Access content directly

Moncef KADI

Enseignant/Chercheur ESIGELEC Responsable du Pôle Electronique et Systèmes de l'IRSEEM
3%
Open access
75
Documents
Current affiliations
  • 101325
  • 569794
Researcher identifiers
  • IdHAL moncef-kadi
  • Google Scholar : https://scholar.google.fr/citations?hl=fr&user=EzO4fV4AAAAJ
  • IdRef : 084533242
Contact

Research domains

Electric power Electronics

Skills

Electromagnétisme, Electronique, CEM, Fiabilité

Publications

PHM method for detecting degradation of GaN HEMT ON resistance, application to power converter

H. Boulzazen , Chawki Douzi , Eric Joubert , Pascal Dherbécourt , Moncef Kadi
e-Prime – Advances in Electrical Engineering, Electronics and Energy, 2022, 2, pp.100060. ⟨10.1016/j.prime.2022.100060⟩
Journal articles hal-03872112v1

A novel methodology to characterize LGA packaged GaN power transistors using a mother/daughter board configuration for the reliability qualification in the mild hybrid applications

Chawki Douzi , Moncef Kadi , Moncef Kadi , Pascal Dherbécourt , Mohamed Akram Besserour
Microelectronics Reliability, 2022, 138, pp.114777. ⟨10.1016/j.microrel.2022.114777⟩
Journal articles hal-03882052v1

Fast Calculation Approach of the Radiated Magnetic Field Based on the Equivalent Model of a Flat Ground Plane

Oussama Sassi , Moncef Kadi , Michael Niederholz
IEEE Transactions on Electromagnetic Compatibility, 2021, pp.1-11. ⟨10.1109/TEMC.2021.3084512⟩
Journal articles hal-03516130v1

Curved Pyramidal Metamaterial Absorber: From Theory to an Ultra-Broadband Application in the [0.3 – 30] GHz Frequency Band

Zeinab Fneish , Jalal Jomaa , Hussam Ayad , Moncef Kadi , Ghaleb Faour
Advances in Science, Technology and Engineering Systems Journal, 2021, 6 (2), pp.29-35. ⟨10.25046/aj060204⟩
Journal articles hal-03516188v1

Experimental and microscopic analysis of 600V GaN-GIT under the short-circuit aging tests

Jian Zhi Fu , François Fouquet , Moncef Kadi , Pascal Dherbécourt , Fabien Cuvilly
International Journal of Information Science & Technology, 2019
Journal articles hal-02295904v1

Radiated EMI evolution of power SiC MOSFET in a boost converter after short-circuit aging tests

Shawki Douzi , Moncef Kadi , Habib Boulzazen , Mohamed Tlig , Jaleleddine Ben Hadj Slama
Microelectronics Reliability, 2019, pp.113398. ⟨10.1016/j.microrel.2019.113398⟩
Journal articles hal-02305454v1

Failure investigation of packaged SiC-diodes after thermal storage in extreme operating condition

O. Latry , Pascal Dherbécourt , Patrick Denis , Fabien Cuvilly , Moncef Kadi
Engineering Failure Analysis, 2018, 83, pp.185-192. ⟨10.1016/J.ENGFAILANAL.2017.09.010⟩
Journal articles hal-02131204v1

Evolution of C-V and I-V characteristics for a commercial 600 V GaN GIT power device under repetitive short-circuit tests

J.Z. Fu , F. Fouquet , M. Kadi , Pascal Dherbécourt
Microelectronics Reliability, 2018, 88-90, pp.652-655. ⟨10.1016/j.microrel.2018.06.034⟩
Journal articles hal-02181673v1

Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests

Shawki Douzi , Moncef Kadi , Habib Boulzazen , Mohamed Tlig , Jaleleddine Ben Hadj Slama
Microelectronics Reliability, 2018, 88-90, pp.219-224. ⟨10.1016/j.microrel.2018.06.092⟩
Journal articles hal-02305461v1

