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Blum Ivan

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Surface Microscopy of Atomic and Molecular Hydrogen from Field-Evaporating Semiconductors

Lorenzo Rigutti , Enrico Di Russo , Florian Chabanais , Ivan Blum , Jonathan Houard et al.
Journal of Physical Chemistry C, 2021, 125 (31), pp.17078-17087. ⟨10.1021/acs.jpcc.1c04778⟩
Journal articles hal-03448318v1
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In Situ Spectroscopic Study of the Optomechanical Properties of Evaporating Field Ion Emitters

P. Dalapati , G. Beainy , E. Di Russo , I. Blum , J. Houard et al.
Physical Review Applied, 2021, 15 (2), ⟨10.1103/physrevapplied.15.024014⟩
Journal articles hal-03138523v1
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Super-resolution Optical Spectroscopy of Nanoscale Emitters within a Photonic Atom Probe

Enrico Di Russo , Pradip Dalapati , Jonathan Houard , Linda Venturi , Ivan Blum et al.
Journal articles hal-03024946v1

Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography

Enrico Di Russo , Ivan Blum , Ivan Rivalta , Jonathan Houard , Gérald da Costa et al.
Journal of Physical Chemistry A, 2020, 124 (52), pp.10977-10988. ⟨10.1021/acs.jpca.0c09259⟩
Journal articles hal-03120561v1

Capacitive effect in ultrafast laser-induced emission from low conductance diamond nanotips

Olivier Torresin , Julien Mauchain , Mario Borz , Ivan Blum , Angela Vella et al.
New Journal of Physics, 2020, 22 (8), pp.083055. ⟨10.1088/1367-2630/aba5bf⟩
Journal articles hal-02935610v1

Effect of electrical conduction on the electron emission properties of diamond needles

Ivan Blum , Mario Borz , Olivier Torresin , Julien Mauchain , Benoît Chalopin et al.
New Journal of Physics, 2020, 22 (8), pp.083044. ⟨10.1088/1367-2630/aba392⟩
Journal articles hal-02935647v1

Photoassisted and multiphoton emission from single-crystal diamond needles

M. Borz , M. Mammez , I. Blum , J. Houard , G. da Costa et al.
Nanoscale, 2019, 11 (14), pp.6852-6858. ⟨10.1039/C9NR01001G⟩
Journal articles hal-02108219v1

Compositional accuracy in atom probe tomography analyses performed on III-N light emitting diodes

E. Di Russo , Nikolay Cherkashin , Maxim Korytov , A. Nikolaev , A. Sakharov et al.
Journal of Applied Physics, 2019, 126 (12), pp.124307. ⟨10.1063/1.5113799⟩
Journal articles hal-02298940v1
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Conduction mechanisms and voltage drop during field electron emission from diamond needles

Olivier Torresin , Mario Borz , Julien Mauchain , Ivan Blum , Victor Kleshch et al.
Ultramicroscopy, 2019, 202, pp.51-56. ⟨10.1016/j.ultramic.2019.03.006⟩
Journal articles hal-02109685v1

Unraveling the metastability of C n 2+ ( n = 2–4) Clusters

Zirong Peng , David Zanuttini , Benoit Gervais , Emmanuelle Jacquet , Ivan Blum et al.
Journal of Physical Chemistry Letters, 2019, 10 (3), pp.581-588. ⟨10.1021/acs.jpclett.8b03449⟩
Journal articles hal-02107343v1
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Strain sensitivity and symmetry of 2.65 eV color center in diamond nanoscale needles

L. Venturi , L. Rigutti , J. Houard , I. Blum , S. Malykhin et al.
Applied Physics Letters, 2019, 114 (14), pp.143104. ⟨10.1063/1.5092329⟩
Journal articles hal-02109311v1

Effect of laser illumination on the electrical conductivity of single-crystal diamond needles

L. Arnoldi , M. Borz , I. Blum , V. Kleshch , A. Obraztsov et al.
Journal of Applied Physics, 2019, 126 (4), pp.045710. ⟨10.1063/1.5092459⟩
Journal articles hal-02294960v1

Niobium Base Superalloys: Achievement of a Coherent Ordered Precipitate Structure in the Nb Solid-Solution

François Saint-Antonin , Williams Lefebvre , Ivan Blum
Crystals, 2019, 9 (7), pp.345. ⟨10.3390/cryst9070345⟩
Journal articles hal-03260704v1

Field emission microscopy pattern of a single-crystal diamond needle under ultrafast laser illumination

M Mammez , M. Borz , I. Blum , S. Moldovan , L. Arnoldi et al.
New Journal of Physics, 2019, 21 (11), pp.113060. ⟨10.1088/1367-2630/ab5857⟩
Journal articles hal-02393669v1

