|
Dead-reckoning for marine animals: trade-offs between estimation accuracy and power consumption
Pierre Gogendeau
,
Sylvain Bonhommeau
,
Hassen Fourati
,
Michel Renovell
,
Fabien Soulier
et al.
BLS7 2021 - 7th International Bio-Logging Science Symposium, Oct 2021, Honolulu, United States
Communication dans un congrès
hal-03392214
v1
|
|
Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies
Amit Karel
,
Florence Azaïs
,
Mariane Comte
,
Jean-Marc J.-M. Galliere
,
Michel Renovell
Communication dans un congrès
lirmm-02064921
v1
|
|
Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions
Amit Karel
,
Florence Azaïs
,
Mariane Comte
,
Jean-Marc J.-M. Galliere
,
Michel Renovell
et al.
Communication dans un congrès
hal-01709615
v1
|
|
Analysis of short defects in FinFET based logic cells
Freddy Forero
,
Jean-Marc J.-M. Galliere
,
Michel Renovell
,
Víctor H. Champac
Communication dans un congrès
hal-01709620
v1
|
|
Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology
Amit Karel
,
Florence Azaïs
,
Mariane Comte
,
Jean-Marc J.-M. Galliere
,
Michel Renovell
et al.
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.320-325, ⟨10.1109/ISVLSI.2017.63⟩
Communication dans un congrès
hal-01709614
v1
|
|
Mitigating Read & Write Errors in STT-MRAM Memories under DVS
Elena Ioana Vatajelu
,
Rosa Rodríguez-Montañés
,
Michel Renovell
,
Joan Figueras
Communication dans un congrès
hal-01525720
v1
|
|
Mixed-level simulation tool for design optimization of electrical impedance spectroscopy systems
Achraf Lamlih
,
Vincent Kerzérho
,
Serge Bernard
,
Fabien Soulier
,
Mariane Comte
et al.
IWIS: International Workshop on Impedance Spectroscopy, Sep 2016, Chemnitz, Germany
Communication dans un congrès
lirmm-01457544
v1
|
|
Behavior and test of open-gate defects in FinFET based cells
Francisco Mesalles
,
Hector Villacorta
,
Michel Renovell
,
Víctor H. Champac
Communication dans un congrès
lirmm-01923016
v1
|
|
Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect
Amit Karel
,
Mariane Comte
,
Jean-Marc J.-M. Galliere
,
Florence Azaïs
,
Michel Renovell
Communication dans un congrès
lirmm-01374300
v1
|
|
Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurations
Amit Karel
,
Mariane Comte
,
Jean-Marc J.-M. Galliere
,
Florence Azaïs
,
Michel Renovell
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, PA, United States. pp.164-169, ⟨10.1109/ISVLSI.2016.102⟩
Communication dans un congrès
lirmm-01374292
v1
|
|
Power-aware voltage tuning for STT-MRAM reliability
Elena Ioana Vatajelu
,
Rosa Rodríguez-Montañés
,
Stefano Di Carlo
,
Marco Indaco
,
Michel Renovell
et al.
Communication dans un congrès
lirmm-01922971
v1
|
|
A framework for efficient implementation of analog/RF alternate test with model redundancy
Syhem Larguech
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
et al.
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.621-626, ⟨10.1109/ISVLSI.2015.30⟩
Communication dans un congrès
lirmm-01233104
v1
|
|
A generic methodology for building efficient prediction models in the context of alternate testing
Syhem Larguech
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
et al.
Communication dans un congrès
lirmm-01233150
v1
|
|
Toward adaptation of ADCs to operating conditions through on-chip correction
Vincent Kerzérho
,
Ludovic Guillaume-Sage
,
Florence Azaïs
,
Mariane Comte
,
Michel Renovell
et al.
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.634-639, ⟨10.1109/ISVLSI.2015.62⟩
Communication dans un congrès
lirmm-01233117
v1
|
|
Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter module
Mouhamadou Dieng
,
Florence Azaïs
,
Mariane Comte
,
Serge Bernard
,
Vincent Kerzérho
et al.
Communication dans un congrès
lirmm-01119365
v1
|
|
Solutions for the self-adaptation of communicating systems in operation
Martin Andraud
,
Anthony Deluthault
,
Mouhamadou Dieng
,
Florence Azaïs
,
Serge Bernard
et al.
Communication dans un congrès
hal-01118068
v1
|
|
New implementions of predictive alternate analog/RF test with augmented model redundancy
Haithem Ayari
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
et al.
