Andraud , Anthony Deluthault , Mouhamadou Dieng , Florence Azaïs , Serge Bernard
IOLTS: International On-line Test Symposium, Jul 2014, Platja d’Aro, Spain. pp.234-239, ⟨10.1109/IOLTS.2014.6873705⟩
Conference papers hal-01118068v1
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New implementions of predictive alternate analog/RF test with augmented model redundancy

Haithem Ayari , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
DATE 2014 - 17th Design, Automation and Test in Europe Conference and Exhibition, Mar 2014, Dresden, Germany. ⟨10.7873/DATE2014.144⟩
Conference papers lirmm-00994714v1

Self-Adaptive NFC Systems

Vincent Kerzérho , Florence Azaïs , Mouhamadou Dieng , Mariane Comte , Serge Bernard
IOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain
Conference papers lirmm-01084355v1

Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing

Syhem Larguech , Florence Azaïs , Serge Bernard , Vincent Kerzérho , Mariane Comte
LATW: Latin American Test Workshop, Mar 2014, Fortaleza, Brazil. ⟨10.1109/LATW.2014.6841930⟩
Conference papers lirmm-01119361v1

Investigations on alternate analog/RF test with model redundancy

Haithem Ayari , Florence Azaïs , Serge Bernard , Vincent Kerzérho , Syhem Larguech
STEM Workshop, May 2014, Paderborn, Germany
Conference papers lirmm-01119374v1
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Accurate and Efficient Analytical Electrical Model of Antenna for NFC Applications

Mouhamadou Dieng , Mariane Comte , Serge Bernard , Vincent Kerzérho , Florence Azaïs
NEWCAS: New Circuits and Systems, Jun 2013, Paris, France. pp.137-141, ⟨10.1109/NEWCAS.2013.6573657⟩
Conference papers lirmm-00839190v1

A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing

Syhem Larguech , Florence Azaïs , Serge Bernard , Vincent Kerzérho , Mariane Comte
3rd IEEE International Workshop on Test and Validation of High Speed Analog Circuits, Sep 2013, Anaheim, CA, United States
Conference papers lirmm-00985422v1

Pre-characterization Procedure for a Mixed Mode Simulation of IR-Drop Induced Delays

Marina Aparicio Rodriguez , Mariane Comte , Florence Azaïs , Michel Renovell , Jie Jiang
LATW: Latin American Test Workshop, Apr 2013, Cordoba, Argentina. ⟨10.1109/LATW.2013.6562657⟩
Conference papers lirmm-00820067v1
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MIRID: Mixed-Mode IR-Drop Induced Delay Simulator

Jie Jiang , Marina Aparicio Rodriguez , Mariane Comte , Florence Azaïs , Michel Renovell
ATS: Asian Test Symposium, Nov 2013, Jiaosi Township, Taiwan. pp.177-182, ⟨10.1109/ATS.2013.41⟩
Conference papers lirmm-00932357v1
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An IR-Drop Simulation Principle Oriented to Delay Testing

Marina Aparicio Rodriguez , Mariane Comte , Florence Azaïs , Yves Bertrand , Michel Renovell
DCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.404-409
Conference papers lirmm-00804254v1

Making predictive analog/RF alternate test strategy independent of training set size

Haithem Ayari , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
ITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.9, ⟨10.1109/TEST.2012.6401560⟩
Conference papers lirmm-00803564v1

On the use of redundancy to reduce prediction error in alternate analog/RF test

Haithem Ayari , Florence Azaïs , Serge Bernard , Mariane Comte , Vincent Kerzérho
IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, May 2012, Taipei, Taiwan. pp.34-39, ⟨10.1109/IMS3TW.2012.17⟩
Conference papers lirmm-00803556v1

Smart selection of indirect parameters for DC-based alternate RF IC testing

Haithem Ayari , Florence Azaïs , Serge Bernard , Mariane Comte , Michel Renovell
VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.19-24, ⟨10.1109/VTS.2012.6231074⟩
Conference papers lirmm-00803453v1
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Adaptive LUT-Based System for In Situ ADC Auto-correction

