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MC
Mariane Comte
80
Documents
Researcher identifiers
mariane-comte
- IdRef : 078523052
Presentation
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Exploring on-line RF performance monitoring based on the indirect test strategyLATS 2021 - IEEE 22nd Latin American Test Symposium, Oct 2021, Punta del Este (virtual), Uruguay. pp.1-7, ⟨10.1109/LATS53581.2021.9651743⟩
Conference papers
lirmm-03426373v1
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Implementing indirect test of RF circuits without compromising test quality: a practical case studyLATS 2020 - 21st IEEE Latin American Test Symposium, Mar 2020, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS49555.2020.9093666⟩
Conference papers
lirmm-03000910v1
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Indirect test of RF circuits using ensemble methodsETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia
Conference papers
lirmm-03001530v1
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Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICsIOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩
Conference papers
lirmm-02993384v1
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Which metrics to use for RF indirect test strategy?SMACD 2019 - 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Jul 2019, Lausanne, Switzerland. pp.73-76, ⟨10.1109/SMACD.2019.8795302⟩
Conference papers
lirmm-02338027v1
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The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated CircuitsSETS 2019 - South European Test Seminar, 2019, Pitztal, Austria
Conference papers
lirmm-02375866v1
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The use of ensemble methods for indirect test of RF circuits13ème Colloque National du GDR SoC², Jun 2019, Montpellier, France
Conference papers
lirmm-02375900v1
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Use of ensemble methods for indirect test of RF circuits: can it bring benefits?LATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. pp.1-6, ⟨10.1109/LATW.2019.8704641⟩
Conference papers
lirmm-02338047v1
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Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologiesLATS: Latin-American Test Symposium, Mar 2018, Sao Paulo, Brazil. ⟨10.1109/LATW.2018.8349696⟩
Conference papers
lirmm-02064921v1
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Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI TechnologyISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.320-325, ⟨10.1109/ISVLSI.2017.63⟩
Conference papers
hal-01709614v1
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Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditionsETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968208⟩
Conference papers
hal-01709615v1
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Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurationsISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, PA, United States. pp.164-169, ⟨10.1109/ISVLSI.2016.102⟩
Conference papers
lirmm-01374292v1
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Mixed-level simulation tool for design optimization of electrical impedance spectroscopy systemsIWIS: International Workshop on Impedance Spectroscopy, Sep 2016, Chemnitz, Germany
Conference papers
lirmm-01457544v1
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Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defectLATS: Latin-American Test Symposium, Mar 2016, Foz do Iguacu, Brazil. pp.129-134, ⟨10.1109/LATW.2016.7483352⟩
Conference papers
lirmm-01374300v1
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A generic methodology for building efficient prediction models in the context of alternate testingIMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. ⟨10.1109/IMS3TW.2015.7177873⟩
Conference papers
lirmm-01233150v1
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Toward adaptation of ADCs to operating conditions through on-chip correctionISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.634-639, ⟨10.1109/ISVLSI.2015.62⟩
Conference papers
lirmm-01233117v1
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A framework for efficient implementation of analog/RF alternate test with model redundancyISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.621-626, ⟨10.1109/ISVLSI.2015.30⟩
Conference papers
lirmm-01233104v1
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Solutions for the self-adaptation of communicating systems in operationIOLTS: International On-line Test Symposium, Jul 2014, Platja d’Aro, Spain. pp.234-239, ⟨10.1109/IOLTS.2014.6873705⟩
Conference papers
hal-01118068v1
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New implementions of predictive alternate analog/RF test with augmented model redundancyDATE 2014 - 17th Design, Automation and Test in Europe Conference and Exhibition, Mar 2014, Dresden, Germany. ⟨10.7873/DATE2014.144⟩
Conference papers
lirmm-00994714v1
