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Lirida Naviner

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Publications

Dependable STT-MRAM With Emerging Approximation and Speculation Paradigms

Hao Cai , Yaoru Hou , Mengdi Zhang , Bo Liu , Lirida Naviner
IEEE Design & Test, 2023, 40 (3), pp.17-25. ⟨10.1109/MDAT.2021.3120330⟩
Journal articles hal-04420922v1

A survey on two-dimensional Error Correction Codes applied to fault-tolerant systems

David Freitas , César Marcon , Jarbas Silveira , Lirida Naviner , João Mota
Microelectronics Reliability, 2022, 139, pp.114826. ⟨10.1016/j.microrel.2022.114826⟩
Journal articles hal-04420908v1

OPCoSA: an Optimized Product Code for space applications

David Freitas , Jarbas Silveira , César Marcon , Lirida Naviner , João Mota
Integration, the VLSI Journal, 2022, 84, pp.131-141. ⟨10.1016/j.vlsi.2022.02.005⟩
Journal articles hal-04420909v1

Writing-only in-MRAM computing paradigm for ultra-low power applications

Bo Liu , Mingyue Liu , Yongliang Zhou , Xiaofeng Hong , Hao Cai
Microprocessors and Microsystems: Embedded Hardware Design , 2022, 90, pp.104449. ⟨10.1016/j.micpro.2022.104449⟩
Journal articles hal-04420915v1

Commodity Bit-Cell Sponsored MRAM Interaction Design for Binary Neural Network

Hao Cai , Zhongjian Bian , Zhonghua Fan , Bo Liu , Lirida Naviner
IEEE Transactions on Electron Devices, 2022, 69 (4), pp.1721-1726. ⟨10.1109/TED.2021.3134588⟩
Journal articles hal-04420910v1

Tunnel Magnetoresistance Based Passive Resistance Replacement in Hybrid MTJ-CMOS Integration

Yu-Ang Wu , Xinshu Xie , Xinfang Tong , Yantong Di , Lirida Naviner
IEEE Transactions on Nanotechnology, 2022, 21, pp.638-647. ⟨10.1109/TNANO.2022.3216778⟩
Journal articles hal-04420913v1

Sparse Realization in Unreliable Spin-Transfer-Torque RAM for Convolutional Neural Network

Hao Cai , Juntong Chen , Yongliang Zhou , Xiaofeng Hong , Bo Liu
IEEE Transactions on Magnetics, 2021, 57 (2), pp.1-5. ⟨10.1109/TMAG.2020.3015146⟩
Journal articles hal-04420916v1

Investigation of PVT-Aware STT-MRAM Sensing Circuits for Low-VDD Scenario

Zhongjian Bian , Xiaofeng Hong , Yanan Guo , Lirida Naviner , Wei Ge
Micromachines, 2021, 12 (5), pp.551. ⟨10.3390/mi12050551⟩
Journal articles hal-04420923v1

Analysis of stepwise charging limits and its implementation for efficiency improvement in switched capacitor DC–DC converters

Francisco Veirano , Pablo Castro Lisboa , Pablo Pérez-Nicoli , Lirida Naviner , Fernando Silveira
Analog Integrated Circuits and Signal Processing, 2021, 109 (2), pp.271-282. ⟨10.1007/s10470-021-01810-5⟩
Journal articles hal-04420921v1

Triple Sensing Current Margin for Maintainable MRAM Yield at Sub-100% Tunnel Magnetoresistance Ratio

Hao Cai , Menglin Han , Yongliang Zhou , Bo Liu , Lirida Naviner
IEEE Transactions on Magnetics, 2021, 57 (2), pp.1-5. ⟨10.1109/TMAG.2020.3011614⟩
Journal articles hal-04420918v1

A survey of in-spin transfer torque MRAM computing

Hao Cai , Bo Liu , Juntong Chen , Lirida Naviner , Yongliang Zhou
Science China Information Sciences, 2021, 64 (6), pp.160402. ⟨10.1007/s11432-021-3220-0⟩
Journal articles hal-04420919v1
Image document

CSME: A novel cycle-sensing margin enhancement scheme for high yield STT-MRAM

H. Cai , M. Liu , Y. Zhou , B. Liu , Lirida Naviner
Microelectronics Reliability, 2020, pp.113732. ⟨10.1016/j.microrel.2020.113732⟩
Journal articles hal-02941338v1
Image document

Magnetic Tunnel Junction Applications

Nilson Maciel , Elaine Marques , Lirida Naviner , Yongliang Zhou , Hao Cai
Sensors, 2020, 20 (1), pp.121. ⟨10.3390/s20010121⟩
Journal articles hal-02941339v1

Voltage-Controlled Magnetic Anisotropy MeRAM Bit-Cell over Event Transient Effects

Nilson Maciel , Elaine Crespo Marques , Lirida Naviner , Hao Cai , Jun Yang
Journal of Low Power Electronics Applications, 2019, 9 (2), pp.1-14. ⟨10.3390/jlpea9020015⟩
Journal articles hal-02288058v1

Optimal Asymmetrical Back Plane Biasing for Energy Efficient Digital Circuits in 28 nm UTBB FD-SOI

Francisco Veirano , Lirida Naviner , Fernando Silveira
Integration, the VLSI Journal, 2019, 65, pp.211-218. ⟨10.1016/j.vlsi.2017.08.008⟩
Journal articles hal-02287634v1

Soft-Error Vulnerability Estimation Approach Based on the SET Susceptibility of Each Gate

Fábio Batagin Armelin , Lirida Naviner , Roberto D’amore
Electronics, 2019, 8 (7), pp.749. ⟨10.3390/electronics8070749⟩
Journal articles hal-02941341v1

