FV

François Vurpillot

174
Documents

Publications

Publications

Stochastic ion emission perturbation mechanisms in atom probe tomography: Linking simulations to experiment

Aslam Shaikh , Tero Mäkinen , François Vurpillot , Mikko Alava , Ivan Lomakin

Physical Review Materials, 2026, 10 (3), pp.033802. ⟨10.1103/tg1g-s7r2⟩

Article dans une revue hal-05535424v1

Exploring Mechanisms Leading to Composition Errors in Monazite (CePO4) Analyzed With Atom Probe Tomography

Tom Veret , Fabien Delaroche , Ivan Blum , Jonathan Houard , Benjamin Klaes et al.

Microscopy and Microanalysis, 2026, 32 (2), ⟨10.1093/mam/ozag009⟩

Article dans une revue hal-05560238v1
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Open-circuit fault detection in a 5-level cascaded H-bridge inverter using 1D CNN and ISTM

Chouaib Djaghloul , Kambiz Tehrani , François Vurpillot

Energies, 2025, 18 (18), pp.5004. ⟨10.3390/en18185004⟩

Article dans une revue hal-05283279v1
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Effect of Dynamic Reconstruction on Particle Size and Morphology in Atom Probe Tomography

Constantinos Hatzoglou , Paraskevas Kontis , Heena Khanchandani , Gérald da Costa , Baptiste Gault et al.

Microscopy and Microanalysis, 2025, 31 (2), ⟨10.1093/mam/ozaf006⟩

Article dans une revue hal-05524841v1
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Spatial resolution(s) in atom probe tomography

Baptiste Gault , Frédéric de Geuser , Christoph Freysoldt , Benjamin Klaes , François Vurpillot

Microscopy and Microanalysis, In press

Article dans une revue hal-05410426v1

A Survey of AI in System of Systems With a Focus on Power Electronic Systems—Part I: Design and Control

Kambiz Tehrani , Noman Khan , Chouaib Djaghloul , Tanveer Abbas , Pierre Bonnet et al.

IEEE Systems Journal, 2025, 19 (4), pp.1011-1024. ⟨10.1109/JSYST.2025.3641535⟩

Article dans une revue hal-05524892v1

A Survey of AI in System of Systems With a Focus on Power Electronic Systems—Part II: Maintenance and Forecasting

Kambiz Tehrani , Noman Khan , Chouaib Djaghloul , Tanveer Abbas , Pierre Bonnet et al.

IEEE Systems Journal, 2025, 19 (4), pp.1025-1037. ⟨10.1109/JSYST.2025.3641439⟩

Article dans une revue hal-05524901v1
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Stacking Fault Segregation Imaging With Analytical Field Ion Microscopy

Felipe F. Morgado , Leigh T Stephenson , Shalini Bhatt , Christoph Freysoldt , Steffen Neumeier et al.

Microscopy and Microanalysis, 2025, 31 (1), ⟨10.1093/mam/ozae105⟩

Article dans une revue hal-05524849v1

Isotopic Correction of Compositional Inaccuracies in the Atom Probe Analysis of LaB 6

S. Ndiaye , O. Bhorade , Ivan Blum , Benjamin Klaes , Christian Bacchi et al.

Journal of Physical Chemistry C, 2024, 128 (7), pp.2937-2947. ⟨10.1021/acs.jpcc.3c07595⟩

Article dans une revue hal-04695353v1
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Bringing atom probe tomography to transmission electron microscopes

Gérald da Costa , Celia Castro , Antoine Normand , Charly Vaudolon , Aidar Zakirov et al.

Nature Communications, 2024, 15 (1), pp.9870. ⟨10.1038/s41467-024-54169-2⟩

Article dans une revue hal-04885414v1

Crystallographic Dependence of Field Evaporation Energy Barrier in Metals Using Field Evaporation Energy Loss Spectroscopy Mapping

François Vurpillot , Constantinos Hatzoglou , Benjamin Klaes , Loic Rousseau , Jean-Baptiste Maillet et al.

Microscopy and Microanalysis, 2024, 30 (6), pp.1091-1099. ⟨10.1093/mam/ozae083⟩

Article dans une revue hal-05524874v1
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On the iron content of Mn-Ni-Si-rich clusters that form in reactor pressure vessel steels during exposure to neutron irradiation

Benjamin M Jenkins , Aidar Zakirov , François Vurpillot , Auriane Etienne , Cristelle Pareige et al.

Acta Materialia, 2024, 281, pp.120384. ⟨10.1016/j.actamat.2024.120384⟩

Article dans une revue hal-04698441v1
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In-Situ Pulsed Hydrogen Implantation in Atom Probe Tomography

Jean-Baptiste Maillet , Gérald da Costa , Benjamin Klaes , Christian Bacchi , Antoine Normand et al.

Microscopy and Microanalysis, 2024, ⟨10.1093/mam/ozae040⟩

Article dans une revue hal-04582888v1
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Beyond Atom Mapping in Atom Probe Tomography Using Field Evaporation Energy Loss Spectroscopy

François Vurpillot , Loïc Rousseau , C. Hatzoglou , Antoine Normand , Baptiste Gault et al.

Microscopy and Microanalysis, 2023, 29 (Supplement_1), pp.605-606. ⟨10.1093/micmic/ozad067.293⟩

Article dans une revue hal-04346766v1

Synthesis of relaxed Ge0.9Sn0.1/Ge by nanosecond pulsed laser melting

Enrico Di Russo , Francesco Sgarbossa , Pierpaolo Ranieri , Gianluigi Maggioni , Samba Ndiaye et al.

Applied Surface Science, 2023, 612, pp.155817. ⟨10.1016/j.apsusc.2022.155817⟩

Article dans une revue hal-03885778v1

Alloy distribution and compositional metrology of epitaxial ScAlN by atom probe tomography

Samba Ndiaye , Caroline Elias , Aissatou Diagne , Hélène Rotella , Frédéric Georgi et al.

Applied Physics Letters, 2023, 123, pp.162102. ⟨10.1063/5.0167855⟩

Article dans une revue hal-04351608v1
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Atom probe tomography of hyper-doped Ge layers synthesized by Sb in-diffusion by pulsed laser melting

Samba Ndiaye , Sébastien Duguay , François Vurpillot , Chiara Carraro , Gianluigi Maggioni et al.

Materials Science in Semiconductor Processing, 2023, 164 (11), pp.107641. ⟨10.1016/j.mssp.2023.107641⟩

Article dans une revue hal-04125505v1
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Introducing a Dynamic Reconstruction Methodology for Multilayered Structures in Atom Probe Tomography

Constantinos Hatzoglou , Gérald da Costa , Peter Wells , Xiaochen Ren , Brian Geiser et al.

Microscopy and Microanalysis, 2023, 29 (3), pp.1124-1136. ⟨10.1093/micmic/ozad054⟩

Article dans une revue hal-04152106v1
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A Quantitative Investigation of Functionalized Glazing Stacks by Atom Probe Tomography

Jacques Perrin Toinin , Constantinos Hatzoglou , Justine Voronkoff , Hervé Montigaud , Denis Guimard et al.

