Rosine COQ GERMANICUS

63
Documents
Affiliation actuelle
  • Laboratoire de cristallographie et sciences des matériaux (CRISMAT)
Contact

Présentation

I'm a full professor in Nanoscience at the University of Caen Normandie.
Teachning: IUT GON GC-GP departement https://uniform.unicaen.fr/catalogue/formation/autres/6741-but-genie-chimique---genie-des-procedes?s=iut-caen&r=1291041065219
Metrology, Electrical engineering, Electricity, Sensors
Research Laboratory: CRISMAT UMR6508 https://crismat.cnrs.fr/
Nanoscience, Scanning Probe Microscopy (SPM), Atomic Force Microscopy (AFM), Radiation effects, SiC devices
Nomandie Univ, UNICAEN, ENSICAEN, CNRS, 14000 CAEN, FRANCE
Education and Work experience: I received my Ph. D. degree in 2002 from the University of Montpellier 2 (France) in radiation effects on optoelectronics device, cifre thesis (CNES / Alcatel Space / RADIAC ). Since 2003, at the University of Caen (IUT-CRISMAT UMR6508) I was an associate professor in Normandy, now I am a full professor. I successfuly defended my Research Direction Habilitation (HDR) on June 2021 at the University of Caen. My research in Nanoscience topic with interests include (i) scanning probe microscopy with particular emphasis on local nano-electrical characterizations of semiconductor devices for microelectronics reliability and process (ii) radiation damage in optoelectronics and WBG devices (SiC MOSFETs) at the die level.

Domaines de recherche

Physique [physics]

Compétences

AFM (Atomic Force Microscopy) Metrology Failure Analysis (FA) Radiation effects Microelectronic

Publications

7
6
5
5
5
4
4
4
4
3
3
3
3
3
3
3
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
10
4
4
5
7
5
1
4
1
2
4
1
1
1
2
3
4
3
1
22
16
6
5
4
3
2
2
1
1
1
15
12
10
9
8
7
7
7
7
7
6
5
5
5
4
4
4
4
4
4
4
4
4
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
3
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
9
4
3
2
2
2
1
1
1
1
1
1
1
1
1
1
1
1
1
1
45
10
2
1
1
3

Publications

Image document

Single Event Effects of SiC power MOSFETs: from neutron interaction to destruction at the die level

Rosine Coq Germanicus , Alain Michez , Kimmo Niskanen , Mahima Chaudhary , Guillaume Bascoul et al.
IEEE Transactions on Nuclear Science, 2025, 72 (8), pp.2368 - 2376. ⟨10.1109/TNS.2025.3561583⟩
Article dans une revue hal-05081304 v1

Predicting and Clustering Machine Learning for DataCube Atomic Force Microscope (AFM) Electrical Modes in SSRM

Rosine Coq Germanicus , Othman El-Hassani , Petr Klapetek
Journal of Failure Analysis and Prevention, 2025, ⟨10.1007/s11668-025-02240-5⟩
Article dans une revue hal-05291889 v1
Image document

Influence of the SrVO3 thin film thickness integrated on glass thanks to [Ca$_2$Nb$_3$O$_{10}$]- nanosheets

Marie El Rami , Simon Hurand , Florent Baudouin , Marie Dallocchio , Rosine Coq Germanicus et al.
Applied Surface Science, 2025, 690, pp.162580. ⟨10.1016/j.apsusc.2025.162580⟩
Article dans une revue hal-04929878 v1

Low Frequency Noise Spectroscopy: A Powerful Diagnostic Tool for Trap Identification in Active and Passive Components

B. Cretu , A. Tahiat , R. Coq Germanicus , F. Bezerra , C. Bunel et al.
EDFA Technical Articles, 2025, 27 (1), pp.8-17. ⟨10.31399/asm.edfa.2025-1.p008⟩
Article dans une revue hal-05053719 v1

Characterization of Na-doped Cu2ZnSnS4 thin films and electrical analysis of Al/ p-Cu2ZnSnS4: Na (1%)/Mo structure

M. Marzougui , Rosine Coq Germanicus , X. Larose , M. Ben Rabeh , M. Kanzari
Optical and Quantum Electronics, 2025, 57 (5), pp.290. ⟨10.1007/s11082-025-08219-8⟩
Article dans une revue hal-05081288 v1
Image document

AFM-sMIM characterization of the recombination-enhancing buffer layer for bipolar degradation free SiC MOSFETs

