Lirida Naviner

163
Documents
Affiliations actuelles
  • Télécom Paris
  • Département Communications & Electronique (COMELEC)
  • Laboratoire Traitement et Communication de l'Information (LTCI)
  • Secure and Safe Hardware (SSH)

Publications

Publications

Impact of Scaling Up the Sensor Sampling Frequency on the Reliability of Edge Processing Systems in Tolerating Soft Errors Caused by Neutrons

Matheus Minelli de Carvalho , Luiz Henrique Laurini , Emmanuel Atukpor , Lirida Naviner , Rodrigo Possamai Bastos
IEEE Sensors Letters, 2024, 8 (9), pp.Article Sequence Number: 7004304. ⟨10.1109/LSENS.2024.3435677⟩
Article dans une revue hal-04681009 v1

Dependable STT-MRAM With Emerging Approximation and Speculation Paradigms

Hao Cai , Yaoru Hou , Mengdi Zhang , Bo Liu , Lirida Naviner
IEEE Design & Test, 2023, 40 (3), pp.17-25. ⟨10.1109/MDAT.2021.3120330⟩
Article dans une revue hal-04420922 v1

A survey on two-dimensional Error Correction Codes applied to fault-tolerant systems

David Freitas , César Marcon , Jarbas Silveira , Lirida Naviner , João Mota
Microelectronics Reliability, 2022, 139, pp.114826. ⟨10.1016/j.microrel.2022.114826⟩
Article dans une revue hal-04420908 v1

OPCoSA: an Optimized Product Code for space applications

David Freitas , Jarbas Silveira , César Marcon , Lirida Naviner , João Mota
Integration, the VLSI Journal, 2022, 84, pp.131-141. ⟨10.1016/j.vlsi.2022.02.005⟩
Article dans une revue hal-04420909 v1

Commodity Bit-Cell Sponsored MRAM Interaction Design for Binary Neural Network

Hao Cai , Zhongjian Bian , Zhonghua Fan , Bo Liu , Lirida Naviner
IEEE Transactions on Electron Devices, 2022, 69 (4), pp.1721-1726. ⟨10.1109/TED.2021.3134588⟩
Article dans une revue hal-04420910 v1

Writing-only in-MRAM computing paradigm for ultra-low power applications

Bo Liu , Mingyue Liu , Yongliang Zhou , Xiaofeng Hong , Hao Cai et al.
Microprocessors and Microsystems: Embedded Hardware Design , 2022, 90, pp.104449. ⟨10.1016/j.micpro.2022.104449⟩
Article dans une revue hal-04420915 v1

Tunnel Magnetoresistance Based Passive Resistance Replacement in Hybrid MTJ-CMOS Integration

Yu-Ang Wu , Xinshu Xie , Xinfang Tong , Yantong Di , Lirida Naviner et al.
IEEE Transactions on Nanotechnology, 2022, 21, pp.638-647. ⟨10.1109/TNANO.2022.3216778⟩
Article dans une revue hal-04420913 v1

Investigation of PVT-Aware STT-MRAM Sensing Circuits for Low-VDD Scenario

Zhongjian Bian , Xiaofeng Hong , Yanan Guo , Lirida Naviner , Wei Ge et al.
Micromachines, 2021, 12 (5), pp.551. ⟨10.3390/mi12050551⟩
Article dans une revue hal-04420923 v1

A survey of in-spin transfer torque MRAM computing

Hao Cai , Bo Liu , Juntong Chen , Lirida Naviner , Yongliang Zhou et al.
Science China Information Sciences, 2021, 64 (6), pp.160402. ⟨10.1007/s11432-021-3220-0⟩
Article dans une revue hal-04420919 v1

Sparse Realization in Unreliable Spin-Transfer-Torque RAM for Convolutional Neural Network

Hao Cai , Juntong Chen , Yongliang Zhou , Xiaofeng Hong , Bo Liu et al.
IEEE Transactions on Magnetics, 2021, 57 (2), pp.1-5. ⟨10.1109/TMAG.2020.3015146⟩
Article dans une revue hal-04420916 v1

Analysis of stepwise charging limits and its implementation for efficiency improvement in switched capacitor DC–DC converters

Francisco Veirano , Pablo Castro Lisboa , Pablo Pérez-Nicoli , Lirida Naviner , Fernando Silveira
Analog Integrated Circuits and Signal Processing, 2021, 109 (2), pp.271-282. ⟨10.1007/s10470-021-01810-5⟩
Article dans une revue hal-04420921 v1

Triple Sensing Current Margin for Maintainable MRAM Yield at Sub-100% Tunnel Magnetoresistance Ratio

Hao Cai , Menglin Han , Yongliang Zhou , Bo Liu , Lirida Naviner
IEEE Transactions on Magnetics, 2021, 57 (2), pp.1-5. ⟨10.1109/TMAG.2020.3011614⟩
Article dans une revue hal-04420918 v1
Image document

CSME: A novel cycle-sensing margin enhancement scheme for high yield STT-MRAM

H. Cai , M. Liu , Y. Zhou , B. Liu , Lirida Naviner
Microelectronics Reliability, 2020, pp.113732. ⟨10.1016/j.microrel.2020.113732⟩
Article dans une revue hal-02941338 v1
Image document

Magnetic Tunnel Junction Applications

Nilson Maciel , Elaine Marques , Lirida Naviner , Yongliang Zhou , Hao Cai
Sensors, 2020, 20 (1), pp.121. ⟨10.3390/s20010121⟩
Article dans une revue hal-02941339 v1

Voltage-Controlled Magnetic Anisotropy MeRAM Bit-Cell over Event Transient Effects

Nilson Maciel , Elaine Crespo Marques , Lirida Naviner , Hao Cai , Jun Yang
Journal of Low Power Electronics Applications, 2019, 9 (2), pp.1-14. ⟨10.3390/jlpea9020015⟩
Article dans une revue hal-02288058 v1

Optimal Asymmetrical Back Plane Biasing for Energy Efficient Digital Circuits in 28 nm UTBB FD-SOI

Francisco Veirano , Lirida Naviner , Fernando Silveira
Integration, the VLSI Journal, 2019, 65, pp.211-218. ⟨10.1016/j.vlsi.2017.08.008⟩
Article dans une revue hal-02287634 v1
Image document