Addressing Failure and Aging Degradation in MRAM/MeRAM-on-FDSOI Integration

Hao Cai , You Wang , Lirida Naviner , Xinning Liu , Weiwei Shan
IEEE Transactions on Circuits and Systems I: Regular Papers, 2019, 66 (1), pp.239-250. ⟨10.1109/TCSI.2018.2854277⟩
Journal articles hal-02942486v1
Image document

A Review of Sparse Recovery Algorithms

Elaine Crespo Marques , Nilson Maciel , Lirida Naviner , Hao Cai , Jun Yang
IEEE Access, 2019, 7, pp.1300-1322. ⟨10.1109/ACCESS.2018.2886471⟩
Journal articles hal-02942487v1

Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology

Nilson Maciel , Elaine Crespo Marques , Lirida Naviner , Hao Cai
Microelectronics Reliability, 2018, 88-90, pp.965-968
Journal articles hal-02287982v1

Exploring Hybrid STT-MTJ/CMOS Energy Solution in Near/Sub-Threshold Regime

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
IEEE Transactions on Magnetics, 2018, 54 (2), pp.1-9
Journal articles hal-02287861v1

Exploring Hybrid STT-MTJ/CMOS Energy Solution in Near-/Sub-Threshold Regime for IoT Applications

Hao Cai , You Wang , Lirida Naviner , Jun Yang , Weisheng Zhao
IEEE Transactions on Magnetics, 2018, 54 (2), pp.1-9. ⟨10.1109/TMAG.2017.2766220⟩
Journal articles hal-04420926v1

Robust Ultra-Low Power Non-Volatile Logic-in-Memory Circuits in FD-SOI Technology

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
IEEE Transactions on Circuits and Systems I: Regular Papers, 2017, 64 (4), pp.847-857
Journal articles hal-02287638v1

Optimum NMOS/PMOS Imbalance for Energy Efficient Digital Circuits

Francisco Veirano , Lirida Naviner , Fernando Silveira
IEEE Transactions on Circuits and Systems I: Regular Papers, 2017
Journal articles hal-02287635v1

A Non-Monte-Carlo Methodology for Variability Analysis of Magnetic Tunnel Junction-Based Circuits

You Wang , Hao Cai , Lirida Naviner , Weisheng Zhao
IEEE Transactions on Magnetics, 2017, 53 (3), pp.1-6. ⟨10.1109/TMAG.2016.2638913⟩
Journal articles hal-02287631v1
Image document

High Performance MRAM with Spin-Transfer-Torque and Voltage-Controlled Magnetic Anisotropy Effects

Hao Cai , Wang Kang , You Wang , Lirida Naviner , Jun Yang
Applied Sciences, 2017, 7 (9), pp.1-13. ⟨10.3390/app7090929⟩
Journal articles hal-02287690v1

Failure Analysis in Magnetic Tunnel Junction Nanopillar with Interfacial Perpendicular Magnetic Anisotropy

Weisheng Zhao , You Wang , Lirida Naviner
Materials Science Journal, 2017, 9 (41), pp.1-17
Journal articles hal-02287641v1

Analysis of Ageing effects on ARTIX7 XILINX FPGA (article) Author

Mariem Slimani , Karim Benkalaia , Lirida Naviner
Microelectronics Reliabilit Journal, 2017
Journal articles hal-02287639v1

Breakdown Analysis of Magnetic Flip-flop With 28nm UTBB FDSOI Technology

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
IEEE Transactions on Device and Materials Reliability, 2016, 16 (3), pp.376-383
Journal articles hal-02287471v1

A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28nm FDSOI

Y. Wang , H. Cai , Lirida Naviner , X.X. Zhao , Y. Zhang
Microelectronics Reliability, 2016, ⟨10.1016/j.microrel.2016.07.073⟩
Journal articles hal-01371736v1

Efficient reliability evaluation methodologies for combinational circuits

Hao Cai , Kaikai Liu , Lirida Naviner , You Wang , Mariem Slimani
Microelectronics Reliability, 2016, 64, pp.19-25. ⟨10.1016/j.microrel.2016.07.116⟩
Journal articles hal-02942489v1

Reliable majority voter based on spin transfer torque magnetic tunnel junction device

Paulo Butzen , Mariem Slimani , You Wang , Hao Cai , Lirida Naviner
IEEE Electronics Letters, 2016, 52 (1), pp.47-49
Journal articles hal-02287642v1

Reliability analysis of hybrid spin transfer torque magnetic tunnel junction/CMOS majority voters

Mariem Slimani , Lirida Naviner , You Wang , Hao Cai
Microelectronics Reliability, 2016, C (64), pp.48-53
Journal articles hal-02287469v1

Low Power Magnetic Flip-Flop Optimization With FDSOI Technology Boost

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
IEEE Transactions on Magnetics, 2016, 52 (8), pp.1-7
Journal articles hal-02287472v1

Compact Model of Dielectric Breakdown in Spin-Transfer Torque Magnetic Tunnel Junction

You Wang , Hao Cai , Lirida Naviner , Yue Zhang , Zhao Xiaoxuan
IEEE Transactions on Electron Devices, 2016, 63 (4), pp.1762 - 1767. ⟨10.1109/TED.2016.2533438⟩
Journal articles hal-01318736v1

Efficient reliability evaluation methodologies for combinational circuits

Hao Cai , Kaikai Liu , Lirida Naviner , You Wang , Mariem Slimani
Microelectronics Reliability, 2016, 64
Journal articles hal-02287474v1

Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
Microelectronics Reliability, 2015
Journal articles hal-02287224v1

Compact thermal modeling of spin transfer torque magnetic tunnel junction

You Wang , Hao Cai , Lirida Naviner , Yue Zhang , Jacques-Olivier Klein
Microelectronics Reliability, 2015, 55 (9-10), pp.1649-1653. ⟨10.1016/j.microrel.2015.06.029⟩
Journal articles hal-01216389v1