Serge Bernard , Florence Azaïs , Mariane Comte , Olivier Potin , Vincent Kerzérho
IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Conference papers lirmm-00494424v1
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ANC-Based Method for Testing Converters with Random-Phase Harmonics

Vincent Kerzérho , Florence Azaïs , Mariane Comte , Philippe Cauvet , Serge Bernard
IMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Conference papers lirmm-00494578v1

LH-BIST for Digital Correction of ADC Offset

Serge Bernard , Florence Azaïs , Mariane Comte , Yves Bertrand , Michel Renovell
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.199-203
Conference papers lirmm-00375659v1

Deriving an Electrical Model for Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects

Nicolas Houarche , Alejandro Czutro , Mariane Comte , Piet Engelke , Ilia Polian
LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A
Conference papers lirmm-00367708v1
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An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects

Nicolas Houarche , Mariane Comte , Michel Renovell , Alejandro Czutro , Piet Engelke
VTS'09: 27th VLSI Test Symposium, May 2009, Santa Cruz, Californie, United States. pp.21-26, ⟨10.1109/VTS.2009.57⟩
Conference papers lirmm-00374941v1
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A Multi-Converter DFT Technique for Complex SIP: Concepts and Validation

Vincent Kerzérho , Philippe Cauvet , Serge Bernard , Florence Azaïs , Mariane Comte
ECCTD: European Conference on Circuit Theory and Design, Aug 2009, Antalya, Turkey. pp.747-750
Conference papers lirmm-00448863v1

A Simulator of Small-Delay Faults Caused by Resistive-Open Defects

Alejandro Czutro , Nicolas Houarche , Piet Engelke , Ilia Polian , Mariane Comte
ETS: European Test Symposium, May 2008, Verbania, Italy. pp.113-118
Conference papers lirmm-00285886v1

A Model for Resistive Open Recursivity in CMOS Random Logic

Michel Renovell , Mariane Comte , Nicolas Houarche , Ilia Polian , Piet Engelke
EWDTS: East-West Design & Test Symposium, Oct 2008, Lviv, Ukraine. pp.21-24
Conference papers lirmm-00381465v1

Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave Generators

Vincent Kerzérho , Philippe Cauvet , Serge Bernard , Florence Azaïs , Michel Renovell
IMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, Povoa de Varzim, Portugal. pp.196-201
Conference papers lirmm-00161708v1

"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC

Vincent Kerzérho , Philippe Cauvet , Serge Bernard , Florence Azaïs , Mariane Comte
ETS: European Test Symposium, May 2007, Freiburg, Germany. pp.211-216, ⟨10.1109/ETS.2007.1⟩
Conference papers lirmm-00158527v1
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Experimental Validation of the "Analogue Network of Converters" Technique to Test Complex SiP/SoC

Serge Bernard , Florence Azaïs , Philippe Cauvet , Mariane Comte , Vincent Kerzérho
IEEE International Mixed-Signal Testing Workshop, Jun 2006, Paris, France. pp.84-88
Conference papers lirmm-00119266v1
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Analysing the Memory Effect of Resistive Open in CMOS Random Logic

Michel Renovell , Mariane Comte , Ilia Polian , Piet Engelke , Bernd Becker
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2006, Tunis, Tunisia. pp.251-256
Conference papers lirmm-00093383v1
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“Analogue Network of Converters”: A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC

Florence Azaïs , Serge Bernard , Philippe Cauvet , Mariane Comte , Vincent Kerzérho
ETS: European Test Symposium, May 2006, Southampton, United Kingdom. pp.159-164
Conference papers lirmm-00115676v1

A Specific ATPG Technique for Resistive Open with Sequence Recursive Dependency

Michel Renovell , Mariane Comte , Ilia Polian , Piet Engelke , Bernd Becker
ATS: Asian Test Symposium, Nov 2006, Fukuoka, Japan. pp.273-278, ⟨10.1109/ATS.2006.261031⟩
Conference papers lirmm-00117022v1

Electrical Behavior of GOS Fault Affected Domino Logic Cell

Mariane Comte , Satoshi Ohtake , Hideo Fujiwara , Michel Renovell
DELTA'06: IEEE International Workshop on Electronics DesignTest & Applications, Jan 2006, Kuala Lumpur, Malaysia, pp.183-189
Conference papers lirmm-00102703v1