A Review of Sparse Recovery Algorithms

Elaine Crespo Marques , Nilson Maciel , Lirida Naviner , Hao Cai , Jun Yang
IEEE Access, 2019, 7, pp.1300-1322. ⟨10.1109/ACCESS.2018.2886471⟩
Article dans une revue hal-02942487 v1

Addressing Failure and Aging Degradation in MRAM/MeRAM-on-FDSOI Integration

Hao Cai , You Wang , Lirida Naviner , Xinning Liu , Weiwei Shan et al.
IEEE Transactions on Circuits and Systems I: Regular Papers, 2019, 66 (1), pp.239-250. ⟨10.1109/TCSI.2018.2854277⟩
Article dans une revue hal-02942486 v1

Soft-Error Vulnerability Estimation Approach Based on the SET Susceptibility of Each Gate

Fábio Batagin Armelin , Lirida Naviner , Roberto D’amore
Electronics, 2019, 8 (7), pp.749. ⟨10.3390/electronics8070749⟩
Article dans une revue hal-02941341 v1

Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology

Nilson Maciel , Elaine Crespo Marques , Lirida Naviner , Hao Cai
Microelectronics Reliability, 2018, 88-90, pp.965-968
Article dans une revue hal-02287982 v1

Exploring Hybrid STT-MTJ/CMOS Energy Solution in Near-/Sub-Threshold Regime for IoT Applications

Hao Cai , You Wang , Lirida Naviner , Jun Yang , Weisheng Zhao
IEEE Transactions on Magnetics, 2018, 54 (2), pp.1-9. ⟨10.1109/TMAG.2017.2766220⟩
Article dans une revue hal-04420926 v1

Exploring Hybrid STT-MTJ/CMOS Energy Solution in Near/Sub-Threshold Regime

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
IEEE Transactions on Magnetics, 2018, 54 (2), pp.1-9
Article dans une revue hal-02287861 v1

Analysis of Ageing effects on ARTIX7 XILINX FPGA (article) Author

Mariem Slimani , Karim Benkalaia , Lirida Naviner
Microelectronics Reliabilit Journal, 2017
Article dans une revue hal-02287639 v1

Robust Ultra-Low Power Non-Volatile Logic-in-Memory Circuits in FD-SOI Technology

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
IEEE Transactions on Circuits and Systems I: Regular Papers, 2017, 64 (4), pp.847-857
Article dans une revue hal-02287638 v1

Failure Analysis in Magnetic Tunnel Junction Nanopillar with Interfacial Perpendicular Magnetic Anisotropy

Weisheng Zhao , You Wang , Lirida Naviner
Materials Science Journal, 2017, 9 (41), pp.1-17
Article dans une revue hal-02287641 v1

A Non-Monte-Carlo Methodology for Variability Analysis of Magnetic Tunnel Junction-Based Circuits

You Wang , Hao Cai , Lirida Naviner , Weisheng Zhao
IEEE Transactions on Magnetics, 2017, 53 (3), pp.1-6. ⟨10.1109/TMAG.2016.2638913⟩
Article dans une revue hal-02287631 v1

Optimum NMOS/PMOS Imbalance for Energy Efficient Digital Circuits

Francisco Veirano , Lirida Naviner , Fernando Silveira
IEEE Transactions on Circuits and Systems I: Regular Papers, 2017
Article dans une revue hal-02287635 v1
Image document

High Performance MRAM with Spin-Transfer-Torque and Voltage-Controlled Magnetic Anisotropy Effects

Hao Cai , Wang Kang , You Wang , Lirida Naviner , Jun Yang et al.
Applied Sciences, 2017, 7 (9), pp.1-13. ⟨10.3390/app7090929⟩
Article dans une revue hal-02287690 v1

A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28nm FDSOI

Y. Wang , H. Cai , Lirida Naviner , X.X. Zhao , Y. Zhang et al.
Microelectronics Reliability, 2016, ⟨10.1016/j.microrel.2016.07.073⟩
Article dans une revue hal-01371736 v1

Breakdown Analysis of Magnetic Flip-flop With 28nm UTBB FDSOI Technology

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
IEEE Transactions on Device and Materials Reliability, 2016, 16 (3), pp.376-383
Article dans une revue hal-02287471 v1

Compact Model of Dielectric Breakdown in Spin-Transfer Torque Magnetic Tunnel Junction

You Wang , Hao Cai , Lirida Naviner , Yue Zhang , Zhao Xiaoxuan et al.
IEEE Transactions on Electron Devices, 2016, 63 (4), pp.1762 - 1767. ⟨10.1109/TED.2016.2533438⟩
Article dans une revue hal-01318736 v1

Efficient reliability evaluation methodologies for combinational circuits

Hao Cai , Kaikai Liu , Lirida Naviner , You Wang , Mariem Slimani et al.
Microelectronics Reliability, 2016, 64, pp.19-25. ⟨10.1016/j.microrel.2016.07.116⟩
Article dans une revue hal-02942489 v1

Reliable majority voter based on spin transfer torque magnetic tunnel junction device

Paulo Butzen , Mariem Slimani , You Wang , Hao Cai , Lirida Naviner
IEEE Electronics Letters, 2016, 52 (1), pp.47-49
Article dans une revue hal-02287642 v1

Low Power Magnetic Flip-Flop Optimization With FDSOI Technology Boost

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
IEEE Transactions on Magnetics, 2016, 52 (8), pp.1-7
Article dans une revue hal-02287472 v1

Reliability analysis of hybrid spin transfer torque magnetic tunnel junction/CMOS majority voters

Mariem Slimani , Lirida Naviner , You Wang , Hao Cai
Microelectronics Reliability, 2016, C (64), pp.48-53
Article dans une revue hal-02287469 v1

Efficient reliability evaluation methodologies for combinational circuits

Hao Cai , Kaikai Liu , Lirida Naviner , You Wang , Mariem Slimani et al.
Microelectronics Reliability, 2016, 64
Article dans une revue hal-02287474 v1

Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
Microelectronics Reliability, 2015
Article dans une revue hal-02287224 v1

Compact thermal modeling of spin transfer torque magnetic tunnel junction

You Wang , Hao Cai , Lirida Naviner , Yue Zhang , Jacques-Olivier Klein et al.
Microelectronics Reliability, 2015, 55 (9-10), pp.1649-1653. ⟨10.1016/j.microrel.2015.06.029⟩
Article dans une revue hal-01216389 v1

