
Lirida Naviner
163
Documents
Affiliations actuelles
- Télécom Paris
- Département Communications & Electronique (COMELEC)
- Laboratoire Traitement et Communication de l'Information (LTCI)
- Secure and Safe Hardware (SSH)
Publications
Publications
Impact of scaling up the sensor sampling frequency on the reliability of edge processing systems in tolerating soft errors caused by neutronsIEEE Sensors Conference 2024, Oct 2024, Kobe, Japan
Communication dans un congrès
hal-04739776
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Neutron radiation tests and assessment of edge computing systemsInvited talk presented in VII Workshop sobre os Efeitos das Radiações Ionizantes em Componentes e Circuitos Eletrônicos de Uso Aeroespacial (WERICE AEROESPACIAL 2024), Nov 2024, São José dos Campos, Brazil
Communication dans un congrès
hal-04739744
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Fast analysis of combinatorial netlists correctness rate based on binomial law and partitioning2023 IEEE 24th Latin American Test Symposium (LATS), Mar 2023, Veracruz, Mexico. pp.1-6, ⟨10.1109/lats58125.2023.10154491⟩
Communication dans un congrès
hal-04420927
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Fast and accurate estimation of correctness rate in combinatorial circuits based on clusteringIEEE Workshop on Silicon Errors in Logic – System Effects SELSE 2023, IEEE, Mar 2023, ONLINE, France. pp.1-6
Communication dans un congrès
hal-04458400
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Minconvnets: a New Class of Multiplication-Less Neural Networks2022 IEEE International Conference on Image Processing (ICIP), Oct 2022, Bordeaux, France. pp.881-885, ⟨10.1109/ICIP46576.2022.9897286⟩
Communication dans un congrès
hal-04297354
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Ultra-low Power Access Strategy for Process-Voltage-Temperature Aware STT-MRAM2021 IEEE 14th International Conference on ASIC (ASICON), Oct 2021, Kunming, China. pp.1-4, ⟨10.1109/ASICON52560.2021.9620529⟩
Communication dans un congrès
hal-04477660
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Hybrid MTJ-CMOS Integration for Sigma-Delta ADC2021 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), Nov 2021, AB, Canada. pp.1-5, ⟨10.1109/NANOARCH53687.2021.9642236⟩
Communication dans un congrès
hal-04477656
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Novel Self-timing Speculative Writing for Unreliable STT-MRAM2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT), Nov 2020, Kunming, China. pp.1-3, ⟨10.1109/ICSICT49897.2020.9278373⟩
Communication dans un congrès
hal-04477675
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Magnetic Tunnel Junction-based Analog-to-Digital Converter using Spin Orbit Torque Mechanism2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS), Nov 2020, Glasgow, United Kingdom. pp.1-4, ⟨10.1109/ICECS49266.2020.9294780⟩
Communication dans un congrès
hal-04477665
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Quad-Approx CNNs for Embedded Object Detection Systems2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS), Nov 2020, Glasgow, United Kingdom. pp.1-4, ⟨10.1109/ICECS49266.2020.9294829⟩
Communication dans un congrès
hal-04297374
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Deep Learning Approaches for Sparse Recovery in Compressive Sensing2019 11th International Symposium on Image and Signal Processing and Analysis (ISPA), Sep 2019, Dubrovnik, Croatia. pp.129-134, ⟨10.1109/ISPA.2019.8868841⟩
Communication dans un congrès
hal-04477689
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Nonlinear Functions in Learned Iterative Shrinkage-Thresholding Algorithm for Sparse Signal Recovery2019 IEEE International Workshop on Signal Processing Systems (SiPS), Oct 2019, Nanjing, China. pp.324-329, ⟨10.1109/SiPS47522.2019.9020469⟩
Communication dans un congrès
hal-04477699
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Comprehensive Pulse Shape Induced Failure Analysis in Voltage-Controlled MRAM2019 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), Jul 2019, Qingdao, China. pp.1-6, ⟨10.1109/NANOARCH47378.2019.181292⟩
Communication dans un congrès
hal-04477682
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Stability and Variability Emphasized STT-MRAM Sensing Circuit With Performance Enhancement2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS), Oct 2018, Chengdu, China. pp.386-389, ⟨10.1109/APCCAS.2018.8605603⟩
Communication dans un congrès
hal-04477743
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Reliability Emphasized MTJ/CMOS Hybrid Circuit Towards Ultra-Low Power2018 Conference on Design of Circuits and Integrated Systems (DCIS), Nov 2018, Lyon, France. pp.1-5, ⟨10.1109/DCIS.2018.8681471⟩
Communication dans un congrès
hal-04477704
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Probability Aware Fault-Injection Approach for SER EstimationProceedings of IEEE Latin American Test Symposium (LATS), Mar 2018, São Paulo, SP, Brazil
Communication dans un congrès
hal-02287888
