
Pascal Nouet
243
Documents
Publications
Publications
Exploring flexible and 3D printing technologies for the design of high spatial resolution EM probesNEWCAS 2021 - 19th IEEE International New Circuits and Systems Conference, Jun 2021, Toulon, France. pp.1-4, ⟨10.1109/NEWCAS50681.2021.9462763⟩
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lirmm-03278789
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On the scaling of EMFI probesFDTC 2021 - Workshop on Fault Detection and Tolerance in Cryptography, Sep 2021, Milan, Italy. pp.67-73, ⟨10.1109/FDTC53659.2021.00019⟩
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lirmm-03476820
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Optimal Detector Position and Structure for a New 3-axis CMOS Thermal MicroaccelerometerSSD 2020 - 17th International Multi-Conference on Systems, Signals and Devices, Jul 2020, Monastir, Tunisia. pp.1144-1149, ⟨10.1109/SSD49366.2020.9364127⟩
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lirmm-03528836
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Low-voltage Low-power current-mode square-root circuit based on Quasi-floating gate techniqueSSD 2020 - 17th International Multi-Conference on Systems, Signals and Devices, Jul 2020, Monastir, Tunisia. pp.761-764, ⟨10.1109/SSD49366.2020.9364230⟩
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lirmm-03528840
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New High Efficiency Heater Design for a 3-axis CMOS MEMS Convective AccelerometerDTIP 2020 - 22nd Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS, Jun 2020, Lyon (Virtual), France. pp.1-6, ⟨10.1109/DTIP51112.2020.9139152⟩
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lirmm-02942550
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Dynamic weighted average in multisensory systemsDTIP 2019 - 21st Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS, May 2019, Paris, France. pp.1-4, ⟨10.1109/DTIP.2019.8752804⟩
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lirmm-02354061
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Using multifunctional standardized stack as universal spintronic technology for IoTDATE 2018 - 21st Design, Automation and Test in Europe Conference and Exhibition, Mar 2018, Dresden, Germany. pp.931-936, ⟨10.23919/DATE.2018.8342143⟩
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hal-01864468
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From spintronic devices to hybrid CMOS/magnetic system on chipVLSI-SoC 2018 - IFIP International Conference on Very Large Scale Integration, Oct 2018, Verona, Italy. pp.188-191, ⟨10.1109/VLSI-SoC.2018.8644875⟩
Communication dans un congrès
hal-01982791
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Mechanical Solution for Out-of-Plane Sensitivity Enhancement of CMOS MEMS Convective AccelerometersICECS 2018 - 25th International Conference on Electronics, Circuits and Systems, Dec 2018, Bordeaux, France. pp.301-304, ⟨10.1109/ICECS.2018.8617928⟩
Communication dans un congrès
lirmm-02354212
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Post-fabrication soft trimming of resistive sensorsDTIP 2018 - 20th Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS, May 2018, Roma, Italy. ⟨10.1109/DTIP.2018.8394221⟩
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lirmm-01827725
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A generic model for sensor simulation at system levelDTIP 2018 - 20th Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS, May 2018, Roma, Italy. ⟨10.1109/DTIP.2018.8394198⟩
Communication dans un congrès
lirmm-01827709
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New time-domain conditioning circuit for resistive sensor: Behavioral modelling for simulation and optimizationMIXDES: Mixed Design of Integrated Circuits and Systems, Jun 2017, Bydgoszcz, Poland. pp.408-411, ⟨10.23919/MIXDES.2017.8005242⟩
Communication dans un congrès
lirmm-01687778
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A high temperature, 12-bit-time-domain sensor interface based on injection locked oscillatorISCAS: International Symposium on Circuits and Systems, May 2017, Baltimore, United States. ⟨10.1109/ISCAS.2017.8050504⟩
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lirmm-01687348
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High Temperature, Time Domain Sensor Interface based on Phase ShifterHiTen: High Temperature Electronics Network, Jul 2017, Cambridge, United Kingdom. pp.103-108, ⟨10.4071/2380-4491.2017.HiTEN.103⟩
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lirmm-01684794
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GREAT: HeteroGeneous IntegRated Magnetic tEchnology Using Multifunctional Standardized sTackISVLSI 2017 - International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.344-349, ⟨10.1109/ISVLSI.2017.67⟩
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lirmm-01708599
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Synchronised 4-Phase Resonant Power Clock Supply for Energy Efficient Adiabatic LogicICRC: International Conference on Rebooting Computing, Nov 2017, Washington, DC, United States. ⟨10.1109/ICRC.2017.8123661⟩
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lirmm-01768831
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Combo of innovative educational approaches to teach industrial test to undergraduate studentsEDUCON: Global Engineering Education Conference, Apr 2017, Athens, Greece. pp.56-64, ⟨10.1109/EDUCON.2017.7942824⟩
Communication dans un congrès
lirmm-01768840
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Highly linear voltage-to-time converter based on injection locked relaxation oscillatorsSSD: Systems, Signals and Devices, Mar 2017, Marrakech, Morocco. ⟨10.1109/SSD.2017.8167011⟩
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lirmm-01712478
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Investigation of the power-clock network impact on adiabatic logicSPI: Signal and Power Integrity, May 2016, Turin, Italy. ⟨10.1109/SaPIW.2016.7496270⟩
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hal-01348476
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Problem-Based Learning Approach to Teach Printed Circuit Boards TestICL: Interactive Collaborative Learning, Sep 2016, Belfast, United Kingdom. pp.45-57, ⟨10.1007/978-3-319-50337-0_4⟩
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lirmm-01385626