A dual-rail compact defect-tolerant multiplexer

Arwa Ben Dhia , Mariem Slimani , Hao Cai , Lirida Naviner
Microelectronics Reliability, 2015, 55, pp.662-670
Article dans une revue hal-01128326 v1

Multiplexing Sense Amplifier Based Magnetic Flip Flop in 28nm FDSOI Technology

Hao Cai , You Wang , Weisheng Zhao , Lirida Naviner
IEEE Transactions on Nanotechnology, 2015, 14 (4)
Article dans une revue hal-02287225 v1

Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Ting An , Kaikai Liu , Hao Cai , Lirida Naviner
Microelectronics Reliability, 2015, 55 (3-4), pp.696-703
Article dans une revue hal-01122423 v1

A Novel Analytical Method for Defect Tolerance Assessment

Mariem Slimani , Arwa Ben Dhia , Lirida Naviner
Microelectronics Reliability, 2015, 55, pp.1285-1289
Article dans une revue hal-01216729 v1

Compact model of magnetic tunnel junction with stochastic spin transfer torque switching for reliability analyses

You Wang , Yue Zhang , Erya Deng , Jacques-Olivier Klein , Lirida Naviner et al.
Microelectronics Reliability, 2014, 54 (9-10), pp.1774-1778. ⟨10.1016/j.microrel.2014.07.019⟩
Article dans une revue hal-01216414 v1

A defect-tolerant area-efficient multiplexer for basic blocks in SRAM-based FPGAs

Arwa Ben Dhia , S. N. Pagliarini , Lirida Naviner , Habib Mehrez , Philippe Matherat
Microelectronics Reliability, 2013, 53 (9-11), pp.1189-1193. ⟨10.1016/j.microrel.2013.06.014⟩
Article dans une revue hal-01195954 v1

SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults

Samuel Nascimento Pagliarini , Arwa Ben Dhia , Lirida Naviner , J. F. Naviner
Microelectronics Reliability, 2013, pp.1230-1234
Article dans une revue hal-01062108 v1

Optimal digital reconstruction and calibration for multichannel Time Interleaved ΣΔ ADC based on Comb-filters

Ali Beydoun , van Tam Nguyen , Lirida Naviner , Patrick Loumeau
AEÜ - International Journal of Electronics and Communications / Archiv für Elektronik und Übertragungstechnik, 2013, 67 (4), pp.329-339. ⟨10.1016/j.aeue.2012.10.004⟩
Article dans une revue istex hal-02942479 v1

A defect-tolerant area-efficient multiplexer for basic blocks in SRAM-based FPGAs

Arwa Ben Dhia , Samuel Nascimento Pagliarini , Lirida Naviner , Habib Mehrez , Philippe Matherat
Microelectronics Reliability, 2013, pp.1189-1193
Article dans une revue hal-01062109 v1

Majority voter: Signal probability, reliability and error bound characteristics

Tian Ban , Lirida Naviner
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on, 2012, pp.538 - 541
Article dans une revue hal-00728879 v1

Progressive module redundancy for fault-tolerant designs in nanoelectronics

Tian Ban , Lirida Naviner
Microelectronics Reliability, 2011, 51 (9-11), pp.1489-1492. ⟨10.1016/j.microrel.2011.06.020⟩
Article dans une revue istex hal-02942481 v1

FIFA: A fault-injection-fault-analysis-based tool for reliability assessment at RTL level

Lirida Naviner , Jean-Francois Naviner , Gutemberg Goncalves dos Santos Junior , Elaine Crespo Marques , Nilson Maciel de Paiva Junior
Microelectronics Reliability, 2011, 51 (9-11), http://www.sciencedirect.com/science/article/pii/S0026271411002162. ⟨10.1016/j.microrel.2011.06.017⟩
Article dans une revue istex hal-00627134 v1

Impact of scaling up the sensor sampling frequency on the reliability of edge processing systems in tolerating soft errors caused by neutrons

Matheus Minelli de Carvalho , Luiz Henrique Laurini , Emmanuel Atukpor , Lirida Naviner , Rodrigo Possamai Bastos
IEEE Sensors Conference 2024, Oct 2024, Kobe, Japan
Communication dans un congrès hal-04739776 v1

Neutron radiation tests and assessment of edge computing systems

Rodrigo Possamai Bastos , Luiz Henrique Laurini , Matheus Minelli de Carvalho , Lirida Naviner
Invited talk presented in VII Workshop sobre os Efeitos das Radiações Ionizantes em Componentes e Circuitos Eletrônicos de Uso Aeroespacial (WERICE AEROESPACIAL 2024), Nov 2024, São José dos Campos, Brazil
Communication dans un congrès hal-04739744 v1

Fast analysis of combinatorial netlists correctness rate based on binomial law and partitioning

Esther Goudet , Luis Peña Treviño , Lirida Naviner , Jean-Marc Daveau , Philippe Roche
2023 IEEE 24th Latin American Test Symposium (LATS), Mar 2023, Veracruz, Mexico. pp.1-6, ⟨10.1109/lats58125.2023.10154491⟩
Communication dans un congrès hal-04420927 v1

Fast and accurate estimation of correctness rate in combinatorial circuits based on clustering

Esther Goudet , Lirida Naviner , Jean Marc Daveau , Philippe Roche
IEEE Workshop on Silicon Errors in Logic – System Effects SELSE 2023, IEEE, Mar 2023, ONLINE, France. pp.1-6
Communication dans un congrès hal-04458400 v1

Minconvnets: a New Class of Multiplication-Less Neural Networks

Xuecan Yang , Sumanta Chaudhuri , Laurence Likforman-Sulem , Lirida Naviner
2022 IEEE International Conference on Image Processing (ICIP), Oct 2022, Bordeaux, France. pp.881-885, ⟨10.1109/ICIP46576.2022.9897286⟩
Communication dans un congrès hal-04297354 v1

Ultra-low Power Access Strategy for Process-Voltage-Temperature Aware STT-MRAM

You-You Zhang , Lirida Naviner , Hao Cai
2021 IEEE 14th International Conference on ASIC (ASICON), Oct 2021, Kunming, China. pp.1-4, ⟨10.1109/ASICON52560.2021.9620529⟩
Communication dans un congrès hal-04477660 v1