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MRAM-on-FDSOI Integration: A Bit-Cell Perspective2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), Jul 2018, Hong Kong, China. pp.263-268, ⟨10.1109/ISVLSI.2018.00056⟩
Communication dans un congrès
hal-04477718
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Compressed Sensing for Wideband HF Channel Estimation4th International Conference on Frontiers of Signal Processing, Sep 2018, Poitiers, France. pp.1-5
Communication dans un congrès
hal-02287975
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Design Space Exploration of Magnetic Tunnel Junction based Stochastic Computing in Deep LearningTo appear in Proceedings of ACM Great Lakes Symposium on VLSI (GLSVLSI), May 2018, Chicago, Illinois, United States. pp.23-25
Communication dans un congrès
hal-02287894
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Using FPGA self-produced transients to emulate SETs for SER estimationProceedings of IEEE Latin American Test Symposium (LATS), Mar 2018, São Paulo, SP, Brazil
Communication dans un congrès
hal-02288530
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Design, Synthesis and Application of A Novel Approximate Adder2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2018, Windsor, Canada. pp.488-491, ⟨10.1109/MWSCAS.2018.8624023⟩
Communication dans un congrès
hal-04477695
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Reliability evaluation of circuits designed in multi- and single-stage versions2018 IEEE 9th Latin American Symposium on Circuits & Systems (LASCAS), Feb 2018, Puerto Vallarta, Mexico. pp.1-4, ⟨10.1109/LASCAS.2018.8399927⟩
Communication dans un congrès
hal-04477727
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Enabling Resilient Voltage-Controlled MeRAM Using Write Assist TechniquesIEEE International Symposium on Circuits and Systems (ISCAS), May 2018, Florence, Italy
Communication dans un congrès
hal-02288533
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Novel Pulsed-Latch Replacement in Non-Volatile Flip-Flop CoreVLSI (ISVLSI), 2017 IEEE Computer Society Annual Symposium on, Jun 2017, Bochum, Germany
Communication dans un congrès
hal-02287633
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Asymmetrical Length Biasing for Energy Efficient Digital CircuitsIEEE Latin American Symposium on Circuits and Systems, Feb 2017, Bariloche, Argentina
Communication dans un congrès
hal-02287637
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Energy Efficient Magnetic Tunnel Junction Based Hybrid LSI Using Multi-Threshold UTBB-FD-SOI DeviceGreat Lakes Symposium on VLSI 2017 (GLSVLSI 17), May 2017, Banff, Canada
Communication dans un congrès
hal-02287632
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Practical metrics for evaluation of fault-tolerant logic designIEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering, Feb 2017, Saint Petersbourgh, Russia. pp.569-573
Communication dans un congrès
hal-02287656
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Sparsity Analysis using a Mixed Approach with Greedy and LS Algorithms on Channel EstimationInternational Conference on Frontiers of Signal Processing (ICFSP), Sep 2017, Paris, France. pp.91-95
Communication dans un congrès
hal-02287640
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Analysis of Ageing effects on ARTIX7 XILINX FPGAEuropean Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Sep 2017, Bordeaux, France
Communication dans un congrès
hal-02287636
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A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28 nm FDSOIESREF 2016, 27th EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS, Sep 2016, Händel-Halle, Halle, Germany. ⟨10.1016/j.microrel.2016.07.073⟩
Communication dans un congrès
hal-01371743
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A Layout-Based Fault Injection Methodology for SER Prediction: Implementation and Correlation with 65nm Heavy Ion Experimental ResultsProceedings of IEEE Nuclear and Space Radiation Effects Conference (NSREC), Jul 2016, New Orleans, United States
Communication dans un congrès
hal-02288532
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Design Considerations for Reliable OxRAM-based Non-Volatile Flip-Flops in 28nm FD-SOI TechnologyIEEE International Symposium on Circuits and Systems (ISCAS 2016), May 2016, Montréal, Canada. pp.1146-1149, ⟨10.1109/ISCAS.2016.7527448⟩
Communication dans un congrès
hal-02287862
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Approximate Computing in MOS/Spintronic Non-Volatile Full-Adder12th ACM/IEEE International Symposium on Nanoscale Architectures, Jun 2016, Beijing, China
Communication dans un congrès
hal-02412223
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Radiation Hardening Improvement of a SerDes under Heavy Ions up to 60 MeV.cm2/mg by Layout-Aware Fault InjectionProceedings of IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE), Mar 2016, Austin, Texas, United States
Communication dans un congrès