Erratum: “Thermal diffusivity of diamond nanowires studied by laser assisted atom probe tomography” [Appl. Phys. Lett. 112 , 143104 (2018)]

L. Arnoldi , M. Spies , J. Houard , I. Blum , M. Ismagilov et al.
Applied Physics Letters, 2018, 112 (18), pp.189901. ⟨10.1063/1.5035134⟩
Journal articles hal-02109689v1
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Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events

E. Di Russo , I. Blum , J. Houard , M. Gilbert , G. da Costa et al.
Ultramicroscopy, 2018, 187, pp.126--134. ⟨10.1016/j.ultramic.2018.02.001⟩
Journal articles hal-01928843v1
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Thermal diffusivity of diamond nanowires studied by laser assisted atom probe tomography

L. Arnoldi , M. Spies , J. Houard , I. Blum , A. Etienne et al.
Applied Physics Letters, 2018, 112 (14), pp.143104. ⟨10.1063/1.5019672⟩
Journal articles hal-02061754v1

6H-SiC-Fe Nanostructures Studied by Atom Probe Tomography

Lindor Diallo , Abdeslem Fnidiki , Luc Lechevallier , Amjaad Zarefy , Jean Juraszek et al.
IEEE Magnetics Letters, 2018, 9, pp.1-3. ⟨10.1109/lmag.2018.2829109⟩
Journal articles hal-02061774v1

Dissociation of GaN 2+ and AlN 2+ in APT: Analysis of experimental measurements

David Zanuttini , I. Blum , E. Di Russo , L. Rigutti , F. Vurpillot et al.
Journal of Chemical Physics, 2018, 149 (13), pp.134311. ⟨10.1063/1.5037010⟩
Journal articles hal-02061762v1
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Optothermal response of a single silicon nanotip

A. Vella , D. Shinde , J. Houard , E. Silaeva , L. Arnoldi et al.
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2018, 97 (7), pp.075409. ⟨10.1103/physrevb.97.075409⟩
Journal articles hal-02061771v1

Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography

E. Di Russo , F. Moyon , N. Gogneau , L. Largeau , E. Giraud et al.
Journal of Physical Chemistry C, 2018, 122 (29), pp.16704--16714. ⟨10.1021/acs.jpcc.8b03223⟩
Journal articles hal-01928844v1
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Fe implantation effect in the 6H-SiC semiconductor investigated by Mössbauer spectrometry

Lindor Diallo , Lindor Diallo , A. Fnidiki , L. Lechevallier , F. Cuvilly et al.
Journal of Applied Physics, 2017, 122, pp.083905. ⟨10.1063/1.4992102⟩
Journal articles cea-01591469v1

Carrier Localization in GaN/AlN Quantum Dots As Revealed by Three-Dimensional Multimicroscopy

Lorenzo Mancini , Florian Moyon , David Hernàndez-Maldonado , Ivan Blum , Jonathan Houard et al.
Nano Letters, 2017, 17 (7), pp.4261 - 4269. ⟨10.1021/acs.nanolett.7b01189⟩
Journal articles hal-01765951v1

Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage Pulsing

Lu Zhao , Antoine Normand , Jonathan Houard , Ivan Blum , Fabien Delaroche et al.
Microscopy and Microanalysis, 2017, 23 (2), pp.221-226. ⟨10.1017/S1431927616012666⟩
Journal articles hal-02611781v1

Electronic structure and stability of the SiO 2+ dications produced in tomographic atom probe experiments

D. Zanuttini , I. Blum , L. Rigutti , F. Vurpillot , J. Douady et al.
Journal of Chemical Physics, 2017, 147 (16), pp.164301. ⟨10.1063/1.5001113⟩
Journal articles hal-02107463v1

Field-Dependent Measurement of GaAs Composition by Atom Probe Tomography

Enrico Di Russo , Ivan Blum , Jonathan Houard , Gérald da Costa , Didier Blavette et al.
Microscopy and Microanalysis, 2017, 23 (06), pp.1067 - 1075. ⟨10.1017/s1431927617012582⟩
Journal articles hal-01766042v1

Simulation of field-induced molecular dissociation in atom-probe tomography: Identification of a neutral emission channel

David Zanuttini , Ivan Blum , Lorenzo Rigutti , François Vurpillot , Julie Douady et al.
Physical Review A : Atomic, molecular, and optical physics, 2017, 95 (6), ⟨10.1103/PhysRevA.95.061401⟩
Journal articles hal-02107497v1

Multi-excitonic emission from Stranski-Krastanov GaN/AlN quantum dots inside a nanoscale tip

L. Mancini , F. Moyon , J. Houard , I. Blum , W. Lefebvre et al.
Applied Physics Letters, 2017, 111 (24), ⟨10.1063/1.5004417⟩
Journal articles hal-01766091v1

Three-dimensional atomic-scale investigation of ZnO-Mg x Zn 1−x O m-plane heterostructures