Hybrid MTJ-CMOS Integration for Sigma-Delta ADC

Yu-Ang Wu , Lirida Naviner , Hao Cai
2021 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), Nov 2021, AB, Canada. pp.1-5, ⟨10.1109/NANOARCH53687.2021.9642236⟩
Communication dans un congrès hal-04477656 v1

Novel Self-timing Speculative Writing for Unreliable STT-MRAM

Meng-Di Zhang , Hao Cai , Lirida Naviner
2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT), Nov 2020, Kunming, China. pp.1-3, ⟨10.1109/ICSICT49897.2020.9278373⟩
Communication dans un congrès hal-04477675 v1

Magnetic Tunnel Junction-based Analog-to-Digital Converter using Spin Orbit Torque Mechanism

Nilson Maciel , Elaine Marques , Lirida Naviner , Hao Cai
2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS), Nov 2020, Glasgow, United Kingdom. pp.1-4, ⟨10.1109/ICECS49266.2020.9294780⟩
Communication dans un congrès hal-04477665 v1

Quad-Approx CNNs for Embedded Object Detection Systems

Xuecan Yang , Sumanta Chaudhuri , Lirida Naviner , Laurence Likforman-Sulem
2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS), Nov 2020, Glasgow, United Kingdom. pp.1-4, ⟨10.1109/ICECS49266.2020.9294829⟩
Communication dans un congrès hal-04297374 v1

Deep Learning Approaches for Sparse Recovery in Compressive Sensing

E. Marques , N. Maciel , Lirida Naviner , H. Cai , J. Yang
2019 11th International Symposium on Image and Signal Processing and Analysis (ISPA), Sep 2019, Dubrovnik, Croatia. pp.129-134, ⟨10.1109/ISPA.2019.8868841⟩
Communication dans un congrès hal-04477689 v1

Nonlinear Functions in Learned Iterative Shrinkage-Thresholding Algorithm for Sparse Signal Recovery

Elaine Crespo Marques , Nilson Maciel , Lirida Naviner , Hao Cai , Jun Yang
2019 IEEE International Workshop on Signal Processing Systems (SiPS), Oct 2019, Nanjing, China. pp.324-329, ⟨10.1109/SiPS47522.2019.9020469⟩
Communication dans un congrès hal-04477699 v1

Comprehensive Pulse Shape Induced Failure Analysis in Voltage-Controlled MRAM

Mingyue Liu , Hao Cai , Menglin Han , Lei Xie , Jun Yang et al.
2019 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), Jul 2019, Qingdao, China. pp.1-6, ⟨10.1109/NANOARCH47378.2019.181292⟩
Communication dans un congrès hal-04477682 v1

Stability and Variability Emphasized STT-MRAM Sensing Circuit With Performance Enhancement

Menglin Han , Hao Cai , Jun Yang , Lirida Naviner , You Wang et al.
2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS), Oct 2018, Chengdu, China. pp.386-389, ⟨10.1109/APCCAS.2018.8605603⟩
Communication dans un congrès hal-04477743 v1

Reliability Emphasized MTJ/CMOS Hybrid Circuit Towards Ultra-Low Power

Hao Cai , Menglin Han , You Wang , Lirida Naviner , Xinning Liu et al.
2018 Conference on Design of Circuits and Integrated Systems (DCIS), Nov 2018, Lyon, France. pp.1-5, ⟨10.1109/DCIS.2018.8681471⟩
Communication dans un congrès hal-04477704 v1

Probability Aware Fault-Injection Approach for SER Estimation

Fabio Batagin Armelin , Lirida Naviner , Roberto d'Amore
Proceedings of IEEE Latin American Test Symposium (LATS), Mar 2018, São Paulo, SP, Brazil
Communication dans un congrès hal-02287888 v1

MRAM-on-FDSOI Integration: A Bit-Cell Perspective

Hao Cai , You Wang , Wang Kang , Lirida Naviner , Xinning Liu et al.
2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), Jul 2018, Hong Kong, China. pp.263-268, ⟨10.1109/ISVLSI.2018.00056⟩
Communication dans un congrès hal-04477718 v1

Compressed Sensing for Wideband HF Channel Estimation

Elaine Crespo Marques , Nilson Maciel , Lirida Naviner , Hao Cai , Jun Yang
4th International Conference on Frontiers of Signal Processing, Sep 2018, Poitiers, France. pp.1-5
Communication dans un congrès hal-02287975 v1

Design Space Exploration of Magnetic Tunnel Junction based Stochastic Computing in Deep Learning

You Wang , Yue Zhang , Zhabg Youguang , Weisheng Zhao , Hao Cai et al.
To appear in Proceedings of ACM Great Lakes Symposium on VLSI (GLSVLSI), May 2018, Chicago, Illinois, United States. pp.23-25
Communication dans un congrès hal-02287894 v1

Using FPGA self-produced transients to emulate SETs for SER estimation

Fabio Batagin Armelin , Lirida Naviner , Roberto d'Amore
Proceedings of IEEE Latin American Test Symposium (LATS), Mar 2018, São Paulo, SP, Brazil
Communication dans un congrès hal-02288530 v1

Design, Synthesis and Application of A Novel Approximate Adder

Tian Ban , Baokun Wang , Lirida Naviner
2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2018, Windsor, Canada. pp.488-491, ⟨10.1109/MWSCAS.2018.8624023⟩
Communication dans un congrès hal-04477695 v1

Reliability evaluation of circuits designed in multi- and single-stage versions

R. Schvittz , M. Pontes , C. Meinhardt , D. Franco , Lirida Naviner et al.
2018 IEEE 9th Latin American Symposium on Circuits & Systems (LASCAS), Feb 2018, Puerto Vallarta, Mexico. pp.1-4, ⟨10.1109/LASCAS.2018.8399927⟩
Communication dans un congrès hal-04477727 v1

Enabling Resilient Voltage-Controlled MeRAM Using Write Assist Techniques

Hao Cai , You Wang , Lirida Naviner , Jun Yang , Wang Kang et al.
IEEE International Symposium on Circuits and Systems (ISCAS), May 2018, Florence, Italy
Communication dans un congrès hal-02288533 v1

