Rosine COQ GERMANICUS

54
Documents

Présentation

Domaines de recherche

Physique [physics]

Compétences

AFM (Atomic Force Microscopy) Metrology Failure Analysis (FA) Radiation effects Microelectronic

Publications

7
6
5
5
5
4
4
3
3
3
3
3
3
3
3
3
2
2
2
2
2
2
2
2
2
2
2
2
2
2
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
4
4
5
7
5
1
4
1
2
4
1
1
1
2
3
4
3
1
18
15
5
4
3
3
2
2
1
1
15
12
10
9
8
8
7
7
6
5
5
5
5
4
4
4
4
4
4
4
4
4
4
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
37
10
2
1
1
2

Publications

Image document

Influence of the SrVO3 thin film thickness integrated on glass thanks to [Ca$_2$Nb$_3$O$_{10}$]- nanosheets

Marie El Rami , Simon Hurand , Florent Baudouin , Marie Dallocchio , Rosine Coq Germanicus et al.
Applied Surface Science, 2025, 690, pp.162580. ⟨10.1016/j.apsusc.2025.162580⟩
Article dans une revue hal-04929878 v1
Image document

AFM-sMIM characterization of the recombination-enhancing buffer layer for bipolar degradation free SiC MOSFETs

Rosine Coq Germanicus , Tanguy Phulpin , Kimmo Niskanen , Alain Michez , Ulrike Lüders
Solid State Phenomena, 2024, 361, pp.85-91. ⟨10.4028/p-hupmo0⟩
Article dans une revue hal-04682254 v1
Image document

SiC Doping Impact during Conducting AFM under Ambient Atmosphere

Christina Villeneuve-Faure , Abdelhaq Boumaarouf , Vishal Shah , Peter Gammon , Ulrike Lüders et al.
Materials, 2023, 16 (15), pp.5401. ⟨10.3390/ma16155401⟩
Article dans une revue hal-04187713 v1
Image document

Selective Oxidation during AFM Electrical Characterization of Doped SiC Layers

Rosine Coq Germanicus , Abdelhaq Boumaarouf , Christina Villeneuve-Faure , Vish Al Shah , Peter Gammon et al.
Materials Science Forum, 2023, 1089, pp.63-69. ⟨10.4028/p-666z18⟩
Article dans une revue hal-04124446 v1
Image document

Failure of a brittle layer on a ductile substrate: Nanoindentation experiments and FEM simulations

M. Rusinowicz , G. Parry , F. Volpi , D. Mercier , S. Eve et al.
Journal of the Mechanics and Physics of Solids, 2022, 163, pp.104859. ⟨10.1016/j.jmps.2022.104859⟩
Article dans une revue hal-03708224 v1

Study of the beneficial effects of sodium doping Cu2ZnSnS4 material

M. Marzougui , H. Hammami , H. Oueslati , R. Coq Germanicus , C. Leroux et al.
Optical Materials, 2022, 132, pp.112709. ⟨10.1016/j.optmat.2022.112709⟩
Article dans une revue hal-03777821 v1
Image document

Failure Analysis of Atmospheric Neutron-Induced Single Event Burnout of a Commercial SiC MOSFET

Rosine Coq Germanicus , Kimmo Niskanen , Alain Michez , Niemat Moultif , Wadia Jouha et al.
Materials Science Forum, 2022, 1062, pp.544-548. ⟨10.4028/p-973n9u⟩
Article dans une revue hal-03702520 v1

Electrical characterizations based on AFM: SCM and SSRM measurements with a multidimensional approach

Rosine Coq Germanicus , U. Lüders
EDFA Technical Articles, 2022, 24 (3), pp.24-31. ⟨10.31399/asm.edfa.2022-3.p024⟩
Article dans une revue hal-03781868 v1
Image document

Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation

Andrea Coronetti , Ruben Garcia Alia , Jan Budroweit , Tomasz Rajkowski , Israel Da Costa Lopes et al.
IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.958-969. ⟨10.1109/TNS.2021.3061197⟩
Article dans une revue hal-03341566 v1
Image document

Neutron-Induced Failure Dependence on Reverse Gate Voltage for SiC Power MOSFETs in Atmospheric Environment

