Vincent Girones

8
Documents

Publications

Publications

The Use of Filtered High-Energy X-rays and 60Co for TID Testing of a 32-Bit 28nm FDSOI DSP

Alejandro Urena Acuna , Julien Favrichon , Aurélien Ballier , Pierre-Alexis Robin , Vincent Girones et al.
ESREF 2024 - 35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Sep 2024, Parme, Italy
Communication dans un congrès hal-04892361 v1