A dual-rail compact defect-tolerant multiplexer

Arwa Ben Dhia , Mariem Slimani , Hao Cai , Lirida Naviner
Microelectronics Reliability, 2015, 55, pp.662-670
Journal articles hal-01128326v1

Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Ting An , Kaikai Liu , Hao Cai , Lirida Naviner
Microelectronics Reliability, 2015, 55 (3-4), pp.696-703
Journal articles hal-01122423v1

A Novel Analytical Method for Defect Tolerance Assessment

Mariem Slimani , Arwa Ben Dhia , Lirida Naviner
Microelectronics Reliability, 2015, 55, pp.1285-1289
Journal articles hal-01216729v1

Multiplexing Sense Amplifier Based Magnetic Flip Flop in 28nm FDSOI Technology

Hao Cai , You Wang , Weisheng Zhao , Lirida Naviner
IEEE Transactions on Nanotechnology, 2015, 14 (4)
Journal articles hal-02287225v1

Compact model of magnetic tunnel junction with stochastic spin transfer torque switching for reliability analyses

You Wang , Yue Zhang , Erya Deng , Jacques-Olivier Klein , Lirida Naviner
Microelectronics Reliability, 2014, 54 (9-10), pp.1774-1778. ⟨10.1016/j.microrel.2014.07.019⟩
Journal articles hal-01216414v1

Optimal digital reconstruction and calibration for multichannel Time Interleaved ΣΔ ADC based on Comb-filters

Ali Beydoun , van Tam Nguyen , Lirida Naviner , Patrick Loumeau
AEÜ - International Journal of Electronics and Communications / Archiv für Elektronik und Übertragungstechnik, 2013, 67 (4), pp.329-339. ⟨10.1016/j.aeue.2012.10.004⟩
Journal articles hal-02942479v1

SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults

Samuel Nascimento Pagliarini , Arwa Ben Dhia , Lirida Naviner , J. F. Naviner
Microelectronics Reliability, 2013, pp.1230-1234
Journal articles hal-01062108v1

A defect-tolerant area-efficient multiplexer for basic blocks in SRAM-based FPGAs

Arwa Ben Dhia , Samuel Nascimento Pagliarini , Lirida Naviner , Habib Mehrez , Philippe Matherat
Microelectronics Reliability, 2013, pp.1189-1193
Journal articles hal-01062109v1

A defect-tolerant area-efficient multiplexer for basic blocks in SRAM-based FPGAs

Arwa Ben Dhia , S. N. Pagliarini , Lirida Naviner , Habib Mehrez , Philippe Matherat
Microelectronics Reliability, 2013, 53 (9-11), pp.1189-1193. ⟨10.1016/j.microrel.2013.06.014⟩
Journal articles hal-01195954v1

Majority voter: Signal probability, reliability and error bound characteristics

Tian Ban , Lirida Naviner
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on, 2012, pp.538 - 541
Journal articles hal-00728879v1

Progressive module redundancy for fault-tolerant designs in nanoelectronics

Tian Ban , Lirida Naviner
Microelectronics Reliability, 2011, 51 (9-11), pp.1489-1492. ⟨10.1016/j.microrel.2011.06.020⟩
Journal articles hal-02942481v1

FIFA: A fault-injection-fault-analysis-based tool for reliability assessment at RTL level

Lirida Naviner , Jean-Francois Naviner , Gutemberg Goncalves dos Santos Junior , Elaine Crespo Marques , Nilson Maciel de Paiva Junior
Microelectronics Reliability, 2011, 51 (9-11), http://www.sciencedirect.com/science/article/pii/S0026271411002162. ⟨10.1016/j.microrel.2011.06.017⟩
Journal articles hal-00627134v1

Fast analysis of combinatorial netlists correctness rate based on binomial law and partitioning

Esther Goudet , Luis Peña Treviño , Lirida Naviner , Jean-Marc Daveau , Philippe Roche
2023 IEEE 24th Latin American Test Symposium (LATS), Mar 2023, Veracruz, Mexico. pp.1-6, ⟨10.1109/lats58125.2023.10154491⟩
Conference papers hal-04420927v1

Fast and accurate estimation of correctness rate in combinatorial circuits based on clustering

Esther Goudet , Lirida Naviner , Jean Marc Daveau , Philippe Roche
IEEE Workshop on Silicon Errors in Logic – System Effects SELSE 2023, IEEE, Mar 2023, ONLINE, France. pp.1-6
Conference papers hal-04458400v1

Minconvnets: a New Class of Multiplication-Less Neural Networks

Xuecan Yang , Sumanta Chaudhuri , Laurence Likforman-Sulem , Lirida Naviner
2022 IEEE International Conference on Image Processing (ICIP), Oct 2022, Bordeaux, France. pp.881-885, ⟨10.1109/ICIP46576.2022.9897286⟩
Conference papers hal-04297354v1

Ultra-low Power Access Strategy for Process-Voltage-Temperature Aware STT-MRAM

You-You Zhang , Lirida Naviner , Hao Cai
2021 IEEE 14th International Conference on ASIC (ASICON), Oct 2021, Kunming, China. pp.1-4, ⟨10.1109/ASICON52560.2021.9620529⟩
Conference papers hal-04477660v1

Hybrid MTJ-CMOS Integration for Sigma-Delta ADC

Yu-Ang Wu , Lirida Naviner , Hao Cai
2021 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), Nov 2021, AB, Canada. pp.1-5, ⟨10.1109/NANOARCH53687.2021.9642236⟩
Conference papers hal-04477656v1

Novel Self-timing Speculative Writing for Unreliable STT-MRAM

Meng-Di Zhang , Hao Cai , Lirida Naviner
2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT), Nov 2020, Kunming, China. pp.1-3, ⟨10.1109/ICSICT49897.2020.9278373⟩
Conference papers hal-04477675v1

Magnetic Tunnel Junction-based Analog-to-Digital Converter using Spin Orbit Torque Mechanism

