Sébastien Duguay
2
Documents
Publications
- 2
Atom probe tomography for advanced nanoelectronic devices: Current status and perspectivesScripta Materialia, 2018, 148, pp.91 - 97. ⟨10.1016/j.scriptamat.2017.05.012⟩
Article dans une revue
hal-01765929v1
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3D analysis of advanced nano-devices using electron and atom probe tomographyUltramicroscopy, 2014, 136, pp.185--192. ⟨10.1016/j.ultramic.2013.10.001⟩
Article dans une revue
hal-01929139v1
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