hal-02287892
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A novel circuit design of true random number generator using magnetic tunnel junction12th ACM/IEEE International Symposium on Nanoscale Architectures (Nanoarch 2016), At Beijing, China, Jul 2016, Beijing, China
Communication dans un congrès
hal-01371756
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Design insights for reliable energy efficient OxRAM-based flip-flop in 28nm FD-SOIProceedings of IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Sonoma Valley, CA, United States
Communication dans un congrès
hal-02287895
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Frequency and Voltage Effects on SER on a 65nm Sparc-V8 Microprocessor Under Radiation TestProceedings of IEEE International Reliability Physics Symposium (IRPS), Apr 2015, Monterrey, CA, United States
Communication dans un congrès
hal-02287890
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Partial Triplication of a Sparc-V8 Microprocessor Using Fault InjectionProceedings of IEEE Latin American Symposium on Circuits and Systems (LASCAS), Feb 2015, Montevideo, Uruguay
Communication dans un congrès
hal-02287891
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A Novel Analytical Method for Defect Tolerance AssessmentEuropean Symposium on Reliability of Electron devices, Failure physics and Analysis, Oct 2015, Toulouse, France
Communication dans un congrès
hal-01216726
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A Tool for Transient Fault Analysis in Combinational CircuitsIEEE International Conference on Electronics, Circuits, and Systems, Dec 2015, Caire, Egypt
Communication dans un congrès
hal-02287234
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D2D Broadcast Communications for 4G PMR NetworksProceedings of IFIF International Conference on New Technologies, Mobility and Security (NTMS), Jul 2015, Paris, France
Communication dans un congrès
hal-02287897
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Stochastic Computation With Spin Torque Transfer Magnetic Tunnel JunctionIEEE-NEWCAS, Jun 2015, Grenoble, France
Communication dans un congrès
hal-02412179
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Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2015, Toulouse, France
Communication dans un congrès
hal-02287226
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A Layout-Aware Approach to Fault Injection for Improving Failure Mode PredictionProceedings of Workshop on Silicon Errors in Logic - System Effects (SELSE), Mar 2015, Austin, United States
Communication dans un congrès
hal-02288531
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Battery-aware network discovery algorithm for mobile terminals within heterogeneous networksProceedings of IEEE International Workshop on Computer Aided Modeling and Design of Communication Links and Networks (CAMAD), Dec 2014, Athens, Greece
Communication dans un congrès
hal-02287896
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Simulation Study of Aging in CMOS Binary AddersMIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia
Communication dans un congrès
hal-02288395
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Cross Logic : A New Approach for Defect-Tolerant CircuitsIEEE International Conference on IC Design and Technology (ICICDT), May 2014, Austin, United States. pp.1-4
Communication dans un congrès
hal-01062064
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Efficient Implementation for Accurate Analysis of CED Circuits Against Multiple Faults21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES), Jun 2014, Lublin, Poland
Communication dans un congrès
hal-02286893
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Impact of Cluster Size on Routability, Testability and Robustness of a Cluster in a Mesh FPGAIEEE Computer Society Annual Symposium on VLSI (ISVLSI'14), Jul 2014, Tampa, FL, United States. pp.553-558, ⟨10.1109/ISVLSI.2014.66⟩
Communication dans un congrès
hal-01400630
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Reliability-aware Delay Faults Evaluation of CMOS Flip-Flops21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES), Jun 2014, Lublin, Poland
Communication dans un congrès
hal-02412061
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OxRAM-Based Non Volatile Flip-Flop in 28nm FDSOI2014 IEEE 12th International New Circuits and Systems Conference (NEWCAS), Jun 2014, Trois Rivières, Canada. ⟨10.1109/NEWCAS.2014.6934003⟩
Communication dans un congrès
hal-02288534
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Comparative Study of Defect-Tolerant Multiplexers for FPGAs20th IEEE International On-Line Testing Symposium (IOLTS), Jul 2014, Platja d'Aro, Spain. pp.7-12
Communication dans un congrès
hal-01062059
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Efficient Computation of Combinational Circuits Reliability Based on Probabilistic Transfer MatrixInternational Conference on IC Design and Technology (ICICDT), May 2014, Austin, United States