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Industrial Test Project Oriented EducationEDUCON: Global Engineering Education Conference, Apr 2016, Abu Dhabi, United Arab Emirates. pp.119-124, ⟨10.1109/EDUCON.2016.7474541⟩
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lirmm-01256447
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Per Peers Learning Education Approach to Teach Industrial Test to Undergraduate StudentsEWME: European Workshop on Microelectronics Education, May 2016, Southampton, United Kingdom. ⟨10.1109/EWME.2016.7496485⟩
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lirmm-01385619
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Physical description and analysis of doped carbon nanotube interconnectsPATMOS: Power And Timing Modeling, Optimization and Simulation, Sep 2016, Brême, Germany. pp.250-255, ⟨10.1109/PATMOS.2016.7833695⟩
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lirmm-01457338
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On Analysis of On-chip DC-DC Converters for Power Delivery NetworksISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.557-560, ⟨10.1109/ISVLSI.2015.96⟩
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lirmm-01446182
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Une pedagogie par projet pour des etudiants acteurs et auteurs de leur apprentissageQPES: Questions de Pédagogie dans l’Enseignement Supérieur, Jun 2015, Brest, France
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lirmm-01256445
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MEMS based Inertial Measurement UnitsDTIP: Design, Test, Integration and Packaging, Apr 2015, Montpellier, France. ⟨10.1109/DTIP.2015.7160966⟩
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lirmm-01235526
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An ultra-low-power front-end for differential capacitive sensorsDTIP: Design, Test, Integration and Packaging, Apr 2015, Montpellier, France. ⟨10.1109/DTIP.2015.7160964⟩
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lirmm-01235453
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CMOS implementation of a 3-axis thermal convective accelerometerIEEE SENSORS, Nov 2014, Valencia, Spain. pp.1471-1474, ⟨10.1109/ICSENS.2014.6985292⟩
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lirmm-01166836
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Monitoring of particle deposition in cleanrooms: State-of-the-artDTIP: Design, Test, Integration and Packaging, Apr 2014, Cannes, France. pp.368-371, ⟨10.1109/DTIP.2014.7056699⟩
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lirmm-01166805
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Une expérience de pédagogie par projet pour la formation au test industrielCETSIS: Colloque sur l'Enseignement des Technologies et des Sciences de l'Information et des Systèmes, Oct 2014, Besançon, France
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lirmm-01256441
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Direct digital synthesiser (DDS) design parameters optimisation for vibrating MEMS sensors: Optimisation of phase accumulator, Look-Up Table (LUT) and Digital to Analog Converter (DAC) sizesDTIP: Design, Test, Integration and Packaging, Apr 2014, Cannes, France. ⟨10.1109/DTIP.2014.7056692⟩
Communication dans un congrès
lirmm-01166917
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Self-test and self-calibration of a MEMS convective accelerometerDTIP: Design, Test, Integration & Packaging of MEMS/MOEMS, Apr 2013, Barcelona, Spain. pp.239-242
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lirmm-00814231
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Design of a Monolithic 3-axis Thermal Convective AccelerometerDTIP: Design, Test, Integration and Packaging, Apr 2013, Barcelona, Spain. pp.235-238
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lirmm-00814222
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Modeling and simulation of CMOS integrated MEMS: application to low-cost sensorsSSDM'2012: International Conference on Solid State Devices and Materials, Sep 2012, Kyoto, Japan. pp.1117-1119
Communication dans un congrès
lirmm-00814386
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De l'étude de la testabilité d'un circuit logique à sa vérification sur testeur industriel : Une expérience pédagogique sur les approches de test structurel et fonctionnel12èmes Journées Pédagogiques du CNFM (JPCNFM 2012), Nov 2012, Saint Malo, France. pp.39-44
Communication dans un congrès
hal-00769876
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Testabilité d'un circuit intégré mixte dédié à la mesure d'un champ magnétique12èmes Journées Pédagogiques du CNFM (JPCNFM 2012), Nov 2012, Saint Malo, France. pp. 45-50
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hal-00769886
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Accurate Frequency Counting Architecture for Vibrating Accelerometers on FPGADCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.218-222
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lirmm-00814198
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Study of a high-resolution and low-power CMOS temperature sensorNEWCAS: International New Circuits and Systems Conference, Jun 2012, Montreal, Canada. pp.205-208, ⟨10.1109/NEWCAS.2012.6328992⟩
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lirmm-00814184
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Design-for-manufacturability of MEMS convective accelerometers through adaptive electrical calibration strategyLATW: Latin American Test Workshop, Apr 2012, Quito, Ecuador. ⟨10.1109/LATW.2012.6261237⟩
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lirmm-00803451
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Efficiency modeling of a CMOS MEMS convective accelerometerDTIS: Design and Technology of Integrated Systems in Nanoscale Era, May 2012, Tunis, Tunisia. ⟨10.1109/DTIS.2012.6232985⟩
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lirmm-00814162
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An Ultra Low Power Temperature Sensor for Smart Packaging MonitoringDTIP'11: Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Aix-en-Provence, France. pp.320-323
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lirmm-00632577
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Investigation on the Effect of Geometrical Dimensions on the Conductive Behaviour of a MEMS Convective AccelerometerDTIP'11: Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Aix-en-Provence, France. pp.14-17
