Michel RAMONDA
Publications
Publications
Reducing defect density in the epitaxy of III-Vs on Silicon substratesICG2025, Jan 2025, LECCE, Italy |
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Revisiting the epitaxy of III-Vs on group-IV substratesThe 23rd International Conference on Molecular Beam Epitaxy (ICMBE 2024), Sep 2024, Matsue, Japan |
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The direct epitaxial growth of III-Vs on Silicon substrateJournées Nano, Micro et Optoélectronique (JNMO 2024), Oct 2024, Sete, France |
Reduction of threading dislocation density in GaSb layers grown on Si(001) by molecular beam epitaxy: misfit dislocation networksThe 23rd International Conference on Molecular Beam Epitaxy (ICMBE 2024), Sep 2024, Matsue, Japan |
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Direct epitaxy of lasers on Si: challenges and solutionsOSEPI : Epitaxie des oxydes et des semiconducteurs, May 2024, Fréjus, France |
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Interband cascade lasers on mismatched substrates emitting above 4 µmThe 23rd International Conference on Molecular Beam Epitaxy (ICMBE), Sep 2024, Matsue, Shimane, Japan |
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Distribution initiale de phase et enfouissement des domaines d'antiphase lors de la croissance III-Vs/Si (001)GdR MatÉpi, Jul 2023, Paris, France |
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Strain-relieving mechanism in III-V semiconductors epitaxially grown on Si: misfit dislocations networksOSEPI : Epitaxie des oxydes et des semiconducteurs 13-17 mai 2024, May 2024, Fréjus, France |
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Influence of the initial phase distribution on antiphase domains control and burying in MBE growth of III-Vs on "on-axis" SiEuropean Workshop on Molecular Beam Epitaxy (EuroMBE 2023), Apr 2023, Madrid, Spain |
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Molecular beam epitaxy of III-V semiconductors on group-IV substrates: Formation and burying of antiphase domainsThe International Conference on Molecular Beam Epitaxy (ICMBE 2022), Sep 2022, Sheffield, United Kingdom |
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Impact of fabrication process of polyethylene / boronnitride nanocomposite on morphology and dielectric properties2022 IEEE 4th International Conference on Dielectrics (ICD), Jul 2022, Palermo, Italy. pp.305-308, ⟨10.1109/ICD53806.2022.9863479⟩ |
Molecular beam epitaxy of III-V semiconductors on group-IV (001) substrates: Formation and burying of antiphase domains.22nd International Conference on Molecular-Beam Epitaxy (ICMBE 2022), Sep 2022, Sheffield, United Kingdom |
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Impact of the interphase dielectric properties on the electric field distribution in LDPE/BN nanocompositesIEEE 2022 International Conference on Dielectrics, Jul 2022, Palermo, Italy |
Anti-phase boundaries annihilation in the growth of GaSb on Silicon(001)21st International Conference on Molecular-Beam Epitaxy (IC-MBE 2021), Sep 2021, online, Mexico |
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On the Mapping of the Viscoelastic Properties of Polymer Blends by Multifrequency AFM8th Multifrequency AFM Conference, Oct 2020, Madrid, Spain |
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Conjugating immunolocalization and afm observations to determine if rhamnogalacturonan-i type pectins are responsible for the generation of maturation stress in poplar tension wood fibresXV Cell Wall Meeting, Jul 2019, Cambridge, United Kingdom |
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Nanodielectric model samples to assess the detectability of interphases with Electrostatic Force MicroscopyIEEE 2nd International Conference on Dielectrics - ICD 2018, Jul 2018, Budapest, Hungary |
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Caractérisation mécanique de la paroi cellulaire des fibres végétales par Microscopie à Force Atomique23ème Congrès Français de Mécanique, Aug 2017, Lille, France |
Détection de couches diélectriques de nanoparticules de forme core-shell par microscopie à force électrostatiqueForum des microscopies à sonde locale, Mar 2017, Juvignac, France |
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Utilisation de la microscopie à force atomique pour l'étude de la biomécanique des parois secondairesRéunion de lancement du GDR PHYP, Jun 2017, Marseille, France |