Advanced Materials Technologies, 2023, 8 (3), pp.2200922. ⟨10.1002/admt.202200922⟩

Article dans une revue hal-04351630v1
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Improving Spatial and Elemental Associations in Analytical Field Ion Microscopy

Felipe F Morgado , Leigh Stephenson , Loïc Rousseau , François Vurpillot , Simon Evertz et al.

Microscopy and Microanalysis, 2023, 29, pp.1077-1086. ⟨10.1093/micmic/ozad039⟩

Article dans une revue hal-04056079v1
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Mesoscopic modeling of field evaporation on atom probe tomography

Constantinos Hatzoglou , Benjamin Klaes , Fabien Delaroche , Gérald da Costa , Brian Geiser et al.

Journal of Physics D: Applied Physics, 2023, 56 (37), pp.375301. ⟨10.1088/1361-6463/acd649⟩

Article dans une revue hal-04344607v1

Surface Dynamics of Field Evaporation in Silicon Carbide

Samba Ndiaye , Christian Bacchi , Benjamin Klaes , Mariaconcetta Canino , François Vurpillot et al.

Journal of Physical Chemistry C, 2023, 127 (11), pp.5467-5478. ⟨10.1021/acs.jpcc.2c08908⟩

Article dans une revue hal-04344583v1
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Introducing field evaporation energy loss spectroscopy

Loïc Rousseau , Antoine Normand , Felipe Morgado , Hanne-Sofie Marie Scisly Søreide , Leigh Stephenson et al.

Communications Physics, 2023, 6 (1), pp.100. ⟨10.1038/s42005-023-01203-2⟩

Article dans une revue hal-04106937v1
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Correlating laser energy with compositional and atomic-level information of oxides in atom probe tomography

K.A. Hunnestad , C. Hatzoglou , François Vurpillot , I.-E. Nylund , Z. Yan et al.

Materials Characterization, 2023, 203, pp.113085. ⟨10.1016/j.matchar.2023.113085⟩

Article dans une revue hal-04132732v1

Combining Structure, Chemistry and Properties at the Nanoscale with Correlative Tomography Approaches

Williams Lefebvre , Gérald da Costa , Celia Castro , François Vurpillot

Microscopy and Microanalysis, 2023, 29 (Supplement_1), pp.611-611. ⟨10.1093/micmic/ozad067.296⟩

Article dans une revue hal-04324995v1

Mysterious Field Evaporation Behavior of Hydrogen in Aluminium Based Material Analyzed with Atom Probe Tomography

Loïc Rousseau , Jean-Baptiste Maillet , Leigh Stephenson , Benoit Gervais , Baptiste Gault et al.

Microscopy and Microanalysis, 2022, 28 (S1), pp.690-691. ⟨10.1017/S1431927622003233⟩

Article dans une revue hal-03855834v1

Development of an Energy-Sensitive Detector for the Atom Probe Tomography

Christian Bacchi , Gérald da Costa , Emmanuel Cadel , Fabien Cuvilly , Jonathan Houard et al.

Microscopy Microanal., 2022, 28 (4), pp.1076-1091. ⟨10.1017/S1431927621012708⟩

Article dans une revue hal-03178516v1
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A Tomographic Atom Probe laser assisted by a flexible optical system

Jonathan Houard , Angela Vella , Gérald da Costa , Ivan Blum , Fabien Delaroche et al.

Microscopy and Microanalysis, 2021, 27 (S1), pp.1260 - 1261. ⟨10.1017/s1431927621004724⟩

Article dans une revue hal-04360365v1

Development of Wide Field of View Three-Dimensional Field Ion Microscopy and High-Fidelity Reconstruction Algorithms to the Study of Defects in Nuclear Materials

Benjamin Klaes , Rodrigue Lardé , Fabien Delaroche , Constantinos Hatzoglou , Stefan Parviainen et al.

Microscopy and Microanalysis, 2021, 27 (2), pp.365-384. ⟨10.1017/S1431927621000131⟩

Article dans une revue hal-03474668v1
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Surface Microscopy of Atomic and Molecular Hydrogen from Field-Evaporating Semiconductors

Lorenzo Rigutti , Enrico Di Russo , Florian Chabanais , Ivan Blum , Jonathan Houard et al.

Journal of Physical Chemistry C, 2021, 125 (31), pp.17078-17087. ⟨10.1021/acs.jpcc.1c04778⟩

Article dans une revue hal-03448318v1
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Revealing atomic-scale vacancy-solute interaction in nickel

Felipe Morgado , Shyam Katnagallu , Christoph Freysoldt , Benjamin Klaes , François Vurpillot et al.

Scripta Materialia, 2021, 203, pp.114036. ⟨10.1016/j.scriptamat.2021.114036⟩

Article dans une revue hal-03474754v1
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In Situ Spectroscopic Study of the Optomechanical Properties of Evaporating Field Ion Emitters

P. Dalapati , G. Beainy , Enrico Di Russo , Ivan Blum , Jonathan Houard et al.

Physical Review Applied, 2021, 15 (2), ⟨10.1103/physrevapplied.15.024014⟩

Article dans une revue hal-03138523v1

Influence of field conditions on quantitative analysis of single crystal thorium dioxide by atom probe tomography

Amrita Sen , Mukesh Bachhav , François Vurpillot , J. Matthew Mann , Phyllis Morgan et al.

Ultramicroscopy, 2021, 220, pp.113167. ⟨10.1016/j.ultramic.2020.113167⟩

Article dans une revue hal-04355448v1

Analytical Three-Dimensional Field Ion Microscopy of an Amorphous Glass FeBSi

Benjamin Klaes , Jeoffrey Renaux , Rodrigue Lardé , Fabien Delaroche , Felipe Morgado et al.

Microscopy and Microanalysis, 2021, pp.1-9. ⟨10.1017/S1431927621012629⟩

Article dans une revue hal-03474770v1
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Reflections on the Spatial Performance of Atom Probe Tomography in the Analysis of Atomic Neighborhoods

Baptiste Gault , Benjamin Klaes , Felipe F Morgado , Christoph Freysoldt , Yue Li et al.

Microscopy and Microanalysis, 2021, ⟨10.1017/S1431927621012952⟩

Article dans une revue hal-03388125v1
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Super-resolution Optical Spectroscopy of Nanoscale Emitters within a Photonic Atom Probe

Enrico Di Russo , Pradip Dalapati , Jonathan Houard , Linda Venturi , Ivan Blum et al. Article dans une revue hal-03024946v1
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Dynamic Effects in Voltage Pulsed Atom Probe

Loïc Rousseau , Antoine Normand , Felipe Morgado , Leigh Stephenson , Baptiste Gault et al.

Microscopy and Microanalysis, 2020, 26 (6), pp.1133-1146. ⟨10.1017/S1431927620024587⟩

Article dans une revue hal-03013684v1
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Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography

Enrico Di Russo , Ivan Blum , Ivan Rivalta , Jonathan Houard , Gérald da Costa et al.

