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Patrick Girard
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Documents
Identifiants chercheurs
- patrick-girard-lirmm
- 0000-0003-0722-8772
Présentation
Publications
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A comprehensive framework for cell-aware diagnosis of customer returnsMicroelectronics Reliability, 2022, 135, pp.114595. ⟨10.1016/j.microrel.2022.114595⟩
Article dans une revue
lirmm-03768999v1
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Cell-Aware Defect Diagnosis of Customer Returns Based on Supervised LearningIEEE Transactions on Device and Materials Reliability, 2020, 20 (2), pp.329-340. ⟨10.1109/TDMR.2020.2992482⟩
Article dans une revue
lirmm-03031823v1
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Cell-Aware Diagnosis of Customer Returns Using Bayesian InferenceISQED 2021 - 22nd International Symposium on Quality Electronic Design, Apr 2021, Santa Clara (virtual), United States. pp.48-53, ⟨10.1109/ISQED51717.2021.9424337⟩
Communication dans un congrès
hal-03266815v1
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Learning-Based Cell-Aware Defect Diagnosis of Customer ReturnsETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia. pp.1-2, ⟨10.1109/ETS48528.2020.9131601⟩
Communication dans un congrès
lirmm-03035669v1
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A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer ReturnsITC 2020 - IEEE International Test Conference, Nov 2020, Washington DC, United States. pp.1-10, ⟨10.1109/ITC44778.2020.9325246⟩
Communication dans un congrès
lirmm-03034264v1
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Towards Improvement of Mission Mode Failure Diagnosis for System-on-ChipIOLTS 2019 - 25th International Symposium on On-Line Testing And Robust System Design, Jul 2019, Rhodes, Greece. pp.21-26, ⟨10.1109/IOLTS.2019.8854388⟩
Communication dans un congrès
lirmm-02395493v1
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Machine Learning Support for Fault Diagnosis of System-on-ChipSpringer Nature Switzerland AG, 2023, ISBN 978-3-031-19638-6 ISBN 978-3-031-19639-3 (eBook). ⟨10.1007/978-3-031-19639-3⟩
Ouvrages
hal-03990006v1
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Defect Diagnosis Techniques for Silicon Customer ReturnsFrontiers of Quality Electronic Design (QED), Springer International Publishing, pp.641-676, 2023, 978-3-031-16344-9. ⟨10.1007/978-3-031-16344-9_17⟩
Chapitre d'ouvrage
lirmm-03986615v1
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