|
Surface Microscopy of Atomic and Molecular Hydrogen from Field-Evaporating Semiconductors
Lorenzo Rigutti
,
Enrico Di Russo
,
Florian Chabanais
,
Ivan Blum
,
Jonathan Houard
et al.
Journal articles
hal-03448318v1
|
|
In Situ Spectroscopic Study of the Optomechanical Properties of Evaporating Field Ion Emitters
P. Dalapati
,
G. Beainy
,
E. Di Russo
,
I. Blum
,
J. Houard
et al.
Journal articles
hal-03138523v1
|
|
Super-resolution Optical Spectroscopy of Nanoscale Emitters within a Photonic Atom Probe
Enrico Di Russo
,
Pradip Dalapati
,
Jonathan Houard
,
Linda Venturi
,
Ivan Blum
et al.
Journal articles
hal-03024946v1
|
|
Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography
Enrico Di Russo
,
Ivan Blum
,
Ivan Rivalta
,
Jonathan Houard
,
Gérald da Costa
et al.
Journal articles
hal-03120561v1
|
|
Capacitive effect in ultrafast laser-induced emission from low conductance diamond nanotips
Olivier Torresin
,
Julien Mauchain
,
Mario Borz
,
Ivan Blum
,
Angela Vella
et al.
Journal articles
hal-02935610v1
|
|
Effect of electrical conduction on the electron emission properties of diamond needles
Ivan Blum
,
Mario Borz
,
Olivier Torresin
,
Julien Mauchain
,
Benoît Chalopin
et al.
Journal articles
hal-02935647v1
|
|
Photoassisted and multiphoton emission from single-crystal diamond needles
M. Borz
,
M. Mammez
,
I. Blum
,
J. Houard
,
G. da Costa
et al.
Journal articles
hal-02108219v1
|
|
Compositional accuracy in atom probe tomography analyses performed on III-N light emitting diodes
E. Di Russo
,
Nikolay Cherkashin
,
Maxim Korytov
,
A. Nikolaev
,
A. Sakharov
et al.
Journal articles
hal-02298940v1
|
|
Conduction mechanisms and voltage drop during field electron emission from diamond needles
Olivier Torresin
,
Mario Borz
,
Julien Mauchain
,
Ivan Blum
,
Victor Kleshch
et al.
Journal articles
hal-02109685v1
|
|
Unraveling the metastability of C n 2+ ( n = 2–4) Clusters
Zirong Peng
,
David Zanuttini
,
Benoit Gervais
,
Emmanuelle Jacquet
,
Ivan Blum
et al.
Journal articles
hal-02107343v1
|
|
Strain sensitivity and symmetry of 2.65 eV color center in diamond nanoscale needles
L. Venturi
,
L. Rigutti
,
J. Houard
,
I. Blum
,
S. Malykhin
et al.
Journal articles
hal-02109311v1
|
|
Effect of laser illumination on the electrical conductivity of single-crystal diamond needles
L. Arnoldi
,
M. Borz
,
I. Blum
,
V. Kleshch
,
A. Obraztsov
et al.
Journal articles
hal-02294960v1
|
|
Niobium Base Superalloys: Achievement of a Coherent Ordered Precipitate Structure in the Nb Solid-Solution
François Saint-Antonin
,
Williams Lefebvre
,
Ivan Blum
Journal articles
hal-03260704v1
|
|
Field emission microscopy pattern of a single-crystal diamond needle under ultrafast laser illumination
M Mammez
,
M. Borz
,
I. Blum
,
S. Moldovan
,
L. Arnoldi
et al.
Journal articles
hal-02393669v1
|
|
Erratum: “Thermal diffusivity of diamond nanowires studied by laser assisted atom probe tomography” [Appl. Phys. Lett. 112 , 143104 (2018)]
L. Arnoldi
,
M. Spies
,
J. Houard
,
I. Blum
,
M. Ismagilov
et al.
Journal articles
hal-02109689v1
|
|
Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events
E. Di Russo
,
I. Blum
,
J. Houard
,
M. Gilbert
,
G. da Costa
et al.
Journal articles
hal-01928843v1
|
|
Thermal diffusivity of diamond nanowires studied by laser assisted atom probe tomography
L. Arnoldi
,
M. Spies
,
J. Houard
,
I. Blum
,
A. Etienne
et al.
Journal articles
hal-02061754v1
|
|
6H-SiC-Fe Nanostructures Studied by Atom Probe Tomography
Lindor Diallo
,
Abdeslem Fnidiki
,
Luc Lechevallier
,
Amjaad Zarefy
,
Jean Juraszek
et al.
