Martin HYTCH

121

Documents

Presentation

Publications

	Principle of TEM alignment using convolutional neural networks: Case study on condenser aperture alignment Loïc Grossetête , Cécile Marcelot , Christophe Gatel , Sylvain Pauchet , Martin Hytch Ultramicroscopy, 2024, 267, pp.114047. ⟨10.1016/j.ultramic.2024.114047⟩ Journal articles hal-04771442v1
	Operando electrical biasing TEM experiments of Ge-rich GST thin films with FIB sample preparation L. Zhang , Bumsu Park , Lucas Chapuis , Kilian Gruel , Robin Cours Journal of Alloys and Compounds, 2024, 1003, pp.175626. ⟨10.1016/j.jallcom.2024.175626⟩ Journal articles hal-04727916v1
	Measuring Electrical Resistivity at the Nanoscale in Phase-Change Materials L. Zhang , Frédéric Lorut , Kilian Gruel , Martin Hÿtch , Christophe Gatel Nano Letters, 2024, 24 (19), pp.5913-5919. ⟨10.1021/acs.nanolett.4c01462⟩ Journal articles hal-04727906v1
	Mapping electric fields in real nanodevices by operando electron holography Maria Brodovoi , Kilian Gruel , Aurélien Masseboeuf , Lucas Chapuis , Martin Hÿtch Applied Physics Letters, 2022, 120 (23), pp.233501. ⟨10.1063/5.0092019⟩ Journal articles hal-03752638v1
	Extended charge layers in metal-oxide-semiconductor nanocapacitors revealed by Operando electron holography C. Gatel , R. Serra , K. Gruel , A. Masseboeuf , L. Chapuis Physical Review Letters, 2022, 129 (13), pp.137701. ⟨10.1103/physrevlett.129.137701⟩ Journal articles hal-03787333v1
	Phase detection limits in off-axis electron holography from pixelated detectors: gain variations, geometric distortion and failure of reference-hologram correction Martin Hÿtch , Christophe Gatel Microscopy (Oxf), 2021, Electron Interference Microscopy, 70 (1), pp.47. ⟨10.1093/jmicro/dfaa044⟩ Journal articles hal-03001935v1
	Dark-field electron holography as a recording of crystal diffraction in real space: a comparative study with high-resolution X-ray diffraction for strain analysis of MOSFETs Victor Boureau , Aurèle Durand , Patrice Gergaud , Delphine Le Cunff , Matthew Wormington Journal of Applied Crystallography, 2020, 53 (4), pp.885-895. ⟨10.1107/S1600576720006020⟩ Journal articles hal-03001931v1
	Strain evolution of SiGe-on-insulator obtained by the Ge-condensation technique Victor Boureau , Shay Reboh , Daniel Benoit , Martin Hÿtch , Alain Claverie APL Materials, 2019, 7 (4), pp.041120. ⟨10.1063/1.5088441⟩ Journal articles hal-03015401v1
	One-Pot Seed-Mediated Growth of Co Nanoparticles by the Polyol Process: Unraveling the Heterogeneous Nucleation Raj Kumar Ramamoorthy , Arnaud Viola , Bilel Grindi , Jennifer Peron , Christophe Gatel Nano Letters, 2019, 19 (12), pp.9160-9169. ⟨10.1021/acs.nanolett.9b04584⟩ Journal articles hal-04727875v1
	Optimization of off-axis electron holography performed with femtosecond electron pulses Florent Houdellier , Giuseppe Mario Caruso , Sébastien J. Weber , M.J. Hÿtch , Christophe Gatel Ultramicroscopy, 2019, ⟨10.1016/j.ultramic.2019.03.016⟩ Journal articles hal-02080673v1
	One-Pot Seed-Mediated Growth of Co Nanoparticles by the Polyol Process: Unraveling the Heterogeneous Nucleation Raj-Kumar Ramamoorthy , Arnaud Viola , Bilel Grindi , Jennifer Péron , Christophe Gatel Nano Letters, 2019, 19 (12), pp.9160-9169. ⟨10.1021/acs.nanolett.9b04584⟩ Journal articles hal-02467983v1
	Unlimited acquisition time in electron holography by automated feedback control of transmission electron microscope Christophe Gatel , Julien Dupuy , Florent Houdellier , Martin J. Hÿtch Applied Physics Letters, 2018, 113 (13), ⟨10.1063/1.5050906⟩ Journal articles hal-01884057v1
	Local deformation gradients in epitaxial Pb(Zr 0.2 Ti 0.8 )O 3 layers investigated by transmission electron microscopy Thibaud Denneulin , N Wollschläger , E Everhardt , S. Farokhipoor , B. Noheda Journal of Physics: Condensed Matter, 2018, 30 (21), ⟨10.1088/1361-648X/aabd00⟩ Journal articles hal-01838701v1
	Lattice reorientation in tetragonal PMN-PT thin film induced by focused ion beam preparation for transmission electron microscopy Thibaud Denneulin , Wanjoo Maeng , Chang-Beom Eom , Martin Hÿtch Journal of Applied Physics, 2017, 121 (5), pp.055302. ⟨10.1063/1.4975114⟩ Journal articles hal-01707818v1
	Influence of electromechanical coupling on optical properties of InGaN quantum-dot based light-emitting diodes D. Barettin , M.A.D. Maur , A.D. Di Carlo , A. Pecchia , A.F. Tsatsulnikov Nanotechnology, 2017, 28 (1), ⟨10.1088/0957-4484/28/1/015701⟩ Journal articles hal-01736015v1
	Carrier transport and emission efficiency in InGaN quantum-dot based light-emitting diodes Daniele Barettin , Matthias auf Der Maur , Aldo Di Carlo , Alessandro Pecchia , Andrei F Tsatsulnikov Nanotechnology, 2017, 28 (27), ⟨10.1088/1361-6528/aa75a8⟩ Journal articles hal-01736017v1
	Electron microscopy by specimen design: application to strain measurements Nikolay Cherkashin , Thibaud Denneulin , Martin Hÿtch Scientific Reports, 2017, 7 (1), pp.12394 - 12394. ⟨10.1038/s41598-017-12695-8⟩ Journal articles hal-01707848v1
	Differential phase-contrast dark-field electron holography for strain mapping Thibaud Denneulin , Florent Houdellier , Martin Hÿtch Ultramicroscopy, 2016, 160, pp.98-109. ⟨10.1016/j.ultramic.2015.10.002⟩ Journal articles hal-01723740v1
	Quantitative 3D electromagnetic field determination of 1D nanostructures from single projection Charudatta Phatak , Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Martin Hÿtch Ultramicroscopy, 2016, 164, pp.24--30. ⟨10.1016/j.ultramic.2016.03.005⟩ Journal articles hal-01430579v1
	Realization of a tilted reference wave for electron holography by means of a condenser biprism Falk Röder , Florent Houdellier , Thibaud Denneulin , Etienne Snoeck , Martin Hÿtch Ultramicroscopy, 2016, 161, pp.23 - 40. ⟨10.1016/j.ultramic.2015.11.004⟩ Journal articles hal-01404505v1
