Pascal Nouet
                                    243 
                                    
                            Documents
                                Publications
Publications
        
            Exploring flexible and 3D printing technologies for the design of high spatial resolution EM probesNEWCAS 2021 - 19th IEEE International New Circuits and Systems Conference, Jun 2021, Toulon, France. pp.1-4, ⟨10.1109/NEWCAS50681.2021.9462763⟩ 
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                    lirmm-03278789
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            On the scaling of EMFI probesFDTC 2021 - Workshop on Fault Detection and Tolerance in Cryptography, Sep 2021, Milan, Italy. pp.67-73, ⟨10.1109/FDTC53659.2021.00019⟩ 
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                    lirmm-03476820
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            Optimal Detector Position and Structure for a New 3-axis CMOS Thermal MicroaccelerometerSSD 2020 - 17th International Multi-Conference on Systems, Signals and Devices, Jul 2020, Monastir, Tunisia. pp.1144-1149, ⟨10.1109/SSD49366.2020.9364127⟩ 
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                    lirmm-03528836
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            Low-voltage Low-power current-mode square-root circuit based on Quasi-floating gate techniqueSSD 2020 - 17th International Multi-Conference on Systems, Signals and Devices, Jul 2020, Monastir, Tunisia. pp.761-764, ⟨10.1109/SSD49366.2020.9364230⟩ 
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                    lirmm-03528840
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            New High Efficiency Heater Design for a 3-axis CMOS MEMS Convective AccelerometerDTIP 2020 - 22nd Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS, Jun 2020, Lyon (Virtual), France. pp.1-6, ⟨10.1109/DTIP51112.2020.9139152⟩ 
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                    lirmm-02942550
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            Dynamic weighted average in multisensory systemsDTIP 2019 - 21st Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS, May 2019, Paris, France. pp.1-4, ⟨10.1109/DTIP.2019.8752804⟩ 
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                    lirmm-02354061
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            Mechanical Solution for Out-of-Plane Sensitivity Enhancement of CMOS MEMS Convective AccelerometersICECS 2018 - 25th International Conference on Electronics, Circuits and Systems, Dec 2018, Bordeaux, France. pp.301-304, ⟨10.1109/ICECS.2018.8617928⟩ 
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                    lirmm-02354212
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            From spintronic devices to hybrid CMOS/magnetic system on chipVLSI-SoC 2018 - IFIP International Conference on Very Large Scale Integration, Oct 2018, Verona, Italy. pp.188-191, ⟨10.1109/VLSI-SoC.2018.8644875⟩ 
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                    hal-01982791
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            Using multifunctional standardized stack as universal spintronic technology for IoTDATE 2018 - 21st Design, Automation and Test in Europe Conference and Exhibition, Mar 2018, Dresden, Germany. pp.931-936, ⟨10.23919/DATE.2018.8342143⟩ 
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                    hal-01864468
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            Post-fabrication soft trimming of resistive sensorsDTIP 2018 - 20th Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS, May 2018, Roma, Italy. ⟨10.1109/DTIP.2018.8394221⟩ 
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                    lirmm-01827725
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            A generic model for sensor simulation at system levelDTIP 2018 - 20th Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS, May 2018, Roma, Italy. ⟨10.1109/DTIP.2018.8394198⟩ 
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                    lirmm-01827709
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            High Temperature, Time Domain Sensor Interface based on Phase ShifterHiTen: High Temperature Electronics Network, Jul 2017, Cambridge, United Kingdom. pp.103-108, ⟨10.4071/2380-4491.2017.HiTEN.103⟩ 
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                    lirmm-01684794
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            Synchronised 4-Phase Resonant Power Clock Supply for Energy Efficient Adiabatic LogicICRC: International Conference on Rebooting Computing, Nov 2017, Washington, DC, United States. ⟨10.1109/ICRC.2017.8123661⟩ 
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                    lirmm-01768831
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            GREAT: HeteroGeneous IntegRated Magnetic tEchnology Using Multifunctional Standardized sTackISVLSI 2017 - International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.344-349, ⟨10.1109/ISVLSI.2017.67⟩ 
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                    lirmm-01708599
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            New time-domain conditioning circuit for resistive sensor: Behavioral modelling for simulation and optimizationMIXDES: Mixed Design of Integrated Circuits and Systems, Jun 2017, Bydgoszcz, Poland. pp.408-411, ⟨10.23919/MIXDES.2017.8005242⟩ 
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                    lirmm-01687778
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            A high temperature, 12-bit-time-domain sensor interface based on injection locked oscillatorISCAS: International Symposium on Circuits and Systems, May 2017, Baltimore, United States. ⟨10.1109/ISCAS.2017.8050504⟩ 
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                    lirmm-01687348
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            Combo of innovative educational approaches to teach industrial test to undergraduate studentsEDUCON: Global Engineering Education Conference, Apr 2017, Athens, Greece. pp.56-64, ⟨10.1109/EDUCON.2017.7942824⟩ 
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                    lirmm-01768840
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            Highly linear voltage-to-time converter based on injection locked relaxation oscillatorsSSD: Systems, Signals and Devices, Mar 2017, Marrakech, Morocco. ⟨10.1109/SSD.2017.8167011⟩ 
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                    lirmm-01712478
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            Investigation of the power-clock network impact on adiabatic logicSPI: Signal and Power Integrity, May 2016, Turin, Italy. ⟨10.1109/SaPIW.2016.7496270⟩ 
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                    hal-01348476
