Bogdan Cretu

46
Documents

Publications

Publications

Investigation of DC and low frequency noise parameters of junctionless GAA Si VNW pMOSFETs in the temperature range from 80 K to 340 K

A. Tahiat , B. Cretu , A. Veloso , E. Simoen
Solid-State Electronics, 2025, 225, pp.109068. ⟨10.1016/j.sse.2025.109068⟩
Article dans une revue hal-05118056 v1

Novel Y-function methodology parameter estimation from weak to strong inversion operation

A. Tahiat , B. Cretu , A. Veloso , E. Simoen
Solid-State Electronics, 2025, 225, pp.109071. ⟨10.1016/j.sse.2025.109071⟩
Article dans une revue hal-05118066 v1

Refined Analysis of the Correlated Carrier Number and Mobility Fluctuations Mechanism in MOSFETs

Bogdan Cretu , Abderrahim Tahiat , Anabela Veloso , Eddy Simoen
IEEE Transactions on Electron Devices, 2024, 71 (10), pp.5860-5866. ⟨10.1109/TED.2024.3445310⟩
Article dans une revue hal-05118050 v1

(Invited) In-Depth Understanding of the Key Contributors to the Total Flicker Noise in Advanced Logic Devices

Bogdan Cretu , Abderrahim Tahiat , Anabela Veloso , Eddy Simoen
ECS Transactions, 2023, 112 (1), pp.53-63. ⟨10.1149/11201.0053ecst⟩
Article dans une revue hal-04335869 v1

Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs

Bogdan Cretu , Anabela Veloso , Eddy Simoen
IEEE Transactions on Electron Devices, 2023, 70 (1), pp.254-260. ⟨10.1109/TED.2022.3225248⟩
Article dans une revue hal-04335878 v1

(Invited) In-Depth DC and Low Frequency Noise Characterization of Nanosheet FETs at Room and Cryogenic Temperatures

Bogdan Cretu , Abderrahim Tahiat , Anabela Veloso , Eddy Simoen
ECS Transactions, 2023, 111 (1), pp.197-208. ⟨10.1149/11101.0197ecst⟩
Article dans une revue hal-04335860 v1
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In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets

B. Cretu , A. Veloso , E. Simoen
Solid-State Electronics, 2023, 201, pp.108591. ⟨10.1016/j.sse.2023.108591⟩
Article dans une revue hal-04335886 v1
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Is there a limit when the access resistance impact on the extraction of key GAA NS FETs devices parameters can (not) be avoided?

A. Tahiat , B. Cretu , A. Veloso , E. Simoen
Solid-State Electronics, 2023, 209, pp.108711. ⟨10.1016/j.sse.2023.108711⟩
Article dans une revue hal-04335903 v1

Novel Y-function based strategy for parameter extraction in S/D asymmetric architecture devices and low frequency noise characterization in GAA Si VNW pMOSFETs

A. Tahiat , B. Cretu , A. Veloso , E. Simoen
Solid-State Electronics, 2023, 209, pp.108709. ⟨10.1016/j.sse.2023.108709⟩
Article dans une revue hal-04335891 v1

DC and low a frequency noise analysis of p channel gate all around vertically stacked silicon nanosheets

B. Cretu , Anabela Veloso , Eddy Roger Simoen
Solid-State Electronics, 2022, 194, pp.108360. ⟨10.1016/j.sse.2022.108360⟩
Article dans une revue hal-03784465 v1

(Invited) Innovations in Transistor Architecture and Device Connectivity Options for Advanced Logic Scaling

Anabela Veloso , Geert Eneman , Eddy Simoen , Bogdan Cretu , An de Keersgieter et al.
ECS Transactions, 2022, 108 (2), pp.31-42. ⟨10.1149/10802.0031ecst⟩
Article dans une revue hal-03784469 v1