	Strain/composition interplay in thin SiGe layers on insulator processed by Ge condensation Victor Boureau , Daniel Benoit , Bénédicte Warot-Fonrose , Martin Hÿtch , Alain Claverie Materials Science in Semiconductor Processing, 2016, 42, pp.251 - 254. ⟨10.1016/j.mssp.2015.07.034⟩ Journal articles hal-01707172v1
	Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip Florent Houdellier , Ludvig de Knoop , Christophe Gatel , Aurélien Masseboeuf , S Mamishin Ultramicroscopy, 2015, 151, pp.107--115. ⟨10.1016/j.ultramic.2014.11.021⟩ Journal articles hal-01430585v1
	Three Dimensional Visualization of Electromagnetic Fields from One Dimensional Nanostructures Charudatta Phatak , Aurélien Masseboeuf , Ludvig de Knoop , Christophe Gatel , Martin Hÿtch Microscopy and Microanalysis, 2015, 21 (S3), pp.1977--1978. ⟨10.1017/S1431927615010661⟩ Journal articles hal-01430587v1
	Role of compositional fluctuations and their suppression on the strain and luminescence of InGaN alloys Konstantinos Pantzas , Gilles Patriarche , David Troadec , Mathieu Kociak , Nikolay Cherkashin Journal of Applied Physics, 2015, 117 (5), pp.55705. ⟨10.1063/1.4907210⟩ Journal articles hal-01721149v1
	Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing Ludvig de Knoop , Christophe Gatel , Florent Houdellier , Marc Monthioux , Aurélien Masseboeuf Applied Physics Letters, 2015, 106 (26), pp.263101. ⟨10.1063/1.4923245⟩ Journal articles hal-01430586v2
	Formation of three-dimensional islands in the active region of InGaN based light emitting diodes using a growth interruption approach Andrei F. F Tsatsulnikov , Wsevolod V. V Lundin , Alexei V. V Sakharov , Andrey E. E Nikolaev , E.E. E Zavarin Science of advanced materials, 2015, 7 (8), pp.1629-1635. ⟨10.1166/sam.2015.2277⟩ Journal articles hal-01721151v1
	Investigation of the phase occurrence, H sorption properties, and electrochemical behavior in the composition ranges La0.75-0.80Mg0.30-0.38Ni3.67 Junxian Zhang , Michel Latroche , Cesar Magen , Virginie Serin , Martin Hÿtch Journal of Physical Chemistry C, 2014, 118 (48), pp.27808-27814. ⟨10.1021/jp510313a⟩ Journal articles hal-01760672v1
	Local strain measurements at dislocations, disclinations and domain boundaries Martin Hÿtch , Christophe Gatel , Axel Lubk , Thibaud Denneulin , Lise Durand Microscopy and Microanalysis, 2014, 20 (3), pp.1044-1045. ⟨10.1017/S1431927614006941⟩ Journal articles hal-01721157v1
	Off-Axial Aberration Correction using a B-COR for Lorentz and HREM Modes Etienne Snoeck , Florent Houdellier , Yoshifumi Taniguch , Aurélien Masseboeuf , Christophe Gatel Microscopy and Microanalysis, 2014, 20 (S3), pp.932--933. ⟨10.1017/S1431927614006382⟩ Journal articles hal-01430589v1
	Dynamic scattering theory for dark-field electron holography of 3D strain fields Axel Lubk , Elsa Javon , Nikolay Cherkashin , Shay Reboh , Christophe Gatel Ultramicroscopy, 2014, 136, pp.42-49. ⟨10.1016/j.ultramic.2013.07.007⟩ Journal articles hal-01721153v1
	Determining the work function of a carbon-cone cold-field emitter by in situ electron holography Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Aurélien Masseboeuf , Marc Monthioux Micron, 2014, 63, pp.2--8. ⟨10.1016/j.micron.2014.03.005⟩ Journal articles hal-01430588v1
	Dynamical effects in strain measurements by dark-field electron holography Elsa Javon , Axel Lubk , Robin Cours , Shay Reboh , Nikolay Cherkashin Ultramicroscopy, 2014, 147, pp.70-85. ⟨10.1016/j.ultramic.2014.06.005⟩ Journal articles hal-01721158v1
	Mechanics of silicon nitride thin-film stressors on a transistor-like geometry Shay Reboh , P. Morin , Martin Hÿtch , Florent Houdellier , Alain Claverie APL Materials, 2013, 1 (4), ⟨10.1063/1.4826545⟩ Journal articles hal-01724108v1
	Determination of stress, strain, and elemental distribution within In(Ga)As quantum dots embedded in GaAs using advanced transmission electron microscopy Nikolay Cherkashin , Shay Reboh , Martin Hÿtch , Alain Claverie , V.V. Preobrazhenskii Applied Physics Letters, 2013, 102 (17), pp.173115. ⟨10.1063/1.4804380⟩ Journal articles hal-01736028v1
	Strain in hydrogen-implanted si investigated using dark-field electron holography Nikolay Cherkashin , Shay Reboh , Axel Lubk , Martin Hÿtch , Alain Claverie Applied Physics Express, 2013, 6 (9), ⟨10.7567/APEX.6.091301⟩ Journal articles hal-01736022v1
	Nanoscale concentration and strain distribution in pseudomorphic films Si1−xGex/Si processed by pulsed laser induced epitaxy L. Vincent , F. Fossard , T. Kociniewski , L. Largeau , Nikolay Cherkashin Applied Surface Science, 2012, 258 (23), pp.9208-9212. ⟨10.1016/j.apsusc.2011.07.074⟩ Journal articles hal-01736031v1
	Application of the O-lattice theory for the reconstruction of the high-angle near 90? tilt Si(1 1 0)/(0 0 1) boundary created by wafer bonding Nikolay Cherkashin , O. Kononchuk , Shay Reboh , Martin Hÿtch Acta Materialia, 2012, 60 (3), pp.1161-1173. ⟨10.1016/j.actamat.2011.10.054⟩ Journal articles hal-01736034v1
	A new linear transfer theory and characterization method for image detectors. Part II: Experiment Axel Lubk , Falk Röder , Tore Niermann , Christophe Gatel , Sébastien Joulié Ultramicroscopy, 2012, 115, pp.78 - 87. ⟨10.1016/j.ultramic.2012.01.011⟩ Journal articles hal-01742051v1
	Monolithic white LEDs: Approaches, technology, design V.M. Ustinov , A.F. Tsatsulnikov , V.V. Lundin , A.V. Sakharov , A.E. Nikolaev Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2012, 6 (3), pp.501-504. ⟨10.1134/S1027451012060237⟩ Journal articles hal-01736030v1
	Effect of stimulated phase separation on properties of blue, green and monolithic white LEDs A.F. Tsatsulnikov , W.V. Lundin , A.V. Sakharov , E.E. Zavarin , S.O. Usov physica status solidi (c), 2012, 9 (3-4), pp.774-777. ⟨10.1002/pssc.201100339⟩ Journal articles hal-01736032v1