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            Problem-Based Learning Approach to Teach Printed Circuit Boards TestICL: Interactive Collaborative Learning, Sep 2016, Belfast, United Kingdom. pp.45-57, ⟨10.1007/978-3-319-50337-0_4⟩ 
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                    lirmm-01385626
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            Industrial Test Project Oriented EducationEDUCON: Global Engineering Education Conference, Apr 2016, Abu Dhabi, United Arab Emirates. pp.119-124, ⟨10.1109/EDUCON.2016.7474541⟩ 
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                    lirmm-01256447
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            Per Peers Learning Education Approach to Teach Industrial Test to Undergraduate StudentsEWME: European Workshop on Microelectronics Education, May 2016, Southampton, United Kingdom. ⟨10.1109/EWME.2016.7496485⟩ 
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                    lirmm-01385619
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            Physical description and analysis of doped carbon nanotube interconnectsPATMOS: Power And Timing Modeling, Optimization and Simulation, Sep 2016, Brême, Germany. pp.250-255, ⟨10.1109/PATMOS.2016.7833695⟩ 
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                    lirmm-01457338
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            On Analysis of On-chip DC-DC Converters for Power Delivery NetworksISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.557-560, ⟨10.1109/ISVLSI.2015.96⟩ 
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                    lirmm-01446182
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            Une pedagogie par projet pour des etudiants acteurs et auteurs de leur apprentissageQPES: Questions de Pédagogie dans l’Enseignement Supérieur, Jun 2015, Brest, France 
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                    lirmm-01256445
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            MEMS based Inertial Measurement UnitsDTIP: Design, Test, Integration and Packaging, Apr 2015, Montpellier, France. ⟨10.1109/DTIP.2015.7160966⟩ 
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                    lirmm-01235526
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            An ultra-low-power front-end for differential capacitive sensorsDTIP: Design, Test, Integration and Packaging, Apr 2015, Montpellier, France. ⟨10.1109/DTIP.2015.7160964⟩ 
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                    lirmm-01235453
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            CMOS implementation of a 3-axis thermal convective accelerometerIEEE SENSORS, Nov 2014, Valencia, Spain. pp.1471-1474, ⟨10.1109/ICSENS.2014.6985292⟩ 
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                    lirmm-01166836
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            Monitoring of particle deposition in cleanrooms: State-of-the-artDTIP: Design, Test, Integration and Packaging, Apr 2014, Cannes, France. pp.368-371, ⟨10.1109/DTIP.2014.7056699⟩ 
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                    lirmm-01166805
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            Une expérience de pédagogie par projet pour la formation au test industrielCETSIS: Colloque sur l'Enseignement des Technologies et des Sciences de l'Information et des Systèmes, Oct 2014, Besançon, France 
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                    lirmm-01256441
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            Direct digital synthesiser (DDS) design parameters optimisation for vibrating MEMS sensors: Optimisation of phase accumulator, Look-Up Table (LUT) and Digital to Analog Converter (DAC) sizesDTIP: Design, Test, Integration and Packaging, Apr 2014, Cannes, France. ⟨10.1109/DTIP.2014.7056692⟩ 
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                    lirmm-01166917
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            Self-test and self-calibration of a MEMS convective accelerometerDTIP: Design, Test, Integration & Packaging of MEMS/MOEMS, Apr 2013, Barcelona, Spain. pp.239-242 
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                    lirmm-00814231
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            Design of a Monolithic 3-axis Thermal Convective AccelerometerDTIP: Design, Test, Integration and Packaging, Apr 2013, Barcelona, Spain. pp.235-238 
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                    lirmm-00814222
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            De l'étude de la testabilité d'un circuit logique à sa vérification sur testeur industriel : Une expérience pédagogique sur les approches de test structurel et fonctionnel12èmes Journées Pédagogiques du CNFM (JPCNFM 2012), Nov 2012, Saint Malo, France. pp.39-44 
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                    hal-00769876
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            Modeling and simulation of CMOS integrated MEMS: application to low-cost sensorsSSDM'2012: International Conference on Solid State Devices and Materials, Sep 2012, Kyoto, Japan. pp.1117-1119 
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                    lirmm-00814386
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            Testabilité d'un circuit intégré mixte dédié à la mesure d'un champ magnétique12èmes Journées Pédagogiques du CNFM (JPCNFM 2012), Nov 2012, Saint Malo, France. pp. 45-50 
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                    hal-00769886
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            Accurate Frequency Counting Architecture for Vibrating Accelerometers on FPGADCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.218-222 
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                    lirmm-00814198
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            Study of a high-resolution and low-power CMOS temperature sensorNEWCAS: International New Circuits and Systems Conference, Jun 2012, Montreal, Canada. pp.205-208, ⟨10.1109/NEWCAS.2012.6328992⟩ 
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                    lirmm-00814184
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            Efficiency modeling of a CMOS MEMS convective accelerometerDTIS: Design and Technology of Integrated Systems in Nanoscale Era, May 2012, Tunis, Tunisia. ⟨10.1109/DTIS.2012.6232985⟩ 
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                    lirmm-00814162
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            Design-for-manufacturability of MEMS convective accelerometers through adaptive electrical calibration strategyLATW: Latin American Test Workshop, Apr 2012, Quito, Ecuador. ⟨10.1109/LATW.2012.6261237⟩ 