High-Frequency Characterization and Modeling of EMI Filters Under Temperature Variations

Fahim Hami , Habib Boulzazen , Moncef Kadi
IEEE Transactions on Electromagnetic Compatibility, 2017, 59 (6), pp.1906-1915. ⟨10.1109/TEMC.2017.2679700⟩
Journal articles hal-02305489v1

Electrical predictive model of Zener diode under pulsed EOS

F. Zhu , M. Kadi , François Fouquet , B. Ravelo
Electronics Letters, 2015, 51 (4), pp.327-328. ⟨10.1049/el.2014.4311⟩
Journal articles hal-02407347v1

A Novel Approach for Modeling Near-Field Coupling With PCB Traces

Hanen Shall , Zouheir Riah , Moncef Kadi
IEEE Transactions on Electromagnetic Compatibility, 2014, 56 (5), pp.1194-1201. ⟨10.1109/TEMC.2014.2304306⟩
Journal articles hal-02306921v1

A 3-D Near-Field Modeling Approach for Electromagnetic Interference Prediction

Hanen Shall , Zouheir Riah , Moncef Kadi
IEEE Transactions on Electromagnetic Compatibility, 2014, 56 (1), pp.102-112. ⟨10.1109/TEMC.2013.2274576⟩
Journal articles hal-02306926v1

Robustness of 4H-SiC 1200V Schottky diodes under high electrostatic discharge like human body model stresses : An in-depth failure analysis

P. Denis , Pascal Dherbécourt , O. Latry , C. Genevois , F. Cuvilly
Diamond and Related Materials, 2014, 44, pp.62-70. ⟨10.1016/j.diamond.2014.02.002⟩
Journal articles hal-02156382v1

Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS)

F. Zhu , F. Fouquet , B. Ravelo , A. Alaeddine , Moncef Kadi
Microelectronics Reliability, 2013, 53 (9-11), pp.1288-1292. ⟨10.1016/j.microrel.2013.07.077⟩
Journal articles hal-02306929v1

Determination of the compaction of hot mix asphalt using high-frequency electromagnetic methods

Cyrille Fauchard , Bo Li , Laurent Laguerre , Bernard Heritier , Nabil Benjelloun
NDT & E International, 2013, 60, pp.40-51. ⟨10.1016/j.ndteint.2013.07.004⟩
Journal articles hal-02178091v1

Experimental Study of a Computational Hybrid Method for the Radiated Coupling Modelling between Electronic Circuits and Electric Cable

Elagiri-Ramalingam Rajkumar , Ravelo Blaise , Mohamed Bensetti , Priscilla Fernández Lopez , Yang Liu
International Journal of Advances in Engineering & Technology, 2012
Journal articles hal-03680516v1

Post-processing of electric field measurements to calibrate a near-field dipole probe

Z. Riah , D. Baudry , Moncef Kadi , A. Louis , B. Mazari
IET Science Measurement and Technology, 2011, 5 (2), pp.29-36. ⟨10.1049/iet-smt.2010.0031⟩
Journal articles hal-02306941v1

Degradation of Au–Ti contacts of SiGe HBTs during electromagnetic field stress

A Alaeddine , C. Genevois , Moncef Kadi , F. Cuvilly , K. Daoud
Semiconductor Science and Technology, 2011, 26 (2), pp.025003. ⟨10.1088/0268-1242/26/2/025003⟩
Journal articles hal-02308187v1

Reliability study of AlGaN/GaN HEMT under electromagnetic, RF and DC stress

S. Khemiri , Moncef Kadi , A. Louis
Microelectronics Reliability, 2011, 51 (9-11), pp.1783-1787. ⟨10.1016/j.microrel.2011.07.074⟩
Journal articles hal-02306934v1

Characteristics degradation of the SiGe HBT under electromagnetic field stress

A. Alaeddine , Moncef Kadi , K. Daoud , B. Beydoun
Microelectronics Reliability, 2010, 50 (12), pp.1961-1966. ⟨10.1016/j.microrel.2010.07.002⟩
Journal articles hal-02306946v1