Novel Pulsed-Latch Replacement in Non-Volatile Flip-Flop Core

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
VLSI (ISVLSI), 2017 IEEE Computer Society Annual Symposium on, Jun 2017, Bochum, Germany
Communication dans un congrès hal-02287633 v1

Asymmetrical Length Biasing for Energy Efficient Digital Circuits

Francisco Veirano , Lirida Naviner , Fernando Silveira
IEEE Latin American Symposium on Circuits and Systems, Feb 2017, Bariloche, Argentina
Communication dans un congrès hal-02287637 v1

Energy Efficient Magnetic Tunnel Junction Based Hybrid LSI Using Multi-Threshold UTBB-FD-SOI Device

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
Great Lakes Symposium on VLSI 2017 (GLSVLSI 17), May 2017, Banff, Canada
Communication dans un congrès hal-02287632 v1

Practical metrics for evaluation of fault-tolerant logic design

Alexandre Stempkovskiy , Dmitry Telpukhov , Roman Solovyev , Ekaterina Balaka , Lirida Naviner
IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering, Feb 2017, Saint Petersbourgh, Russia. pp.569-573
Communication dans un congrès hal-02287656 v1

Sparsity Analysis using a Mixed Approach with Greedy and LS Algorithms on Channel Estimation

Nilson Maciel , Elaine Crespo Marques , Lirida Naviner
International Conference on Frontiers of Signal Processing (ICFSP), Sep 2017, Paris, France. pp.91-95
Communication dans un congrès hal-02287640 v1

Analysis of Ageing effects on ARTIX7 XILINX FPGA

Mariem Slimani , Karim Benkalaia , Lirida Naviner
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Sep 2017, Bordeaux, France
Communication dans un congrès hal-02287636 v1

A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28 nm FDSOI

You Wang , Hao Cai , Lirida Naviner , Weisheng Zhao , Jacques-Olivier Klein et al.
ESREF 2016, 27th EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS, Sep 2016, Händel-Halle, Halle, Germany. ⟨10.1016/j.microrel.2016.07.073⟩
Communication dans un congrès hal-01371743 v1

A Layout-Based Fault Injection Methodology for SER Prediction: Implementation and Correlation with 65nm Heavy Ion Experimental Results

Benjamin Coeffic , Victor Malherbe , Jean-Marc Daveau , Gilles Gasiot , Lirida Naviner et al.
Proceedings of IEEE Nuclear and Space Radiation Effects Conference (NSREC), Jul 2016, New Orleans, United States
Communication dans un congrès hal-02288532 v1
Image document

Design Considerations for Reliable OxRAM-based Non-Volatile Flip-Flops in 28nm FD-SOI Technology

Natalija Jovanovic , Olivier Thomas , Elisa Vianello , Boris Nikolic , Lirida Naviner
IEEE International Symposium on Circuits and Systems (ISCAS 2016), May 2016, Montréal, Canada. pp.1146-1149, ⟨10.1109/ISCAS.2016.7527448⟩
Communication dans un congrès hal-02287862 v1

Approximate Computing in MOS/Spintronic Non-Volatile Full-Adder

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
12th ACM/IEEE International Symposium on Nanoscale Architectures, Jun 2016, Beijing, China
Communication dans un congrès hal-02412223 v1

Radiation Hardening Improvement of a SerDes under Heavy Ions up to 60 MeV.cm2/mg by Layout-Aware Fault Injection

Benjamin Coeffic , Jean-Marc Daveau , Gilles Gasiot , A.E. Pricco , S. Parini et al.
Proceedings of IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE), Mar 2016, Austin, Texas, United States
Communication dans un congrès hal-02287892 v1

A novel circuit design of true random number generator using magnetic tunnel junction

You Wang , Hao Cai , Lirida Naviner , Jacques-Olivier Klein , Jianlei Yang et al.
12th ACM/IEEE International Symposium on Nanoscale Architectures (Nanoarch 2016), At Beijing, China, Jul 2016, Beijing, China
Communication dans un congrès hal-01371756 v1

Design insights for reliable energy efficient OxRAM-based flip-flop in 28nm FD-SOI

Natalija Jovanovic , Elisa Vianello , Olivier Thomas , Boris Nikolic , Lirida Naviner
Proceedings of IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Sonoma Valley, CA, United States
Communication dans un congrès hal-02287895 v1

Frequency and Voltage Effects on SER on a 65nm Sparc-V8 Microprocessor Under Radiation Test

Cyril Bottoni , Benjamin Coeffic , Jean-Marc Daveau , Gilles Gasiot , F. Abouzeid et al.
Proceedings of IEEE International Reliability Physics Symposium (IRPS), Apr 2015, Monterrey, CA, United States
Communication dans un congrès hal-02287890 v1

Partial Triplication of a Sparc-V8 Microprocessor Using Fault Injection

Cyril Bottoni , Benjamin Coeffic , Jean-Marc Daveau , Lirida Naviner , Philippe Roche
Proceedings of IEEE Latin American Symposium on Circuits and Systems (LASCAS), Feb 2015, Montevideo, Uruguay
Communication dans un congrès hal-02287891 v1

A Novel Analytical Method for Defect Tolerance Assessment

Mariem Slimani , Arwa Ben Dhia , Lirida Naviner
European Symposium on Reliability of Electron devices, Failure physics and Analysis, Oct 2015, Toulouse, France
Communication dans un congrès hal-01216726 v1

A Tool for Transient Fault Analysis in Combinational Circuits

Mariem Slimani , Lirida Naviner
IEEE International Conference on Electronics, Circuits, and Systems, Dec 2015, Caire, Egypt
Communication dans un congrès hal-02287234 v1

D2D Broadcast Communications for 4G PMR Networks

Xavier Pons Masbernart , Christophe Gruet , Eric Georgeaux , Lirida Naviner
Proceedings of IFIF International Conference on New Technologies, Mobility and Security (NTMS), Jul 2015, Paris, France
Communication dans un congrès hal-02287897 v1

Stochastic Computation With Spin Torque Transfer Magnetic Tunnel Junction

Lirida Naviner , Hao Cai , You Wang , Weisheng Zhao , Arwa Ben Dhia
IEEE-NEWCAS, Jun 2015, Grenoble, France
Communication dans un congrès hal-02412179 v1

Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2015, Toulouse, France
Communication dans un congrès hal-02287226 v1