Journal of Physical Chemistry A, 2020, 124 (52), pp.10977-10988. ⟨10.1021/acs.jpca.0c09259⟩

Article dans une revue hal-03120561v1
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A model to predict image formation in the three-dimensional field ion microscope

Benjamin Klaes , Rodrigue Lardé , Fabien Delaroche , Stefan Parviainen , Nicolas Rolland et al.

Computer Physics Communications, 2020, pp.107317. ⟨10.1016/j.cpc.2020.107317⟩

Article dans une revue hal-02571970v1
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Characterization of Pd and Pd@Au core-shell nanoparticles using atom probe tomography and field evaporation simulation

Se-Ho Kim , Kyuseon Jang , Phil Woong Kang , Jae-Pyoung Ahn , Jae-Bok Seol et al.

Journal of Alloys and Compounds, 2020, 831, pp.154721. ⟨10.1016/j.jallcom.2020.154721⟩

Article dans une revue hal-02571984v1
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Interpreting nanovoids in atom probe tomography data for accurate local compositional measurements

Xing Wang , Constantinos Hatzoglou , Brian Sneed , Zhe Fan , Wei Guo et al.

Nature Communications, 2020, 11 (1), ⟨10.1038/s41467-020-14832-w⟩

Article dans une revue hal-02571976v1
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Preferential evaporation in atom probe tomography: an analytical approach

Constantinos Hatzoglou , Solène Rouland , Bertrand Radiguet , Auriane Etienne , Gérald da Costa et al.

Microscopy and Microanalysis, 2020, 26 (4), pp.689-698. ⟨10.1017/S1431927620001749⟩

Article dans une revue hal-02917595v1

Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations

R. Dubosq , B. Gault , C. Hatzoglou , K. Schweinar , François Vurpillot et al.

Ultramicroscopy, 2020, 218, pp.113092. ⟨10.1016/j.ultramic.2020.113092⟩

Article dans une revue hal-02921985v1
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A Photonic Atom Probe coupling 3D Atomic Scale Analysis with in situ Photoluminescence Spectroscopy

Jonathan Houard , Antoine Normand , Enrico Di Russo , Christian Bacchi , P Dalapati et al.

Review of Scientific Instruments, 2020, 91, pp.083704. ⟨10.1063/5.0012359⟩

Article dans une revue hal-02902892v1

An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography

Zirong Peng , Yifeng Lu , Constantinos Hatzoglou , Alisson Kwiatkowski da Silva , François Vurpillot et al.

Microscopy and Microanalysis, 2019, 25, pp.389-400. ⟨10.1017/S1431927618016112⟩

Article dans une revue hal-02107351v1

Spatial and Compositional Biases Introduced by Position Sensitive Detection Systems in APT: A Simulation Approach

Christian Bacchi , Gérald da Costa , François Vurpillot

Microscopy and Microanalysis, 2019, 25, pp.418-424. ⟨10.1017/S143192761801629X⟩

Article dans une revue hal-02107336v1

Enhancing Element Identification by Expectation–Maximization Method in Atom Probe Tomography

François Vurpillot , Constantinos Hatzoglou , Bertrand Radiguet , Gérald da Costa , Fabien Delaroche et al.

Microscopy and Microanalysis, 2019, 25, pp.367-377. ⟨10.1017/S1431927619000138⟩

Article dans une revue hal-02107329v1

Unraveling the metastability of C n 2+ ( n = 2–4) Clusters

Zirong Peng , David Zanuttini , Benoit Gervais , Emmanuelle Jacquet , Ivan Blum et al.

Journal of Physical Chemistry Letters, 2019, 10 (3), pp.581-588. ⟨10.1021/acs.jpclett.8b03449⟩

Article dans une revue hal-02107343v1
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Imaging individual solute atoms at crystalline imperfections in metals

Shyam Katnagallu , Leigh T. Stephenson , Isabelle Mouton , Christoph Freysoldt , Aparna P.A. Subramanyam et al.

New Journal of Physics, 2019, 21 (12), pp.123020. ⟨10.1088/1367-2630/ab5cc4⟩

Article dans une revue hal-02097141v1
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La sonde atomique tomographique

Lorenzo Rigutti , François Vurpillot , Williams Lefebvre , Angela Vella

Reflets de la Physique, 2019, 62, pp.4-10. ⟨10.1051/refdp/201962004⟩

Article dans une revue hal-03260708v1

Enhanced dynamic reconstruction for atom probe tomography

Constantinos Hatzoglou , Gérald da Costa , François Vurpillot

Ultramicroscopy, 2019, 197, pp.72-82. ⟨10.1016/j.ultramic.2018.11.010⟩

Article dans une revue hal-02107358v1

Dissociation of GaN$^{2+}$ and AlN$^{2+}$ in APT: Electronic structure and stability in strong DC field

David Zanuttini , François Vurpillot , J. Douady , E. Jacquet , P.-M. Anglade et al.

The Journal of Chemical Physics, 2018, 149 (13), pp.134310. ⟨10.1063/1.5036933⟩

Article dans une revue hal-02061759v1

Kron–Branin modelling of ultra-short pulsed signal microelectrode

Zhifei Xu , Blaise Elysée Guy Ravelo , Yang Liu , Lu Zhao , Fabien Delaroche et al.

European Physical Journal: Applied Physics, 2018, 81 (2), pp.21001. ⟨10.1051/epjap/2018170383⟩

Article dans une revue istex hal-02611693v1
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Impact of local electrostatic field rearrangement on field ionization

Shyam Katnagallu , Michal Dagan , Stefan Parviainen , Ali Nematollahi , Blazej Grabowski et al.

Journal of Physics D: Applied Physics, 2018, 51 (10), pp.105601. ⟨10.1088/1361-6463/aaaba6⟩

Article dans une revue hal-02107446v1
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Green electroluminescence from radial m -plane InGaN quantum wells grown on GaN wire sidewalls by metal–organic vapor phase epitaxy

Akanksha Kapoor , Nan Guan , Martin Vallo , Agnès Messanvi , Lorenzo Mancini et al.

ACS photonics, 2018, 5 (11), pp.4330-4337. ⟨10.1021/acsphotonics.8b00520⟩

Article dans une revue hal-01986657v1

Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography

Enrico Di Russo , F. Moyon , N. Gogneau , L. Largeau , E. Giraud et al.

Journal of Physical Chemistry C, 2018, 122 (29), pp.16704--16714. ⟨10.1021/acs.jpcc.8b03223⟩

Article dans une revue hal-01928844v1

On the detection of multiple events in atom probe tomography

Zirong Peng , François Vurpillot , Pyuck-Pa Choi , Yujiao Li , Dierk Raabe et al.

Ultramicroscopy, 2018, 189, pp.54-60. ⟨10.1016/j.ultramic.2018.03.018⟩

Article dans une revue hal-02061736v1

Interpreting the Presence of an Additional Oxide Layer in Analysis of Metal Oxides–Metal Interfaces in Atom Probe Tomography

Mukesh Bachhav , Gorakh Pawar , François Vurpillot , Raphaële Danoix , Frederic Danoix et al.