Rosine Coq Germanicus , Tanguy Phulpin , Kimmo Niskanen , Alain Michez , Ulrike Lüders
Solid State Phenomena, 2024, 361, pp.85-91. ⟨10.4028/p-hupmo0⟩
Article dans une revue hal-04682254 v1
Image document

SiC Doping Impact during Conducting AFM under Ambient Atmosphere

Christina Villeneuve-Faure , Abdelhaq Boumaarouf , Vishal Shah , Peter Gammon , Ulrike Lüders et al.
Materials, 2023, 16 (15), pp.5401. ⟨10.3390/ma16155401⟩
Article dans une revue hal-04187713 v1
Image document

Selective Oxidation during AFM Electrical Characterization of Doped SiC Layers

Rosine Coq Germanicus , Abdelhaq Boumaarouf , Christina Villeneuve-Faure , Vish Al Shah , Peter Gammon et al.
Materials Science Forum, 2023, 1089, pp.63-69. ⟨10.4028/p-666z18⟩
Article dans une revue hal-04124446 v1

Study of the beneficial effects of sodium doping Cu2ZnSnS4 material

M. Marzougui , H. Hammami , H. Oueslati , R. Coq Germanicus , C. Leroux et al.
Optical Materials, 2022, 132, pp.112709. ⟨10.1016/j.optmat.2022.112709⟩
Article dans une revue hal-03777821 v1
Image document

Failure of a brittle layer on a ductile substrate: Nanoindentation experiments and FEM simulations

M. Rusinowicz , G. Parry , F. Volpi , D. Mercier , S. Eve et al.
Journal of the Mechanics and Physics of Solids, 2022, 163, pp.104859. ⟨10.1016/j.jmps.2022.104859⟩
Article dans une revue hal-03708224 v1
Image document

Failure Analysis of Atmospheric Neutron-Induced Single Event Burnout of a Commercial SiC MOSFET

Rosine Coq Germanicus , Kimmo Niskanen , Alain Michez , Niemat Moultif , Wadia Jouha et al.
Materials Science Forum, 2022, 1062, pp.544-548. ⟨10.4028/p-973n9u⟩
Article dans une revue hal-03702520 v1

Electrical characterizations based on AFM: SCM and SSRM measurements with a multidimensional approach

Rosine Coq Germanicus , U. Lüders
EDFA Technical Articles, 2022, 24 (3), pp.24-31. ⟨10.31399/asm.edfa.2022-3.p024⟩
Article dans une revue hal-03781868 v1
Image document

Neutron-Induced Failure Dependence on Reverse Gate Voltage for SiC Power MOSFETs in Atmospheric Environment

K. Niskanen , Rosine Coq Germanicus , A. Michez , Frédéric Wrobel , Jérôme Boch et al.
IEEE Transactions on Nuclear Science, 2021, 68 (8), pp.1623-1632. ⟨10.1109/tns.2021.3077733⟩
Article dans une revue hal-03341565 v1
Image document

Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation

Andrea Coronetti , Ruben Garcia Alia , Jan Budroweit , Tomasz Rajkowski , Israel Da Costa Lopes et al.
IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.958-969. ⟨10.1109/TNS.2021.3061197⟩
Article dans une revue hal-03341566 v1
Image document

Development of a multifunctional nanoindenter integrated in-situ Scanning Electron Microscope - application to the monitoring of piezoresponse and electro-mechanical failures

F. Volpi , C. Boujrouf , M. Rusinowicz , S. Comby-Dassonneville , F. Mercier et al.
Thin Solid Films, 2021, 735, pp.138891. ⟨10.1016/j.tsf.2021.138891⟩
Article dans une revue hal-03428537 v1
Image document

Thickness dependence of dielectric properties in sub-nanometric Al2O3/ZnO laminates

M. Upadhyay , M. Ben Elbahri , M. Mezhoud , Rosine Coq Germanicus , U. Lüders
Solid-State Electronics, 2021, 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), 186, pp.108070. ⟨10.1016/j.sse.2021.108070⟩
Article dans une revue hal-03341562 v1
Image document

Morphology control of self-organised Sr3V2O8 nanostructures on SrVO3 grown onto single and poly-crystalline subjacent SrTiO3 substrates

B. Bérini , M. Dallocchio , A. David , U. Luders , Bourlier Yoan et al.
Applied Surface Science, 2021, 566, pp.150759. ⟨10.1016/j.apsusc.2021.150759⟩
Article dans une revue hal-03335293 v1
Image document