Si GAA NW FETs threshold voltage evaluation

Dragos Dobrescu , Bogdan Cretu , Eddy Simoen , Anabela Veloso , Andrei Voicu-Spineanu et al.
Solid-State Electronics, 2022, 194, pp.108317. ⟨10.1016/j.sse.2022.108317⟩
Article dans une revue hal-03784467 v1

Performance Perspective of Gate-All-Around Double Nanosheet CMOS Beyond High-Speed Logic Applications

Eddy Simoen , Carlos H.S. Coelho , Vanessa C.P. Da Silva , João Martino , Paula Ghedini Der Agopian et al.
Journal of Integrated Circuits and Systems, 2022, 17 (2), pp.1-9. ⟨10.29292/jics.v17i2.617⟩
Article dans une revue hal-03852430 v1
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Detailed low frequency noise assessment on GAA NW n-channel FETs

B. Cretu , A. Bordin , E. Simoen , G. Hellings , D. Linten et al.
Solid-State Electronics, 2021, 181-182, pp.108029. ⟨10.1016/j.sse.2021.108029⟩
Article dans une revue hal-03784462 v1
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Improved physics-based analysis to discriminate the flicker noise origin at very low temperature and drain voltage polarization

B Cretu , D. Boudier , E. Simoen , A. Veloso , N. Collaert et al.
Solid-State Electronics, 2020, pp.107771. ⟨10.1016/j.sse.2020.107771⟩
Article dans une revue hal-02475438 v1

Discussion on the Figures of Merit of Identified Traps Located in the Si Film: Surface Versus Volume Trap Densities

B Cretu , Beya Nafaa , Eddy Simoen , Geert Hellings , Dimitri Linten et al.
ECS Transactions, 2020, 97 (5), pp.45-51. ⟨10.1149/09705.0045ecst⟩
Article dans une revue hal-02939114 v1
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Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs

D. Boudier , B Cretu , E. Simoen , G. Hellings , T. Schram et al.
Solid-State Electronics, 2019, pp.107732. ⟨10.1016/j.sse.2019.107732⟩
Article dans une revue hal-02438740 v1

Detailed characterisation of Si Gate-All-Around Nanowire MOSFETs at cryogenic temperatures

D. Boudier , B Cretu , E. Simoen , A. Veloso , N. Collaert
Solid-State Electronics, 2018, 143, pp.27-32. ⟨10.1016/j.sse.2018.02.015⟩
Article dans une revue hal-02438730 v1

Low-frequency noise measurements at liquid helium temperature operation in ultra-thin buried oxide transistors – Physical interpretation of transport phenomena

B. Nafaa , B Cretu , N. Ismail , O. Touayar , R. Carin et al.
Solid-State Electronics, 2018, 150, pp.1-7. ⟨10.1016/j.sse.2018.08.010⟩
Article dans une revue hal-02438735 v1

Low frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs: Part I: Theory and methodology

D. Boudier , B. Cretu , E. Simoen , Régis Carin , A. Veloso et al.
Solid-State Electronics, 2017, 128, pp.102 - 108. ⟨10.1016/j.sse.2016.10.012⟩
Article dans une revue hal-01712351 v1

Low frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs: Part II: Measurements and results

D. Boudier , B. Cretu , E. Simoen , Régis Carin , A. Veloso et al.
Solid-State Electronics, 2017, 128, pp.109 - 114. ⟨10.1016/j.sse.2016.10.013⟩
Article dans une revue hal-01712353 v1

Low-Frequency Noise Analysis and Modeling in Vertical Tunnel FETs With Ge Source

Felipe Neves , Paula Agopian , Joao Antonio Martino , Bogdan Cretu , Rita Rooyackers et al.
IEEE Transactions on Electron Devices, 2016, 63 (4), pp.1658 - 1665. ⟨10.1109/TED.2016.2533360⟩
Article dans une revue hal-01712409 v1

(Invited) Generation-Recombination Noise in Advanced CMOS Devices

E. Simoen , A. Oliveira , D. Boudier , J. Mitard , L. Witters et al.
ECS Transactions, 2016, 75 (5), pp.111 - 120. ⟨10.1149/07505.0111ecst⟩
Article dans une revue hal-01712452 v1