DATE 2014 - 17th Design, Automation and Test in Europe Conference and Exhibition, Mar 2014, Dresden, Germany. ⟨10.7873/DATE2014.144⟩
Communication dans un congrès
lirmm-00994714
v1
|
|
Self-Adaptive NFC Systems
Vincent Kerzérho
,
Florence Azaïs
,
Mouhamadou Dieng
,
Mariane Comte
,
Serge Bernard
et al.
IOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain
Communication dans un congrès
lirmm-01084355
v1
|
|
Investigations on alternate analog/RF test with model redundancy
Haithem Ayari
,
Florence Azaïs
,
Serge Bernard
,
Vincent Kerzérho
,
Syhem Larguech
et al.
STEM Workshop, May 2014, Paderborn, Germany
Communication dans un congrès
lirmm-01119374
v1
|
|
Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing
Syhem Larguech
,
Florence Azaïs
,
Serge Bernard
,
Vincent Kerzérho
,
Mariane Comte
et al.
Communication dans un congrès
lirmm-01119361
v1
|
|
MIRID: Mixed-Mode IR-Drop Induced Delay Simulator
Jie Jiang
,
Marina Aparicio Rodriguez
,
Mariane Comte
,
Florence Azaïs
,
Michel Renovell
et al.
Communication dans un congrès
lirmm-00932357
v1
|
|
Accurate and Efficient Analytical Electrical Model of Antenna for NFC Applications
Mouhamadou Dieng
,
Mariane Comte
,
Serge Bernard
,
Vincent Kerzérho
,
Florence Azaïs
et al.
Communication dans un congrès
lirmm-00839190
v1
|
|
A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing
Syhem Larguech
,
Florence Azaïs
,
Serge Bernard
,
Vincent Kerzérho
,
Mariane Comte
et al.
3rd IEEE International Workshop on Test and Validation of High Speed Analog Circuits, Sep 2013, Anaheim, CA, United States
Communication dans un congrès
lirmm-00985422
v1
|
|
Pre-characterization Procedure for a Mixed Mode Simulation of IR-Drop Induced Delays
Marina Aparicio Rodriguez
,
Mariane Comte
,
Florence Azaïs
,
Michel Renovell
,
Jie Jiang
et al.
Communication dans un congrès
lirmm-00820067
v1
|
|
An IR-Drop Simulation Principle Oriented to Delay Testing
Marina Aparicio Rodriguez
,
Mariane Comte
,
Florence Azaïs
,
Yves Bertrand
,
Michel Renovell
et al.
DCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.404-409
Communication dans un congrès
lirmm-00804254
v1
|
|
Smart selection of indirect parameters for DC-based alternate RF IC testing
Haithem Ayari
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Michel Renovell
et al.
Communication dans un congrès
lirmm-00803453
v1
|
|
Making predictive analog/RF alternate test strategy independent of training set size
Haithem Ayari
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
et al.
Communication dans un congrès
lirmm-00803564
v1
|
|
On the use of redundancy to reduce prediction error in alternate analog/RF test
Haithem Ayari
,
Florence Azaïs
,
Serge Bernard
,
Mariane Comte
,
Vincent Kerzérho
et al.
IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, May 2012, Taipei, Taiwan. pp.34-39, ⟨10.1109/IMS3TW.2012.17⟩
Communication dans un congrès
lirmm-00803556
v1
|
|
ANC-Based Method for Testing Converters with Random-Phase Harmonics
Vincent Kerzérho
,
Florence Azaïs
,
Mariane Comte
,
Philippe Cauvet
,
Serge Bernard
et al.
IMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès
lirmm-00494578
v1
|
|
Adaptive LUT-Based System for In Situ ADC Auto-correction
Serge Bernard
,
Florence Azaïs
,
Mariane Comte
,
Olivier Potin
,
Vincent Kerzérho
et al.
IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès
lirmm-00494424
v1
|
|
LH-BIST for Digital Correction of ADC Offset
Serge Bernard
,
Florence Azaïs
,
Mariane Comte
,
Yves Bertrand
,
Michel Renovell
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.199-203
Communication dans un congrès
lirmm-00375659
v1
|
|
Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split Models
Jean-Marc J.-M. Galliere
,
Florence Azaïs
,
Michel Renovell
,
Luigi Dilillo
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229
Communication dans un congrès
lirmm-00370798
v1
|
|
An Analysis of the Timing Behavior of CMOS Digital Blocks under Simultaneous Switching Noise Conditions
Florence Azaïs
,
Yves Bertrand
,
Michel Renovell
DDECS'09: IEEE Design and Diagnostics of Electronic Circuits and Systems, Apr 2009, Liberec, Czech Republic. pp.158-163
Communication dans un congrès
lirmm-00386906
v1
|
|
Deriving an Electrical Model for Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects
Nicolas Houarche
,
Alejandro Czutro
,
Mariane Comte
,
Piet Engelke
,
Ilia Polian
et al.
LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A
Communication dans un congrès
lirmm-00367708
v1
|
|
An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects
Nicolas Houarche
,
Mariane Comte
,
Michel Renovell
,
Alejandro Czutro
,
Piet Engelke
et al.
VTS'09: 27th VLSI Test Symposium, May 2009, Santa Cruz, Californie, United States. pp.21-26, ⟨10.1109/VTS.2009.57⟩
Communication dans un congrès
lirmm-00374941
v1
|
|
Analyzing the Impact of Simultaneous Switching Noise on the Timing Behavior of CMOS Digital Blocks
Florence Azaïs
,
Yves Bertrand
,
Michel Renovell
LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A
Communication dans un congrès
lirmm-00367718
v1
|
|
A Multi-Converter DFT Technique for Complex SIP: Concepts and Validation
Vincent Kerzérho
,
Philippe Cauvet
,
Serge Bernard
,
Florence Azaïs
,
Mariane Comte
et al.
ECCTD: European Conference on Circuit Theory and Design, Aug 2009, Antalya, Turkey. pp.747-750
Communication dans un congrès
lirmm-00448863
v1
|
|
A Model for Resistive Open Recursivity in CMOS Random Logic
Michel Renovell
,
Mariane Comte
,
Nicolas Houarche
,
Ilia Polian
,
Piet Engelke
et al.
EWDTS: East-West Design & Test Symposium, Oct 2008, Lviv, Ukraine. pp.21-24
Communication dans un congrès
lirmm-00381465
v1
|
|
On-Chip Monitor for the Detection of Logic Errors due to Simultaneous Switching Noise
Florence Azaïs
,
Laurent Larguier
,
Yves Bertrand
,
Michel Renovell
LATW'08: 9th Latin-American Test Workshop, Puebla, Mexico, pp.11-16
Communication dans un congrès
lirmm-00260194
v1
|
|
On the Detection of SSN-Induced Logic Errors Through On-Chip Monitoring
Florence Azaïs
,
Laurent Larguier
,
Yves Bertrand
,
Michel Renovell
Communication dans un congrès
lirmm-00294767
v1
|
|
A Simulator of Small-Delay Faults Caused by Resistive-Open Defects
Alejandro Czutro
,
Nicolas Houarche
,
Piet Engelke
,
Ilia Polian
,
Mariane Comte
et al.
ETS: European Test Symposium, May 2008, Verbania, Italy. pp.113-118
Communication dans un congrès
lirmm-00285886
v1
|
|
System-in-Package, a Combination of Challenges and Solutions
Philippe Cauvet
,
Serge Bernard
,
Michel Renovell
ETS: European Test Symposium, May 2007, Freiburg, Germany. pp.193-199
Communication dans un congrès
lirmm-00158123
v1
|
|
Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC
Vincent Kerzérho
,
Philippe Cauvet
,
Serge Bernard
,
Florence Azaïs
,
Mariane Comte
et al.
Communication dans un congrès
lirmm-00158527
v1
|
|
SUPERB: Simulator Utilizing Parallel Evaluation of Resistive Bridges
Piet Engelke
,
Bettina Braitling
,
Ilia Polian
,
Michel Renovell
,
Bernd Becker
ATS: Asian Test Symposium, Oct 2007, Beijing, China. pp.433-438
Communication dans un congrès
lirmm-00179272
v1
|
|
Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave Generators
Vincent Kerzérho
,
Philippe Cauvet
,
Serge Bernard
,
Florence Azaïs
,
Michel Renovell
et al.
IMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, Povoa de Varzim, Portugal. pp.196-201
Communication dans un congrès
lirmm-00161708
v1
|
|
Accessibility to Embedded A/MS Cores: An Oscillation-Based S-R DFT
Rahebeh Niaraki Asli
,
Zainalabedin Navabi
,
Sattar Mirzakuchaki
,
Michel Renovell
ETS: European Test Symposium, May 2007, Freiburg, Germany. pp.77-81
Communication dans un congrès
lirmm-00158961
v1
|
|
Impact of Simultaneous Switching Noise on the Static Behavior of Digital CMOS Circuits
Florence Azaïs
,
Laurent Larguier
,
Michel Renovell
ATS: Asian Test Symposium, Oct 2007, Beijing, China. pp.239-244
Communication dans un congrès
lirmm-00179262
v1
|
|
Analyzing the Logic Behavior of Digital CMOS Circuits in Presence of Simultaneous Switching Noise
Florence Azaïs
,
Laurent Larguier
,
Michel Renovell
LATW: Latin American Test Workshop, Mar 2007, Cuzco, Peru
Communication dans un congrès
lirmm-00199261
v1
|
|
Analysing the Memory Effect of Resistive Open in CMOS Random Logic
Michel Renovell
,
Mariane Comte
,
Ilia Polian
,
Piet Engelke
,
Bernd Becker
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2006, Tunis, Tunisia. pp.251-256
Communication dans un congrès
lirmm-00093383
v1
|
|
Experimental Validation of the "Analogue Network of Converters" Technique to Test Complex SiP/SoC
Serge Bernard
,
Florence Azaïs
,
Philippe Cauvet
,
Mariane Comte
,
Vincent Kerzérho
et al.
IEEE International Mixed-Signal Testing Workshop, Jun 2006, Paris, France. pp.84-88
Communication dans un congrès
lirmm-00119266
v1
|
|
State of the art in soc testing: The analog challenge
Serge Bernard
,
Michel Renovell
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2006, Tunis, Tunisia
Communication dans un congrès
lirmm-00407019
v1
|
|
Electrical Behavior of GOS Fault Affected Domino Logic Cell
Mariane Comte
,
Satoshi Ohtake
,
Hideo Fujiwara
,
Michel Renovell
DELTA'06: IEEE International Workshop on Electronics DesignTest & Applications, Jan 2006, Kuala Lumpur, Malaysia, pp.183-189
Communication dans un congrès
lirmm-00102703
v1
|
|
“Analogue Network of Converters”: A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC
Florence Azaïs
,
Serge Bernard
,
Philippe Cauvet
,
Mariane Comte
,
Vincent Kerzérho
et al.
ETS: European Test Symposium, May 2006, Southampton, United Kingdom. pp.159-164
Communication dans un congrès
lirmm-00115676
v1
|
|
Delta-Iddq Testing of Resistive Short Defects
Piet Engelke
,
Ilia Polian
,
Hans Manhaeve
,
Michel Renovell
,
Bernd Becker
ATS: Asian Test Symposium, Nov 2006, Fukuoka, Japan. pp.63-68
Communication dans un congrès
lirmm-00117020
v1
|
|
A Specific ATPG Technique for Resistive Open with Sequence Recursive Dependency
Michel Renovell
,
Mariane Comte
,
Ilia Polian
,
Piet Engelke
,
Bernd Becker
Communication dans un congrès
lirmm-00117022
v1
|
|
Testing for Realistic Spot Defects in CMOS Technology: a Unified View
Michel Renovell
EWDTW: East-West Design & Test Workshop, Sep 2006, Sochi, Russia
Communication dans un congrès
lirmm-00096254
v1
|
|
Electrical Analysis of a Domino Logic Cell with GOS Faults
Mariane Comte
,
Satoshi Ohtake
,
Hideo Fujiwara
,
Michel Renovell
DBT'05: International Workshop on Current & Defect Based Testing, May 2005, Palm Springs, CA, United States
Communication dans un congrès
lirmm-00374937
v1
|
|
Fast and Fully-Efficient Test Flow for ADCs
Serge Bernard
,
Mariane Comte
,
Florence Azaïs
,
Yves Bertrand
,
Michel Renovell
IMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.244-249
Communication dans un congrès
lirmm-00106523
v1
|
|
Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron Technologies
I. Polian
,
Kundu Sandip
,
Jean-Marc J.-M. Galliere
,
P. Engelke
,
Michel Renovell
et al.
VTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.343-348
Communication dans un congrès
lirmm-00105997
v1
|
|
Analysis and Attenuation Proposal in Ground Bounce: II
Antonio Zenteno
,
Víctor H. Champac
,
Michel Renovell
,
Florence Azaïs
LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.34-39
Communication dans un congrès
lirmm-00106514
v1
|
|
Electrical Behavior of GOS Faults in Domino Logic
Mariane Comte
,
Satoshi Ohtake
,
Hideo Fujiwara
,
Michel Renovell
DDECS'05: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2005, Sopron, Hungary, pp.210-215
Communication dans un congrès
lirmm-00105991
v1
|
|
Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays
Gustavo Pereira
,
Antonio Andrade Jr.