E. Di Russo , L. Mancini , F. Moyon , S. Moldovan , J. Houard et al.
Applied Physics Letters, 2017, 111 (3), pp.032108. ⟨10.1063/1.4994659⟩
Journal articles hal-01766135v1

Nanoscale photoconductive switching effect applied to atom probe tomography

L. Zhao , Antoine Normand , Jonathan Houard , Ivan Blum , Fabien Delaroche et al.
American Journal of Physics, 2016, 116, pp.2. ⟨10.1209/0295-5075/116/27002⟩
Journal articles hal-01719197v1

Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem

L. Rigutti , L. Mancini , E. Di Russo , I. Blum , F. Moyon et al.
Microscopy and Microanalysis, 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩
Journal articles hal-01954232v1

Dissociation of Molecular Ions During the DC Field Evaporation ZnO in Atom Probe Tomography

Ivan Blum , David Zanuttini , Lorenzo Rigutti , François Vurpillot , Julie Douady et al.
Microscopy and Microanalysis, 2016, 22 (S3), pp.662-663. ⟨10.1017/S1431927616004165⟩
Journal articles hal-02107558v1

Multi-Microscopy Study of the Influence of Stacking Faults and Three-Dimensional In Distribution on the Optical Properties of m-Plane InGaN Quantum Wells Grown on Microwire Sidewalls

L. Mancini , Daniel Hernandez Maldonado , W. Lefebvre , J. Houard , I. Blum et al.
Applied Physics Letters, 2016, 108 (4), pp.042102. ⟨10.1063/1.4940748⟩
Journal articles hal-01954240v1

Dissociation Dynamics of Molecular Ions in High Dc Electric Field

Ivan Blum , Lorenzo Rigutti , François Vurpillot , Angela Vella , Aurore Gaillard et al.
Journal of Physical Chemistry A, 2016, 120 (20), pp.3654-3662. ⟨10.1021/acs.jpca.6b01791⟩
Journal articles hal-01954242v1

Wavelength and shape dependent strong-field photoemission from silver nanotips

Mina R. Bionta , Sébastien J. Weber , I Blum , Julien Mauchain , Béatrice Chatel et al.
New Journal of Physics, 2016, 18 (10), pp.103010. ⟨10.1088/1367-2630/18/10/103010⟩
Journal articles hal-01401516v1

Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atoms

L. Arnoldi , E. P. Silaeva , F. Vurpillot , B. Deconihout , E. Cadel et al.
Ultramicroscopy, 2015, 159, pp.139--146. ⟨10.1016/j.ultramic.2014.11.018⟩
Journal articles hal-01929137v1

Fe-implanted 6H-SiC: Direct evidence of Fe3Si nanoparticles observed by atom probe tomography and Fe-57 Mossbauer spectroscopy

Lindor Diallo , L. Lechevallier , A. Fnidiki , R. Larde , A. Debelle et al.
Journal of Applied Physics, 2015, 117 (issue 18), pp.183907. ⟨10.1063/1.4921056⟩
Journal articles in2p3-01168657v1

Correlation of Microphotoluminescence Spectroscopy, Scanning Transmission Electron Microscopy, and Atom Probe Tomography on a Single Nano-object Containing an InGaN/GaN Multiquantum Well System

Lorenzo Rigutti , Ivan Blum , Deodatta Shinde , David Hernandez-Maldonado , Williams Lefebvre et al.
Nano Letters, 2014, 14 (1), pp.107-114. ⟨10.1021/nl4034768⟩
Journal articles hal-01986734v1

Kinetics of growth and consumption of Ni rich phases

G. Tellouche-Derafa , K. Hoummada , A. Derafa , I. Blum , A. Portavoce et al.
Microelectronic Engineering, 2014, 120, pp.146-149. ⟨10.1016/j.mee.2013.12.015⟩
Journal articles hal-02385327v1

Progress in the understanding of Ni silicide formation for advanced MOS structures

Dominique Mangelinck , K. Hoummada , F. Panciera , M. El Kousseifi , I. Blum et al.
physica status solidi (a), 2014, 211 (1), pp.152-165. ⟨10.1002/pssa.201300167⟩
Journal articles hal-01951259v1
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Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field

Lorenzo Mancini , Nooshin Amirifar , Deodatta Shinde , Ivan Blum , Matthieu Gilbert et al.
Journal of Physical Chemistry C, 2014, 118 (41), pp.24136-24151. ⟨10.1021/jp5071264⟩
Journal articles hal-01163403v1

Combined in situ x-ray scattering and electrical measurements for characterizing phase transformations in nanometric functional films

Magali Putero , Benjamin Duployer , Ivan Blum , Toufik Ouled-Khachroum , Marie-Vanessa Coulet et al.
Thin Solid Films, 2013, 541, pp.21-27. ⟨10.1016/j.tsf.2012.11.131⟩
Journal articles hal-01951266v1

