Jean-Marc Galliere
Présentation
Publications
Publications
A better practice for Body Biasing InjectionFDTC 2023 - Workshop on Fault Detection and Tolerance in Cryptography, Sep 2023, Prague, Czech Republic. pp.48-59, ⟨10.1109/FDTC60478.2023.00014⟩ |
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Body Biasing Injection: To Thin or Not to Thin the Substrate?COSADE 2022 - 13th International Workshop on Constructive Side-Channel Analysis and Secure Design, Apr 2022, Leuwen, Belgium. pp.125-139, ⟨10.1007/978-3-030-99766-3_6⟩ |
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Body Biasing Injection: Impact of substrate types on the induced disturbancesƒFDTC 2022 - Workshop on Fault Detection and Tolerance in Cryptography, Sep 2022, Virtual, Italy. pp.50-60, ⟨10.1109/FDTC57191.2022.00015⟩ |
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Iterative Method for Performance Prediction Improvement of Integrated CircuitsDCIS 2021 - 36th Conference on Design of Circuits and Integrated Systems, Nov 2021, Vila do Conde, Portugal. pp.1-5, ⟨10.1109/DCIS53048.2021.9666182⟩ |
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On the scaling of EMFI probesFDTC 2021 - Workshop on Fault Detection and Tolerance in Cryptography, Sep 2021, Milan, Italy. pp.67-73, ⟨10.1109/FDTC53659.2021.00019⟩ |
Combined analysis of supply voltage and body-bias voltage for energy managementPATMOS: Power And Timing Modeling, Optimization and Simulation, Jul 2018, Platja d’Aro, Spain. pp.88-91, ⟨10.1109/PATMOS.2018.8464159⟩ |
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Exploiting Phase Information in Thermal Scans for Stealthy Trojan DetectionDSD 2018 - 21st Euromicro Conference on Digital System Design, Aug 2018, Prague, Slovakia. pp.573-576, ⟨10.1109/DSD.2018.00100⟩ |
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Thermal Scans for Detecting Hardware TrojansCOSADE 2018 - 9th International Workshop on Constructive Side-Channel Analysis and Secure Design, Apr 2018, Singapour, Singapore. pp.117-132, ⟨10.1007/978-3-319-89641-0_7⟩ |
Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologiesLATS 2018 - 19th IEEE Latin American Test Symposium, Mar 2018, Sao Paulo, Brazil. ⟨10.1109/LATW.2018.8349696⟩ |
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Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditionsETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968208⟩ |
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Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI TechnologyISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.320-325, ⟨10.1109/ISVLSI.2017.63⟩ |
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Analysis of short defects in FinFET based logic cellsLATS 2017 - 18th IEEE Latin American Test Symposium, Mar 2017, Bogota, Colombia. ⟨10.1109/LATW.2017.7906755⟩ |
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Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defectLATS 2016 - 17th Latin-American Test Symposium, Mar 2016, Foz do Iguacu, Brazil. pp.129-134, ⟨10.1109/LATW.2016.7483352⟩ |
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Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurationsISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, PA, United States. pp.164-169, ⟨10.1109/ISVLSI.2016.102⟩ |
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Statistical Energy Study for 28nm FDSOI DevicesEuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2015, Budapest, Hungary. ⟨10.1109/EuroSimE.2015.7103149⟩ |
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A toolkit to demystify CMOS Active Pixel SensorsMSE: Microelectronic Systems Education, Jun 2013, Austin, TX, United States. ⟨10.1109/MSE.2013.6566696⟩ |
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A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in AltitudeIEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, ⟨10.1109/RTC.2012.6418104⟩ |
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Proton Flux Anisotropy in the Atmosphere: Experiment and ModelingRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4 |
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Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM ArraysRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩ |
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Dynamic-Stress Neutrons Test of Commercial SRAMsIEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4 |
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Versatile March Test Generator for Hands-on Memory Testing LaboratoryMSE: Microelectronic Systems Education, Jun 2011, San Diego, CA, United States. pp.41-42, ⟨10.1109/MSE.2011.5937088⟩ |
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Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test BenchIEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6 |