Study of electromagnetic field stress impact on SiGe heterojunction bipolar transistor performance

Ali Alaeddine , Moncef Kadi , Kaouther Daoud , Hichame Maanane , Philippe Eudeline
International Journal of Microwave and Wireless Technologies, 2009, 1 (6), pp.475-482. ⟨10.1017/S1759078709990572⟩
Journal articles hal-02306952v1

Effects of electromagnetic near-field stress on SiGe HBT’s reliability

A. Alaeddine , Moncef Kadi , K. Daoud , B. Mazari
Microelectronics Reliability, 2009, 49 (9-11), pp.1029-1032. ⟨10.1016/j.microrel.2009.07.014⟩
Journal articles hal-02306966v1

Modeling IC Snapback Characteristics Under Electrostatic Discharge Stress

Abhishek Ramanujan , Moncef Kadi , Jean Trémenbert , Frédéric Lafon , Bélahcène Mazari
IEEE Transactions on Electromagnetic Compatibility, 2009, 51 (4), pp.901-908. ⟨10.1109/TEMC.2009.2029092⟩
Journal articles hal-02306961v1

Plane wave spectrum theory applied to near-field measurements for electromagnetic compatibility investigations

D. Baudry , Moncef Kadi , Z. Riah , C. Arcambal , Y. Vives-Gilabert
IET Science Measurement and Technology, 2009, 3 (1), pp.72-83. ⟨10.1049/iet-smt:20080026⟩
Journal articles hal-02306968v1

Modeling IC Snapback characteristics under Electrostatic Discharge Stress

A. Ramanujan , M. Kadi , Jocelyne Trémenbert , Frédéric Lafon , B. Mazari
IEEE Transactions on Electromagnetic Compatibility, 2009, 51 (4), pp.901-908. ⟨10.1109/TEMC.2009.2029092⟩
Journal articles hal-00688281v1

Printed Dipoles Antennas for MCM-L Wireless RF Interconnects

Moncef Kadi , Fabien Ndagijimana , Joël Dansou-Eloy
IEEE Transactions on Antennas and Propagation, 2008, 56 (1), pp.223-230. ⟨10.1109/TAP.2007.912936⟩
Journal articles hal-02306985v1

Characterization and Modeling of the Susceptibility of Integrated Circuits to Conducted Electromagnetic Disturbances Up to 1 GHz

Imad Chahine , Moncef Kadi , Eric Gaboriaud , Anne Louis , Bélahcène Mazari
IEEE Transactions on Electromagnetic Compatibility, 2008, 50 (2), pp.285-293. ⟨10.1109/TEMC.2008.918983⟩
Journal articles hal-02306971v1

Printed Dipoles Antennas for MCM-L Wireless RF Interconnects

M. Kadi , F. Ndagijimana , J. Dansou-Eloy
IEEE Transactions on Antennas and Propagation, 2008, 56 (1), pp.223 - 230
Journal articles hal-00397591v1

Characterization of electromagnetic fields close to microwave devices using electric dipole probes

Lakhdar Bouchelouk , Zouheir Riah , David Baudry , Moncef Kadi , Anne Louis
International Journal of RF and Microwave Computer-Aided Engineering, 2008, 18 (2), pp.146-156. ⟨10.1002/mmce.20274⟩
Journal articles hal-02306981v1

Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances

I. Chahine , Moncef Kadi , E. Gaboriaud , X. Gallenne , A. Louis
IET Science Measurement and Technology, 2007, 1 (5), pp.240-244. ⟨10.1049/iet-smt:20060142⟩
Journal articles hal-02306991v1

Modelling of integrated circuit susceptibility to conducted electromagnetic disturbances using neural networks theory