A Layout-Aware Approach to Fault Injection for Improving Failure Mode Prediction

Cyril Bottoni , Benjamin Coeffic , Jean-Marc Daveau , Gilles Gasiot , Lirida Naviner et al.
Proceedings of Workshop on Silicon Errors in Logic - System Effects (SELSE), Mar 2015, Austin, United States
Communication dans un congrès hal-02288531 v1

Battery-aware network discovery algorithm for mobile terminals within heterogeneous networks

Xavier Pons Masbernart , S. Althunibat , G Kibalya , Christophe Gruet , Lirida Naviner et al.
Proceedings of IEEE International Workshop on Computer Aided Modeling and Design of Communication Links and Networks (CAMAD), Dec 2014, Athens, Greece
Communication dans un congrès hal-02287896 v1

Simulation Study of Aging in CMOS Binary Adders

Ting An , Hao Cai , Lirida Naviner
MIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia
Communication dans un congrès hal-02288395 v1

Cross Logic : A New Approach for Defect-Tolerant Circuits

Mariem Slimani , Arwa Ben Dhia , Lirida Naviner
IEEE International Conference on IC Design and Technology (ICICDT), May 2014, Austin, United States. pp.1-4
Communication dans un congrès hal-01062064 v1

Efficient Implementation for Accurate Analysis of CED Circuits Against Multiple Faults

Ting An , Kaikai Liu , Hao Cai , Lirida Naviner
21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES), Jun 2014, Lublin, Poland
Communication dans un congrès hal-02286893 v1

Impact of Cluster Size on Routability, Testability and Robustness of a Cluster in a Mesh FPGA

Saif-Ur Rehman , Adrien Blanchardon , Arwa Ben Dhia , Mounir Benabdenbi , Roselyne Chotin-Avot et al.
IEEE Computer Society Annual Symposium on VLSI (ISVLSI'14), Jul 2014, Tampa, FL, United States. pp.553-558, ⟨10.1109/ISVLSI.2014.66⟩
Communication dans un congrès hal-01400630 v1

Reliability-aware Delay Faults Evaluation of CMOS Flip-Flops

Hao Cai , Kaikai Liu , Lirida Naviner
21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES), Jun 2014, Lublin, Poland
Communication dans un congrès hal-02412061 v1
Image document

OxRAM-Based Non Volatile Flip-Flop in 28nm FDSOI

Natalija Jovanovic , Olivier Thomas , Elisa Vianello , Jean-Michel Portal , Boris Nikolic et al.
2014 IEEE 12th International New Circuits and Systems Conference (NEWCAS), Jun 2014, Trois Rivières, Canada. ⟨10.1109/NEWCAS.2014.6934003⟩
Communication dans un congrès hal-02288534 v1

Comparative Study of Defect-Tolerant Multiplexers for FPGAs

Arwa Ben Dhia , Mariem Slimani , Lirida Naviner
20th IEEE International On-Line Testing Symposium (IOLTS), Jul 2014, Platja d'Aro, Spain. pp.7-12
Communication dans un congrès hal-01062059 v1

Efficient Computation of Combinational Circuits Reliability Based on Probabilistic Transfer Matrix

Lirida Naviner , Kaikai Liu , Hao Cai , Jean-François Naviner
International Conference on IC Design and Technology (ICICDT), May 2014, Austin, United States
Communication dans un congrès hal-02412060 v1

A hybrid reliability assessment method and its support of sequential logic modelling

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner , Dhiraj Pradhan
IEEE International On-line Test Symposium, Jul 2014, Platja d'Aro, Spain
Communication dans un congrès hal-02412073 v1

Heavy ions test result on a 65nm sparc-v8 radiation-hard microprocessor

Cyril Bottoni , Jean-Marc Daveau , Gilles Gasiot , Lirida Naviner , Philippe Roche
IEEE International Reliability Physics Symposium, Jun 2014, Waikoloa, Hawai, United States
Communication dans un congrès hal-02412075 v1

Analytical method for reliability assessment of concurrent checking circuits under multiple faults

Ting An , Kaikai Liu , Lirida Naviner
MIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia
Communication dans un congrès hal-02286867 v1

A Defect-Tolerant Multiplexer Using Differential Logic for FPGAs

Arwa Ben Dhia , Mariem Slimani , Lirida Naviner
IEEE 21st Mixed Design of Integrated Circuits and Systems Conference (MIXDES), Jun 2014, Lublin, Poland. pp.375-380
Communication dans un congrès hal-01062063 v1

Improving the Robustness of a Switch Box in a Mesh of Clusters FPGA

Arwa Ben Dhia , Mariem Slimani , Lirida Naviner
15th IEEE Latin American Test Workshop (LATW), Mar 2014, Fortaleza, Brazil. pp.1-6
Communication dans un congrès hal-01062066 v1

Flip-flop selection for in-situ slack-time monito- ring based on the activation probability of timing-critical paths.

Sébastien Sarrazin , Samuel Evain , Ivan Miro Panades , Alexandre Valentian , Lirida Naviner et al.
IEEE International On-line Test Symposium, Jul 2014, Platja d'Aro, Spain
Communication dans un congrès hal-02412072 v1

A Study of Statistical Variability-aware Methods

Hao Cai , Kaikai Liu , Lirida Naviner
IEEE International Symposium on Radio Frequency Integration Technology (RFIT), Aug 2014, Hefei, China
Communication dans un congrès hal-02286946 v1
Image document

A Defect-tolerant Cluster in a Mesh SRAM-based FPGA

Arwa Ben Dhia , Saif Ur Rehman , Adrien Blanchardon , Lirida Naviner , Mounir Benabdenbi et al.
International Conference on Field-Programmable Technology (FPT), Dec 2013, Kyoto, Japan. pp.434-437, ⟨10.1109/FPT.2013.6718407⟩
Communication dans un congrès hal-00987365 v1

Reliability analysis of combinational circuits with the influences of noise and single-event transients

Kaikai Liu , Hao Cai , Ting An , Lirida Naviner , Jean-François Naviner et al.
IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, United States
Communication dans un congrès hal-02286814 v1

A model to simulate the behaviour of probabilistic gates

Kaikai Liu , Lirida Naviner , Jean-François Naviner
Journées Nationales du Réseau Doctoral de Microélectronique, Jun 2013, Grenoble, France
Communication dans un congrès hal-02286894 v1