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lirmm-00632610
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A Micro-Power High-Resolution Sigma-Delta CMOS Temperature SensorIEEE Sensors 2011, Limerik, Ireland. pp.1530-1533
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lirmm-00651052
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Test and Calibration of MEMS Convective Accelerometers with a Fully Electrical SetupLATW: Latin American Test Workshop, Mar 2011, Porto de Galinhas, Brazil. ⟨10.1109/LATW.2011.5985907⟩
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lirmm-00702769
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A Novel Integrated Solution for the Control and Diagnosis of Electrostatic MEMS SwitchesDTIP'11: Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Aix-en-Provence, France. pp.315-319
Communication dans un congrès
lirmm-00632583
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A Tracking Converter for Resistive Sensors Based on a Feedback Active BridgeIEEE International Conference NEWCAS 2011, Jun 2011, France. pp.458-461, ⟨10.1109/NEWCAS.2011.5981269⟩
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lirmm-00743354
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A MEMS Convective Accelerometer Equipped with On-Chip Facilities for Sensitivity Electrical CalibrationIMS3TW'11: IEEE International Mixed-Signals, Sensors and Systems Test Workshop, United States. pp.82-87, ⟨10.1109/IMS3TW.2011.21⟩
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lirmm-00702759
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An Electrical Test Method for MEMS Convective Accelerometers: Development and EvaluationDATE: Design, Automation and Test in Europe, Mar 2011, Grenoble, France. ⟨10.1109/DATE.2011.5763137⟩
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lirmm-00702754
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Design of a Smart CMOS High-Voltage Driver for Electrostatic MEMS SwitchesDTIP'10: Design, Test, Integration and Packaging of MEMS/MOEMS, Seville, Spain. pp.44-47
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lirmm-00489031
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A CMOS-MEMS Inertial Measurement UnitIEEE SENSORS, Nov 2010, Waikoloa, Hawaii, United States. pp.1033-1036
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lirmm-00547694
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Projet pédagogique Master Micro-Nano Électronique de Strasbourg ¬ CRTC: Testabilité numérique-analogique sur circuit intégré mixte dédié11èmes Journées Pédagogiques du CNFM (JPCNFM 2010), Nov 2010, Sainr-Malo, France. Actes pp. 7-12
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hal-00597329
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A Low Power Interface Circuit for Resistive Sensors with Digital Offset CompensationISCAS'10: IEEE International Symposium on Circuits and Systems, Paris, France. pp.3092-3095
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lirmm-00498468
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Smart Drivers for Online Diagnosis of Electrostatic MEMS ActuatorsIMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès
lirmm-00494515
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Experiments on the Analysis of Phase/Frequency-Modulated RF Signals Using Digital Tester ChannelsLATW'10: 11th Latin-American Test Workshop, Punta del Este, Uruguay. pp.N/A
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lirmm-00473524
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Modeling the Influence of Etching Defects on the Sensitivity of MEMS Convective AccelerometersIMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
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lirmm-00494555
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Nonlinear Behaviour of a Micromachined SOI Device for Energy Harvesting ApplicationDTIP'10: Design, Test, Integration and Packaging of MEMS/MOEMS, May 2010, Seville, Spain. pp.263-265
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lirmm-00489036
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A Study of Package Effects on the Behavior of MEMS Convective AccelerometersDTIP'10: Design, Test, Integration and Packaging of MEMS/MOEMS, Seville, Spain. pp.6-9
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lirmm-00489026
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An Optimized Electronic Architecture for Resistive SensorsDTIP'10: Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, Seville, Spain. pp.372-375
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lirmm-00547712
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Linearity optimization using dithering in a 1st order thermal modulatorJoint Conference IEEE NEWCAS - TAISA'09, Toulouse, France, pp.4
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lirmm-00406937
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A Method for Electrical Calibration of MEMS Accelerometers Through Multivariate RegressionIMS3TW'09: IEEE 15th Mixed-Signals, Sensors and Systems Test Workshop, Jun 2009, pp.N/A
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lirmm-00399110
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Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals using Digital ATEATS: Asian Test Symposium, 2009, Taichung, Taiwan. pp.261-266, ⟨10.1109/ATS.2009.56⟩
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lirmm-00436384
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A Novel Low Power Interface for Resistive MEMS SensorsSCS: Signals, Circuits and Systems, Nov 2009, Medenine, Tunisia. ⟨10.1109/ICSCS.2009.5412550⟩
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lirmm-00436253
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A MEMS-Based Multi-Sensor Platform for Consumer ApplicationsPRIME'09: Research in Microelectronics and Electronics, Jul 2009, Cork, Ireland. pp.320-323
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lirmm-00423604
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A MEMS Multi-Sensor System for Attitude DeterminationDTIP'09: Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, Apr 2009, pp.261-264
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lirmm-00373753
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Mécanismes non linéaires dans des dispositifs MEMS pour la récupération d'énergieJournées Nationales 2009 du GDR Micro- et Nano-Systèmes, France
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lirmm-00436714