Nilson Maciel , Elaine Marques , Lirida Naviner , Hao Cai
2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS), Nov 2020, Glasgow, United Kingdom. pp.1-4, ⟨10.1109/ICECS49266.2020.9294780⟩
Conference papers hal-04477665v1

Quad-Approx CNNs for Embedded Object Detection Systems

Xuecan Yang , Sumanta Chaudhuri , Lirida Naviner , Laurence Likforman-Sulem
2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS), Nov 2020, Glasgow, United Kingdom. pp.1-4, ⟨10.1109/ICECS49266.2020.9294829⟩
Conference papers hal-04297374v1

Deep Learning Approaches for Sparse Recovery in Compressive Sensing

E. Marques , N. Maciel , Lirida Naviner , H. Cai , J. Yang
2019 11th International Symposium on Image and Signal Processing and Analysis (ISPA), Sep 2019, Dubrovnik, Croatia. pp.129-134, ⟨10.1109/ISPA.2019.8868841⟩
Conference papers hal-04477689v1

Comprehensive Pulse Shape Induced Failure Analysis in Voltage-Controlled MRAM

Mingyue Liu , Hao Cai , Menglin Han , Lei Xie , Jun Yang
2019 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), Jul 2019, Qingdao, China. pp.1-6, ⟨10.1109/NANOARCH47378.2019.181292⟩
Conference papers hal-04477682v1

Nonlinear Functions in Learned Iterative Shrinkage-Thresholding Algorithm for Sparse Signal Recovery

Elaine Crespo Marques , Nilson Maciel , Lirida Naviner , Hao Cai , Jun Yang
2019 IEEE International Workshop on Signal Processing Systems (SiPS), Oct 2019, Nanjing, China. pp.324-329, ⟨10.1109/SiPS47522.2019.9020469⟩
Conference papers hal-04477699v1

Stability and Variability Emphasized STT-MRAM Sensing Circuit With Performance Enhancement

Menglin Han , Hao Cai , Jun Yang , Lirida Naviner , You Wang
2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS), Oct 2018, Chengdu, China. pp.386-389, ⟨10.1109/APCCAS.2018.8605603⟩
Conference papers hal-04477743v1

Design Space Exploration of Magnetic Tunnel Junction based Stochastic Computing in Deep Learning

You Wang , Yue Zhang , Zhabg Youguang , Weisheng Zhao , Hao Cai
To appear in Proceedings of ACM Great Lakes Symposium on VLSI (GLSVLSI), May 2018, Chicago, Illinois, United States. pp.23-25
Conference papers hal-02287894v1

Compressed Sensing for Wideband HF Channel Estimation

Elaine Crespo Marques , Nilson Maciel , Lirida Naviner , Hao Cai , Jun Yang
4th International Conference on Frontiers of Signal Processing, Sep 2018, Poitiers, France. pp.1-5
Conference papers hal-02287975v1

Using FPGA self-produced transients to emulate SETs for SER estimation

Fabio Batagin Armelin , Lirida Naviner , Roberto d'Amore
Proceedings of IEEE Latin American Test Symposium (LATS), Mar 2018, São Paulo, SP, Brazil
Conference papers hal-02288530v1

Reliability evaluation of circuits designed in multi- and single-stage versions

R. Schvittz , M. Pontes , C. Meinhardt , D. Franco , Lirida Naviner
2018 IEEE 9th Latin American Symposium on Circuits & Systems (LASCAS), Feb 2018, Puerto Vallarta, Mexico. pp.1-4, ⟨10.1109/LASCAS.2018.8399927⟩
Conference papers hal-04477727v1

Reliability Emphasized MTJ/CMOS Hybrid Circuit Towards Ultra-Low Power

Hao Cai , Menglin Han , You Wang , Lirida Naviner , Xinning Liu
2018 Conference on Design of Circuits and Integrated Systems (DCIS), Nov 2018, Lyon, France. pp.1-5, ⟨10.1109/DCIS.2018.8681471⟩
Conference papers hal-04477704v1

Probability Aware Fault-Injection Approach for SER Estimation

Fabio Batagin Armelin , Lirida Naviner , Roberto d'Amore
Proceedings of IEEE Latin American Test Symposium (LATS), Mar 2018, São Paulo, SP, Brazil
Conference papers hal-02287888v1

Enabling Resilient Voltage-Controlled MeRAM Using Write Assist Techniques

Hao Cai , You Wang , Lirida Naviner , Jun Yang , Wang Kang
IEEE International Symposium on Circuits and Systems (ISCAS), May 2018, Florence, Italy
Conference papers hal-02288533v1

Design, Synthesis and Application of A Novel Approximate Adder

Tian Ban , Baokun Wang , Lirida Naviner
2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2018, Windsor, Canada. pp.488-491, ⟨10.1109/MWSCAS.2018.8624023⟩
Conference papers hal-04477695v1

MRAM-on-FDSOI Integration: A Bit-Cell Perspective

Hao Cai , You Wang , Wang Kang , Lirida Naviner , Xinning Liu
2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), Jul 2018, Hong Kong, China. pp.263-268, ⟨10.1109/ISVLSI.2018.00056⟩
Conference papers hal-04477718v1

Asymmetrical Length Biasing for Energy Efficient Digital Circuits

Francisco Veirano , Lirida Naviner , Fernando Silveira
IEEE Latin American Symposium on Circuits and Systems, Feb 2017, Bariloche, Argentina
Conference papers hal-02287637v1

Practical metrics for evaluation of fault-tolerant logic design

Alexandre Stempkovskiy , Dmitry Telpukhov , Roman Solovyev , Ekaterina Balaka , Lirida Naviner
IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering, Feb 2017, Saint Petersbourgh, Russia. pp.569-573
Conference papers hal-02287656v1

Analysis of Ageing effects on ARTIX7 XILINX FPGA

Mariem Slimani , Karim Benkalaia , Lirida Naviner
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Sep 2017, Bordeaux, France
Conference papers hal-02287636v1