I. Chahine , Moncef Kadi , E. Gaboriaud , C. Maziere , A. Louis
Electronics Letters, 2006, 42 (18), pp.1022. ⟨10.1049/el:20061903⟩
Journal articles hal-02307005v1

Methodology to Validate the Radiated Immunity of Very Complex Systems by a Succession of Simple Component Radiated Immunity Tests at System Level

Nadir Fouad Bedjiah , Marco Klingler , Moncef Kadi , Romain Rossi
2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), Aug 2022, Spokane, United States. pp.561-564, ⟨10.1109/EMCSI39492.2022.9889365⟩
Conference papers hal-03964862v1

5G Ambient Backscatter Communications: Achievable Range and Power Levels in an Urban Environment

Mariem Lefki , Sahbi Baccar , Hanen Shall , Mohamed Ghorbel , Moncef Kadi
2022 IEEE 12th International Conference on RFID Technology and Applications (RFID-TA), Sep 2022, Cagliari, Italy. pp.74-77, ⟨10.1109/RFID-TA54958.2022.9924037⟩
Conference papers hal-03964777v1

Effect of SiC MOSFET Terminal Capacitances Evolution after Short-Circuit Aging Tests on Conducted EMI in a Boost Converter

Chawki Douzi , Moncef Kadi , Jaleleddine Ben Hadj Slama
2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), Mar 2022, Bruges, Belgium. pp.29-34, ⟨10.1109/EMCCompo52133.2022.9758597⟩
Conference papers hal-03964891v1

Characterization of the shielding effectiveness of composite materials using ultra-wide band Vivaldi antennas

Rassoul Mansour , Nabil Benjelloun , Moncef Kadi
2021 IEEE Conference on Antenna Measurements & Applications (CAMA), Nov 2021, Antibes Juan-les-Pins, France
Conference papers hal-03517424v1

Evolution of Electrical Performance in First Generation of SiC MOSFET for Low Voltage Applications after Short-Circuit Aging Tests

Chawki Douzi , Moncef Kadi , Jaleleddine Ben Hadj Slama
2021 12th International Renewable Energy Congress (IREC), Oct 2021, Hammamet, Tunisia. pp.1-6, ⟨10.1109/IREC52758.2021.9624831⟩
Conference papers hal-03516144v1

DoE-based Evaluation of the Impact of the Twisted-Pair-Cable Parameters on the Wireless Communication Performance

Oussama Sassi , Pascal Herve , Moncef Kadi
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, Jul 2021, Raleigh, United States. pp.733-738, ⟨10.1109/EMC/SI/PI/EMCEurope52599.2021.9559193⟩
Conference papers hal-03516152v1

Thermal Modelling for an Electrothermal Model of GaN Devices

Mohamed Akram Besserour , Sonia Eloued , Francois Fouquet , Moncef Kadi , Jaleleddine Ben Hadj Slama
2021 12th International Renewable Energy Congress (IREC), Oct 2021, Hammamet, Tunisia. pp.1-6, ⟨10.1109/IREC52758.2021.9624883⟩
Conference papers hal-03516140v1

Concept of Mean Effective Gain for Optimizing Ambient Energy-Harvesting Antennas

Shirin Aghabeiki , M. Constant Niamien , Moncef Kadi
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Jul 2020, Montreal, Canada. pp.1479-1480, ⟨10.1109/IEEECONF35879.2020.9330318⟩
Conference papers hal-03516164v1

Time-Average Behaviors of Indoor Propagation Channels on Wireless Applications

Shirin Aghabeiki , Constant Niamien , Moncef Kadi
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Jul 2020, Montreal, Canada. pp.1165-1166, ⟨10.1109/IEEECONF35879.2020.9330382⟩
Conference papers hal-03516168v1

Evaluation method of wireless communication system performance based on PER-function coupled with full wave simulation in presence of EM-Interference

Oussama Sassi , Mahmud Naseef , Pascal Herve , Moncef Kadi
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Sep 2020, Rome, Italy. pp.1-6, ⟨10.1109/EMCEUROPE48519.2020.9245729⟩
Conference papers hal-03016375v1

