Bogdan Cretu
87
Documents
Publications
Low temperature investigation of n-channel GAA vertically stacked silicon nanosheets2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), Sep 2021, Caen, France. pp.1-4, ⟨10.1109/EuroSOI-ULIS53016.2021.9560692⟩
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Trap identification on n-channel GAA NW FETs2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Sep 2020, Caen, France. pp.1-4, ⟨10.1109/EUROSOI-ULIS49407.2020.9365281⟩
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Discussion on the Figures of Merit of Identified Traps Located in the Si Film: Surface Versus Volume Trap DensitiesECS MEETING - annulé, May 2020, Montreal, France. pp.1372-1372, ⟨10.1149/MA2020-01241372mtgabs⟩
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Processing Impact on the Low-Frequency Noise of 1.8 V Input-Output Bulk FinFETsInternational Conference on Noise and Fluctuations (ICNF), Jun 2019, Neuchâtel,, Switzerland
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Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETsJoint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2019, Grenoble, France
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Discussion of the flicker noise origin at very low temperature and polarisation operationInternational Conference on Noise and Fluctuations (ICNF), Jun 2019, Neuchâtel, Switzerland. ⟨10.5075/epfl-ICLAB-ICNF-269233⟩
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Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2019, Grenoble, France. pp.1-4, ⟨10.1109/EUROSOI-ULIS45800.2019.9041918⟩
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Si/SiGe superlattice I/O finFETs in a vertically-stacked Gate-All-Around horizontal Nanowire Technology2018 IEEE Symposium on VLSI Technology, Jun 2018, Honolulu, United States. pp.85-86, ⟨10.1109/VLSIT.2018.8510654⟩
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Identification of stable irradiation-induced defects using low frequency noise spectroscopy2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2018, Göteborg, Sweden. pp.1-4, ⟨10.1109/RADECS45761.2018.9328657⟩
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Discussion on the 1/f noise behavior in Si gate-all-around nanowire MOSFETs at liquid helium temperatures2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Mar 2018, Granada, France. pp.1-4, ⟨10.1109/ULIS.2018.8354739⟩
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Discussion on the 1/f noise behavior in Si gate-all-around nanowire MOSFETs at liquid helium temperatures2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Mar 2018, Granada, France. pp.1-4, ⟨10.1109/ULIS.2018.8354739⟩
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Impact of cryogenic temperature operation on static and low frequency noise behaviors of FD UTBOX nMOSFETs2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, France. ⟨10.1109/ULIS.2017.7962610⟩
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Impact of channel orientation on low frequency noise performances of UTBOX nMOSFETs operated at liquid nitrogen temperature2017 International Conference on Noise and Fluctuations (ICNF), Jun 2017, Vilnius, France. ⟨10.1109/ICNF.2017.7985964⟩
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On quantum effects and low frequency noise spectroscopy in Si Gate-All-Around Nanowire MOSFETs at cryogenic temperatures2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, France. ⟨10.1109/ULIS.2017.7962578⟩
Communication dans un congrès
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On trap identification in triple-gate FinFETs and Gate-All-Around nanowire MOSFETs using low frequency noise spectroscopy2017 International Conference on Noise and Fluctuations (ICNF), Jun 2017, Vilnius, France. ⟨10.1109/ICNF.2017.7985990⟩
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Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETsJoint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria
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Static and low frequency noise characterization of n-channel 16 nm UTBOX devices2016 7th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT), Dec 2016, Hammamet, France. ⟨10.1109/SETIT.2016.7939833⟩
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Study of Low Frequency Noise in Vertical NW-Tunnel FETs with Different Source CompositionsEUROSOI-ULIS’2015 Conference, Jan 2015, Bologne, Italy
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Low frequency noise spectroscopy in rotated UTBOX nMOSFETsICNF’2015 (International Conference on Noise and Fluctuations), Jun 2015, Xi’An, China. ⟨10.1109/ICNF.2015.7288588⟩
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Static and low frequency noise characterization in standard and rotated UTBOX nMOSFETsEUROSOI-ULIS’2015 Conference, Jan 2015, Bologne, Italy
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Transconductance hump in vertical gate-all-around tunnel-FETs2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, France. ⟨10.1109/S3S.2015.7333523⟩
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The Smaller the Noisier? Low Frequency Noise Diagnostics of Advanced Semiconductor Devices30th Symp on Microelectronics Technology and Device, Aug 2015, Salvador Bahia, Brazil