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                    lirmm-00803451
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            Investigation on the Effect of Geometrical Dimensions on the Conductive Behaviour of a MEMS Convective AccelerometerDTIP'11: Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Aix-en-Provence, France. pp.14-17 
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                    lirmm-00632610
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            An Ultra Low Power Temperature Sensor for Smart Packaging MonitoringDTIP'11: Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Aix-en-Provence, France. pp.320-323 
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                    lirmm-00632577
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            Test and Calibration of MEMS Convective Accelerometers with a Fully Electrical SetupLATW: Latin American Test Workshop, Mar 2011, Porto de Galinhas, Brazil. ⟨10.1109/LATW.2011.5985907⟩ 
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                    lirmm-00702769
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            A Micro-Power High-Resolution Sigma-Delta CMOS Temperature SensorIEEE Sensors 2011, Limerik, Ireland. pp.1530-1533 
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                    lirmm-00651052
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            A Tracking Converter for Resistive Sensors Based on a Feedback Active BridgeIEEE International Conference NEWCAS 2011, Jun 2011, France. pp.458-461, ⟨10.1109/NEWCAS.2011.5981269⟩ 
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                    lirmm-00743354
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            A Novel Integrated Solution for the Control and Diagnosis of Electrostatic MEMS SwitchesDTIP'11: Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Aix-en-Provence, France. pp.315-319 
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                    lirmm-00632583
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            A MEMS Convective Accelerometer Equipped with On-Chip Facilities for Sensitivity Electrical CalibrationIMS3TW'11: IEEE International Mixed-Signals, Sensors and Systems Test Workshop, United States. pp.82-87, ⟨10.1109/IMS3TW.2011.21⟩ 
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                    lirmm-00702759
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            An Electrical Test Method for MEMS Convective Accelerometers: Development and EvaluationDATE: Design, Automation and Test in Europe, Mar 2011, Grenoble, France. ⟨10.1109/DATE.2011.5763137⟩ 
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                    lirmm-00702754
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            A Low Power Interface Circuit for Resistive Sensors with Digital Offset CompensationISCAS'10: IEEE International Symposium on Circuits and Systems, Paris, France. pp.3092-3095 
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                    lirmm-00498468
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            Smart Drivers for Online Diagnosis of Electrostatic MEMS ActuatorsIMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A 
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                    lirmm-00494515
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            A CMOS-MEMS Inertial Measurement UnitIEEE SENSORS, Nov 2010, Waikoloa, Hawaii, United States. pp.1033-1036 
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                    lirmm-00547694
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            Projet pédagogique Master Micro-Nano Électronique de Strasbourg ¬ CRTC: Testabilité numérique-analogique sur circuit intégré mixte dédié11èmes Journées Pédagogiques du CNFM (JPCNFM 2010), Nov 2010, Sainr-Malo, France. Actes pp. 7-12 
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                    hal-00597329
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            Design of a Smart CMOS High-Voltage Driver for Electrostatic MEMS SwitchesDTIP'10: Design, Test, Integration and Packaging of MEMS/MOEMS, Seville, Spain. pp.44-47 
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                    lirmm-00489031
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            Experiments on the Analysis of Phase/Frequency-Modulated RF Signals Using Digital Tester ChannelsLATW'10: 11th Latin-American Test Workshop, Punta del Este, Uruguay. pp.N/A 
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                    lirmm-00473524
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            Modeling the Influence of Etching Defects on the Sensitivity of MEMS Convective AccelerometersIMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A 
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                    lirmm-00494555
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            A Study of Package Effects on the Behavior of MEMS Convective AccelerometersDTIP'10: Design, Test, Integration and Packaging of MEMS/MOEMS, Seville, Spain. pp.6-9 
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                    lirmm-00489026
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            Nonlinear Behaviour of a Micromachined SOI Device for Energy Harvesting ApplicationDTIP'10: Design, Test, Integration and Packaging of MEMS/MOEMS, May 2010, Seville, Spain. pp.263-265 
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                    lirmm-00489036
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            An Optimized Electronic Architecture for Resistive SensorsDTIP'10: Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, Seville, Spain. pp.372-375 
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                    lirmm-00547712
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            A MEMS-Based Multi-Sensor Platform for Consumer ApplicationsPRIME'09: Research in Microelectronics and Electronics, Jul 2009, Cork, Ireland. pp.320-323 
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                    lirmm-00423604
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            A MEMS Multi-Sensor System for Attitude DeterminationDTIP'09: Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, Apr 2009, pp.261-264 
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                    lirmm-00373753
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            Mécanismes non linéaires dans des dispositifs MEMS pour la récupération d'énergieJournées Nationales 2009 du GDR Micro- et Nano-Systèmes, France 
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                    lirmm-00436714
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            Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals using Digital ATEATS: Asian Test Symposium, 2009, Taichung, Taiwan. pp.261-266, ⟨10.1109/ATS.2009.56⟩ 