K. Niskanen , Rosine Coq Germanicus , A. Michez , Frédéric Wrobel , Jérôme Boch et al.
IEEE Transactions on Nuclear Science, 2021, 68 (8), pp.1623-1632. ⟨10.1109/tns.2021.3077733⟩
Article dans une revue hal-03341565 v1
Image document

Development of a multifunctional nanoindenter integrated in-situ Scanning Electron Microscope - application to the monitoring of piezoresponse and electro-mechanical failures

F. Volpi , C. Boujrouf , M. Rusinowicz , S. Comby-Dassonneville , F. Mercier et al.
Thin Solid Films, 2021, 735, pp.138891. ⟨10.1016/j.tsf.2021.138891⟩
Article dans une revue hal-03428537 v1
Image document

Thickness dependence of dielectric properties in sub-nanometric Al2O3/ZnO laminates

M. Upadhyay , M. Ben Elbahri , M. Mezhoud , Rosine Coq Germanicus , U. Lüders
Solid-State Electronics, 2021, 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), 186, pp.108070. ⟨10.1016/j.sse.2021.108070⟩
Article dans une revue hal-03341562 v1
Image document

Morphology control of self-organised Sr3V2O8 nanostructures on SrVO3 grown onto single and poly-crystalline subjacent SrTiO3 substrates

B. Bérini , M. Dallocchio , A. David , U. Luders , Bourlier Yoan et al.
Applied Surface Science, 2021, 566, pp.150759. ⟨10.1016/j.apsusc.2021.150759⟩
Article dans une revue hal-03335293 v1
Image document

Dopant activity for highly in-situ doped polycrystalline silicon: hall, XRD, scanning capacitance microscopy (SCM) and scanning spreading resistance microscopy (SSRM)

Rosine Coq Germanicus , Florent Lallemand , Daniel Chateigner , Wadia Jouha , Niemat Moultif et al.
Nano Express, 2021, 2 (1), pp.010037. ⟨10.1088/2632-959x/abed3e⟩
Article dans une revue hal-03341563 v1
Image document

Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy

Rosine Coq Germanicus , Peter de Wolf , Florent Lallemand , Catherine Bunel , Serge Bardy et al.
Beilstein Journal of Nanotechnology, 2020, 11, pp.1764 - 1775. ⟨10.3762/bjnano.11.159⟩
Article dans une revue hal-03053497 v1
Image document

Three dimensional resistance mapping of self-organized Sr3V2O8 nanorods on metallic perovskite SrVO3 matrix

Rosine Coq Germanicus , Yoan Bourlier , Vincent Notot , Bruno Bérini , Valérie Demange et al.
Applied Surface Science, 2020, 510, pp.- 145522. ⟨10.1016/j.apsusc.2020.145522⟩
Article dans une revue hal-02531301 v1

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

K. Niskanen , A. Touboul , Rosine Coq Germanicus , A. Michez , A. Javanainen et al.
IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1365-1373. ⟨10.1109/TNS.2020.2983599⟩
Article dans une revue hal-03511987 v1
Image document

Quantitative mapping of high modulus materials at the nanoscale: comparative study between atomic force microscopy and nanoindentation

Rosine Coq Germanicus , D. Mercier , F. Agrebi , M. Fèbvre , D. Mariolle et al.
Journal of Microscopy, 2020, 280 (1), pp.51-62. ⟨10.1111/jmi.12935⟩
Article dans une revue hal-03343212 v1

Reliability analysis of BiCMOS SiGe:C technology under aggressive conditions for emerging RF and mm-wave applications: proposal of reliability-aware circuit design methodology

Insaf Lahbib , Sidina Wane , Aziz Doukkali , Dominique Lesénéchal , Thanh Vinh Dinh et al.
International Journal of Microwave and Wireless Technologies, 2018, Volume 10 (Special Issue 5-6), pp. 690-699. ⟨10.1017/S1759078718000624⟩
Article dans une revue hal-02190712 v1
Image document

Caractérisation par nanoindentation du GaN irradié par des ions uranium de grande énergie

Sophie Eve , Florent Moisy , Rosine Coq Germanicus , Clara Grygiel , Eric Hug et al.
Matériaux et Techniques, 2017, 105 (1), pp.108. ⟨10.1051/mattech/2017008⟩
Article dans une revue hal-02175450 v1