Dopant activity for highly in-situ doped polycrystalline silicon: hall, XRD, scanning capacitance microscopy (SCM) and scanning spreading resistance microscopy (SSRM)

Rosine Coq Germanicus , Florent Lallemand , Daniel Chateigner , Wadia Jouha , Niemat Moultif et al.
Nano Express, 2021, 2 (1), pp.010037. ⟨10.1088/2632-959x/abed3e⟩
Article dans une revue hal-03341563 v1
Image document

Three dimensional resistance mapping of self-organized Sr3V2O8 nanorods on metallic perovskite SrVO3 matrix

Rosine Coq Germanicus , Yoan Bourlier , Vincent Notot , Bruno Bérini , Valérie Demange et al.
Applied Surface Science, 2020, 510, pp.- 145522. ⟨10.1016/j.apsusc.2020.145522⟩
Article dans une revue hal-02531301 v1

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

K. Niskanen , A. Touboul , Rosine Coq Germanicus , A. Michez , A. Javanainen et al.
IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1365-1373. ⟨10.1109/TNS.2020.2983599⟩
Article dans une revue hal-03511987 v1
Image document

Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy

Rosine Coq Germanicus , Peter de Wolf , Florent Lallemand , Catherine Bunel , Serge Bardy et al.
Beilstein Journal of Nanotechnology, 2020, 11, pp.1764 - 1775. ⟨10.3762/bjnano.11.159⟩
Article dans une revue hal-03053497 v1
Image document

Quantitative mapping of high modulus materials at the nanoscale: comparative study between atomic force microscopy and nanoindentation

Rosine Coq Germanicus , D. Mercier , F. Agrebi , M. Fèbvre , D. Mariolle et al.
Journal of Microscopy, 2020, 280 (1), pp.51-62. ⟨10.1111/jmi.12935⟩
Article dans une revue hal-03343212 v1

Reliability analysis of BiCMOS SiGe:C technology under aggressive conditions for emerging RF and mm-wave applications: proposal of reliability-aware circuit design methodology

Insaf Lahbib , Sidina Wane , Aziz Doukkali , Dominique Lesénéchal , Thanh Vinh Dinh et al.
International Journal of Microwave and Wireless Technologies, 2018, Volume 10 (Special Issue 5-6), pp. 690-699. ⟨10.1017/S1759078718000624⟩
Article dans une revue hal-02190712 v1
Image document

Caractérisation par nanoindentation du GaN irradié par des ions uranium de grande énergie

Sophie Eve , Florent Moisy , Rosine Coq Germanicus , Clara Grygiel , Eric Hug et al.
Matériaux et Techniques, 2017, 105 (1), pp.108. ⟨10.1051/mattech/2017008⟩
Article dans une revue hal-02175450 v1

On the effects of a pressure induced amorphous silicon layer on consecutive spreading resistance microscopy scans of doped silicon

Rosine Coq Germanicus , Ph. Leclère , Y. Guhel , B. Boudart , Antoine Touboul et al.
Journal of Applied Physics, 2015, 117 (24), pp.244306. ⟨10.1063/1.4923052⟩
Article dans une revue hal-01647658 v1

On the effects of a pressure induced amorphous silicon layer on consecutive spreading resistance microscopy scans of doped silicon

R. Coq Germanicus , Ph. Leclère , Y. Guhel , B. Boudart , A. Touboul et al.
Journal of Applied Physics, 2015, 117 (24), ⟨10.1063/1.4923052⟩
Article dans une revue hal-04408079 v1

Rapid thermal annealing of cerium dioxide thin films sputtered onto silicon (111) substrates: Influence of heating rate on microstructure and electrical properties

Y. Guhel , T. Toloshniak , J. Bernard , A. Besq , Rosine Coq Germanicus et al.
Materials Science in Semiconductor Processing, 2015, 30, pp.352 - 360. ⟨10.1016/j.mssp.2014.10.010⟩
Article dans une revue hal-01646795 v1

Nanoindentation du Si3N4 pour la microelectronique : influence de la sous-couche

Rosine Coq Germanicus , S. Eve , F. Lallemand , E. Hug
Matériaux et Techniques, 2015, 103 (6), pp.606. ⟨10.1051/mattech/2015052⟩
Article dans une revue istex hal-02184114 v1

New Approach for the Prediction of CCD Dark Current Distribution in a Space Radiation Environment