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An Innovative, Offset Imune, Conditionning and Read-out Circuitry for Resistive MEMS SensorsJoint Conference IEEE NEWCAS - TAISA'09, Toulouse, France, pp.4
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lirmm-00406936
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Silicon on Insulator Temperature and Pressure Sensor for MEMS Smart PackagingProceedings of the Eurosensors XXIII Conference, France. pp.782-785
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lirmm-00436120
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A Wide Bandwidth, Wide Dynamic Range Thermal Architecture for Convective AccelerometersIEEE Sensors 2009 Conference, Oct 2009, Nouvelle Zélande, pp.N/A
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lirmm-00406935
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An Efficient Low Power Interface Circuit for Resistive MEMs SensorFTFC'09: 8èmes Journées Faible Tension Faible Consommation, Neufchatel, Suisse, pp.3
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lirmm-00406942
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Investigations on Electrical-only Test Setup for MEMS Convective AccelerometerICSCS: International Conference on Signals, Circuits and Systems, Nov 2009, Medenine, Tunisia. ⟨10.1109/ICSCS.2009.5412624⟩
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lirmm-00436265
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The Active Bridge: an Alternative to the Wheatstone Bridge for Efficient Conditioning of Resistive MEMS SensorsDTIP 2009 - Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, Apr 2009, Rome, Italy. pp.265-268
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lirmm-00373800
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STUDY OF FIRST-ORDER THERMAL SIGMA-DELTA ARCHITECTURE FOR CONVECTIVE ACCELEROMETERSDTIP 2008, Apr 2008, Nice, France. pp.100-104
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hal-00277687
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Study of First-Order Thermal SIGMA-DELTA Architecture for Convective AccelerometersDTIP: Design, Test, Integration and Packaging of MEMS/MOEMS, Apr 2008, Nice, France. pp.100-104, ⟨10.1109/DTIP.2008.4752961⟩
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lirmm-00333632
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Analytical and Finite-Element Modeling of a Localized-Mass SensorSensors, Oct 2008, Lecce, Italy. pp.367-370, ⟨10.1109/ICSENS.2008.4716457⟩
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lirmm-00363479
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A CMOS Multi-Sensor System for 3D Orientation DeterminationISVLSI'08: IEEE Computer Society Annual Symposium on VLSI, Apr 2008, Montpellier, France, pp.57-62
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lirmm-00280806
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A Novel Method for Test and Calibration of Capacitive Accelerometers with a Fully Electrical SetupDDECS 2008 - 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Apr 2008, Bratislava, Slovakia. ⟨10.1109/DDECS.2008.4538807⟩
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lirmm-00337873
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A Physics-Based Compact Model for ESD Protection Diodes under Very Fast Transients30th Annual EOS/ESD Symposium, Sep 2008, Tuscon, Arizona, USA, pp.9
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lirmm-00337880
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Evaluation of a Fully Electrical Test and Calibration Method for MEMS Capacitive AccelerometersIMS3TW'08: 14th IEEE International Mixed-Signals, Sensor, and Systems Test Workshop, Jun 2008, Vancouver, Canada, pp.6, ⟨10.1109/IMS3TW.2008.4581616⟩
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lirmm-00337875
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Transit Time Extraction Method for ESD Protection Diodes ModelIEW'08: International ESD Workshop, Port d'Albret, France
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lirmm-00337884
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An Approach to Integrate MEMS into High-Level System design FlowsJoint conference IEEE NEWCAS - TAISA'08, Jun 2008, Montreal, Canada. pp.273-276
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lirmm-00333697
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A Closed-Loop Architecture with Digital Output for Convective AccelerometersISVLSI'08: IEEE Computer Society Annual Symposium on VLSI, Apr 2008, Montpellier, France, pp.51-56
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lirmm-00280803
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Towards New Low-Cost Multi-Sensor SystemsEUROSENSORS, Sep 2008, Desden, Germany. pp.549-552
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lirmm-00325075
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Conception de MEMS : de l'idée à l'integration SoC/SiPGDR SoC-SiP: System-On-Chip & Sytem-In-Package, Jun 2008, Paris, France
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lirmm-00361232
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The Active Bridge: an Alternative to the Wheatstone BridgeJournées Nationales du Groupement de Recherche Micro et Nano Systèmes (GDR MNS), Dec 2008, Montpellier, France
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lirmm-00363892
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Rejection of Power Supply Noise in Wheatstone Bridges: Application to Piezoresistive MEMSDTIP 2008 - 10th Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Apr 2008, Nice, France. pp.96-99, ⟨10.1109/DTIP.2008.4752960⟩
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hal-00277686
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Automated On-Wafer Characterization in Micro-Machined Resonators: Towards an Integrated Test Vehicle for Bulk Acoustic Wave Resonators (FBAR)ICMTS'07: IEEE International Conference on Microelectronic Test Structures, Mar 2007, Tokyo, Japan, pp.157-161
Communication dans un congrès
lirmm-00200013
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Design for Test of MNT-Based Systems: Alternative Test Solutions for Reduced Test CostsMEMUNITY (The MEMS Test Community) Workshop, France
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lirmm-00406907