Journal of Physical Chemistry C, 2018, 123 (2), pp.1313-1319. ⟨10.1021/acs.jpcc.8b10895⟩

Article dans une revue hal-02106738v1

A chemical composition correction model for nanoclusters observed by APT - Application to ODS steel nanoparticles

Constantinos Hatzoglou , Bertrand Radiguet , François Vurpillot , Philippe Pareige

Journal of Nuclear Materials, 2018, 505, pp.240-248. ⟨10.1016/j.jnucmat.2018.03.057⟩

Article dans une revue hal-02061493v1

Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives

J. Barnes , A. Grenier , I. Mouton , S. Barraud , G. Audoit et al.

Scripta Materialia, 2018, 148, pp.91 - 97. ⟨10.1016/j.scriptamat.2017.05.012⟩

Article dans une revue istex hal-01765929v1

Simulation tools for atom probe tomography: A path for diagnosis and treatment of image degradation

François Vurpillot , Stefan Parviainen , Fluyra Djurabekova , David Zanuttini , Benoit Gervais

Materials Characterization, 2018, 146, pp.336-346. ⟨10.1016/j.matchar.2018.04.024⟩

Article dans une revue hal-02061494v1

Recent Reconstruction Developments in IVAS

Brian Geiser , François Vurpillot , Yimeng Chen , Katherine Rice , Stuart Wright et al.

Microscopy and Microanalysis, 2017, 23 (S1), pp.638-639. ⟨10.1017/S1431927617003853⟩

Article dans une revue hal-02107488v1

Carrier Localization in GaN/AlN Quantum Dots As Revealed by Three-Dimensional Multimicroscopy

Lorenzo Mancini , Florian Moyon , David Hernàndez-Maldonado , Ivan Blum , Jonathan Houard et al.

Nano Letters, 2017, 17 (7), pp.4261 - 4269. ⟨10.1021/acs.nanolett.7b01189⟩

Article dans une revue hal-01765951v1

Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage Pulsing

Lu Zhao , Antoine Normand , Jonathan Houard , Ivan Blum , Fabien Delaroche et al.

Microscopy and Microanalysis, 2017, 23 (2), pp.221-226. ⟨10.1017/S1431927616012666⟩

Article dans une revue hal-02611781v1

Reconstructing APT Datasets: Challenging the Limits of the Possible

François Vurpillot , David Zanuttini , Stefan Parviainen , Baishaikhi Mazumder , Nicolas Rolland et al.

Microscopy and Microanalysis, 2017, 23 (S1), pp.640-641. ⟨10.1017/S1431927617003865⟩

Article dans une revue hal-02107482v1

Simulation of field-induced molecular dissociation in atom-probe tomography: Identification of a neutral emission channel

David Zanuttini , Ivan Blum , Lorenzo Rigutti , François Vurpillot , Julie Douady et al.

Physical Review A : Atomic, molecular, and optical physics [1990-2015], 2017, 95 (6), ⟨10.1103/PhysRevA.95.061401⟩

Article dans une revue hal-02107497v1
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Analysis of Radiation Damage in Light Water Reactors: Comparison of Cluster Analysis Methods for the Analysis of Atom Probe Data

Jonathan Hyde , Gérald da Costa , Constantinos Hatzoglou , Hannah Weekes , Bertrand Radiguet et al.

Microscopy and Microanalysis, 2017, 23 (02), pp.366 - 375. ⟨10.1017/s1431927616012678⟩

Article dans une revue hal-01765920v1

True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy

François Vurpillot , Frederic Danoix , Matthieu Gilbert , Sebastian Koelling , Michal Dagan et al.

Microscopy and Microanalysis, 2017, 23 (02), pp.210 - 220. ⟨10.1017/s1431927617000198⟩

Article dans une revue hal-01766137v1

Electronic structure and stability of the SiO 2+ dications produced in tomographic atom probe experiments

D. Zanuttini , Ivan Blum , Lorenzo Rigutti , François Vurpillot , Julie Douady et al.

The Journal of Chemical Physics, 2017, 147 (16), pp.164301. ⟨10.1063/1.5001113⟩

Article dans une revue hal-03345835v1

New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint

Nicolas Rolland , François Vurpillot , Sébastien Duguay , Baishakhi Mazumder , James Speck et al.

Microscopy and Microanalysis, 2017, 23 (02), pp.247 - 254. ⟨10.1017/s1431927617000253⟩

Article dans une revue hal-01766098v1

Multi-excitonic emission from Stranski-Krastanov GaN/AlN quantum dots inside a nanoscale tip

L. Mancini , F. Moyon , Jonathan Houard , Ivan Blum , Williams Lefebvre et al.

Applied Physics Letters, 2017, 111 (24), ⟨10.1063/1.5004417⟩

Article dans une revue hal-01766091v1
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Atom probe tomography analysis of SiGe fins embedded in SiO$_2$: Facts and artefacts

D. Melkonyan , C. Fleischmann , L. Arnoldi , J. Demeulemeester , A. Kumar et al.

Ultramicroscopy, 2017, 179, pp.100 - 107. ⟨10.1016/j.ultramic.2017.04.006⟩

Article dans une revue hal-01765926v1

Atomistic Simulations of Surface Effects Under High Electric Fields

Stefan Parviainen , Michal Dagan , Shyam Katnagallu , Baptiste Gault , Michael Moody et al.

Microscopy and Microanalysis, 2017, 23 (S1), pp.644-645. ⟨10.1017/S1431927617003889⟩

Article dans une revue hal-02107478v1

Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem

Lorenzo Rigutti , L. Mancini , Enrico Di Russo , Ivan Blum , F. Moyon et al.

Microscopy and Microanalysis, 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩

Article dans une revue hal-01954232v1

Accuracy of analyses of microelectronics nanostructures in atom probe tomography

François Vurpillot , Nicolas Rolland , Robert Estivill , Sébastien Duguay , D. Blavette

Semiconductor Science and Technology, 2016, 31 (7), pp.074002. ⟨10.1088/0268-1242/31/7/074002⟩

Article dans une revue hal-01928850v1

Nanoscale photoconductive switching effect applied to atom probe tomography

Lu Zhao , Antoine Normand , Jonathan Houard , Ivan Blum , Fabien Delaroche et al.

American Journal of Physics, 2016, 116, pp.2. ⟨10.1209/0295-5075/116/27002⟩

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Dissociation Dynamics of Molecular Ions in High Dc Electric Field

Ivan Blum , Lorenzo Rigutti , François Vurpillot , Angela Vella , Aurore Gaillard et al.

Journal of Physical Chemistry A, 2016, 120 (20), pp.3654-3662. ⟨10.1021/acs.jpca.6b01791⟩

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Dissociation of Molecular Ions During the DC Field Evaporation ZnO in Atom Probe Tomography

Ivan Blum , David Zanuttini , Lorenzo Rigutti , François Vurpillot , Julie Douady et al.