Olivier Gilard , Mathieu Boutillier , Gianandrea Quadri , Guy Rolland , Rosine Coq Germanicus
IEEE Transactions on Nuclear Science, 2008, 55 (6), pp.3626-3632. ⟨10.1109/TNS.2008.2004875⟩
Article dans une revue hal-03515229 v1

Analytic description of scanning capacitance microscopy

Hugues Murray , Rosine Coq Germanicus , Aziz Doukkali , Patrick Martin , Bernadette Domengès et al.
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures, 2007, 25 (4), pp.1340. ⟨10.1116/1.2759218⟩
Article dans une revue hal-02533128 v1

Microstructure and electrical characterization based on AFM of very high-doped polysilicon grains

Rosine Coq Germanicus , E. Picard , B. Domenges , K. Danilo , R. Rogel
Applied Surface Science, 2007, 253 (14), pp.6006-6012. ⟨10.1016/j.apsusc.2006.12.114⟩
Article dans une revue istex hal-02533135 v1

Proton damage effects on GaAs/GaAlAs vertical cavity surface emitting lasers

P. Le Métayer , O. Gilard , Rosine Coq Germanicus , D. Campillo , F. Ledu et al.
Journal of Applied Physics, 2003, 94 (12), pp.7757. ⟨10.1063/1.1622113⟩
Article dans une revue hal-02533145 v1

Hardening of a radiation sensor based on optically stimulated luminescence

J.-R. Vaillé , S. Ducret , K. Idri , Frédéric Saigné , S. Matias et al.
IEEE Transactions on Nuclear Science, 2003, 50 (6), pp.2358 - 2362. ⟨10.1109/TNS.2003.821578⟩
Article dans une revue hal-00327358 v1

Analysis of the proton-induced permanent degradation in an optocoupler

Rosine Coq Germanicus , L. Dusseau , Frédéric Saigné , S. Barde , R. Ecoffet et al.
IEEE Transactions on Nuclear Science, 2002, 49 (3), pp.1421 - 1425. ⟨10.1109/TNS.2002.1039677⟩
Article dans une revue hal-01802189 v1

Evaluation and prediction of the degradation of a COTS CCD induced by displacement damage

Rosine Coq Germanicus , S. Barde , L. Dusseau , G. Rolland , Christian Barillot et al.
IEEE Transactions on Nuclear Science, 2002, 49 (6), pp.2830 - 2835. ⟨10.1109/TNS.2002.805554⟩
Article dans une revue hal-00327069 v1

High-energy particle irradiation of optically stimulated luminescent films at CERN

L. Dusseau , G. Polge , S. Mathias , J.-R. Vaillé , Rosine Coq Germanicus et al.
IEEE Transactions on Nuclear Science, 2001, 48 (6), pp.2056 - 2060. ⟨10.1109/23.983172⟩
Article dans une revue hal-01801752 v1
Image document

Comparative analysis of SEGR and SEB susceptibility in Si and SiC MOSFETs using TCAD modeling

Cleiton Marques , Alain Michez , Timothée Labau , Rosine Coq Germanicus , Frédéric Wrobel et al.
RADECS 2025 - RADiation and its Effects on Components and Systems Conference, Sep 2025, Anvers, Belgium
Communication dans un congrès cea-05422315 v1
Image document

Accuracy and reproducibility of ambient topographies at the nanoscale by AFM: Several months of metrological monitoring

Ziad Gharibeh , Maxime Leménager , Hind Bousbia , Rosine Coq Germanicus
22nd International Metrology Congress, Mar 2025, Lyon, France. pp.13001, ⟨10.1051/epjconf/202532313001⟩
Communication dans un congrès hal-05053733 v1

Data processing, analysis and Machine Learning of Electrical Atomic Force Microscopy (AFM) in Data Cube mode: conduction of a nanomaterial for Lithium-ion battery electrodes

Rosine Coq Germanicus , Peter de Wolf , Petr Klapetek
2025 IEEE 6th International Conference on Image Processing, Applications and Systems (IPAS), Jan 2025, Lyon, France. pp.1-5, ⟨10.1109/IPAS63548.2025.10924528⟩
Communication dans un congrès hal-05016532 v1
Image document

Top and cross-sectional Failure Analysis investigations by AFM, FIB and SEM: elucidation of an unwanted layer growth in integrated microelectronic chip

