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Patrick Girard
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Documents
Identifiants chercheurs
- patrick-girard-lirmm
- 0000-0003-0722-8772
Présentation
Publications
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Analysis of resistive defects on a foundry 8T SRAM-based IMC architectureMicroelectronics Reliability, 2023, 147, pp.115029. ⟨10.1016/j.microrel.2023.115029⟩
Article dans une revue
hal-04129470v1
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Intra-cell Resistive-Open Defect Analysis on a Foundry 8T SRAM-based IMC ArchitectureETS 2023 - 28th IEEE European Test Symposium, May 2023, Venise, Italy. ⟨10.1109/ETS56758.2023.10174107⟩
Communication dans un congrès
hal-04164663v1
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Analysis of Read Port Short Defects in an 8T SRAM-based IMC Architecture16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France
Communication dans un congrès
lirmm-03990078v1
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