Direct observation of Ni decorated dislocation loops within As+-implanted silicon and arsenic clustering in Ni silicide contact

Khalid Hoummada , Gamra Tellouche , Ivan Blum , Alain Portavoce , Marion Descoins et al.
Microelectronic Engineering, 2013, 107, pp.184-189. ⟨10.1016/j.mee.2012.12.008⟩
Journal articles hal-02385371v1

Diffusion and Redistribution of Boron in Nickel Silicides

Ivan Blum , Alain Portavoce , Lee Chow , Khalid Hoummada , Dominique Mangelinck et al.
Defect and Diffusion Forum, 2012, 323-325, pp.415-420. ⟨10.4028/www.scientific.net/DDF.323-325.415⟩
Journal articles hal-02393983v1

Boron clustering in implanted NiSi

A. Portavoce , I. Blum , D. Mangelinck , K. Hoummada , L. Chow et al.
Scripta Materialia, 2011, 64 (9), pp.828-831. ⟨10.1016/j.scriptamat.2011.01.015⟩
Journal articles hal-02385405v1

Redistribution of Alloy Elements during Nickel Silicide Formation: Benefit of Atom Probe Tomography

C. Perrin , K. Hoummada , I. Blum , A. Portavoce , M. Descoins et al.
Defect and Diffusion Forum, 2011, 309-310, pp.161-166. ⟨10.4028/www.scientific.net/DDF.309-310.161⟩
Journal articles hal-02394008v1

Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films

Alain Portavoce , Ivan Blum , Lee Chow , Jean Bernardini , Dominique Mangelinck et al.
Defect and Diffusion Forum, 2011, 309-310, pp.63-72. ⟨10.4028/www.scientific.net/DDF.309-310.63⟩
Journal articles hal-02394011v1

Dopant diffusivity and solubility in nickel silicides

Ivan Blum , Alain Portavoce , Khalid Hoummada , Gamra Tellouche , Lee Chow et al.
physica status solidi (c), 2011, 8 (3), pp.670-673. ⟨10.1002/pssc.201000283⟩
Journal articles hal-02385407v1

B diffusion in implanted Ni2Si and NiSi layers

I. Blum , A. Portavoce , L. Chow , D. Mangelinck , K. Hoummada et al.
Applied Physics Letters, 2010, 96 (5), pp.054102. ⟨10.1063/1.3303988⟩
Journal articles hal-02386108v1

Simultaneous Measurements of Lattice and Grain Boundary Diffusion Coefficients via 2-Dimensional Simulations

Ivan Blum , Alain Portavoce , Dominique Mangelinck , Jean Bernardini , Khalid Hoummada et al.
Defect and Diffusion Forum, 2010, 297-301, pp.978-983. ⟨10.4028/www.scientific.net/DDF.297-301.978⟩
Journal articles hal-02394022v1

Measurement of As diffusivity in Ni2Si thin films

I. Blum , A. Portavoce , D. Mangelinck , R. Daineche , K. Hoummada et al.
Microelectronic Engineering, 2010, 87 (3), pp.263-266. ⟨10.1016/j.mee.2009.05.020⟩
Journal articles hal-02386115v1

Composition measurement of the Ni-silicide transient phase by atom probe tomography

K. Hoummada , I. Blum , D. Mangelinck , A. Portavoce
Applied Physics Letters, 2010, 96 (26), pp.261904. ⟨10.1063/1.3457995⟩
Journal articles hal-02386090v1

Lattice and grain-boundary diffusion of As in Ni2Si

Ivan Blum , A. Portavoce , Dominique Mangelinck , Rachid Daineche , K. Hoummada et al.
Journal of Applied Physics, 2008, 104 (11), pp.114312. ⟨10.1063/1.3035836⟩
Journal articles hal-02127829v1

Lattice and grain-boundary diffusion of As in Ni2Si

I. Blum , A. Portavoce , D. Mangelinck , R. Daineche , K. Hoummada et al.
Journal of Applied Physics, 2008, 104 (11), pp.114312. ⟨10.1063/1.3035836⟩
Journal articles hal-02386151v1

Data Mining

W. Lefebvre-Ulrikson , G. da Costa , L. Rigutti , I. Blum
Atom Probe Tomography, Elsevier, pp.279-317, 2016, 978-0-12-804647-0. ⟨10.1016/B978-0-12-804647-0.00009-7⟩
Book sections hal-01954258v1

Atom Probe Sample Preparation

I. Blum , F. Cuvilly , W. Lefebvre-Ulrikson
Atom Probe Tomography, Elsevier, pp.97-121, 2016, 978-0-12-804647-0. ⟨10.1016/B978-0-12-804647-0.00004-8⟩
Book sections hal-01954251v1