Jean-Marc Galliere
59
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Presentation
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Iterative Method for Performance Prediction Improvement of Integrated CircuitsDCIS 2021 - 36th Conference on Design of Circuits and Integrated Systems, Nov 2021, Vila do Conde, Portugal. pp.1-5, ⟨10.1109/DCIS53048.2021.9666182⟩
Conference papers
lirmm-03710383v1
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On the scaling of EMFI probesFDTC 2021 - Workshop on Fault Detection and Tolerance in Cryptography, Sep 2021, Milan, Italy. pp.67-73, ⟨10.1109/FDTC53659.2021.00019⟩
Conference papers
lirmm-03476820v1
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Exploiting Phase Information in Thermal Scans for Stealthy Trojan DetectionDSD 2018 - 21st Euromicro Conference on Digital System Design, Aug 2018, Prague, Slovakia. pp.573-576, ⟨10.1109/DSD.2018.00100⟩
Conference papers
lirmm-01872499v1
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Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologiesLATS: Latin-American Test Symposium, Mar 2018, Sao Paulo, Brazil. ⟨10.1109/LATW.2018.8349696⟩
Conference papers
lirmm-02064921v1
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Thermal Scans for Detecting Hardware TrojansCOSADE 2018 - 9th International Workshop on Constructive Side-Channel Analysis and Secure Design, Apr 2018, Singapour, Singapore. pp.117-132, ⟨10.1007/978-3-319-89641-0_7⟩
Conference papers
lirmm-01823444v1
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Combined analysis of supply voltage and body-bias voltage for energy managementPATMOS: Power And Timing Modeling, Optimization and Simulation, Jul 2018, Platja d’Aro, Spain. pp.88-91, ⟨10.1109/PATMOS.2018.8464159⟩
Conference papers
lirmm-01867809v1
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Analysis of short defects in FinFET based logic cellsLATS: Latin American Test Symposium, Mar 2017, Bogota, Colombia. ⟨10.1109/LATW.2017.7906755⟩
Conference papers
hal-01709620v1
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Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditionsETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968208⟩
Conference papers
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Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI TechnologyISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.320-325, ⟨10.1109/ISVLSI.2017.63⟩
Conference papers
hal-01709614v1
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Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defectLATS: Latin-American Test Symposium, Mar 2016, Foz do Iguacu, Brazil. pp.129-134, ⟨10.1109/LATW.2016.7483352⟩
Conference papers
lirmm-01374300v1
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Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurationsISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, PA, United States. pp.164-169, ⟨10.1109/ISVLSI.2016.102⟩
Conference papers
lirmm-01374292v1
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Statistical Energy Study for 28nm FDSOI DevicesEuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2015, Budapest, Hungary. ⟨10.1109/EuroSimE.2015.7103149⟩
Conference papers
lirmm-01168602v1
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A toolkit to demystify CMOS Active Pixel SensorsMSE: Microelectronic Systems Education, Jun 2013, Austin, TX, United States. ⟨10.1109/MSE.2013.6566696⟩
Conference papers
hal-01709627v1
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A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in AltitudeIEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, ⟨10.1109/RTC.2012.6418104⟩
Conference papers
lirmm-00805169v1
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Dynamic-Stress Neutrons Test of Commercial SRAMsIEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4
Conference papers
lirmm-00805349v1
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Proton Flux Anisotropy in the Atmosphere: Experiment and ModelingRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Conference papers
lirmm-00805150v1
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Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM ArraysRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩
Conference papers
lirmm-00805314v1
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Versatile March Test Generator for Hands-on Memory Testing LaboratoryMSE: Microelectronic Systems Education, Jun 2011, San Diego, CA, United States. pp.41-42, ⟨10.1109/MSE.2011.5937088⟩
Conference papers
lirmm-00805300v1
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Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test BenchIEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6
Conference papers
lirmm-00805120v1
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Impact of Resistive-Open Defects on SRAM sensitivity to Soft ErrorsRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria
Conference papers
lirmm-00566847v1
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Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split ModelsDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229
Conference papers
lirmm-00370798v1