	New carbon cone nanotip for use in a highly coherent cold field emission electron microscope Florent Houdellier , Aurélien Masseboeuf , Marc Monthioux , Martin Hÿtch Carbon, 2012, 50 (5), pp.2037-2044. ⟨10.1016/j.carbon.2012.01.023⟩ Journal articles hal-00678407v1
	Dark-field electron holography for the measurement of geometric phase Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck Ultramicroscopy, 2011, 111 (8), pp.1328 - 1337. ⟨10.1016/j.ultramic.2011.04.008⟩ Journal articles hal-01742047v1
	Single quantum well deep-green LEDs with buried InGaN/GaN short-period superlattice W.V. Lundin , A.E. Nikolaev , A.V. Sakharov , E.E. Zavarin , G.A. Valkovskiy Journal of Crystal Growth, 2011, 315 (1), pp.267--271. ⟨10.1016/j.jcrysgro.2010.09.043⟩ Journal articles hal-01736042v1
	Reconstruction of a high angle tilt (110)/(001) boundary in Si using O-lattice theory Nikolay Cherkashin , O. Kononchuk , Martin Hÿtch Solid State Phenomena, 2011, 178-179, pp.489-494. ⟨10.4028/www.scientific.net/SSP.178-179.489⟩ Journal articles hal-01736039v1
	Strain mapping in layers and devices by electron holography Martin Hÿtch , Nikolay Cherkashin , Shay Reboh , Florent Houdellier , Alain Claverie Physica Status Solidi A (applications and materials science), 2011, 208 (3), pp.580-583. ⟨10.1002/pssa.201000281⟩ Journal articles hal-01736038v1
	InGaN/GaN short-period superlattices: synthesis, properties, applications A. F. Tsatsulnikov , W. V. Lundin , A. V. Sakharov , E. E. Zavarin , S. O. Usov physica status solidi (c), 2011, 8 (7-8), pp.2308--2310. ⟨10.1002/pssc.201001040⟩ Journal articles hal-01736040v1
	Active region based on graded-gap InGaN/GaN superlattices for high-power 440- to 470-nm light-emitting diodes A.F. Tsatsulnikov , W.V. Lundin , A.V. Sakharov , E.E. Zavarin , S.O. Usov Semiconductors, 2010, 44 (1), pp.93-97. ⟨10.1134/S1063782610010161⟩ Journal articles hal-01736052v1
	Visualising alloy fluctuations by spherical-aberration–corrected HRTEM Marie-José Casanove , Nicolas Combe , Florent Houdellier , Martin Hÿtch EPL - Europhysics Letters, 2010, 91 (3), ⟨10.1209/0295-5075/91/36001⟩ Journal articles hal-01742039v1
	Dark-field electron holography for the mapping of strain in nanostructures: correcting artefacts and aberrations Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck Journal of Physics: Conference Series, 2010, 241, pp.012027. ⟨10.1088/1742-6596/241/1/012027⟩ Journal articles hal-01742031v1
	The use of short-period InGaN/GaN superlattices in blue-region light-emitting diodes V.S. Sizov , A.F. Tsatsulnikov , A.V. Sakharov , W.V. Lundin , E.E. Zavarin Semiconductors, 2010, 44 (7), pp.924-930. ⟨10.1134/S106378261007016X⟩ Journal articles hal-01736047v1
	Cyclic Deposition / Etch processes for the formation of Si raised sources and drains in advanced MOSFETs J.M. Hartmann , M. Py , P.H. Morel , T. Ernst , B. Prévitali ECS Transactions, 2010, 33 (6), pp.391-407. ⟨10.1149/1.3487570⟩ Journal articles hal-01736046v1
	Fabrication, structural and electrical properties of compressively strained Ge-on-insulator substrates. M. Hartmann , L. Sanchez , W. van den Daele , A. Abadie , L. Baud Semiconductor Science & Technology, 2010, 25, pp.075010 Journal articles hal-00596336v1
	Formation of composite InGaN/GaN/InAlN quantum dots A.F. Tsatsul'Nikov , E.E. Zavarin , N.V. Kryzhanovskaya , W.V. Lundin , A.V. Saharov Semiconductors, 2010, 44 (10), pp.1338-1341. ⟨10.1134/S1063782610100167⟩ Journal articles hal-01736045v1
	Strain mapping of tensiley strained silicon transistors with embedded Si1−yCy source and drain by dark-field holography Florian Hüe , Martin Hÿtch , Florent Houdellier , Hugo Bender , Alain Claverie Applied Physics Letters, 2009, 95 (7), pp.73103 - 73103. ⟨10.1063/1.3192356⟩ Journal articles hal-01742020v1
	End of range defects in Ge S. Koffel , Nikolay Cherkashin , Florent Houdellier , Martin Hÿtch , Gérard Benassayag Journal of Applied Physics, 2009, 105, pp.126110. ⟨10.1063/1.3153985⟩ Journal articles hal-01736054v1
	Effect of strain relaxation on active-region formation in InGaN/(Al)GaN heterostructures for green LEDs A.V. Sakharov , W.V. Lundin , E.E. Zavarin , M.A. Sinitsyn , A.E. Nikolaev Semiconductors, 2009, 43 (6), pp.812-817. ⟨10.1134/S1063782609060232⟩ Journal articles hal-01736055v1
	On the influence of elastic strain on the accommodation of carbon atoms into substitutional sites in strained Si:C layers grown on Si substrates Nikolay Cherkashin , Martin Hÿtch , Florent Houdellier , Florian Hüe , Vincent Paillard Applied Physics Letters, 2009, 94 (14), pp.141910. ⟨10.1063/1.3116648⟩ Journal articles hal-00417300v1
	Selective growth of tensily strained Si1−yCy films on patterned Si substrates A. Gouye , Florian Hüe , A. Halimaoui , O. Kermarrec , Y. Campidelli Materials Science in Semiconductor Processing, 2009, 12 (1-2), pp.34 - 39. ⟨10.1016/j.mssp.2009.07.006⟩ Journal articles hal-01742015v1
	Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique Bénédicte Warot-Fonrose , Florent Houdellier , Martin Hÿtch , Lionel Calmels , Virginie Serin Ultramicroscopy, 2008, 108 (5), pp.393 - 398. ⟨10.1016/j.ultramic.2007.05.013⟩ Journal articles hal-01707847v1
	Lateral epitaxial growth of germanium on silicon oxide D. Cammilleri , V. Yam , F. Fossard , C. Renard , D. Bouchier Applied Physics Letters, 2008, 93 (4), pp.43110 - 43110. ⟨10.1063/1.2963363⟩ Journal articles hal-01742002v1
	Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography Florian Hüe , Martin Hÿtch , Florent Houdellier , Etienne Snoeck , Alain Claverie Materials Science and Engineering: B, 2008, 154-155, pp.221 - 224. ⟨10.1016/j.mseb.2008.10.020⟩ Journal articles hal-01742010v1
	Lateral growth of monocrystalline Ge on silicon oxide by ultrahigh vacuum chemical vapor deposition V. D. Cammilleri , V. Yam , F. Fossard , C. Renard , D. Bouchier Materials Science in Semiconductor Processing, 2008, 11 (5-6), pp.214-216. ⟨10.1016/j.mssp.2008.07.003⟩ Journal articles hal-01293141v1