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Characterization of the Transient Behavior of Gated/STI Diodes and their Associated BJT in the CDM Time DomainEOS/ESD'07: 29th Electrical Overstress/Electrostatic Discharge Symposium, Sep 2007, Anaheim, CA, USA, pp.3A.2_1- 3A.2_10, ⟨10.1109/EOSESD.2007.4401748⟩
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lirmm-00199232
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A Comparative Study of Conditioning Architectures for Convective Accelerometers6th IEEE Conference on SENSORS 2007, Oct 2007, pp.107-110
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lirmm-00194571
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The future of Embedded Test within the Design for Micro & Nano Manufacture NoEWorkshop on Design for Reliability and Manufacturability in MNT, Apr 2006, Stresa, Lago Maggiore, Italy
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lirmm-00406909
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Conception de Microsystèmes Monolithiques Testables et Robustes aux Variations de ProcessEcole d'hiver Francophone sur les Technologies de Conception des Systèmes Embarqués Hétérogènes (FETCH 2007), 2007, Grenoble, France
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lirmm-00406918
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Réjection du bruit d'alimentation du pont de Wheatstone : application aux MEMS piézorésistifsTAISA'07 : 8ème colloque sur le Traitement Analogique de l'Information, du Signal et ses Applications, Oct 2007, Lyon, France. Session 4A : Capteurs
Communication dans un congrès
lirmm-00202769
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A Fault-Tolerant MEF Peptide Synthesizer using Control and Direct Sensing Electrodes Employing Current and Impedance TestsIMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, pp.176-181
Communication dans un congrès
lirmm-00161699
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Méthodes alternatives pour le test de MEMSJournées Nationales du GDR Micro et Nano Systèmes, France
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lirmm-00406946
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On the Use of LVTPNP in ESD Protection StructuresIEW'07: International Electrostatic Discharge Workshop, May 2007, Lake Tahoe, CA, United States
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lirmm-00199246
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Accéléromètre convectif CMOS en boucle ferméeTAISA'2007 : 8ème colloque sur le Traitement Analogique de l'Information, du Signal et ses Applications, pp.107-110
Communication dans un congrès
lirmm-00181093
v1
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Challenges in MEMS Manufacture Testing and Embedded Test SolutionsNTC (Northern Test Center) Remote and Embedded Testing Seminar, Finland
Communication dans un congrès
lirmm-00406914
v1
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Design and Characterization of a Bulk-Acoustic-Resonator (FBAR)MEMSWAVE'07: 8th International Symposium on RF MEMS and RF Microsystems, Jun 2007, Barcelone, Spain
Communication dans un congrès
lirmm-00203361
v1
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A Digitally Testable Capacitance-Insensitive Mixed-Signal FilterETS: European Test Symposium, May 2007, Freiburg, Germany. pp.21-26, ⟨10.1109/ETS.2007.6⟩
Communication dans un congrès
lirmm-00158154
v1
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Instantaneous de-embedding of the on-wafer Equivalent-Circuit Parameters of Acoustic Resonator (FBAR) for Integrated Circuit ApplicationsSBCCI: Symposium on Integrated Circuits and Systems Design, Sep 2007, Copacabana, Rio de Janeiro, Brazil. pp.212-217, ⟨10.1145/1284480.1284539⟩
Communication dans un congrès
lirmm-00203350
v1
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Partially Depleted SOI Body-Contacted MOSFET-Triggered Silicon Controlled Rectifier for ESD ProtectionEOS/ESD Symposium, Sep 2006, Tucson (USA), pp.6
Communication dans un congrès
lirmm-00112952
v1
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HDL Simulation of a Thermal Accelerometer for System DesignXX EUROSENSORS, Sep 2006, Göteborg (Sweden)
Communication dans un congrès
lirmm-00102170
v1
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Design for Manufacturing of MNT-based Systems: A Test CaseJournées Nationales du GDR Micro et Nano-Systèmes, France
Communication dans un congrès
lirmm-00406847
v1
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Design for Manufacturing of MNT-based Systems: a test caseJournées nationales du GDR Micro et Nano Systèmes, Lille, France
Communication dans un congrès
lirmm-00406951
v1
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Read-Out Circuit in RT-FluxgateISCAS'06: IEEE International Symposium on Circuits and Systems, pp.5910-5913
Communication dans un congrès
lirmm-00406820
v1
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A simulation tool for CDM stress evaluation at circuit levelEOS/ESD/EMI Workshop, May 2006, Toulouse, France. pp.89-92
Communication dans un congrès
lirmm-00112986
v1
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Challenges in Manufacturing Test of MNT-based SystemsIMSTW'06: 12th International Mixed Signal Testing Workshop, Jun 2006
Communication dans un congrès
lirmm-00128280
v1
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Modeling of a CMOS Convective Accelerometer for HDL IntegrationESSDERC'06: 36th European Solid-State Device Research Conference - ESSCIRC'06: 32nd European Solid-State Circuits Conference, Sep 2006, Montreux (Switzerland), pp.134-137
Communication dans un congrès
lirmm-00102127
v1
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Challenges in Manufacturing Test of Micro and Nano-SystemsWorkshop on Design for Reliability and Manufacturability in MNT, France
Communication dans un congrès
lirmm-00406837
v1
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On the Testing of the Electronic Conditioning Chain of a CMOS MEMS Based Magnetic Field SensorLATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, Argentina. pp.29-34
Communication dans un congrès
lirmm-00102750
v1
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Electro-thermal short pulsed simulation for SOI technologyESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Oct 2006, Wuppertal, Germany
Communication dans un congrès
lirmm-00112981
v1
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InP HBT XOR and Phase-Detector for 40Gbit/s Clock and Data Recovery (CDR)MIKON: Microwaves, Radar & Wireless Communications, May 2006, Paris, France. pp.1115-1118, ⟨10.1109/MIKON.2006.4345382⟩