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Neutron Detection through an SRAM-Based Test BenchIWASI'09: International Workshop On Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. pp.64-69, ⟨10.1109/IWASI.2009.5184769⟩
Conference papers
lirmm-00438842v1
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A mixed TCAD/Electrical simulation laboratory to open up the microelectronics teachingMSE: Microelectronic Systems Education, Jul 2009, San Francisco, United States. ⟨10.1109/MSE.2009.5270836⟩
Conference papers
hal-01709636v1
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Use of BOBST for the Detection of Neutrons Induced Errors in SRAMIWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2009, Trani, Italy
Conference papers
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A 2-D VHDL-AMS Model for Disk-Shape Piezoelectric TransducersBMAS 2008 - IEEE International Workshop on Behavioral Modeling and Simulation, Sep 2008, San Jose, United States. pp.148-152, ⟨10.1109/BMAS.2008.4751257⟩
Conference papers
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Stream Manager, Easy CAD Tools Switching in Academic ContextIEEE Conference on Microelectronic Systems Education, Jun 2007, San Diego, USA, pp.2
Conference papers
lirmm-00370396v1
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A Unified Electrical SPICE Model for Piezoelectric TransducersBMAS: Behavioral Modeling and Simulation, Sep 2007, San Jose, SA, United States. ⟨10.1109/BMAS.2007.4437540⟩
Conference papers
lirmm-00370388v1
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Programmable Analog Array in Control-Systems LaboratoryIEEE Mediterranean Conference on Control and Automation, Jun 2007, Athens, Greece, pp.5
Conference papers
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Stream Manager, Easy CAD Tools Switching in Academic ContextMSE: Microelectronic Systems Education, Jun 2007, San Diego, United States. ⟨10.1109/MSE.2007.77⟩
Conference papers
hal-01709640v1
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Stream Manager, an Answer to Academic Project PolicyAQTR: Automation, Quality and Testing, Robotics, May 2006, Cluj-Napoca, Romania. ⟨10.1109/AQTR.2006.254614⟩
Conference papers
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Stream Manager: Une Assistance à la Gestion des Projets MicroélectroniquesCNFM'06 : 9èmes Journées Pédagogiques, Nov 2006, Saint-Malo (France), pp.5-8
Conference papers
lirmm-00117324v1
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Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron TechnologiesVTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.343-348
Conference papers
lirmm-00105997v1
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Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current MirrorLATW: Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.12-17
Conference papers
lirmm-00108659v1
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GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact ModelLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil
Conference papers
lirmm-00269604v1
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Delay Testing of MOS Transistor with Gate Oxide ShortATS: Asian Test Symposium, Nov 2003, Xian, China. pp.168-173
Conference papers
lirmm-00269641v1
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Modeling Gate Oxide Short Defects in CMOS Minimum TransistorsETW: European Test Workshop, 2002, Corfu, Greece. pp.15-20
Conference papers
lirmm-00268527v1
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A Non-Split Model for Realistic Gate Oxide Short in CMOS TechnologyDCIS: Design of Circuits and Integrated Systems, 2002, Santander, Spain. pp.197-204
Conference papers
lirmm-00268432v1
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Non-Linear and Non-Split Transistor MOS Model for Gate Oxyde ShortDBT: Defect Based Testing, Apr 2002, Monterey, CA, United States. pp.11-16
Conference papers
lirmm-00269333v1
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Low Voltage Testing of Gate Oxide Short in CMOS TechnologyDDECS: Design and Diagnostics of Electronic Circuits and Systems, 2002, Brno, Czech Republic. pp.168-174
Conference papers
lirmm-00268526v1
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Boolean and Current Detection of MOS Transistor with Gate Oxide ShortIEEE International Test Conference, Oct 2001, Baltimore, USA, pp.10
Conference papers
lirmm-00370400v1
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Méthode Itérative pour l’Amélioration de la Prédiction des Performances des Circuits Intégrés15e Colloque National du GDR SoC², Jun 2021, Rennes, France
Conference poster
lirmm-03358670v1
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A Roaming Memory Test Bench for Detecting Particle Induced SEUsITC 2010 - International Test Conference, Nov 2010, Austin, TX, United States. 2010, ⟨10.1109/TEST.2010.5699302⟩
Conference poster
lirmm-00537879v1
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A Simple Protocol to Compare EMFI platforms2020
Preprints, Working Papers, ...
lirmm-03626807v1
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A Compact Model for Electrical Simulation of MOS Transistor with Gate Oxide Short Defect[Research Report] 04080, Lirmm, University of Montpellier. 2004
Reports
lirmm-00109221v1
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