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Exploring on-line RF performance monitoring based on the indirect test strategy
Hassan El Badawi
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
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Communication dans un congrès
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Implementing indirect test of RF circuits without compromising test quality: a practical case study
Hassan El Badawi
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
et al.
Communication dans un congrès
lirmm-03000910
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Indirect test of RF circuits using ensemble methods
Hassan El Badawi
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
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ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia
Communication dans un congrès
lirmm-03001530
v1
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Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Bastien Deveautour
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Sophie Dupuis
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Communication dans un congrès
lirmm-02993384
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The use of ensemble methods for indirect test of RF circuits
Hassan El Badawi
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
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13e Colloque National du GDR SOC², Jun 2019, Montpellier, France
Communication dans un congrès
lirmm-02375900
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Which metrics to use for RF indirect test strategy?
Hassan El Badawi
,
Mariane Comte
,
Florence Azaïs
,
Vincent Kerzérho
,
Serge Bernard
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SMACD 2019 - 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Jul 2019, Lausanne, Switzerland. pp.73-76, ⟨10.1109/SMACD.2019.8795302⟩
Communication dans un congrès
lirmm-02338027
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Use of ensemble methods for indirect test of RF circuits: can it bring benefits?
Hassan El Badawi
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
et al.
Communication dans un congrès
lirmm-02338047
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The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated Circuits
Hassan El Badawi
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
et al.
SETS 2019 - South European Test Seminar, 2019, Pitztal, Austria
Communication dans un congrès
lirmm-02375866
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Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies
Amit Karel
,
Florence Azaïs
,
Mariane Comte
,
Jean-Marc J.-M. Galliere
,
Michel Renovell
Communication dans un congrès
lirmm-02064921
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Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions
Amit Karel
,
Florence Azaïs
,
Mariane Comte
,
Jean-Marc J.-M. Galliere
,
Michel Renovell
et al.
Communication dans un congrès
hal-01709615
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Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology
Amit Karel
,
Florence Azaïs
,
Mariane Comte
,
Jean-Marc J.-M. Galliere
,
Michel Renovell
et al.
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.320-325, ⟨10.1109/ISVLSI.2017.63⟩
Communication dans un congrès
hal-01709614
v1
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Mixed-level simulation tool for design optimization of electrical impedance spectroscopy systems
Achraf Lamlih
,
Vincent Kerzérho
,
Serge Bernard
,
Fabien Soulier
,
Mariane Comte
et al.
IWIS: International Workshop on Impedance Spectroscopy, Sep 2016, Chemnitz, Germany
Communication dans un congrès
lirmm-01457544
v1
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Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurations
Amit Karel
,
Mariane Comte
,
Jean-Marc J.-M. Galliere
,
Florence Azaïs
,
Michel Renovell
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, PA, United States. pp.164-169, ⟨10.1109/ISVLSI.2016.102⟩
Communication dans un congrès
lirmm-01374292
v1
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Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect
Amit Karel
,
Mariane Comte
,
Jean-Marc J.-M. Galliere
,
Florence Azaïs
,
Michel Renovell
Communication dans un congrès
lirmm-01374300
v1
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A framework for efficient implementation of analog/RF alternate test with model redundancy
Syhem Larguech
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
et al.
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.621-626, ⟨10.1109/ISVLSI.2015.30⟩
Communication dans un congrès
lirmm-01233104
v1
|
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A generic methodology for building efficient prediction models in the context of alternate testing
Syhem Larguech
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
et al.
Communication dans un congrès
lirmm-01233150
v1
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Toward adaptation of ADCs to operating conditions through on-chip correction
Vincent Kerzérho
,
Ludovic Guillaume-Sage
,
Florence Azaïs
,
Mariane Comte
,
Michel Renovell
et al.
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.634-639, ⟨10.1109/ISVLSI.2015.62⟩
Communication dans un congrès
lirmm-01233117
v1
|
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Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter module
Mouhamadou Dieng
,
Florence Azaïs
,
Mariane Comte
,
Serge Bernard
,
Vincent Kerzérho
et al.