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                    lirmm-00436384
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            A Novel Low Power Interface for Resistive MEMS SensorsSCS: Signals, Circuits and Systems, Nov 2009, Medenine, Tunisia. ⟨10.1109/ICSCS.2009.5412550⟩ 
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                    lirmm-00436253
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            A Method for Electrical Calibration of MEMS Accelerometers Through Multivariate RegressionIMS3TW'09: IEEE 15th Mixed-Signals, Sensors and Systems Test Workshop, Jun 2009, pp.N/A 
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                    lirmm-00399110
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            Linearity optimization using dithering in a 1st order thermal modulatorJoint Conference IEEE NEWCAS - TAISA'09, Toulouse, France, pp.4 
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                    lirmm-00406937
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            An Innovative, Offset Imune, Conditionning and Read-out Circuitry for Resistive MEMS SensorsJoint Conference IEEE NEWCAS - TAISA'09, Toulouse, France, pp.4 
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                    lirmm-00406936
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            Silicon on Insulator Temperature and Pressure Sensor for MEMS Smart PackagingProceedings of the Eurosensors XXIII Conference, France. pp.782-785 
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                    lirmm-00436120
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            A Wide Bandwidth, Wide Dynamic Range Thermal Architecture for Convective AccelerometersIEEE Sensors 2009 Conference, Oct 2009, Nouvelle Zélande, pp.N/A 
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                    lirmm-00406935
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            An Efficient Low Power Interface Circuit for Resistive MEMs SensorFTFC'09: 8èmes Journées Faible Tension Faible Consommation, Neufchatel, Suisse, pp.3 
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                    lirmm-00406942
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            Investigations on Electrical-only Test Setup for MEMS Convective AccelerometerICSCS: International Conference on Signals, Circuits and Systems, Nov 2009, Medenine, Tunisia. ⟨10.1109/ICSCS.2009.5412624⟩ 
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                    lirmm-00436265
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            The Active Bridge: an Alternative to the Wheatstone Bridge for Efficient Conditioning of Resistive MEMS SensorsDTIP 2009 - Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, Apr 2009, Rome, Italy. pp.265-268 
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                    lirmm-00373800
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            A Novel Method for Test and Calibration of Capacitive Accelerometers with a Fully Electrical SetupDDECS 2008 - 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2008, Bratislava, Slovakia. ⟨10.1109/DDECS.2008.4538807⟩ 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00337873
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            A Physics-Based Compact Model for ESD Protection Diodes under Very Fast Transients30th Annual EOS/ESD Symposium, Sep 2008, Tuscon, Arizona, USA, pp.9 
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                    lirmm-00337880
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            Analytical and Finite-Element Modeling of a Localized-Mass SensorSensors, Oct 2008, Lecce, Italy. pp.367-370, ⟨10.1109/ICSENS.2008.4716457⟩ 
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                    lirmm-00363479
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            A CMOS Multi-Sensor System for 3D Orientation DeterminationISVLSI'08: IEEE Computer Society Annual Symposium on VLSI, Apr 2008, Montpellier, France, pp.57-62 
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                    lirmm-00280806
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            An Approach to Integrate MEMS into High-Level System design FlowsJoint conference IEEE NEWCAS - TAISA'08, Jun 2008, Montreal, Canada. pp.273-276 
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                    lirmm-00333697
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            Evaluation of a Fully Electrical Test and Calibration Method for MEMS Capacitive AccelerometersIMS3TW'08: 14th IEEE International Mixed-Signals, Sensor, and Systems Test Workshop, Jun 2008, Vancouver, Canada, pp.6, ⟨10.1109/IMS3TW.2008.4581616⟩ 
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                    lirmm-00337875
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            Transit Time Extraction Method for ESD Protection Diodes ModelIEW'08: International ESD Workshop, Port d'Albret, France 
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                    lirmm-00337884
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            A Closed-Loop Architecture with Digital Output for Convective AccelerometersISVLSI'08: IEEE Computer Society Annual Symposium on VLSI, Apr 2008, Montpellier, France, pp.51-56 
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                    lirmm-00280803
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            Study of First-Order Thermal SIGMA-DELTA Architecture for Convective AccelerometersDTIP: Design, Test, Integration and Packaging of MEMS/MOEMS, Apr 2008, Nice, France. pp.100-104, ⟨10.1109/DTIP.2008.4752961⟩ 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00333632
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            STUDY OF FIRST-ORDER THERMAL SIGMA-DELTA ARCHITECTURE FOR CONVECTIVE ACCELEROMETERSDTIP 2008, Apr 2008, Nice, France. pp.100-104 
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                    hal-00277687
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            Towards New Low-Cost Multi-Sensor SystemsEUROSENSORS, Sep 2008, Desden, Germany. pp.549-552 
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                    lirmm-00325075
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            Conception de MEMS : de l'idée à l'integration SoC/SiPGDR SoC-SiP: System-On-Chip & Sytem-In-Package, Jun 2008, Paris, France 
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                    lirmm-00361232
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            Rejection of Power Supply Noise in Wheatstone Bridges: Application to Piezoresistive MEMSDTIP 2008 - 10th Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Apr 2008, Nice, France. pp.96-99, ⟨10.1109/DTIP.2008.4752960⟩ 
                 Communication dans un congrès
                    