Microscopy and Microanalysis, 2016, 22 (S3), pp.662-663. ⟨10.1017/S1431927616004165⟩

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Field Evaporation Behavior of Metal Oxide/Metal Interfaces

Mukesh Bachhav , François Vurpillot , Frederic Danoix , Raphaële Danoix , Béatrice Hannoyer et al.

Microscopy and Microanalysis, 2016, 22 (S3), pp.678-679. ⟨10.1017/S1431927616004244⟩

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Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N

Lorenzo Rigutti , L. Mancini , Daniel Hernandez Maldonado , Williams Lefebvre , E. Giraud et al.

Journal of Applied Physics, 2016, 119 (10), pp.105704. ⟨10.1063/1.4943612⟩

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Multi-Microscopy Study of the Influence of Stacking Faults and Three-Dimensional In Distribution on the Optical Properties of m-Plane InGaN Quantum Wells Grown on Microwire Sidewalls

L. Mancini , Daniel Hernandez Maldonado , Williams Lefebvre , Jonathan Houard , Ivan Blum et al.

Applied Physics Letters, 2016, 108 (4), pp.042102. ⟨10.1063/1.4940748⟩

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RF pulse signal integrity analysis for nonlinear ended microstrip line atom-probe tomography

Lu Zhao , A. Delamare , Antoine Normand , Fabien Delaroche , O. Latry et al.

IOP Conference Series: Materials Science and Engineering, 2016, 120, pp.012006. ⟨10.1088/1757-899X/120/1/012006⟩

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Advanced Volume Reconstruction and Data Mining Methods in Atom Probe Tomography

François Vurpillot , Williams Lefebvre , J.M. Cairney , C. Oberdorfer , B.P. Geiser et al.

MRS Bulletin, 2016, 41 (01), pp.46-52. ⟨10.1557/mrs.2015.312⟩

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Statistical nanoscale study of localised radiative transitions in GaN/AlGaN quantum wells and AlGaN epitaxial layers

Lorenzo Rigutti , L. Mancini , Williams Lefebvre , Jonathan Houard , Daniel Hernandez Maldonado et al.

Semiconductor Science and Technology, 2016, 31 (9), pp.095009. ⟨10.1088/0268-1242/31/9/095009⟩

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Quantitative analysis of Si/SiGeC superlattices using atom probe tomography

Robert Estivill , Adeline Grenier , Sébastien Duguay , François Vurpillot , Tanguy Terlier et al.

Ultramicroscopy, 2015, 159, pp.223-231. ⟨10.1016/j.ultramic.2015.03.014⟩

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Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques

A. Grenier , Sébastien Duguay , J. P. Barnes , R. Serra , Nicolas Rolland et al.

Applied Physics Letters, 2015, 106 (21), pp.213102. ⟨10.1063/1.4921352⟩

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Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atoms

L. Arnoldi , Elena Silaeva , François Vurpillot , Bernard Deconihout , E. Cadel et al.

Ultramicroscopy, 2015, 159, pp.139--146. ⟨10.1016/j.ultramic.2014.11.018⟩

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An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials

Nicolas Rolland , D. J. Larson , B. P. Geiser , Sébastien Duguay , François Vurpillot et al.

Ultramicroscopy, 2015, 159, pp.195--201. ⟨10.1016/j.ultramic.2015.03.010⟩

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Challenges in the study of Fe/MgO/Fe interfaces using 3D Atom Probe

B. Mazumder , Viswas Purohit , M. Gruber , Angela Vella , François Vurpillot et al.

Thin Solid Films, 2015, 589, pp.38-46. ⟨10.1016/j.tsf.2015.04.079⟩

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Ion energy spread in laser-assisted atom probe tomography

Nicolas Sevelin-Radiguet , L. Arnoldi , François Vurpillot , Antoine Normand , Bernard Deconihout et al.

EPL - Europhysics Letters, 2015, 109 (3), pp.37009. ⟨10.1209/0295-5075/109/37009⟩

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Quantitative investigation of SiGeC layers using atom probe tomography

Robert Estivill , Adeline Grenier , Sébastien Duguay , François Vurpillot , Tanguy Terlier et al.

Ultramicroscopy, 2015, 150, pp.23--29. ⟨10.1016/j.ultramic.2014.11.020⟩

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A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography

Nicolas Rolland , François Vurpillot , Sébastien Duguay , Didier Blavette

Microscopy and Microanalysis, 2015, 21 (6), pp.1649-1656. ⟨10.1017/S1431927615015184⟩

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Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation

Nicolas Rolland , François Vurpillot , Sébastien Duguay , Didier Blavette

European Physical Journal: Applied Physics, 2015, 72 (2), pp.21001. ⟨10.1051/epjap/2015150233⟩

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Modeling Atom Probe Tomography: A review

François Vurpillot , C. Oberdorfer

Ultramicroscopy, 2015, 159, pp.202-216. ⟨10.1016/j.ultramic.2014.12.013⟩

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Nanoscale Microstructural and Chemical Analysis of SiO 2 -Zn 1− x Al x O Nanocomposites: Towards a Better Understanding of Si and Al Substitution in ZnO

Matthieu Gilbert , Céline Byl , David Bérardan , Alexandre Gloter , Nita Dragoe et al.

Journal of the American Ceramic Society, 2015, 98 (12), pp.3948-3955. ⟨10.1111/jace.13848⟩

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Pulse shaping optimization for improving atom probe tomography

Lu Zhao , Antoine Normand , Fabien Delaroche , B. Ravelo , François Vurpillot

International Journal of Mass Spectrometry, 2015, 386, pp.47-53. ⟨10.1016/j.ijms.2015.06.012⟩

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HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy

Williams Lefebvre , Daniel Hernandez Maldonado , F. Moyon , Fabien Cuvilly , Charly Vaudolon et al.

Ultramicroscopy, 2015, 159, pp.403-412. ⟨10.1016/j.ultramic.2015.02.011⟩

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3D analysis of advanced nano-devices using electron and atom probe tomography

A. Grenier , Sébastien Duguay , J. P. Barnes , R. Serra , G. Haberfehlner et al.

Ultramicroscopy, 2014, 136, pp.185--192. ⟨10.1016/j.ultramic.2013.10.001⟩

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Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field

Lorenzo Mancini , Nooshin Amirifar , Deodatta Shinde , Ivan Blum , Matthieu Gilbert et al.

Journal of Physical Chemistry C, 2014, 118 (41), pp.24136-24151. ⟨10.1021/jp5071264⟩

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Correlation of Microphotoluminescence Spectroscopy, Scanning Transmission Electron Microscopy, and Atom Probe Tomography on a Single Nano-object Containing an InGaN/GaN Multiquantum Well System

Lorenzo Rigutti , Ivan Blum , Deodatta Shinde , David Hernandez-Maldonado , Williams Lefebvre et al.

Nano Letters, 2014, 14 (1), pp.107-114. ⟨10.1021/nl4034768⟩

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Coupling atom probe tomography and photoluminescence spectroscopy: Exploratory results and perspectives

Lorenzo Rigutti , Angela Vella , François Vurpillot , Aurore Gaillard , Nicolas Sevelin-Radiguet et al.