Journal articles
hal-02061774v1
|
|
Dissociation of GaN 2+ and AlN 2+ in APT: Analysis of experimental measurements
David Zanuttini
,
I. Blum
,
E. Di Russo
,
L. Rigutti
,
F. Vurpillot
et al.
Journal articles
hal-02061762v1
|
|
Optothermal response of a single silicon nanotip
A. Vella
,
D. Shinde
,
J. Houard
,
E. Silaeva
,
L. Arnoldi
et al.
Journal articles
hal-02061771v1
|
|
Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography
E. Di Russo
,
F. Moyon
,
N. Gogneau
,
L. Largeau
,
E. Giraud
et al.
Journal articles
hal-01928844v1
|
|
Fe implantation effect in the 6H-SiC semiconductor investigated by Mössbauer spectrometry
Lindor Diallo
,
Lindor Diallo
,
A. Fnidiki
,
L. Lechevallier
,
F. Cuvilly
et al.
Journal articles
cea-01591469v1
|
|
Carrier Localization in GaN/AlN Quantum Dots As Revealed by Three-Dimensional Multimicroscopy
Lorenzo Mancini
,
Florian Moyon
,
David Hernàndez-Maldonado
,
Ivan Blum
,
Jonathan Houard
et al.
Journal articles
hal-01765951v1
|
|
Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage Pulsing
Lu Zhao
,
Antoine Normand
,
Jonathan Houard
,
Ivan Blum
,
Fabien Delaroche
et al.
Journal articles
hal-02611781v1
|
|
Electronic structure and stability of the SiO 2+ dications produced in tomographic atom probe experiments
D. Zanuttini
,
I. Blum
,
L. Rigutti
,
F. Vurpillot
,
J. Douady
et al.
Journal articles
hal-02107463v1
|
|
Field-Dependent Measurement of GaAs Composition by Atom Probe Tomography
Enrico Di Russo
,
Ivan Blum
,
Jonathan Houard
,
Gérald da Costa
,
Didier Blavette
et al.
Journal articles
hal-01766042v1
|
|
Simulation of field-induced molecular dissociation in atom-probe tomography: Identification of a neutral emission channel
David Zanuttini
,
Ivan Blum
,
Lorenzo Rigutti
,
François Vurpillot
,
Julie Douady
et al.
Journal articles
hal-02107497v1
|
|
Multi-excitonic emission from Stranski-Krastanov GaN/AlN quantum dots inside a nanoscale tip
L. Mancini
,
F. Moyon
,
J. Houard
,
I. Blum
,
W. Lefebvre
et al.
Journal articles
hal-01766091v1
|
|
Three-dimensional atomic-scale investigation of ZnO-Mg x Zn 1−x O m-plane heterostructures
E. Di Russo
,
L. Mancini
,
F. Moyon
,
S. Moldovan
,
J. Houard
et al.
Journal articles
hal-01766135v1
|
|
Nanoscale photoconductive switching effect applied to atom probe tomography
L. Zhao
,
Antoine Normand
,
Jonathan Houard
,
Ivan Blum
,
Fabien Delaroche
et al.
Journal articles
hal-01719197v1
|
|
Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem
L. Rigutti
,
L. Mancini
,
E. Di Russo
,
I. Blum
,
F. Moyon
et al.
Journal articles
hal-01954232v1
|
|
Dissociation of Molecular Ions During the DC Field Evaporation ZnO in Atom Probe Tomography
Ivan Blum
,
David Zanuttini
,
Lorenzo Rigutti
,
François Vurpillot
,
Julie Douady
et al.
Journal articles
hal-02107558v1
|
|
Multi-Microscopy Study of the Influence of Stacking Faults and Three-Dimensional In Distribution on the Optical Properties of m-Plane InGaN Quantum Wells Grown on Microwire Sidewalls
L. Mancini
,
Daniel Hernandez Maldonado
,
W. Lefebvre
,
J. Houard
,
I. Blum
et al.
Journal articles
hal-01954240v1
|
|
Dissociation Dynamics of Molecular Ions in High Dc Electric Field
Ivan Blum
,
Lorenzo Rigutti
,
François Vurpillot
,
Angela Vella
,
Aurore Gaillard
et al.
Journal articles
hal-01954242v1
|
|
Wavelength and shape dependent strong-field photoemission from silver nanotips
Mina R. Bionta
,
Sébastien J. Weber
,
I Blum
,
Julien Mauchain
,
Béatrice Chatel
et al.
Journal articles
hal-01401516v1
|
|
Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atoms
L. Arnoldi
,
E. P. Silaeva
,
F. Vurpillot
,
B. Deconihout
,
E. Cadel
et al.