Energy Efficient Magnetic Tunnel Junction Based Hybrid LSI Using Multi-Threshold UTBB-FD-SOI Device

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
Great Lakes Symposium on VLSI 2017 (GLSVLSI 17), May 2017, Banff, Canada
Conference papers hal-02287632v1

Sparsity Analysis using a Mixed Approach with Greedy and LS Algorithms on Channel Estimation

Nilson Maciel , Elaine Crespo Marques , Lirida Naviner
International Conference on Frontiers of Signal Processing (ICFSP), Sep 2017, Paris, France. pp.91-95
Conference papers hal-02287640v1

Novel Pulsed-Latch Replacement in Non-Volatile Flip-Flop Core

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
VLSI (ISVLSI), 2017 IEEE Computer Society Annual Symposium on, Jun 2017, Bochum, Germany
Conference papers hal-02287633v1
Image document

Design Considerations for Reliable OxRAM-based Non-Volatile Flip-Flops in 28nm FD-SOI Technology

Natalija Jovanovic , Olivier Thomas , Elisa Vianello , Boris Nikolic , Lirida Naviner
IEEE International Symposium on Circuits and Systems (ISCAS 2016), May 2016, Montréal, Canada. pp.1146-1149, ⟨10.1109/ISCAS.2016.7527448⟩
Conference papers hal-02287862v1

A Layout-Based Fault Injection Methodology for SER Prediction: Implementation and Correlation with 65nm Heavy Ion Experimental Results

Benjamin Coeffic , Victor Malherbe , Jean-Marc Daveau , Gilles Gasiot , Lirida Naviner
Proceedings of IEEE Nuclear and Space Radiation Effects Conference (NSREC), Jul 2016, New Orleans, United States
Conference papers hal-02288532v1

A novel circuit design of true random number generator using magnetic tunnel junction

You Wang , Hao Cai , Lirida Naviner , Jacques-Olivier Klein , Jianlei Yang
12th ACM/IEEE International Symposium on Nanoscale Architectures (Nanoarch 2016), At Beijing, China, Jul 2016, Beijing, China
Conference papers hal-01371756v1

Approximate Computing in MOS/Spintronic Non-Volatile Full-Adder

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
12th ACM/IEEE International Symposium on Nanoscale Architectures, Jun 2016, Beijing, China
Conference papers hal-02412223v1

Radiation Hardening Improvement of a SerDes under Heavy Ions up to 60 MeV.cm2/mg by Layout-Aware Fault Injection

Benjamin Coeffic , Jean-Marc Daveau , Gilles Gasiot , A.E. Pricco , S. Parini
Proceedings of IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE), Mar 2016, Austin, Texas, United States
Conference papers hal-02287892v1

A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28 nm FDSOI

You Wang , Hao Cai , Lirida Naviner , Weisheng Zhao , Jacques-Olivier Klein
ESREF 2016, 27th EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS, Sep 2016, Händel-Halle, Halle, Germany. ⟨10.1016/j.microrel.2016.07.073⟩
Conference papers hal-01371743v1

Design insights for reliable energy efficient OxRAM-based flip-flop in 28nm FD-SOI

Natalija Jovanovic , Elisa Vianello , Olivier Thomas , Boris Nikolic , Lirida Naviner
Proceedings of IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Sonoma Valley, CA, United States
Conference papers hal-02287895v1

Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology

Hao Cai , You Wang , Lirida Naviner , Weisheng Zhao
26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2015, Toulouse, France
Conference papers hal-02287226v1

A Layout-Aware Approach to Fault Injection for Improving Failure Mode Prediction

Cyril Bottoni , Benjamin Coeffic , Jean-Marc Daveau , Gilles Gasiot , Lirida Naviner
Proceedings of Workshop on Silicon Errors in Logic - System Effects (SELSE), Mar 2015, Austin, United States
Conference papers hal-02288531v1

A Novel Analytical Method for Defect Tolerance Assessment

Mariem Slimani , Arwa Ben Dhia , Lirida Naviner
European Symposium on Reliability of Electron devices, Failure physics and Analysis, Oct 2015, Toulouse, France
Conference papers hal-01216726v1

A Tool for Transient Fault Analysis in Combinational Circuits

Mariem Slimani , Lirida Naviner
IEEE International Conference on Electronics, Circuits, and Systems, Dec 2015, Caire, Egypt
Conference papers hal-02287234v1

Frequency and Voltage Effects on SER on a 65nm Sparc-V8 Microprocessor Under Radiation Test

Cyril Bottoni , Benjamin Coeffic , Jean-Marc Daveau , Gilles Gasiot , F. Abouzeid
Proceedings of IEEE International Reliability Physics Symposium (IRPS), Apr 2015, Monterrey, CA, United States
Conference papers hal-02287890v1

Partial Triplication of a Sparc-V8 Microprocessor Using Fault Injection

Cyril Bottoni , Benjamin Coeffic , Jean-Marc Daveau , Lirida Naviner , Philippe Roche
Proceedings of IEEE Latin American Symposium on Circuits and Systems (LASCAS), Feb 2015, Montevideo, Uruguay
Conference papers hal-02287891v1

Stochastic Computation With Spin Torque Transfer Magnetic Tunnel Junction

Lirida Naviner , Hao Cai , You Wang , Weisheng Zhao , Arwa Ben Dhia
IEEE-NEWCAS, Jun 2015, Grenoble, France
Conference papers hal-02412179v1

D2D Broadcast Communications for 4G PMR Networks

Xavier Pons Masbernart , Christophe Gruet , Eric Georgeaux , Lirida Naviner
Proceedings of IFIF International Conference on New Technologies, Mobility and Security (NTMS), Jul 2015, Paris, France
Conference papers hal-02287897v1

