florent LOETE
Publications
Publications
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A wheel-rail electrical contact experiment at the laboratory scale4th International Railway Symposium Aachen (IRSA 2023), Nov 2023, Aachen (Aix la Chapelle), Germany |
Machine learning applied to the analysis of the gait initiation process in Parkinson’s disease using Principal Component Analysis and bootstrapping37eme congres de la societe francaise de medecine physique et de réadaptation. SOFMER 2022, Dec 2022, Rennes, France |
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Contactless Investigation of the p-Type Doping Concentration Level of Single Micrometric Size GaAs Crystals Grown on Silicon for Multijunction Solar Cells35th European Photovoltaic Solar Energy Conference and Exhibition (EU-PVSEC), EU PVSEC, Sep 2018, Bruxelles, Belgium. pp.660 - 664, ⟨10.4229/35thEUPVSEC20182018-2AV.3.17⟩ |
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Contactless conductivity measurement for ITO nanolayers on AsGa substrats over a wide frequency rangeIEEE SENSORS 2018, Oct 2018, New delhi, India. ⟨10.1109/icsens.2018.8589554⟩ |
Modèle de réflectométrie en domaine temporel pour l’´etude des défauts non-francs9ème Conférence Européenne sur les Méthodes Numériques en Electromagnétisme (NUMELEC 2017), Nov 2017, Paris, France |
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Étude expérimentale du contact électrique roue/railXIIIème Colloque sur les Arcs Electriques et Workshop Arcs et Contacts Electriques (CAE XIII ACE 2017), Mar 2017, Nancy, France |
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Electrical tagging devices for the removal of fault location ambiguities by reflectometry in complex electrical networksIEEE SENSORS, Oct 2016, Orlando, FL, United States. ⟨10.1109/ICSENS.2016.7808646⟩ |
Modélisation et analyse de défauts non francs dans le blindage des lignes coaxiales en vue du diagnostic18ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2016), Jul 2016, Rennes, France |
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Model-Based Eddy Current Determination of the Electrical Conductivity of Semiconductors2016 IEEE Conference on Electromagnetic Field Computation (CEFC), Nov 2016, Miami, United States. ⟨10.1109/cefc.2016.7816375⟩ |
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Contactless device for the fast conductivity characterization of a large range semiconductorsInternational Symposium on Semiconductor Manufacturing (ISSM 2016), Dec 2016, Tokyo, Japan. 4p., ⟨10.1109/issm.2016.7934522⟩ |
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Time domain modeling of soft faults in wiring system by a nodal Discontinuous Galerkin Method with high-order hexahedral meshesCOMPUMAG 2015, Jun 2015, MONTREAL, Canada |
Modélisation et Analyse de Défauts Non-Francs dans les Lignes de Transmission en vue du Diagnostic19èmes Journées Nationales Micro-ondes (JNM 2015), Jun 2015, Bordeaux, France |
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Experimental Evaluation of the Inverse Scattering Method for Electrical Cable Fault Diagnosis9th IFAC Symposium on Fault Detection, Supervision and Safety of Technical Processes (SAFEPROCESS), Sep 2015, Paris, France. ⟨10.1016/j.ifacol.2015.09.619⟩ |
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Experimental Analysis and Modelling of Coaxial Transmission Lines with Soft Shield DefectsJoint IEEE International Symposium on Electromagnetic Compatibility and EMC Europe, Aug 2015, Dresden, Germany. ⟨10.1109/ISEMC.2015.7256406⟩ |
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Electrical behaviour of the wheel-rail contactICEC 2012, May 2012, Beijing, China. pp.67-72, ⟨10.1049/cp.2012.0624⟩ |
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Observation of Branly's effect during shunting experiments on scaled wheel-rail contacts9th International Conference on Contact Mechanics and Wear of Rail/Wheel Systems, Aug 2012, Chengdu, China. pp.111-114 |
Inverse Scattering Experiments for Electric Cable Soft Fault Diagnosis and Connector LocationPIERS Proceedings, Mar 2012, Kuala Lumpur, Malaysia. pp.1932-1936 |
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Diagnostic of Connector's Degradation Level by Frequency Domain ReflectometryHolm 2012, Sep 2012, Portland, United States. pp.101-104, ⟨10.1109/HOLM.2012.6336591⟩ |
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Essais de vieillissement par vibration de connecteurs pour la mécatroniqueJournée "La Connectique : état de l'art et perspectives", Dec 2010, Paris, France |
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Detection and Location of Defects in Wiring Networks using Time Domain Reflectometry and Neural Networks14th Biennial IEEE Conference on Electromagnetic Field Computation, May 2010, Chicago, États-Unis. pp.000 |
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Feasability of the detection of vibration induced faults in connectors by reflectometry24 th Int. Conf. on Elec. Contacts ICEC 2008, Jun 2008, St Malo, France. pp.CD-ROM Proceedings |
Analyse par photoluminescence du dopage résiduel dans un cristal unique de GaAs de taille micrométrique épitaxié sur silicium pour la réalisation de multijonctionsJournées Nationales du Photovoltaïque 2018 (JNPV 2018), Dec 2018, Dourdan, France |
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Tunable Eddy Current Device for the Contactless Characterization of a Large Variety of Semiconductor Materials2015 IEEE SENSORS, Nov 2015, Busan, South Korea. ⟨10.1109/ICSENS.2015.7370427⟩ |
Method for marking bundles of power lines for diagnosis by reflectometry and corresponding kitUnited States, Patent n° : US20170153284. 2019 |
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Contactless measurement of the conductivity of semiconductors using a multicarrier frequency test signalUnited States, Patent n° : 10429435. 2019 |
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MESURE SANS CONTACT DE LA CONDUCTIVITÉ DE SEMI-CONDUCTEURSFrance, N° de brevet: EP3283891. 2018 |
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Contactless measurement of the conductivity of semiconductors using a multicarrier frequency test signalÉtats-Unis, N° de brevet: US20180100887. 2018 |
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Mesure sans contact de la conductivité de semiconducteursFrance, N° de brevet: FR 1553392. 2015 |
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Procédé de marquage de faisceaux de lignes électriques pour le diagnostic par réflectométrie et kit correspondantFrance, N° de brevet: FR 1455748. LGEP 2014 ID = 1716. 2014 |