Ultramicroscopy, 2013, 132, pp.75-80. ⟨10.1016/j.ultramic.2013.02.002⟩

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A model to predict image formation in Atom probeTomography

François Vurpillot , A. Gaillard , Gérald da Costa , Bernard Deconihout

Ultramicroscopy, 2013, 132, pp.152-157. ⟨10.1016/j.ultramic.2012.12.007⟩

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Atom probe tomography spatial reconstruction: Status and directions

D.J. Larson , B. Gault , B.P. Geiser , F. de Geuser , François Vurpillot

Current Opinion in Solid State and Materials Science, 2013, 17 (5), pp.236-247. ⟨10.1016/j.cossms.2013.09.002⟩

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Numerical study of femtosecond laser assisted atom probe tomography

E. Silaeva , Nikita Shcheblanov , Tatiana Itina , Angela Vella , Jonathan Houard et al.

Applied physics. A, Materials science & processing, 2013, 110 (3), pp.703-707. ⟨10.1007/s00339-012-7189-7⟩

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Nanometer scale tomographic investigation of fine scale precipitates in a CuFeNi granular system by three-dimensional field ion microscopy

Sophie Cazottes , François Vurpillot , Abdeslem Fnidiki , Dany Lemarchand , Marcello Baricco et al.

Microscopy and Microanalysis, 2012, 18 (5), pp.1129--1134. ⟨10.1017/S1431927612000517⟩

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Atomic-scale imaging and analysis of single layer GP zones in a model steel

Frédéric Danoix , T. Epicier , François Vurpillot , D. Blavette

Journal of Materials Science, 2012, 47 (3), pp.1567-1571. ⟨10.1007/s10853-011-6008-4⟩

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Three-dimensional thermal response of a metal subwavelength tip under femtosecond laser illumination

Jonathan Houard , Angela Vella , François Vurpillot , Bernard Deconihout

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2011, 84 (3), ⟨10.1103/PhysRevB.84.033405⟩

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Application of Delaunay tessellation for the characterization of solute-rich clusters in atom probe tomography

W Lefebvre , Thomas Philippe , F. Vurpillot

Ultramicroscopy, 2011, 111 (3), pp.200-206. ⟨10.1016/j.ultramic.2010.11.034⟩

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Atom probe tomography: 3D imaging at the atomic level

D. Blavette , François Vurpillot , Bernard Deconihout , A. Menand

Advanced Structured Materials, 2011, 10, pp.201--222. ⟨10.1007/978-3-642-17782-8_9⟩

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Pragmatic reconstruction methods in atom probe tomography

François Vurpillot , M. Gruber , Gérald da Costa , I. Martin , L. Renaud et al.

Ultramicroscopy, 2011, 111 (8), pp.1286-1294. ⟨10.1016/j.ultramic.2011.04.001⟩

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Optical near-field absorption at a metal tip far from plasmonic resonance

Jonathan Houard , Angela Vella , François Vurpillot , Bernard Deconihout

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2010, 81 (12), ⟨10.1103/PhysRevB.81.125411⟩

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Three-dimensional atomic-scale imaging of boron clusters in implanted silicon

O. Cojocaru-Mirédin , Emmanuel Cadel , François Vurpillot , Dominique Mangelinck , D. Blavette

Scripta Materialia, 2009, 60 (5), pp.285-288. ⟨10.1016/j.scriptamat.2008.10.008⟩

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Ultrafast emission of ions during laser ablation of metal for 3D atom probe

Angela Vella , Jonathan Houard , François Vurpillot , Bernard Deconihout

Applied Surface Science, 2009, 255 (10), pp.5154-5158. ⟨10.1016/j.apsusc.2008.08.109⟩

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Conditions to cancel the laser polarization dependence of a subwavelength tip

Jonathan Houard , Angela Vella , François Vurpillot , Bernard Deconihout

Applied Physics Letters, 2009, 94 (12), pp.121905. ⟨10.1063/1.3095829⟩

Article dans une revue hal-02109355v1
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Investigation at the atomic scale of the Co spatial distribution in Zn(Co)O magnetic semiconductor oxide

Rodrigue Lardé , Etienne Talbot , François Vurpillot , Philippe Pareige , G. Schmerber et al.

Journal of Applied Physics, 2009, 105 (12), pp.126107. ⟨10.1063/1.3152579⟩

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Depth resolution function of the laser assisted tomographic atom probe in the investigation of semiconductors

Emmanuel Cadel , François Vurpillot , Rodrigue Lardé , Sébastien Duguay , Bernard Deconihout

Journal of Applied Physics, 2009, 106 (4), pp.044908. ⟨10.1063/1.3186617⟩

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Thermal response of a field emitter subjected to ultra-fast laser illumination

François Vurpillot , Jonathan Houard , Angela Vella , Bernard Deconihout

Journal of Physics D: Applied Physics, 2009, 42 (12), pp.125502. ⟨10.1088/0022-3727/42/12/125502⟩

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Evidence of atomic-scale arsenic clustering in highly doped silicon

Sébastien Duguay , François Vurpillot , Thomas Philippe , E. Cadel , Rodrigue Lardé et al.

Journal of Applied Physics, 2009, 106 (10), pp.106102. ⟨10.1063/1.3257178⟩

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Nanostructure and properties of a Cu-Cr composite processed by severe plastic deformation.

Xavier Sauvage , Peter Jessner , François Vurpillot , Reinhard Pippan

Scripta Materialia, 2008, 58, pp.1125. ⟨10.1016/j.scriptamat.2008.02.010⟩

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Laser-assisted atom probe tomography and nanosciences

Didier Blavette , Talaat Al Kassab , Emmanuel Cadel , Alexander Mackel , François Vurpillot et al.

International Journal of Materials Research, 2008, 99 (5), pp.454--460. ⟨10.3139/146.101672⟩

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3D atom probe assisted by femtosecond laser pulses

Bernard Deconihout , Angela Vella , François Vurpillot , Gérald da Costa , A. Bostel

Applied physics. A, Materials science & processing, 2008, 93 (4), pp.995-1003. ⟨10.1007/s00339-008-4774-x⟩

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Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitter

B. Gault , A. Vella , François Vurpillot , A. Menand , D. Blavette et al.

Ultramicroscopy, 2007, 107 (9), pp.713--719. ⟨10.1016/j.ultramic.2007.02.004⟩

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Atomic scale study of TbCo2.5/Fe multilayers by laser-assisted tomographic atom probe

A. Grenier , R. Larde , E. Cadel , F. Vurpillot , J. Juraszek et al.

Journal of Applied Physics, 2007, 102, pp.033912-1-4. ⟨10.1063/1.2761825⟩

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Correlated field evaporation as seen by atom probe tomography

F. de Geuser , B. Gault , A. Bostel , François Vurpillot

Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2007, 601 (2), pp.536 - 543. ⟨10.1016/j.susc.2006.10.019⟩