	Nanoscale holographic interferometry for strain measurements in electronic devices Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck Nature, 2008, 453 (7198), pp.1086 - 1089. ⟨10.1038/nature07049⟩ Journal articles hal-01742001v1
	Direct Mapping of Strain in a Strained Silicon Transistor by High-Resolution Electron Microscopy Florian Hüe , Martin Hÿtch , Hugo Bender , Florent Houdellier , Alain Claverie Physical Review Letters, 2008, 100 (15), ⟨10.1103/PhysRevLett.100.156602⟩ Journal articles hal-01741994v1
	Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF) Florent Houdellier , Martin Hÿtch Ultramicroscopy, 2008, 108 (3), pp.285 - 294. ⟨10.1016/j.ultramic.2007.08.016⟩ Journal articles hal-01707842v1
	Single crystals of V amylose complexed with a-naphthol M.B. Cardoso , J.L. Putaux , Y. Nishiyama , W. Helbert , Martin Hÿtch Biomacromolecules, 2007, pp.1319-1326 Journal articles hal-00305577v1
	HRTEM study of defects in twin boundaries of ultra fine grained copper Mohamed Sennour , Sylvie Lartigue-Korinek , Yannick Champion , Martin Hÿtch Philosophical Magazine, 2007, 87 (10), pp.1465-1486. ⟨10.1080/14786430601021611⟩ Journal articles hal-00513787v1
	Experimental application of sum rules for electron energy loss magnetic chiral dichroism Lionel Calmels , Florent Houdellier , Bénédicte Warot-Fonrose , Christophe Gatel , Martin Hÿtch Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2007, 76 (6), ⟨10.1103/PhysRevB.76.060409⟩ Journal articles hal-01741982v1
	Mapping stress and strain in nanostructures by high-resolution transmission electron microscopy Florent Houdellier , Martin Hÿtch Microelectronic Engineering, 2007, 84 (3), pp.460 - 463. ⟨10.1016/j.mee.2006.10.062⟩ Journal articles hal-01741980v1
	Stress and strain around grain-boundary dislocations measured by high-resolution electron microscopy Martin Hÿtch , Jean-Luc Putaux , Jany Thibault Philosophical Magazine, 2006, 86 (29-31), pp.4641-4656. ⟨10.1080/14786430600743876⟩ Journal articles hal-00513705v1
	High-resolution electron holography for the study of composition and strain in thin film semiconductors Florent Houdellier , Martin Hÿtch , Etienne Snoeck , Marie-José Casanove Materials Science and Engineering: B, 2006, 135 (3), pp.188 - 191. ⟨10.1016/j.mseb.2006.08.035⟩ Journal articles hal-01741978v1
	Quantitative local strain measurements in compressive strained Ge/tensile strained Si bi-layers grown on top of relaxed Si0.5Ge0.5 virtual substrates Nikolay Cherkashin , Martin Hÿtch , Etienne Snoeck , Florian Hüe , J.M. Hartmann Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2006, 253 (1-2), pp.145-148. ⟨10.1016/j.nimb.2006.10.051⟩ Journal articles hal-01736071v1
	Characterization of helium bubble size and faceting by electron holography Etienne Snoeck , Jérôme Majimel , M. O. Ruault , Martin Hÿtch Journal of Applied Physics, 2006, 100 (2), 023519 (5 p.). ⟨10.1063/1.2216791⟩ Journal articles hal-00090302v1
	Quantitative strain and stress measurements in Ge/Si dual channels grown on a Si0.5Ge0.5 virtual substrate Nikolay Cherkashin , Martin Hÿtch , Etienne Snoeck , Alain Claverie , J.M. Hartmann Materials Science and Engineering: B, 2005, 124-125, pp.118--122. ⟨10.1016/j.mseb.2005.08.054⟩ Journal articles hal-01736084v1
	Structure determination of clusters formed in ultra-low energy high-dose implanted silicon Nikolay Cherkashin , Martin Hÿtch , Fuccio Cristiano , Alain Claverie Solid State Phenomena, 2005, 108-109, pp.303-308. ⟨10.4028/www.scientific.net/SSP.108-109.303⟩ Journal articles hal-01736085v1
	Synthesis and microstructure of bulk nanocrystalline copper C. Langlois , M.J. Hÿtch , S. Lartigue-Korinek , Y Champion , P. Langlois Metallurgical and Materials Transactions A, 2005, 36 (12), pp.3451-3460. ⟨10.1007/s11661-005-0018-2⟩ Journal articles hal-03934689v1
	Nanoscale measurement of stress and strain by quantitative high-resolution electron microscopy Martin Hÿtch , J.L. Putaux , J.M. Penisson Mater. Sci. Forum, 2005, pp.39-44 Journal articles hal-00305967v1
	Plasticity of Copper with Small Grain Size Yannick Champion , Cyril Langlois , Sandrine Guérin , Sylvie Lartigue-Korinek , Patrick Langlois Materials Science Forum, 2005, 482, pp.71-76. ⟨10.4028/www.scientific.net/MSF.482.71⟩ Journal articles hal-03934629v1
	Near-Perfect Elastoplasticity in Pure Nanocrystalline Copper Yannick Champion , Sandrine Guérin-Mailly , Patrick Langlois , Jean-Louis Bonnentien , Martin Hÿtch Science, 2003, 300 (5617), pp.310-311. ⟨10.1126/science.1081042⟩ Journal articles hal-03356720v1
	Control of grain size and morphologies of nanograined ferrites by adaptation of the synthesis route. Mechanosynthesis and soft chemistry N. Guigue-Millot , Sylvie Begin-Colin , Y. Champion , Martin Hÿtch , Gérard Le Caër Journal of Solid State Chemistry, 2003, pp.30-38 Journal articles hal-00475138v1
	Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy Martin Hÿtch , J.L. Putaux , J.M. Penisson Nature, 2003, pp.270-273 Journal articles hal-00306927v1
	Chemical heterogeneities in nanometric titanomagnetites prepared by soft chemistry and studied ex situ : evidence for fe-segregation and oxidation kinetics N. Guigue-Millot , Y. Champion , Martin Hÿtch , F. Bernard , Sylvie Begin-Colin Journal of Physical Chemistry B, 2001, pp.7125-7132 Journal articles hal-00475337v1
	Quantitative analysis of strain field in thin films from HRTEM micrographs Etienne Snoeck , B Warot , H. Ardhuin , A Rocher , Marie-José Casanove Thin Solid Films, 1998, 319 (1-2), pp.157-162. ⟨10.1016/S0040-6090(97)01113-9⟩ Journal articles hal-02918291v1
	Transmission Electron Microscopy of Metallic Multilayers M. Walls , J.-P. Chevalier , Martin Hÿtch Journal de Physique IV Proceedings, 1996, 06 (C7), pp.C7-213-C7-223. ⟨10.1051/jp4:1996728⟩ Journal articles jpa-00254516v1

