Paul GRANDAMME
- Laboratoire Hubert Curien (LabHC)
- École des Mines de Saint-Étienne (Mines Saint-Étienne MSE)
Publications
Publications
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Fault injection attacks on unpowered devicesWorkshop on Practical Hardware Innovations in Security Implementation and Characterization (PHISIC), May 2025, Gardanne, France |
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Éteindre votre composant électronique ne le protège pas !JAIF 2024 - Journée thématique sur les attaques par injection de fautes, Oct 2024, Rennes, France |
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X-Ray Fault Injection Localization with a Shield on Powered and Unpowered Devices2025 IEEE Physical Assurance and Inspection of Electronics (PAINE 2025), Oct 2025, Denver, CO, United States |
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Éteindre votre composant électronique ne le protège pas !JAIF 2024 - Journée thématique sur les attaques par injection de fautes, Oct 2024, Rennes, France |
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Laser Fault Injection on power off devicesRADLAS 2024 : 6th Workshop on Laser Testing of Radiation Effects on Components and Systems, Sep 2024, Noordwijk, Netherlands |
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X-Ray Fault Injection in non-volatile memories of Power Off DevicesJAIF 2024 - Journée thématique sur les attaques par injection de fautes, Sep 2023, Gardanne, France |
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X-Ray Fault Injection in Non-Volatile Memories on Power OFF Devices2023 IEEE Physical Assurance and Inspection of Electronics (PAINE), Oct 2023, Huntsville, United States. pp.1-7, ⟨10.1109/PAINE58317.2023.10318018⟩ |
X-Ray Fault Injection on Power OFF devicesCryptographic architectures embedded in logic devices, Jun 2023, Castro Urdiales, Spain |
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Multi-spot Laser Fault Injection Setup: New Possibilities for Fault Injection Attacks20th Smart Card Research and Advanced Application Conference - CARDIS 2021, Nov 2021, Lübeck, Germany. pp.151-166, ⟨10.1007/978-3-030-97348-3_9⟩ |
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Techniques avancées d'attaques par injection de fautes sur circuits intégrésMicro et nanotechnologies/Microélectronique. Université Jean Monnet (Saint-Etienne), 2025. Français. ⟨NNT : 2025STET0011⟩ |
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Switching Off your Device Does Not Protect Against Fault AttacksIACR Transactions on Cryptographic Hardware and Embedded Systems, 2024, 2024 (4), pp.425-450. ⟨10.46586/tches.v2024.i4.425-450⟩ |