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Mounira Bouarroudj
Maître de conférences à l'UPEC et rattachée au laboratoire SATIE
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Degradation behavior of 600 V-200 A IGBT modules under power cycling and high temperature environment conditionsMicroelectronics Reliability, 2007, 47, pp.719-1724
Article dans une revue
hal-00869421v1
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Failure modes on low voltage power MOSFETs under high temperature applicationMicroelectronics Reliability, 2007, 47 (9), p1767-1772. ⟨10.1016/j.microrel.2007.07.066⟩
Article dans une revue
hal-01704346v1
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Comparison of stress distributions and failure modes during thermal cycling and power cycling on high power IGBT modulesEPE 2007 - 12th European Conference on Power Electronics and Applications, Sep 2007, Aalborg, Denmark. 10p, ⟨10.1109/EPE.2007.4417457⟩
Communication dans un congrès
hal-01702003v1
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Degradation behavior of 600V-200A IGBT modules under Power cycling and high temperature environment conditions18th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2007, BORDEAUX, France. pp. 1719-1724, ⟨10.1016/j.microrel.2007.07.027⟩
Communication dans un congrès
hal-01702036v1
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Ageing Test Results of low voltage MOSFET Modules for Electrical VehiclesEPE 2007 - 12th European Conference on Power Electronics and Applications, Sep 2007, Aalborg, Denmark. 10p
Communication dans un congrès
hal-01701952v1
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