Communication dans un congrès
lirmm-00202634
v1
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Absolute Pitch, Roll and Yaw Measurement on CMOS4th IEEE Conference on Sensors, Oct 2005, Irvine, CA (USA), pp.133-136
Communication dans un congrès
lirmm-00154128
v1
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Offset and Noise Rejection Analysis in CMOS Piezoresistive SensorsEUROSENSORS, Sep 2005, Barcelona, Spain
Communication dans un congrès
lirmm-00106543
v1
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BIST Implementation of Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field SensorLATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.207-212
Communication dans un congrès
lirmm-00106516
v1
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A Monolithic CMOS 3-Axis Accelerometer Combining Piezoresistive and Heat Transfer EffectsPRIME'05: PhD Research in Microelectronics and Electronics, Jul 2005, Lausanne (Switzerland), pp.219-222
Communication dans un congrès
lirmm-00106064
v1
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Design&Test of an Oscillation Based System Architecture for DNA Sensor ArraysIMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.234-239
Communication dans un congrès
lirmm-00106525
v1
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XOR en technologie TBH InP pour les futures transmissions optiques à 40 Gb/s14èmes Journées Nationales Microondes, 2005, Paris, France
Communication dans un congrès
lirmm-00406830
v1
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Electro-Thermal On-Line Testing of a MEMS Magnetometer Through Bias ModulationLATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.213-218
Communication dans un congrès
lirmm-00106517
v1
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On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field SensorVTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.213-218
Communication dans un congrès
lirmm-00105996
v1
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Design of a Micromachined CMOS CompassTRANSDUCERS'05, Jun 2005, Séoul (Corée), pp.405-408
Communication dans un congrès
lirmm-00106457
v1
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Interfaces pour microsystèmes magnétiquesJournées Nationales de la Section Electronique du Club EEA "Interfaces Capteurs : Vers les Micro-Nanosystèmes », France
Communication dans un congrès
lirmm-00406816
v1
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Towards On-Line Testing of MEMS Using Electro-Thermal ExcitationETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.76-81
Communication dans un congrès
lirmm-00106009
v1
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A Broad-Band Active Frequency Doubler Operating up to 120 GHzEuMC: European Microwave Conference, Oct 2005, Paris, France
Communication dans un congrès
lirmm-00406824
v1
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Experimental and Finite-Element Study of Convective Accelerometer on CMOSEUROSENSORS, Sep 2005, Barcelona, Spain
Communication dans un congrès
lirmm-00106544
v1
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Comparison Between 0.13 µm PD-SOI Gated Diode and non Gated Diode through DC TCAD SimulationsEUROSOI'05, Jan 2005, Grenade, Spain
Communication dans un congrès
lirmm-00106519
v1
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Physics and Design Optimization of ESD Diode for 0.13mm PD-SOI TechnologyEOS/ESD: Electrical Overstress/Electrostatic Discharge, Sep 2005, Anaheim, United States
Communication dans un congrès
lirmm-00106041
v1
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Superposition vs. Modulation: A Comparative Analysis for Electro-Thermal On-Line MEMS TestingIMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.212-219
Communication dans un congrès
lirmm-00106522
v1
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Challenges in Manufacturing Test of Micro and Nano-SystemsThe Innovative Manufacturing Research Conference, Scottish Manufacturing Institute, France
Communication dans un congrès
lirmm-00406781
v1
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VHDL-AMS Fault Simulation for Testing DNA Bio-Sensing ArraysIEEE SENSORS, Oct 2005, Irvine, United States. ⟨10.1109/ICSENS.2005.1597878⟩
Communication dans un congrès
lirmm-00106042
v1
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An A/D Interface for Resonant Piezoresistive MEMS SensorISIE 2004 - IEEE International Symposium on Industrial Electronics, May 2004, Ajaccio, France. pp.83-88, ⟨10.1109/ISIE.2004.1571786⟩
Communication dans un congrès
lirmm-00108896
v1
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Tutorial on Test Engineering and Design for Testability of Micro- and Nano- Systems1st DfMM Summer School, 2004
Communication dans un congrès
lirmm-00109141
v1
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Investigations on the Use of EWS Data for Failure Diagnosis EnhancementLATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena (Colombia), pp.6-10
Communication dans un congrès
lirmm-00108652
v1
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On the Use of Electrical Stimuli for MEMS TestingLATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.118-122
Communication dans un congrès
lirmm-00108651
v1
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Electrically-Induced Thermal Stimuli for MEMS TestingETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.60-65
Communication dans un congrès
lirmm-00108904
v1
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A DC-100 GHz Frequency Doubler in InP DHBT TechnologyMTT-S: Microwave Theory and Techniques Society, Jun 2004, Texas, United States. pp.167-170, ⟨10.1109/MWSYM.2004.1335834⟩
Communication dans un congrès
lirmm-00108815
v1
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Electrically-Induced Thermal Stimuli for MEMS Testing1st DfMM Summer School, 2004
Communication dans un congrès
lirmm-00109142
v1
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A CMOS MEMS Accelerometer with Bulk MicromachiningEUROSENSORS, Sep 2004, Rome, Italy
Communication dans un congrès
lirmm-00108794
v1
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Optimised Probing Flow for High Speed Fault LocalizationISTFA'04: International Symposium on Testing and Failure Analysis, Nov 2004, Worcester (USA)
Communication dans un congrès
lirmm-00108898
v1