Simulation Study of Aging in CMOS Binary Adders

Ting An , Hao Cai , Lirida Naviner
MIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia
Conference papers hal-02288395v1

Cross Logic : A New Approach for Defect-Tolerant Circuits

Mariem Slimani , Arwa Ben Dhia , Lirida Naviner
IEEE International Conference on IC Design and Technology (ICICDT), May 2014, Austin, United States. pp.1-4
Conference papers hal-01062064v1

Battery-aware network discovery algorithm for mobile terminals within heterogeneous networks

Xavier Pons Masbernart , S. Althunibat , G Kibalya , Christophe Gruet , Lirida Naviner
Proceedings of IEEE International Workshop on Computer Aided Modeling and Design of Communication Links and Networks (CAMAD), Dec 2014, Athens, Greece
Conference papers hal-02287896v1

Reliability-aware Delay Faults Evaluation of CMOS Flip-Flops

Hao Cai , Kaikai Liu , Lirida Naviner
21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES), Jun 2014, Lublin, Poland
Conference papers hal-02412061v1

Flip-flop selection for in-situ slack-time monito- ring based on the activation probability of timing-critical paths.

Sébastien Sarrazin , Samuel Evain , Ivan Miro Panades , Alexandre Valentian , Lirida Naviner
IEEE International On-line Test Symposium, Jul 2014, Platja d'Aro, Spain
Conference papers hal-02412072v1

A Study of Statistical Variability-aware Methods

Hao Cai , Kaikai Liu , Lirida Naviner
IEEE International Symposium on Radio Frequency Integration Technology (RFIT), Aug 2014, Hefei, China
Conference papers hal-02286946v1

Comparative Study of Defect-Tolerant Multiplexers for FPGAs

Arwa Ben Dhia , Mariem Slimani , Lirida Naviner
20th IEEE International On-Line Testing Symposium (IOLTS), Jul 2014, Platja d'Aro, Spain. pp.7-12
Conference papers hal-01062059v1
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OxRAM-Based Non Volatile Flip-Flop in 28nm FDSOI

Natalija Jovanovic , Olivier Thomas , Elisa Vianello , Jean-Michel Portal , Boris Nikolic
2014 IEEE 12th International New Circuits and Systems Conference (NEWCAS), Jun 2014, Trois Rivières, Canada. ⟨10.1109/NEWCAS.2014.6934003⟩
Conference papers hal-02288534v1

Improving the Robustness of a Switch Box in a Mesh of Clusters FPGA

Arwa Ben Dhia , Mariem Slimani , Lirida Naviner
15th IEEE Latin American Test Workshop (LATW), Mar 2014, Fortaleza, Brazil. pp.1-6
Conference papers hal-01062066v1

A Defect-Tolerant Multiplexer Using Differential Logic for FPGAs

Arwa Ben Dhia , Mariem Slimani , Lirida Naviner
IEEE 21st Mixed Design of Integrated Circuits and Systems Conference (MIXDES), Jun 2014, Lublin, Poland. pp.375-380
Conference papers hal-01062063v1

Analytical method for reliability assessment of concurrent checking circuits under multiple faults

Ting An , Kaikai Liu , Lirida Naviner
MIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia
Conference papers hal-02286867v1

Heavy ions test result on a 65nm sparc-v8 radiation-hard microprocessor

Cyril Bottoni , Jean-Marc Daveau , Gilles Gasiot , Lirida Naviner , Philippe Roche
IEEE International Reliability Physics Symposium, Jun 2014, Waikoloa, Hawai, United States
Conference papers hal-02412075v1

Efficient Computation of Combinational Circuits Reliability Based on Probabilistic Transfer Matrix

Lirida Naviner , Kaikai Liu , Hao Cai , Jean-François Naviner
International Conference on IC Design and Technology (ICICDT), May 2014, Austin, United States
Conference papers hal-02412060v1

A hybrid reliability assessment method and its support of sequential logic modelling

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner , Dhiraj Pradhan
IEEE International On-line Test Symposium, Jul 2014, Platja d'Aro, Spain
Conference papers hal-02412073v1

Efficient Implementation for Accurate Analysis of CED Circuits Against Multiple Faults

Ting An , Kaikai Liu , Hao Cai , Lirida Naviner
21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES), Jun 2014, Lublin, Poland
Conference papers hal-02286893v1

Impact of Cluster Size on Routability, Testability and Robustness of a Cluster in a Mesh FPGA

Saif-Ur Rehman , Adrien Blanchardon , Arwa Ben Dhia , Mounir Benabdenbi , Roselyne Chotin-Avot
IEEE Computer Society Annual Symposium on VLSI (ISVLSI'14), Jul 2014, Tampa, FL, United States. pp.553-558, ⟨10.1109/ISVLSI.2014.66⟩
Conference papers hal-01400630v1

A model to simulate the behaviour of probabilistic gates

Kaikai Liu , Lirida Naviner , Jean-François Naviner
Journées Nationales du Réseau Doctoral de Microélectronique, Jun 2013, Grenoble, France
Conference papers hal-02286894v1

Reliability analysis of combinational circuits with the influences of noise and single-event transients

Kaikai Liu , Hao Cai , Ting An , Lirida Naviner , Jean-François Naviner
IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, United States
Conference papers hal-02286814v1

Single Event Transient Mitigation Through Pulse Quenching: Effectiveness at Circuit Level

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner
IEEE International Conference of Electronics, Circuits and Systems (ICECS), Dec 2013, Abu Dhabi, United Arab Emirates
Conference papers hal-02412466v1
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A Defect-tolerant Cluster in a Mesh SRAM-based FPGA

Arwa Ben Dhia , Saif Ur Rehman , Adrien Blanchardon , Lirida Naviner , Mounir Benabdenbi
International Conference on Field-Programmable Technology (FPT), Dec 2013, Kyoto, Japan. pp.434-437, ⟨10.1109/FPT.2013.6718407⟩
Conference papers hal-00987365v1