Communication dans un congrès
hal-02412060
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A hybrid reliability assessment method and its support of sequential logic modellingIEEE International On-line Test Symposium, Jul 2014, Platja d'Aro, Spain
Communication dans un congrès
hal-02412073
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Heavy ions test result on a 65nm sparc-v8 radiation-hard microprocessorIEEE International Reliability Physics Symposium, Jun 2014, Waikoloa, Hawai, United States
Communication dans un congrès
hal-02412075
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Analytical method for reliability assessment of concurrent checking circuits under multiple faultsMIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia
Communication dans un congrès
hal-02286867
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A Defect-Tolerant Multiplexer Using Differential Logic for FPGAsIEEE 21st Mixed Design of Integrated Circuits and Systems Conference (MIXDES), Jun 2014, Lublin, Poland. pp.375-380
Communication dans un congrès
hal-01062063
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Improving the Robustness of a Switch Box in a Mesh of Clusters FPGA15th IEEE Latin American Test Workshop (LATW), Mar 2014, Fortaleza, Brazil. pp.1-6
Communication dans un congrès
hal-01062066
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Flip-flop selection for in-situ slack-time monito- ring based on the activation probability of timing-critical paths.IEEE International On-line Test Symposium, Jul 2014, Platja d'Aro, Spain
Communication dans un congrès
hal-02412072
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A Study of Statistical Variability-aware MethodsIEEE International Symposium on Radio Frequency Integration Technology (RFIT), Aug 2014, Hefei, China
Communication dans un congrès
hal-02286946
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A Defect-tolerant Cluster in a Mesh SRAM-based FPGAInternational Conference on Field-Programmable Technology (FPT), Dec 2013, Kyoto, Japan. pp.434-437, ⟨10.1109/FPT.2013.6718407⟩
Communication dans un congrès
hal-00987365
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Reliability analysis of combinational circuits with the influences of noise and single-event transientsIEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, United States
Communication dans un congrès
hal-02286814
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A model to simulate the behaviour of probabilistic gatesJournées Nationales du Réseau Doctoral de Microélectronique, Jun 2013, Grenoble, France
Communication dans un congrès
hal-02286894
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Single Event Transient Mitigation Through Pulse Quenching: Effectiveness at Circuit LevelIEEE International Conference of Electronics, Circuits and Systems (ICECS), Dec 2013, Abu Dhabi, United Arab Emirates
Communication dans un congrès
hal-02412466
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Reliability Assessment of Combinational Logic Using First-Order-Only Fanout Reconvergence AnalysisMidwest Symposium on Circuits and Systems (MWSCAS), Aug 2013, Columbus, OH., United States
Communication dans un congrès
hal-02411994
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Comparison of Fault-Tolerant Fabless CLBs in SRAM-based FPGAsIEEE Latin-American Test Workshop (LATW), Apr 2013, Cordoba, Argentina. pp.1-6
Communication dans un congrès
hal-01062112
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Evaluating CLB Designs under Multiple SETs in SRAM-based FPGAsIEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New-York City, United States. pp.112-117
Communication dans un congrès
hal-01062101
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Selective Hardening Against Multiple Faults Employing a Net-based Reliability AnalysisInternational New Circuits and Systems Conference (NEWCAS), Jun 2013, Paris, France
Communication dans un congrès
hal-02411993
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Nouvelle architecture de BLE tolérante aux fautes dans les FPGAs SRAMJournées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2013, Grenoble, France
Communication dans un congrès
hal-02288374
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Evaluation of Fault-tolerant Composite Field AES S-Boxes under Multiple Transient FaultsIEEE International NEWCAS Conference, Jun 2013, Paris, France. pp.1 - 4
Communication dans un congrès
hal-00973720
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Exploring the Impact of Transient Faults on CORDIC ProcessorJournées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM), Jun 2013, Grenoble, France
Communication dans un congrès
hal-02411992
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Uplink energy efficiency in LTE systemsIEEE International Workshop on Computer Aided Modeling and Design of Communication Links and Networks, Sep 2013, Berlin, Germany
Communication dans un congrès
hal-02412074
