Richard DAUBRIAC

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Publications

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Impact of impurities on leakage current induced by High-Energy Density Pulsed Laser Annealing in Si diodes

Richard Monflier , Richard Daubriac , Mahmoud Haned , Toshiyuki Tabata , François Olivier et al.

IEEE Transactions on Electron Devices, 2025, 72 (11), pp.5860 - 5867. ⟨10.1109/TED.2025.3614566⟩

Article dans une revue hal-04878600v2
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Rapid Quantification of Threading Dislocation Networks in Topologically Insulating Bi 1− x Sb x Thin Films via Deep‐Learning Analysis of Etch Pits

Leonardo Cancellara , Mohamed Ali Khaled , Richard Daubriac , Salima Fekraoui , Alexandre Arnoult et al.

Advanced Engineering Materials, 2025, ⟨10.1002/adem.202501696⟩

Article dans une revue hal-05398988v1
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Evolution of the liquid/solid interface roughness in Si$_{1-x}$Ge$_x$ layers processed by nanosecond laser annealing

Rémi Demoulin , Richard Daubriac , S. Kerdilès , L. Dagault , O. Adami et al.

Applied Surface Science, 2025, 684, pp.161982. ⟨10.1016/j.apsusc.2024.161982⟩

Article dans une revue hal-04821556v1
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Nanosecond laser annealing: Impact on superconducting silicon on insulator monocrystalline epilayers

Y. Baron , J. Lábár , S. Lequien , B. Pécz , R. Daubriac et al.

APL Materials, 2024, 12 (12), ⟨10.1063/5.0231177⟩

Article dans une revue hal-04823654v1

Laser‐Annealed SiO 2 /Si 1− x Ge x Scaffolds for Nanoscaled Devices, Synergy of Experiment, and Computation

Damiano Ricciarelli , Jonas Müller , Guilhem Larrieu , Ioannis Deretzis , Gaetano Calogero et al.

Physica Status Solidi A (applications and materials science), 2024, 221 (24), pp.2400120. ⟨10.1002/pssa.202400120⟩

Article dans une revue cea-04769530v1
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Large-Scale Epitaxial Integration of Single-Crystalline BiSb Topological Insulator on GaAs (111)A

Mohamed Ali Khaled , Leonardo Cancellara , Salima Fekraoui , Richard Daubriac , François Bertran et al.

ACS Applied Electronic Materials, 2024, 6 (5), pp.3771-3779. ⟨10.1021/acsaelm.4c00400⟩

Article dans une revue hal-04584442v1
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Impact of surface reflectivity on the ultra-fast laser melting of silicon-germanium alloys

Damiano Ricciarelli , Giovanni Mannino , Ioannis Deretzis , Gaetano Calogero , Giuseppe Fisicaro et al.

Materials Science in Semiconductor Processing, 2023, 165, pp.107635. ⟨10.1016/j.mssp.2023.107635⟩

Article dans une revue hal-04344631v1
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Structural and Electrical Characterizations of BiSb Topological Insulator Layers Epitaxially Integrated on GaAs

Dima Sadek , Richard Daubriac , Corentin Durand , Richard Monflier , Quentin Gravelier et al.

Crystal Growth & Design, 2022, 22 (8), pp.5081-5091. ⟨10.1021/acs.cgd.2c00585⟩

Article dans une revue hal-03775836v1

Superconducting Polycrystalline Silicon Layer Obtained by Boron Implantation and Nanosecond Laser Annealing

R. Daubriac , P. Acosta Alba , C. Marcenat , S. Lequien , T. Vethaak et al.

ECS Journal of Solid State Science and Technology, 2021, 10 (1), pp.014004. ⟨10.1149/2162-8777/abdc41⟩

Article dans une revue hal-04442429v1

Superconducting Polycrystalline Silicon Layer Obtained by Boron Implantation and Nanosecond Laser Annealing

R. Daubriac , P. Acosta Alba , C. Marcenat , S. Lequien , T. Vethaak et al.

ECS Journal of Solid State Science and Technology, 2021, 10 (1), pp.014004. ⟨10.1149/2162-8777/abdc41⟩

Article dans une revue hal-03121810v1
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A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si 1− x Ge x and Si layers

Richard Daubriac , Emmanuel Scheid , Hiba Rizk , Richard Monflier , Sylvain Joblot et al.