	AI Automation for Transmission Electron Microscope Alignment Loïc Grossetête , Cécile Marcelot , C Gatel , Sylvain Pauchet , Martin J. Hÿtch EMC2024, Aug 2024, Copenhagen, Denmark Conference papers hal-04626351v1
	Towards AI-automated TEM Loïc Grossetête , Cécile Marcelot , Christophe Gatel , Sylvain Pauchet , Martin Hÿtch The 20th International Microscopy Congress, International Federation of Societies for Microscopy (IFSM); Korean Society of Microscopy (KSM), Sep 2023, Busan (South Korea), South Korea Conference papers hal-04636435v1
	AI driven TEM configuration for better data acquisition Loïc Grossetête , Martin Hÿtch , Christophe Gatel , Cécile Marcelot , Sylvain Pauchet 18e Colloque de la Société Française des Microscopies, Société Française des Microscopies (SFmu), Jul 2023, Rouen, France Conference papers hal-04636457v1
	In-Situ Electrical Biasing of Electrically Connected TEM Lamellae with Embedded Nanodevices Maria Brodovoi , Kilian Gruel , Lucas Chapuis , Aurélien Masseboeuf , Cécile Marcelot ISTFA 2021, Oct 2021, Phoenix, France. pp.190-195, ⟨10.31399/asm.cp.istfa2021p0190⟩ Conference papers hal-03412037v1
	Fabrication by neon ion milling and characterization of barium titanate nanopillars Ibukun Olaniyan , S.W. Schmitt , Javier Garcia Fernandez , J. Albert , Veeresh Deshpande International Symposium on Applications of Ferroelectrics, ISAF 2021, May 2021, Sydney (AUSTRALIA), Australia Conference papers hal-04618582v1
	Epitaxial BaTiO3 on Silicon and Silicon Germanium: Nanoscale Characterization, Ferroelectricity and Integration into TiN-Gated Devices Lucie Mazet , S.M. Yang , M.M. Frank , E.A. Cartier , H. Miyazoe MRS Spring 2016, Mar 2016, Phœnix, États-Unis Conference papers hal-02083658v1
	MOCVD Grown InGaN/GaN Three-Dimensional Islands: Growth Approaches, Strain-Composition Characterization, Exploitation for LEDs Nikolay Cherkashin , Martin Hÿtch , Maxim Korytov , Daniele Barettin , A. V. Sakharov Energy Materials Nanotechnology (EMN), May 2016, Dubrovnik, Croatia Conference papers hal-01763074v1
	Advanced characterization of semiconductors Nikolay Cherkashin , François-Xavier Darras , Maxim Korytov , Christophe Gatel , Martin Hÿtch XV B-MRS, Sep 2016, Campinas, Brazil Conference papers hal-01767758v1
	In situ electron microscopy of hard and soft matter Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Aurélien Masseboeuf , Marc Monthioux Joint XIII Interamerican Microscopy Congress & XVI Venezuelan Congress for Microscopy and Microanalysis 'CIASEM-2015', Oct 2015, Isla de Margarita, Venezuela Conference papers hal-02123302v1
	Growth parameters and tetragonality at the nanoscale of MBE epitaxial BaTiO3 films on Si Sylvie Schamm-Chardon , Cesar Magen , R. Guzman , Lucie Mazet , Robin Cours EMRS Spring 2015, May 2015, Lille, France Conference papers hal-02081622v1
	Measurement of crystalline lattice strain by transmission electron microscopy” Nikolay Cherkashin , Florent Houdellier , Martin Hÿtch , Maxim Korytov 14ème colloque de la Société Française des Microscopies, Jun 2015, Nice, France Conference papers hal-01763051v1
	Development of TEM and SEM high brightness electron guns using cold field emission from a carbon nanotip Florent Houdellier , Ludvig de Knoop , Christophe Gatel , Aurélien Masseboeuf , Shuichi Mamishin PICO-2015, Apr 2015, Jülich, Netherlands Conference papers hal-02123316v1
	Complex oxides on semiconductors for nanoelectronic applications Lucie Mazet , Romain Bachelet , Guillaume Saint-Girons , Martin Hÿtch , Sylvie Schamm-Chardon TMS 2015 144th Annual Meeting, 2015, Orlando, Fl, USA, United States Conference papers hal-01489569v1
	Realistic model of LED structure with InGaN quantum-dots active region Daniele Barettin , Matthias auf Der Maur , Alessandro Pecchia , Walter Rodrigues , Andrei F. Tsatsulnikov Nanotechnology (IEEE-NANO) 2015 IEEE 15th International Conference on, 2015, Unknown, Unknown Region. pp.1543-1546, ⟨10.1109/NANO.2015.7388939⟩ Conference papers hal-01721150v1
	Process induced strains in FDSOI devices: a contribution of dark-field electron holography Victor Boureau , Martin Hÿtch , Benoit Daniel , Alain Claverie Micro and Nano 2015, Oct 2015, Athenes, Greece Conference papers hal-01763625v1
	Molecular beam epitaxy of ferroelectric complex oxides on silicon Catherine Dubourdieu , Lucie Mazet , S. Yang , Robin Cours , Romain Bachelet 19th Conference on "Insulating Films on Semiconductors (INFOS), Jul 2015, Udine, Italy Conference papers hal-01489594v1
	Strain and Cation Stoichiometry in Epitaxial BaTiO3 Thin Films Grown on Silicon Sylvie Schamm-Chardon , C. Magen , R. Guzman , Lucie Mazet , Robin Cours MRS 2015 Fall Meeting, Nov 2015, Boston, United States Conference papers hal-01965445v1
	Combining high-resolution X-ray reciprocal space mapping and dark-field electron holography for strain analysis in 20 nm pMOS structures Aurèle Durand , Victor Boureau , Delphine Lecunff , Axel Hourtane , Daniel Benoit Nanotechnology (IEEE-NANO) 2015 IEEE 15th International Conference on, 2015, Unknown, Unknown Region. pp.785-788, ⟨10.1109/NANO.2015.7388727⟩ Conference papers hal-01719495v1