Communication dans un congrès
lirmm-01119365
v1
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Solutions for the self-adaptation of communicating systems in operation
Martin Andraud
,
Anthony Deluthault
,
Mouhamadou Dieng
,
Florence Azaïs
,
Serge Bernard
et al.
Communication dans un congrès
hal-01118068
v1
|
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New implementions of predictive alternate analog/RF test with augmented model redundancy
Haithem Ayari
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
et al.
DATE 2014 - 17th Design, Automation and Test in Europe Conference and Exhibition, Mar 2014, Dresden, Germany. ⟨10.7873/DATE2014.144⟩
Communication dans un congrès
lirmm-00994714
v1
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Self-Adaptive NFC Systems
Vincent Kerzérho
,
Florence Azaïs
,
Mouhamadou Dieng
,
Mariane Comte
,
Serge Bernard
et al.
IOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain
Communication dans un congrès
lirmm-01084355
v1
|
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Investigations on alternate analog/RF test with model redundancy
Haithem Ayari
,
Florence Azaïs
,
Serge Bernard
,
Vincent Kerzérho
,
Syhem Larguech
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STEM Workshop, May 2014, Paderborn, Germany
Communication dans un congrès
lirmm-01119374
v1
|
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Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing
Syhem Larguech
,
Florence Azaïs
,
Serge Bernard
,
Vincent Kerzérho
,
Mariane Comte
et al.
Communication dans un congrès
lirmm-01119361
v1
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MIRID: Mixed-Mode IR-Drop Induced Delay Simulator
Jie Jiang
,
Marina Aparicio Rodriguez
,
Mariane Comte
,
Florence Azaïs
,
Michel Renovell
et al.
Communication dans un congrès
lirmm-00932357
v1
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Accurate and Efficient Analytical Electrical Model of Antenna for NFC Applications
Mouhamadou Dieng
,
Mariane Comte
,
Serge Bernard
,
Vincent Kerzérho
,
Florence Azaïs
et al.
Communication dans un congrès
lirmm-00839190
v1
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A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing
Syhem Larguech
,
Florence Azaïs
,
Serge Bernard
,
Vincent Kerzérho
,
Mariane Comte
et al.
3rd IEEE International Workshop on Test and Validation of High Speed Analog Circuits, Sep 2013, Anaheim, CA, United States
Communication dans un congrès
lirmm-00985422
v1
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Pre-characterization Procedure for a Mixed Mode Simulation of IR-Drop Induced Delays
Marina Aparicio Rodriguez
,
Mariane Comte
,
Florence Azaïs
,
Michel Renovell
,
Jie Jiang
et al.
Communication dans un congrès
lirmm-00820067
v1
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An IR-Drop Simulation Principle Oriented to Delay Testing
Marina Aparicio Rodriguez
,
Mariane Comte
,
Florence Azaïs
,
Yves Bertrand
,
Michel Renovell
et al.
DCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.404-409
Communication dans un congrès
lirmm-00804254
v1
|
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Smart selection of indirect parameters for DC-based alternate RF IC testing
Haithem Ayari
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Michel Renovell
et al.
Communication dans un congrès
lirmm-00803453
v1
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Making predictive analog/RF alternate test strategy independent of training set size
Haithem Ayari
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
et al.
Communication dans un congrès
lirmm-00803564
v1
|
|
On the use of redundancy to reduce prediction error in alternate analog/RF test
Haithem Ayari
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
et al.
IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, May 2012, Taipei, Taiwan. pp.34-39, ⟨10.1109/IMS3TW.2012.17⟩
Communication dans un congrès
lirmm-00803556
v1
|
|
ANC-Based Method for Testing Converters with Random-Phase Harmonics
Vincent Kerzérho
,
Florence Azaïs
,
Mariane Comte
,
Philippe Cauvet
,
Serge Bernard
et al.
IMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès
lirmm-00494578
v1
|
|
Adaptive LUT-Based System for In Situ ADC Auto-correction
Serge Bernard
,
Florence Azaïs
,
Mariane Comte
,
Olivier Potin
,
Vincent Kerzérho
et al.
IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès
lirmm-00494424
v1
|
|
LH-BIST for Digital Correction of ADC Offset
Serge Bernard
,
Florence Azaïs
,
Mariane Comte
,
Yves Bertrand
,
Michel Renovell
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.199-203
Communication dans un congrès
lirmm-00375659
v1
|
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Deriving an Electrical Model for Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects
Nicolas Houarche
,
Alejandro Czutro
,
Mariane Comte
,
Piet Engelke
,
Ilia Polian
et al.
LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A
Communication dans un congrès
lirmm-00367708
v1
|
|
An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects
Nicolas Houarche
,
Mariane Comte
,
Michel Renovell
,
Alejandro Czutro
,
Piet Engelke
et al.
VTS'09: 27th VLSI Test Symposium, May 2009, Santa Cruz, Californie, United States. pp.21-26, ⟨10.1109/VTS.2009.57⟩
Communication dans un congrès
lirmm-00374941
v1
|
|
A Multi-Converter DFT Technique for Complex SIP: Concepts and Validation
Vincent Kerzérho
,
Philippe Cauvet
,
Serge Bernard
,
Florence Azaïs
,
Mariane Comte
et al.
ECCTD: European Conference on Circuit Theory and Design, Aug 2009, Antalya, Turkey. pp.747-750
Communication dans un congrès
lirmm-00448863
v1
|
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A Model for Resistive Open Recursivity in CMOS Random Logic
Michel Renovell
,
Mariane Comte
,
Nicolas Houarche
,
Ilia Polian
,
Piet Engelke
et al.
EWDTS: East-West Design & Test Symposium, Oct 2008, Lviv, Ukraine. pp.21-24
Communication dans un congrès
lirmm-00381465
v1
|
|
A Simulator of Small-Delay Faults Caused by Resistive-Open Defects
Alejandro Czutro
,
Nicolas Houarche
,
Piet Engelke
,
Ilia Polian
,
Mariane Comte
et al.
ETS: European Test Symposium, May 2008, Verbania, Italy. pp.113-118
Communication dans un congrès
lirmm-00285886
v1
|
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Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC
Vincent Kerzérho
,
Philippe Cauvet
,
Serge Bernard
,
Florence Azaïs
,
Mariane Comte
et al.
Communication dans un congrès
lirmm-00158527
v1
|
|
Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave Generators
Vincent Kerzérho
,
Philippe Cauvet
,
Serge Bernard
,
Florence Azaïs
,
Michel Renovell
et al.
IMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, Povoa de Varzim, Portugal. pp.196-201
Communication dans un congrès
lirmm-00161708
v1
|
|
Experimental Validation of the "Analogue Network of Converters" Technique to Test Complex SiP/SoC
Serge Bernard
,
Florence Azaïs
,
Philippe Cauvet
,
Mariane Comte
,
Vincent Kerzérho
et al.
IEEE International Mixed-Signal Testing Workshop, Jun 2006, Paris, France. pp.84-88
Communication dans un congrès
lirmm-00119266
v1
|
|
Analysing the Memory Effect of Resistive Open in CMOS Random Logic
Michel Renovell
,
Mariane Comte
,
Ilia Polian
,
Piet Engelke
,
Bernd Becker
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2006, Tunis, Tunisia. pp.251-256
Communication dans un congrès
lirmm-00093383
v1
|
|
Electrical Behavior of GOS Fault Affected Domino Logic Cell
Mariane Comte
,
Satoshi Ohtake
,
Hideo Fujiwara
,
Michel Renovell
DELTA'06: IEEE International Workshop on Electronics DesignTest & Applications, Jan 2006, Kuala Lumpur, Malaysia, pp.183-189
Communication dans un congrès
lirmm-00102703
v1
|
|
“Analogue Network of Converters”: A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC
Florence Azaïs
,
Serge Bernard
,
Philippe Cauvet
,
Mariane Comte
,
Vincent Kerzérho
et al.