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Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter moduleIMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto ALegre, Brazil. ⟨10.1109/IMS3TW.2014.6997401⟩
Conference papers
lirmm-01119365v1
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Self-Adaptive NFC SystemsIOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain
Conference papers
lirmm-01084355v1
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Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testingLATW: Latin American Test Workshop, Mar 2014, Fortaleza, Brazil. ⟨10.1109/LATW.2014.6841930⟩
Conference papers
lirmm-01119361v1
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Investigations on alternate analog/RF test with model redundancySTEM Workshop, May 2014, Paderborn, Germany
Conference papers
lirmm-01119374v1
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Accurate and Efficient Analytical Electrical Model of Antenna for NFC ApplicationsNEWCAS: New Circuits and Systems, Jun 2013, Paris, France. pp.137-141, ⟨10.1109/NEWCAS.2013.6573657⟩
Conference papers
lirmm-00839190v1
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Pre-characterization Procedure for a Mixed Mode Simulation of IR-Drop Induced DelaysLATW: Latin American Test Workshop, Apr 2013, Cordoba, Argentina. ⟨10.1109/LATW.2013.6562657⟩
Conference papers
lirmm-00820067v1
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MIRID: Mixed-Mode IR-Drop Induced Delay SimulatorATS: Asian Test Symposium, Nov 2013, Jiaosi Township, Taiwan. pp.177-182, ⟨10.1109/ATS.2013.41⟩
Conference papers
lirmm-00932357v1
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A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing3rd IEEE International Workshop on Test and Validation of High Speed Analog Circuits, Sep 2013, Anaheim, CA, United States
Conference papers
lirmm-00985422v1
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An IR-Drop Simulation Principle Oriented to Delay TestingDCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.404-409
Conference papers
lirmm-00804254v1
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Making predictive analog/RF alternate test strategy independent of training set sizeITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.9, ⟨10.1109/TEST.2012.6401560⟩
Conference papers
lirmm-00803564v1
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Smart selection of indirect parameters for DC-based alternate RF IC testingVTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.19-24, ⟨10.1109/VTS.2012.6231074⟩
Conference papers
lirmm-00803453v1
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On the use of redundancy to reduce prediction error in alternate analog/RF testIMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, May 2012, Taipei, Taiwan. pp.34-39, ⟨10.1109/IMS3TW.2012.17⟩
Conference papers
lirmm-00803556v1
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Adaptive LUT-Based System for In Situ ADC Auto-correctionIMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Conference papers
lirmm-00494424v1
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ANC-Based Method for Testing Converters with Random-Phase HarmonicsIMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Conference papers
lirmm-00494578v1
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An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short DefectsVTS'09: 27th VLSI Test Symposium, May 2009, Santa Cruz, Californie, United States. pp.21-26, ⟨10.1109/VTS.2009.57⟩
Conference papers
lirmm-00374941v1
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Deriving an Electrical Model for Delay Faults Caused by Crosstalk Aggravated Resistive Short DefectsLATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A
Conference papers
lirmm-00367708v1
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LH-BIST for Digital Correction of ADC OffsetDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.199-203
Conference papers
lirmm-00375659v1
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A Multi-Converter DFT Technique for Complex SIP: Concepts and ValidationECCTD: European Conference on Circuit Theory and Design, Aug 2009, Antalya, Turkey. pp.747-750
Conference papers
lirmm-00448863v1
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A Model for Resistive Open Recursivity in CMOS Random LogicEWDTS: East-West Design & Test Symposium, Oct 2008, Lviv, Ukraine. pp.21-24
Conference papers
lirmm-00381465v1
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A Simulator of Small-Delay Faults Caused by Resistive-Open DefectsETS: European Test Symposium, May 2008, Verbania, Italy. pp.113-118
Conference papers
lirmm-00285886v1
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Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave GeneratorsIMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, Povoa de Varzim, Portugal. pp.196-201
Conference papers
lirmm-00161708v1
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"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOCETS: European Test Symposium, May 2007, Freiburg, Germany. pp.211-216, ⟨10.1109/ETS.2007.1⟩