	Strain imaging of processed layers and devices by dark field electron holography Alain Claverie , Victor Boureau , Martin Hÿtch , Nikolay Cherkashin Congress of the Electron Microscopy Society of India, Jul 2014, ??, India Conference papers hal-01763638v1
	Epitaxy of ferroelectric complex oxides on semiconductors for field-effect devices Lucie Mazet , Romain Bachelet , Guillaume Saint-Girons , Lamis Louahadj , David Albertini 10th International Conference on Physics of Advanced Materials, Sep 2014, Iasi, Romania Conference papers hal-01965375v1
	Monolithic integration of epitaxial BaTiO3 on Si and SiGe for ferroelectric devices Lucie Mazet , Romain Bachelet , Guillaume Saint-Girons , David Albertini , Brice Gautier AVS 61st International Symposium, 2014, Baltimore, USA, United States Conference papers hal-01490296v1
	Local tetragonality of epitaxial BaTiO3 thin films on Si for ferroelectric applications Sylvie Schamm-Chardon , Thibaud Denneulin , Martin Hÿtch , Lucie Mazet , Romain Bachelet IMC2014 - 18th International Microscopy congress, Sep 2014, Prague, Czech Republic Conference papers hal-01489876v1
	Synthesis and applications of individual carbon-nanotube-supported carbon nanocones Marc Monthioux , Mathieu Delmas , Florent Houdellier , Thierry Ondarçuhu , Aurélien Masseboeuf IEEE Nanotechnology Materials and Devices Conference, Oct 2014, Aci Castello, Italy Conference papers hal-02123308v1
	Epitaxial growth of BaTiO3 on Si and SOI by molecular beam epitaxy for ferroelectric applications Lucie Mazet , Romain Bachelet , Lamis Louahadj , Sylvie Schamm-Chardon , Martin Hÿtch ISAF 2014, May 2014, Penn State University in State College, PA, USA, United States Conference papers hal-01489874v1
	Epitaxial growth of BaTiO3 on semiconductor substrates by molecular beam epitaxy for ferroelectric devices Lucie Mazet , Romain Bachelet , Lamis Louahadj , Claude Botella , M. Frank EMRS 2014 Fall meeting, Sep 2014, Warsaw, Poland Conference papers hal-01489916v1
	Epitaxial growth by molecular beam epitaxy of ferroelectric BaTiO3 on silicon Lucie Mazet , Romain Bachelet , Guillaume Saint-Girons , M. Yang , S. Kalinin Workshop “Les oxydes pour l’optique et la photonique”, 2014, Meudon, France Conference papers hal-01489873v1
	Germanium condensation for co-integration: Strain study by dark-field electron holography Victor Boureau , Daniel Benoit , Bénédicte Warot-Fonrose , Martin Hÿtch , Alain Claverie Nanotechnology Materials and Devices Conference (NMDC), 2014 IEEE 9th, 2014, Unknown, Unknown Region. pp.34-36, ⟨10.1109/NMDC.2014.6997415⟩ Conference papers hal-01719498v1
	Deep green and monolithic white LEDs based on combination of short-period InGaN/GaN superlattice and InGaN QWs A.F. Tsatsulnikov , W.V. Lundin , A.V. Sakharov , E.E. Zavarin , S.O. Usov PHYSICS OF SEMICONDUCTORS: 30th International Conference on the Physics of Semiconductors, 2011, Seoul, France. pp.253-254, ⟨10.1063/1.3666350⟩ Conference papers hal-01736043v1
	Optoelectronic structures with InAlN layers grown by MOVPE A.V. Sakharov , W.V. Lundin , E.E. Zavarin , M.A. Sinitsyn , S.O. Usov 30th International Conference on the Physics of Semiconductors, Jul 2010, Séoul, South Korea. pp.107-108, ⟨10.1063/1.3666279⟩ Conference papers hal-01736041v1
	Strain Mapping of Layers and Devices Using Electron Holography Alain Claverie , Nikolay Cherkashin , Florian Hüe , Shay Reboh , Florent Houdellier ECS Trans. 2010, 2010, Unknown, Unknown Region. ⟨10.1149/1.3487533⟩ Conference papers hal-01736051v1
	Critical Analysis of Different Techniques for Measuring Strain in Si1-yCy Layers Grown by CVD on a Si Substrate Nikolay Cherkashin , Adrien Gouye , Florian Hüe , Florent Houdellier , Martin Hÿtch ECS Transactions, May 2008, Unknown, Unknown Region. ⟨10.1149/1.2911510⟩ Conference papers hal-01736065v1
	Silica coated nanoparticles: synthesis,magnetic properties and spin structure Frederic Mazaleyrat , Mehdi Ammar , Martino Lobue , Jean-Pierre Bonnet , Pierre Audebert ISMANAM, Aug 2007, Corfou, Greece. pp.473-478, ⟨10.1016/j.jallcom.2008.08.121⟩ Conference papers hal-00662962v1
	Determination of strain within Si1-yCy layers grown by CVD on a Si substrate Nikolay Cherkashin , A. Gouye , Florian Hüe , Florent Houdellier , Martin Hÿtch Symposium C – Quantitative Electron Microscopy for Materials Science, 2007, undetermined, France. pp.12-19, ⟨10.1557/PROC-1026-C07-03⟩ Conference papers hal-01736057v1
	Strained Si and Ge MOSFETs with high-K/metal gate stack for high mobility dual channel CMOS O. Weber , Y. Bogumilowicz , T. Ernst , J.-M. Hartmann , F. Ducroquet IEEE International Electron Devices Meeting, 2005, Dec 2005, Washington, United States. pp.137-140, ⟨10.1109/IEDM.2005.1609288⟩ Conference papers hal-01736083v1