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Improving the Efficiency of the Oscillation-Based Test Methodology for Parametric FaultsLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.234-237
Communication dans un congrès
lirmm-00269433
v1
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Electrical Modeling of LSCRs in Deep Submicron CMOS Technologies for Circuit-Level Simulation of ESDBCTM 2003 - Bipolar/BiCMOS Circuits and Technology Meeting, Sep 2003, Toulouse, France. pp.97-100, ⟨10.1109/BIPOL.2003.1274943⟩
Communication dans un congrès
lirmm-00269608
v1
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STMSCR: A New Multi-Finger SCR-Based Protection Structure Against ESDEOS/ESD Symposium, Las Vegas (USA), pp. 223-241
Communication dans un congrès
lirmm-00269603
v1
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A Novel SCR-Based Protection Structure Against ESD with Efficient Multi-Finger TriggeringESSDERC 2003 - 33rd European Solid-State Device Research Conference, Sep 2003, Estoril, Portugal. pp.207-210, ⟨10.1109/ESSDERC.2003.1256850⟩
Communication dans un congrès
lirmm-00269605
v1
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Piezoresistive CMOS Beams for Inertial SensingIEEE SENSORS, Oct 2003, Toronto, Canada. pp.451-456, ⟨10.1109/ICSENS.2003.1278978⟩
Communication dans un congrès
lirmm-00269470
v1
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Low Noise CMOS Amplifier for a Piezoresistive Magnetic Field SensorDCIS: Design of Circuits and Integrated Systems, Nov 2003, Ciudad Real, Spain. pp.639-644
Communication dans un congrès
lirmm-00269472
v1
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Use of a Statistical Approach for Efficient Implementation of Oscillation-Based Test StrategyIMSTW 2003 - 9th IEEE International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.99-103
Communication dans un congrès
lirmm-00269582
v1
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On the Synthesis of Analog Cascaded Filters with Optimal Test Point InsertionLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.212-216
Communication dans un congrès
lirmm-00269499
v1
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Design and Simulation of a CMOS MEMS Using Standard Microelectronic CAD EnvironmentNANOTECH 2003 - Nanotechnology Conference and Trade Show, Feb 2003, San Francisco, CA, United States. pp.472-475
Communication dans un congrès
lirmm-00269546
v1
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Amplificateur CMOS Faible Bruit pour Micro Capteur MEMSTAISA'03: Traitement Analogique de l'Information, du Signal et ses Applications, Oct 2003, Louvain, Belgique. pp.71-74
Communication dans un congrès
lirmm-00269460
v1
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Implementation of an Experimental IEEE 1149.4 Mixed-Signal Test ChipBTW 2002 - 1st IEEE International Board Test Workshop, Oct 2002, Baltimore, United States. paper 4.2
Communication dans un congrès
lirmm-00269342
v1
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Experimental test infrastructure supporting IEEE 11494 StandardETW: European Test Workshop, 2002, Corfou, Greece
Communication dans un congrès
lirmm-00268606
v1
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On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanichal SystemsDATE: Design, Automation and Test in Europe, Mar 2002, Paris, France. pp.1120-1120, ⟨10.1109/DATE.2002.998476⟩
Communication dans un congrès
lirmm-00268488
v1
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Impact of Environmental Parameters on CMOS MEMS StructuresCANEUS, Aug 2002, Montreal, Canada
Communication dans un congrès
lirmm-00269356
v1
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Conception et Test d'une Micro-Boussole Electromécanique IntégréeColloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 97-100
Communication dans un congrès
lirmm-00269324
v1
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Caractérisation et Modélisation de Thyristors Parasites en Technologie CMOS Fortement SubmicroniqueColloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 137-140
Communication dans un congrès
lirmm-00269319
v1
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Micromachined CMOS Magnetic Field Sensors with Low-Noise Signal ConditioningMEMS'02: IEEE International Conference on Micro Electro Mechanical Systems, Las Vegas, Nevada, USA, pp.256-259
Communication dans un congrès
lirmm-00268486
v1
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Design of an IEEE 1149.4 Test Chip with Extended ABM FunctionalityIMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Montreux (Suisse), France. pp. 153-159
Communication dans un congrès
lirmm-00269340
v1
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Protection contre les ESD : Caractérisation et Modélisation de Thyristors ParasitesEOS/ESD/EMI Workshop, Toulouse (France), France. pp.P nd
Communication dans un congrès
lirmm-00269343
v1
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Testing Reasonant Micro-Electro-Mechanical Sensors Using the Oscillation-Based Test MethodologyLATW 2002 - 3rd IEEE Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.99-104
Communication dans un congrès
lirmm-00269323
v1
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On the Use of CMOS 0n-Chip Mechanical Devices for Spectral AnalysisEUROSENSORS, Sep 2002, Prague, Czech Republic. pp.191-192
Communication dans un congrès
lirmm-00268509
v1
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Designing Testable Analog Filters with Optimal DFT InsertionIMSTW: International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.201-203
Communication dans un congrès
lirmm-00269341
v1
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Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical SystemsVTS'02: 20th IEEE VLSI Test Symposium, Monterey, CA, USA, pp.439-444
Communication dans un congrès
lirmm-00268484
v1
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Impact of Power-Clock Network on Adiabatic LogicColloque du GDR SoC-SiP, Jun 2016, Nantes, France. , 10ème Colloque National du GDR SoC-SiP, 2016
Poster de conférence
lirmm-01456996
v1
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FINMINA: a French national project to promote Innovation in Higher Education in Microelectronics and NanotechnologiesITHET: Information Technology Based Higher Education and Training, Sep 2014, York, United Kingdom. Information Technology Based Higher Education and Training, 2014, ⟨10.1109/ITHET.2014.7155715⟩
Poster de conférence
hal-01122242