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Structural investigation of TbCo2/Fe magnetostrictive thin films by tomographic atom probe and Mössbauer spectrometry

A. Grenier , R. Lardé , E. Cadel , J.M. Le Breton , J. Juraszek et al.

Journal of Magnetism and Magnetic Materials, 2007, 310, pp.2215-2216. ⟨10.1016/j.jmmm.2006.10.1102⟩

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An improved reconstruction procedure for the correction of local magnification effects in three-dimensional atom-probe

F. de Geuser , Williams Lefebvre , Frédéric Danoix , François Vurpillot , B. Forbord et al.

Surface and Interface Analysis, 2007, 39 (2-3), pp.268--272. ⟨10.1002/sia.2489⟩

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Design of a femtosecond laser assisted tomographic atom probe

B. Gault , François Vurpillot , A. Vella , M. Gilbert , A. Menand et al.

Review of Scientific Instruments, 2006, 77 (4), ⟨10.1063/1.2194089⟩

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The New Laser assisted Wide Angle Tomographic Atom Probe

L Renaud , P Monsallut , P. Benard , P Saliot , Gérald da Costa et al.

Microscopy and Microanalysis, 2006, 12 (S02), pp.1726-1727. ⟨10.1017/S1431927606063410⟩

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Design of a delay-line position-sensitive detector with improved performance

Gérald da Costa , François Vurpillot , A. Bostel , M. Bouet , Bernard Deconihout

Review of Scientific Instruments, 2005, 76 (1), pp.013304. ⟨10.1063/1.1829975⟩

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Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probe

François Vurpillot , F. de Geuser , Gérald da Costa , D. Blavette

Journal of Microscopy, 2004, 216 (3), pp.234--240. ⟨10.1111/j.0022-2720.2004.01413.x⟩

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A new step towards the lattice reconstruction in 3DAP

François Vurpillot , Ludovic Renaud , D. Blavette

Ultramicroscopy, 2003, 95, pp.223--229. ⟨10.1016/S0304-3991(02)00320-0⟩

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A new approach to the interpretation of atom probe field-ion microscopy images

François Vurpillot , A. Bostel , D. Blavette

Ultramicroscopy, 2001, 89 (1-3), pp.137--144. ⟨10.1016/S0304-3991(01)00097-3⟩

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A model accounting for spatial overlaps in 3D atom-probe microscopy

D. Blavette , François Vurpillot , Philippe Pareige , A. Menand

Ultramicroscopy, 2001, 89 (1-3), pp.145--153. ⟨10.1016/S0304-3991(01)00120-6⟩

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Structural analyses in three-dimensional atom probe: A Fourier transform approach

François Vurpillot , Gérald da Costa , A. Menand , D. Blavette

Journal of Microscopy, 2001, 203 (3), pp.295--302. ⟨10.1046/j.1365-2818.2001.00923.x⟩

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The spatial resolution of 3D atom probe in the investigation of single-phase materials

François Vurpillot , A. Bostel , E. Cadel , D. Blavette

Ultramicroscopy, 2000, 84 (3-4), pp.213--224. ⟨10.1016/S0304-3991(00)00035-8⟩

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Trajectory overlaps and local magnification in three-dimensional atom probe

François Vurpillot , A. Bostel , D. Blavette

Applied Physics Letters, 2000, 76 (21), pp.3127--3129. ⟨10.1063/1.126545⟩

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Trajectories of field emitted ions in 3D atom-probe

François Vurpillot , A. Bostel , A. Menand , D. Blavette

European Physical Journal: Applied Physics, 1999, 6 (2), pp.217--221. ⟨10.1051/epjap:1999173⟩

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The shape of field emitters and the ion trajectories in three- dimensional atom probes

François Vurpillot , A. Bostel , D. Blavette

Journal of Microscopy, 1999, 196 (3), pp.332--336. ⟨10.1046/j.1365-2818.1999.00637.x⟩

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A High Kinetic Energy Atom Probe Design to Improve Instrument Performances in Voltage Pulse Mode

François Vurpillot , Antoine Normand , Matin Brault , Sylvain Nulli , Gérald da Costa et al.

Microscopy and Microanalysis, Jul 2024, Cleveland, United States. ⟨10.1093/mam/ozae044.041⟩

Communication dans un congrès hal-04734921v1

Design of A Multistage Marx Generator topology based on SiC-MOSFET Device for Atomic Probe Tomography Applications

Kambiz Tehrani , Yunbi Liu , Loïc Rousseau , Antoine Normand , François Vurpillot

2020 IEEE 15th International Conference of System of Systems Engineering (SoSE), Jun 2020, Budapest, France. pp.000423-000428, ⟨10.1109/SoSE50414.2020.9130521⟩

Communication dans un congrès hal-02889711v1

Characterization of a High Voltage and High Frequency pulse generator configuration for Atom Probe

Loïc Rousseau , Antoine Normand , Tehrani Kambiz , François Vurpillot

2020 IEEE 15th International Conference of System of Systems Engineering (SoSE), Jun 2020, Budapest, France. pp.193-198, ⟨10.1109/SoSE50414.2020.9130486⟩

Communication dans un congrès hal-02889710v1

Design of A Multistage Marx Generator topology based on SiC-MOSFET Device for Atomic Probe Tomography Applications

Kambiz Tehrani , Yunbi Liu , Loic Rousseau , Antoine Normand , François Vurpillot

2020 IEEE 15th International Conference of System of Systems Engineering (SoSE), Jun 2020, Budapest, Hungary. pp.000423-000428, ⟨10.1109/SoSE50414.2020.9130521⟩

Communication dans un congrès hal-02964346v1

Revisiting Field Ion Microscopy

B. Gault , M. Dagan , S. Katnagallu , F. de Geuser , François Vurpillot et al.

TMS conference, 2017, San Diego, United States

Communication dans un congrès hal-01838871v1

Analysis of transient electric-field emitted by atom-probe tomography electrode

Z. Xu , Y. Liu , B. Ravelo , O. Maurice , L. Zhao et al.

2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Sep 2017, Angers, France. ⟨10.1109/emceurope.2017.8094618⟩

Communication dans un congrès hal-01765924v1

Correlative Investigations by HAADF-STEM and Atom Probe Tomography

Williams Lefebvre , Florian Moyon , Antoine Normand , Nicolas Rolland , Ivan Blum et al.

European Microscopy Congress, Aug 2016, Lyon, France. pp.775-776, ⟨10.1002/9783527808465.EMC2016.8364⟩

Communication dans un congrès hal-01954243v1

RF transient pulse signal integrity with ns-duration for atom-probe tomography

Lu Zhao , A. Delamare , Antoine Normand , Fabien Delaroche , O. Latry et al.

2015 IEEE Radio and Antenna Days of the Indian Ocean (RADIO), Sep 2015, Belle Mare, France. pp.1-2, ⟨10.1109/RADIO.2015.7323403⟩

Communication dans un congrès hal-02107624v1
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Asymmetrical PCB Interconnect Tree Modelling with Coupling Effect

B. Ravelo , François Vurpillot , A K Jastrzebski

EMC Europe 2014, Sep 2014, Gothenburg, Sweden

Communication dans un congrès hal-02485771v1

Atom probe tomography: An imaging tool at the atomic scale using ltrafast laser pulses

Bernard Deconihout , François Vurpillot , Gérald da Costa , Jonathan Houard , Philippe Pareige et al.