ETS: European Test Symposium, May 2006, Southampton, United Kingdom. pp.159-164
Communication dans un congrès
lirmm-00115676
v1
|
|
A Specific ATPG Technique for Resistive Open with Sequence Recursive Dependency
Michel Renovell
,
Mariane Comte
,
Ilia Polian
,
Piet Engelke
,
Bernd Becker
Communication dans un congrès
lirmm-00117022
v1
|
|
Electrical Analysis of a Domino Logic Cell with GOS Faults
Mariane Comte
,
Satoshi Ohtake
,
Hideo Fujiwara
,
Michel Renovell
DBT'05: International Workshop on Current & Defect Based Testing, May 2005, Palm Springs, CA, United States
Communication dans un congrès
lirmm-00374937
v1
|
|
Fast and Fully-Efficient Test Flow for ADCs
Serge Bernard
,
Mariane Comte
,
Florence Azaïs
,
Yves Bertrand
,
Michel Renovell
IMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.244-249
Communication dans un congrès
lirmm-00106523
v1
|
|
Electrical Behavior of GOS Faults in Domino Logic
Mariane Comte
,
Satoshi Ohtake
,
Hideo Fujiwara
,
Michel Renovell
DDECS'05: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2005, Sopron, Hungary, pp.210-215
Communication dans un congrès
lirmm-00105991
v1
|
|
Analysis of the Specification Influence on the Efficiency of an Optimized Test Flow for ADCs
Mariane Comte
,
Florence Azaïs
,
Serge Bernard
,
Yves Bertrand
,
Michel Renovell
IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.185-190
Communication dans un congrès
lirmm-00269583
v1
|
|
Automatic Generation of LH-BIST Architecture for ADC Testing
Serge Bernard
,
Florence Azaïs
,
Mariane Comte
,
Yves Bertrand
,
Michel Renovell
IWADC'03: IEEE International Workshop on ADC Modelling and Testing, Sep 2003, Perugia, Italy. pp.7-12
Communication dans un congrès
lirmm-00269683
v1
|
|
An Automatic Tool for Generation of ADC BIST Architecture
Serge Bernard
,
Florence Azaïs
,
Mariane Comte
,
Yves Bertrand
,
Michel Renovell
IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.79-84
Communication dans un congrès
lirmm-00269580
v1
|
|
A New Methodology for ADC Test Flow Optimization
Serge Bernard
,
Mariane Comte
,
Florence Azaïs
,
Yves Bertrand
,
Michel Renovell
Communication dans un congrès
lirmm-00269527
v1
|
|
On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static Errors
Mariane Comte
,
Florence Azaïs
,
Serge Bernard
,
Yves Bertrand
,
Michel Renovell
LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.198-203
Communication dans un congrès
lirmm-00269498
v1
|
|
On the Evaluation of ADC Static Parameters Through Dynamic Testing
Mariane Comte
,
Florence Azaïs
,
Serge Bernard
,
Yves Bertrand
,
Michel Renovell
ADDA & EWADC, Jun 2002, Prague, Czech Republic. pp.95-98
Communication dans un congrès
lirmm-00269338
v1
|
|
Estimating Static Parameters of A-to-D Converters from Spectral Analysis
Florence Azaïs
,
Serge Bernard
,
Yves Bertrand
,
Mariane Comte
,
Michel Renovell
et al.
LATW: Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.174-179
Communication dans un congrès
lirmm-00269320
v1
|
|
Mesure des Paramètres Statiques des Convertisseurs A/N par une Analyse Spectrale
Mariane Comte
,
Florence Azaïs
,
Serge Bernard
,
Yves Bertrand
,
Michel Renovell
Colloque du GDR CAO de Circuits et Systèmes Intégrés, May 2002, Paris, France. pp.47-50
Communication dans un congrès
lirmm-00269325
v1
|
|
Evaluation of ADC Static Parameters via Frequency Domain
Florence Azaïs
,
Serge Bernard
,
Yves Bertrand
,
Mariane Comte
,
Michel Renovell
IMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.165-169
Communication dans un congrès
lirmm-00269347
v1
|