Meryem Messoudi , Sébastien Jacqueline , Florent Lallemand , Marie-Pierre Chauvat , Sandrine Froissart et al.
ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France
Communication dans un congrès hal-05323122 v1

Correlative Near-Field Characterizations with KPFM, sMIM and SCM to Characterize the Geometry of a N-Channel Failed SiC JFET

Rosine Coq Germanicus , Mahima Chaudhary , Enora Vuillermet , Mihai Lazar
ISTFA 2025, Nov 2025, Pasadena, France. pp.404-410, ⟨10.31399/asm.cp.istfa2025p0404⟩
Communication dans un congrès hal-05401738 v1
Image document

Machine learning for predicting DataCube atomic force microscope (AFM)—MultiDAT-AFM

Rosine Coq Germanicus , El-Hassani Othman
ISTFA 2024 - the 50th International Symposium for Testing and Failure Analysis Conference, Oct 2024, San Diego, United States. pp.351-357, ⟨10.31399/asm.cp.istfa2024p0351⟩
Communication dans un congrès hal-04779848 v1

SiC MOSFET structure at the die level with AFM sMIM Mode

Rosine Coq Germanicus , Mahima Chaudhary , Kimmo Niskanen , Xavier Larose , Vanessa Chazal et al.
2024 IEEE 11th Workshop on Wide Bandgap Power Devices & Applications (WiPDA), Nov 2024, Dayton, OH, USA,, United States. pp.1-6, ⟨10.1109/wipda62103.2024.10773106⟩
Communication dans un congrès hal-04838098 v1
Image document

SiC MOSFET micro-explosion due to a single event burnout: analysis at the device and die levels

Rosine Coq Germanicus , Tanguy Phulpin , Thomas Rogaume , Kimmo Niskanen , Sandrine Froissart et al.
ISTFA 2023 - the 49th International Symposium for Testing and Failure Analysis Conference, Nov 2023, Phoenix, United States. pp.483-490, ⟨10.31399/asm.cp.istfa2023p0483⟩
Communication dans un congrès hal-04285320 v1
Image document

Parametric nano-electrical analysis for SiC junctions of a packaged device

Rosine Coq Germanicus , Wadia Jouha , Niemat Moultif , Peter de Wolf , Vishal Shah et al.
WiPDA Europe 2022 - IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe, Sep 2022, Coventry, United Kingdom. ⟨10.1109/WiPDAEurope55971.2022.9936397⟩
Communication dans un congrès hal-04124443 v1

Integrated 3D-Capacitors for Implantable Bradycardia Pacemakers: Dielectric Integrity and Local Electrical Characterizations using AFM

Rosine Coq Germanicus , Florent Lallemand , Nicolas Normand , Catherine Bunel , Ulrike Lüders
14th International Conference on Biomedical Electronics and Devices, Feb 2021, Online Streaming, France. pp.49-57, ⟨10.5220/0010254300490057⟩
Communication dans un congrès hal-03342791 v1

Impact of electrical stress and neutron irradiation on reliability of silicon carbide power MOSFET

K. Niskanen , Antoine Touboul , Rosine Coq Germanicus , A. Michez , A. Javanainen et al.
IEEE RADECS 2019, Sep 2019, Montpellier, France. pp.1365 - 1373, ⟨10.1109/TNS.2020.2983599⟩
Communication dans un congrès hal-02446882 v1

Silicon carbide power MOSFETs under neutron irradiation: Failure In Time demonstration and long term reliability degradation evaluation

K. Niskanen , Antoine Touboul , Rosine Coq Germanicus , A. Michez , Frédéric Wrobel et al.
55th IEEE Nuclear Space and Radiation Effects Conference, Jul 2019, San Antonio, United States
Communication dans un congrès hal-02446823 v1

Détermination des propriétés mécaniques de matériaux très rigides : comparaison entre nanoindentation instrumentée, Microscopie à Force Atomique en mode Peak Force Tapping et Contact Résonant

Rosine Coq Germanicus , D. Mercier , M. Febvre , J. Beaumale , Philippe Descamps et al.
Forum Sonde Locale, Mar 2018, La Rochelle, France
Communication dans un congrès hal-02191114 v1

Aging and Gate Bias Effects on TID Sensitivity of Wide Bandgap Power Devices

Kimmo Niskanen , Antoine Touboul , Rosine Coq Germanicus , Frédéric Wrobel , F. Saigné et al.
IEEE RADECS2018, Sep 2018, Goteborg, Sweden
Communication dans un congrès hal-02086450 v1