v1
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A Time-Efficient Simulation Flow for DAC Characterization & OptimizationDCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.298-299, 2012
Poster de conférence
lirmm-00814994
v1
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FEM study of a 3-axis thermal accelerometer based on free convection in a microcavityMSM'2012: Modeling & Simulation of Microsystems, Microtech Conference & Expo, Santa Clara, United States. pp.4, 2012
Poster de conférence
lirmm-00814247
v1
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Pressure Sensor for Smart Wafer-Level Packaging of MEMSEUROSENSORS, Sep 2008, Dresden, Germany. 22nd European Conference on Solid-State Transducers, pp.408-411, 2008
Poster de conférence
lirmm-00325109
v1
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Design of CMOS Cantilevers for Intertial SensingEUSPEN: European Society for Precision Engineering and Nanotechnology, May 2005, Montpellier, France. 5th International Conference of the European Society for Precision Engineering and Nanotechnology, pp.341-344, 2005
Poster de conférence
lirmm-00106001
v1
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Design of a High Resolution MEMS-Based CMOS MagnetometerEUSPEN: European Society for Precision Engineering and Nanotechnology, May 2005, Montpellier, France. 5th International Conference of the European Society for Precision Engineering and Nanotechnology, pp.287-290, 2005
Poster de conférence
lirmm-00105999
v1
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On the Development of a Low-Cost Diagnostic Flow for Efficient Failure AnalysisETS: European Test Symposium, May 2004, Ajaccio, France. 9th IEEE European Test Symposium, 2004
Poster de conférence
lirmm-00108658
v1
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Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP 2015)IEEE, 2015, 978-1-4799-8625-5
Ouvrages
lirmm-01432968
v1
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Proceedings of Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP 2014)Vice General Chair: Pascal NOUET. EDA Publishing, 2014
Ouvrages
lirmm-01434883
v1
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Ultra-Low-Power SensorsM. Belleville and C. Condemine. Energy Autonomous Micro and Nano Systems, ISTE Ltd and John Wiley & Sons Inc, pp.207-237, 2012, 978-1-84821-359-9
Chapitre d'ouvrage
lirmm-00803687
v1
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Les capteurs à ultra-basse consommationM. Belleville et C. Condemine. Micro et nanosystèmes autonomes en énergie, des applications aux fonctions et technologies, Hermès-Lavoisier, pp.237-269, 2012, 978-2-7462-2517-6
Chapitre d'ouvrage
lirmm-00803681
v1
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Analog and Mixed-Signal Test Bus: IEEE 1149.4 Test StandardHuertas J.L. Test and Design-for-Testability in Mixed-Signal Integrated Circuits, Kluwer Academic Publishers, pp.28, 2004, 1-4020-7724-6
Chapitre d'ouvrage
lirmm-00109159
v1
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Impact of Technology Spreading on MEMS Design RobustnessSOC Design Methodologies, 90, Kluwer Academic Publishers, pp.241-251, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_21⟩
Chapitre d'ouvrage
lirmm-00268485
v1
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Interconnect Capacitance Modelling in a VDSM CMOS TechnologySOC Design Methodologies, 90, Kluwer Academic Publishers, pp.133-144, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_12⟩
Chapitre d'ouvrage
lirmm-00268482
v1
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Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensingSOC Design Methodologies, 90, Kluwer Academic Publishers, pp.461-472, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_39⟩
Chapitre d'ouvrage
hal-01105261
v1
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Noise Optimisatioin of a Piezoresistive CMOS MEMS for Magnetic Field SensingSOC Design Methodologies, 90, Kluwer Academic Publishers, pp.461-472, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_40⟩
Chapitre d'ouvrage
lirmm-00268487
v1
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MEMS monolithiques.Hermès science publication, 1 (1), 2000, Nano et Micro Technologies, micro-capteurs et microsystèmes intégrés, 9-782746-202422
Chapitre d'ouvrage
hal-01105274
v1
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Read circuit comprising a read amplifier, and corresponding memory deviceFrance, Patent n° : FR2301698A. 2023
Brevet
lirmm-04769193
v1
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Circuit d'amplification d'un signal représentant une variation de résistance d'une résistance variable et capteur correspondantFrance, N° de brevet: FR0854585A. 2008
Brevet
lirmm-00363897
v1
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Gated thyristor and related system and methodUnited States, Patent n° : FR20060052837. 2006
Brevet
lirmm-00406923
v1
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Electrostatic Discharge Protection Device Comprising Several ThyristorsFrance, Patent n° : FR0205009A. 2002
Brevet
lirmm-00406883
v1
|
|
3D Orientation Determination DEMO2008
Autre publication scientifique
lirmm-00361236
v1
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Remote Access to Manufacturing Test Facilities: a Reality in IC, a dream in MEMS2006, pp.39-41
Autre publication scientifique
lirmm-00128278
v1
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Towards package opening detection at power-up by monitoring thermal dissipation2024
Pré-publication, Document de travail
lirmm-04703369
v1
|
|
A Simple Protocol to Compare EMFI platforms2020
Pré-publication, Document de travail
lirmm-03626807
v1
|
Study of a Multi-Chip Circuit under CDM Stress06024, 2006, 20 p
Rapport
lirmm-00102726
v1
|
|
Modelling and Comparison of TQFP48 and GBA64 Packages in CDM Environment06022, 2006, 40 p
Rapport
lirmm-00102724
v1
|
|
HBM and CDM Stress Evaluation at Circuit Level06023, 2006, 15 p
Rapport
lirmm-00102725
v1
|
|
Introduction aux Microsystèmes (MEMS)2004
Rapport
(rapport contrat/projet)
lirmm-00109128
v1
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Caractérisation TLP des Structures STMSCR du Run H8T1062003, pp.P nd
Rapport
(rapport technique)
lirmm-00269719
v1
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Modélisation Electrique de LSCR en Technologie H92002
Rapport
(rapport technique)
lirmm-00268608
v1
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