CLEO: Applications and Technology, CLEO_AT 2013, 2013, Unknown, Unknown Region

Communication dans un congrès hal-01928864v1

Numerical study of femtosecond laser-assisted atom probe tomography

Elena Silaeva , N. Shcheblanov , Tatiana Itina , Angela Vella , N. Sévelin-Radiguet et al.

11th International Conference on Laser Ablation, Nov 2011, Playa del Carmen, Mexico. pp.133

Communication dans un congrès ujm-00710834v1

Methods for the study of clustering and precipitation in Al-based alloys by APT

Williams Lefebvre , François Vurpillot , M. Torsaeter , F. de Geuser

International Conference on Aluminium Alloys (ICAA 12), 2010, Yokohama, Japan

Communication dans un congrès hal-01838921v1

Modeling artifacts in the analysis of test semiconductor structures in atom probe tomography

François Vurpillot , M. Gruber , S. Duguay , E. Cadel , Bernard Deconihout

AIP Conference Proceedings, 2009, Unknown, Unknown Region. pp.175--180, ⟨10.1063/1.3251216⟩

Communication dans un congrès hal-01929146v1

Toward a laser assisted wide-angle tomographic atom-probe

Bernard Deconihout , François Vurpillot , B. Gault , Gérald da Costa , M. Bouet et al.

Surface and Interface Analysis, 2007, Unknown, Unknown Region. pp.278--282, ⟨10.1002/sia.2491⟩

Communication dans un congrès istex hal-01928893v1

Atom probe tomography study of homogeneous and heterogeneous precipitation of niobium carbides in a model ferritic steel

Frédéric Danoix , E. Bémont , Philippe Maugis , François Vurpillot , D. Blavette

IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, 2006, Unknown, Unknown Region. pp.91, ⟨10.1109/IVNC.2006.335372⟩

Communication dans un congrès hal-01928902v1

Analyse d'une multicouche magnétostrictive TbCo2/Fe par sonde atomique tomographique assistée par laser

A. Grenier , E. Cadel , F. Vurpillot , R. Larde , Nicolas Tiercelin et al.

10èmes Journées de la Matière Condensée, JMC10, 2006, Toulouse, France

Communication dans un congrès hal-00241168v1

Investigation of TbCo2Fe magnetostrictive multilayers by laser assisted tomographic atom probe (LATAP)

A. Grenier , E. Cadel , F. Vurpillot , R. Iarde , Nicolas Tiercelin et al.

2006, pp.187

Communication dans un congrès hal-00152962v1

Laser atom probe tomography: Some applications

D. Blavette , E. Cadel , Dominique Mangelinck , K. Hoummada , Rodrigue Lardé et al.

IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, 2006, Unknown, Unknown Region. pp.61--62, ⟨10.1109/IVNC.2006.335352⟩

Communication dans un congrès hal-01928901v1

The tomographic atom probe: Salient results and recent breakthroughs

A. Menand , Bernard Deconihout , P. Pareige , François Vurpillot , D. Blavette

Microscopy and Microanalysis, 2005, Unknown, Unknown Region. pp.96--97, ⟨10.1017/S1431927605501545⟩

Communication dans un congrès hal-01928903v1

An improved reconstruction procedure for the correction of local magnification effects in 3D Atom Probe

Frederic de Geuser , W. Lefebvre , Frédéric Danoix , François Vurpillot , B. Forbord et al.

49th International Field Emission Symposium (IFES), 2004, Graz, Austria

Communication dans un congrès hal-01838942v1

Modeling image distortions in 3DAP

François Vurpillot , A. Cerezo , D. Blavette , D. J. Larson

Microscopy and Microanalysis, 2004, Unknown, Unknown Region. pp.384--390, ⟨10.1017/S1431927604040486⟩

Communication dans un congrès hal-01928907v1

Local magnification in 3DAP

Didier Blavette , François Vurpillot , Frederic de Geuser , Emilie Bémont

49th International Field Emission Symposium (IFES), 2004, Graz, Austria

Communication dans un congrès hal-01838941v1

3D atom probe: Chemical analysis with (near) atomic resolution

Frédéric Danoix , François Vurpillot , Williams Lefebvre , D. Blavette

Microscopy and Microanalysis, 2003, Unknown, Unknown Region. pp.568--569

Communication dans un congrès hal-01928912v1

Why do We Need a High Performance Position Sensitive Detector in Atom Probe Tomography?

François Vurpillot , Gérald da Costa , F. de Geuser , B. Gault , Bernard Deconihout

50th International Field Emission Symposium (IFES), 2006, Guilin, China. 2006

Poster de conférence hal-01838932v1

Composition measurements in 3DAP: a Bayesian approach

François Vurpillot , Alain Bostel , Frederic de Geuser , Bernard Deconihout

49th International Field Emission Symposium (IFES), 2004, Graz, Austria. 2004

Poster de conférence hal-01838939v1
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Compositional Metrology of Atom Probe Applied to non-Metallic Materials

Enrico Di Russo , François Vurpillot , Lorenzo Rigutti

2026

Pré-publication, Document de travail hal-05533361v1
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Determination of electric field in the vicinity of polarized atom probe tomography specimens using scanning transmission electron microscopy

Mohammed Ilhami , Juan Macchi , Celia Castro , Gérald da Costa , François Vurpillot et al.

2025

Pré-publication, Document de travail hal-05388042v1
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Exploring mechanisms leading to composition errors in monazite (CePO4) analysed with atom probe tomography

Tom Veret , Fabien Delaroche , Ivan Blum , Jonathan Houard , Benjamin Klaes et al.

2026

Pré-publication, Document de travail hal-05546893v1
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Crystallographic dependence of Field Evaporation Energy Barrier in metals using Field Evaporation Energy Loss Spectroscopy mapping

François Vurpillot , C. Hatzoglou , Benjamin Klaes , Loic Rousseau , Jean-Baptiste Maillet et al.

2024

Pré-publication, Document de travail hal-04530255v1
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Bringing Atom Probe Tomography to Transmission Electron Microscopes

Gérald da Costa , Celia Castro , Antoine Normand , Charly Vaudolon , Aidar Zakirov et al.

2024

Pré-publication, Document de travail hal-04734951v1

Reflections on the spatial performance of atom probe tomography in the analysis of atomic neighbourhoods

Baptiste Gault , Benjamin Klaes , Felipe F. Morgado , Christoph Freysoldt , Yue Li et al.

2021

Pré-publication, Document de travail hal-03474777v1

Numeric modeling of synchronous laser pulsing and voltage pulsing field evaporation

Lu Zhao , Antoine Normand , Jonathan Houard , Ivan Blum , Fabien Delaroche et al.

2019

Pré-publication, Document de travail hal-02127790v1