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Nicolas MAURAN

23
Documents

Publications

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Preconditioning of p-GaN power HEMT for reproducible V measurements

L. Ghizzo , David Trémouilles , Frédéric Richardeau , S. Vinnac , Lucas Moreau
Microelectronics Reliability, 2023, 144, pp.114955. ⟨10.1016/j.microrel.2023.114955⟩
Article dans une revue hal-04049626v1
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Very high frequency probes for atomic force microscopy with silicon optomechanics

L Schwab , P E Allain , Nicolas Mauran , Xavier Dollat , Laurent Mazenq
Microsystems & Nanoengineering, 2022, 8, pp.32. ⟨10.1038/s41378-022-00364-4⟩
Article dans une revue hal-03326075v2
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Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes

Denis Lagrange , Nicolas Mauran , Lucien Schwab , Bernard Legrand
IEEE Transactions on Control Systems Technology, 2021, 29 (5), pp.2264 - 2270. ⟨10.1109/TCST.2020.3028737⟩
Article dans une revue hal-02974151v1
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A New Miniaturized Gas Sensor Based on Zener Diode Network Covered by Metal Oxide

Vignesh Gunasekaran , Soffian Yjjou , Eve Hennequin , Thierry Camps , Nicolas Mauran
Micromachines, 2021, 12 (11), pp.1355. ⟨10.3390/mi12111355⟩
Article dans une revue hal-03417359v1
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On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress

Fabrice Caignet , Nicolas Nolhier , Marise Bafleur , Anqing Wang , Nicolas Mauran
Microelectronics Reliability, 2013, 53 (9-11), pp.1278-1283. ⟨10.1016/j.microrel.2013.07.056⟩
Article dans une revue hal-00941840v1
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An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices

Jinyu Jason Ruan , Nicolas Monnereau , David Trémouilles , Nicolas Mauran , Fabio Coccetti
IEEE Transactions on Instrumentation and Measurement, 2012, pp.456-461. ⟨10.1109/TIM.2011.2161937⟩
Article dans une revue hal-00668827v1
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Integrated LC filter on silicon for DC-DC converter applications

Philippe Artillan , Magali Brunet , David Bourrier , Jean-Pierre Laur , Nicolas Mauran
IEEE Transactions on Power Electronics, 2011, 26 (8), pp.2319-2325. ⟨10.1109/TPEL.2010.2102776⟩
Article dans une revue hal-01443073v1

A New Junction Termination Using a Deep Trench Filled With BenzoCycloButene

Loïc Théolier , Hicham Mahfoz-Kotb , Karine Isoird , Frédéric Morancho , Sandrine Assié-Souleille
IEEE Electron Device Letters, 2009, 30 (6), pp.687 - 689. ⟨10.1109/LED.2009.2020348⟩
Article dans une revue hal-00991660v1
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Analysis and Compact Modeling of a Vertical Grounded-Base NPN Bipolar Transistor used as ESD Protection in a Smart Power Technology

Géraldine Bertrand , Christelle Delage , Marise Bafleur , Nicolas Nolhier , Jean-Marie Dorkel
IEEE Journal of Solid-State Circuits, 2001, 36 (9), pp.1373-1381
Article dans une revue hal-00143927v1

Self-Propagating Reaction Mechanisms in TiB2 Integrated Al/CuO Nanothermites

Vidushi Singh , Richard Monflier , Nicolas Mauran , Alain Estève , Carole Rossi
2023 MRS Fall Meeting & Exhibit, Materials Research Society, Nov 2023, Boston (MA), United States
Communication dans un congrès hal-04493934v1
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130-MHz Optomechanical Vibrating Sensor: Towards High Bandwidth / Ultrasensitive Measurements

Lucien Schwab , Pierre-Etienne Allain , Louise Banniard , Nicolas Mauran , Denis Lagrange
IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS 2019), Jan 2019, Seoul, South Korea. pp.819-822, ⟨10.1109/MEMSYS.2019.8870718⟩
Communication dans un congrès hal-02371188v1

VCSELs fabricated using self-aligned processing

Ludovic Marigo-Lombart , Laurent Mazenq , Ludovic Salvagnac , Guillaume Libaude , Bernard Rousset
42nd Micro and Nano Engineering (MNE), Sep 2016, Vienna, Austria
Communication dans un congrès hal-01857636v1

VCSELs fabricated using self-aligned processing

Ludovic Marigo-Lombart , Alexandre Arnoult , Laurent Mazenq , Pascal Dubreuil , Benjamin Reig
Workshop VCSEL Day 2016, Jun 2016, Darmstadt, Germany. 2p
Communication dans un congrès hal-01857634v1
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TLP-based Human Metal Model stress generator and analysis method of ESD generators

Rémi Bèges , Fabrice Caignet , Patrice Besse , Jean-Philippe Laine , Alain Salles
Electrical Overstress / Electrostatic Discharge Symposium (EOS/ESD 2015), Sep 2015, Reno, United States. ⟨10.1109/EOSESD.2015.7314777⟩
Communication dans un congrès hal-01239451v1
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Oscilloscope intégré sur puce appliqué à la caractérisation d'un générateur d'impulsions à 20 GHz

Thomas Epert , Fabrice Caignet , Christophe Viallon , Anqing Wang , Nicolas Mauran
18èmes Journées Nationales Microondes, May 2013, Paris, France. pp.4
Communication dans un congrès hal-00924176v1
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Transient-TLP (T-TLP): a simple method for accurate ESD protection transient behavior measurement

David Trémouilles , Antoine Delmas , Nicolas Mauran , Nicolas Nolhier , Houssam Arbess
EOS/ESD Symposium, Sep 2013, LAS VEGAS, United States. pp.258-267
Communication dans un congrès hal-01056511v1
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Réalisation et caractérisation de diodes Schottky en diamant monocristallin protégées par plaque de champ sur Si3N4

Fabien Thion , Karine Isoird , Dominique Planson , Marie-Laure Locatelli , Henri Schneider
14ème EPF, Jul 2012, Bordeaux, France. 4 p
Communication dans un congrès hal-01005917v1
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Accurate Transient Behavior Measurement of High- Voltage ESD Protections Based on a Very Fast Transmission-Line Pulse System

Antoine Delmas , Nicolas Nolhier , David Trémouilles , Marise Bafleur , Nicolas Mauran
31st Electrical Overstress/Electrostatic Discharge Symposium, 2009. EOS/ESD Symposium, Aug 2009, ANAHEIM, United States. pp.165-172
Communication dans un congrès hal-00445676v1
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ENERGY SCAVENGING BASED ON TRANSIENT THERMAL GRADIENTS: APPLICATION TO STRUCTURAL HEALTH MONITORING OF AIRCRAFTS

Nicolas Bailly , Jean-Marie Dilhac , Christophe Escriba , Claude Vanhecke , Nicolas Mauran
8th International Workshop on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS 2008), Nov 2008, SENDAI, Japan. pp.205-208
Communication dans un congrès hal-00384129v1
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Notice d'utilisation de la station sous pointes MPI TS-2000

Nicolas Mauran
Rapport LAAS n° 20089. 2020, pp.8
Autre rapport, séminaire, workshop hal-02573149v1