Assessment of DC and low-frequency noise performances of triple-gate FinFETs at cryogenic temperatures

B Cretu , D Boudier , E. Simoen , A Veloso , N. Collaert
Semiconductor Science and Technology, 2016, 31 (12), pp.124006. ⟨10.1088/0268-1242/31/12/124006⟩
Article dans une revue hal-01712415 v1
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Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices

E. Simoen , Bogdan Cretu , W Fang , M. Aoulaiche , Jean-Marc Routoure et al.
Solid State Phenomena, 2016, 242, pp.449. ⟨10.4028/www.scientific.net/SSP.242.449⟩
Article dans une revue hal-01196556 v1
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Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy

Hakim Hachour , Bogdan Cretu , Jean-Marc Routoure , Régis Carin , A. Benfdila et al.
Solid-State Electronics, 2015, 112, pp.1-6. ⟨10.1016/j.sse.2015.02.014⟩
Article dans une revue hal-01196272 v1

Towards single-trap spectroscopy : Generation-recombination noise in UTBOX SOI nMOSFETs

Eddy Simoen , Bogdan Cretu , Wen Fang , M. Aoulaiche , Jean-Marc Routoure et al.
Physica Status Solidi C: Current Topics in Solid State Physics, 2015, 7 p. ⟨10.1002/pssc.201400075⟩
Article dans une revue hal-01196247 v1
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In depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature

H. Achour , Bogdan Cretu , Jean-Marc Routoure , Régis Carin , Rachida Talmat et al.
Solid-State Electronics, 2014, 8 p
Article dans une revue hal-00994380 v1
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Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics

S.D. dos Santos , Bogdan Cretu , V. Strobel , Jean-Marc Routoure , Régis Carin et al.
Solid-State Electronics, 2014, 9 p. ⟨10.1016/j.sse.2014.04.034⟩
Article dans une revue hal-00994378 v1
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Low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs: challenges and opportunities

Eddy Simoen , M. Aoulaiche , S.D. dos Santos , J.A. Martino , V. Strobel et al.
ECS Journal of Solid State Science and Technology, 2013, pp.q205-q210. ⟨10.1149/2.011311jss⟩
Article dans une revue hal-00994293 v1
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Lessons Learned from Low-Frequency Noise Studies on Fully Depleted UTBOX Silicon-on-Insulator nMOSFETs

E. Simoen , M. Aoulaiche , S.D. dos Santos , J.A. Martino , V. Strobel et al.
ECS Journal of Solid State Science and Technology, 2013, pp.q205-q210
Article dans une revue hal-00994168 v1
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DC and low frequency noise performances of SOI p-FinFETs at very low temperature

H. Achour , Rachida Talmat , Bogdan Cretu , Jean-Marc Routoure , A. Benfdila et al.
Solid-State Electronics, 2013, 90, pp.160-165. ⟨10.1016/j.sse.2013.06.006⟩
Article dans une revue hal-00994180 v1

Low-Frequency Noise in High-K and SiO 2 UTBOX SOI nMOSFETS

S. dos Santos , J. Martino , Vincent Strobel , Bogdan Cretu , Jean-Marc Routoure et al.
ECS Transactions, 2013, 52 (1), pp.87-92. ⟨10.1149/05201.0087ecst⟩
Article dans une revue hal-03784649 v1
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Low frequency noise characterization in n-channel FinFETs

Rachida Talmat , H. Achour , Bogdan Cretu , Jean-Marc Routoure , A. Benfdila et al.
Solid-State Electronics, 2012, p20-26
Article dans une revue hal-00994184 v1
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Improvement in the determination by 1/f noise measurements of the interface state distribution in polysilicon TFTs in relation with the compensation law of Meyer Neldel