Discussion on the choice of the antenna for ambient radio-frequency power density measurement systems

Shirin Aghabeiki , M. Niamien , Moncef Kadi , Mohamed Fall
2019 International Conference on Electromagnetics in Advanced Applications (ICEAA), Sep 2019, Granada, Spain. pp.0427-0430, ⟨10.1109/ICEAA.2019.8879100⟩
Conference papers hal-02421572v1

Design methodology of quasi-isotropic antennas with basic radiators as the electric and magnetic dipoles

Shirin Aghabeiki , M. Niamien , Moncef Kadi , Mohamed Fall
2019 International Conference on Electromagnetics in Advanced Applications (ICEAA), Sep 2019, Granada, Spain. pp.0807-0810, ⟨10.1109/ICEAA.2019.8879259⟩
Conference papers hal-02407247v1

Ultra Broadband Curved Pyramidal Absorber Metamaterial in the UHF/SHF Region

Z. Fneish , Hussam Ayad , Moncef Kadi , F. Mazeh , J. Jomaah
2019 7th Mediterranean Congress of Telecommunications (CMT), Oct 2019, Fès, Morocco. pp.1-4, ⟨10.1109/CMT.2019.8931391⟩
Conference papers hal-02421586v1

Estimation de la densité de puissance incidente mono-source en visibilité directe

Shirin Aghabeiki , Constant Niamien , Moncef Kadi , Mohamed Fall
19ème Colloque International & Exposition sur la Compatibilité Electromagnétique (CEM 2018), Jul 2018, Paris, France
Conference papers hal-02310356v1

Experimental study of 600V GaN transistor under the short-circuit aging tests

J-Z. Fu , F. Fouquet , M. Kadi , Pascal Dherbécourt
2018 19th IEEE Mediterranean Electrotechnical Conference (MELECON), May 2018, Marrakech, France. pp.249-253, ⟨10.1109/MELCON.2018.8379102⟩
Conference papers hal-02181678v1

Aging of GaN GIT under repetitive short-circuit tests

J-Z. Fu , F. Fouquet , Moncef Kadi , Pascal Dherbécourt
2018 1st Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia), May 2018, Xi'an, China. pp.189-193, ⟨10.1109/WiPDAAsia.2018.8734539⟩
Conference papers hal-02306848v1

Broad band PCB probes for near field measurements

Nimisha Sivaraman , Fabien Ndagljlmana , Moncef Kadi , Zouheir Riah
2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Sep 2017, Angers, France. pp.1-5, ⟨10.1109/EMCEurope.2017.8094674⟩
Conference papers hal-02306862v1

WORKSHOP EMC OF ICs -THE FRENCH TOUCH : On the combined effect of environmental and service conditionson the EMC behavior of the passive component up to the circuit

Habib Boulzazen , Fahim Hami , Moncef Kadi
EMC Europe 2017, Sep 2017, Angers, France
Conference papers hal-01598936v1

Failure analysis of aluminum electrolytic capacitors based on electrical and physicochemical characterizations

Chadia Lachkar , Moncef Kadi , Jean-Paterne Kouadio , Morgane Presle , Sabrina El Yousfi
2017 IEEE International Reliability Physics Symposium (IRPS), Apr 2017, Monterey, United States. pp.5C-1.1-5C-1.7, ⟨10.1109/IRPS.2017.7936328⟩
Conference papers hal-02961756v1

Behavoir study of a 600v gan transistor under short-circuit experimental test

Jian Zhi Fu , Francois Fouquet , Moncef Kadi , Pascal Dherbécourt
TELECOM 2017 et 10ème JFMMA, May 2017, Rabat, Morocco
Conference papers hal-02310344v1

Exploitation des mesures en champ proche par la technique du spectre d’ondes planes : theorie et applications

