Eric Joubert
26
Documents
Current affiliations
Publications
SiC MOSFET robustness to ESD study: Correlation between electrical and spectral photo-emission characterizations2018 19th IEEE Mediterranean Electrotechnical Conference (MELECON), May 2018, Marrakech, France. pp.260-264, ⟨10.1109/MELCON.2018.8379104⟩
Conference papers
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Temperature estimation of high-electron mobility transistors AlGaN/GaN2018 19th IEEE Mediterranean Electrotechnical Conference (MELECON), May 2018, Marrakech, France. pp.265-268, ⟨10.1109/MELCON.2018.8379105⟩
Conference papers
hal-02131183v1
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An Extraction Method of SiC Power MOSFET Threshold Voltage3rd International Conference on Electrical and Information Technologies, Nov 2017, Rabat, Morocco. ⟨10.1007/978-3-030-05276-8_2⟩
Conference papers
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A new extraction method of SiC power MOSFET threshold voltage using a physical approach2017 International Conference on Electrical and Information Technologies (ICEIT), Nov 2017, Rabat, France. pp.1-6, ⟨10.1109/EITech.2017.8255289⟩
Conference papers
hal-02177925v1
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Characterization of ESD stress effects on SiC MOSFETs using photon emission spectral signatures2017 Annual Reliability and Maintainability Symposium (RAMS), Jan 2017, Orlando, France. ⟨10.1109/ram.2017.7889732⟩
Conference papers
hal-01765953v1
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Static behavior analysis of silicon carbide power MOSFET for temperature variations2016 International Conference on Electrical and Information Technologies (ICEIT), May 2016, Tangiers, Morocco. pp.276-280, ⟨10.1109/EITech.2016.7519605⟩
Conference papers
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Analyse par électroluminescence des dégradations de transistor MOSFET en SiCSymposium de Génie Electrique 2016 - SGE2016, Jun 2016, Grenoble, France
Conference poster
hal-01696225v1
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Reliability and Qualification Tests for High-Power MOSFET TransistorsReliability of High-Power Mechatronic Systems 2, Elsevier, pp.155--197, 2017, ⟨10.1016/b978-1-78548-261-8.50005-x⟩
Book sections
hal-01927246v1
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Reliability Study of High-Power Mechatronic Components by Spectral Photoemission MicroscopyReliability of High-Power Mechatronic Systems 2, Elsevier, pp.241--271, 2017, ⟨10.1016/b978-1-78548-261-8.50008-5⟩
Book sections
hal-01927247v1
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Internal Temperature Measurement of Electronic ComponentsAbdelkhalak El Hami & Philippe Pougnet (Eds). Embedded Mechatronic Systems 1, Elsevier, pp.165-184, 2015, 978-1-78548-013-3. ⟨10.1016/B978-1-78548-013-3.50007-3⟩
Book sections
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