Laurent Pichon , Abdelmalek Boukhenoufa , Bogdan Cretu , Regis Rogel
Journal of Applied Physics, 2009, 105, pp.104503. ⟨10.1063/1.3126706⟩
Article dans une revue hal-00387394 v1
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THERMAL DEPENDENCE OF LOW-FREQUENCY NOISE IN POLYSILICON THIN FILM TRANSISTORS

Laurent Pichon , Bogdan Cretu , Abdelmalek Boukhenoufa
Thin Solid Films, 2009, 517, pp.6367. ⟨10.1016/j.tsf.2009.02.055⟩
Article dans une revue hal-00522575 v1

Impact of strain and source/drain engineering on the low frequency noise behaviour in n-channel tri-gate FinFETs

W. Guo , B. Cretu , J.-M. Routoure , R. Carin , E. Simoen et al.
Solid-State Electronics, 2008, 52 (12), pp.1889-1894. ⟨10.1016/j.sse.2008.06.055⟩
Article dans une revue istex hal-03784657 v1
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Numerical Simulation of Low-Frequency Noise in Polysilicon Thin-Film Transistors

Laurent Pichon , Abdelmalek Boukhenoufa , Christophe Cordier , Bogdan Cretu
IEEE Electron Device Letters, 2007, 28 (8), pp.716. ⟨10.1109/LED.2007.900849⟩
Article dans une revue hal-00171712 v1

Temperature impact on the Lorentzian noise induced by electron valence-band tunneling in partially depleted SOI p-MOSFETs

W. Guo , B. Cretu , J.-M. Routoure , R. Carin , E. Simoen et al.
Solid-State Electronics, 2007, 51 (9), pp.1180-1184. ⟨10.1016/j.sse.2007.07.033⟩
Article dans une revue istex hal-03784679 v1

Numerical simulation of conduction and low frequency noise in polysilicon thin film transistors

Laurent Pichon , Abdelmalek Boukhenoufa , Christophe Cordier , Bogdan Cretu
IEEE Electron Device Letters, 2007, 28, pp.719-718
Article dans une revue hal-00197122 v1
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Numerical simulation of conduction and low-frequency noise in polysilicon thin film transistors

Abdelmalek Boukhenoufa , Christophe Cordier , Laurent Pichon , Bogdan Cretu
Thin Solid Films, 2007, 515, pp.7556. ⟨10.1016/j.tsf.2006.11.162⟩
Article dans une revue hal-00171471 v1

Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors

I. Lartigau , J. Routoure , W. Guo , B. Cretu , R. Carin et al.
Journal of Applied Physics, 2007, 101 (10), pp.104511. ⟨10.1063/1.2732685⟩
Article dans une revue hal-03784674 v1

Numerical simulations of conduction and low-frequency noise in polysilicon TFTs

Abdelmalek Boukhenoufa , Christophe Cordier , Laurent Pichon , Bogdan Cretu
Thin Solid Films, 2007, pp.7556-7559
Article dans une revue hal-00259046 v1

Low-Frequency Noise Assessment of Silicon Passivated Ge pMOSFETs With TiN/TaN/ $\hbox{HfO}_{2}$ Gate Stack

W. Guo , G. Nicholas , B. Kaczer , R. Todi , B. de Jaeger et al.
IEEE Electron Device Letters, 2007, 28 (4), pp.288-291. ⟨10.1109/LED.2007.891797⟩
Article dans une revue hal-03784663 v1

Numerical simulation of low frequency noise in polysilicon thin film transistors

Laurent Pichon , Abdelmalek Boukhenoufa , Christophe Cordier , Bogdan Cretu
IEEE Electron Device Letters, 2007, 28 (8), pp.716-718
Article dans une revue hal-00198456 v1

Determination of interface state distribution in polysilicon thin film transistors from low frequency -noise measurements: application to analysis of electrical properties

Laurent Pichon , Abdelmalek Boukhenoufa , Christophe Cordier , Bogdan Cretu
Journal of Applied Physics, 2006, 100 (5), pp.54504-54509
Article dans une revue hal-00437321 v1