Electrical Behavior of GOS Faults in Domino Logic

Mariane Comte , Satoshi Ohtake , Hideo Fujiwara , Michel Renovell
DDECS'05: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2005, Sopron, Hungary, pp.210-215
Conference papers lirmm-00105991v1
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Electrical Analysis of a Domino Logic Cell with GOS Faults

Mariane Comte , Satoshi Ohtake , Hideo Fujiwara , Michel Renovell
DBT'05: International Workshop on Current & Defect Based Testing, May 2005, Palm Springs, CA, United States
Conference papers lirmm-00374937v1

Fast and Fully-Efficient Test Flow for ADCs

Serge Bernard , Mariane Comte , Florence Azaïs , Yves Bertrand , Michel Renovell
IMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.244-249
Conference papers lirmm-00106523v1

An Automatic Tool for Generation of ADC BIST Architecture

Serge Bernard , Florence Azaïs , Mariane Comte , Yves Bertrand , Michel Renovell
IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.79-84
Conference papers lirmm-00269580v1

Automatic Generation of LH-BIST Architecture for ADC Testing

Serge Bernard , Florence Azaïs , Mariane Comte , Yves Bertrand , Michel Renovell
IWADC'03: IEEE International Workshop on ADC Modelling and Testing, Sep 2003, Perugia, Italy. pp.7-12
Conference papers lirmm-00269683v1

Analysis of the Specification Influence on the Efficiency of an Optimized Test Flow for ADCs

Mariane Comte , Florence Azaïs , Serge Bernard , Yves Bertrand , Michel Renovell
IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.185-190
Conference papers lirmm-00269583v1
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A New Methodology for ADC Test Flow Optimization

Serge Bernard , Mariane Comte , Florence Azaïs , Yves Bertrand , Michel Renovell
ITC: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209, ⟨10.1109/TEST.2003.1270841⟩
Conference papers lirmm-00269527v1

On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static Errors

Mariane Comte , Florence Azaïs , Serge Bernard , Yves Bertrand , Michel Renovell
LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.198-203
Conference papers lirmm-00269498v1

On the Evaluation of ADC Static Parameters Through Dynamic Testing

Mariane Comte , Florence Azaïs , Serge Bernard , Yves Bertrand , Michel Renovell
ADDA & EWADC, Jun 2002, Prague, Czech Republic. pp.95-98
Conference papers lirmm-00269338v1

Mesure des Paramètres Statiques des Convertisseurs A/N par une Analyse Spectrale

Mariane Comte , Florence Azaïs , Serge Bernard , Yves Bertrand , Michel Renovell
Colloque du GDR CAO de Circuits et Systèmes Intégrés, May 2002, Paris, France. pp.47-50
Conference papers lirmm-00269325v1

Evaluation of ADC Static Parameters via Frequency Domain

Florence Azaïs , Serge Bernard , Yves Bertrand , Mariane Comte , Michel Renovell
IMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.165-169
Conference papers lirmm-00269347v1

Estimating Static Parameters of A-to-D Converters from Spectral Analysis

Florence Azaïs , Serge Bernard , Yves Bertrand , Mariane Comte , Michel Renovell
LATW: Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.174-179
Conference papers lirmm-00269320v1
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Mixed-level simulation tool for design optimization of electrical impedance spectroscopy systems

Achraf Lamlih , Vincent Kerzérho , Serge Bernard , Fabien Soulier , Mariane Comte
Kanoun, Olfa. Impedance Spectroscopy
Advanced Applications: Battery Research, Bioimpedance, System Design
, Walter de Gruyter, pp.71-80, 2018, 9783110558920. ⟨10.1515/9783110558920-008⟩
Book sections lirmm-02007013v1
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Etude des Corrélations entre Paramètres Statiques et Dynamiques des CAN en vue d'optimiser leur Flot de Test

Mariane Comte
Micro et nanotechnologies/Microélectronique. Université Montpellier II - Sciences et Techniques du Languedoc, 2003. Français. ⟨NNT : ⟩
Theses tel-00003666v1