On the effects of a pressure induced amorphous silicon layer on consecutive spreading resistance microscopy scans of doped silicon

Rosine Coq Germanicus , Ph. Leclère , Y. Guhel , B. Boudart , Antoine Touboul et al.
Journal of Applied Physics, 2015, 117 (24), pp.244306. ⟨10.1063/1.4923052⟩
Article dans une revue hal-01647658 v1

On the effects of a pressure induced amorphous silicon layer on consecutive spreading resistance microscopy scans of doped silicon

R. Coq Germanicus , Ph. Leclère , Y. Guhel , B. Boudart , A. Touboul et al.
Journal of Applied Physics, 2015, 117 (24), ⟨10.1063/1.4923052⟩
Article dans une revue hal-04408079 v1

Rapid thermal annealing of cerium dioxide thin films sputtered onto silicon (111) substrates: Influence of heating rate on microstructure and electrical properties

Y. Guhel , T. Toloshniak , J. Bernard , A. Besq , Rosine Coq Germanicus et al.
Materials Science in Semiconductor Processing, 2015, 30, pp.352 - 360. ⟨10.1016/j.mssp.2014.10.010⟩
Article dans une revue hal-01646795 v1

Nanoindentation du Si3N4 pour la microelectronique : influence de la sous-couche

Rosine Coq Germanicus , S. Eve , F. Lallemand , E. Hug
Matériaux et Techniques, 2015, 103 (6), pp.606. ⟨10.1051/mattech/2015052⟩
Article dans une revue istex hal-02184114 v1

New Approach for the Prediction of CCD Dark Current Distribution in a Space Radiation Environment

Olivier Gilard , Mathieu Boutillier , Gianandrea Quadri , Guy Rolland , Rosine Coq Germanicus
IEEE Transactions on Nuclear Science, 2008, 55 (6), pp.3626-3632. ⟨10.1109/TNS.2008.2004875⟩
Article dans une revue hal-03515229 v1

Analytic description of scanning capacitance microscopy

Hugues Murray , Rosine Coq Germanicus , Aziz Doukkali , Patrick Martin , Bernadette Domengès et al.
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures, 2007, 25 (4), pp.1340. ⟨10.1116/1.2759218⟩
Article dans une revue hal-02533128 v1

Microstructure and electrical characterization based on AFM of very high-doped polysilicon grains

Rosine Coq Germanicus , E. Picard , B. Domenges , K. Danilo , R. Rogel
Applied Surface Science, 2007, 253 (14), pp.6006-6012. ⟨10.1016/j.apsusc.2006.12.114⟩
Article dans une revue istex hal-02533135 v1

Proton damage effects on GaAs/GaAlAs vertical cavity surface emitting lasers

P. Le Métayer , O. Gilard , Rosine Coq Germanicus , D. Campillo , F. Ledu et al.
Journal of Applied Physics, 2003, 94 (12), pp.7757. ⟨10.1063/1.1622113⟩
Article dans une revue hal-02533145 v1

Hardening of a radiation sensor based on optically stimulated luminescence

J.-R. Vaillé , S. Ducret , K. Idri , Frédéric Saigné , S. Matias et al.
IEEE Transactions on Nuclear Science, 2003, 50 (6), pp.2358 - 2362. ⟨10.1109/TNS.2003.821578⟩
Article dans une revue hal-00327358 v1

Analysis of the proton-induced permanent degradation in an optocoupler

Rosine Coq Germanicus , L. Dusseau , Frédéric Saigné , S. Barde , R. Ecoffet et al.
IEEE Transactions on Nuclear Science, 2002, 49 (3), pp.1421 - 1425. ⟨10.1109/TNS.2002.1039677⟩
Article dans une revue hal-01802189 v1

Evaluation and prediction of the degradation of a COTS CCD induced by displacement damage

Rosine Coq Germanicus , S. Barde , L. Dusseau , G. Rolland , Christian Barillot et al.
IEEE Transactions on Nuclear Science, 2002, 49 (6), pp.2830 - 2835. ⟨10.1109/TNS.2002.805554⟩
Article dans une revue hal-00327069 v1

High-energy particle irradiation of optically stimulated luminescent films at CERN