        
        
            
                
                    hal-00277686
                                            v1
                                    
            
        
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            The Active Bridge: an Alternative to the Wheatstone BridgeJournées Nationales du Groupement de Recherche Micro et Nano Systèmes (GDR MNS), Dec 2008, Montpellier, France 
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                    lirmm-00363892
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            A Comparative Study of Conditioning Architectures for Convective Accelerometers6th IEEE Conference on SENSORS 2007, Oct 2007, pp.107-110 
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                    lirmm-00194571
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            The future of Embedded Test within the Design for Micro & Nano Manufacture NoEWorkshop on Design for Reliability and Manufacturability in MNT, Apr 2006, Stresa, Lago Maggiore, Italy 
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                    lirmm-00406909
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            Characterization of the Transient Behavior of Gated/STI Diodes and their Associated BJT in the CDM Time DomainEOS/ESD'07: 29th Electrical Overstress/Electrostatic Discharge Symposium, Sep 2007, Anaheim, CA, USA, pp.3A.2_1- 3A.2_10, ⟨10.1109/EOSESD.2007.4401748⟩ 
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                    lirmm-00199232
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            Conception de Microsystèmes Monolithiques Testables et Robustes aux Variations de ProcessEcole d'hiver Francophone sur les Technologies de Conception des Systèmes Embarqués Hétérogènes (FETCH 2007), 2007, Grenoble, France 
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                    lirmm-00406918
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            Réjection du bruit d'alimentation du pont de Wheatstone : application aux MEMS piézorésistifsTAISA'07 : 8ème colloque sur le Traitement Analogique de l'Information, du Signal et ses Applications, Oct 2007, Lyon, France. Session 4A : Capteurs 
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                    lirmm-00202769
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            A Fault-Tolerant MEF Peptide Synthesizer using Control and Direct Sensing Electrodes Employing Current and Impedance TestsIMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, pp.176-181 
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                    lirmm-00161699
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            Design for Test of MNT-Based Systems: Alternative Test Solutions for Reduced Test CostsMEMUNITY (The MEMS Test Community) Workshop, France 
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                    lirmm-00406907
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            Automated On-Wafer Characterization in Micro-Machined Resonators: Towards an Integrated Test Vehicle for Bulk Acoustic Wave Resonators (FBAR)ICMTS'07: IEEE International Conference on Microelectronic Test Structures, Mar 2007, Tokyo, Japan, pp.157-161 
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                    lirmm-00200013
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            Méthodes alternatives pour le test de MEMSJournées Nationales du GDR Micro et Nano Systèmes, France 
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                    lirmm-00406946
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            Accéléromètre convectif CMOS en boucle ferméeTAISA'2007 : 8ème colloque sur le Traitement Analogique de l'Information, du Signal et ses Applications, pp.107-110 
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                    lirmm-00181093
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            Challenges in MEMS Manufacture Testing and Embedded Test SolutionsNTC (Northern Test Center) Remote and Embedded Testing Seminar, Finland 
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                    lirmm-00406914
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            On the Use of LVTPNP in ESD Protection StructuresIEW'07: International Electrostatic Discharge Workshop, May 2007, Lake Tahoe, CA, United States 
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                    lirmm-00199246
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            Design and Characterization of a Bulk-Acoustic-Resonator (FBAR)MEMSWAVE'07: 8th International Symposium on RF MEMS and RF Microsystems, Jun 2007, Barcelone, Spain 
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                    lirmm-00203361
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            Instantaneous de-embedding of the on-wafer Equivalent-Circuit Parameters of Acoustic Resonator (FBAR) for Integrated Circuit ApplicationsSBCCI: Symposium on Integrated Circuits and Systems Design, Sep 2007, Copacabana, Rio de Janeiro, Brazil. pp.212-217, ⟨10.1145/1284480.1284539⟩ 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00203350
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            A Digitally Testable Capacitance-Insensitive Mixed-Signal FilterETS: European Test Symposium, May 2007, Freiburg, Germany. pp.21-26, ⟨10.1109/ETS.2007.6⟩ 
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                    lirmm-00158154
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            A simulation tool for CDM stress evaluation at circuit levelEOS/ESD/EMI Workshop, May 2006, Toulouse, France. pp.89-92 
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                    lirmm-00112986
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            Challenges in Manufacturing Test of MNT-based SystemsIMSTW'06: 12th International Mixed Signal Testing Workshop, Jun 2006 
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                    lirmm-00128280
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            Read-Out Circuit in RT-FluxgateISCAS'06: IEEE International Symposium on Circuits and Systems, pp.5910-5913 
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                    lirmm-00406820
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            Design for Manufacturing of MNT-based Systems: a test caseJournées nationales du GDR Micro et Nano Systèmes, Lille, France 
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                    lirmm-00406951
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            HDL Simulation of a Thermal Accelerometer for System DesignXX EUROSENSORS, Sep 2006, Göteborg (Sweden) 
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                    lirmm-00102170
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            Partially Depleted SOI Body-Contacted MOSFET-Triggered Silicon Controlled Rectifier for ESD ProtectionEOS/ESD Symposium, Sep 2006, Tucson (USA), pp.6 
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                    lirmm-00112952
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            Design for Manufacturing of MNT-based Systems: A Test CaseJournées Nationales du GDR Micro et Nano-Systèmes, France 
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                    lirmm-00406847
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            Modeling of a CMOS Convective Accelerometer for HDL IntegrationESSDERC'06: 36th European Solid-State Device Research Conference - ESSCIRC'06: 32nd European Solid-State Circuits Conference, Sep 2006, Montreux (Switzerland), pp.134-137 
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                    lirmm-00102127
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            Challenges in Manufacturing Test of Micro and Nano-SystemsWorkshop on Design for Reliability and Manufacturability in MNT, France 
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                    lirmm-00406837
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            On the Testing of the Electronic Conditioning Chain of a CMOS MEMS Based Magnetic Field SensorLATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, Argentina. pp.29-34 
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                    lirmm-00102750
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            Electro-thermal short pulsed simulation for SOI technologyESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Oct 2006, Wuppertal, Germany 
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                    lirmm-00112981
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            InP HBT XOR and Phase-Detector for 40Gbit/s Clock and Data Recovery (CDR)MIKON: Microwaves, Radar & Wireless Communications, May 2006, Paris, France. pp.1115-1118, ⟨10.1109/MIKON.2006.4345382⟩ 
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                    lirmm-00202634
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            Offset and Noise Rejection Analysis in CMOS Piezoresistive SensorsEUROSENSORS, Sep 2005, Barcelona, Spain 
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                    lirmm-00106543
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            BIST Implementation of Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field SensorLATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.207-212 
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                    lirmm-00106516
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            Design&Test of an Oscillation Based System Architecture for DNA Sensor ArraysIMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.234-239 
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                    lirmm-00106525
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            A Monolithic CMOS 3-Axis Accelerometer Combining Piezoresistive and Heat Transfer EffectsPRIME'05: PhD Research in Microelectronics and Electronics, Jul 2005, Lausanne (Switzerland), pp.219-222 
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                    lirmm-00106064
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            XOR en technologie TBH InP pour les futures transmissions optiques à 40 Gb/s14èmes Journées Nationales Microondes, 2005, Paris, France 
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                    lirmm-00406830
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            Design of a Micromachined CMOS CompassTRANSDUCERS'05, Jun 2005, Séoul (Corée), pp.405-408 
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                    lirmm-00106457
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            Electro-Thermal On-Line Testing of a MEMS Magnetometer Through Bias ModulationLATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.213-218 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00106517
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            On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field SensorVTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.213-218 
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                    lirmm-00105996
                                            v1
                                    