	Matière condensée : organisation et dynamique Claude Arnold , Marie-France Beaufort , Loïc Bertrand , Xavier Blase , Christine Boeglin Rapport de conjoncture du comité national de la recherche scientifique : Édition 2014, CNRS Éditions, 2015, 978-2-271-08613-6 Book sections hal-01461528v1
	Dark-Field Electron Holography for Strain Mapping Martin Hÿtch , Florent Houdellier , Nikolay Cherkashin , Shay Reboh , Elsa Javon Alain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩ Book sections hal-01736026v1
	CHAPTER 6 - Aberration Correction With the SACTEM-Toulouse: From Imaging to Diffraction Florent Houdellier , Martin Hÿtch , Florian Hüe , Etienne Snoeck P.W.Hawkes. Advances in Imaging and Electron Physics vol 153, 153, Academic press, 2008, Aberration-Corrected Electron Microscopy, 978-0-12-374220-9. ⟨10.1016/S1076-5670(08)01006-9⟩ Book sections hal-01742322v1

Martin HYTCH

Presentation

Publications

Principle of TEM alignment using convolutional neural networks: Case study on condenser aperture alignment

Operando electrical biasing TEM experiments of Ge-rich GST thin films with FIB sample preparation

Measuring Electrical Resistivity at the Nanoscale in Phase-Change Materials

Mapping electric fields in real nanodevices by operando electron holography

Extended charge layers in metal-oxide-semiconductor nanocapacitors revealed by Operando electron holography