L. Dusseau , G. Polge , S. Mathias , J.-R. Vaillé , Rosine Coq Germanicus et al.
IEEE Transactions on Nuclear Science, 2001, 48 (6), pp.2056 - 2060. ⟨10.1109/23.983172⟩
Article dans une revue hal-01801752 v1

SiC MOSFET structure at the die level with AFM sMIM Mode

Rosine Coq Germanicus , Mahima Chaudhary , Kimmo Niskanen , Xavier Larose , Vanessa Chazal et al.
2024 IEEE 11th Workshop on Wide Bandgap Power Devices & Applications (WiPDA), Nov 2024, Dayton, OH, USA,, United States. pp.1-6, ⟨10.1109/wipda62103.2024.10773106⟩
Communication dans un congrès hal-04838098 v1
Image document

Machine learning for predicting DataCube atomic force microscope (AFM)—MultiDAT-AFM

Rosine Coq Germanicus , El-Hassani Othman
ISTFA 2024 - the 50th International Symposium for Testing and Failure Analysis Conference, Oct 2024, San Diego, United States. pp.351-357, ⟨10.31399/asm.cp.istfa2024p0351⟩
Communication dans un congrès hal-04779848 v1
Image document

SiC MOSFET micro-explosion due to a single event burnout: analysis at the device and die levels

Rosine Coq Germanicus , Tanguy Phulpin , Thomas Rogaume , Kimmo Niskanen , Sandrine Froissart et al.
ISTFA 2023 - the 49th International Symposium for Testing and Failure Analysis Conference, Nov 2023, Phoenix, United States. pp.483-490, ⟨10.31399/asm.cp.istfa2023p0483⟩
Communication dans un congrès hal-04285320 v1
Image document

Parametric nano-electrical analysis for SiC junctions of a packaged device

Rosine Coq Germanicus , Wadia Jouha , Niemat Moultif , Peter de Wolf , Vishal Shah et al.
WiPDA Europe 2022 - IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe, Sep 2022, Coventry, United Kingdom. ⟨10.1109/WiPDAEurope55971.2022.9936397⟩
Communication dans un congrès hal-04124443 v1

Integrated 3D-Capacitors for Implantable Bradycardia Pacemakers: Dielectric Integrity and Local Electrical Characterizations using AFM

Rosine Coq Germanicus , Florent Lallemand , Nicolas Normand , Catherine Bunel , Ulrike Lüders
14th International Conference on Biomedical Electronics and Devices, Feb 2021, Online Streaming, France. pp.49-57, ⟨10.5220/0010254300490057⟩
Communication dans un congrès hal-03342791 v1

Impact of electrical stress and neutron irradiation on reliability of silicon carbide power MOSFET

K. Niskanen , Antoine Touboul , Rosine Coq Germanicus , A. Michez , A. Javanainen et al.
IEEE RADECS 2019, Sep 2019, Montpellier, France. pp.1365 - 1373, ⟨10.1109/TNS.2020.2983599⟩
Communication dans un congrès hal-02446882 v1

Silicon carbide power MOSFETs under neutron irradiation: Failure In Time demonstration and long term reliability degradation evaluation

K. Niskanen , Antoine Touboul , Rosine Coq Germanicus , A. Michez , Frédéric Wrobel et al.
55th IEEE Nuclear Space and Radiation Effects Conference, Jul 2019, San Antonio, United States
Communication dans un congrès hal-02446823 v1

Détermination des propriétés mécaniques de matériaux très rigides : comparaison entre nanoindentation instrumentée, Microscopie à Force Atomique en mode Peak Force Tapping et Contact Résonant

Rosine Coq Germanicus , D. Mercier , M. Febvre , J. Beaumale , Philippe Descamps et al.
Forum Sonde Locale, Mar 2018, La Rochelle, France
Communication dans un congrès hal-02191114 v1

Aging and Gate Bias Effects on TID Sensitivity of Wide Bandgap Power Devices

Kimmo Niskanen , Antoine Touboul , Rosine Coq Germanicus , Frédéric Wrobel , F. Saigné et al.
IEEE RADECS2018, Sep 2018, Goteborg, Sweden
Communication dans un congrès hal-02086450 v1

Identification of stable irradiation-induced defects using low frequency noise spectroscopy