,
Tiago R. Balen
,
Marcelo Lubaszewski
,
Florence Azaïs
et al.
Communication dans un congrès
lirmm-00105998
v1
|
|
The Transient Reponse Analysis Method Applied to the Test of Field Programmable Analog Arrays: Feasibility Study
Tiago R. Balen
,
Tiago A. Jost
,
Jose Vicente Calvano
,
Marcelo Lubaszewski
,
Michel Renovell
LATW: Latin American Test Workshop, Mar 2005, Salvador, Brazil. pp.252-257
Communication dans un congrès
lirmm-00106518
v1
|
|
A Set of Test Configurations for the Global Routing of Hierarchical SRAM-Based FPGA
Michel Renovell
,
Sébastien Tanguy
IBERCHIP, 2005, Salvador da Bahía, Brazil. pp.277-280
Communication dans un congrès
lirmm-00106512
v1
|
|
Modeling Halo Implant Failures in MOS Sub-Micron Technology
Arnaud Regnier
,
Jean-Michel Portal
,
Rachid Bouchakour
,
Michel Renovell
LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.29-33
Communication dans un congrès
lirmm-00106513
v1
|
|
The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults
P. Engelke
,
I. Polian
,
Michel Renovell
,
B. Seshadri
,
P. Becker
VTS'04: 22nd IEEE VLSI Test Symposium, Apr 2004, Napa Valley, CA (USA), pp.171-178
Communication dans un congrès
lirmm-00108845
v1
|
|
Digital and Analog System Testing: Fundamentals and New Challenges
Michel Renovell
Communication dans un congrès
lirmm-00108936
v1
|
|
A Multi-Configuration Strategy for an Application Dependant Testing of FPGAs
Mehdi B. Tahoori
,
Edward J. Mccluskey
,
Michel Renovell
,
Philippe Faure
Communication dans un congrès
lirmm-00108844
v1
|
|
Manufacturing-Oriented Testing of Delay Faults in the Logic Architecture of Symmetrical FPGAs
Patrick Girard
,
Olivier Héron
,
Serge Pravossoudovitch
,
Michel Renovell
ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.117-122
Communication dans un congrès
lirmm-00108905
v1
|
|
High Quality TPG for Delay Faults in Look-Up Tables of FPGAs
Patrick Girard
,
Olivier Héron
,
Serge Pravossoudovitch
,
Michel Renovell
DELTA'04: 2nd International Workshop on Electronic DesignTest and Applications, Jan 2004, Perth (Australia), pp.83-88
Communication dans un congrès
lirmm-00108830
v1
|
|
Testing Global Interconnects of Field Programmable Analog Arrays
Antonio Andrade Jr
,
Gustavo Vieira
,
Tiago R. Balen
,
Marcelo Lubaszewski
,
Florence Azaïs
et al.
IMSTW'04: 10th International Mixed-Signal Testing Workshop, Jun 2004, Portland, Oregon, United States
Communication dans un congrès
lirmm-00108657
v1
|
|
Fundamentals of System Testing: Challenges for System-On-Chips
Michel Renovell
ICM'04: 16th International Conference on Microelectronics, Dec 2004, P., France. pp.176-180
Communication dans un congrès
lirmm-00109135
v1
|
|
Analysis and Attenuation Proposal in Ground Bounce
Antonio Zenteno
,
Víctor H. Champac
,
Michel Renovell
,
Florence Azaïs
Communication dans un congrès
lirmm-00108931
v1
|
|
Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror
S. Bernardini
,
P. Masson
,
Jean-Michel Portal
,
Jean-Marc J.-M. Galliere
,
Michel Renovell
LATW: Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.12-17
Communication dans un congrès
lirmm-00108659
v1
|
|
Principe et Problèmatique pour le Test des System-0n-Chip
Michel Renovell
SCS'04: SignauxCircuits et Systèmes, Mar 2004, Monastir (Tunisie), pp.1-3
Communication dans un congrès
lirmm-00108842
v1
|
|
Realistic Fault Models for Defects in Electronic Circuits
Michel Renovell
BEC'04: International Baltic Electronic Conference, Oct 2004, pp.33-37
Communication dans un congrès
lirmm-00109134
v1
|
|
Automatic Test Pattern Generation for Resistive Bridging Faults
Piet Engelke
,
I. Polian
,
Michel Renovell
,
P. Becker
ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.160-165
Communication dans un congrès
lirmm-00108902
v1
|
|
Scan design and secure chip [secure IC testing]
David Hely
,
Marie-Lise Flottes
,
Frédéric Bancel
,
Bruno Rouzeyre
,
Nicolas Berard
et al.