Identification of stable irradiation-induced defects using low frequency noise spectroscopy

Rosine Coq Germanicus , B Cretu , A.D. D Touboul , C. Grygiel , Francoise Bezerra et al.
2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2018, Göteborg, Sweden. pp.1-4, ⟨10.1109/RADECS45761.2018.9328657⟩
Communication dans un congrès hal-02475434 v1

Détection des états de surface à l’interface Si/SiO2 par balayages successifs en mode SSRM

Rosine Coq Germanicus , P. Leclère , Yannick Guhel , B. Boudart , Philippe Descamps et al.
19e Forum des microscopies à sonde locale, 2016, Sochaux, France
Communication dans un congrès hal-01654277 v1
Image document

Statistical investigations of an ENIG Nickel film morphology by Atomic Force Microscopy

Rosine Coq Germanicus , P. Leclère , E. Hug , F. Lallemand , P. Descamps
i-DUST 2016, 2016, Avignon, France. pp.04003, ⟨10.1051/e3sconf/20161204003⟩
Communication dans un congrès hal-02184724 v1

Broadband characterization of dielectric materials from RF, millimeter-wave to THz frequencies accounting for anisotropy

Sebastien Massenot , Damienne Bajon , Sidina Wane , Laurent Leyssenne , Rosine Coq Germanicus et al.
2014 IEEE/MTT-S International Microwave Symposium - MTT 2014, Jun 2014, Tampa, France. pp.1-4, ⟨10.1109/MWSYM.2014.6848525⟩
Communication dans un congrès hal-02871170 v1

Reconfigurable sensors for extraction of dielectric material and liquid properties

Laurent Leyssenne , Sidina Wane , Damienne Bajon , Philippe Descamps , Rosine Coq Germanicus
2013 IEEE Radio Frequency Integrated Circuits Symposium (RFIC), Jun 2013, Seattle, United States. pp.393-396, ⟨10.1109/RFIC.2013.6569613⟩
Communication dans un congrès hal-02871196 v1

Hardening of a Radiation Sensor Based on Optically Stimulated Luminescence

J.-R. Vaillé , S. Ducret , K. Idri , Frédéric Saigné , S. Matias et al.
40th IEEE Nuclear Space and Radiation Effects Conference,, 2003, Monterey, United States
Communication dans un congrès hal-01806762 v1

Evaluation and prediction of the degradation of a COTS CCD induced by displacement damage

Rosine Coq Germanicus , S. Barde , L. Dusseau , G. Rolland , Christian Barillot et al.
39th IEEE Nuclear Space and Radiation Effects Conference, 2002, Phoenix, United States
Communication dans un congrès hal-01806730 v1

Correlation between electron and proton induced permanent degradation in a COTS optocoupler

Rosine Coq Germanicus , L. Dusseau , G. Rolland , R. Ecoffet , J. Fesquet et al.
European Space Components Conference, 2002, Toulouse, France
Communication dans un congrès hal-02019321 v1

High Energy Particles Irradiation of Optically Stimulated Luminescent Films at CERN

L. Dusseau , G. Polge , S. Mathias , J.-R. Vaillé , Rosine Coq Germanicus et al.
38th IEEE Nuclear Space and Radiation Effects Conference, 2001, Vancouver, Canada
Communication dans un congrès hal-01803959 v1

Analysis of the proton induced permanent degradation in an optocoupler

Rosine Coq Germanicus , L. Dusseau , Frédéric Saigné , S. Barde , R. Ecoffet et al.
6th European Conference on Radiation and its Effects on Components and Systems, 2001, Grenoble, France
Communication dans un congrès hal-01804816 v1

Etude de la sensibilité aux protons et à l’effet de dose des optocoupleurs COTS SIEMENS SFH610A

Rosine Coq Germanicus , Laurent Dusseau , Eric Lorfèvre , Frédéric Saigné , J. Fesquet et al.
3th European Workshop on Radiation and its Effects on Components and Systems, 2000, Louvain la Neuve, Belgium
Communication dans un congrès hal-01803938 v1
Image document

Identifying the properties of brittle thin films and oxide scales by nanoindentation

Morgan Rusinowicz , Fabien Volpi , Guillaume Parry , Chaymaa Boujrouf , David Mercier et al.
HTCPM 2024 - The 11th edition of the High Temperature Corrosion and Protection of Materials, Jun 2024, Les Embiez, France.
Poster de conférence hal-04839694 v1