Régis Carin
Publications
Publications
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Armand FREMONT: un universitaire attaché à toutes les missions de l'enseignant-chercheur, du syndicalisme à la gestion des universitésColloque Armand Fremont - Un géographe dans le siècle, Université de Caen, Jun 2022, Caen, France |
Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETsJoint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan 2016, Vienna, Austria |
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Low frequency noise spectroscopy in rotated UTBOX nMOSFETsICNF’2015 (International Conference on Noise and Fluctuations), Jun 2015, Xi’An, China. ⟨10.1109/ICNF.2015.7288588⟩ |
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Static and low frequency noise characterization in standard and rotated UTBOX nMOSFETsEUROSOI-ULIS’2015 Conference, Jan 2015, Bologne, Italy. ⟨10.1109/ULIS.2015.7063817⟩ |
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Low temperature noise spectroscopy of p-channel SOI FinFETs10th Workshop of the Thematic Network on SOI Technology, Devices and Circuits, Jan 2014, tarragona, Spain. 2 p. in USB Key |
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Performances under saturation operation of p channel FinFETs on SOI substrates at cryogenic temperatureIEEE/CAS’2014, 2014, Sinaia, Romania. pp181-184, ⟨10.1109/SMICND.2014.6966429⟩ |
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Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs9th Workshop of the Thematic Network on SOI Technology, Devices and Circuits, Jan 2013, Paris, France. 2 p. (CDROM) |
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Low frequency noise assessment in advanced UTBOX SOI n-channel MOSFETs9th Workshop of the Thematic Network on SOI Technology, Devices and Circuits, Jan 2013, paris, France. 2 p. (CDROM) |
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Low-Frequency Noise in High-K and SiO2 UTBOX SOI nMOSFETSChina Semiconductor Technology International Conference, Mar 2013, shangai, China. pp.87-92 |
Low frequency noise as diagnostic tools in sub-22nm MOSFET transistorsWorkshop " Oxydes Fonctionnels pour l'Intégration en Micro- et Nano-électronique ", Apr 2013, Autrans, France |
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Detailled characterisation of SOI n-FinFETs at very low temperatureInternational Conference on Ultimate Integration on Silicon (ULIS), Mar 2013, Coventry, United Kingdom. 4 p |
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Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si filmThe International Conference on Noise and Fluctuations (ICNF), 2013, Montpellier, France. 4 p |
Bruit basse fréquence dans les transistors ultrafins totalement déplétés sur substrat SOI13èmes Journées de la Matière Condensée, Aug 2012, Montpellier, France |
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On the Variability and Front-Back Coupling of the Low-frequency Noise in UTBOX SOI nMOSFETsIEEE 11th International Conference on Solid-State and Integrated Circuit Technology, Oct 2012, xian, China. 3 p |
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DC and noise performances of SOI FinFETs at very low temperature8th Workshop of the Thematic Network on SOI Technology, Devices and Circuits, Jan 2012, Montpellier, France. 2p |
Réflexions sur une électronique analogique de courant : super transistor OPA86X et amplificateur direct à transimpédance à base de GMRColloque sur l'Enseignement des Technologies et des Sciences de l'Information et des Systèmes, Oct 2011, Trois-Rivières, Quebec, Canada. 6 p |
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Assessment of temperature dependence of the low frequency noise in unstrained and strained FinFInternational Conference on Future Networks (ICFN ), Jun 2011, toronto, Canada. pp135-138 |
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Low Frequency Noise Spectroscopy in Advanced nFinFETSSeventh Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits, Jan 2011, Grenade, Spain. pp55-56 |
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Low-frequency noise behavior in P-channel SOI FinFETs processed with different strain techniques20th International Conference on Noise and Fluctuations, Jun 2009, Pista, Italy. p.295-298 |
Unusual noise behavior versus temperature in nFinFETs on silicon on insulator (SOI) substrates processed with different strain techniquesEUROSOI 2008 CONFERENCE PROCEEDINGS FOURTH WORKSHOP OF THE THEMATIC NETWORK ON SILICON-ON-INSULATOR TECHNOLOGY, 2008, dublin, Ireland |
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Apparent noise parameter behavior in n-MOS transistors operating from subthreshold to above-threshold regionsProceedings of the 18th International Conference on noise in Physical Systems and 1/f Fluctuation ; ICNF 2005 ; CP780 Noise and Fluctuations, Sep 2005, Salamanca, Spain. pp.319-322 |
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Conduction and Low-Frequency noise : diagnostic tools for low-temperature (£ 600=B0C) polysilicon thin film transistor technologyInvited Conference; ElectroChem. Soc. TFTTVI, Oct 2002, Salt Lake City, United States. pp.246-256 |
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Meyer-Neldel parameter as a figure of merit for quality of thin film transistor active layerE-MRS 2002, Spring Meeting Poster, Jun 2002, Strasbourg, France |
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Caractérisation en température de semi-conducteurs et mise en oeuvre d'un thermomètre analogiqueCETSIS-EEA 2001, Oct 2001, Clermont-Ferrand, France. pp.273-276 |
La science sur un plateau. Au nord de Caen, un demi-siècle de développement (1967-2017)J. Travert, D. Toulorge, R. Carin. Presses Universitaires de Caen, 2018, 978-2-84133-888-7 |
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Un universitaire attaché à toutes les missions de l'enseignant-chercheur, du syndicalisme à la gestion des universitésUn géographe dans le siècle - Hommage à Armand Frémont, pp.277-280, 2022, 979-10-91823-05-0 |