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Quantification of the Effect of Surface Slope on Mechanical Measurements by Contact-Resonance AFMForum des Microscopies à Sonde Locale, Mar 2017, Juvignac, France |
Mesures physiques et mécaniques des propriétés de la paroi pendant la maturation11es Journées du Réseau Français des Parois : Workshop StressInTrees, Jun 2017, Orléans, France |
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Mechanical characterization of developing tension wood fibre wall by atomic force microscopy8th Plant Biomechanics International Conference , Nov 2015, Nagoya, Japan |
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Spectroscopie diélectrique par Microscopie à force électrostatique : application à l’étude de la dynamique des polymères nanostructurésForum des microscopies à sondes locales, Mar 2011, Ecully, France |
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High ionizing dose effects on ultra thin SiO<inf>2</inf>/Si structures revealed by Conductive Atomic Force Microscopy2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2011, Sevilla, France. ⟨10.1109/RADECS.2011.6131383⟩ |
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Determination of the Nanoscale dielectric permittivity by means of a double pass method using EFMinanoGUNE ETORTEK 1st Workshop, May 2009, San Sebastian, Spain |
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Microplasticity in mixed alkali phosphate glasses2009 Workshop on Topology, Structure and Dynamics in Non-Crystalline Solids, Sep 2009, PARIS, France |
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Quantitative determination of the local dielectric permittivity of ultrathin films at Nanoscale by means of Electrostatic Force MicroscopyXI International Scanning Probe Microscopy Conference, Jun 2009, Madrid, Spain |
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Structural and morphological studies of CuIn(1-x)AlxS2 deposited by spray on various substratesSymposium on Inorganic and Nanostructured Photovoltaics, E-MRS 2009, 2009, Strasbourg, France |
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Study of Latent Defects Induced by Swift Heavy Ion Irradiation on MOS Devices Gate Oxide45th IEEE Nuclear Space and Radiation Effects Conference, 2008, Tucson, United States |
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Point mass modelling of AFM cantilever vibrating on higher flexural modes and comparison with experimentsInternational Conference on Nanoscience +Technology (ICN+T 2008), Jul 2008, Keystone, United States |
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Recent advances in Amplitude-Controlled AFM under vacuum1st Multifrequency AFM Conference, Sep 2008, Madrid, Spain |
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Single swift heavy ion-induced trail of discontinuous nanostructures on SiO2 surface under grazing incidenceICSI-5, 2007, Marseille, France |
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Electrostatic force gradient microscopy under vacuumScanning Probe Microscopy, Sensors and Nanostructures, Jun 2006, Montpellier, France |
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Interests of High Flexure Modes for Vacuum AFMConference on Nanoscience and Technology ICN&T 2006, Jul 2006, Bâle, Switzerland |
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Effect of SiN treatment on GaN epilayer quality8th International Conference on Optics of Excitons in Confined Systems, Sep 2003, Lecce (ITALY), France. pp.502-508 |
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Etude du comportement viscoélastique du bois de l'échelle cellulaire à l'échelle macroscopiqueJournées du Programme Matériaux du CNRS, 2004, Toulouse, France |
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Mise en évidence des propriétés élastiques de la paroi cellulaire du bois par microscopie à force atomiqueForum des microscopies à sondes locales, Mar 2001, La Baume-les-Aix, France |
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Mechanical characterisation of the developing cell wall layers of tension wood fibres by Atomic Force Microscopy2022 |
Measuring dielectric properties at the nanoscale using Electrostatic Force MicroscopyMicroscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; n° 4). A. Méndez-Vilas and J. Díaz (Eds.) p 1963-1977, 2010, 978-84-614-6191-2 |
HIGHER HARMONICS ATOMIC FORCE MICROSCOPEFrance, N° de brevet: WO/2006/136705. 2006 |