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Performances under saturation operation of p channel FinFETs on SOI substrates at cryogenic temperatureIEEE/CAS’2014, 2014, Sinaia, Romania. pp181-184, ⟨10.1109/SMICND.2014.6966429⟩
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Low temperature noise spectroscopy of p-channel SOI FinFETs10th Workshop of the Thematic Network on SOI Technology, Devices and Circuits, Jan 2014, tarragona, Spain. 2 p. in USB Key
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Low frequency noise assessment in advanced UTBOX SOI n-channel MOSFETs9th Workshop of the Thematic Network on SOI Technology, Devices and Circuits, Jan 2013, paris, France. 2 p. (CDROM)
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Low-Frequency Noise in High-K and SiO2 UTBOX SOI nMOSFETSChina Semiconductor Technology International Conference, Mar 2013, shangai, China. pp.87-92
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Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs9th Workshop of the Thematic Network on SOI Technology, Devices and Circuits, Jan 2013, Paris, France. 2 p. (CDROM)
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Approche projet pour l'enseignement de l'électronique analogique en 2ème année d'école d'ingénieurCETSIS 2013, Mar 2013, caen, France
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Detailled characterisation of SOI n-FinFETs at very low temperatureInternational Conference on Ultimate Integration on Silicon (ULIS), Mar 2013, Coventry, United Kingdom. 4 p
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Low frequency noise as diagnostic tools in sub-22nm MOSFET transistorsWorkshop " Oxydes Fonctionnels pour l'Intégration en Micro- et Nano-électronique ", Apr 2013, Autrans, France
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Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si filmThe International Conference on Noise and Fluctuations (ICNF), 2013, Montpellier, France. 4 p
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DC and noise performances of SOI FinFETs at very low temperature8th Workshop of the Thematic Network on SOI Technology, Devices and Circuits, Jan 2012, Montpellier, France. 2p
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On the Variability and Front-Back Coupling of the Low-frequency Noise in UTBOX SOI nMOSFETsIEEE 11th International Conference on Solid-State and Integrated Circuit Technology, Oct 2012, xian, China. 3 p
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Bruit basse fréquence dans les transistors ultrafins totalement déplétés sur substrat SOI13èmes Journées de la Matière Condensée, Aug 2012, Montpellier, France
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Low Frequency Noise Spectroscopy in Advanced nFinFETSSeventh Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits, Jan 2011, Grenade, Spain. pp55-56
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Assessment of temperature dependence of the low frequency noise in unstrained and strained FinFInternational Conference on Future Networks (ICFN ), Jun 2011, toronto, Canada. pp135-138
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Uncertainties in the estimation of low frequency noise level extracted from noise spectral density measurementsNoise and Fluctuations (ICNF), 2011 21st International Conference on,INCF, Jun 2011, Toronto, Canada. 4 p
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Low-frequency noise behavior in P-channel SOI FinFETs processed with different strain techniques20th International Conference on Noise and Fluctuations, Jun 2009, Pista, Italy. p.295-298
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Unusual noise behavior versus temperature in nFinFETs on silicon on insulator (SOI) substrates processed with different strain techniquesEUROSOI 2008 CONFERENCE PROCEEDINGS FOURTH WORKSHOP OF THE THEMATIC NETWORK ON SILICON-ON-INSULATOR TECHNOLOGY, 2008, dublin, Ireland
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Two dimensional numerical simulations of low frequency noise in polysilicon thin film transistorsInternational TFT Conference'07, Jan 2007, Rome, Italy
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Numerical simulations of conduction and low-frequency noise in polysilicon TFTsEMRS, May 2006, Nice, France
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Numerical simulation of conduction and low-frequency noise in polysilicon TFTsSpring Meeting EMRS, May 2006, Nice, France. pp.Poster
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Apparent noise parameter behavior in n-MOS transistors operating from subthreshold to above-threshold regionsProceedings of the 18th International Conference on noise in Physical Systems and 1/f Fluctuation ; ICNF 2005 ; CP780 Noise and Fluctuations, Sep 2005, Salamanca, Spain. pp.319-322
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Bruit électrique basse fréquence comme outil de diagnostic non destructif pour des technologies MOS submicroniques et nanométriquesElectronique. Université de Caen, 2013
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