Communication dans un congrès
lirmm-00108909
v1
|
|
Automatic Test Pattern Generation for Resistive Bridging Faults
P. Engelke
,
I. Polian
,
Michel Renovell
,
P. Becker
IEEE International Workshop on Current and Defect-Based Testing, May 2004, Napa Valley, CA, pp.89-94
Communication dans un congrès
lirmm-00108661
v1
|
|
An Approach to the Built-in-Self of Field Programmable Analog Arrays
Tiago R. Balen
,
Antonio Andrade Jr.
,
Florence Azaïs
,
Marcelo Lubaszewski
,
Michel Renovell
VTS: VLSI Test Symposium, Apr 2004, Napa Valley, CA, United States. pp.383-388
Communication dans un congrès
lirmm-00108908
v1
|
|
Testing the Configurable Analog Blocks of Field Programmable Analog Arrays
Tiago R. Balen
,
Antonio Andrade Jr.
,
Florence Azaïs
,
Marcelo Lubaszewski
,
Michel Renovell
ITC: International Test Conference, Oct 2004, Charlotte, United States. pp.893-902
Communication dans un congrès
lirmm-00108897
v1
|
|
The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults
P. Engelke
,
I. Polian
,
Michel Renovell
,
B. Seshadri
,
P. Becker
GI/ITG Workshop Testmethoden und Zuverlassigkeit von Schaltungen und Systemen, Feb 2004, Dresden, Germany. pp.149-153
Communication dans un congrès
lirmm-00108660
v1
|
|
BIST of Delay Faults in the Logic Architecture of Symmetrical FPGAs
Patrick Girard
,
Olivier Héron
,
Serge Pravossoudovitch
,
Michel Renovell
Communication dans un congrès
lirmm-00108824
v1
|
|
Hard to Detect Bridging Defects in a Cross-Point Digital Switch
M. Zottino
,
Alfredo Benso
,
Michel Renovell
,
Yves Bertrand
,
Luz Maria Balado Suarez
et al.
LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.12-18
Communication dans un congrès
lirmm-00269496
v1
|
|
Conditions pour le Test de Pannes de Délai des Look-Up Table dans les FPGA à Base de SRAM
Patrick Girard
,
Olivier Héron
,
Serge Pravossoudovitch
,
Michel Renovell
JNRDM: Journées Nationales du Réseau Doctoral de Microélectronique, May 2003, Toulouse, France. pp.381-383
Communication dans un congrès
lirmm-00269544
v1
|
|
Defect Analysis for Delay-Fault BIST in FPGAs
Patrick Girard
,
Olivier Héron
,
Serge Pravossoudovitch
,
Michel Renovell
Communication dans un congrès
lirmm-00269553
v1
|
|
Timing Defect Analysis in Look-Up Tables of SRAM-Based FPGAs
Patrick Girard
,
Olivier Héron
,
Serge Pravossoudovitch
,
Michel Renovell
LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.26-31
Communication dans un congrès
lirmm-00269497
v1
|
|
Simulating Resistive Bridging and Stuck-At Faults
Piet Engelke
,
Ilia Polian
,
Michel Renovell
,
Bernd Becker
Communication dans un congrès
lirmm-00269611
v1
|
|
Automatic Generation of LH-BIST Architecture for ADC Testing
Serge Bernard
,
Florence Azaïs
,
Mariane Comte
,
Yves Bertrand
,
Michel Renovell
IWADC'03: IEEE International Workshop on ADC Modelling and Testing, Sep 2003, Perugia, Italy. pp.7-12
Communication dans un congrès
lirmm-00269683
v1
|
|
An Automatic Tool for Generation of ADC BIST Architecture
Serge Bernard
,
Florence Azaïs
,
Mariane Comte
,
Yves Bertrand
,
Michel Renovell
IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.79-84
Communication dans un congrès
lirmm-00269580
v1
|
|
Analysis of the Specification Influence on the Efficiency of an Optimized Test Flow for ADCs
Mariane Comte
,
Florence Azaïs
,
Serge Bernard
,
Yves Bertrand
,
Michel Renovell
IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.185-190
Communication dans un congrès
lirmm-00269583
v1
|
|
Delay Testing of MOS Transistor with Gate Oxide Short
Michel Renovell
,
Jean-Marc J.-M. Galliere
,
Florence Azaïs
,
Yves Bertrand
ATS: Asian Test Symposium, Nov 2003, Xian, China. pp.168-173
Communication dans un congrès
lirmm-00269641
v1
|
|
OBIST Applied to FPAAs: A Case Study
Michel Renovell
,
Tiago R. Balen
,