Moncef Kadi
TELECOM 2017 et 10e JFMMA, May 2017, Rabat, Maroc
Conference papers hal-02310337v1

Simulation of conducted EMI in SiC MOSFET buck converters before and after aging

Shawki Douzi , Mohamed Tlig , Jaleleddine Ben Hadj Slama , Moncef Kadi
2016 7th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT), Dec 2016, Hammamet, Tunisia. pp.171-176, ⟨10.1109/SETIT.2016.7939861⟩
Conference papers hal-02306875v1

Modelling and characterisation of a wireless charging system for mobile devices

Ghida Al Achkar , Nabil Benjelloun , Aufmkolk, R , Laurent Daniel , Denis Desrus
18th International Symposium on ElectroMagnetic Compatibility (CEM 2016), Jul 2016, Rennes, France
Conference papers hal-02889039v1

Overview on Zener diode pulsed EOS characterization

Feiyi Zhu , Ravelo Blaise , Bernadette Domengès , Moncef Kadi
The 4th Advanced Electromagnetics Symposium (AES 2016), Jul 2016, Malaga, Spain
Conference papers hal-02889063v1

Study of the radiated emissions of an electric vehicle battery charger during the charge cycle

H. Shall , Moncef Kadi
2015 12th International Multi-Conference on Systems, Signals & Devices (SSD), Mar 2015, Mahdia, Tunisia. pp.1-5, ⟨10.1109/SSD.2015.7348148⟩
Conference papers hal-02306897v1

Wideband characterization and modeling of coupled inductors under temperature variations

Fahim Hami , Habib Boulzazen , Moncef Kadi
2015 IEEE International Symposium on Electromagnetic Compatibility - EMC 2015, Aug 2015, Dresden, Germany. pp.1396-1401, ⟨10.1109/ISEMC.2015.7256376⟩
Conference papers hal-02306882v1

High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations

Fahim Hami , Habib Boulzazen , Moncef Kadi
2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), May 2015, Pisa, Italy. pp.334-339, ⟨10.1109/I2MTC.2015.7151290⟩
Conference papers hal-02306892v1

A tridimensional radiated emission model based on an improved near field scan technique

H. Shall , K. Alameh , Z. Riah , A. Alaeddine , Moncef Kadi
2014 International Conference on Green Energy, Mar 2014, Sfax, Tunisia. pp.240-245, ⟨10.1109/ICGE.2014.6835428⟩
Conference papers hal-02307015v1

Wideband impedance characterization and modeling of power electronic capacitors under high bias voltage variation

Fahim Hami , Habib Boulzazen , Fabrice Duval , Moncef Kadi
2014 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Sep 2014, Gothenburg, Germany. pp.928-933, ⟨10.1109/EMCEurope.2014.6931036⟩
Conference papers hal-02310289v1

Comparative study of two inverse methods based on near-field technique

W. Labiedh , H. Shall , J. Ben Hadj Slama , Z. Riah , Moncef Kadi
2014 International Conference on Electrical Sciences and Technologies in Maghreb (CISTEM), Nov 2014, Tunis, Tunisia. pp.1-6, ⟨10.1109/CISTEM.2014.7076993⟩
Conference papers hal-02306911v1

Modeling of the coupling phenomenon between a transmission line and a near-field excitation

A. Alaeddine , Moncef Kadi , H. Shall , B. Beydoun , K. Daoud
2013 25th International Conference on Microelectronics (ICM), Dec 2013, Beirut, Lebanon. pp.1-4, ⟨10.1109/ICM.2013.6735005⟩
Conference papers hal-02310312v1

Prediction of 3D-near field coupling between a toroïdal inductor and a transmission line

H. Shall , Z. Riah , Moncef Kadi
2013 IEEE International Symposium on Electromagnetic Compatibility - EMC 2013, Aug 2013, Denver, United States. pp.651-656, ⟨10.1109/ISEMC.2013.6670492⟩
Conference papers hal-02307023v1

