Sébastien Vinnac

22
Documents

Publications

Publications

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Low-Voltage Schottky p-GaN HEMT Properties under Extreme Repetitive Short-Circuit Operation Conditions : 2DEG Pinch-off, Stability, Aging, Robustness and Failure-Modes Analysis [Abstract]

Frédéric Richardeau , Lucien Ghizzo , David Trémouilles , Sébastien Vinnac
35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2024, Sep 2024, Parma, Italy
Communication dans un congrès hal-04713127 v1
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On-Line Digital Fine Monitoring of SiC MOSFET Gate-Oxide Health: A Dual-Channel Gate Driving Approach

Mathis Picot-Digoix , T-L Le , S. Azzopardi , Sébastien Vinnac , Frédéric Richardeau et al.
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD), Jun 2024, Bremen, Germany. pp.84-87, ⟨10.1109/ISPSD59661.2024.10579698⟩
Communication dans un congrès hal-04647322 v2
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CMOS Gate Driver with Integrated Gate Current Monitoring Method for Fault Under Load Short Circuit Detection of SiC Power Modules

Anas El Boubkari , Nicolas Rouger , Frédéric Richardeau , Pierre Calmes , Matthew Bacchi et al.
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD), Jun 2024, Bremen, Germany. pp.454-457, ⟨10.1109/ISPSD59661.2024.10579581⟩
Communication dans un congrès hal-04647315 v1
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Design and efficiency measurement of a sub-unit for a 20kW DC-DC multiphase power converter

Bastien Pasquet , Sébastien Vinnac , Jean-Marc Blaquière , Thierry Meynard , Sébastien Sanchez
2023 IEEE International Conference on Electrical Systems for Aircraft, Railway, Ship Propulsion and Road Vehicles & International Transportation Electrification Conference (ESARS-ITEC), Mar 2023, Venice, Italy. pp.1-6, ⟨10.1109/ESARS-ITEC57127.2023.10114845⟩
Communication dans un congrès hal-04239643 v1
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Concept de grille quasi-flottante pour la protection d'un MOSFET SiC et la surveillance de l'intégrité de son oxyde basé sur une architecture de driver à résistances de grilles commutées

Mathis Picot-Digoix , Frédéric Richardeau , Wadia Jouha , Jean-Marc Blaquière , Sébastien Vinnac et al.
Symposium de Génie Électrique, Jul 2023, Lille, France. 6 p
Communication dans un congrès hal-04163149 v1
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Développement de fonctionnalités rapides, précises et intégrées CMOS, pour la commutation optimale et la protection interne des onduleurs à module SiC MOSFET

Anas Elboubkari , Matthieu Masson , Nicolas C. Rouger , Marc Cousineau , Frédéric Richardeau et al.
SYMPOSIUM DE GENIE ELECTRIQUE (SGE 2023), Jul 2023, Lille, France
Communication dans un congrès hal-04157854 v1
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p-GaN HEMT Hard Switching Fault Type Short-Circuit Detection Based on the Gate Schottky-Barrier Leakage Current and Using a Dual-Channel Segmented CMOS buffer Gate-Driver

Yazan Barazi , Frédéric Richardeau , Sébastien Vinnac , Nicolas C. Rouger
35th IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD 2023), Hong Kong University of Science and Technology, May 2023, Hong Kong, China. ⟨10.1109/ISPSD57135.2023.10147669⟩
Communication dans un congrès hal-04114246 v2
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Over-Voltage and Cross-Conduction Hard Switching Stress on Schottky Gate-Type p-GaN HEMT in Half-Bridge Operation Experimental and Physical Approaches [ESREF'23]

Lucien Ghizzo , David Trémouilles , Frédéric Richardeau , Sébastien Vinnac , François Jamin et al.
34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2023, Toulouse, France. ⟨10.1016/j.microrel.2023.115172⟩
Communication dans un congrès hal-04252379 v1
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SiC Power MOSFET Overload Detection, Short-Circuit Protection and Gate-Oxide Integrity Monitoring Using a Switched Resistors Dual-Channel Gate-Driver [ESREF'23]

Mathis Picot-Digoix , Frédéric Richardeau , Wadia Jouha , Jean-Marc Blaquière , Sébastien Vinnac et al.
34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2023), Oct 2023, Toulouse, France. ⟨10.1016/j.microrel.2023.115082⟩
Communication dans un congrès hal-04252358 v1
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Protection rapide et robuste contre les courts-circuits internes de convertisseurs à base de MOSFETs SiC

Yazan Barazi , François Boige , Nicolas C. Rouger , Jean-Marc Blaquière , Sébastien Vinnac et al.
SYMPOSIUM DE GENIE ELECTRIQUE (SGE 2021), 6 - 8 JUILLET 2021, NANTES, FRANCE, Jul 2021, Nantes, France
Communication dans un congrès hal-03287704 v1

Towards the implementation of diamond power devices in power converters and measurements of their switching losses

Nicolas C. Rouger , Damien Risaletto , Pierre Lefranc , Pierre-Olivier Jeannin , Hugo Cagnol et al.
MRS Spring Meeting 2021, Apr 2021, Seattle WA, United States
Communication dans un congrès hal-03289135 v1
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Sub-nanosecond delay CMOS Active Gate Driver for Closed-Loop dv/dt Control of GaN Transistors

Bau Plinio , Marc Cousineau , Bernardo Cogo , Frédéric Richardeau , Sébastien Vinnac et al.
31st IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD), May 2019, Shanghai, China. ⟨10.1109/ispsd.2019.8757693⟩
Communication dans un congrès hal-02157332 v1
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Short-circuit robustness of parallel SiC MOSFETs and fail-safe mode strategy

François Boige , Asad Fayyaz , Alberto Castellazzi , Frédéric Richardeau , Sébastien Vinnac
European Power Elecrtonics and Applications 2019 - IEEE ECCE Europe, Sep 2019, Gênes, Italy
Communication dans un congrès hal-02334405 v1

First practical evaluation of a complete fail-safe and 100% fault-tolerant inverter for critical load in aerospace application

Frédéric Richardeau , Sébastien Vinnac , Franck Mosser , A. Rashed , A. Boetsch et al.
8th International Conference on Recent Advances in Aerospace Actuation Systems and Components (R3ASC'18), 30 mai-1 juin 2018, Toulouse (FRANCE), 2018, Toulouse, France
Communication dans un congrès hal-03937652 v1