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A General Cost-effective Design Structure for Probabilistic-Based Noise-Tolerant Logic Functions in Nanometer CMOS TechnologyEurocon 2013, Jul 2013, Zagreb, Croatia. pp.1829-1836, ⟨10.1109/EUROCON.2013.6625225⟩
Communication dans un congrès
hal-02286855
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Circuit-level Hardening Against Multiple Faults: Combining Global TMR and Selective HardeningJournées Nationales du Réseau Doctoral de Microélectronique, Jun 2013, Grenoble, France
Communication dans un congrès
hal-02286728
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A Low Cost Reliable Architecture for S-Boxes in AES ProcessorsIEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, U.S. Outlying Islands. pp.155-160
Communication dans un congrès
hal-01024892
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SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple FaultsEuropean Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1230-1234
Communication dans un congrès
hal-01062078
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A defect-tolerant area-efficient multiplexer for basic blocks in SRAM-based FPGAsEuropean Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1189-1193
Communication dans un congrès
hal-01062075
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Single-Event-Induced Charge Sharing Effects in TMR with Different Levels of GranularityEuropean Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2012, Biarritz, France
Communication dans un congrès
hal-02286461
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Transient Fault Analysis of CORDIC ProcessorIEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Communication dans un congrès
hal-00973766
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Transient Fault Analysis of CORDIC ProcessorIEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Communication dans un congrès
hal-00973765
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Transient Fault Analysis of CORDIC ProcessorIEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Communication dans un congrès
hal-00973764
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Reliability Analysis of a Reed-Solomon DecoderIEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2012, Boise, Idaho, United States
Communication dans un congrès
hal-02411876
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Exploring the Feasibility of Selective Hardening for Combinational LogicEuropean Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2012, Cagliari, Italy
Communication dans un congrès
hal-02288323
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Green Solutions for Future LTE PMR NetworksIEEE International Workshop on Computer Aided Modeling and Design of Communication Links and Networks (CAMAD), Sep 2012, Barcelona, Spain
Communication dans un congrès
hal-02411920
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Designing Digital Reliable Processors in NanotechnologiesNanoTechItaly, Nov 2012, Venice, Italy
Communication dans un congrès
hal-02411921
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Selective Hardening Concerning Single and Multiple FaultsJournées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2012, Marseille, France
Communication dans un congrès
hal-02286334
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Parallel Scaling-Free and Area-Time Efficient CORDIC AlgorithmIEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.149 - 152
Communication dans un congrès
hal-01024891
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Reliability estimation methods : Tradeoffs between complexity and accuracySouthern Simposium of Microelectronics, Apr 2012, Sao Miguel das Missoes, RS, Brazil
Communication dans un congrès
hal-02288322
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Tolérance aux défauts dans les FPGAsJournées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2012, Marseille, France
Communication dans un congrès
hal-02411877
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Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective HardeningEuropean Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2012, Biarritz, France
Communication dans un congrès
hal-02286459
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Selective Hardening Methodology Concerning Multiple FaultsIEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States
Communication dans un congrès
hal-02411864
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Fault tolerant architectures in nanoelectronics: The progressive approachSouthern Simposium of Microelectronics, Apr 2012, Sao Miguel das Missoes, RS, Brazil
Communication dans un congrès
hal-02286332
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Signal Probability, Reliability and Error Bound of Majority Voter in TMRIEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2012, Boise, Idaho, United States
Communication dans un congrès
hal-02286333