Single Event Transient Mitigation Through Pulse Quenching: Effectiveness at Circuit Level

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner
IEEE International Conference of Electronics, Circuits and Systems (ICECS), Dec 2013, Abu Dhabi, United Arab Emirates
Communication dans un congrès hal-02412466 v1

Reliability Assessment of Combinational Logic Using First-Order-Only Fanout Reconvergence Analysis

Samuel Nascimento Pagliarini , Tian Ban , Lirida Naviner , Jean-François Naviner
Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2013, Columbus, OH., United States
Communication dans un congrès hal-02411994 v1

Comparison of Fault-Tolerant Fabless CLBs in SRAM-based FPGAs

Arwa Ben Dhia , Lirida Naviner , Philippe Matherat
IEEE Latin-American Test Workshop (LATW), Apr 2013, Cordoba, Argentina. pp.1-6
Communication dans un congrès hal-01062112 v1

Evaluating CLB Designs under Multiple SETs in SRAM-based FPGAs

Arwa Ben Dhia , Lirida Naviner , Philippe Matherat
IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New-York City, United States. pp.112-117
Communication dans un congrès hal-01062101 v1

Selective Hardening Against Multiple Faults Employing a Net-based Reliability Analysis

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner
International New Circuits and Systems Conference (NEWCAS), Jun 2013, Paris, France
Communication dans un congrès hal-02411993 v1

Nouvelle architecture de BLE tolérante aux fautes dans les FPGAs SRAM

Arwa Ben Dhia , Lirida Naviner , Philippe Matherat
Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2013, Grenoble, France
Communication dans un congrès hal-02288374 v1

Evaluation of Fault-tolerant Composite Field AES S-Boxes under Multiple Transient Faults

Ting An , Lirida Naviner , Philippe Matherat
IEEE International NEWCAS Conference, Jun 2013, Paris, France. pp.1 - 4
Communication dans un congrès hal-00973720 v1

Exploring the Impact of Transient Faults on CORDIC Processor

Ting An , Lirida Naviner , Philippe Matherat
Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM), Jun 2013, Grenoble, France
Communication dans un congrès hal-02411992 v1

Uplink energy efficiency in LTE systems

Xavier Pons Masbernart , Raul Palacios , Christophe Gruet , Lirida Naviner , Hugo Marques et al.
IEEE International Workshop on Computer Aided Modeling and Design of Communication Links and Networks, Sep 2013, Berlin, Germany
Communication dans un congrès hal-02412074 v1

A General Cost-effective Design Structure for Probabilistic-Based Noise-Tolerant Logic Functions in Nanometer CMOS Technology

Kaikai Liu , Ting An , Hao Cai , Lirida Naviner , Jean-François Naviner et al.
Eurocon 2013, Jul 2013, Zagreb, Croatia. pp.1829-1836, ⟨10.1109/EUROCON.2013.6625225⟩
Communication dans un congrès hal-02286855 v1

Circuit-level Hardening Against Multiple Faults: Combining Global TMR and Selective Hardening

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner
Journées Nationales du Réseau Doctoral de Microélectronique, Jun 2013, Grenoble, France
Communication dans un congrès hal-02286728 v1

A Low Cost Reliable Architecture for S-Boxes in AES Processors

Ting An , Lirida Naviner , Philippe Matherat
IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, U.S. Outlying Islands. pp.155-160
Communication dans un congrès hal-01024892 v1

SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults

Samuel Nascimento Pagliarini , Arwa Ben Dhia , Lirida Naviner , J. F. Naviner
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1230-1234
Communication dans un congrès hal-01062078 v1

A defect-tolerant area-efficient multiplexer for basic blocks in SRAM-based FPGAs

Arwa Ben Dhia , Samuel Nascimento Pagliarini , Lirida Naviner , Habib Mehrez , Philippe Matherat
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1189-1193
Communication dans un congrès hal-01062075 v1

Single-Event-Induced Charge Sharing Effects in TMR with Different Levels of Granularity

Felipe Almeida , Fernanda Lima Kastensmidt , Samuel Nascimento Pagliarini , Luis Entrena , Almudena Lindoso et al.
European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2012, Biarritz, France
Communication dans un congrès hal-02286461 v1

Transient Fault Analysis of CORDIC Processor

Ting An , Matteo Causo , Lirida Naviner , Philippe Matherat
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Communication dans un congrès hal-00973766 v1

Transient Fault Analysis of CORDIC Processor

Ting An , Matteo Causo , Lirida Naviner , Philippe Matherat
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Communication dans un congrès hal-00973765 v1

Transient Fault Analysis of CORDIC Processor

Ting An , Matteo Causo , Lirida Naviner , Philippe Matherat
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Communication dans un congrès hal-00973764 v1

Reliability Analysis of a Reed-Solomon Decoder

Kaikai Liu , Tian Ban , Lirida Naviner , Jean-François Naviner
IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2012, Boise, Idaho, United States
Communication dans un congrès hal-02411876 v1

Exploring the Feasibility of Selective Hardening for Combinational Logic

Samuel Nascimento Pagliarini , Gutemberg Gonçalves dos Santos Jr , Lirida Naviner , Jean-François Naviner
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2012, Cagliari, Italy
Communication dans un congrès hal-02288323 v1

Green Solutions for Future LTE PMR Networks

Xavier Pons Masbernart , Christophe Gruet , Frédéric Fraysse , Serge Contal , Lirida Naviner
IEEE International Workshop on Computer Aided Modeling and Design of Communication Links and Networks (CAMAD), Sep 2012, Barcelona, Spain
Communication dans un congrès hal-02411920 v1

Designing Digital Reliable Processors in Nanotechnologies

Lirida Naviner
NanoTechItaly, Nov 2012, Venice, Italy
Communication dans un congrès hal-02411921 v1

Selective Hardening Concerning Single and Multiple Faults

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner
Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2012, Marseille, France
Communication dans un congrès hal-02286334 v1

Parallel Scaling-Free and Area-Time Efficient CORDIC Algorithm

Matteo Causo , Ting An , Lirida Naviner
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.149 - 152
Communication dans un congrès hal-01024891 v1