Exploring the Impact of Transient Faults on CORDIC Processor

Ting An , Lirida Naviner , Philippe Matherat
Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM), Jun 2013, Grenoble, France
Conference papers hal-02411992v1

Uplink energy efficiency in LTE systems

Xavier Pons Masbernart , Raul Palacios , Christophe Gruet , Lirida Naviner , Hugo Marques
IEEE International Workshop on Computer Aided Modeling and Design of Communication Links and Networks, Sep 2013, Berlin, Germany
Conference papers hal-02412074v1

Evaluation of Fault-tolerant Composite Field AES S-Boxes under Multiple Transient Faults

Ting An , Lirida Naviner , Philippe Matherat
IEEE International NEWCAS Conference, Jun 2013, Paris, France. pp.1 - 4
Conference papers hal-00973720v1

Nouvelle architecture de BLE tolérante aux fautes dans les FPGAs SRAM

Arwa Ben Dhia , Lirida Naviner , Philippe Matherat
Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2013, Grenoble, France
Conference papers hal-02288374v1

Circuit-level Hardening Against Multiple Faults: Combining Global TMR and Selective Hardening

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner
Journées Nationales du Réseau Doctoral de Microélectronique, Jun 2013, Grenoble, France
Conference papers hal-02286728v1

A Low Cost Reliable Architecture for S-Boxes in AES Processors

Ting An , Lirida Naviner , Philippe Matherat
IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, U.S. Outlying Islands. pp.155-160
Conference papers hal-01024892v1

Reliability Assessment of Combinational Logic Using First-Order-Only Fanout Reconvergence Analysis

Samuel Nascimento Pagliarini , Tian Ban , Lirida Naviner , Jean-François Naviner
Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2013, Columbus, OH., United States
Conference papers hal-02411994v1

Comparison of Fault-Tolerant Fabless CLBs in SRAM-based FPGAs

Arwa Ben Dhia , Lirida Naviner , Philippe Matherat
IEEE Latin-American Test Workshop (LATW), Apr 2013, Cordoba, Argentina. pp.1-6
Conference papers hal-01062112v1

Evaluating CLB Designs under Multiple SETs in SRAM-based FPGAs

Arwa Ben Dhia , Lirida Naviner , Philippe Matherat
IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New-York City, United States. pp.112-117
Conference papers hal-01062101v1

A defect-tolerant area-efficient multiplexer for basic blocks in SRAM-based FPGAs

Arwa Ben Dhia , Samuel Nascimento Pagliarini , Lirida Naviner , Habib Mehrez , Philippe Matherat
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1189-1193
Conference papers hal-01062075v1

A General Cost-effective Design Structure for Probabilistic-Based Noise-Tolerant Logic Functions in Nanometer CMOS Technology

Kaikai Liu , Ting An , Hao Cai , Lirida Naviner , Jean-François Naviner
Eurocon 2013, Jul 2013, Zagreb, Croatia. pp.1829-1836, ⟨10.1109/EUROCON.2013.6625225⟩
Conference papers hal-02286855v1

SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults

Samuel Nascimento Pagliarini , Arwa Ben Dhia , Lirida Naviner , J. F. Naviner
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1230-1234
Conference papers hal-01062078v1

Selective Hardening Against Multiple Faults Employing a Net-based Reliability Analysis

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner
International New Circuits and Systems Conference (NEWCAS), Jun 2013, Paris, France
Conference papers hal-02411993v1

Single-Event-Induced Charge Sharing Effects in TMR with Different Levels of Granularity

Felipe Almeida , Fernanda Lima Kastensmidt , Samuel Nascimento Pagliarini , Luis Entrena , Almudena Lindoso
European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2012, Biarritz, France
Conference papers hal-02286461v1

Reliability estimation methods : Tradeoffs between complexity and accuracy

Samuel Nascimento Pagliarini , Denis Teixeira Franco , Lirida Naviner , Jean-François Naviner
Southern Simposium of Microelectronics, Apr 2012, Sao Miguel das Missoes, RS, Brazil
Conference papers hal-02288322v1

Parallel Scaling-Free and Area-Time Efficient CORDIC Algorithm

Matteo Causo , Ting An , Lirida Naviner
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.149 - 152
Conference papers hal-01024891v1

Tolérance aux défauts dans les FPGAs

Arwa Ben Dhia , Lirida Naviner , P. Matherat
Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2012, Marseille, France
Conference papers hal-02411877v1

Signal Probability, Reliability and Error Bound of Majority Voter in TMR

Tian Ban , Lirida Naviner
IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2012, Boise, Idaho, United States
Conference papers hal-02286333v1

Analyzing and Alleviating the Impact of Errors on an SRAM-based FPGA Cluster

Arwa Ben Dhia , Lirida Naviner , P. Matherat
IEEE International On-Line Testing Symposium (IOLTS), Jun 2012, Sitges, Spain. pp.31-36
Conference papers hal-01062799v1

A New Fault-Tolerant Architecture for CLBs in SRAM-based FPGAs

Arwa Ben Dhia , Lirida Naviner , P. Matherat
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Sevilla, Spain. pp.761-764
Conference papers hal-01062116v1

Reliability and Hardening of FPGA Implementations face to Radiative Constraints

Gutemberg Gonçalves dos Santos Jr , Lirida Naviner , J. F. Naviner
Journées Nationales Electronique et Rayonnements Naturels au Niveau du Sol (RADSOL), Jun 2012, Paris, France
Conference papers hal-02288324v1

Transient Fault Analysis of CORDIC Processor

Ting An , Matteo Causo , Lirida Naviner , Philippe Matherat
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Conference papers hal-00973764v1

Transient Fault Analysis of CORDIC Processor

Ting An , Matteo Causo , Lirida Naviner , Philippe Matherat
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Conference papers hal-00973765v1