Phase detection limits in off-axis electron holography from pixelated detectors: gain variations, geometric distortion and failure of reference-hologram correction

Dark-field electron holography as a recording of crystal diffraction in real space: a comparative study with high-resolution X-ray diffraction for strain analysis of MOSFETs

Strain evolution of SiGe-on-insulator obtained by the Ge-condensation technique

One-Pot Seed-Mediated Growth of Co Nanoparticles by the Polyol Process: Unraveling the Heterogeneous Nucleation

Optimization of off-axis electron holography performed with femtosecond electron pulses

One-Pot Seed-Mediated Growth of Co Nanoparticles by the Polyol Process: Unraveling the Heterogeneous Nucleation

Unlimited acquisition time in electron holography by automated feedback control of transmission electron microscope

Local deformation gradients in epitaxial Pb(Zr 0.2 Ti 0.8 )O 3 layers investigated by transmission electron microscopy

Lattice reorientation in tetragonal PMN-PT thin film induced by focused ion beam preparation for transmission electron microscopy

Influence of electromechanical coupling on optical properties of InGaN quantum-dot based light-emitting diodes

Carrier transport and emission efficiency in InGaN quantum-dot based light-emitting diodes

Electron microscopy by specimen design: application to strain measurements

Differential phase-contrast dark-field electron holography for strain mapping

Quantitative 3D electromagnetic field determination of 1D nanostructures from single projection

Realization of a tilted reference wave for electron holography by means of a condenser biprism

Strain/composition interplay in thin SiGe layers on insulator processed by Ge condensation

Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip

Three Dimensional Visualization of Electromagnetic Fields from One Dimensional Nanostructures

Role of compositional fluctuations and their suppression on the strain and luminescence of InGaN alloys

Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing

Formation of three-dimensional islands in the active region of InGaN based light emitting diodes using a growth interruption approach

Investigation of the phase occurrence, H sorption properties, and electrochemical behavior in the composition ranges La0.75-0.80Mg0.30-0.38Ni3.67

Local strain measurements at dislocations, disclinations and domain boundaries

Off-Axial Aberration Correction using a B-COR for Lorentz and HREM Modes

Dynamic scattering theory for dark-field electron holography of 3D strain fields

Determining the work function of a carbon-cone cold-field emitter by in situ electron holography

Dynamical effects in strain measurements by dark-field electron holography

Mechanics of silicon nitride thin-film stressors on a transistor-like geometry

Determination of stress, strain, and elemental distribution within In(Ga)As quantum dots embedded in GaAs using advanced transmission electron microscopy

Strain in hydrogen-implanted si investigated using dark-field electron holography

Nanoscale concentration and strain distribution in pseudomorphic films Si1−xGex/Si processed by pulsed laser induced epitaxy

Application of the O-lattice theory for the reconstruction of the high-angle near 90? tilt Si(1 1 0)/(0 0 1) boundary created by wafer bonding

A new linear transfer theory and characterization method for image detectors. Part II: Experiment

Monolithic white LEDs: Approaches, technology, design

Effect of stimulated phase separation on properties of blue, green and monolithic white LEDs

New carbon cone nanotip for use in a highly coherent cold field emission electron microscope

Dark-field electron holography for the measurement of geometric phase

Single quantum well deep-green LEDs with buried InGaN/GaN short-period superlattice

Reconstruction of a high angle tilt (110)/(001) boundary in Si using O-lattice theory

Strain mapping in layers and devices by electron holography

InGaN/GaN short-period superlattices: synthesis, properties, applications

Active region based on graded-gap InGaN/GaN superlattices for high-power 440- to 470-nm light-emitting diodes

Visualising alloy fluctuations by spherical-aberration–corrected HRTEM

Dark-field electron holography for the mapping of strain in nanostructures: correcting artefacts and aberrations

The use of short-period InGaN/GaN superlattices in blue-region light-emitting diodes

Cyclic Deposition / Etch processes for the formation of Si raised sources and drains in advanced MOSFETs

Fabrication, structural and electrical properties of compressively strained Ge-on-insulator substrates.

Formation of composite InGaN/GaN/InAlN quantum dots

Strain mapping of tensiley strained silicon transistors with embedded Si1−yCy source and drain by dark-field holography

End of range defects in Ge

Effect of strain relaxation on active-region formation in InGaN/(Al)GaN heterostructures for green LEDs

On the influence of elastic strain on the accommodation of carbon atoms into substitutional sites in strained Si:C layers grown on Si substrates

Selective growth of tensily strained Si1−yCy films on patterned Si substrates

Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique

Lateral epitaxial growth of germanium on silicon oxide

Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography

Lateral growth of monocrystalline Ge on silicon oxide by ultrahigh vacuum chemical vapor deposition

Nanoscale holographic interferometry for strain measurements in electronic devices

Direct Mapping of Strain in a Strained Silicon Transistor by High-Resolution Electron Microscopy

Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF)

Single crystals of V amylose complexed with a-naphthol

HRTEM study of defects in twin boundaries of ultra fine grained copper

Experimental application of sum rules for electron energy loss magnetic chiral dichroism

Mapping stress and strain in nanostructures by high-resolution transmission electron microscopy

Stress and strain around grain-boundary dislocations measured by high-resolution electron microscopy

High-resolution electron holography for the study of composition and strain in thin film semiconductors

Quantitative local strain measurements in compressive strained Ge/tensile strained Si bi-layers grown on top of relaxed Si0.5Ge0.5 virtual substrates

Characterization of helium bubble size and faceting by electron holography

Quantitative strain and stress measurements in Ge/Si dual channels grown on a Si0.5Ge0.5 virtual substrate

Structure determination of clusters formed in ultra-low energy high-dose implanted silicon

Synthesis and microstructure of bulk nanocrystalline copper

Nanoscale measurement of stress and strain by quantitative high-resolution electron microscopy