Beilstein Journal of Nanotechnology, 2018, 9, pp.1926 - 1939. ⟨10.3762/bjnano.9.184⟩

Article dans une revue hal-01921179v1

Epitaxial Topological Insulator Bi1 xSbx lms on GaAs substrates for Spintronic applications

Mohamed Ali Khaled , Danny Petty Gweha Nyoma , Salima Fekraoui , Leonardo Cancellara , Richard Daubriac et al.

Journées de la Matière Condensée, Société Française de Physique, Oct 2024, Marseille, France

Communication dans un congrès hal-04949065v1

Characterization of epitaxial Bi1-xSbx topological insulator thin films on GaAs(111) substrates

Salima Fekraoui , Ali Khaled Mohamed , Richard Daubriac , Quentin Gravelier , Richard Monflier et al.

Journées de la Matière Condensée 2024, Société Française de Physique, Oct 2024, Marseille, France

Communication dans un congrès hal-04946094v1

Investigation of the enlargement of Ru grains and failure modes analysis in microsecond UV laser annealing

Zeinab Chehadi , Richard Daubriac , Lu Lu , Karim Huet , Zsolt Tokei et al.

2024 IEEE International Interconnect Technology Conference (IITC), Jun 2024, San Jose, United States. pp.1-3, ⟨10.1109/IITC61274.2024.10732322⟩

Communication dans un congrès hal-05202707v1

Study on the electrical properties of ultrathin in situ Boron-doped strained Si0.7Ge0.3 layers annealed by nanosecond pulsed laser

Richard Daubriac , Rémi Demoulin , Sébastien Kerdilès , P. Acosta-Alba , M. Opprecht et al.

2023 E-MRS Spring Meeting, May 2023, Strasbourg, France

Communication dans un congrès hal-04442327v1

Topological insulator Bi1-xSbx films on GaAs substrates as current-induced Spin-Orbit Torques generators

Mohamed Ali Khaled , Richard Daubriac , Leonardo Cancellara , Quentin Gravelier , Thomas Blon et al.

2023 E-MRS Fall Meeting, E-MRS, Sep 2023, Warsaw (Varsovie), Poland

Communication dans un congrès hal-04297125v1

Study of the electrical and structural properties of Ru thin films annealed by Microsecond UV Laser Annealing for future BEOL interconnections

Richard Daubriac , Leonardo Cancellara , Mohamed Ali Khaled , Lu Lu , Zeinab Chehadi et al.

2023 E-MRS Fall Meeting, Sep 2023, Warsaw, Poland

Communication dans un congrès hal-04442370v1
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Failure Mode Analysis in Microsecond UV Laser Annealing of Cu Thin Films

Rémi Demoulin , Richard Daubriac , Louis Thuries , Emmanuel Scheid , Fabien Rozé et al.

IEEE International Interconnect Technology Conference (IITC) 2022, Jun 2022, San José, California, United States. ⟨10.1109/iitc52079.2022.9881308⟩

Communication dans un congrès hal-03795894v1

Stress relaxation and dopant activation in nsec laser annealed SiGe

Fuccio Cristiano , Richard Monflier , Richard Daubriac , Rémi Demoulin , Emmanuel Scheid et al.

IWJT - International Workshop on Junction Technology, Jun 2021, Kyoto (on line), Japan. ⟨10.23919/IWJT52818.2021.9609361⟩

Communication dans un congrès hal-03449341v1
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Dopant Activation in Ultra-thin SiGeOI and SOI layers characterised by Differential Hall Effect

Richard Daubriac , Emmanuel Scheid , S. Joblot , R. Beneyton , P Acosta Alba et al.

Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, Mar 2018, Grenade, Spain

Communication dans un congrès hal-01735436v1

High performance CMOS FDSOI devices activated at low temperature

L. Pasini , P. Batude , J. Lacord , M. Cassé , B. Mathieu et al.

2016 IEEE Symposium on VLSI Technology, Jun 2016, Honolulu, United States. ⟨10.1109/VLSIT.2016.7573407⟩

Communication dans un congrès hal-01730659v1

Differential hall characterization of shallow strained SiGe layers

Richard Daubriac , Mahmoud Abou Daher , Emmanuel Scheid , Fuccio Cristiano , S. Joblot et al.

2016 IEEE Nanotechnology Materials and Devices Conference (NMDC), Oct 2016, Toulouse, France. ⟨10.1109/NMDC.2016.7777082⟩

Communication dans un congrès hal-01730652v1