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0000-0002-8476-5785
Work experience
Education
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On the importance of adding ToF-SIMS MS/MS data to existing mass spectral databases2025
Pré-publication, Document de travail
hal-05386638
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Matrices to enhance the ion yield of Organic Light Emitting Devices molecules in Time of Flight Secondary Ion Mass Spectrometry: an interesting alchemist solutionJournal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, 2024, B 42 (4), pp.044003. ⟨10.1116/6.0003648⟩
Article dans une revue
cea-04765391
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