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Impact of Resistive-Open Defects on SRAM sensitivity to Soft ErrorsRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria |
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Neutron Detection through an SRAM-Based Test BenchIWASI'09: International Workshop On Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. pp.64-69, ⟨10.1109/IWASI.2009.5184769⟩ |
Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split ModelsDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229 |
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Use of BOBST for the Detection of Neutrons Induced Errors in SRAMIWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2009, Trani, Italy |
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A mixed TCAD/Electrical simulation laboratory to open up the microelectronics teachingMSE: Microelectronic Systems Education, Jul 2009, San Francisco, United States. ⟨10.1109/MSE.2009.5270836⟩ |
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A 2-D VHDL-AMS Model for Disk-Shape Piezoelectric TransducersBMAS 2008 - IEEE International Workshop on Behavioral Modeling and Simulation, Sep 2008, San Jose, United States. pp.148-152, ⟨10.1109/BMAS.2008.4751257⟩ |
Stream Manager, Easy CAD Tools Switching in Academic ContextMSE: Microelectronic Systems Education, Jun 2007, San Diego, United States. ⟨10.1109/MSE.2007.77⟩ |
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Programmable Analog Array in Control-Systems LaboratoryIEEE Mediterranean Conference on Control and Automation, Jun 2007, Athens, Greece, pp.5 |
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A Unified Electrical SPICE Model for Piezoelectric TransducersBMAS: Behavioral Modeling and Simulation, Sep 2007, San Jose, SA, United States. ⟨10.1109/BMAS.2007.4437540⟩ |
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Stream Manager, Easy CAD Tools Switching in Academic ContextIEEE Conference on Microelectronic Systems Education, Jun 2007, San Diego, USA, pp.2 |
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Stream Manager: Une Assistance à la Gestion des Projets MicroélectroniquesCNFM'06 : 9èmes Journées Pédagogiques, Nov 2006, Saint-Malo (France), pp.5-8 |
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Stream Manager, an Answer to Academic Project PolicyAQTR: Automation, Quality and Testing, Robotics, May 2006, Cluj-Napoca, Romania. ⟨10.1109/AQTR.2006.254614⟩ |
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Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron TechnologiesVTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.343-348 |
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Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current MirrorLATW: Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.12-17 |
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Delay Testing of MOS Transistor with Gate Oxide ShortATS: Asian Test Symposium, Nov 2003, Xian, China. pp.168-173 |
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GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact ModelLATW: Latin American Test Workshop, Feb 2003, Natal, Brazil |
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Non-Linear and Non-Split Transistor MOS Model for Gate Oxyde ShortDBT: Defect Based Testing, Apr 2002, Monterey, CA, United States. pp.11-16 |
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Low Voltage Testing of Gate Oxide Short in CMOS TechnologyDDECS: Design and Diagnostics of Electronic Circuits and Systems, 2002, Brno, Czech Republic. pp.168-174 |
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A Non-Split Model for Realistic Gate Oxide Short in CMOS TechnologyDCIS: Design of Circuits and Integrated Systems, 2002, Santander, Spain. pp.197-204 |
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Modeling Gate Oxide Short Defects in CMOS Minimum TransistorsETW: European Test Workshop, 2002, Corfu, Greece. pp.15-20 |
Boolean and Current Detection of MOS Transistor with Gate Oxide ShortIEEE International Test Conference, Oct 2001, Baltimore, USA, pp.10 |
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Méthode Itérative pour l’Amélioration de la Prédiction des Performances des Circuits Intégrés15e Colloque National du GDR SoC², Jun 2021, Rennes, France |
A Roaming Memory Test Bench for Detecting Particle Induced SEUsITC 2010 - International Test Conference, Nov 2010, Austin, TX, United States. 2010, ⟨10.1109/TEST.2010.5699302⟩ |
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A Simple Protocol to Compare EMFI platforms2020 |
A Compact Model for Electrical Simulation of MOS Transistor with Gate Oxide Short Defect[Research Report] 04080, Lirmm, University of Montpellier. 2004 |