M. Schreiber
,
Florence Azaïs
,
Marcelo Lubaszewski
LATW 2003 - 4th IEEE Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.238-243
Communication dans un congrès
lirmm-00269501
v1
|
|
Structural Testing of Modern Reconfigurable Chips
Michel Renovell
EWDTC 2003 - East-West Design & Test Conference, Sep 2003, Moscou, Russia. pp.5-9
Communication dans un congrès
lirmm-00269648
v1
|
|
Testing Challenges for Modern FPGAs
Michel Renovell
ECS: Electronic Circuits and Systems, Sep 2003, Bratislava, Slovenia. pp.1-9
Communication dans un congrès
lirmm-00269565
v1
|
|
On the Synthesis of Analog Cascaded Filters with Optimal Test Point Insertion
Florence Azaïs
,
Marcelo Lubaszewski
,
Pascal Nouet
,
Michel Renovell
LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.212-216
Communication dans un congrès
lirmm-00269499
v1
|
|
GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model
Michel Renovell
,
Jean-Marc J.-M. Galliere
,
Florence Azaïs
,
Yves Bertrand
,
Jean-Michel Portal
et al.
LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil
Communication dans un congrès
lirmm-00269604
v1
|
|
Requirements for Delay Testing of Look-Up Tables in SRAM-Based FPGAs
Patrick Girard
,
Olivier Héron
,
Serge Pravossoudovitch
,
Michel Renovell
ETW: European Test Workshop, May 2003, Maastricht, Netherlands. pp.147-152
Communication dans un congrès
lirmm-00269530
v1
|
|
A New Methodology for ADC Test Flow Optimization
Serge Bernard
,
Mariane Comte
,
Florence Azaïs
,
Yves Bertrand
,
Michel Renovell
Communication dans un congrès
lirmm-00269527
v1
|
|
On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static Errors
Mariane Comte
,
Florence Azaïs
,
Serge Bernard
,
Yves Bertrand
,
Michel Renovell
LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.198-203
Communication dans un congrès
lirmm-00269498
v1
|
|
A high accuracy triangle-wave signal generator for on-chip ADC testing
Serge Bernard
,
Florence Azaïs
,
Yves Bertrand
,
Michel Renovell
Communication dans un congrès
lirmm-00268483
v1
|
|
Non-Linear and Non-Split Transistor MOS Model for Gate Oxyde Short
Michel Renovell
,
Jean-Marc J.-M. Galliere
,
Florence Azaïs
,
Yves Bertrand
DBT: Defect Based Testing, Apr 2002, Monterey, CA, United States. pp.11-16
Communication dans un congrès
lirmm-00269333
v1
|
|
Low Voltage Testing of Gate Oxide Short in CMOS Technology
Michel Renovell
,
Jean-Marc J.-M. Galliere
,
Florence Azaïs
,
Yves Bertrand
DDECS: Design and Diagnostics of Electronic Circuits and Systems, 2002, Brno, Czech Republic. pp.168-174
Communication dans un congrès
lirmm-00268526
v1
|
|
A Non-Split Model for Realistic Gate Oxide Short in CMOS Technology
Michel Renovell
,
Jean-Marc J.-M. Galliere
,
Florence Azaïs
,
Yves Bertrand
DCIS: Design of Circuits and Integrated Systems, 2002, Santander, Spain. pp.197-204
Communication dans un congrès
lirmm-00268432
v1
|
|
On the Evaluation of ADC Static Parameters Through Dynamic Testing
Mariane Comte
,
Florence Azaïs
,
Serge Bernard
,
Yves Bertrand
,
Michel Renovell
ADDA & EWADC, Jun 2002, Prague, Czech Republic. pp.95-98
Communication dans un congrès
lirmm-00269338
v1
|
|
Testing the Unidimensionnal Interconnect Architecture of Symmetrical SRAM-based FPGA
Michel Renovell
,
Philippe Faure
,
Paolo Prinetto
,
Yervant Zorian
Communication dans un congrès
lirmm-00268528
v1
|
|
Implementation of an Experimental IEEE 1149.4 Mixed-Signal Test Chip
Uroš Kač
,
Franc Novak
,
Florence Azaïs
,
Pascal Nouet
,
Michel Renovell
BTW 2002 - 1st IEEE International Board Test Workshop, Oct 2002, Baltimore, United States. paper 4.2
Communication dans un congrès
lirmm-00269342
v1
|
|
Experimental test infrastructure supporting IEEE 11494 Standard
Uroš Kač
,
Franc Novak
,
Jozef Stefan
,
Florence Azaïs
,
Pascal Nouet
et al.