Reliability estimation methods : Tradeoffs between complexity and accuracy

Samuel Nascimento Pagliarini , Denis Teixeira Franco , Lirida Naviner , Jean-François Naviner
Southern Simposium of Microelectronics, Apr 2012, Sao Miguel das Missoes, RS, Brazil
Communication dans un congrès hal-02288322 v1

Tolérance aux défauts dans les FPGAs

Arwa Ben Dhia , Lirida Naviner , P. Matherat
Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2012, Marseille, France
Communication dans un congrès hal-02411877 v1

Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner
European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2012, Biarritz, France
Communication dans un congrès hal-02286459 v1

Selective Hardening Methodology Concerning Multiple Faults

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner
IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States
Communication dans un congrès hal-02411864 v1

Fault tolerant architectures in nanoelectronics: The progressive approach

Tian Ban , Lirida Naviner
Southern Simposium of Microelectronics, Apr 2012, Sao Miguel das Missoes, RS, Brazil
Communication dans un congrès hal-02286332 v1

Signal Probability, Reliability and Error Bound of Majority Voter in TMR

Tian Ban , Lirida Naviner
IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2012, Boise, Idaho, United States
Communication dans un congrès hal-02286333 v1

Analyzing and Alleviating the Impact of Errors on an SRAM-based FPGA Cluster

Arwa Ben Dhia , Lirida Naviner , P. Matherat
IEEE International On-Line Testing Symposium (IOLTS), Jun 2012, Sitges, Spain. pp.31-36
Communication dans un congrès hal-01062799 v1

A New Fault-Tolerant Architecture for CLBs in SRAM-based FPGAs

Arwa Ben Dhia , Lirida Naviner , P. Matherat
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Sevilla, Spain. pp.761-764
Communication dans un congrès hal-01062116 v1

Reliability and Hardening of FPGA Implementations face to Radiative Constraints

Gutemberg Gonçalves dos Santos Jr , Lirida Naviner , J. F. Naviner
Journées Nationales Electronique et Rayonnements Naturels au Niveau du Sol (RADSOL), Jun 2012, Paris, France
Communication dans un congrès hal-02288324 v1
Image document

Selective Hardening Methodology for Combinational Logic

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner
IEEE Latin-American Test Workshop (LATW), Apr 2012, Quito, Ecuador. pp.6
Communication dans un congrès hal-00695808 v1

Automatic Selective Hardening Against Soft Errors: a Cost-based and Regularity-aware Approach

Samuel Nascimento Pagliarini , Arwa Ben Dhia , Lirida Naviner , J. F. Naviner
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Sevilla, Spain. pp.753-756
Communication dans un congrès hal-01062119 v1

Optimized Robust Digital Voter in TMR Designs

Tian Ban , Lirida Naviner
Proceedings of Colloque National GdR SoC-SiP, Jun 2011, Lyon, France
Communication dans un congrès hal-00637642 v1

Reliability analysis based on significance

Lirida Naviner , Jean-Francois Naviner , Tian Ban , Gutemberg Goncalves dos Santos Junior
Argentine School of Micro-Nanoelectronics Technology and Applications (EAMTA), Aug 2011, Buenos Aires, Argentina. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6021291
Communication dans un congrès hal-00637373 v1

An approach for efficient reliability improvement of digital circuits

Gutemberg Goncalves dos Santos Junior , Elaine Crespo Marques , Lirida Naviner , Jean-Francois Naviner
Colloque National GdR SoC-SiP, Jun 2011, Lyon, France
Communication dans un congrès hal-00637375 v1

Effective metrics for reliability analysis

Elaine Crespo Marques , Gutemberg Goncalves dos Santos Junior , Lirida Naviner , Jean-Francois Naviner
Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on, Aug 2010, Seattle, WA, United States. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5548671&tag=1, ⟨10.1109/MWSCAS.2010.5548671⟩
Communication dans un congrès hal-00627132 v1

A 65 nm CMOS versatile ADC using time interleaving and ΣΔ modulation for multi-mode receiver

Ali Beydoun , Chadi Jabbour , Hussein Fakhoury , van Tam Nguyen , Lirida Naviner et al.
2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA), Jun 2009, Toulouse, France. pp.1-4, ⟨10.1109/NEWCAS.2009.5290510⟩
Communication dans un congrès hal-03591883 v1

Cryogenic In-MRAM Computing

Yaoru Hou , We Ge , Yanan Guo , Lirida Naviner , You Wang et al.
2021 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), IEEE, pp.1-6, 2021, ⟨10.1109/NANOARCH53687.2021.9642238⟩
Proceedings/Recueil des communications hal-04420929 v1

Compact thermal modeling of spin transfer torque magnetic tunnel junction

You Wang , Hao Cai , Lirida Naviner , Yue Zhang , Jacques-Olivier Klein et al.
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis 2015, Oct 2015, Toulouse, France. , 2015, ⟨10.1016/j.microrel.2015.06.029⟩
Proceedings/Recueil des communications hal-01216419 v1

Compact model of magnetic tunnel junction with stochastic spin transfer torque switching for reliability analyses

You Wang , Yue Zhang , Erya Deng , Jacques-Olivier Klein , Lirida Naviner et al.
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis 2014, Sep 2014, Berlin, Germany. , 2014, ⟨10.1016/j.microrel.2014.07.019⟩
Proceedings/Recueil des communications hal-01216431 v1

From DMO to D2D

Xavier Pons Masbernart , Eric Georgeaux , Christophe Gruet , François Montaigne , Lirida Naviner
Wireless Public Safety Networks: Overview and Challenges, ISTE Press & Elsivier, pp.9-126, 2015
Chapitre d'ouvrage hal-02287836 v1

Reliability Aware AMS/RF Performance Optimization

P. Maris Ferreira , Hao Cai , Lirida Naviner
Performance Optimization Techniques in Analog, Mixed-Signal, and Radio-Frequency Circuit Design, IGI Global, 2014
Chapitre d'ouvrage hal-02286875 v1

Reliability Aware AMS / RF Performance Optimization

Pietro Maris Ferreira , Hao Cai , Lirida Naviner
Mourad Fakhfakh, Esteban Tlelo-Cuautle, Maria Helena Fino. Performance Optimization Techniques in Analog, Mixed-Signal, and Radio-Frequency Circuit Design, 2014, ⟨10.4018/978-1-4666-6627-6.ch002⟩
Chapitre d'ouvrage hal-01222104 v1