            
        
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            Absolute Pitch, Roll and Yaw Measurement on CMOS4th IEEE Conference on Sensors, Oct 2005, Irvine, CA (USA), pp.133-136 
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                    lirmm-00154128
                                            v1
                                    
            
        
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            Interfaces pour microsystèmes magnétiquesJournées Nationales de la Section Electronique du Club EEA "Interfaces Capteurs : Vers les Micro-Nanosystèmes », France 
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                    lirmm-00406816
                                            v1
                                    
            
        
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            Towards On-Line Testing of MEMS Using Electro-Thermal ExcitationETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.76-81 
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                    lirmm-00106009
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            A Broad-Band Active Frequency Doubler Operating up to 120 GHzEuMC: European Microwave Conference, Oct 2005, Paris, France 
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                    lirmm-00406824
                                            v1
                                    
            
        
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            Challenges in Manufacturing Test of Micro and Nano-SystemsThe Innovative Manufacturing Research Conference, Scottish Manufacturing Institute, France 
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                    lirmm-00406781
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            Experimental and Finite-Element Study of Convective Accelerometer on CMOSEUROSENSORS, Sep 2005, Barcelona, Spain 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00106544
                                            v1
                                    
            
        
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            Superposition vs. Modulation: A Comparative Analysis for Electro-Thermal On-Line MEMS TestingIMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.212-219 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00106522
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            Physics and Design Optimization of ESD Diode for 0.13mm PD-SOI TechnologyEOS/ESD: Electrical Overstress/Electrostatic Discharge, Sep 2005, Anaheim, United States 
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                    lirmm-00106041
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            Comparison Between 0.13 µm PD-SOI Gated Diode and non Gated Diode through DC TCAD SimulationsEUROSOI'05, Jan 2005, Grenade, Spain 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00106519
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            VHDL-AMS Fault Simulation for Testing DNA Bio-Sensing ArraysIEEE SENSORS, Oct 2005, Irvine, United States. ⟨10.1109/ICSENS.2005.1597878⟩ 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00106042
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            Tutorial on Test Engineering and Design for Testability of Micro- and Nano- Systems1st DfMM Summer School, 2004 
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                    lirmm-00109141
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            An A/D Interface for Resonant Piezoresistive MEMS SensorISIE 2004 - IEEE International Symposium on Industrial Electronics, May 2004, Ajaccio, France. pp.83-88, ⟨10.1109/ISIE.2004.1571786⟩ 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00108896
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            Investigations on the Use of EWS Data for Failure Diagnosis EnhancementLATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena (Colombia), pp.6-10 
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                    lirmm-00108652
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            On the Use of Electrical Stimuli for MEMS TestingLATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.118-122 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00108651
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            Electrically-Induced Thermal Stimuli for MEMS TestingETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.60-65 
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                    lirmm-00108904
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            A CMOS MEMS Accelerometer with Bulk MicromachiningEUROSENSORS, Sep 2004, Rome, Italy 
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                    lirmm-00108794
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            A DC-100 GHz Frequency Doubler in InP DHBT TechnologyMTT-S: Microwave Theory and Techniques Society, Jun 2004, Texas, United States. pp.167-170, ⟨10.1109/MWSYM.2004.1335834⟩ 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00108815
                                            v1
                                    
            
        
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            Electrically-Induced Thermal Stimuli for MEMS Testing1st DfMM Summer School, 2004 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00109142
                                            v1
                                    
            
        
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            Optimised Probing Flow for High Speed Fault LocalizationISTFA'04: International Symposium on Testing and Failure Analysis, Nov 2004, Worcester (USA) 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00108898
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            Low Noise CMOS Amplifier for a Piezoresistive Magnetic Field SensorDCIS: Design of Circuits and Integrated Systems, Nov 2003, Ciudad Real, Spain. pp.639-644 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00269472
                                            v1
                                    
            
        
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            Use of a Statistical Approach for Efficient Implementation of Oscillation-Based Test StrategyIMSTW 2003 - 9th IEEE International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.99-103 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00269582
                                            v1
                                    
            
        
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            STMSCR: A New Multi-Finger SCR-Based Protection Structure Against ESDEOS/ESD Symposium, Las Vegas (USA), pp. 223-241 
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                    lirmm-00269603
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            A Novel SCR-Based Protection Structure Against ESD with Efficient Multi-Finger TriggeringESSDERC 2003 - 33rd European Solid-State Device Research Conference, Sep 2003, Estoril, Portugal. pp.207-210, ⟨10.1109/ESSDERC.2003.1256850⟩ 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00269605
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            Piezoresistive CMOS Beams for Inertial SensingIEEE SENSORS, Oct 2003, Toronto, Canada. pp.451-456, ⟨10.1109/ICSENS.2003.1278978⟩ 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00269470
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            Improving the Efficiency of the Oscillation-Based Test Methodology for Parametric FaultsLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.234-237 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00269433
                                            v1
                                    
            
        
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            Electrical Modeling of LSCRs in Deep Submicron CMOS Technologies for Circuit-Level Simulation of ESDBCTM 2003 - Bipolar/BiCMOS Circuits and Technology Meeting, Sep 2003, Toulouse, France. pp.97-100, ⟨10.1109/BIPOL.2003.1274943⟩ 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00269608
                                            v1
                                    