ETW: European Test Workshop, 2002, Corfou, Greece
Communication dans un congrès
lirmm-00268606
v1
|
|
Pannes Temporelles dans les FPGA
Patrick Girard
,
Olivier Héron
,
Serge Pravossoudovitch
,
Michel Renovell
Colloque du GDR CAO de Circuits et Systèmes Intégrés, May 2002, Paris, France. pp.43-46
Communication dans un congrès
lirmm-00269327
v1
|
|
Estimating Static Parameters of A-to-D Converters from Spectral Analysis
Florence Azaïs
,
Serge Bernard
,
Yves Bertrand
,
Mariane Comte
,
Michel Renovell
et al.
LATW: Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.174-179
Communication dans un congrès
lirmm-00269320
v1
|
|
A New FPGA for DSP Applications Integrating BIST Capabilities
Alex Gonsales
,
Marcelo Lubaszewski
,
Luigi Carro
,
Michel Renovell
LATW'02: 3rd IEEE Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.76-81
Communication dans un congrès
lirmm-00269328
v1
|
|
Mesure des Paramètres Statiques des Convertisseurs A/N par une Analyse Spectrale
Mariane Comte
,
Florence Azaïs
,
Serge Bernard
,
Yves Bertrand
,
Michel Renovell
Colloque du GDR CAO de Circuits et Systèmes Intégrés, May 2002, Paris, France. pp.47-50
Communication dans un congrès
lirmm-00269325
v1
|
|
Designing Testable Analog Filters with Optimal DFT Insertion
Florence Azaïs
,
Yves Bertrand
,
Jose Vicente Calvano
,
Marcelo Lubaszewski
,
Pascal Nouet
et al.
IMSTW: International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.201-203
Communication dans un congrès
lirmm-00269341
v1
|
|
Evaluation of ADC Static Parameters via Frequency Domain
Florence Azaïs
,
Serge Bernard
,
Yves Bertrand
,
Mariane Comte
,
Michel Renovell
IMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.165-169
Communication dans un congrès
lirmm-00269347
v1
|
|
Modeling Gate Oxide Short Defects in CMOS Minimum Transistors
Michel Renovell
,
Jean-Marc J.-M. Galliere
,
Florence Azaïs
,
Yves Bertrand
ETW: European Test Workshop, 2002, Corfu, Greece. pp.15-20
Communication dans un congrès
lirmm-00268527
v1
|
|
Boolean and Current Detection of MOS Transistor with Gate Oxide Short
Michel Renovell
,
Jean-Marc J.-M. Galliere
,
Florence Azaïs
,
Yves Bertrand
IEEE International Test Conference, Oct 2001, Baltimore, USA, pp.10
Communication dans un congrès
lirmm-00370400
v1
|
|
A multi-mode stimuli generator for analogue and mixed-signal built-in-self-test
Marcelo Lubaszewski
,
Michel Renovell
,
Florence Azaïs
,
Yves Bertrand
IMSTW: International Mixed Signal Testing Workshop, Jun 1998, The Hague, Pays-Bas. pp.100-106
Communication dans un congrès
hal-01384740
v1
|
|
From dependable computing systems to computing for integrated dependable systems?
Karl-Erwin Grosspietsch
,
Jacob Abraham
,
Jürgen Maier
,
Hans-Dieter Kochs
,
Michael Nicolaidis
et al.
Communication dans un congrès
hal-00013844
v1
|
|
A built-in multi-mode stimuli generator for analogue and mixed-signal testing
Marcelo Lubaszewski
,
Michel Renovell
,
Salvador Mir
,
Florence Azaïs
,
Yves Bertrand
Communication dans un congrès
hal-00005876
v1
|
|
A multi-mode signature analyzer for analog and mixed circuits
Michel Renovell
,
Marcelo Lubaszewski
,
Salvador Mir
,
Florence Azaïs
,
Yves Bertrand
Communication dans un congrès
hal-01399998
v1
|