Rosine Coq Germanicus , B Cretu , A.D. D Touboul , C. Grygiel , Francoise Bezerra et al.
2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2018, Göteborg, Sweden. pp.1-4, ⟨10.1109/RADECS45761.2018.9328657⟩
Communication dans un congrès hal-02475434 v1

Détection des états de surface à l’interface Si/SiO2 par balayages successifs en mode SSRM

Rosine Coq Germanicus , P. Leclère , Yannick Guhel , B. Boudart , Philippe Descamps et al.
19e Forum des microscopies à sonde locale, 2016, Sochaux, France
Communication dans un congrès hal-01654277 v1
Image document

Statistical investigations of an ENIG Nickel film morphology by Atomic Force Microscopy

Rosine Coq Germanicus , P. Leclère , E. Hug , F. Lallemand , P. Descamps
i-DUST 2016, 2016, Avignon, France. pp.04003, ⟨10.1051/e3sconf/20161204003⟩
Communication dans un congrès hal-02184724 v1

Broadband characterization of dielectric materials from RF, millimeter-wave to THz frequencies accounting for anisotropy

Sebastien Massenot , Damienne Bajon , Sidina Wane , Laurent Leyssenne , Rosine Coq Germanicus et al.
2014 IEEE/MTT-S International Microwave Symposium - MTT 2014, Jun 2014, Tampa, France. pp.1-4, ⟨10.1109/MWSYM.2014.6848525⟩
Communication dans un congrès hal-02871170 v1

Reconfigurable sensors for extraction of dielectric material and liquid properties

Laurent Leyssenne , Sidina Wane , Damienne Bajon , Philippe Descamps , Rosine Coq Germanicus
2013 IEEE Radio Frequency Integrated Circuits Symposium (RFIC), Jun 2013, Seattle, United States. pp.393-396, ⟨10.1109/RFIC.2013.6569613⟩
Communication dans un congrès hal-02871196 v1

Hardening of a Radiation Sensor Based on Optically Stimulated Luminescence

J.-R. Vaillé , S. Ducret , K. Idri , Frédéric Saigné , S. Matias et al.
40th IEEE Nuclear Space and Radiation Effects Conference,, 2003, Monterey, United States
Communication dans un congrès hal-01806762 v1

Evaluation and prediction of the degradation of a COTS CCD induced by displacement damage

Rosine Coq Germanicus , S. Barde , L. Dusseau , G. Rolland , Christian Barillot et al.
39th IEEE Nuclear Space and Radiation Effects Conference, 2002, Phoenix, United States
Communication dans un congrès hal-01806730 v1

Correlation between electron and proton induced permanent degradation in a COTS optocoupler

Rosine Coq Germanicus , L. Dusseau , G. Rolland , R. Ecoffet , J. Fesquet et al.
European Space Components Conference, 2002, Toulouse, France
Communication dans un congrès hal-02019321 v1

High Energy Particles Irradiation of Optically Stimulated Luminescent Films at CERN

L. Dusseau , G. Polge , S. Mathias , J.-R. Vaillé , Rosine Coq Germanicus et al.
38th IEEE Nuclear Space and Radiation Effects Conference, 2001, Vancouver, Canada
Communication dans un congrès hal-01803959 v1

Analysis of the proton induced permanent degradation in an optocoupler

Rosine Coq Germanicus , L. Dusseau , Frédéric Saigné , S. Barde , R. Ecoffet et al.
6th European Conference on Radiation and its Effects on Components and Systems, 2001, Grenoble, France
Communication dans un congrès hal-01804816 v1

Etude de la sensibilité aux protons et à l’effet de dose des optocoupleurs COTS SIEMENS SFH610A

Rosine Coq Germanicus , L. Dusseau , E. Lorfèvre , Frédéric Saigné , J. Fesquet et al.
3th European Workshop on Radiation and its Effects on Components and Systems, 2000, Louvain la Neuve, Belgium
Communication dans un congrès hal-01803938 v1
Image document

Identifying the properties of brittle thin films and oxide scales by nanoindentation

Morgan Rusinowicz , Fabien Volpi , Guillaume Parry , Chaymaa Boujrouf , David Mercier et al.
HTCPM 2024 - The 11th edition of the High Temperature Corrosion and Protection of Materials, Jun 2024, Les Embiez, France.
Poster de conférence hal-04839694 v1