A hybrid technique for radiated coupling exposed to nearand far -fields

E.R Rajkumar , Abhishek Ramanujan , Ravelo Blaise , Mohamed Bensetti , M. Kadi
16ème Colloque International et Exposition sur la Compatibilité Électromagnétique (CEM 2012), Apr 2012, Rouen, France
Conference papers hal-03680938v1

Performance and structure degradations of SiGe HBT after electromagnetic field stress

A. Alaeddine , Moncef Kadi , K. Daoud
2011 IEEE International Reliability Physics Symposium (IRPS), Apr 2011, Monterey, United States. pp.CD.1.1-CD.1.6, ⟨10.1109/IRPS.2011.5784555⟩
Conference papers hal-02307309v1

Estimation of the electromagnetic field radiated by a microwave circuit encapsulated in a rectangular cavity

Samh Khemiri , Abhishek Ramanujan , Moncef Kadi , Zouheir Riah , Anne Louis
2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011, Aug 2011, Long Beach, United States. pp.196-201, ⟨10.1109/ISEMC.2011.6038309⟩
Conference papers hal-02307305v1

Characterization and simulation of SiGe HBT degradation nduced by electromagnetic field stress

A. Alaeddine , M. Kadi , K. Daoud , B. Beydoun , D. Blavette
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, 2009, Unknown, Unknown Region. pp.751--755, ⟨10.1109/IPFA.2009.5232729⟩
Conference papers hal-01928879v1

Electromagnetic interference produced by printed dipole antennas for MCM wireless RF clock distribution

Moncef Kadi , F. Ndagijimana , J. Dansou
8th IEEE Workshop on Signal Propagation on Interconnects, 2004, Heidelberg, Germany. pp.161-164, ⟨10.1109/SPI.2004.1409040⟩
Conference papers hal-02307319v1

Fiabilité des transistors radiofréquence de puissance aux agressions électromagnétique et thermique

Samh Khemiri , Moncef Kadi
Les systèmes mécatroniques embarqués - 1 : analyse des causes de défaillances, modélisation, simulation et optimisation, ISTE - Edition, 2020, 9781784056476
Book sections hal-02933542v1

Méthode de caractérisation de l’environnement électromagnétique dans des circuits hyperfréquences encapsulés dans des cavités métalliques

Samh Khemiri , Abhishek Ramanujan , Moncef Kadi , Zouheir Riah
Les systèmes mécatroniques embarqués - 1 : analyse des causes de défaillances, modélisation, simulation et optimisation, ISTE - Edition, 2020, 9781784056476
Book sections hal-02933531v1

Reliability Study for Cuboid Aluminum Capacitors with Liquid Electrolyte

Chadia Lachkar , Moncef Kadi , Jean-Paterne Kouadio , Jean-Francois Goupy , Philippe Eudeline
Reliability of High-Power Mechatronic Systems 2, Elsevier, pp.109-137, 2017, ⟨10.1016/B978-1-78548-261-8.50003-6⟩
Book sections hal-02306868v1

Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities

Samh Khemiri , Abhishek Ramanujan , Moncef Kadi , Zouheir Riah
Embedded Mechatronic Systems 1, Elsevier, pp.57-77, 2015, ⟨10.1016/B978-1-78548-013-3.50003-6⟩
Book sections hal-02306900v1

Reliability of Radio Frequency Power Transistors to Electromagnetic and Thermal Stress

Samh Khemiri , Moncef Kadi
Embedded Mechatronic Systems 1, Elsevier, pp.141-164, 2015, ⟨10.1016/B978-1-78548-013-3.50006-1⟩
Book sections hal-02306903v1
Image document

ETUDE DES PROBLEMATIQUES D'INTEGRITE DES SIGNAUX, DE CEM ET DE FIABILITE DES COMPOSANTS ELECTRONIQUES

Moncef Kadi
Electronique. Université de Rouen Normandie, 2011
Habilitation à diriger des recherches tel-02308022v1