Journal articles
hal-01929137v1
|
|
Fe-implanted 6H-SiC: Direct evidence of Fe3Si nanoparticles observed by atom probe tomography and Fe-57 Mossbauer spectroscopy
Lindor Diallo
,
L. Lechevallier
,
A. Fnidiki
,
R. Larde
,
A. Debelle
et al.
Journal articles
in2p3-01168657v1
|
|
Correlation of Microphotoluminescence Spectroscopy, Scanning Transmission Electron Microscopy, and Atom Probe Tomography on a Single Nano-object Containing an InGaN/GaN Multiquantum Well System
Lorenzo Rigutti
,
Ivan Blum
,
Deodatta Shinde
,
David Hernandez-Maldonado
,
Williams Lefebvre
et al.
Journal articles
hal-01986734v1
|
|
Kinetics of growth and consumption of Ni rich phases
G. Tellouche-Derafa
,
K. Hoummada
,
A. Derafa
,
I. Blum
,
A. Portavoce
et al.
Journal articles
hal-02385327v1
|
|
Progress in the understanding of Ni silicide formation for advanced MOS structures
Dominique Mangelinck
,
K. Hoummada
,
F. Panciera
,
M. El Kousseifi
,
I. Blum
et al.
Journal articles
hal-01951259v1
|
|
Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field
Lorenzo Mancini
,
Nooshin Amirifar
,
Deodatta Shinde
,
Ivan Blum
,
Matthieu Gilbert
et al.
Journal articles
hal-01163403v1
|
|
Combined in situ x-ray scattering and electrical measurements for characterizing phase transformations in nanometric functional films
Magali Putero
,
Benjamin Duployer
,
Ivan Blum
,
Toufik Ouled-Khachroum
,
Marie-Vanessa Coulet
et al.
Journal articles
hal-01951266v1
|
|
Direct observation of Ni decorated dislocation loops within As+-implanted silicon and arsenic clustering in Ni silicide contact
Khalid Hoummada
,
Gamra Tellouche
,
Ivan Blum
,
Alain Portavoce
,
Marion Descoins
et al.
Journal articles
hal-02385371v1
|
|
Diffusion and Redistribution of Boron in Nickel Silicides
Ivan Blum
,
Alain Portavoce
,
Lee Chow
,
Khalid Hoummada
,
Dominique Mangelinck
et al.
Journal articles
hal-02393983v1
|
|
Boron clustering in implanted NiSi
A. Portavoce
,
I. Blum
,
D. Mangelinck
,
K. Hoummada
,
L. Chow
et al.
Journal articles
hal-02385405v1
|
|
Redistribution of Alloy Elements during Nickel Silicide Formation: Benefit of Atom Probe Tomography
C. Perrin
,
K. Hoummada
,
I. Blum
,
A. Portavoce
,
M. Descoins
et al.
Journal articles
hal-02394008v1
|
|
Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films
Alain Portavoce
,
Ivan Blum
,
Lee Chow
,
Jean Bernardini
,
Dominique Mangelinck
et al.
Journal articles
hal-02394011v1
|
|
Dopant diffusivity and solubility in nickel silicides
Ivan Blum
,
Alain Portavoce
,
Khalid Hoummada
,
Gamra Tellouche
,
Lee Chow
et al.
Journal articles
hal-02385407v1
|
|
B diffusion in implanted Ni2Si and NiSi layers
I. Blum
,
A. Portavoce
,
L. Chow
,
D. Mangelinck
,
K. Hoummada
et al.
Journal articles
hal-02386108v1
|
|
Simultaneous Measurements of Lattice and Grain Boundary Diffusion Coefficients via 2-Dimensional Simulations
Ivan Blum
,
Alain Portavoce
,
Dominique Mangelinck
,
Jean Bernardini
,
Khalid Hoummada
et al.
Journal articles
hal-02394022v1
|
|
Measurement of As diffusivity in Ni2Si thin films
I. Blum
,
A. Portavoce
,
D. Mangelinck
,
R. Daineche
,
K. Hoummada
et al.
Journal articles
hal-02386115v1
|
|
Composition measurement of the Ni-silicide transient phase by atom probe tomography
K. Hoummada
,
I. Blum
,
D. Mangelinck
,
A. Portavoce
Journal articles
hal-02386090v1
|
|
Lattice and grain-boundary diffusion of As in Ni2Si
Ivan Blum
,
A. Portavoce
,
Dominique Mangelinck
,
Rachid Daineche
,
K. Hoummada
et al.
Journal articles
hal-02127829v1
|
|
Lattice and grain-boundary diffusion of As in Ni2Si
I. Blum
,
A. Portavoce
,
D. Mangelinck
,
R. Daineche
,
K. Hoummada
et al.
Journal articles
hal-02386151v1
|