            
        
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            On the Synthesis of Analog Cascaded Filters with Optimal Test Point InsertionLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.212-216 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00269499
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            Amplificateur CMOS Faible Bruit pour Micro Capteur MEMSTAISA'03: Traitement Analogique de l'Information, du Signal et ses Applications, Oct 2003, Louvain, Belgique. pp.71-74 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00269460
                                            v1
                                    
            
        
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            Design and Simulation of a CMOS MEMS Using Standard Microelectronic CAD EnvironmentNANOTECH 2003 - Nanotechnology Conference and Trade Show, Feb 2003, San Francisco, CA, United States. pp.472-475 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00269546
                                            v1
                                    
            
        
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            Caractérisation et Modélisation de Thyristors Parasites en Technologie CMOS Fortement SubmicroniqueColloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 137-140 
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                    lirmm-00269319
                                            v1
                                    
            
        
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            Impact of Environmental Parameters on CMOS MEMS StructuresCANEUS, Aug 2002, Montreal, Canada 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00269356
                                            v1
                                    
            
        
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            Conception et Test d'une Micro-Boussole Electromécanique IntégréeColloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 97-100 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00269324
                                            v1
                                    
            
        
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            On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanichal SystemsDATE: Design, Automation and Test in Europe, Mar 2002, Paris, France. pp.1120-1120, ⟨10.1109/DATE.2002.998476⟩ 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00268488
                                            v1
                                    
            
        
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            Experimental test infrastructure supporting IEEE 11494 StandardETW: European Test Workshop, 2002, Corfou, Greece 
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                    lirmm-00268606
                                            v1
                                    
            
        
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            Implementation of an Experimental IEEE 1149.4 Mixed-Signal Test ChipBTW 2002 - 1st IEEE International Board Test Workshop, Oct 2002, Baltimore, United States. paper 4.2 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00269342
                                            v1
                                    
            
        
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            Micromachined CMOS Magnetic Field Sensors with Low-Noise Signal ConditioningMEMS'02: IEEE International Conference on Micro Electro Mechanical Systems, Las Vegas, Nevada, USA, pp.256-259 
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                    lirmm-00268486
                                            v1
                                    
            
        
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            Design of an IEEE 1149.4 Test Chip with Extended ABM FunctionalityIMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Montreux (Suisse), France. pp. 153-159 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00269340
                                            v1
                                    
            
        
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            Protection contre les ESD : Caractérisation et Modélisation de Thyristors ParasitesEOS/ESD/EMI Workshop, Toulouse (France), France. pp.P nd 
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                    lirmm-00269343
                                            v1
                                    
            
        
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            Testing Reasonant Micro-Electro-Mechanical Sensors Using the Oscillation-Based Test MethodologyLATW 2002 - 3rd IEEE Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.99-104 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00269323
                                            v1
                                    
            
        
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            On the Use of CMOS 0n-Chip Mechanical Devices for Spectral AnalysisEUROSENSORS, Sep 2002, Prague, Czech Republic. pp.191-192 
                 Communication dans un congrès
                    
        
        
            
                
                    lirmm-00268509
                                            v1
                                    
            
        
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            Designing Testable Analog Filters with Optimal DFT InsertionIMSTW: International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.201-203 
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                    lirmm-00269341
                                            v1
                                    
            
        
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            Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical SystemsVTS'02: 20th IEEE VLSI Test Symposium, Monterey, CA, USA, pp.439-444 
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                    lirmm-00268484
                                            v1
                                    
            
        
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            Impact of Power-Clock Network on Adiabatic LogicColloque du GDR SoC-SiP, Jun 2016, Nantes, France. , 10ème Colloque National du GDR SoC-SiP, 2016 
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                    lirmm-01456996
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                                            v1
                                    
            
        
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                    lirmm-00814994
                                            v1
                                    
            
        
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            FEM study of a 3-axis thermal accelerometer based on free convection in a microcavityMSM'2012: Modeling & Simulation of Microsystems, Microtech Conference & Expo, Santa Clara, United States. pp.4, 2012 
                 Poster de conférence
                    
        
        
            
                
                    lirmm-00814247
                                            v1
                                    
            
        
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            Pressure Sensor for Smart Wafer-Level Packaging of MEMSEUROSENSORS, Sep 2008, Dresden, Germany. 22nd European Conference on Solid-State Transducers, pp.408-411, 2008 
                 Poster de conférence
                    
        
        
            
                
                    lirmm-00325109
                                            v1
                                    
            
        
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            Design of CMOS Cantilevers for Intertial SensingEUSPEN: European Society for Precision Engineering and Nanotechnology, May 2005, Montpellier, France. 5th International Conference of the European Society for Precision Engineering and Nanotechnology, pp.341-344, 2005 
                 Poster de conférence
                    
        
        
            
                
                    lirmm-00106001
                                            v1
                                    
            
        
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            Design of a High Resolution MEMS-Based CMOS MagnetometerEUSPEN: European Society for Precision Engineering and Nanotechnology, May 2005, Montpellier, France. 5th International Conference of the European Society for Precision Engineering and Nanotechnology, pp.287-290, 2005 
                 Poster de conférence
                    
        
        
            
                
                    lirmm-00105999
                                            v1
                                    
            
        
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            On the Development of a Low-Cost Diagnostic Flow for Efficient Failure AnalysisETS: European Test Symposium, May 2004, Ajaccio, France. 9th IEEE European Test Symposium, 2004 
                 Poster de conférence
                    
        
        
            
                
                    lirmm-00108658
                                            v1
                                    
            
        