Conference papers
lirmm-00158527v1
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“Analogue Network of Converters”: A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOCETS: European Test Symposium, May 2006, Southampton, United Kingdom. pp.159-164
Conference papers
lirmm-00115676v1
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Electrical Behavior of GOS Fault Affected Domino Logic CellDELTA'06: IEEE International Workshop on Electronics DesignTest & Applications, Jan 2006, Kuala Lumpur, Malaysia, pp.183-189
Conference papers
lirmm-00102703v1
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Analysing the Memory Effect of Resistive Open in CMOS Random LogicDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2006, Tunis, Tunisia. pp.251-256
Conference papers
lirmm-00093383v1
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Experimental Validation of the "Analogue Network of Converters" Technique to Test Complex SiP/SoCIEEE International Mixed-Signal Testing Workshop, Jun 2006, Paris, France. pp.84-88
Conference papers
lirmm-00119266v1
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A Specific ATPG Technique for Resistive Open with Sequence Recursive DependencyATS: Asian Test Symposium, Nov 2006, Fukuoka, Japan. pp.273-278, ⟨10.1109/ATS.2006.261031⟩
Conference papers
lirmm-00117022v1
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Fast and Fully-Efficient Test Flow for ADCsIMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.244-249
Conference papers
lirmm-00106523v1
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Electrical Analysis of a Domino Logic Cell with GOS FaultsDBT'05: International Workshop on Current & Defect Based Testing, May 2005, Palm Springs, CA, United States
Conference papers
lirmm-00374937v1
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Electrical Behavior of GOS Faults in Domino LogicDDECS'05: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2005, Sopron, Hungary, pp.210-215
Conference papers
lirmm-00105991v1
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Analysis of the Specification Influence on the Efficiency of an Optimized Test Flow for ADCsIMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.185-190
Conference papers
lirmm-00269583v1
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On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static ErrorsLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.198-203
Conference papers
lirmm-00269498v1
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An Automatic Tool for Generation of ADC BIST ArchitectureIMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.79-84
Conference papers
lirmm-00269580v1
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Automatic Generation of LH-BIST Architecture for ADC TestingIWADC'03: IEEE International Workshop on ADC Modelling and Testing, Sep 2003, Perugia, Italy. pp.7-12
Conference papers
lirmm-00269683v1
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A New Methodology for ADC Test Flow OptimizationITC: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209, ⟨10.1109/TEST.2003.1270841⟩
Conference papers
lirmm-00269527v1
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Mesure des Paramètres Statiques des Convertisseurs A/N par une Analyse SpectraleColloque du GDR CAO de Circuits et Systèmes Intégrés, May 2002, Paris, France. pp.47-50
Conference papers
lirmm-00269325v1
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On the Evaluation of ADC Static Parameters Through Dynamic TestingADDA & EWADC, Jun 2002, Prague, Czech Republic. pp.95-98
Conference papers
lirmm-00269338v1
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Estimating Static Parameters of A-to-D Converters from Spectral AnalysisLATW: Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.174-179
Conference papers
lirmm-00269320v1
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Evaluation of ADC Static Parameters via Frequency DomainIMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.165-169
Conference papers
lirmm-00269347v1
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Implementing model redundancy in predictive alternate test to improve test confidenceETS: European Test Symposium, May 2013, Avignon, France. 18th IEEE European Test Symposium, 2013, ⟨10.1109/ETS.2013.6569386⟩
Conference poster
lirmm-00820077v1
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Mixed-level simulation tool for design optimization of electrical impedance spectroscopy systemsKanoun, Olfa. Impedance Spectroscopy
Book sections
lirmm-02007013v1
Advanced Applications: Battery Research, Bioimpedance, System Design, Walter de Gruyter, pp.71-80, 2018, 9783110558920. ⟨10.1515/9783110558920-008⟩ |
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Etude des Corrélations entre Paramètres Statiques et Dynamiques des CAN en vue d'optimiser leur Flot de TestMicro et nanotechnologies/Microélectronique. Université Montpellier II - Sciences et Techniques du Languedoc, 2003. Français. ⟨NNT : ⟩
Theses
tel-00003666v1
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