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Analyzing and Alleviating the Impact of Errors on an SRAM-based FPGA ClusterIEEE International On-Line Testing Symposium (IOLTS), Jun 2012, Sitges, Spain. pp.31-36
Communication dans un congrès
hal-01062799
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A New Fault-Tolerant Architecture for CLBs in SRAM-based FPGAsIEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Sevilla, Spain. pp.761-764
Communication dans un congrès
hal-01062116
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Reliability and Hardening of FPGA Implementations face to Radiative ConstraintsJournées Nationales Electronique et Rayonnements Naturels au Niveau du Sol (RADSOL), Jun 2012, Paris, France
Communication dans un congrès
hal-02288324
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Selective Hardening Methodology for Combinational LogicIEEE Latin-American Test Workshop (LATW), Apr 2012, Quito, Ecuador. pp.6
Communication dans un congrès
hal-00695808
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Automatic Selective Hardening Against Soft Errors: a Cost-based and Regularity-aware ApproachIEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Sevilla, Spain. pp.753-756
Communication dans un congrès
hal-01062119
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Optimized Robust Digital Voter in TMR DesignsProceedings of Colloque National GdR SoC-SiP, Jun 2011, Lyon, France
Communication dans un congrès
hal-00637642
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Reliability analysis based on significanceArgentine School of Micro-Nanoelectronics Technology and Applications (EAMTA), Aug 2011, Buenos Aires, Argentina. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6021291
Communication dans un congrès
hal-00637373
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An approach for efficient reliability improvement of digital circuitsColloque National GdR SoC-SiP, Jun 2011, Lyon, France
Communication dans un congrès
hal-00637375
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Effective metrics for reliability analysisCircuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on, Aug 2010, Seattle, WA, United States. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5548671&tag=1, ⟨10.1109/MWSCAS.2010.5548671⟩
Communication dans un congrès
hal-00627132
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A 65 nm CMOS versatile ADC using time interleaving and ΣΔ modulation for multi-mode receiver2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA), Jun 2009, Toulouse, France. pp.1-4, ⟨10.1109/NEWCAS.2009.5290510⟩
Communication dans un congrès
hal-03591883
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Decoding Attack Behaviors by Analyzing Patterns in Instruction-Based Attacks using Gem5ACACES 2024 Poster Abstracts, Jul 2024, Fiuggi, Italy
Poster de conférence
hal-04709017
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Cryogenic In-MRAM Computing2021 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), IEEE, pp.1-6, 2021, ⟨10.1109/NANOARCH53687.2021.9642238⟩
Proceedings/Recueil des communications
hal-04420929
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Compact thermal modeling of spin transfer torque magnetic tunnel junctionEuropean Symposium on Reliability of Electron Devices, Failure Physics and Analysis 2015, Oct 2015, Toulouse, France. , 2015, ⟨10.1016/j.microrel.2015.06.029⟩
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Compact model of magnetic tunnel junction with stochastic spin transfer torque switching for reliability analysesEuropean Symposium on Reliability of Electron Devices, Failure Physics and Analysis 2014, Sep 2014, Berlin, Germany. , 2014, ⟨10.1016/j.microrel.2014.07.019⟩
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From DMO to D2DWireless Public Safety Networks: Overview and Challenges, ISTE Press & Elsivier, pp.9-126, 2015
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Reliability Aware AMS/RF Performance OptimizationPerformance Optimization Techniques in Analog, Mixed-Signal, and Radio-Frequency Circuit Design, IGI Global, 2014
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Reliability Aware AMS / RF Performance OptimizationMourad Fakhfakh, Esteban Tlelo-Cuautle, Maria Helena Fino. Performance Optimization Techniques in Analog, Mixed-Signal, and Radio-Frequency Circuit Design, 2014, ⟨10.4018/978-1-4666-6627-6.ch002⟩
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Procédé permettant d'établir une stratégie d'économie d'énergie de batterie de terminaux mobilesFrance, N° de brevet: WO Patent App. PCT/EP2013/003,489. XP:Patent-14. 2014
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Procédé de Durcissement Logique par Partitionnement d'un Circuit ElectroniqueFrance, N° de brevet: 1261439. GG:BREVET-12. 2012, pp.21
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Structure d'Atténuation de Bruit d'une Fonction Logique CombinatoireFrance, N° de brevet: 1262053. KL:BREVET-12. 2012
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