Transient Fault Analysis of CORDIC Processor

Ting An , Matteo Causo , Lirida Naviner , Philippe Matherat
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Conference papers hal-00973766v1

Automatic Selective Hardening Against Soft Errors: a Cost-based and Regularity-aware Approach

Samuel Nascimento Pagliarini , Arwa Ben Dhia , Lirida Naviner , J. F. Naviner
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Sevilla, Spain. pp.753-756
Conference papers hal-01062119v1

Fault tolerant architectures in nanoelectronics: The progressive approach

Tian Ban , Lirida Naviner
Southern Simposium of Microelectronics, Apr 2012, Sao Miguel das Missoes, RS, Brazil
Conference papers hal-02286332v1

Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner
European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2012, Biarritz, France
Conference papers hal-02286459v1

Selective Hardening Methodology Concerning Multiple Faults

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner
IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States
Conference papers hal-02411864v1
Image document

Selective Hardening Methodology for Combinational Logic

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner
IEEE Latin-American Test Workshop (LATW), Apr 2012, Quito, Ecuador. pp.6
Conference papers hal-00695808v1

Selective Hardening Concerning Single and Multiple Faults

Samuel Nascimento Pagliarini , Lirida Naviner , Jean-François Naviner
Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2012, Marseille, France
Conference papers hal-02286334v1

Green Solutions for Future LTE PMR Networks

Xavier Pons Masbernart , Christophe Gruet , Frédéric Fraysse , Serge Contal , Lirida Naviner
IEEE International Workshop on Computer Aided Modeling and Design of Communication Links and Networks (CAMAD), Sep 2012, Barcelona, Spain
Conference papers hal-02411920v1

Exploring the Feasibility of Selective Hardening for Combinational Logic

Samuel Nascimento Pagliarini , Gutemberg Gonçalves dos Santos Jr , Lirida Naviner , Jean-François Naviner
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2012, Cagliari, Italy
Conference papers hal-02288323v1

Reliability Analysis of a Reed-Solomon Decoder

Kaikai Liu , Tian Ban , Lirida Naviner , Jean-François Naviner
IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2012, Boise, Idaho, United States
Conference papers hal-02411876v1

Designing Digital Reliable Processors in Nanotechnologies

Lirida Naviner
NanoTechItaly, Nov 2012, Venice, Italy
Conference papers hal-02411921v1

Optimized Robust Digital Voter in TMR Designs

Tian Ban , Lirida Naviner
Proceedings of Colloque National GdR SoC-SiP, Jun 2011, Lyon, France
Conference papers hal-00637642v1

An approach for efficient reliability improvement of digital circuits

Gutemberg Goncalves dos Santos Junior , Elaine Crespo Marques , Lirida Naviner , Jean-Francois Naviner
Colloque National GdR SoC-SiP, Jun 2011, Lyon, France
Conference papers hal-00637375v1

Reliability analysis based on significance

Lirida Naviner , Jean-Francois Naviner , Tian Ban , Gutemberg Goncalves dos Santos Junior
Argentine School of Micro-Nanoelectronics Technology and Applications (EAMTA), Aug 2011, Buenos Aires, Argentina. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6021291
Conference papers hal-00637373v1

Effective metrics for reliability analysis

Elaine Crespo Marques , Gutemberg Goncalves dos Santos Junior , Lirida Naviner , Jean-Francois Naviner
Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on, Aug 2010, Seattle, WA, United States. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5548671&tag=1, ⟨10.1109/MWSCAS.2010.5548671⟩
Conference papers hal-00627132v1

A 65 nm CMOS versatile ADC using time interleaving and ΣΔ modulation for multi-mode receiver

Ali Beydoun , Chadi Jabbour , Hussein Fakhoury , van Tam Nguyen , Lirida Naviner
2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA), Jun 2009, Toulouse, France. pp.1-4, ⟨10.1109/NEWCAS.2009.5290510⟩
Conference papers hal-03591883v1

Cryogenic In-MRAM Computing

Yaoru Hou , We Ge , Yanan Guo , Lirida Naviner , You Wang
2021 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), IEEE, pp.1-6, 2021, ⟨10.1109/NANOARCH53687.2021.9642238⟩
Proceedings hal-04420929v1

Compact thermal modeling of spin transfer torque magnetic tunnel junction

You Wang , Hao Cai , Lirida Naviner , Yue Zhang , Jacques-Olivier Klein
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis 2015, Oct 2015, Toulouse, France. , 2015, ⟨10.1016/j.microrel.2015.06.029⟩
Proceedings hal-01216419v1

Compact model of magnetic tunnel junction with stochastic spin transfer torque switching for reliability analyses

You Wang , Yue Zhang , Erya Deng , Jacques-Olivier Klein , Lirida Naviner
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis 2014, Sep 2014, Berlin, Germany. , 2014, ⟨10.1016/j.microrel.2014.07.019⟩
Proceedings hal-01216431v1

From DMO to D2D

Xavier Pons Masbernart , Eric Georgeaux , Christophe Gruet , François Montaigne , Lirida Naviner
Wireless Public Safety Networks: Overview and Challenges, ISTE Press & Elsivier, pp.9-126, 2015
Book sections hal-02287836v1

Reliability Aware AMS / RF Performance Optimization

Pietro Maris Ferreira , Hao Cai , Lirida Naviner
Mourad Fakhfakh, Esteban Tlelo-Cuautle, Maria Helena Fino. Performance Optimization Techniques in Analog, Mixed-Signal, and Radio-Frequency Circuit Design, 2014, ⟨10.4018/978-1-4666-6627-6.ch002⟩
Book sections hal-01222104v1

Reliability Aware AMS/RF Performance Optimization

P. Maris Ferreira , Hao Cai , Lirida Naviner
Performance Optimization Techniques in Analog, Mixed-Signal, and Radio-Frequency Circuit Design, IGI Global, 2014
Book sections hal-02286875v1