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            Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP 2015)IEEE, 2015, 978-1-4799-8625-5 
                 Ouvrages
                    
        
        
            
                
                    lirmm-01432968
                                            v1
                                    
            
        
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            Proceedings of Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP 2014)Vice General Chair: Pascal NOUET. EDA Publishing, 2014 
                 Ouvrages
                    
        
        
            
                
                    lirmm-01434883
                                            v1
                                    
            
        
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            Ultra-Low-Power SensorsM. Belleville and C. Condemine. Energy Autonomous Micro and Nano Systems, ISTE Ltd and John Wiley & Sons Inc, pp.207-237, 2012, 978-1-84821-359-9 
                 Chapitre d'ouvrage
                    
        
        
            
                
                    lirmm-00803687
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            Les capteurs à ultra-basse consommationM. Belleville et C. Condemine. Micro et nanosystèmes autonomes en énergie, des applications aux fonctions et technologies, Hermès-Lavoisier, pp.237-269, 2012, 978-2-7462-2517-6 
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                    lirmm-00803681
                                            v1
                                    
            
        
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            Analog and Mixed-Signal Test Bus: IEEE 1149.4 Test StandardHuertas J.L. Test and Design-for-Testability in Mixed-Signal Integrated Circuits, Kluwer Academic Publishers, pp.28, 2004, 1-4020-7724-6 
                 Chapitre d'ouvrage
                    
        
        
            
                
                    lirmm-00109159
                                            v1
                                    
            
        
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            Interconnect Capacitance Modelling in a VDSM CMOS TechnologySOC Design Methodologies, 90, Kluwer Academic Publishers, pp.133-144, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_12⟩ 
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                    lirmm-00268482
                                            v1
                                    
            
        
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            Impact of Technology Spreading on MEMS Design RobustnessSOC Design Methodologies, 90, Kluwer Academic Publishers, pp.241-251, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_21⟩ 
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                    lirmm-00268485
                                            v1
                                    
            
        
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            Noise Optimisatioin of a Piezoresistive CMOS MEMS for Magnetic Field SensingSOC Design Methodologies, 90, Kluwer Academic Publishers, pp.461-472, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_40⟩ 
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                    lirmm-00268487
                                            v1
                                    
            
        
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            Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensingSOC Design Methodologies, 90, Kluwer Academic Publishers, pp.461-472, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_39⟩ 
                 Chapitre d'ouvrage
                    
        
        
            
                
                    hal-01105261
                                            v1
                                    
            
        
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            MEMS monolithiques.Hermès science publication, 1 (1), 2000, Nano et Micro Technologies, micro-capteurs et microsystèmes intégrés, 9-782746-202422 
                 Chapitre d'ouvrage
                    
        
        
            
                
                    hal-01105274
                                            v1
                                    
            
        
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            Read circuit comprising a read amplifier, and corresponding memory deviceFrance, Patent n° : FR2301698A. 2023 
                 Brevet
                    
        
        
            
                
                    lirmm-04769193
                                            v1
                                    
            
        
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            Circuit d'amplification d'un signal représentant une variation de résistance d'une résistance variable et capteur correspondantFrance, N° de brevet: FR0854585A. 2008 
                 Brevet
                    
        
        
            
                
                    lirmm-00363897
                                            v1
                                    
            
        
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            Gated thyristor and related system and methodUnited States, Patent n° : FR20060052837. 2006 
                 Brevet
                    
        
        
            
                
                    lirmm-00406923
                                            v1
                                    
            
        
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            Electrostatic Discharge Protection Device Comprising Several ThyristorsFrance, Patent n° : FR0205009A. 2002 
                 Brevet
                    
        
        
            
                
                    lirmm-00406883
                                            v1
                                    
            
        
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            3D Orientation Determination DEMO2008 
                 Autre publication scientifique
                    
        
        
            
                
                    lirmm-00361236
                                            v1
                                    
            
        
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            Remote Access to Manufacturing Test Facilities: a Reality in IC, a dream in MEMS2006, pp.39-41 
                 Autre publication scientifique
                    
        
        
            
                
                    lirmm-00128278
                                            v1
                                    
            
        
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            Towards package opening detection at power-up by monitoring thermal dissipation2024 
                 Pré-publication, Document de travail
                    
        
        
            
                
                    lirmm-04703369
                                            v1
                                    
            
        
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            A Simple Protocol to Compare EMFI platforms2020 
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                    lirmm-03626807
                                            v1
                                    
            
        
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            Modelling and Comparison of TQFP48 and GBA64 Packages in CDM Environment06022, 2006, 40 p 
                 Rapport
                    
        
        
            
                
                    lirmm-00102724
                                            v1
                                    
            
        
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            Study of a Multi-Chip Circuit under CDM Stress06024, 2006, 20 p 
                 Rapport
                    
        
        
            
                
                    lirmm-00102726
                                            v1
                                    
            
        
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            HBM and CDM Stress Evaluation at Circuit Level06023, 2006, 15 p 
                 Rapport
                    
        
        
            
                
                    lirmm-00102725
                                            v1
                                    
            
        
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            Introduction aux Microsystèmes (MEMS)2004 
                 Rapport
                             (rapport contrat/projet)
                    
        
        
            
                
                    lirmm-00109128
                                            v1
                                    
            
        
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            Caractérisation TLP des Structures STMSCR du Run H8T1062003, pp.P nd 
                 Rapport
                             (rapport technique)
                    
        
        
            
                
                    lirmm-00269719
                                            v1
                                    
            
        
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            Modélisation Electrique de LSCR en Technologie H92002 
                 Rapport
                             (rapport technique)
                    
        
        
            
                
                    lirmm-00268608
                                            v1
                                    
            
        
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